Application-independent testing of FPGA interconnects

The ever increasing adoption of field programmable devices in various application domains for building complex embedded systems based on FPGA processors along with the reliability issues having emerged for FPGA devices built with the latest nanometer ...

This paper provides a novel technique for testing FPGA local interconnects based on repeatable configuration modules (RCMs). In order to fully detect all the possible faults, local interconnects together with the adjacent logic blocks in an FPGA are ...

Testing techniques for interconnect and logic resources of an arbitrary design implemented into a field-programmable gate array (FPGA) are presented. The target fault list includes all stuck-at, open, and pair-wise bridging faults in the mapped design. ...