[go: up one dir, main page]
More Web Proxy on the site http://driver.im/ skip to main content
article

On-Line Fault Resilience Through Gracefully Degradable ASICs

Published: 01 February 1998 Publication History

Abstract

We present two novel reconfiguration schemes, L/U reconfiguration and its generalization, band reconfiguration, to achieve graceful degradation for general microarchitecture datapaths. Upon detection of a datapath fault, hardware and algorithmic reconfigurations are performed dynamically through operation rescheduling and hardware rebinding. Instead of a complete shuffling, the proposed scheme perturbs the original schedule and binding in a systematic fashion. This regularity of the scheme allows well-structured design planning for the controller and the datapath. The underlying microarchitecture supporting such reconfiguration schemes is briefly outlined. Experimental evidence indicates negligible performance and small hardware overheads.

References

[1]
1. D.P. Siewiorek and R.S. Swarz, The Theory and Practice of Reliable System Design, Digital Press, 1992.
[2]
2. C. Stapper and R. Rosner, "Integrated Circuit Yield Management and Yield Analysis: Development and Implementation," IEEE Transactions on Semiconductor Manufacturing, Vol. 8, No. 2, pp. 95-102, May 1995.
[3]
3. R. Negrini, M.G. Sami, and R. Stefanelli. Fault Tolerance Through Reconfiguration in VLSI and WSI Arrays, MIT Press, 1989.
[4]
4. A. Orailoglu and R. Karri, "Coactive Scheduling and Checkpoint Determination During High-Level Synthesis of Self-Recovering Microarchitectures," IEEE Transactions on VLSI Systems, Vol. 2, No. 3, pp. 304-311, Sept. 1994.
[5]
5. A. Orailoglu and R. Karri, "Automatic Synthesis of Self-Recovering VLSI Systems," IEEE Transactions on Computers, Vol. 45, No. 2, pp. 131-142, Feb. 1996.
[6]
6. B. Iyer, R. Karri, and I. Koren, "Phantom Redundancy: A High-Level Synthesis Approach for Manufacturability," Proc. of Int. Conf. on Computer-Aided Design, Nov. 1995, pp. 658-661.
[7]
7. W. Chan and A. Orailoglu, "High Level Synthesis of Gracefully Degradable ASICs," Proc. of European Design and Test Conf., March 1996, pp. 50-54.

Recommendations

Comments

Please enable JavaScript to view thecomments powered by Disqus.

Information & Contributors

Information

Published In

cover image Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications  Volume 12, Issue 1-2
Special issue on On-line testing
Feb./April 1998
146 pages
ISSN:0923-8174
Issue’s Table of Contents

Publisher

Kluwer Academic Publishers

United States

Publication History

Published: 01 February 1998

Author Tags

  1. fault tolerant ICs
  2. graceful degradation
  3. high level synthesis
  4. on-line test
  5. reconfigurable ASICs

Qualifiers

  • Article

Contributors

Other Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

  • 0
    Total Citations
  • 0
    Total Downloads
  • Downloads (Last 12 months)0
  • Downloads (Last 6 weeks)0
Reflects downloads up to 23 Dec 2024

Other Metrics

Citations

View Options

View options

Media

Figures

Other

Tables

Share

Share

Share this Publication link

Share on social media