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"Voltage and temperature effect on dielectric charging for RF-MEMS ..."

Mohamed Lamhamdi et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.07.017

access: closed

type: Journal Article

metadata version: 2024-08-04

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  - https://dblp.org/rec/journals/mr/LamhamdiPZBCGSPP08
Mohamed Lamhamdi, Patrick Pons, Usama Zaghloul, Laurent Boudou, Fabio Coccetti, Jean Guastavino, Y. Segui, George J. Papaioannou, Robert Plana:
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. Microelectron. Reliab. 48(8-9): 1248-1252 (2008)

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