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DC Characteristics and Variability on 90nm CMOS Transistor Array-Style Analog Layout

Published: 11 May 2016 Publication History

Abstract

In the MOS analog layout, variability suppression is becoming a major issue, as is layout efficiency. Introducing a transistor array (TA) style to analog layout, this article addresses the layout-dependent variability based on the measurement results of test chips on 90nm CMOS process. In TA style, a large transistor is decomposed into a set of unified subtransistors, which are connected in series or parallel. Focusing on one row layout of diffusion sharing for the multiple gates, we analyze the current direction-dependent variability and the leakage current via off-gates for the electrical isolation. Furthermore, we present several analog design cases on TA including analysis of the impact on the DC characteristics caused by the transistor channel decomposition.

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  • (2019)Density Optimization for Analog Layout Based on Transistor-ArrayIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1587/transfun.E102.A.1720E102.A:12(1720-1730)Online publication date: 1-Dec-2019
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  1. DC Characteristics and Variability on 90nm CMOS Transistor Array-Style Analog Layout

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      Published In

      cover image ACM Transactions on Design Automation of Electronic Systems
      ACM Transactions on Design Automation of Electronic Systems  Volume 21, Issue 3
      Special Section on New Physical Design Techniques for the Next Generation Integration Technology and Regular Papers
      July 2016
      434 pages
      ISSN:1084-4309
      EISSN:1557-7309
      DOI:10.1145/2926747
      • Editor:
      • Naehyuck Chang
      Issue’s Table of Contents
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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      Association for Computing Machinery

      New York, NY, United States

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      Publication History

      Published: 11 May 2016
      Accepted: 01 January 2016
      Revised: 01 November 2015
      Received: 01 July 2015
      Published in TODAES Volume 21, Issue 3

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      Author Tags

      1. Direct current characteristics
      2. diffusion sharing
      3. isolation gates
      4. transistor array-style analog layout
      5. variability of threshold voltage

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      • Research-article
      • Research
      • Refereed

      Funding Sources

      • Variability-Tolerant Analog LSI Design Methodology Based on Fine Grain Transistor Array
      • Semiconductor Technology Academic Research Center (STARC)

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      View all
      • (2023)A fast MILP solver for high-level synthesis based on heuristic model reduction and enhanced branch and bound algorithmThe Journal of Supercomputing10.1007/s11227-023-05109-279:11(12042-12073)Online publication date: 1-Jul-2023
      • (2020)A full-transistor fine-grain multilevel delay element with compact regularity layoutAnalog Integrated Circuits and Signal Processing10.1007/s10470-020-01588-y103:1(163-172)Online publication date: 3-Feb-2020
      • (2019)Density Optimization for Analog Layout Based on Transistor-ArrayIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1587/transfun.E102.A.1720E102.A:12(1720-1730)Online publication date: 1-Dec-2019
      • (2018)Routable and Matched Layout Styles for Analog Module GenerationACM Transactions on Design Automation of Electronic Systems10.1145/318216923:4(1-17)Online publication date: 28-Jun-2018
      • (2017)Explicit layout pattern density controlling based on transistor-array-style2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)10.1109/MWSCAS.2017.8053233(1557-1560)Online publication date: Aug-2017
      • (2016)Layout-dependent effect evaluation of transistor array-style phase locked loop2016 IEEE Region 10 Conference (TENCON)10.1109/TENCON.2016.7848449(2346-2349)Online publication date: Nov-2016

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