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"Analyzing the behavior of FinFET SRAMs with resistive defects."

Thiago Santos Copetti et al. (2017)

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DOI: 10.1109/VLSI-SOC.2017.8203483

access: closed

type: Conference or Workshop Paper

metadata version: 2017-12-20

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Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls:
Analyzing the behavior of FinFET SRAMs with resistive defects. VLSI-SoC 2017: 1-6

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