research-article

Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis

Authors:

M. Abramovici,

M. A. BreuerAuthors Info & Claims

IEEE Transactions on Computers, Volume 29, Issue 6

Pages 451 - 460

https://doi.org/10.1109/TC.1980.1675604

Published: 01 June 1980 Publication History

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Abstract

In this paper we present a new approach to multiple fault diagnosis in combinational circuits based on an effect-cause analysis. The main vehicle of our approach is the deduction of internal line values in a circuit under test N*. The knowledge of these values allows us to identify fault situations in N* (causes) which are compatible with the applied test and the obtained response (the effect). A fault situation specifies faulty as well as fault-free lines. Other applications include identifying the existence of nonstuck faults in N* and determination of faults not detected by a given test, including redundant faults. The latter application allows for the generation of tests for multiple faults without performing fault enumeration.

References

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M. Abramovici, "'Fault diagnosis in logic circuits based on effect-cause analysis," Ph.D. thesis, Univ. of Southern California, June 1980.

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C. W. Cha, "Multiple fault diagnosis in combinational networks," Univ. of Illinois, Coordinated Sci. Lab., Rep. R-650, June 1974.

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F. J. O. Dias, "Fault masking in combinational logic circuits," IEEE Trans. Comput., vol. C-24, pp. 476-482, May 1975.

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Cited By

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Pomeranz IStok LDutt NHassoun S(2011)Diagnosis of transition fault clustersProceedings of the 48th Design Automation Conference10.1145/2024724.2024824(429-434)Online publication date: 5-Jun-2011
https://dl.acm.org/doi/10.1145/2024724.2024824
Pomeranz IReddy S(2010)Selection of a fault model for fault diagnosis based on unique responsesIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2009.202550318:11(1533-1543)Online publication date: 1-Nov-2010
https://dl.acm.org/doi/10.1109/TVLSI.2009.2025503
Yu XBlanton R(2010)Diagnosis of integrated circuits with multiple defects of arbitrary characteristicsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2010.204835229:6(977-987)Online publication date: 1-Jun-2010
https://dl.acm.org/doi/10.1109/TCAD.2010.2048352
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Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis
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cover image IEEE Transactions on Computers

IEEE Transactions on Computers Volume 29, Issue 6

June 1980

142 pages

ISSN:0018-9340

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IEEE Computer Society

United States

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Published: 01 June 1980

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Pomeranz IStok LDutt NHassoun S(2011)Diagnosis of transition fault clustersProceedings of the 48th Design Automation Conference10.1145/2024724.2024824(429-434)Online publication date: 5-Jun-2011
https://dl.acm.org/doi/10.1145/2024724.2024824
Pomeranz IReddy S(2010)Selection of a fault model for fault diagnosis based on unique responsesIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2009.202550318:11(1533-1543)Online publication date: 1-Nov-2010
https://dl.acm.org/doi/10.1109/TVLSI.2009.2025503
Yu XBlanton R(2010)Diagnosis of integrated circuits with multiple defects of arbitrary characteristicsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2010.204835229:6(977-987)Online publication date: 1-Jun-2010
https://dl.acm.org/doi/10.1109/TCAD.2010.2048352
Pomeranz IReddy SBenini LDe Micheli GAl-Hashimi BMueller W(2009)Selection of a fault model for fault diagnosis based on unique responsesProceedings of the Conference on Design, Automation and Test in Europe10.5555/1874620.1874862(994-999)Online publication date: 20-Apr-2009
https://dl.acm.org/doi/10.5555/1874620.1874862
Yamazaki KTakamatsu Y(2008)A Method of Locating Open Faults on Incompletely Identified Pass/Fail InformationIEICE - Transactions on Information and Systems10.1093/ietisy/e91-d.3.661E91-D:3(661-666)Online publication date: 1-Mar-2008
https://dl.acm.org/doi/10.1093/ietisy/e91-d.3.661
Wen XMiyoshi TKajihara SWang LSaluja KKinoshita K(2004)On per-test fault diagnosis using the X-fault modelProceedings of the 2004 IEEE/ACM International conference on Computer-aided design10.1109/ICCAD.2004.1382653(633-640)Online publication date: 7-Nov-2004
https://dl.acm.org/doi/10.1109/ICCAD.2004.1382653
Lavo DLarrabee T(2001)Making Cause-Effect Cost EffectiveProceedings of the 2001 IEEE International Test Conference10.5555/839296.843736Online publication date: 30-Oct-2001
https://dl.acm.org/doi/10.5555/839296.843736
Pant PChatterjee A(2000)Path-Delay Fault Diagnosis in Non-Scan Sequential Circuits with At-Speed Test ApplicationProceedings of the 2000 IEEE International Test Conference10.5555/839295.843642Online publication date: 3-Oct-2000
https://dl.acm.org/doi/10.5555/839295.843642
Shigeta KIshiyama T(2000)An Improved Fault Diagnosis Algorithm Based on Path Tracing with Dynamic Circuit ExtractionProceedings of the 2000 IEEE International Test Conference10.5555/839295.843641Online publication date: 3-Oct-2000
https://dl.acm.org/doi/10.5555/839295.843641
Takahashi HBoateng KTakamatsu Y(1999)A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault SimulationsProceedings of the 1999 17TH IEEE VLSI Test Symposium10.5555/832299.836519Online publication date: 26-Apr-1999
https://dl.acm.org/doi/10.5555/832299.836519
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Multiple Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization

Selection of a fault model for fault diagnosis based on unique responses

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