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"Using Bulk Built-In Current Sensors and recomputing techniques to mitigate ..."

Franco Leite et al. (2009)

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DOI: 10.1109/LATW.2009.4813790

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-06

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Franco Leite, Tiago R. Balen, Marcos Hervé, Marcelo Lubaszewski, Gilson I. Wirth:
Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors. LATW 2009: 1-6

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