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"The impact of static and dynamic degradation on SOI "smart-cut" floating ..."

M. A. Exarchos et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.027

access: closed

type: Journal Article

metadata version: 2022-10-02

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M. A. Exarchos, George J. Papaioannou, Jalal Jomaah, Francis Balestra:
The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs. Microelectron. Reliab. 45(9-11): 1386-1389 (2005)

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