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Stefano Aresu
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2020 – today
- 2023
- [c1]Alessandro Grossi, Matteo Coppetta, Stefano Aresu, Andreas Kux, Thomas Kern, Robert Strenz:
28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers. IMW 2023: 1-4
2010 – 2019
- 2014
- [j10]C. Olk, Stefano Aresu, R. Rudolf, M. Röhner, Wolfgang Gustin, E. Stein Von Kamienski:
HCS degradation of 5 nm oxide high-voltage PLDMOS. Microelectron. Reliab. 54(9-10): 1883-1886 (2014) - 2012
- [j9]Karina Rott, Hans Reisinger, Stefano Aresu, Christian Schlünder, Klaus Kölpin, Wolfgang Gustin, Tibor Grasser
:
New insights on the PBTI phenomena in SiON pMOSFETs. Microelectron. Reliab. 52(9-10): 1891-1894 (2012)
2000 – 2009
- 2008
- [j8]Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin:
NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique. Microelectron. Reliab. 48(8-9): 1310-1312 (2008) - [j7]Reinhard Pufall, Werner Kanert, Stefano Aresu, Michael Goroll:
Reduction of test effort. Looking for more acceleration for reliable components for automotive applications. Microelectron. Reliab. 48(8-9): 1490-1493 (2008) - [j6]Michael Goroll, Reinhard Pufall, Stefano Aresu, Wolfgang Gustin:
New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure. Microelectron. Reliab. 48(8-9): 1509-1512 (2008) - 2007
- [j5]Stefano Aresu, Werner Kanert, Reinhard Pufall, Michael Goroll:
Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors. Microelectron. Reliab. 47(9-11): 1416-1418 (2007) - [j4]Michael Goroll, Werner Kanert, Reinhard Pufall, Stefano Aresu:
Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices. Microelectron. Reliab. 47(9-11): 1512-1516 (2007) - 2004
- [j3]Stefano Aresu, Ward De Ceuninck, Geert Van den Bosch, Guido Groeseneken
Evidence for source side injection hot carrier effects on lateral DMOS transistors. Microelectron. Reliab. 44(9-11): 1621-1624 (2004) - 2003
- [j2]Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca
A new method for the analysis of high-resolution SILC data. Microelectron. Reliab. 43(9-11): 1483-1488 (2003) - 2002
- [j1]Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca
High-resolution SILC measurements of thin SiO2 at ultra low voltages. Microelectron. Reliab. 42(9-11): 1485-1489 (2002)
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