Article

An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories

Authors:

Steven GarverickAuthors Info & Claims

DATE '05: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

Pages 592 - 597

https://doi.org/10.1109/DATE.2005.54

Published: 07 March 2005 Publication History

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Abstract

In this paper we propose a new Built in Current Sensor (BICS) to detect single event upsets in SRAM. The BICS is designed and validated for 100nm process technology. The BICS reliability analysis for process, voltage, temperature, and power supply noise are provided. This BICS detect various shapes of current pulses generated due to particle strike. The BICS power consumption and area overhead are also provided. This BICS found to be very reliable for process, voltage and temperature variation and under stringent noise conditions.

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Cited By

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Possamai Bastos RGuimares LSill Torres FFesquet L(2018)Architectures of bulk built-in current sensors for detection of transient faults in integrated circuitsMicroelectronics Journal10.1016/j.mejo.2017.11.00671:C(70-79)Online publication date: 1-Jan-2018
https://dl.acm.org/doi/10.1016/j.mejo.2017.11.006
Liu QJung CLee DTiwari DHsu WYang CLipasti MLee H(2016)Low-cost soft error resilience with unified data verification and fine-grained recovery for acoustic sensor based detectionThe 49th Annual IEEE/ACM International Symposium on Microarchitecture10.5555/3195638.3195668(1-12)Online publication date: 15-Oct-2016
https://dl.acm.org/doi/10.5555/3195638.3195668
Upasani GVera XGonzález AYew PZhai AKeckler S(2014)Avoiding core's DUE & SDC via acoustic wave detectors and tailored error containment and recoveryProceeding of the 41st annual international symposium on Computer architecuture10.5555/2665671.2665682(37-48)Online publication date: 14-Jun-2014
https://dl.acm.org/doi/10.5555/2665671.2665682
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An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories
1. Hardware

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Published In

DATE '05: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

March 2005

630 pages

ISBN:0769522882

Publisher

IEEE Computer Society

United States

Publication History

Published: 07 March 2005

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DATE05: Design, Automation and Test in Europe

March 7 - 11, 2005

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Overall Acceptance Rate 518 of 1,794 submissions, 29%

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Cited By

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Possamai Bastos RGuimares LSill Torres FFesquet L(2018)Architectures of bulk built-in current sensors for detection of transient faults in integrated circuitsMicroelectronics Journal10.1016/j.mejo.2017.11.00671:C(70-79)Online publication date: 1-Jan-2018
https://dl.acm.org/doi/10.1016/j.mejo.2017.11.006
Liu QJung CLee DTiwari DHsu WYang CLipasti MLee H(2016)Low-cost soft error resilience with unified data verification and fine-grained recovery for acoustic sensor based detectionThe 49th Annual IEEE/ACM International Symposium on Microarchitecture10.5555/3195638.3195668(1-12)Online publication date: 15-Oct-2016
https://dl.acm.org/doi/10.5555/3195638.3195668
Upasani GVera XGonzález AYew PZhai AKeckler S(2014)Avoiding core's DUE & SDC via acoustic wave detectors and tailored error containment and recoveryProceeding of the 41st annual international symposium on Computer architecuture10.5555/2665671.2665682(37-48)Online publication date: 14-Jun-2014
https://dl.acm.org/doi/10.5555/2665671.2665682
Upasani GVera XGonzález A(2014)Avoiding core's DUE & SDC via acoustic wave detectors and tailored error containment and recoveryACM SIGARCH Computer Architecture News10.1145/2678373.266568242:3(37-48)Online publication date: 14-Jun-2014
https://dl.acm.org/doi/10.1145/2678373.2665682
Reviriego PMaestro JBleakley C(2010)Reliability analysis of memories protected with BICS and a per-word parity bitACM Transactions on Design Automation of Electronic Systems10.1145/1698759.169876815:2(1-15)Online publication date: 2-Mar-2010
https://dl.acm.org/doi/10.1145/1698759.1698768
Reviriego PMaestro J(2009)Efficient error detection codes for multiple-bit upset correction in SRAMs with BICSACM Transactions on Design Automation of Electronic Systems10.1145/1455229.145524714:1(1-10)Online publication date: 23-Jan-2009
https://dl.acm.org/doi/10.1145/1455229.1455247
Garg RJayakumar NKhatri SChoi G(2009)Circuit-level design approaches for radiation-hard digital electronicsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2008.200679517:6(781-792)Online publication date: 1-Jun-2009
https://dl.acm.org/doi/10.1109/TVLSI.2008.2006795
Nagpal CGarg RKhatri SSciuto D(2008)A delay-efficient radiation-hard digital design approach using CWSP elementsProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403460(354-359)Online publication date: 10-Mar-2008
https://dl.acm.org/doi/10.1145/1403375.1403460
Garg RJayakumar NKhatri SChoi GSentovich E(2006)A design approach for radiation-hard digital electronicsProceedings of the 43rd annual Design Automation Conference10.1145/1146909.1147105(773-778)Online publication date: 24-Jul-2006
https://dl.acm.org/doi/10.1145/1146909.1147105
Neto ERibeiro IVieira MWirth GKastensmidt F(2006)Using Bulk Built-in Current Sensors to Detect Soft ErrorsIEEE Micro10.1109/MM.2006.10326:5(10-18)Online publication date: 1-Sep-2006
https://dl.acm.org/doi/10.1109/MM.2006.103
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