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George J. Papaioannou
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2010 – 2019
- 2018
- [j33]Dimitrios Birmpiliotis, Matroni Koutsoureli, J. Kohylas, George J. Papaioannou
, A. Ziaei:
Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches. Microelectron. Reliab. 88-90: 840-845 (2018) - 2017
- [j32]Matroni Koutsoureli, George Stavrinidis, Dimitrios Birmpiliotis, George Konstantinidis, George J. Papaioannou
Electrical properties of SiNx films with embedded CNTs for MEMS capacitive switches. Microelectron. Reliab. 76-77: 614-618 (2017) - [j31]Matroni Koutsoureli, N. Siannas, George J. Papaioannou
Temperature accelerated discharging processes through the bulk of PECVD silicon nitride films for MEMS capacitive switches. Microelectron. Reliab. 76-77: 631-634 (2017) - 2016
- [j30]Matroni Koutsoureli, Athanasios Zevgolatis, Samuel Saada, Christine Mer-Calfati, Loukas Michalas
Dielectric charging phenomena in diamond films used in RF MEMS capacitive switches: The effect of film thickness. Microelectron. Reliab. 64: 660-664 (2016) - [j29]Matroni Koutsoureli, Dimitrios Birmpiliotis, Loukas Michalas
An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches. Microelectron. Reliab. 64: 688-692 (2016) - 2015
- [j28]Loukas Michalas
Dielectric charging effects in floating electrode MEMS capacitive switches. Microelectron. Reliab. 55(9-10): 1891-1895 (2015) - [j27]Matroni Koutsoureli, Loukas Michalas
Induced charging phenomena on SiNx dielectric films used in RF MEMS capacitive switches. Microelectron. Reliab. 55(9-10): 1911-1915 (2015) - [c1]Panagiotis Giounanlis
Modelling of the dynamical behaviour of floating electrode MEMS. ISCAS 2015: 1322-1325 - 2014
- [j26]Matroni Koutsoureli, Loukas Michalas
A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches. Microelectron. Reliab. 54(9-10): 2159-2163 (2014) - 2013
- [j25]Matroni Koutsoureli, Loukas Michalas
Properties of contactless and contacted charging in MEMS capacitive switches. Microelectron. Reliab. 53(9-11): 1655-1658 (2013) - 2012
- [j24]Matroni Koutsoureli, Loukas Michalas
Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches. Microelectron. Reliab. 52(9-10): 2240-2244 (2012) - [j23]Loukas Michalas
A study of field emission process in electrostatically actuated MEMS switches. Microelectron. Reliab. 52(9-10): 2267-2271 (2012) - [j22]Loukas Michalas
A temperature study of photosensitivity in SLS polycrystalline silicon TFTs. Microelectron. Reliab. 52(9-10): 2508-2511 (2012) - 2011
- [j21]Usama Zaghloul, George J. Papaioannou
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies. Microelectron. Reliab. 51(9-11): 1810-1818 (2011) - [j20]Matroni Koutsoureli, George J. Papaioannou
Determination of bulk discharge current in the dielectric film of MEMS capacitive switches. Microelectron. Reliab. 51(9-11): 1874-1877 (2011) - [j19]Usama Zaghloul, George J. Papaioannou, Bharat Bhushan
Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]. Microelectron. Reliab. 51(12): 2416 (2011) - 2010
- [j18]Usama Zaghloul, Matroni Koutsoureli, H. Wang, Fabio Coccetti, George J. Papaioannou
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. Microelectron. Reliab. 50(9-11): 1615-1620 (2010) - [j17]Loukas Michalas
Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress. Microelectron. Reliab. 50(9-11): 1848-1851 (2010)
2000 – 2009
- 2009
- [j16]M. A. Exarchos, George J. Papaioannou
Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs. Microelectron. Reliab. 49(9-11): 1018-1023 (2009) - [j15]Jinyu Jason Ruan, Nicolas Nolhier, George J. Papaioannou
Accelerated lifetime test of RF-MEMS switches under ESD stress. Microelectron. Reliab. 49(9-11): 1256-1259 (2009) - [j14]Usama Zaghloul, George J. Papaioannou
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions. Microelectron. Reliab. 49(9-11): 1309-1314 (2009) - 2008
- [j13]A. Belarni, Mohamed Lamhamdi, Patrick Pons
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches. Microelectron. Reliab. 48(8-9): 1232-1236 (2008) - [j12]Jinyu Jason Ruan, George J. Papaioannou
ESD failure signature in capacitive RF MEMS switches. Microelectron. Reliab. 48(8-9): 1237-1240 (2008) - [j11]Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons
Alpha particle radiation effects in RF MEMS capacitive switches. Microelectron. Reliab. 48(8-9): 1241-1244 (2008) - [j10]Mohamed Lamhamdi, Patrick Pons
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. Microelectron. Reliab. 48(8-9): 1248-1252 (2008) - [j9]Despina C. Moschou
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. Microelectron. Reliab. 48(8-9): 1544-1548 (2008) - 2007
- [j8]Despina C. Moschou
Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques. Microelectron. Reliab. 47(9-11): 1378-1383 (2007) - [j7]E. Papandreou, Mohamed Lamhamdi, C. M. Skoulikidou, Patrick Pons
Structure dependent charging process in RF MEMS capacitive switches. Microelectron. Reliab. 47(9-11): 1812-1817 (2007) - [j6]Loukas Michalas
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors. Microelectron. Reliab. 47(12): 2058-2064 (2007) - 2006
- [j5]M. A. Exarchos, E. Papandreou, Patrick Pons
Charging of radiation induced defects in RF MEMS dielectric films. Microelectron. Reliab. 46(9-11): 1695-1699 (2006) - 2005
- [j4]M. A. Exarchos, George J. Papaioannou
The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs. Microelectron. Reliab. 45(9-11): 1386-1389 (2005) - [j3]M. A. Exarchos, V. Theonas, Patrick Pons
Investigation of charging mechanisms in metal-insulator-metal structures. Microelectron. Reliab. 45(9-11): 1782-1785 (2005) - 2004
- [j2]Dimitrios N. Kouvatsos, Vojkan Davidovic
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectron. Reliab. 44(9-11): 1631-1636 (2004) - [j1]M. A. Exarchos, François Dieudonné, Jalal Jomaah, George J. Papaioannou, Francis Balestra:
On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs. Microelectron. Reliab. 44(9-11): 1643-1647 (2004)
Coauthor Index
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