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A variable observation time method for testing delay faults

Authors:

Wei-Wei Mao,

Michael D. CilettiAuthors Info & Claims

DAC '90: Proceedings of the 27th ACM/IEEE Design Automation Conference

Pages 728 - 731

https://doi.org/10.1145/123186.123454

Published: 03 January 1991 Publication History

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Abstract

Test methodologies for delay faults usually observe output patterns at a single observation time, and the same observation time is used for all faults in the circuit under test. In this paper we show that use of a single observation time is not advantageous for testing delay faults, and we are able to show that the detection threshold can be dramatically improved by using a testing methodology that allows variable, fault-dependent and output-dependent observation times. A “waveform-type” simulation method is used for calculating detection thresholds for definitely detectable faults. Statistical distributions of delay fault detection thresholds are presented for ten benchmark circuits.

References

[1]

W.Mao, M.D.Ciletti, "A Simplified Six-Waveform Type Method for Delay Fault Testing," Proc. of the 26tla Design AutomaIion Conf., pp.730-733.

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[2]

V.S. Iyengar, B.K. Rosen, and I. Spillinger, "Delay Test Generation 1 -- Concepts and Coverage Metrics," 1988 IEEE ITC, pp.857-866.

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V.S. Iyengar, B.K. Rosen, and I. Spillinger, "Delay Test Generation 2 -- Algebra and Algorithm," 1988 IEEE ITC, pp.867-876.

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G.L. Smith, "Model for Delay Faults Upon Path," 1985 IEEE ITC, pp.342-349.

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J.L. Carter, V.S. Iyengar, and B.K. Rosen, "Efficient Test Coverage Determination for Delay Faults," 1987 IEEE ITC,

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Cited By

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Liu CSchneider EWunderlich HDi Natale GFummi F(2020)Using programmable delay monitors for wear-out and early life failure predictionProceedings of the 23rd Conference on Design, Automation and Test in Europe10.5555/3408352.3408535(804-809)Online publication date: 9-Mar-2020
https://dl.acm.org/doi/10.5555/3408352.3408535
Pomeranz I(2013)Built-in generation of multicycle functional broadside tests with observation pointsACM Transactions on Design Automation of Electronic Systems10.1145/253439619:1(1-17)Online publication date: 20-Dec-2013
https://dl.acm.org/doi/10.1145/2534396
Datta RSebastine ARaghunathan ACarpenter GNowka KAbraham J(2010)On-Chip Delay Measurement Based Response Analysis for Timing CharacterizationJournal of Electronic Testing: Theory and Applications10.1007/s10836-010-5188-126:6(599-619)Online publication date: 1-Dec-2010
https://dl.acm.org/doi/10.1007/s10836-010-5188-1
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Index Terms

A variable observation time method for testing delay faults
1. Hardware

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Information

Published In

DAC '90: Proceedings of the 27th ACM/IEEE Design Automation Conference

January 1991

742 pages

ISBN:0897913639

DOI:10.1145/123186

Chairman:
Richard C. Smith

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 03 January 1991

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DAC90

Sponsor:

SIGDA
IEEE-CS

DAC90: The 27th ACM/IEEE-CS Design Automation Conference

June 24 - 27, 1990

Florida, Orlando, USA

Acceptance Rates

DAC '90 Paper Acceptance Rate 125 of 427 submissions, 29%;

Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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June 22 - 26, 2025

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Cited By

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Liu CSchneider EWunderlich HDi Natale GFummi F(2020)Using programmable delay monitors for wear-out and early life failure predictionProceedings of the 23rd Conference on Design, Automation and Test in Europe10.5555/3408352.3408535(804-809)Online publication date: 9-Mar-2020
Pomeranz I(2013)Built-in generation of multicycle functional broadside tests with observation pointsACM Transactions on Design Automation of Electronic Systems10.1145/253439619:1(1-17)Online publication date: 20-Dec-2013
Datta RSebastine ARaghunathan ACarpenter GNowka KAbraham J(2010)On-Chip Delay Measurement Based Response Analysis for Timing CharacterizationJournal of Electronic Testing: Theory and Applications10.1007/s10836-010-5188-126:6(599-619)Online publication date: 1-Dec-2010
Pomeranz IReddy S(2008)Improving the transition fault coverage of functional broadside tests by observation point insertionIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2008.200045316:7(931-936)Online publication date: 1-Jul-2008
Wang (2007)System-on-Chip Test ArchitecturesundefinedOnline publication date: 20-Nov-2007
Wang LWu CWen X(2006)VLSI Test Principles and ArchitecturesundefinedOnline publication date: 14-Aug-2006
Sharma MPatel J(2004)What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit?Proceedings of the 22nd IEEE VLSI Test Symposium10.5555/987684.987967Online publication date: 25-Apr-2004
Liou JWang LCheng KDworak JMercer MKapur RWilliams TAckland B(2002)Enhancing test efficiency for delay fault testing using multiple-clocked schemesProceedings of the 39th annual Design Automation Conference10.1145/513918.514013(371-374)Online publication date: 10-Jun-2002
Ubar RJutman APeng Z(2001)Timing simulation of digital circuits with binary decision diagramsProceedings of the conference on Design, automation and test in Europe10.5555/367072.367324(460-466)Online publication date: 13-Mar-2001
Pomeranz IReddy S(1998)Delay fault models for VLSI circuitsIntegration, the VLSI Journal10.1016/S0167-9260(98)00019-426:1-2(21-40)Online publication date: 1-Dec-1998
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Recommendations

On testing of delay faults in logic circuits

Transition path delay faults: a new path delay fault model for small and large delay defects

Delay Fault Coverage Enhancement Using Variable Observation Times