A novel scheme for reducing the test application time in accumulator-based test-pattern generation is presented. The proposed scheme exhibits extremely low demand for hardware. It is based on a decoder whose inputs are driven by a very slow external ...
In this paper, a novel scheme for the generation of pseudo-exhaustive two-pattern tests for combinational modules under test is presented. The proposed scheme utilizes an accumulator with 1's complement adder to generate the patterns in time equal to ...
An accumulator-based compaction (ABC) scheme for parallel compaction of test responses is introduced. The asymptotic and transient coverage drop introduced by accumulators with binary and 1's complement adders is studied using Markov chain models. It is ...
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