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Using Synchrotron Radiation for Characterization of Cultural Heritage Materials

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Synchrotron Light Sources and Free-Electron Lasers

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Abstract

The literature on the use of synchrotron radiation-based methods, such as X-ray fluorescence spectrometry (XRF), X-ray absorption spectroscopy (XAS), and X-ray powder diffraction (XRPD) for characterization of cultural heritage (CH) materials and for gaining a deeper insight in the spontaneous degradation phenomena they are subjected to, is reviewed. In the CH context, the combination of the aforementioned methods is capable of providing information of the elemental and/or (crystal) phase composition of a material. Since CH materials usually are composed of multiple compounds, often mixed together in a strongly heterogeneous manner, these are mostly the laterally resolved variants of the abovementioned methods that find application in CH studies. In a concluding outlook session, some new methodological developments are outlined that may become relevant for characterization of CH artefacts and materials in the near future.

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Abbreviations

AD:

Anno Domini

ATR:

Attenuated total reflection

BC:

Before Christ

CH:

Cultural heritage

CY:

Chrome yellow

EDS:

Energy-dispersive X-ray spectrometry

EPMA:

Electron probe microanalysis

EXAFS:

Extended X-ray absorption fine structure

FF:

Full field

FIB:

Focused ion beam

FS:

Full scale

FTIR:

Fourier transform infrared spectroscopy

MA-XRF:

Macroscopic X-ray fluorescence scanning

μ-CT:

Microscopic X-ray computed tomography

PDF:

Powder Diffraction File

RGB:

Red, green, blue

RIXS:

Resonant inelastic X-ray scattering

RS:

Raman spectroscopy

SEM:

Scanning electron microscope

SEM-EDX:

Scanning electron microscopy with energy-dispersive X-ray spectroscopy

SR:

Synchrotron radiation

STXM:

Scanning transmission X-ray microscopy

TEM:

Transmission electron microscopy

TXM:

Transmission X-ray microscopy

UV:

Ultraviolet

VIS:

Visible

XANES:

X-ray absorption near edge spectroscopy

XAS:

X-ray absorption spectroscopy

XEOL:

X-ray excited optical luminescence

XES:

X-ray emission spectroscopy

XRF:

X-ray fluorescence spectrometry

XRPD:

X-ray powder diffraction

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Authors and Affiliations

  1. Department of Chemistry, University of Antwerp, Antwerpen, Belgium

    Koen Janssens

  2. European Synchrotron Radiation Facility, Grenoble, France

    Marine Cotte

  3. Laboratoire d’Archéologie Moléculaire et Structurale (LAMS), Sorbonne Université, CNRS, UMR8220, Paris, France

    Marine Cotte

Authors
  1. Koen Janssens
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  2. Marine Cotte
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Correspondence to Koen Janssens .

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Editors and Affiliations

  1. Helmholtz-Zentrum Berlin, BESSY II, Berlin, Germany

    Eberhard J. Jaeschke

  2. Zentrum für Synchrotronstrahlung (DELTA), Technische Universität Dortmund, Dortmund, Germany

    Shaukat Khan

  3. Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany

    Jochen R. Schneider

  4. Linac Coherent Light Source, SLAC National Accelerator Laboratory Linac Coherent Light Source, Menlo Park, CA, USA

    Jerome B. Hastings

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Janssens, K., Cotte, M. (2020). Using Synchrotron Radiation for Characterization of Cultural Heritage Materials. In: Jaeschke, E., Khan, S., Schneider, J., Hastings, J. (eds) Synchrotron Light Sources and Free-Electron Lasers. Springer, Cham. https://doi.org/10.1007/978-3-030-23201-6_78

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