WO2024142621A1

WO2024142621A1 - Reflection device

Info

Publication number: WO2024142621A1
Application number: PCT/JP2023/040580
Authority: WO
Inventors: 孝志齋藤; 栄治森田
Original assignee: テクノス株式会社
Priority date: 2022-12-27
Filing date: 2023-11-10
Publication date: 2024-07-04
Also published as: JP2024093367A; JP2024105733A; JP7498767B1

Abstract

[Problem] To provide a reflection device that can retroreflect light incident thereon from a wide range. [Solution] This reflection device for retroreflecting light with which the reflection device is irradiated comprises a retroreflective unit formed by arranging retroreflective reflectors enabling the retroreflection. The retroreflective unit comprises a plurality of reflective regions in which the direction of retroreflection is set to different directions.

Description

Reflector

The present invention relates to a reflecting device, and in particular to a reflecting device capable of retroreflecting light incident from a wide range.

Traditionally, reflecting devices have been used in vehicles, road signs, surveying, etc. For example, in geodetic surveys, civil engineering surveys, and architectural surveys, targets such as highly reflective reflective sheets or triangular prisms are placed at the target position of the survey object, and light reflected from the target is automatically captured by a surveying instrument with an automatic aiming function. The intensity of the reflected light depends on the angle between the line of sight for the target and the reflecting surface or prism surface of the reflective sheet. For example, the limit of the angle at which automatic aiming is possible is approximately ±20° for reflective sheets and approximately ±20° for triangular prisms. For this reason, target devices based on triangular prisms that can be automatically aimed in all directions at an angle of 360°, as disclosed in Patent Document 1, have been developed in recent years.

JP 2020-98175 A

However, target devices based on triangular prisms that can be automatically aimed are very expensive and have a structure that is easily damaged, so they must be handled with care. In addition, as mentioned above, the range in which reflective sheets and triangular prisms can be automatically aimed is limited, so in order to make the most of the automatic aiming function, it is necessary to change the position of the surveying instrument every time. Every time the position of the surveying instrument is changed, work such as transporting, assembling, and leveling the instrument is required, which hinders the continuous capture of the survey target.
Furthermore, reflectors used on vehicles and road signs have a limited angle of incidence of light that allows recognition, so it is preferable that they be capable of being recognized from a wider range of angles.
An object of the present invention is to provide a reflecting device capable of retroreflecting light incident from a wide range.

In order to solve the above problems, the configuration of the reflection device is a reflection device that retroreflects irradiated light, and includes a retroreflecting section configured by arranging retroreflectors that enable the retroreflection, and the retroreflecting section is configured to include a plurality of reflective areas in which the direction of retroreflection is set to different directions.
According to this configuration, light incident from a wide range can be retroreflected.
Furthermore, since the retroreflector is made of microprisms, it becomes easier to obtain retroreflected light having a light flux required for, for example, visual recognition, surveying, and the like.
Furthermore, the retroreflection section is provided on a base, and an air layer is formed between the retroreflection section and the base, so that the reflecting device can be manufactured inexpensively and easily.
Furthermore, by configuring the base to include a fixing means for fixing the reflecting device, the work of installing the reflecting device can be facilitated.
Another configuration of the reflecting device is a reflecting device that is attached to an object to be surveyed and retroreflects light irradiated from a surveying instrument, and includes a retroreflecting section configured by arranging retroreflectors that enable the retroreflection, and the retroreflecting section has a plurality of reflective areas in which the direction of retroreflection is set in different directions, and when the reflecting device is attached to the object to be surveyed, the reflective areas with the same direction of retroreflection are arranged in symmetrical positions.
According to this configuration, it is possible to continuously capture the survey object by utilizing the automatic collimation function of the surveying instrument, thereby improving the efficiency of the surveying work.

FIG. 2 is a plan view of the target 1 according to the present embodiment. FIG. 2 is an exploded view of the target 1 according to the present embodiment. FIG. 2 is a cross-sectional view of the target 1. FIG. 2 is a diagram showing a retroreflector. 4 is a plan view showing the orientation and arrangement of retroreflectors in each of the reflective regions R1 to R5. FIG. 4 is a plan view showing the orientation and arrangement of retroreflectors in each of the reflective regions R1 to R5. FIG. FIG. 13 is a diagram showing the action of a target.

The present invention will be described in detail below through embodiments of the invention, but the following embodiments do not limit the invention as claimed, and not all of the combinations of features described in the embodiments are necessarily essential to the solution of the invention, and include configurations that are selectively adopted.

The reflecting device according to the present invention can be used, for example, as a surveying target 1. In the following description, the reflecting device will be described using the surveying target 1.
The target 1 according to this embodiment is attached to an object to be surveyed and is used to measure the position, orientation, etc. of the object to be surveyed by irradiating distance measuring light from the surveying instrument, and is configured to facilitate attachment to the object to be surveyed when it is attached to multiple locations on one object to be surveyed or multiple targets to be surveyed, and to enable surveying of multiple measurement positions from one location, for example, when the surveying instrument has an automatic collimation function. In the following explanation, the surveying instrument 4 is described as having an automatic collimation function.

Fig. 1 is a plan view showing an example of a target 1 according to the present embodiment. Fig. 2 is an exploded perspective view showing the configuration of the target 1 according to the present embodiment.
FIG. 3 is a cross-sectional view showing the relationship between the base member 10 and the reflecting member 20 when the base member 10 and the reflecting member 20 are integrated to form the target 1. As shown in FIG.
The target 1 has an up-down direction that defines the orientation for mounting the target on a survey object. In the following explanation, it is assumed that the target 1 is mounted on a pillar or the like, and the directions are specified as up-down, left-right, and front-rear directions as shown by the arrows in the figure.

Target 1 is formed in a square shape when viewed from above (see FIG. 1(a)) and in a flat plate shape when viewed from the side (see FIG. 1(b)), and is configured to include, for example, a base member 10 and a reflecting member 20. The base member 10 forms one side of target 1, and the reflecting member 20 forms the other side of target 1.

As shown in Figures 1 and 2, the base member 10 is formed in a box shape that is open on one side (front) and has a square-shaped substrate 10A and a frame 10B that rises to surround the outer periphery of the substrate 10A. The substrate 10A is formed, for example, in the shape of a flat plate with a constant thickness. The frame 10B is formed, for example, in the shape of a plate with a constant thickness that rises at a uniform height toward one side of the substrate 10A.

The base member 10 can be made of a material such as resin or polyethylene, and can be colored, for example, in white or black, and configured so as not to allow light to pass through.

The reflective member 20 is made of a material such as a light-transmitting resin. As shown in FIG. 3, the reflective member 20 is made by arranging a plurality of retroreflectors 50, which enable the retroreflection of light, on a support layer 22. In the following description, a collection of a plurality of arranged retroreflectors 50 may be referred to as the reflective structure 20A. The support layer 22 and the retroreflectors 50 are integrally formed as the reflective member 20.

The support layer 22 is formed, for example, in a square plate shape that matches the outer peripheral dimensions (external shape) of the frame 10B of the base member 10 in a plan view so that it can be superimposed on the base member 10. The multiple retroreflectors 50 are aligned on one side so that they are included within the inner peripheral dimensions of the frame 10B when the support layer 22 is superimposed on the base member 10.

In other words, the reflective member 20 is configured with a reflective structure 20A with one flat surface and multiple retroreflectors 50 protruding from the other surface. The reflective structure 20A is formed on the support layer 22, for example, in an area that can be accommodated within the frame 10B of the base member 10, and arranged to form a square that follows the shape of the inside of the frame 10B of the base member 10.

The target 1 is constructed by integrating the base member 10 and the reflective member 20, for example, so that when the support layer 22 of the reflective member 20 is brought into contact with and superimposed on the frame 10B of the base member 10, an air layer 30 is formed between the reflective structure 20A protruding from the support layer 22 of the reflective member 20 and the substrate 10A of the base member 10.

The space between the reflective structure 20A protruding from the support layer 22 of the reflective member 20 and the substrate 10A of the base member 10 is not limited to the air layer 30. For example, the air layer 30 may be replaced with a material having a smaller refractive index than the reflective member 20, and the base member 10 may be formed so that the substrate 10A of the base member 10 matches the reflective structure 20A of the reflective member 20.

The base member 10 and the reflective member 20 can be integrated together using a fixing means such as adhesive or fitting.

In the target 1, in which the base member 10 and the reflecting member 20 are integrated, the flat surface 20a of the reflecting member 20 functions as the irradiation surface 1a on which the collimation light and distance measurement light emitted from the surveying instrument are incident, and the flat surface 10a of the base member 10 functions as the mounting surface 1b for mounting the target 1 to the surveying object. The irradiation surface 1a and the mounting surface 1b are parallel to each other. The target 1 may also be configured in such a way that a member in which the reflecting member 20 and the base member 10 are integrated into n equal parts is fixed to a base.

The mounting surface 1b may be provided with a fixing means (not shown) for easily attaching the target 1 to the object to be surveyed. The fixing means may be, for example, double-sided tape, a magnet, adhesive, etc. This makes it easier to set up the target 1 when, for example, surveying the erection accuracy of steel frames, etc. Note that the use of the target 1 in this embodiment is not limited to this.

FIG. 4 is a diagram showing a retroreflector 50 according to this embodiment.
In this embodiment, the retroreflector 50 is described as a corner cube type microprism as shown in Fig. 4, but other microprisms such as glass beads may be used as long as they enable retroreflection. By using a microprism for the retroreflector 50, it becomes easier to obtain the light flux required for the automatic collimation function.

As shown in FIG. 4, the corner cube retroreflector 50 has one vertex forming a cube, which is the vertex 51A of a triangular pyramid, cut out along a plane passing through the three

vertices

51B, 51C, and 51D adjacent to this vertex.

That is, as shown in FIG. 4, the triangular pyramid that constitutes the retroreflector 50 is formed such that the side surfaces 52a, 52b, and 52c intersect at right angles with each other and have the same length.
As shown in Figure 3, the retroreflector 50 is arranged such that the base surfaces 52d of triangular pyramids cut out from a cube as corner cubes face the support layer 22, and is formed integrally with the support layer 22 to form a reflective structure (retroreflector) 20A.

Each of the (arranged) retroreflectors 50 that make up the reflective structure 20A functions as a (retroreflective) prism that reflects light (incident light) that passes through the support layer 22 and enters from the bottom surface 52d, specularly once each from the three side surfaces (the inner surfaces of which) 52a, 52b, and 52c, and then reflects it again in the incident direction from the bottom surface 52d.
As described above, the retroreflector 50 is formed integrally with the support layer 22, and therefore the bottom surface 52d shown in FIGS. 3 to 6 is an imaginary surface shown for the sake of convenience of explanation.

The reflective member 20 in this embodiment is configured to be capable of retroreflecting light toward a surveying instrument even when the angle of incidence of collimation light emitted from the surveying instrument is large. Specifically, the reflective structure 20A is configured to have multiple reflective regions formed so that the retroreflecting direction is different. In this embodiment, it is configured to have five types of reflective regions R1, R2, R3, R4, and R5 (see Figure 1).

The direction of retroreflection in each of the reflection regions R1, R2, R3, R4, and R5 is realized by tilting the retroreflectors 50 constituting the reflection regions R1, R2, R3, R4, and R5. The tilted arrangement is based on the case where the retroreflectors 50 are arranged so that the reflection axis J is the normal N of the irradiation surface 1a as shown in FIG. 3. The reflection axis J refers to the direction in which light is most brightly retroreflected when it is incident on the retroreflector 50, and in this embodiment, it is defined by a line that is perpendicular to the bottom surface 52d of the retroreflector 50 and passes through the vertex 51A of the retroreflector 50.
The retroreflection by each of the reflective regions R1, R2, R3, R4, and R5 is not limited to the direction of the reflection axis J, but allows the incidence of light from a certain range (angle) (for example, ±20°).

In other words, the reflective regions R1, R2, R3, R4, and R5 are arranged so that the inclination of the reflective axis J of the retroreflector 50 is the same within the same region. In addition, the retroreflectors 50 constituting the different reflective regions R1, R2, R3, R4, and R5 are formed on the reflective member 20 so that the angles at which the reflective axis J is inclined are different.

In the embodiment, as shown in FIG. 1(a), for example, the reflective structure 20A is divided into 25 regions at equal intervals in the vertical and horizontal directions in a plan view, and each region is square-shaped. Reflective regions R1, R2, R3, R4, and R5 are formed in the square-shaped regions.

The reflective region R1 is disposed in the center of the reflective structure 20A, the reflective regions R2 and R3 are disposed so as to surround the reflective region R1, and the reflective regions R4 and R5 are disposed so as to surround the reflective regions R2 and R3.
Specifically, the reflection region R1 is disposed so that the center of the square defined as the reflection region R1 coincides with the center O of the target 1. The reflection region R2 is disposed above, below, left, and right of the reflection region R1 so as to be in contact with the four sides of the reflection region R1, and the reflection region R3 is disposed at four diagonal positions of the reflection region R1 so as to be adjacent to the vertices of the reflection region R1. The reflection region R4 is disposed outside the reflection regions R2 and R3 surrounding the reflection region R1, at the above, below, left, right, and diagonal positions of the reflection region R1, and the reflection region R5 is disposed between the reflection regions R4 provided outside the reflection regions R2 and R3 surrounding the reflection region R1.

In other words, the target 1 is arranged so that the areas with the same inclination of the reflection axis J are symmetrical around the center O of the reflection structure 20A. By arranging the reflection areas R1 to R5 with the same inclination of the reflection axis J symmetrical around the center O of the reflection structure 20A in this way, the position of the center O of the target 1 can be detected from the light reflected from each of the reflection areas R1 to R5, and the accuracy of the surveying can be maintained.

FIGS. 5 and 6 are plan views showing the arrangement of the retroreflectors 50 in each of the reflection regions R1 to R5. In detail, FIG. 5 shows the arrangement of the retroreflectors 50 in each of the reflection regions R1 to R5 when the target 1 is viewed from above, and FIG. 6 shows the arrangement of the retroreflectors 50 in each of the reflection regions R1 to R5 when the target 1 is viewed from the side. Note that FIGS. 5 and 6 do not show everything that can be seen from the side or above, but rather show only a portion of the retroreflectors 50 that are lined up in a row.

The reflective region R1 is arranged by tilting the retroreflector 50 so that the reflective axis J is inclined 0° in the left-right direction (see FIG. 5(a)) and 15° downward in the up-down direction (see FIG. 6(a)) with respect to the normal N of the irradiation surface 1a.

The reflective region R2 is positioned by tilting the retroreflector 50 so that the reflective axis J is inclined 15° to the left in the left-right direction (see FIG. 5(b)) and 15° down in the up-down direction (see FIG. 6(b)) with respect to the normal N of the irradiation surface 1a.

The reflective region R3 is positioned by tilting the retroreflector 50 so that the reflective axis J is inclined 15° to the right in the left-right direction (see FIG. 5(c)) and 15° down in the up-down direction (see FIG. 6(c)) with respect to the normal N of the irradiation surface 1a.

The reflective region R4 is positioned by tilting the retroreflector 50 so that the reflective axis J is tilted 30° to the left in the left-right direction (see FIG. 5(d)) and 30° down in the up-down direction (see FIG. 6(d)) with respect to the normal N of the irradiation surface 1a.

The reflective region R5 is arranged by tilting the retroreflector 50 so that the reflective axis J is inclined 30° to the right in the left-right direction (see FIG. 5(e)) and 30° down in the up-down direction (see FIG. 6(e)) with respect to the normal N of the irradiation surface 1a.

In other words, when the target 1 is attached to the surface of a surveying object such as a pillar extending in the vertical direction, the reflection area R1 is configured to reflect most brightly when the collimated light irradiated from the surveying instrument is incident on the irradiation surface 1a at a direction angle of 0° and a dip angle of 15°.
The reflection area R2 is configured to reflect the most brightly when the collimated light emitted from the surveying instrument is incident on the irradiation surface 1a at a direction angle of 15° to the left and a dip angle of 15°.
The reflection area R3 is configured to reflect the most brightly when the collimated light emitted from the surveying instrument is incident on the irradiation surface 1a at a direction angle of 15° to the right and a dip angle of 15°.
The reflection area R4 is configured to reflect the most brightly when the collimated light emitted from the surveying instrument is incident on the irradiation surface 1a at a direction angle of 30° to the left and a dip angle of 30°.
The reflection area R5 is configured to reflect the most brightly when the collimated light emitted from the surveying instrument is incident on the irradiation surface 1a at a direction angle of 30° to the right and a dip angle of 30°.

FIG. 7 is a diagram showing the function of target 1. As described above, target 1 according to this embodiment is configured with reflection regions R1 to R5 with different orientations of reflection axis J, and can be arranged in a range such as that shown in FIG. 7.

In Figure 7, 1(a) indicates a target placed at a direction angle of 0° and an elevation angle of 15° as viewed from the surveying instrument 4, 1(b) indicates a target placed at a direction angle of 15° to the left and an elevation angle of 15° as viewed from the surveying instrument 4, 1(c) indicates a target placed at a direction angle of 15° to the right and an elevation angle of 15° as viewed from the surveying instrument 4, 1(d) indicates a target placed at a direction angle of 30° to the left and an elevation angle of 30° as viewed from the surveying instrument 4, and 1(e) indicates a target placed at a direction angle of 30° to the right and an elevation angle of 30° as viewed from the surveying instrument 4. Note that targets 1(a) to 1(e) are identical.

In other words, when the collimation light is irradiated toward a direction angle of 0° and an elevation angle of 15° by the collimation function of the surveying instrument 4, the collimation light is reflected most brightly toward the surveying instrument 4 from the reflection region R1 in which the reflection axis J in the target 1 (a) has a direction angle of 0° and an elevation angle of 15°.
In addition, when the collimation light is irradiated toward a direction angle of 15° to the right and an elevation angle of 15° by the collimation function of the surveying instrument 4, the collimation light is reflected most brightly toward the surveying instrument 4 from the four reflection areas R2 in the target 1 (b) whose reflection axis J is at a direction angle of 15° to the right and an elevation angle of 15°.
In addition, when the collimation light is irradiated toward a direction angle of 15° to the left and an elevation angle of 15° by the collimation function of the surveying instrument 4, the collimation light is reflected most brightly toward the surveying instrument 4 from the four reflection areas R3 in the target 1 (c) whose reflection axis J is at a direction angle of 15° to the left and an elevation angle of 15°.
In addition, when the collimation light is irradiated toward a direction angle of 30° to the right and an elevation angle of 30° by the collimation function of the surveying instrument 4, the collimation light is reflected most brightly toward the surveying instrument 4 from eight reflection areas R4 in which the reflection axis J is at a direction angle of 30° to the right and an elevation angle of 30° in the target 1 (d).
In addition, when the collimation light is irradiated toward a direction angle of 30° to the left and an elevation angle of 30° by the collimation function of the surveying instrument 4, the collimation light is reflected most brightly toward the surveying instrument 4 from the eight reflection areas R5 in the target 1 (e) whose reflection axis J is at a direction angle of 30° to the left and an elevation angle of 30°.

In this way, by configuring the target 1 to have multiple reflection axes J, one type of target can be commonly used as shown in Figure 7, which makes it easier to install the target 1 and allows targets 1 installed in multiple locations to be continuously sighted and surveyed without moving the position of the surveying instrument 4.

In the explanation of FIG. 7, for convenience of explanation, the surveying instrument 4 is positioned on the reflection axis J set on the target 1, but the target 1 does not necessarily need to be positioned so that the collimation light emitted from the surveying instrument 4 coincides with the reflection axis J. The retroreflectors 50 that make up each of the reflection regions R1 to R5 allow the retroreflection of light that is shifted from the reflection axis J, centered on the reflection axis J, making automatic collimation possible over a wider range.

The orientation of the reflection axis J set in each of the reflection areas R1 to R5 described above is not limited to the angles in the above embodiment, and may be changed as appropriate. For example, if the target 1 is configured to be suitable for surveying with a low elevation angle and a wide direction angle, the reflection areas can be set so that the reflection axis J changes more with respect to the direction angle than with respect to the elevation angle, and if the target 1 is configured to be suitable for surveying with a high elevation angle and a narrow direction angle, the target 1 can be configured by setting the reflection areas so that the reflection axis J changes more with respect to the elevation angle than with respect to the direction angle.

In the above embodiment, the shape of the target 1 has been described as a square, but this is not limited to this. The shape of the target 1 may be, for example, a rectangle or a polygon other than a rectangle, or a circle or an ellipse. The shape of the target 1 here refers to the planar shape of the target 1 and the planar shape of the reflective structure portion 20A in the target 1.

The key to forming the target 1 is to have a configuration in which the reflective structure 20A is provided with multiple (two or more) types of reflective regions R with different inclinations of the reflective axis J. In addition, the reflective regions R with the same inclination of the reflective axis J should be provided at least symmetrically with respect to the up-down direction set on the target 1.

In the above embodiment, the target 1 has been described as having multiple reflective areas formed on a single reflective member 20, but it may also be configured such that a reflective member is formed separately for each reflective area with a different inclination of the reflective axis J, and the multiple individually formed reflective members are integrated by the base member 10.

Although the reflection device according to the present invention has been described using the surveying target 1, the subject matter is not limited to this. For example, it may be used on vehicles or road signs. In this case, unlike the surveying target 1, it is not necessary to arrange multiple reflection areas with different retroreflection directions symmetrically, but it is sufficient to set the direction of retroreflection in each reflection area so that light incident from a wide range can be retroreflected.

In addition, the direction of retroreflection set between each reflective area may be within the range of retroreflection in one reflective area, but by setting it outside the range of retroreflection in one reflective area, it is possible to retroreflect light incident from a wider range.

1 (surveying) target, 1a irradiation surface, 4 surveying instrument,
10 Base member, 20 Reflective member, 20A Reflective structure portion (retroreflective portion),
22 Support layer, 30 Air layer, 50 Retroreflector, J Reflection axis,
R1, R2, R3, R4, R5: Reflection areas.

Claims

A reflecting device that retroreflects irradiated light,
A retroreflective section is provided in which the retroreflective members that enable retroreflection are arranged,
The reflection device is characterized in that the retroreflective portion has a plurality of reflection areas each having a different retroreflective direction.
The reflecting device according to claim 1, characterized in that the retroreflector is a microprism.
The reflecting device according to claim 1, characterized in that the retroreflective portion is provided on a base, and an air layer is formed between the retroreflective portion and the base.
The reflecting device according to claim 3, characterized in that the base is provided with a fixing means for fixing the reflecting device.
A reflecting device that is provided on a surveying object and retroreflects light irradiated from a surveying instrument,
A retroreflective section is provided in which the retroreflective members that enable retroreflection are arranged,
The retroreflective portion has a plurality of reflective regions in which the retroreflective directions are set in different directions,
A reflecting device characterized in that, when attached to an object to be surveyed, reflecting areas having the same retroreflective direction are provided at symmetrical positions.