P‐38: Unique Electrical Measurement Technology for Compensation, Inspection, and Process Diagnostics of AMOLED HDTV
S Alexander, GR Chaji, JM Dionne… - … Symposium Digest of …, 2010 - Wiley Online Library
S Alexander, GR Chaji, JM Dionne, C Church, J Hamer, A Nathan
SID Symposium Digest of Technical Papers, 2010•Wiley Online LibraryA unique measurement and compensation technology for AMOLED high definition television
is presented. The technique electrically measures every TFT and OLED in the backplane,
useful for inspection and diagnostics in the factory, and subsequent compensation of mura,
TFT‐and OLED‐degradation.
is presented. The technique electrically measures every TFT and OLED in the backplane,
useful for inspection and diagnostics in the factory, and subsequent compensation of mura,
TFT‐and OLED‐degradation.
Abstract
A unique measurement and compensation technology for AMOLED high definition television is presented. The technique electrically measures every TFT and OLED in the backplane, useful for inspection and diagnostics in the factory, and subsequent compensation of mura, TFT‐ and OLED‐degradation.
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