P. Maxwell, et al., "Current Ratios: A Self-Scaling Implementation Current Signatures for Production I _DDQ Testing," Int'l Test Conf., Atlantic City, N.J., 1999.

Google Scholar

[7]

T. Miller, "I _DDQ Testing in Deep-Submicron Integrated Circuits," Int'l Test Conf., Atlantic City, N.J., 1999.

Digital Library

Google Scholar

[8]

C. Thibeault, "A Histogram-Based Procedure for Current Testing of Active Defects," Int'l Test Conf., Atlantic City, N.J., 1999.

Digital Library

Google Scholar

[9]

S. Jandhyala, et al., "Clustering-Based Techniques for I _DDQ Testing," Int'l Test Conf., Atlantic City, N.J., 1999.

Digital Library

Google Scholar

[10]

B. Kruseman, et al., "Transient Current Testing in 0.25 μm CMOS Devices," Int'l Test Conf., Atlantic City, N.J., 1999.

Digital Library

Google Scholar

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Sabade SWalker D(2004)IDDX-based test methodsACM Transactions on Design Automation of Electronic Systems10.1145/989995.9899979:2(159-198)Online publication date: 1-Apr-2004
https://dl.acm.org/doi/10.1145/989995.989997
Sabade SWalker D(2003)Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier IdentificationProceedings of the 16th International Conference on VLSI Design10.5555/832285.835583Online publication date: 4-Jan-2003
https://dl.acm.org/doi/10.5555/832285.835583
Thibeault C(2003)On Faster IDDQ MeasurementsJournal of Electronic Testing: Theory and Applications10.1023/A:102741870494219:6(625-635)Online publication date: 1-Dec-2003
https://dl.acm.org/doi/10.1023/A%3A1027418704942
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Published In

IEEE Design & Test Volume 16, Issue 4

October 1999

110 pages

ISSN:0740-7475

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IEEE Computer Society Press

Washington, DC, United States

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Published: 01 October 1999

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Sabade SWalker D(2004)IDDX-based test methodsACM Transactions on Design Automation of Electronic Systems10.1145/989995.9899979:2(159-198)Online publication date: 1-Apr-2004
https://dl.acm.org/doi/10.1145/989995.989997
Sabade SWalker D(2003)Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier IdentificationProceedings of the 16th International Conference on VLSI Design10.5555/832285.835583Online publication date: 4-Jan-2003
https://dl.acm.org/doi/10.5555/832285.835583
Thibeault C(2003)On Faster IDDQ MeasurementsJournal of Electronic Testing: Theory and Applications10.1023/A:102741870494219:6(625-635)Online publication date: 1-Dec-2003
https://dl.acm.org/doi/10.1023/A%3A1027418704942
Thibeault C(2003)Replacing IDDQ TestingJournal of Electronic Testing: Theory and Applications10.1023/A:102376141615619:3(325-340)Online publication date: 1-Jun-2003
https://dl.acm.org/doi/10.1023/A%3A1023761416156
Okuda Y(2000)DECOUPLEProceedings of the 2000 IEEE International Test Conference10.5555/839295.843650Online publication date: 3-Oct-2000
https://dl.acm.org/doi/10.5555/839295.843650
Thibeault C(2000)Improving Delta-IDDQ-based test methodsProceedings of the 2000 IEEE International Test Conference10.5555/839295.843647Online publication date: 3-Oct-2000
https://dl.acm.org/doi/10.5555/839295.843647

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IDDQ Testing of Submicron CMOS—by Cooling?

IDDQ Testing for Submicron CMOS IC Technology Qualification

Intrinsic leakage in deep submicron CMOS ICs—measurement-based test solutions

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