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Journal of Electronic Testing, Volume 39
Volume 39, Number 1, February 2023
- Vishwani D. Agrawal:
Editorial. 1-2 - Journal of Electronic Testing: Theory and Applications New Editors - 2023. 3-4
- 2022 Reviewers. 5-6
- Test Technology Newsletter. 7-9
- Bahareh Asadi
, Syed Maqsood Zia
Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey. 11-25 - Zahra Paria Najafi-Haghi
Identifying Resistive Open Defects in Embedded Cells under Variations. 27-40 - Wenrun Xiao, Jidong Diao, Yanping Qiao, Xianming Liu, Shan He, Donghui Guo:
Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit. 41-55 - Isaac Bruce
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. 57-69 - Xiaozhi Du
DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram. 71-88 - Sourav Ghosh
Fault Detection and Diagnosis of DMFB Using Concurrent Electrodes Actuation. 89-102 - Jake Elliot
An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends. 103-110 - Raghavendra Kumar Sakali, Sk. Noor Mahammad
Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction Algorithm. 111-122
Volume 39, Number 2, April 2023
- Vishwani D. Agrawal:
Editorial. 123 - Test Technology Newsletter. 125-127
- Wenjing Tang
Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network. 129-140 - Naveenkumar R
Design of INV/BUFF Logic Locking For Enhancing the Hardware Security. 141-153 - Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. 155-170 - Tommaso Melis
Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications. 171-187 - Tai Song
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation. 189-205 - Chung-Huang Yeh
Multiple Retest Systems for Screening High-Quality Chips. 207-225 - Hui Jiang
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift. 227-243 - Ahmad Menbari
A Tunable Concurrent BIST Design Based on Reconfigurable LFSR. 245-262
Volume 39, Number 3, June 2023
- Vishwani D. Agrawal:
Editorial. 263-264 - Test Technology Newsletter. 265-266
- Benedikt Jooß
Modular Test Kit - A Modular Approach for Efficient and Function-Oriented Testing. 267-274 - Karine Coulié
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations. 275-288 - Zhengfeng Huang, Hao Wang
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets. 289-301 - Sabyasachi Deyati
BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems. 303-322 - Pradeep Kumar Biswal
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits. 323-346 - Bahman Arasteh
A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization Algorithm. 347-370 - Vijaypal Singh Rathor
Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection. 371-385 - Kunwer Mrityunjay Singh
Incomplete Testing of SOC. 387-402
Volume 39, Number 4, August 2023
- Vishwani D. Agrawal:
Editorial. 403-404 - Test Technology Newsletter. 405-407
- Tiago R. Balen
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. 409-420 - R. Saravana Ram, M. Lordwin Cecil Prabhaker:
Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network. 421-433 - Tianyi Shao, Bohua Wei
New Second-order Threshold Implementation of Sm4 Block Cipher. 435-445 - Tapobrata Dhar
Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan Detection. 447-463 - Richa Sharma
Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting Model. 465-485 - Shyue-Kung Lu
E3C Techniques for Protecting NAND Flash Memories. 487-500 - Vinod S. Chippalkatti
Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System. 501-519 - Ling Zhang:
Online Diagnosis and Self-Recovery of Faulty Cells in Daisy-Chained MEDA Biochips Using Functional Actuation Patterns. 521-534
Volume 39, Number 5, December 2023
- Vishwani D. Agrawal:
Editorial. 535-536 - 2022 JETTA-TTTC Best Paper Award. 537-538
- Test Technology Newsletter. 539-540
- Gayathri Lakshmi, V. Udaya Sankar
A Survey of PCB Defect Detection Algorithms. 541-554 - Priyajit Bhattacharya
MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary Algorithms. 555-570 - Asma Iqbal
Performance Efficient and Fault Tolerant Approximate Adder. 571-582 - Zhenyu Zhao
Trade-off Mechanism Between Reliability and Performance for Data-flow Soft Error Detection. 583-595 - Yingchun Xiao, Feng Zhu
Identification of Unknown Electromagnetic Interference Sources Based on Siamese-CNN. 597-609 - Joseph Herbert Mitchell-Moreno
A Low Bit Instability CMOS PUF Based on Current Mirrors and WTA Cells. 611-620 - Shouhong Chen, Tao Wang, Zhentao Huang, Xingna Hou:
Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition Field. 621-629 - Zeinab Asghari, Bahman Arasteh
Effective Software Mutation-Test Using Program Instructions Classification. 631-657 - J. Paul Rajasingh, P. Senthil Kumar, S. Srinivasan:
Efficient Fault Detection by Test Case Prioritization via Test Case Selection. 659-677
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