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research-article

Multiple fault testing using minimal single fault test set for fanout-free circuits

Published: 01 November 2006 Publication History

Abstract

The authors examine the properties of fanout-free circuits, and develop an algorithm to generate single stuck-at fault test experiments that also detect all multiple stuck-at faults. These experiments are shown to be minimal in size. Results demonstrate that elaborate selection of nonsensitizing test pattern guarantees the detection of all multiple stuck-at faults using single stuck-at test experiments. The algorithm is deterministic, and will produce test sets for tree circuits containing any mixture of AND, OR, NOT, NAND, and NOR gates. The results can be extensively applied to multiple stuck-at fault detection for pseudo tree circuits such as parity checkers. The time complexity of the algorithm is determined to the O ( n 2), where n is the number of gates in the circuit

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  • (1996)Multiple Fault Detection in Fan-Out Free Circuits Using Minimal Single Fault Test SetIEEE Transactions on Computers10.1109/12.50643345:6(763-765)Online publication date: 1-Jun-1996
  1. Multiple fault testing using minimal single fault test set for fanout-free circuits

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      cover image IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
      IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  Volume 12, Issue 1
      November 2006
      186 pages

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      IEEE Press

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      Published: 01 November 2006

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      • (1996)Multiple Fault Detection in Fan-Out Free Circuits Using Minimal Single Fault Test SetIEEE Transactions on Computers10.1109/12.50643345:6(763-765)Online publication date: 1-Jun-1996

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