Development of Functional Delay Tests

Functional broadside tests were defined to address overtesting that may occur with unrestricted scan-based tests. However, the fault coverage achievable by functional broadside tests is lower than the fault coverage achievable by unrestricted scan-based ...

This article studies the generation of low-power skewed-load tests such that the signal transitions (and line values) they create during their fast functional clock cycles match those of functional broadside tests. Functional broadside tests create ...

Functional broadside tests were developed to avoid overtesting of delay faults. The tests achieve this goal by creating functional operation conditions during their functional capture cycles. To increase the achievable fault coverage, close-to-...