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Thermal via placement in 3D ICs

Published: 03 April 2005 Publication History

Abstract

As thermal problems become more evident, new physical design paradigms and tools are needed to alleviate them. Incorporating thermal vias into integrated circuits (ICs) is a promising way of mitigating thermal issues by lowering the thermal resistance of the chip itself. However, thermal vias take up valuable routing space, and therefore, algorithms are needed to minimize their usage while placing them in areas where they would make the greatest impact. With the developing technology of three-dimensional integrated circuits (3D ICs), thermal problems are expected to be more prominent, and thermal vias can have a larger impact on them than in traditional 2D ICs. In this paper, thermal vias are assigned to specific areas of a 3D IC and used to adjust their effective thermal conductivities. The thermal via placement method makes iterative adjustments to these thermal conductivities in order to achieve a desired maximum temperature objective. Finite element analysis (FEA) is used in formulating the method and in calculating temperatures quickly during each iteration. As a result, the method efficiently achieves its thermal objective while minimizing the thermal via utilization.

References

[1]
M. Chan and P. K. Ko, "Development of a Viable 3D Integrated Circuit Technology," Science in China, vol. 44, no. 4, pp. 241--248, August 2001.]]
[2]
K. Banerjee, S. J. Souri, P. Kapur, and K. C. Saraswat, "3-D ICs: A Novel Chip Design for Improving Deep Submicrometer Interconnect Performance and Systems-on-Chip Integration," in Proc. of the IEEE, vol. 89, no. 5, pp. 602--633, May 2001.]]
[3]
S. Lee, T.F. Lemczyk, and M. M. Yovanovich, "Analysis of Thermal Vias in High Density Interconnect Technology," in 8th IEEE Semi-Therm Symposium, pp. 55--61, Feb. 1992.]]
[4]
R.S. Li, "Optimization of Thermal Via Design Parameters Based on an Analytical Thermal Resistance Model," in Thermal and Thermomechanical Phenomena in Electronic Systems, pp. 475--480, 1998.]]
[5]
D. Pinjala, M.K. Iyer, Chow Seng Guan, and I.J. Rasiah, "Thermal characterization of vias using compact models," in Proc. of the Electronics Packaging Technology Conf., pp. 144--147, Dec. 2000.]]
[6]
T-Y Chiang, K. Banerjee, and K. C. Saraswat, "Effect of Via Separation and Low-k Dielectric Materials on the Thermal Characteristics of Cu Interconnects," in IEEE Int. Electron Devices Meeting Tech. Digest, pp. 261--264, 2000.]]
[7]
T-Y. Chiang, K. Banerjee, and K. C. Saraswat, "Compact Modeling and SPICE-Based Simulation for Electrothermal Analysis of Multilevel ULSI Interconnects," in Proc. of the Int. Conf. on Comput.-Aided Des., pp. 165--172, Nov. 2001.]]
[8]
A. Rahman and R. Reif, "Thermal Analysis of Three-Dimensional (3-D) Integrated Circuits (ICs)," in Proc. of the Interconnect Technology Conf., pp. 157--159, June 2001.]]
[9]
T-Y. Chiang, S.J. Souri, Chi On Chui, and K.C. Saraswat, "Thermal Analysis of Heterogeneous 3D ICs with Various Integration Scenarios," in IEEE Int. Electron Devices Meeting Tech. Digest, pp. 681--684, Dec. 2001.]]
[10]
B. Goplen and S. S. Sapatnekar, "Efficient Thermal Placement of Standard Cells in 3D ICs using a Force Directed Approach," in Proc. of the Int. Conf. on Comput.-Aided Des., pp. 86--89, Nov. 2003.]]
[11]
D. L. Logan, A First Course in the Finite Element Method, 3rd ed., Brooks/Cole Pub. Co., 2002.]]
[12]
www.tu-dresden.de/mwism/skalicky/laspack/laspack.html]]
[13]
www.cbl.ncsu.edu/pub/Benchmark_dirs/LayoutSynth92]]
[14]
http://er.cs.ucla.edu/benchmarks/ibm-place/]]

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  • (2023)A High-Efficiency Design Method of TSV Array for Thermal Management of 3-D Integrated SystemIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.321361042:6(1733-1741)Online publication date: Jun-2023
  • (2020)A Novel Through Mold Plate (TMP) for Signal and Thermal Integrity Improvement of High Bandwidth Memory (HBM)2020 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)10.1109/NEMO49486.2020.9343473(1-4)Online publication date: 7-Dec-2020
  • (2019)Temperature-Aware Floorplanning for Fixed-Outline 3D ICsIEEE Access10.1109/ACCESS.2019.29428397(139787-139794)Online publication date: 2019
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cover image ACM Conferences
ISPD '05: Proceedings of the 2005 international symposium on Physical design
April 2005
258 pages
ISBN:1595930213
DOI:10.1145/1055137
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Publication History

Published: 03 April 2005

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Author Tags

  1. 3-D IC
  2. 3-D VLSI
  3. finite element analysis
  4. placement
  5. routing
  6. temperature
  7. thermal gradient
  8. thermal optimization
  9. thermal via

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ISPD05
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ISPD05: International Symposium on Physical Design 2005
April 3 - 6, 2005
California, San Francisco, USA

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Overall Acceptance Rate 62 of 172 submissions, 36%

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Cited By

View all
  • (2023)A High-Efficiency Design Method of TSV Array for Thermal Management of 3-D Integrated SystemIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.321361042:6(1733-1741)Online publication date: Jun-2023
  • (2020)A Novel Through Mold Plate (TMP) for Signal and Thermal Integrity Improvement of High Bandwidth Memory (HBM)2020 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)10.1109/NEMO49486.2020.9343473(1-4)Online publication date: 7-Dec-2020
  • (2019)Temperature-Aware Floorplanning for Fixed-Outline 3D ICsIEEE Access10.1109/ACCESS.2019.29428397(139787-139794)Online publication date: 2019
  • (2018)System-Level Analysis of 3D ICs with Thermal TSVsACM Journal on Emerging Technologies in Computing Systems10.1145/326473614:3(1-16)Online publication date: 23-Oct-2018
  • (2018)Accurate Models for Optimizing Tapered Microchannel Heat Sinks in 3D ICs2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)10.1109/ISVLSI.2018.00021(58-63)Online publication date: Jul-2018
  • (2018)Anisotropic equivalent thermal conductivity model for efficient and accurate full-chip-scale numerical simulation of 3D stacked ICInternational Journal of Heat and Mass Transfer10.1016/j.ijheatmasstransfer.2017.10.044120(361-378)Online publication date: May-2018
  • (2018) The Future of CMOS : More Moore or a New Disruptive Technology? Advanced Nanoelectronics10.1002/9783527811861.ch1(1-31)Online publication date: 5-Oct-2018
  • (2017)XylemProceedings of the 50th Annual IEEE/ACM International Symposium on Microarchitecture10.1145/3123939.3124547(546-559)Online publication date: 14-Oct-2017
  • (2017)Thermomechanical Stress-Aware Management for 3-D IC DesignsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2017.270711925:9(2678-2682)Online publication date: Sep-2017
  • (2017)End-to-End Analysis of Integration for Thermocouple-Based Sensors Into 3-D ICsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2017.269904025:9(2498-2511)Online publication date: Sep-2017
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