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Douglas C. Bossen
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Journal Articles
- 2002
- [j12]Douglas C. Bossen, Alongkorn Kitamorn, Kevin Reick, Michael S. Floyd:
Fault-tolerant design of the IBM pSeries 690 system using POWER4 processor technology. IBM J. Res. Dev. 46(1): 77-86 (2002) - [j11]Douglas C. Bossen, Joel M. Tendler, Kevin Reick:
Power4 System Design for High Reliability. IEEE Micro 22(2): 16-24 (2002) - 1992
- [j10]C. L. (Jim) Chen, Nandakumar N. Tendolkar, Arthur J. Sutton, M. Y. (Ben) Hsiao, Douglas C. Bossen:
Fault-tolerance design of the IBM Enterprise System/9000 Type 9021 processors. IBM J. Res. Dev. 36(4): 765-780 (1992) - 1984
- [j9]Douglas C. Bossen, Chin-Long Chen, M. Y. (Ben) Hsiao:
Fault Alignment Exclusion for Memory Using Address Permutation. IBM J. Res. Dev. 28(2): 170-176 (1984) - 1982
- [j8]Douglas C. Bossen, M. Y. (Ben) Hsiao:
Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage. IBM J. Res. Dev. 26(1): 67-77 (1982) - 1980
- [j7]Douglas C. Bossen, Mu Y. Hsiao:
A System Solution to the Memory Soft Error Problem. IBM J. Res. Dev. 24(3): 390-397 (1980) - 1978
- [j6]Douglas C. Bossen, Lih C. Chang, Chin-Long Chen:
Measurement and Generation of Error Correcting Codes for Package Failures. IEEE Trans. Computers 27(3): 201-204 (1978) - 1975
- [j5]Mu Y. Hsiao, Douglas C. Bossen:
Orthogonal Latin Square Configuration for LSI Memory Yield and Reliability Enhancement. IEEE Trans. Computers 24(5): 512-516 (1975) - [j4]Se June Hong, Douglas C. Bossen:
On some properties of self-reciprocal polynomials (Corresp.). IEEE Trans. Inf. Theory 21(4): 462-464 (1975) - 1974
- [j3]Douglas C. Bossen, Se June Hong:
Authors' Reply2. IEEE Trans. Computers 23(12): 1326-1327 (1974) - 1971
- [j2]Douglas C. Bossen, Se June Hong:
Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks. IEEE Trans. Computers 20(11): 1252-1257 (1971) - 1968
- [j1]Douglas C. Bossen, Stephen S. Yau:
Redundant Residue Polynomial Codes. Inf. Control. 13(6): 597-618 (1968)
Conference and Workshop Papers
- 1971
- [c2]Douglas C. Bossen, Daniel L. Ostapko, Arvind M. Patel, Martin S. Schmookler:
Minimum test patterns for residue networks. DAC 1971: 278-284 - 1970
- [c1]Douglas C. Bossen, Daniel L. Ostapko, Arvind M. Patel:
Optimum test patterns for parity networks. AFIPS Fall Joint Computing Conference 1970: 63-68
Coauthor Index
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