WO2022255438A1 - Electromagnetic wave shield film - Google Patents
Electromagnetic wave shield film Download PDFInfo
- Publication number
- WO2022255438A1 WO2022255438A1 PCT/JP2022/022433 JP2022022433W WO2022255438A1 WO 2022255438 A1 WO2022255438 A1 WO 2022255438A1 JP 2022022433 W JP2022022433 W JP 2022022433W WO 2022255438 A1 WO2022255438 A1 WO 2022255438A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- layer
- electromagnetic wave
- conductive adhesive
- shielding film
- inorganic
- Prior art date
Links
- 239000010410 layer Substances 0.000 claims abstract description 174
- 229910052751 metal Inorganic materials 0.000 claims abstract description 64
- 239000002184 metal Substances 0.000 claims abstract description 64
- 239000002245 particle Substances 0.000 claims abstract description 62
- 239000012790 adhesive layer Substances 0.000 claims abstract description 54
- 239000011230 binding agent Substances 0.000 claims abstract description 9
- 229920005989 resin Polymers 0.000 claims description 73
- 239000011347 resin Substances 0.000 claims description 73
- 239000011241 protective layer Substances 0.000 claims description 29
- 229910044991 metal oxide Inorganic materials 0.000 claims description 7
- 150000004706 metal oxides Chemical class 0.000 claims description 7
- 230000007613 environmental effect Effects 0.000 abstract description 21
- 239000010408 film Substances 0.000 description 72
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 25
- 239000004332 silver Substances 0.000 description 25
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 24
- 229910052709 silver Inorganic materials 0.000 description 23
- 239000003822 epoxy resin Substances 0.000 description 21
- 229920000647 polyepoxide Polymers 0.000 description 21
- 150000001875 compounds Chemical class 0.000 description 19
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 18
- 229920001187 thermosetting polymer Polymers 0.000 description 18
- 230000000052 comparative effect Effects 0.000 description 13
- 239000010949 copper Substances 0.000 description 13
- 229910052802 copper Inorganic materials 0.000 description 13
- -1 alkaline earth metal salt Chemical class 0.000 description 11
- 239000003795 chemical substances by application Substances 0.000 description 11
- 238000000034 method Methods 0.000 description 11
- 229910052759 nickel Inorganic materials 0.000 description 11
- 238000004544 sputter deposition Methods 0.000 description 11
- 239000000853 adhesive Substances 0.000 description 10
- 230000001070 adhesive effect Effects 0.000 description 10
- 239000000126 substance Substances 0.000 description 9
- 229910000881 Cu alloy Inorganic materials 0.000 description 8
- 239000000203 mixture Substances 0.000 description 8
- 238000007747 plating Methods 0.000 description 8
- 229920005992 thermoplastic resin Polymers 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 239000002923 metal particle Substances 0.000 description 7
- 239000000758 substrate Substances 0.000 description 7
- 238000007740 vapor deposition Methods 0.000 description 7
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 6
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 6
- 229910045601 alloy Inorganic materials 0.000 description 6
- 239000000956 alloy Substances 0.000 description 6
- 229910052718 tin Inorganic materials 0.000 description 6
- 239000004593 Epoxy Substances 0.000 description 5
- 229910052797 bismuth Inorganic materials 0.000 description 5
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 5
- 230000006866 deterioration Effects 0.000 description 5
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 5
- 229910052737 gold Inorganic materials 0.000 description 5
- 239000010931 gold Substances 0.000 description 5
- 229910052738 indium Inorganic materials 0.000 description 5
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 5
- 229920003986 novolac Polymers 0.000 description 5
- 229920000139 polyethylene terephthalate Polymers 0.000 description 5
- 239000005020 polyethylene terephthalate Substances 0.000 description 5
- 239000002356 single layer Substances 0.000 description 5
- 239000002904 solvent Substances 0.000 description 5
- 238000001771 vacuum deposition Methods 0.000 description 5
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 4
- 229910000861 Mg alloy Inorganic materials 0.000 description 4
- 229910010413 TiO 2 Inorganic materials 0.000 description 4
- WGLPBDUCMAPZCE-UHFFFAOYSA-N Trioxochromium Chemical compound O=[Cr](=O)=O WGLPBDUCMAPZCE-UHFFFAOYSA-N 0.000 description 4
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 4
- 229910000423 chromium oxide Inorganic materials 0.000 description 4
- 238000005868 electrolysis reaction Methods 0.000 description 4
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 4
- 229910052809 inorganic oxide Inorganic materials 0.000 description 4
- 239000011777 magnesium Substances 0.000 description 4
- 150000002739 metals Chemical class 0.000 description 4
- 239000004925 Acrylic resin Substances 0.000 description 3
- 229920000178 Acrylic resin Polymers 0.000 description 3
- 229910001316 Ag alloy Inorganic materials 0.000 description 3
- 229920002284 Cellulose triacetate Polymers 0.000 description 3
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 3
- 239000004743 Polypropylene Substances 0.000 description 3
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 3
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 3
- NNLVGZFZQQXQNW-ADJNRHBOSA-N [(2r,3r,4s,5r,6s)-4,5-diacetyloxy-3-[(2s,3r,4s,5r,6r)-3,4,5-triacetyloxy-6-(acetyloxymethyl)oxan-2-yl]oxy-6-[(2r,3r,4s,5r,6s)-4,5,6-triacetyloxy-2-(acetyloxymethyl)oxan-3-yl]oxyoxan-2-yl]methyl acetate Chemical compound O([C@@H]1O[C@@H]([C@H]([C@H](OC(C)=O)[C@H]1OC(C)=O)O[C@H]1[C@@H]([C@@H](OC(C)=O)[C@H](OC(C)=O)[C@@H](COC(C)=O)O1)OC(C)=O)COC(=O)C)[C@@H]1[C@@H](COC(C)=O)O[C@@H](OC(C)=O)[C@H](OC(C)=O)[C@H]1OC(C)=O NNLVGZFZQQXQNW-ADJNRHBOSA-N 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 229920001577 copolymer Polymers 0.000 description 3
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 3
- 229920001155 polypropylene Polymers 0.000 description 3
- 238000005096 rolling process Methods 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 3
- 239000011701 zinc Substances 0.000 description 3
- 229910001928 zirconium oxide Inorganic materials 0.000 description 3
- KJCVRFUGPWSIIH-UHFFFAOYSA-N 1-naphthol Chemical compound C1=CC=C2C(O)=CC=CC2=C1 KJCVRFUGPWSIIH-UHFFFAOYSA-N 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 2
- 229930185605 Bisphenol Natural products 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 2
- 229920000877 Melamine resin Polymers 0.000 description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 239000004962 Polyamide-imide Substances 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 description 2
- 230000002776 aggregation Effects 0.000 description 2
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 2
- 229920000180 alkyd Polymers 0.000 description 2
- 239000004760 aramid Substances 0.000 description 2
- 229920003235 aromatic polyamide Polymers 0.000 description 2
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 2
- 239000012461 cellulose resin Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- GYZLOYUZLJXAJU-UHFFFAOYSA-N diglycidyl ether Chemical compound C1OC1COCC1CO1 GYZLOYUZLJXAJU-UHFFFAOYSA-N 0.000 description 2
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical compound C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 230000002708 enhancing effect Effects 0.000 description 2
- 239000005038 ethylene vinyl acetate Substances 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 229910052731 fluorine Inorganic materials 0.000 description 2
- 239000011737 fluorine Substances 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- 238000003475 lamination Methods 0.000 description 2
- JDSHMPZPIAZGSV-UHFFFAOYSA-N melamine Chemical compound NC1=NC(N)=NC(N)=N1 JDSHMPZPIAZGSV-UHFFFAOYSA-N 0.000 description 2
- AFEQENGXSMURHA-UHFFFAOYSA-N oxiran-2-ylmethanamine Chemical compound NCC1CO1 AFEQENGXSMURHA-UHFFFAOYSA-N 0.000 description 2
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 2
- 229920002492 poly(sulfone) Polymers 0.000 description 2
- 229920002647 polyamide Polymers 0.000 description 2
- 229920002312 polyamide-imide Polymers 0.000 description 2
- 229920001707 polybutylene terephthalate Polymers 0.000 description 2
- 229920000728 polyester Polymers 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 229920005672 polyolefin resin Polymers 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 238000004381 surface treatment Methods 0.000 description 2
- 229920001169 thermoplastic Polymers 0.000 description 2
- 239000004416 thermosoftening plastic Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- STHCTMWQPJVCGN-UHFFFAOYSA-N 2-[[2-[1,1,2-tris[2-(oxiran-2-ylmethoxy)phenyl]ethyl]phenoxy]methyl]oxirane Chemical compound C1OC1COC1=CC=CC=C1CC(C=1C(=CC=CC=1)OCC1OC1)(C=1C(=CC=CC=1)OCC1OC1)C1=CC=CC=C1OCC1CO1 STHCTMWQPJVCGN-UHFFFAOYSA-N 0.000 description 1
- UJWXADOOYOEBCW-UHFFFAOYSA-N 2-[[2-[bis[2-(oxiran-2-ylmethoxy)phenyl]methyl]phenoxy]methyl]oxirane Chemical compound C1OC1COC1=CC=CC=C1C(C=1C(=CC=CC=1)OCC1OC1)C1=CC=CC=C1OCC1CO1 UJWXADOOYOEBCW-UHFFFAOYSA-N 0.000 description 1
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 1
- VEORPZCZECFIRK-UHFFFAOYSA-N 3,3',5,5'-tetrabromobisphenol A Chemical compound C=1C(Br)=C(O)C(Br)=CC=1C(C)(C)C1=CC(Br)=C(O)C(Br)=C1 VEORPZCZECFIRK-UHFFFAOYSA-N 0.000 description 1
- VPWNQTHUCYMVMZ-UHFFFAOYSA-N 4,4'-sulfonyldiphenol Chemical compound C1=CC(O)=CC=C1S(=O)(=O)C1=CC=C(O)C=C1 VPWNQTHUCYMVMZ-UHFFFAOYSA-N 0.000 description 1
- 229920002126 Acrylic acid copolymer Polymers 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 229910000846 In alloy Inorganic materials 0.000 description 1
- 229910000733 Li alloy Inorganic materials 0.000 description 1
- 229910000990 Ni alloy Inorganic materials 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 229920012266 Poly(ether sulfone) PES Polymers 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- 239000004697 Polyetherimide Substances 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 229920001328 Polyvinylidene chloride Polymers 0.000 description 1
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Natural products C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 1
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 description 1
- 239000005083 Zinc sulfide Substances 0.000 description 1
- 229910001297 Zn alloy Inorganic materials 0.000 description 1
- YKTSYUJCYHOUJP-UHFFFAOYSA-N [O--].[Al+3].[Al+3].[O-][Si]([O-])([O-])[O-] Chemical compound [O--].[Al+3].[Al+3].[O-][Si]([O-])([O-])[O-] YKTSYUJCYHOUJP-UHFFFAOYSA-N 0.000 description 1
- 239000006096 absorbing agent Substances 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000010306 acid treatment Methods 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 238000005054 agglomeration Methods 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 125000005250 alkyl acrylate group Chemical group 0.000 description 1
- 229920005603 alternating copolymer Polymers 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 150000001408 amides Chemical class 0.000 description 1
- 230000003373 anti-fouling effect Effects 0.000 description 1
- 239000002518 antifoaming agent Substances 0.000 description 1
- 229910000410 antimony oxide Inorganic materials 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
- 238000000889 atomisation Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000004305 biphenyl Substances 0.000 description 1
- 235000010290 biphenyl Nutrition 0.000 description 1
- 229920001400 block copolymer Polymers 0.000 description 1
- QHIWVLPBUQWDMQ-UHFFFAOYSA-N butyl prop-2-enoate;methyl 2-methylprop-2-enoate;prop-2-enoic acid Chemical compound OC(=O)C=C.COC(=O)C(C)=C.CCCCOC(=O)C=C QHIWVLPBUQWDMQ-UHFFFAOYSA-N 0.000 description 1
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 1
- 229910001634 calcium fluoride Inorganic materials 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000002041 carbon nanotube Substances 0.000 description 1
- 229910021393 carbon nanotube Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- KRVSOGSZCMJSLX-UHFFFAOYSA-L chromic acid Substances O[Cr](O)(=O)=O KRVSOGSZCMJSLX-UHFFFAOYSA-L 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 238000003851 corona treatment Methods 0.000 description 1
- 239000007822 coupling agent Substances 0.000 description 1
- 229930003836 cresol Natural products 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 239000003085 diluting agent Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000003063 flame retardant Substances 0.000 description 1
- 150000004673 fluoride salts Chemical class 0.000 description 1
- AWJWCTOOIBYHON-UHFFFAOYSA-N furo[3,4-b]pyrazine-5,7-dione Chemical compound C1=CN=C2C(=O)OC(=O)C2=N1 AWJWCTOOIBYHON-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229920001903 high density polyethylene Polymers 0.000 description 1
- 239000004700 high-density polyethylene Substances 0.000 description 1
- 150000003949 imides Chemical class 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 230000005865 ionizing radiation Effects 0.000 description 1
- 229920000554 ionomer Polymers 0.000 description 1
- 238000007561 laser diffraction method Methods 0.000 description 1
- 229920000092 linear low density polyethylene Polymers 0.000 description 1
- 239000004707 linear low-density polyethylene Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 229920001684 low density polyethylene Polymers 0.000 description 1
- 239000004702 low-density polyethylene Substances 0.000 description 1
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 description 1
- 229910001635 magnesium fluoride Inorganic materials 0.000 description 1
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 1
- 239000000395 magnesium oxide Substances 0.000 description 1
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 229920001179 medium density polyethylene Polymers 0.000 description 1
- 239000004701 medium-density polyethylene Substances 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 229910000480 nickel oxide Inorganic materials 0.000 description 1
- QGLKJKCYBOYXKC-UHFFFAOYSA-N nonaoxidotritungsten Chemical compound O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 QGLKJKCYBOYXKC-UHFFFAOYSA-N 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- VTRUBDSFZJNXHI-UHFFFAOYSA-N oxoantimony Chemical compound [Sb]=O VTRUBDSFZJNXHI-UHFFFAOYSA-N 0.000 description 1
- GNRSAWUEBMWBQH-UHFFFAOYSA-N oxonickel Chemical compound [Ni]=O GNRSAWUEBMWBQH-UHFFFAOYSA-N 0.000 description 1
- HBEQXAKJSGXAIQ-UHFFFAOYSA-N oxopalladium Chemical compound [Pd]=O HBEQXAKJSGXAIQ-UHFFFAOYSA-N 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 229910003445 palladium oxide Inorganic materials 0.000 description 1
- 239000000123 paper Substances 0.000 description 1
- 150000002989 phenols Chemical class 0.000 description 1
- IGALFTFNPPBUDN-UHFFFAOYSA-N phenyl-[2,3,4,5-tetrakis(oxiran-2-ylmethyl)phenyl]methanediamine Chemical compound C=1C(CC2OC2)=C(CC2OC2)C(CC2OC2)=C(CC2OC2)C=1C(N)(N)C1=CC=CC=C1 IGALFTFNPPBUDN-UHFFFAOYSA-N 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 1
- 229920001083 polybutene Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 229920006267 polyester film Polymers 0.000 description 1
- 229920001225 polyester resin Polymers 0.000 description 1
- 239000004645 polyester resin Substances 0.000 description 1
- 229920001601 polyetherimide Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920005678 polyethylene based resin Polymers 0.000 description 1
- 239000011112 polyethylene naphthalate Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920000306 polymethylpentene Polymers 0.000 description 1
- 239000011116 polymethylpentene Substances 0.000 description 1
- 229920006389 polyphenyl polymer Polymers 0.000 description 1
- 229920005673 polypropylene based resin Polymers 0.000 description 1
- 229920005629 polypropylene homopolymer Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 239000005033 polyvinylidene chloride Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 229920005604 random copolymer Polymers 0.000 description 1
- 239000005060 rubber Substances 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 239000004576 sand Substances 0.000 description 1
- 238000000790 scattering method Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000005987 sulfurization reaction Methods 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 150000003505 terpenes Chemical class 0.000 description 1
- 235000007586 terpenes Nutrition 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910001930 tungsten oxide Inorganic materials 0.000 description 1
- 229920001862 ultra low molecular weight polyethylene Polymers 0.000 description 1
- 239000004034 viscosity adjusting agent Substances 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
- 229910052984 zinc sulfide Inorganic materials 0.000 description 1
- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B15/08—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B9/00—Layered products comprising a layer of a particular substance not covered by groups B32B11/00 - B32B29/00
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
Definitions
- the present invention relates to an electromagnetic wave shielding film. More particularly, the present invention relates to electromagnetic wave shielding films used in printed wiring boards.
- Printed wiring boards are often used to incorporate circuits into the mechanisms of electronic devices such as mobile phones, video cameras, and laptop computers. It is also used to connect a movable part such as a printer head and a control part. These electronic devices require measures to shield against electromagnetic waves, and the printed wiring boards used in the devices also use shield printed wiring boards that take measures to shield against electromagnetic waves.
- shield film An electromagnetic wave shielding film (hereinafter sometimes simply referred to as "shielding film”) is used for the shield printed wiring board.
- a shield film that is used by adhering to a printed wiring board has a shield layer such as a metal layer and a conductive adhesive sheet provided on the surface of the shield layer.
- shield film having a conductive adhesive sheet for example, those disclosed in Patent Documents 1 and 2 are known.
- the above-mentioned shield film is used by laminating such that the surface where the conductive adhesive sheet is exposed is adhered to the surface of the printed wiring board, specifically the surface of the coverlay provided on the surface of the printed wiring board.
- These conductive adhesive sheets are usually adhered and laminated on a printed wiring board by thermocompression bonding under high temperature and high pressure conditions.
- the shielding film arranged on the printed wiring board in this way exhibits the performance (shielding performance) of shielding electromagnetic waves from the outside of the printed wiring board.
- the shield film is used by bonding it to the substrate under high temperature and high pressure conditions.
- high temperature and high pressure conditions cannot be applied.
- conventional shielding films have the problem of being inferior in adhesion strength and electrical connection stability when bonded to a substrate under relatively mild conditions.
- the present invention has been made in view of the above, and an object of the present invention is to provide an electromagnetic wave shielding film that can be easily adhered to an adherend, has excellent adhesion and electrical connection stability, and has excellent environmental resistance. to provide.
- an electromagnetic wave shielding film having a specific layer structure can be easily adhered to an adherend and has excellent adhesion and electrical connection stability. It was found to be excellent in environmental resistance.
- the present invention has been completed based on these findings.
- a metal layer, a first inorganic layer, and a conductive adhesive layer are laminated in this order,
- the thickness of the first inorganic layer is 0.1 to 100 nm
- the conductive adhesive layer contains a binder component and conductive particles
- an electromagnetic wave shielding film Provided is an electromagnetic wave shielding film, wherein the ratio of the thickness of the conductive adhesive layer to the median diameter of the conductive particles is 0.2 to 3.5.
- an insulating protective layer is directly laminated on the surface of the metal layer opposite to the first inorganic layer.
- the thickness of the second inorganic layer is preferably 0.1 to 100 nm.
- the second inorganic layer is preferably made of metal oxide.
- the first inorganic layer is preferably made of metal oxide.
- the first inorganic layer is preferably laminated directly with the metal layer.
- the conductive adhesive layer is preferably laminated directly with the first inorganic layer.
- the present invention also provides a shield printed wiring board comprising the electromagnetic wave shielding film.
- the electromagnetic wave shielding film of the present invention can be easily adhered to an adherend, yet has excellent adhesion to the adherend, excellent electrical connection stability, and excellent environmental resistance. Therefore, the electromagnetic wave shielding film of the present invention can be used even for substrates having poor resistance to high temperatures and high pressures. Moreover, it can be used in an environment where environmental resistance is required.
- the electromagnetic wave shielding film (shielding film) of the present invention has a layer structure in which a metal layer, a first inorganic layer, and a conductive adhesive layer are laminated in this order.
- the first inorganic layer is directly laminated with the metal layer.
- the conductive adhesive layer is preferably laminated directly with the first inorganic layer. preferable.
- the metal layer on the side opposite to the first inorganic layer It is preferable to provide an insulating protective layer on the surface. It is preferable that the insulating protective layer is directly laminated on the metal layer.
- FIG. 1 is a schematic cross-sectional view showing one embodiment of the shielding film of the present invention.
- the shield film 1 shown in FIG. 1 has an insulating protective layer 2, a metal layer 3, a first inorganic layer 4, and a conductive adhesive layer 5 in this order.
- the insulating protective layer 2, the metal layer 3, the first inorganic layer 4, and the conductive adhesive layer 5 are directly laminated to adjacent layers.
- the conductive adhesive layer has, for example, adhesiveness and adhesiveness for adhering the shield film of the present invention to a printed wiring board, and electrical conductivity for electrically connecting with the metal layer. In addition, it can function as a shield layer exhibiting shielding performance together with the metal layer.
- the conductive adhesive layer may be a single layer or multiple layers.
- the conductive adhesive layer contains a binder component and conductive particles.
- binder component examples include thermoplastic resins, thermosetting resins, and active energy ray-curable compounds. Only one type of the binder component may be used, or two or more types may be used.
- thermoplastic resin examples include polystyrene-based resin, vinyl acetate-based resin, polyester-based resin, polyolefin-based resin (polyethylene-based resin, polypropylene-based resin, etc.), polyamide-based resin, rubber-based resin, acrylic-based resin, silicone-based resin, etc. is mentioned. Only one type of the thermoplastic resin may be used, or two or more types may be used.
- thermosetting resin examples include both resins having thermosetting properties (thermosetting resins) and resins obtained by curing the above thermosetting resins.
- thermosetting resin examples include phenol-based resins, epoxy-based resins, urethane-based resins, melamine-based resins, alkyd-based resins, acrylic-based resins, and the like. Only one kind of the thermosetting resin may be used, or two or more kinds thereof may be used.
- epoxy resin examples include bisphenol type epoxy resin, spirocyclic epoxy resin, naphthalene type epoxy resin, biphenyl type epoxy resin, terpene type epoxy resin, glycidyl ether type epoxy resin, glycidyl amine type Epoxy-based resins, novolak-type epoxy-based resins, and the like are included.
- Examples of the bisphenol type epoxy resin include bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, tetrabromobisphenol A type epoxy resin, and the like.
- Examples of the glycidyl ether type epoxy resin include tris(glycidyloxyphenyl)methane and tetrakis(glycidyloxyphenyl)ethane.
- Examples of the glycidylamine type epoxy resin include tetraglycidyldiaminodiphenylmethane.
- Examples of the novolak type epoxy resin include cresol novolak type epoxy resin, phenol novolak type epoxy resin, ⁇ -naphthol novolak type epoxy resin, and brominated phenol novolak type epoxy resin.
- the active energy ray-curable compounds include both compounds that can be cured by irradiation with active energy rays (active energy ray-curable compounds) and compounds obtained by curing the active energy ray-curable compounds.
- the active energy ray-curable compound is not particularly limited, but for example, a polymerizable compound having one or more (preferably two or more) radical reactive groups (e.g., (meth)acryloyl groups) in the molecule. mentioned. Only 1 type may be used for the said active-energy-ray-curable compound, and 2 or more types may be used for it.
- the conductive adhesive layer has tackiness, and when the shield film of the present invention is used by being attached to an adherend such as a printed wiring board, it can be easily attached without being subjected to high temperature and high pressure conditions. can be matched.
- the binder component When the binder component contains a thermosetting resin, it may contain a curing agent for accelerating the thermosetting reaction as a constituent component of the binder component.
- the curing agent can be appropriately selected according to the type of the thermosetting resin. Only one kind of the curing agent may be used, or two or more kinds thereof may be used.
- Examples of the conductive particles include metal particles, metal-coated resin particles, metal fibers, carbon fillers, and carbon nanotubes.
- metals constituting the coating portion of the metal particles and the metal-coated resin particles include gold, silver, copper, nickel, zinc, indium, tin, lead, bismuth, and alloys containing two or more of these. . Only one kind of the above metals may be used, or two or more kinds thereof may be used.
- the metal particles include copper particles, silver particles, nickel particles, silver-coated copper particles, indium particles, tin particles, lead particles, bismuth particles, gold-coated copper particles, silver-coated nickel particles, gold coated nickel particles, indium-coated copper particles, tin-coated copper particles, lead-coated copper particles, bismuth-coated copper particles, indium-coated nickel particles, tin-coated nickel particles, bismuth-coated nickel particles, silver-coated alloy particles, and the like.
- the silver-coated alloy particles include silver-coated copper alloy particles in which alloy particles containing copper (for example, copper alloy particles made of an alloy of copper, nickel and zinc) are coated with silver.
- the metal particles can be produced by an electrolysis method, an atomization method, a reduction method, or the like.
- silver particles silver particles, silver-coated copper particles, silver-coated copper alloy particles, nickel particles, and silver-coated nickel particles are preferable.
- Silver-coated copper particles and silver-coated copper alloy particles are particularly preferred from the viewpoints of excellent conductivity, suppression of oxidation and agglomeration of the metal particles, and reduction in the cost of the metal particles.
- metal-coated resin particles include silver-coated resin particles, gold-coated resin particles, indium-coated resin particles, tin-coated resin particles, lead-coated resin particles, and bismuth-coated resin particles.
- Examples of the shape of the conductive particles include spherical, flake-like (scale-like), dendritic (dendrite-like), fibrous (filament-like), amorphous (polyhedral), and spike-like shapes.
- the median diameter (D50) of the conductive particles is preferably 1-50 ⁇ m, more preferably 3-40 ⁇ m. When the median diameter is 1 ⁇ m or more, the dispersibility of the conductive particles is good and aggregation can be suppressed. When the average particle size is 50 ⁇ m or less, the conductivity becomes good.
- the median diameter is the median diameter of all the conductive particles in the conductive adhesive layer, and refers to the particle size at 50% of the integrated value in the particle size distribution determined by the laser diffraction/scattering method. When the median diameter is within the above range, the connection stability is more excellent.
- the median diameter can be measured, for example, with a laser diffraction particle size distribution analyzer (trade name “SALD-2200”, manufactured by Shimadzu Corporation).
- the conductive adhesive layer can be a layer having isotropic conductivity or anisotropic conductivity depending on the application.
- the content of the conductive particles in the conductive adhesive layer is preferably 3 to 95% by mass, more preferably 5 to 90% by mass, with respect to 100% by mass of the total amount of the conductive adhesive layer. be. In the case of forming an isotropically conductive conductive adhesive layer, it can be 40 to 95% by mass. In the case of forming an anisotropically conductive conductive adhesive layer, it can be 3 to 40% by mass.
- the conductive adhesive layer may contain components other than the components described above within a range that does not impair the effects of the present invention.
- the above-mentioned other components include components contained in known or commonly used adhesive layers.
- the above other components include curing accelerators, plasticizers, flame retardants, defoaming agents, viscosity modifiers, antioxidants, diluents, anti-settling agents, fillers, leveling agents, coupling agents, and UV absorbers. agents, tackifying resins, antiblocking agents, and the like. Only one kind of the other components may be used, or two or more kinds thereof may be used.
- the thickness of the conductive adhesive layer is not particularly limited, it is preferably 3-20 ⁇ m, more preferably 5-18 ⁇ m. When the thickness is 3 ⁇ m or more, the adhesiveness to the adherend is more excellent. Moreover, it is superior in environmental resistance. When the thickness is 20 ⁇ m or less, the connection stability is excellent even when adhered to a printed wiring board under relatively mild conditions.
- the ratio of the thickness of the conductive adhesive layer to the D50 of the conductive particles is 0.2 to 3.5, preferably 0.3 to 3.0. .
- the adhesion to adherends such as printed wiring boards becomes better.
- the above ratio is 3.5 or less, the amount of conductive particles exposed from the surface of the conductive adhesive layer is increased, and connection stability is ensured even when adhered to a printed wiring board under relatively mild conditions.
- the first inorganic layer is a layer that protects the metal layer.
- the first inorganic layer By interposing the first inorganic layer between the metal layer and the conductive adhesive layer, the surface of the metal layer on the side provided with the conductive adhesive layer is protected, and in a high-temperature and high-humidity environment, the above-mentioned It is possible to suppress deterioration of the connection stability due to deterioration of the metal layer, that is, excellent environmental resistance. It is presumed that the deterioration of the connection stability is caused by the deterioration of the metal layer due to the moisture or the like in the conductive adhesive layer.
- the first inorganic layer may be a single layer or multiple layers.
- Examples of inorganic substances that constitute the first inorganic layer include metal oxides and other inorganic oxides. Only one kind of the inorganic substance may be used, or two or more kinds thereof may be used.
- Examples of the inorganic oxide include aluminum oxide (alumina), magnesium oxide, antimony oxide, titanium oxide, chromium oxide, zirconium oxide, zinc oxide, nickel oxide, palladium oxide, tungsten oxide, indium oxide, and ITO (Indium Tin Oxide). ; indium tin oxide) and silicon oxide.
- Examples of the alkaline earth metal salt include fluoride salts such as magnesium fluoride and calcium fluoride.
- Examples of metal salts other than alkaline earth metal salts include aluminum silicate, aluminum hydroxide, and zinc sulfide.
- inorganic oxides are preferable, and metal oxides are more preferable, and titanium oxide, chromium oxide, and zirconium oxide are more preferable from the viewpoint of superior environmental resistance and economic efficiency.
- Examples of methods for forming the first inorganic layer include electrolysis, vapor deposition (eg, vacuum vapor deposition), sputtering, CVD, metal organic (MO), plating, and rolling. Among them, an inorganic layer formed by vapor deposition, sputtering, or plating is preferable from the viewpoint of ease of manufacture.
- the thickness of the first inorganic layer is 0.1 to 100 nm, preferably 0.1 to 20 nm, more preferably 0.1 to 10 nm, still more preferably 0.1 to 5 nm, particularly preferably 0.1 ⁇ 2.2 nm.
- the thickness is 0.1 nm or more, the environmental resistance is excellent.
- the thickness is 100 nm or less, the connection stability is excellent even when the adhesive is adhered to the printed wiring board under relatively mild conditions.
- the thickness of the first inorganic layer is the total thickness of all layers.
- the metal layer is an element that functions as a shield layer in the shield film of the present invention.
- the metal layer may be a single layer or a laminate of the same or different types.
- metals forming the metal layer include gold, silver, copper, aluminum, lithium, nickel, tin, palladium, chromium, titanium, zinc, and alloys thereof.
- the alloy include silver/copper alloy, magnesium/copper alloy, magnesium/silver alloy, magnesium/aluminum alloy, magnesium/indium alloy, lithium/aluminum alloy, ITO (Indium Tin Oxide; indium tin oxide), and the like. mentioned.
- copper and silver are preferable from the viewpoint of excellent electromagnetic wave shielding performance, and silver/copper alloy is preferable from the viewpoint of excellent migration resistance and sulfurization resistance.
- the method of forming the metal layer is not particularly limited, and examples include electrolysis, vapor deposition (eg, vacuum vapor deposition), sputtering, CVD, metal organic (MO), plating, and rolling. Among them, a metal layer formed by vapor deposition, plating, or sputtering is preferable from the viewpoint of ease of manufacture.
- the thickness of the metal layer is not particularly limited, it is, for example, 5 nm to 15 ⁇ m, preferably 5 nm to 13 ⁇ m.
- the thickness of the metal layer is the sum of all layer thicknesses.
- the insulating protective layer has insulating properties and protects the inner layers of the shield film of the present invention. By providing the insulating protective layer, it is possible to improve the environmental resistance of the surface of the metal layer on which the first inorganic layer is not provided, and to further suppress the deterioration of the connection stability.
- the insulating protective layer may be a single layer or multiple layers.
- the insulating protective layer examples include a resin layer formed mainly from a resin, or an inorganic layer formed from an inorganic substance.
- the insulating protective layer is an inorganic layer, the environmental resistance is further improved.
- the insulating protective layer is a resin layer, it functions as a support in the shield film of the present invention.
- the insulating protective layer may be a single layer or a laminate of the same or different types.
- the insulating protective layer preferably has a resin layer and an inorganic layer.
- the inorganic layer is preferably on the metal layer side.
- the inorganic layer that can be included in the insulating protective layer may be referred to as a "second inorganic layer".
- the second inorganic layer is preferably laminated directly on the metal layer from the viewpoint of better environmental resistance.
- FIG. 2 shows an embodiment of the shield film of the present invention in which the insulating protective layer comprises a resin layer and a second inorganic layer.
- the insulating protective layer 2 has a laminate structure of a resin layer 21 and a second inorganic layer 22, and is composed of the laminate structure.
- the second inorganic layer 22 is arranged on the metal layer 3 side and the resin layer 21 is arranged on the outermost surface, and the second inorganic layer 22 is directly laminated on the metal layer 3 .
- Examples of the resin constituting the resin layer in the insulating protective layer include thermoplastic resins, thermosetting resins, and active energy ray compounds. It is preferably a type compound. Only one kind of the above resin may be used, or two or more kinds thereof may be used.
- thermoplastic resin examples include low-density polyethylene, linear low-density polyethylene, medium-density polyethylene, high-density polyethylene, ultra-low-density polyethylene, random copolymer polypropylene, block copolymer polypropylene, homopolypropylene, polybutene, poly Methylpentene, ethylene-vinyl acetate copolymer (EVA), ionomer, ethylene-(meth)acrylic acid copolymer, ethylene-(meth)acrylic acid ester (random, alternating) copolymer, ethylene-butene copolymer , Polyolefin resins such as ethylene-hexene copolymer; polyurethane; polyester such as polyethylene terephthalate (PET), polyethylene naphthalate, polybutylene terephthalate (PBT); polycarbonate (PC); polyimide (PI); ); Polyetherimide; Aramid, polyamide such as wholly
- thermosetting resin examples include both resins having thermosetting properties (thermosetting resins) and resins obtained by curing the above thermosetting resins.
- thermosetting resin examples include phenol-based resins, epoxy-based resins, urethane-based resins, melamine-based resins, alkyd-based resins, imide-based resins, amide-based resins, polyamideimide-based resins, polyphenylsulfide-based resins, liquid crystals, Examples include polymers (LCP) and acrylic resins. Only one kind of the thermosetting resin may be used, or two or more kinds thereof may be used.
- the active energy ray-curable compounds include both compounds that can be cured by irradiation with active energy rays (active energy ray-curable compounds) and compounds obtained by curing the active energy ray-curable compounds.
- the active energy ray-curable compound is not particularly limited, but for example, a polymerizable compound having one or more (preferably two or more) radical reactive groups (e.g., (meth)acryloyl groups) in the molecule. mentioned. Only 1 type may be used for the said active-energy-ray-curable compound, and 2 or more types may be used for it.
- the surface of the resin layer (especially the surface on the side of the metal layer) may be subjected to, for example, corona discharge treatment, plasma treatment, sand mat treatment, and the like, for the purpose of enhancing adhesion and retention with adjacent layers such as the metal layer.
- Physical treatment such as ozone exposure treatment, flame exposure treatment, high voltage shock exposure treatment, ionizing radiation treatment; chemical treatment such as chromic acid treatment; surface treatment such as easy adhesion treatment with coating agent (undercoat). good too. It is preferable that the surface treatment for enhancing adhesion is applied to the entire surface of the resin layer on the metal layer side.
- the thickness of the resin layer is not particularly limited, it is preferably 1 to 20 ⁇ m, more preferably 1 to 4 ⁇ m. When the thickness is 1 ⁇ m or more, the shield film can be more sufficiently supported and the metal layer can be protected. When the thickness is 20 ⁇ m or less, the transparency and flexibility are excellent, and economically advantageous. In addition, when the said resin layer is a multilayer structure, the thickness of the said resin layer is the total thickness of all the layers.
- Examples of the inorganic substance forming the second inorganic layer include those exemplified and explained as the inorganic substance forming the first inorganic layer. Only one kind of the inorganic substance may be used, or two or more kinds thereof may be used.
- inorganic oxides are preferable, and metal oxides are more preferable, and titanium oxide, chromium oxide, and zirconium oxide are more preferable from the viewpoint of superior environmental resistance and economic efficiency.
- Examples of methods for forming the second inorganic layer include electrolysis, deposition (eg, vacuum deposition), sputtering, CVD, metal organic (MO), plating, and rolling. Among them, an inorganic layer formed by vapor deposition, plating, or sputtering is preferable from the viewpoint of ease of manufacture.
- the thickness of the second inorganic layer is 0.1 to 100 nm, preferably 0.1 to 20 nm, more preferably 0.1 to 10 nm, still more preferably 0.1 to 5 nm, particularly preferably 0.1 ⁇ 2.2 nm.
- the thickness is 0.1 nm or more, the environmental resistance is excellent.
- the thickness is 100 nm or less, the connection stability to the outside is excellent.
- the thickness of the second inorganic layer is the total thickness of all layers.
- the shield film of the present invention may have a separator (release film) on the side of the conductive adhesive layer.
- the separator is laminated so as to be peelable from the shield film of the present invention.
- a separator is an element for covering and protecting the conductive adhesive layer, and is peeled off when using the shield film of the present invention.
- separator examples include polyethylene terephthalate (PET) film, polyethylene film, polypropylene film, plastic film and paper surface-coated with a release agent such as a fluorine-based release agent and a long-chain alkyl acrylate release agent. .
- PET polyethylene terephthalate
- a release agent such as a fluorine-based release agent and a long-chain alkyl acrylate release agent.
- the thickness of the separator is preferably 10-200 ⁇ m, more preferably 15-150 ⁇ m. When the thickness is 10 ⁇ m or more, the protective performance is excellent. When the thickness is 200 ⁇ m or less, the separator is easily peeled off during use.
- the shielding film of the present invention may have layers other than the layers described above.
- the other layers include other insulating layers, antireflection layers, antiglare layers, antifouling layers, hard coat layers, ultraviolet absorption layers, anti-Newton ring layers, and the like.
- the shielding film of the present invention can be easily adhered to an adherend, yet has excellent adhesion to the adherend, excellent electrical connection stability, and excellent environmental resistance. Therefore, the electromagnetic wave shielding film of the present invention can be used even for substrates having poor resistance to high temperatures and high pressures. Moreover, it can be used in an environment where environmental resistance is required.
- the shielding film of the present invention is preferably used for printed wiring boards, and particularly preferably for flexible printed wiring boards (FPC).
- FPC flexible printed wiring boards
- the shielding film of the present invention has excellent environmental resistance. Therefore, it can be preferably used in a high-temperature and high-humidity environment, for example, inside a vehicle such as an automobile.
- FIG. 1 Manufacturing method of electromagnetic wave shielding film
- the metal layer 3 is formed on the insulating protective layer 2 . Formation of the metal layer 3 can be performed by the various methods described above.
- the insulating protective layer 2 can be formed by forming the second inorganic layer 22 on the resin layer 21 by vacuum deposition, sputtering, or the like.
- a metal layer 3 is formed on the insulating protective layer 2 by vacuum deposition, sputtering, plating, or the like.
- the first inorganic layer 4 can be formed on the surface of the formed metal layer 3 by vacuum deposition, sputtering, or the like.
- the adhesive composition for forming the conductive adhesive layer 5 is applied (coated) to the surface of the formed first inorganic layer 4, and if necessary, the solvent is removed and / or partially cured. can be formed.
- the adhesive composition contains, for example, a solvent (solvent) in addition to the components contained in the conductive adhesive layer.
- the solvent include those exemplified as solvents that can be contained in the composition for forming the insulating protective layer.
- the solid content concentration of the adhesive composition is appropriately set according to the thickness of the conductive adhesive layer to be formed.
- a known coating method may be used to apply each of the above compositions.
- coaters such as gravure roll coaters, reverse roll coaters, kiss roll coaters, lip coaters, dip roll coaters, bar coaters, knife coaters, spray coaters, comma coaters, direct coaters and slot die coaters may be used.
- a printed wiring board can be produced using the shielding film of the present invention. For example, by bonding the conductive adhesive layer of the shield film of the present invention to a printed wiring board (for example, a coverlay), a shield printed wiring board in which the shield film of the present invention is bonded to the printed wiring board can be obtained. can.
- the conductive adhesive layer may be thermoset.
- Example 1 A TiO 2 film (thickness: 2 nm) was formed as a second inorganic layer by sputtering on the surface of a PET film (thickness: 6 ⁇ m), which was a resin layer, to prepare an insulating protective layer. Next, a silver thin film (10 nm thick) was formed as a metal layer on the surface of the TiO 2 film by vacuum deposition. Next, a TiO 2 film (thickness: 1.5 nm) was formed on the surface of the silver thin film by sputtering as a first inorganic layer.
- thermoplastic acrylic resin 95 parts by mass of thermoplastic acrylic resin, 5 parts by mass of silver-coated copper powder (spherical, median diameter 5 ⁇ m), and 400 parts by mass of toluene (solid content: 20% by mass) are blended.
- the adhesive composition obtained by mixing is applied to the surface of a polyester film whose surface has been subjected to release treatment using a wire bar, and is heated at 100° C. for 3 minutes to form a conductive adhesive layer (thickness: 5 ⁇ m). was formed and attached to the TiO 2 film side as the first inorganic layer. As described above, the shield film of Example 1 was produced.
- Examples 2-4 An electromagnetic wave shielding film of each example was produced in the same manner as in Example 1, except that the thickness of the first inorganic layer was changed as shown in Table 1.
- Example 5 The epoxy resin composition was applied to a PET film substrate whose surface had been subjected to mold release treatment, and cured by heating at 100° C. for 3 minutes to form a resin layer of epoxy resin having a thickness of 5 ⁇ m. Chromium oxide (thickness: 0.2 nm) was formed by plating on both side surfaces of a rolled copper foil having a thickness of 6 ⁇ m to obtain a laminate consisting of the second inorganic layer/metal layer/first inorganic layer. Next, the second inorganic layer surface of the laminate was attached to the surface of the resin layer by heat lamination.
- Chromium oxide thickness: 0.2 nm
- thermoplastic acrylic resin as a conductive adhesive layer
- nickel particles filament shape, median diameter 20 ⁇ m
- toluene solid content is 20% by mass
- Examples 6-8 An electromagnetic wave shielding film of each example was prepared in the same manner as in Example 5 except that the thickness of the first inorganic layer, the thickness of the second inorganic layer, and the type of conductive particles were changed as shown in Table 1. made.
- Comparative example 1 An electromagnetic wave shielding film of Comparative Example 1 was produced in the same manner as in Example 1, except that the metal layer and the conductive adhesive layer were directly bonded together without producing the first inorganic layer.
- Comparative example 2 An electromagnetic wave shielding film of Comparative Example 2 was produced in the same manner as in Example 3, except that the thickness of the first inorganic layer was 150 nm.
- Comparative example 3 An electromagnetic wave shielding film of Comparative Example 3 was produced in the same manner as in Example 3, except that the thickness of the conductive adhesive layer was 1 ⁇ m, the silver-coated copper powder was spherical, and the median diameter was 7 ⁇ m.
- Comparative example 4 An electromagnetic wave shielding film of Comparative Example 4 was produced in the same manner as in Example 3, except that instead of the silver-coated copper powder of Example 1, spherical silver-coated copper powder having a median diameter of 1 ⁇ m was used.
- connection resistance value measurement Two electrodes each having a width of 5 mm and a length of 10 mm were placed on a glass epoxy substrate having a thickness of 2 mm with a spacing of 100 mm. Then, the shielding film obtained in the example was punched out on the electrode arrangement surface to a width of 5 mm and a length of 130 mm, and under normal temperature and pressure conditions, a 2 kg roller was reciprocated once to connect the electrodes to conductive adhesion. The agent layer surfaces were pasted together. After laminating the conductive adhesive layer surfaces, the resistance value between the two electrodes was measured using a 4-terminal method tester (trade name "RM3542", manufactured by Hioki Electric Co., Ltd.) immediately after the electromagnetic shielding film was produced and at 65 ° C. Each was measured after storage for 72 hours in an environment of 90% RH.
- the shielding films of the present invention have low connection resistance values and excellent shielding performance even when laminated under mild conditions that are not high temperature and high pressure conditions.
- the environmental resistance was poor (Comparative Example 1)
- the first inorganic layer was too thick, the connection stability was poor (Comparative Example 2).
- the ratio of the thickness of the conductive adhesive layer to the median diameter of the conductive particles is too small, the adhesiveness cannot be exhibited, resulting in the resistance value being unmeasurable (Comparative Example 3).
- the connection stability was poor (Comparative Example 4).
- the electromagnetic wave shielding film of the present invention can be suitably used for printed wiring boards.
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
- Laminated Bodies (AREA)
- Adhesive Tapes (AREA)
Abstract
Description
上記第1無機層の厚さは0.1~100nmであり、
上記導電性接着剤層は、バインダー成分および導電性粒子を含み、
上記導電性粒子のメディアン径に対する上記導電性接着剤層の厚さの比は0.2~3.5である、電磁波シールドフィルムを提供する。 That is, in the present invention, a metal layer, a first inorganic layer, and a conductive adhesive layer are laminated in this order,
The thickness of the first inorganic layer is 0.1 to 100 nm,
The conductive adhesive layer contains a binder component and conductive particles,
Provided is an electromagnetic wave shielding film, wherein the ratio of the thickness of the conductive adhesive layer to the median diameter of the conductive particles is 0.2 to 3.5.
本発明の電磁波シールドフィルム(シールドフィルム)は、金属層、第1無機層、および導電性接着剤層がこの順に積層された層構成を有する。 [Shielding film]
The electromagnetic wave shielding film (shielding film) of the present invention has a layer structure in which a metal layer, a first inorganic layer, and a conductive adhesive layer are laminated in this order.
上記導電性接着剤層は、例えば本発明のシールドフィルムをプリント配線板に接着するための接着性や接着性と、上記金属層と電気的接続するための導電性を有する。また、上記金属層とともにシールド性能を発揮するシールド層としても機能し得る。上記導電性接着剤層は、単層であってもよく、複層であってもよい。 (Conductive adhesive layer)
The conductive adhesive layer has, for example, adhesiveness and adhesiveness for adhering the shield film of the present invention to a printed wiring board, and electrical conductivity for electrically connecting with the metal layer. In addition, it can function as a shield layer exhibiting shielding performance together with the metal layer. The conductive adhesive layer may be a single layer or multiple layers.
上記第1無機層は、上記金属層を保護する層である。上記第1無機層が上記金属層と上記導電性接着剤層との間に介在することにより、上記金属層の上記導電性接着剤層を備える側の面を保護し、高温高湿環境において上記金属層が劣化して接続安定性が低下するのを抑制することができ、すなわち、耐環境性に優れる。上記接続安定性の低下は、上記導電性接着剤層中の水分等により上記金属層が劣化することに起因するものと推測される。上記第1無機層は、単層であってもよく、複層であってもよい。 (First inorganic layer)
The first inorganic layer is a layer that protects the metal layer. By interposing the first inorganic layer between the metal layer and the conductive adhesive layer, the surface of the metal layer on the side provided with the conductive adhesive layer is protected, and in a high-temperature and high-humidity environment, the above-mentioned It is possible to suppress deterioration of the connection stability due to deterioration of the metal layer, that is, excellent environmental resistance. It is presumed that the deterioration of the connection stability is caused by the deterioration of the metal layer due to the moisture or the like in the conductive adhesive layer. The first inorganic layer may be a single layer or multiple layers.
上記金属層は、本発明のシールドフィルムにおいてシールド層として機能する要素である。上記金属層は、単層であってもよいし、同種または異種の積層体であってもよい。 (metal layer)
The metal layer is an element that functions as a shield layer in the shield film of the present invention. The metal layer may be a single layer or a laminate of the same or different types.
上記絶縁保護層は、絶縁性を有し、且つ本発明のシールドフィルムにおける内部の各層を保護する。上記絶縁保護層を備えると、上記金属層の上記第1無機層が備えられていない側の面における耐環境性を向上させ、接続安定性の低下をより抑制することができる。上記絶縁保護層は、単層であってもよく、複層であってもよい。 (insulating protective layer)
The insulating protective layer has insulating properties and protects the inner layers of the shield film of the present invention. By providing the insulating protective layer, it is possible to improve the environmental resistance of the surface of the metal layer on which the first inorganic layer is not provided, and to further suppress the deterioration of the connection stability. The insulating protective layer may be a single layer or multiple layers.
本発明のシールドフィルムの製造方法の一実施形態について、図1および図2を用いて説明する。図1に示すシールドフィルム1の作製においては、まず、絶縁保護層2上に金属層3を形成する。金属層3の形成は、上述した各種方法により行うことができる。 (Manufacturing method of electromagnetic wave shielding film)
One embodiment of the method for manufacturing the shielding film of the present invention will be described with reference to FIGS. 1 and 2. FIG. In producing the
樹脂層であるPETフィルム(厚さ6μm)の表面に、第2無機層としてスパッタリングによりTiO2膜(厚さ2nm)を形成し、絶縁保護層を作製した。次に、上記TiO2膜表面に、金属層として真空蒸着により銀薄膜(厚さ10nm)を形成した。次に、上記銀薄膜表面に、第1無機層としてスパッタリングによりTiO2膜(厚さ1.5nm)を形成した。そして、導電性接着剤層として熱可塑性のアクリル系樹脂95質量部、銀コート銅粉(球状、メディアン径5μm)5質量部、およびトルエン400質量部(固形分が20質量%)を配合して混合して得られた接着剤組成物を、表面を離型処理したポリエステルフィルム表面に、ワイヤーバーを用いて塗布し、100℃で3分加熱することで導電性接着剤層(厚さ5μm)を形成し、上記第1無機層であるTiO2膜側に貼り合わせた。以上のようにして、実施例1のシールドフィルムを作製した。 Example 1
A TiO 2 film (thickness: 2 nm) was formed as a second inorganic layer by sputtering on the surface of a PET film (thickness: 6 μm), which was a resin layer, to prepare an insulating protective layer. Next, a silver thin film (10 nm thick) was formed as a metal layer on the surface of the TiO 2 film by vacuum deposition. Next, a TiO 2 film (thickness: 1.5 nm) was formed on the surface of the silver thin film by sputtering as a first inorganic layer. Then, as a conductive adhesive layer, 95 parts by mass of thermoplastic acrylic resin, 5 parts by mass of silver-coated copper powder (spherical, median diameter 5 μm), and 400 parts by mass of toluene (solid content: 20% by mass) are blended. The adhesive composition obtained by mixing is applied to the surface of a polyester film whose surface has been subjected to release treatment using a wire bar, and is heated at 100° C. for 3 minutes to form a conductive adhesive layer (thickness: 5 μm). was formed and attached to the TiO 2 film side as the first inorganic layer. As described above, the shield film of Example 1 was produced.
第1無機層の厚さを表1に示すとおりに変更したこと以外は実施例1と同様にして、各実施例の電磁波シールドフィルムを作製した。 Examples 2-4
An electromagnetic wave shielding film of each example was produced in the same manner as in Example 1, except that the thickness of the first inorganic layer was changed as shown in Table 1.
エポキシ樹脂組成物を、表面に離型処理を施したPETフィルム基材に塗布し、100℃、3分の条件で加熱硬化して厚さが5μmのエポキシ樹脂からなる樹脂層を形成した。また、厚さ6μmの圧延銅箔の両側表面に、メッキによって酸化クロム(厚さ0.2nm)を形成し、第2無機層/金属層/第1無機層からなる積層体を得た。次に、上記樹脂層の表面に、上記積層体の第2無機層面を加熱ラミネートにより貼り合わせた。次に、上記第1無機層の表面に、導電性接着剤層として熱可塑性のアクリル系樹脂95質量部、ニッケル粒子(フィラメント状、メディアン径20μm)5質量部、およびトルエン400質量部(固形分が20質量%)を配合して混合して得られた接着剤組成物を、ワイヤーバーを用いて塗布し、100℃で3分間加熱することで導電性接着剤層(厚さ13μm)を形成して、実施例5の電磁波シールドフィルムを得た。 Example 5
The epoxy resin composition was applied to a PET film substrate whose surface had been subjected to mold release treatment, and cured by heating at 100° C. for 3 minutes to form a resin layer of epoxy resin having a thickness of 5 μm. Chromium oxide (thickness: 0.2 nm) was formed by plating on both side surfaces of a rolled copper foil having a thickness of 6 μm to obtain a laminate consisting of the second inorganic layer/metal layer/first inorganic layer. Next, the second inorganic layer surface of the laminate was attached to the surface of the resin layer by heat lamination. Next, on the surface of the first inorganic layer, 95 parts by mass of thermoplastic acrylic resin as a conductive adhesive layer, 5 parts by mass of nickel particles (filament shape, median diameter 20 μm), and 400 parts by mass of toluene (solid content is 20% by mass), the adhesive composition obtained by mixing is applied using a wire bar and heated at 100 ° C. for 3 minutes to form a conductive adhesive layer (thickness 13 μm). Thus, an electromagnetic wave shielding film of Example 5 was obtained.
第1無機層の厚さ、第2無機層の厚さ、および導電性粒子の種類を表1に示すとおりに変更したこと以外は実施例5と同様にして、各実施例の電磁波シールドフィルムを作製した。 Examples 6-8
An electromagnetic wave shielding film of each example was prepared in the same manner as in Example 5 except that the thickness of the first inorganic layer, the thickness of the second inorganic layer, and the type of conductive particles were changed as shown in Table 1. made.
第1無機層を作製せず、金属層と導電性接着剤層を直接貼り合わせた以外は実施例1と同様にして比較例1の電磁波シールドフィルムを作製した。 Comparative example 1
An electromagnetic wave shielding film of Comparative Example 1 was produced in the same manner as in Example 1, except that the metal layer and the conductive adhesive layer were directly bonded together without producing the first inorganic layer.
第1無機層の厚さを150nmとした以外は実施例3と同様にして比較例2の電磁波シールドフィルムを作製した。 Comparative example 2
An electromagnetic wave shielding film of Comparative Example 2 was produced in the same manner as in Example 3, except that the thickness of the first inorganic layer was 150 nm.
導電性接着剤層の厚さを1μmとし、銀コート銅粉を球状、メディアン径7μmとした以外は実施例3と同様にして、比較例3の電磁波シールドフィルムを作製した。 Comparative example 3
An electromagnetic wave shielding film of Comparative Example 3 was produced in the same manner as in Example 3, except that the thickness of the conductive adhesive layer was 1 μm, the silver-coated copper powder was spherical, and the median diameter was 7 μm.
実施例1の銀コート銅紛に代えてメディアン径が1μmの球状銀コート銅紛を使用した以外は実施例3と同様にして、比較例4の電磁波シールドフィルムを作製した。 Comparative example 4
An electromagnetic wave shielding film of Comparative Example 4 was produced in the same manner as in Example 3, except that instead of the silver-coated copper powder of Example 1, spherical silver-coated copper powder having a median diameter of 1 μm was used.
実施例及び比較例で得られた各シールドフィルムについて以下の通り評価した。評価結果は表に記載した。なお、使用しなかった項目、及び正確に測定できなかった項目に関しては表中で「-」として表記した。 [evaluation]
Each shield film obtained in Examples and Comparative Examples was evaluated as follows. The evaluation results are shown in the table. Items that were not used and items that could not be accurately measured are indicated as "-" in the table.
幅5mm×長さ10mmの電極2つを間隔100mmになるように厚さ2mmのガラスエポキシ基板上に配置した。そして、電極の配置面に、実施例で得られたシールドフィルムを、幅5mm×長さ130mmに打ち抜き、常温常圧の条件下で、2kgローラーで1往復させ電極間を繋ぐように導電性接着剤層面を貼り合わせた。導電性接着剤層面を貼り合わせた後、2つの電極間の抵抗値を、4端子法テスター(商品名「RM3542」、日置電機株式会社製)を用いて、電磁波シールドフィルム作製直後、及び65℃90%RHの環境で72時間保管後にそれぞれ測定した。 (connection resistance value measurement)
Two electrodes each having a width of 5 mm and a length of 10 mm were placed on a glass epoxy substrate having a thickness of 2 mm with a spacing of 100 mm. Then, the shielding film obtained in the example was punched out on the electrode arrangement surface to a width of 5 mm and a length of 130 mm, and under normal temperature and pressure conditions, a 2 kg roller was reciprocated once to connect the electrodes to conductive adhesion. The agent layer surfaces were pasted together. After laminating the conductive adhesive layer surfaces, the resistance value between the two electrodes was measured using a 4-terminal method tester (trade name "RM3542", manufactured by Hioki Electric Co., Ltd.) immediately after the electromagnetic shielding film was produced and at 65 ° C. Each was measured after storage for 72 hours in an environment of 90% RH.
2 絶縁保護層
21 樹脂層
22 第2無機層
3 金属層
4 第1無機層
5 導電性接着剤層 REFERENCE SIGNS
Claims (10)
- 金属層、第1無機層、および導電性接着剤層がこの順に積層されており、
前記第1無機層の厚さは0.1~100nmであり、
前記導電性接着剤層は、バインダー成分および導電性粒子を含み、
前記導電性粒子のメディアン径に対する前記導電性接着剤層の厚さの比は0.2~3.5である、電磁波シールドフィルム。 A metal layer, a first inorganic layer, and a conductive adhesive layer are laminated in this order,
The thickness of the first inorganic layer is 0.1 to 100 nm,
The conductive adhesive layer contains a binder component and conductive particles,
An electromagnetic wave shielding film, wherein the ratio of the thickness of the conductive adhesive layer to the median diameter of the conductive particles is 0.2 to 3.5. - 前記金属層における、前記第1無機層とは反対側の表面に絶縁保護層が直接積層されている、請求項1に記載の電磁波シールドフィルム。 The electromagnetic wave shielding film according to claim 1, wherein an insulating protective layer is directly laminated on the surface of the metal layer opposite to the first inorganic layer.
- 前記絶縁保護層として前記金属層と直接積層した第2無機層を有する請求項2に記載の電磁波シールドフィルム。 The electromagnetic wave shielding film according to claim 2, which has a second inorganic layer directly laminated with the metal layer as the insulating protective layer.
- 前記第2無機層の厚さは0.1~100nmである請求項3に記載の電磁波シールドフィルム。 The electromagnetic wave shielding film according to claim 3, wherein the second inorganic layer has a thickness of 0.1 to 100 nm.
- 前記第2無機層は金属酸化物から構成される請求項3または4に記載の電磁波シールドフィルム。 The electromagnetic wave shielding film according to claim 3 or 4, wherein the second inorganic layer is composed of a metal oxide.
- 前記絶縁保護層として樹脂層を有する請求項2~5のいずれか1項に記載の電磁波シールドフィルム。 The electromagnetic wave shielding film according to any one of claims 2 to 5, which has a resin layer as the insulating protective layer.
- 前記第1無機層は金属酸化物から構成される請求項1~6のいずれか1項に記載の電磁波シールドフィルム。 The electromagnetic wave shielding film according to any one of claims 1 to 6, wherein the first inorganic layer is composed of a metal oxide.
- 前記第1無機層は前記金属層と直接積層している請求項1~7のいずれか1項に記載の電磁波シールドフィルム。 The electromagnetic wave shielding film according to any one of claims 1 to 7, wherein the first inorganic layer is directly laminated with the metal layer.
- 前記導電性接着剤層は前記第1無機層と直接積層している請求項1~8のいずれか1項に記載の電磁波シールドフィルム。 The electromagnetic wave shielding film according to any one of claims 1 to 8, wherein the conductive adhesive layer is directly laminated with the first inorganic layer.
- 請求項1~9のいずれか1項に記載の電磁波シールドフィルムを備えたシールドプリント配線板。 A shield printed wiring board comprising the electromagnetic wave shielding film according to any one of claims 1 to 9.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202280038757.2A CN117397379A (en) | 2021-06-02 | 2022-06-02 | Electromagnetic wave shielding film |
JP2023525905A JPWO2022255438A1 (en) | 2021-06-02 | 2022-06-02 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021-093219 | 2021-06-02 | ||
JP2021093219 | 2021-06-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2022255438A1 true WO2022255438A1 (en) | 2022-12-08 |
Family
ID=84324225
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2022/022433 WO2022255438A1 (en) | 2021-06-02 | 2022-06-02 | Electromagnetic wave shield film |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPWO2022255438A1 (en) |
CN (1) | CN117397379A (en) |
TW (1) | TW202315510A (en) |
WO (1) | WO2022255438A1 (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003033994A (en) * | 2001-07-24 | 2003-02-04 | Toyo Metallizing Co Ltd | Metallized film and metal foil |
JP2005056906A (en) * | 2003-08-05 | 2005-03-03 | Reiko Co Ltd | Electromagnetic wave shielding transfer film |
WO2011121801A1 (en) * | 2010-03-30 | 2011-10-06 | Jx日鉱日石金属株式会社 | Composite for electromagnetic shielding |
WO2016136247A1 (en) * | 2015-02-25 | 2016-09-01 | 東洋インキScホールディングス株式会社 | Electromagnetic wave shielding sheet, electromagnetic wave shielding wiring circuit board, and electronic device |
JP2020024977A (en) * | 2018-08-06 | 2020-02-13 | 信越ポリマー株式会社 | Electromagnetic wave shielding film, manufacturing method thereof, printed wiring board with electromagnetic wave shielding film, and manufacturing method thereof |
-
2022
- 2022-06-02 JP JP2023525905A patent/JPWO2022255438A1/ja active Pending
- 2022-06-02 TW TW111120561A patent/TW202315510A/en unknown
- 2022-06-02 CN CN202280038757.2A patent/CN117397379A/en active Pending
- 2022-06-02 WO PCT/JP2022/022433 patent/WO2022255438A1/en active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003033994A (en) * | 2001-07-24 | 2003-02-04 | Toyo Metallizing Co Ltd | Metallized film and metal foil |
JP2005056906A (en) * | 2003-08-05 | 2005-03-03 | Reiko Co Ltd | Electromagnetic wave shielding transfer film |
WO2011121801A1 (en) * | 2010-03-30 | 2011-10-06 | Jx日鉱日石金属株式会社 | Composite for electromagnetic shielding |
WO2016136247A1 (en) * | 2015-02-25 | 2016-09-01 | 東洋インキScホールディングス株式会社 | Electromagnetic wave shielding sheet, electromagnetic wave shielding wiring circuit board, and electronic device |
JP2020024977A (en) * | 2018-08-06 | 2020-02-13 | 信越ポリマー株式会社 | Electromagnetic wave shielding film, manufacturing method thereof, printed wiring board with electromagnetic wave shielding film, and manufacturing method thereof |
Also Published As
Publication number | Publication date |
---|---|
JPWO2022255438A1 (en) | 2022-12-08 |
TW202315510A (en) | 2023-04-01 |
CN117397379A (en) | 2024-01-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US11317548B2 (en) | Electromagnetic wave shield film, printed wiring board using same, and rolled copper foil | |
TWI700984B (en) | Shielding film for printed wiring board and printed wiring board | |
US20160076829A1 (en) | Heat dissipating sheet | |
CN104219873B (en) | Shape-retaining film and shape-retaining flexible circuit board provided with same | |
JP2019065069A (en) | Conductive adhesive sheet | |
WO2018186156A1 (en) | Graphite composite film and method for producing same | |
WO2022255438A1 (en) | Electromagnetic wave shield film | |
KR102669973B1 (en) | electromagnetic wave shielding film | |
JP7256869B2 (en) | electromagnetic wave shielding film | |
JP7506150B2 (en) | Electromagnetic wave shielding film | |
TWI842957B (en) | Electromagnetic wave shielding film | |
KR102724516B1 (en) | Electromagnetic shielding film | |
WO2021131244A1 (en) | Electromagnetic wave shielding film | |
JP2022021641A (en) | Electromagnetic wave shield film and electromagnetic wave shield film-attached printed wiring board | |
WO2018142876A1 (en) | Graphite composite film and manufacturing method therefor | |
JP7566151B2 (en) | Electromagnetic wave shielding film |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 22816183 Country of ref document: EP Kind code of ref document: A1 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2023525905 Country of ref document: JP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 202280038757.2 Country of ref document: CN |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 22816183 Country of ref document: EP Kind code of ref document: A1 |