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A fault analysis method for synchronous sequential circuits

Authors:

T. Y. Kuo,

J. Y. Lee,

J. F. WangAuthors Info & Claims

DAC '90: Proceedings of the 27th ACM/IEEE Design Automation Conference

Pages 732 - 735

https://doi.org/10.1145/123186.123455

Published: 03 January 1991 Publication History

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Abstract

In this paper we extend the use of the fault analysis method dealing with combinational circuits[1] to synchronous sequential circuits. Using the iterative array model, extended forward propagation and backward implication are performed. based on the observed values at primary outputs, to deduce the actual values of each line to determine its fault status. Any stuck fault can be identified, even in a circuit without any initialization sequence. A fault which is covered is tested unconditionally; thus the results obtained would not be invalidated in the presence of untested or untestable lines. Examples will be given to demonstrate the ability of our method.

References

[1]

H.Cox and J. Rajski, "A method of {ault analysis for test generation and fault diagnosis," IEEE Trans. CAD, vol. 7, No. 7, pp.813-833, July 1988.

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[2]

M. Abramovici and M. A. Breuer, "Multiple fault diagnosis in combinational circuits based on an effect---cause analvsis," tEEE Trans. Comput., vol. C-29, pp.45I--46(}, June 1980.

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[3]

T. Yano and H. Okamoto, "Fast fault diagnostic method using fault dictionary for el.ectron beam tester,a~ in Proc. IEEE Int. Test Conf., Sept. 1987, pp.561-565.

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[4]

A.D. Friedman, J'Fault detection in redundant circuits," IEEE Trans. Comput., vol. EC-16, pp.99--t00, Feb. 1967.

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[5]

F. Brglez, D. Bryan, and K. Kozminski, "Combinational prbfiles of sequential benchmark circuits," ISCAS'89, pp.1929-1934, June 1989.

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Index Terms

A fault analysis method for synchronous sequential circuits
1. Hardware

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Published In

DAC '90: Proceedings of the 27th ACM/IEEE Design Automation Conference

January 1991

742 pages

ISBN:0897913639

DOI:10.1145/123186

Chairman:
Richard C. Smith

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 03 January 1991

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DAC90

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SIGDA
IEEE-CS

DAC90: The 27th ACM/IEEE-CS Design Automation Conference

June 24 - 27, 1990

Florida, Orlando, USA

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DAC '90 Paper Acceptance Rate 125 of 427 submissions, 29%;

Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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