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Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage

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Abstract

Scanning electron microscopy has been extensively used for the material characterization of objects of artistic and archaeological importance, especially in combination with energy dispersive X-ray microanalysis (SEM/EDX). The advantages and limitations of SEM/EDX are presented in a few case studies: analysis of pigments in cross-sections of paint layers, quantitative analysis of archaeological glass from the Roman period excavated in Ephesos/Turkey, and investigations on glasses with medieval composition concerning their weathering stability and degradation phenomena.

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Acknowledgements

The authors want to express their sincere thanks to the following people for their co-operation, intense discussions of the objectives and the results obtained by analysis: Dr. B. Czurda, Österreichisches Archäologisches Institut (Austrian Archaeological Institute), Vienna/Austria, Dr. R. Linke, Bundesdenkmalamt (Federal Office for the Preservation of Austrian Cultural Heritage), Vienna/Austria and Dr. K. Kreislova, SVUOM Ltd., Prague/Czech Republic.

Prof. Dr. G. Friedbacher, Institute for Chemical Technologies and Analytics, Vienna University of Technology and Prof. Dr. J. Wernisch, Institute of Solid State Physics, Vienna University of Technology, Vienna/Austria, are greatfully acknowledged for enabling the SEM/EDX measurements at the Jeol 6400 combined with Philips EDAX Phoenix and Philips ESEM XL30, respectively.

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Authors and Affiliations

  1. Institute of Science and Technology in Art, Academy of Fine Arts, Schillerplatz 3, 1010, Vienna, Austria

    Manfred Schreiner, Michael Melcher & Katharina Uhlir

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  1. Manfred Schreiner
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Correspondence to Manfred Schreiner.

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Schreiner, M., Melcher, M. & Uhlir, K. Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage. Anal Bioanal Chem 387, 737–747 (2007). https://doi.org/10.1007/s00216-006-0718-5

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