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Tiago R. Balen
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2020 – today
- 2024
- [c40]Clayton R. Farias, Tiago R. Balen, Paulo F. Butzen:
Cross-Section Estimation for Assessment of Circuit Susceptibility to Radiation. LATS 2024: 1-6 - [c39]Gustavo Paz Platcheck
, Guilherme Schwanke Cardoso, Tiago R. Balen:
Behavioral and Variability Analysis of Enclosed Layout Transistors for Radiation Hardened Analog Circuits. LATS 2024: 1-6 - 2023
- [j14]Tiago R. Balen
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. J. Electron. Test. 39(4): 409-420 (2023) - [j13]Gustavo Paz Platcheck
Pseudosymmetric Enclosed Layout Transistors for Radiation Hardened Analog Applications. IEEE Trans. Aerosp. Electron. Syst. 59(2): 2072-2076 (2023) - [c38]Állan G. Ferreira, Lucas B. Zilch, Vinícius Navarro, Marcelo Soares Lubaszewski, Tiago R. Balen:
Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits. SBCCI 2023: 1-6 - 2022
- [c37]Bruno Canal, Hamilton Klimach, Sergio Bampi, Tiago R. Balen:
Hybrid Comparator and Window Switching Scheme for low-power SAR ADC. LASCAS 2022: 1-4 - [c36]Clayton R. Farias, Rafael B. Schvittz, Tiago R. Balen, Paulo F. Butzen
Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method. LATS 2022: 1-6 - [c35]Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen:
Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool. LATS 2022: 1-6 - [c34]Bruno Canal, Hamilton Duarte Klimach, Sergio Bampi, Tiago R. Balen:
Time Assisted SAR ADC with Bit-guess and Digital Error Correction. SBCCI 2022: 1-6 - [c33]Rodrigo N. Wuerdig, Bruno Canal, Tiago R. Balen, Sergio Bampi:
Designing a 9.3μW Low-Power Time-to-Digital Converter (TDC) for a Time Assisted SAR ADC. SBCCI 2022: 1-6 - 2021
- [j12]Carlos J. González
Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. J. Electron. Test. 37(3): 329-343 (2021) - [j11]Thiago Copetti
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. J. Electron. Test. 37(3): 383-394 (2021) - [c32]Tiago R. Balen, Carlos J. González
Reliability Evaluation of Voters for Fault Tolerant Approximate Systems. LATS 2021: 1-6 - 2020
- [j10]Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls:
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects. J. Electron. Test. 36(2): 271-284 (2020) - [j9]Leonardo Bisch Piccoli
Design of an Integrated System for On-line Test and Diagnosis of Rotary Actuators. J. Electron. Test. 36(4): 547-553 (2020) - [c31]Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen:
Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS 2020: 1-6 - [c30]Bruno L. Costa, Carlos J. González
Influence of sampling frequency on TID response of SAR ADCs. LATS 2020: 1-6 - [c29]Bruno Canal, Hamilton Duarte Klimach, Sergio Bampi
Low-Voltage Dynamic Comparator with Bulk-Driven Floating Inverter Amplifier. SBCCI 2020: 1-6 - [c28]Gustavo Paz Platcheck
Characterization of Enclosed Layout Transistors for Analog Applications on a130nm Technology. SBCCI 2020: 1-6
2010 – 2019
- 2019
- [j8]G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen:
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. J. Electron. Test. 35(2): 191-200 (2019) - [c27]Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls:
A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. LATS 2019: 1-6 - [c26]Luiz G. S. Dias, Carlos J. González
Electromagnetic Immunity Test of Analog-to-Digital Interfaces of a Mixed-Signal Programmable SoC. LATS 2019: 1-5 - 2018
- [c25]G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen:
Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. LATS 2018: 1-6 - 2017
- [j7]Thales E. Becker, Alisson J. C. Lanot, Guilherme Schwanke Cardoso, Tiago R. Balen
Single event transient effects on charge redistribution SAR ADCs. Microelectron. Reliab. 73: 22-35 (2017) - [c24]André Lucas Chinazzo, Paulo César Comassetto de Aguirre
Low cost automatic test vector generation for structural analog testing. LATS 2017: 1-4 - [c23]Carlos J. González
Evaluation of a mixed-signal design diversity system under radiation effects. LATS 2017: 1-6 - [c22]Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls:
Analyzing the behavior of FinFET SRAMs with resistive defects. VLSI-SoC 2017: 1-6 - [c21]Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen:
Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. VLSI-SoC (Selected Papers) 2017: 22-45 - 2016
- [j6]Daniel Fusco, Tiago R. Balen:
Radiation Effects in Low Power and Ultra-Low Power Voltage References. J. Low Power Electron. 12(4): 403-412 (2016) - [c20]Guilherme Schwanke Cardoso, Tiago R. Balen:
Study of layout extraction accuracy on W/L estimation of ELT in analog design flow. LASCAS 2016: 279-282 - [c19]Daniel Fusco, Tiago R. Balen:
Radiation effects in low power and ultra low power voltage references. LATS 2016: 111-116 - [c18]Guilherme Schwanke Cardoso, Tiago R. Balen:
Performance evaluation of radiation hardened analog circuits based on Enclosed Layout geometry. LATS 2016: 123-128 - 2015
- [j5]Cristiano P. Chenet, Lucas A. Tambara, Gabriel de M. Borges, Fernanda Lima Kastensmidt
Exploring design diversity redundancy to improve resilience in mixed-signal systems. Microelectron. Reliab. 55(12): 2833-2844 (2015) - [c17]Isis D. Bender, Guilherme Schwanke Cardoso, Arthur C. de Oliveira, Lucas C. Severo
Testing fully differential amplifiers using common mode feedback circuit: A case study. LASCAS 2015: 1-4 - 2014
- [c16]Cristiano P. Chenet, Alisson J. C. Lanot, Tiago R. Balen:
Design diversity redundancy with spatial-temporal voting applied to data acquisition systems. LATW 2014: 1-6 - [c15]Alisson J. C. Lanot, Tiago R. Balen:
Analysis of the effects of single event transients on an SAR-ADC based on charge redistribution. LATW 2014: 1-5 - [c14]Alisson J. C. Lanot, Tiago R. Balen:
Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects. SBCCI 2014: 17:1-17:7 - 2013
- [c13]Lucas A. Tambara, Fernanda Lima Kastensmidt
Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC. ISVLSI 2013: 188-193 - 2012
- [c12]Guilherme Schwanke Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez
Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. LATW 2012: 1-6 - 2011
- [j4]Luiz Fernando Gonçalves, Jefferson Luiz Bosa, Tiago Roberto Balen, Marcelo Lubaszewski, Eduardo Luis Schneider
Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps. J. Electron. Test. 27(4): 551-564 (2011) - [c11]Tiago R. Balen, Guilherme Schwanke Cardoso, Odair Lelis Gonçalez
Investigating the effects of transient faults in Programmable Capacitor Arrays. LATW 2011: 1-6 - 2010
- [c10]Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. ETS 2010: 261 - [c9]Tiago R. Balen, Marcelo Lubaszewski:
Radiation effects on programmable analog devices and mitigation techniques. IOLTS 2010: 136 - [c8]Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Diversity TMR: Proof of concept in a mixed-signal case. LATW 2010: 1-6 - [c7]Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity. SBCCI 2010: 134-139
2000 – 2009
- 2009
- [c6]Franco Leite, Tiago R. Balen, Marcos Hervé, Marcelo Lubaszewski, Gilson I. Wirth
Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors. LATW 2009: 1-6 - 2007
- [j3]Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electron. Test. 23(6): 497-512 (2007) - [c5]Tiago R. Balen, Fernanda Lima Kastensmidt
Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. ISVLSI 2007: 192-197 - 2006
- [c4]Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
Functional Test of Field Programmable Analog Arrays. VTS 2006: 326-333 - 2005
- [j2]Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell:
Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. J. Electron. Test. 21(2): 135-146 (2005) - [j1]Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell:
Built-in self-test of global interconnects of field programmable analog arrays. Microelectron. J. 36(12): 1112-1123 (2005) - [c3]Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell:
Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS 2005: 389-394 - 2004
- [c2]Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski:
Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC 2004: 893-902 - [c1]Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell:
An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. VTS 2004: 383-388
Coauthor Index
aka: Marcelo Soares Lubaszewski
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last updated on 2024-10-07 21:18 CEST by the dblp team
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