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Generic low-cost characterization of V_th and mobility variations in LTPS TFTs for non-uniformity calibration of active-matrix OLED displays

Authors:

Javid JaffariAuthors Info & Claims

DAC '12: Proceedings of the 49th Annual Design Automation Conference

Pages 182 - 187

https://doi.org/10.1145/2228360.2228396

Published: 03 June 2012 Publication History

Abstract

Active-matrix organic light emitting diode displays are prone to significant V_th and mobility variations in low-temperature polycrystalline-silicon thin-film transistors. A low-cost characterization of these variations can lead to a practical external calibration and simulation of the display non-uniformity. This paper proposes a generic methodology based on principal component analysis, relying on the display current levels corresponding to applied characterization images. This technique results in simultaneous characterization of the V_th and mobility for the entire active matrix. Measurement results show that taking advantage of spatial correlation leads to 100 times reduction in characterization time with less than 30% relative error.

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Cited By

Li YLi NWang JLi GWu WLi M(2013)The Development and Application of Video’s Color Gamut Test SequenceThe Proceedings of the Second International Conference on Communications, Signal Processing, and Systems10.1007/978-3-319-00536-2_23(195-201)Online publication date: 24-Oct-2013
https://doi.org/10.1007/978-3-319-00536-2_23

Index Terms

Generic low-cost characterization of V_th and mobility variations in LTPS TFTs for non-uniformity calibration of active-matrix OLED displays
1. Applied computing
  1. Physical sciences and engineering
    1. Electronics
2. Hardware
  1. Hardware validation
    1. Functional verification

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Information & Contributors

Information

Published In

cover image ACM Conferences

DAC '12: Proceedings of the 49th Annual Design Automation Conference

June 2012

1357 pages

ISBN:9781450311991

DOI:10.1145/2228360

General Chair:
Patrick Groeneveld
Magma Design Automation, Inc., San Jose, CA
,
Program Chairs:
Donatella Sciuto
Politecnico di Milano, Milano, Italy
,
Soha Hassoun
Tufts Univ., Medford, MA

Copyright © 2012 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CEDA

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SIGBED: ACM Special Interest Group on Embedded Systems

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 03 June 2012

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DAC '12: The 49th Annual Design Automation Conference 2012

June 3 - 7, 2012

California, San Francisco

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

Li YLi NWang JLi GWu WLi M(2013)The Development and Application of Video’s Color Gamut Test SequenceThe Proceedings of the Second International Conference on Communications, Signal Processing, and Systems10.1007/978-3-319-00536-2_23(195-201)Online publication date: 24-Oct-2013
https://doi.org/10.1007/978-3-319-00536-2_23

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