Article

Linear Test Times for Delay-Insensitive Circuits: a Compilation Strategy

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Marly Roncken,

Ronald SaeijsAuthors Info & Claims

Proceedings of the IFIP WG10.5 Working Conference on Asynchronous Design Methodologies

Pages 13 - 27

Published: 31 March 1993 Publication History

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Khoche ABrunvand E(1997)ACTProceedings of the 1997 IEEE International Test Conference10.5555/844384.845849Online publication date: 1-Nov-1997
https://dl.acm.org/doi/10.5555/844384.845849
Kishinevsky MKondratyev ALavagno LSaldanha ATaubin AOtten RYasuura H(1997)Partial scan delay fault testing of asynchronous circuitsProceedings of the 1997 IEEE/ACM international conference on Computer-aided design10.5555/266388.266622(728-735)Online publication date: 13-Nov-1997
https://dl.acm.org/doi/10.5555/266388.266622
Roig OCortadella JPeña MPastor EYoffa EDe Micheli GRabaey J(1997)Automatic generation of synchronous test patterns for asynchronous circuitsProceedings of the 34th annual Design Automation Conference10.1145/266021.266300(620-625)Online publication date: 13-Jun-1997
https://dl.acm.org/doi/10.1145/266021.266300
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Proceedings of the IFIP WG10.5 Working Conference on Asynchronous Design Methodologies

March 1993

209 pages

ISBN:0444815996

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North-Holland Publishing Co.

Netherlands

Publication History

Published: 31 March 1993

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Khoche ABrunvand E(1997)ACTProceedings of the 1997 IEEE International Test Conference10.5555/844384.845849Online publication date: 1-Nov-1997
https://dl.acm.org/doi/10.5555/844384.845849
Kishinevsky MKondratyev ALavagno LSaldanha ATaubin AOtten RYasuura H(1997)Partial scan delay fault testing of asynchronous circuitsProceedings of the 1997 IEEE/ACM international conference on Computer-aided design10.5555/266388.266622(728-735)Online publication date: 13-Nov-1997
https://dl.acm.org/doi/10.5555/266388.266622
Roig OCortadella JPeña MPastor EYoffa EDe Micheli GRabaey J(1997)Automatic generation of synchronous test patterns for asynchronous circuitsProceedings of the 34th annual Design Automation Conference10.1145/266021.266300(620-625)Online publication date: 13-Jun-1997
https://dl.acm.org/doi/10.1145/266021.266300
Piestrak SNanya T(1995)Towards Totally Self-Checking Delay-Insensitive SystemsProceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing10.5555/874064.875618Online publication date: 27-Jun-1995
https://dl.acm.org/doi/10.5555/874064.875618
Lavagno LLioy AKishinevsky MMermet J(1994)Testing redundant asynchronous circuits by variable phase splittingProceedings of the conference on European design automation10.5555/198174.198278(328-333)Online publication date: 23-Sep-1994
https://dl.acm.org/doi/10.5555/198174.198278
van Berkel KBurgess RKessels JRoncken MSchalij FPeeters A(1994)Asynchronous Circuits for Low PowerIEEE Design & Test10.1109/54.28244211:2(22-32)Online publication date: 1-Apr-1994
https://dl.acm.org/doi/10.1109/54.282442

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Fast functional testing of delay-insensitive circuits

Delay-Insensitive Carry-Lookahead Adders

Testing delay-insensitive circuits

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