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WO2021106119A1 - Component management device and component management method - Google Patents

Component management device and component management method Download PDF

Info

Publication number
WO2021106119A1
WO2021106119A1 PCT/JP2019/046460 JP2019046460W WO2021106119A1 WO 2021106119 A1 WO2021106119 A1 WO 2021106119A1 JP 2019046460 W JP2019046460 W JP 2019046460W WO 2021106119 A1 WO2021106119 A1 WO 2021106119A1
Authority
WO
WIPO (PCT)
Prior art keywords
component
wafer
parts
cavity
carrier tape
Prior art date
Application number
PCT/JP2019/046460
Other languages
French (fr)
Japanese (ja)
Inventor
清水 浩二
Original Assignee
株式会社Fuji
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社Fuji filed Critical 株式会社Fuji
Priority to CN201980102452.1A priority Critical patent/CN114731778B/en
Priority to JP2021560833A priority patent/JP7359863B2/en
Priority to PCT/JP2019/046460 priority patent/WO2021106119A1/en
Priority to KR1020227013774A priority patent/KR102598549B1/en
Publication of WO2021106119A1 publication Critical patent/WO2021106119A1/en

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Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/086Supply management, e.g. supply of components or of substrates
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/02Feeding of components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/02Feeding of components
    • H05K13/021Loading or unloading of containers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04Mounting of components, e.g. of leadless components
    • H05K13/0417Feeding with belts or tapes
    • H05K13/0419Feeding with belts or tapes tape feeders

Definitions

  • This specification discloses the technology related to the parts management device and the parts management method.
  • the information management device described in Patent Document 1 includes a collection source information acquisition means, a mounting destination information acquisition means, and a storage means.
  • the collection source information acquisition means acquires collection source information including identification information for identifying the wafer and collection position information regarding the collection position of parts on the wafer.
  • the mounting destination information acquisition means acquires mounting destination information including identification information for identifying the base material and mounting position information regarding the mounting position of the component on the base material.
  • the storage means stores the mounting record information in which the collection source information of the mounted mounting component and the mounting destination information of the mounting component are associated with each other.
  • the electronic component transporting device described in Patent Document 2 includes a transport table that forms a transport path, an accommodating body holding means that holds an accommodating body of electronic components, an observation means that observes electronic components in the transport path, and a transport table. It is equipped with a plurality of carrier tape traveling devices arranged around the.
  • the housing holding means is a wafer ring holding unit that holds a wafer ring in which electronic components are arranged in an array, or a tray holding unit that holds a tray in which electronic components are arranged in an array by partitioning a plane in a grid pattern. Is.
  • the electronic component transfer device described in Patent Document 2 classifies each electronic component of the wafer ring into a non-defective product or a non-good product.
  • the carrier tape traveling device for non-defective products the electronic components are stored in the pockets of the carrier tape and sealed with the sealing tape while the carrier tape is traveled in the transport direction of the reel. The reel winds up a carrier tape sealed with sealing tape.
  • the non-defective electronic components are re-inspected.
  • the worker checks the data obtained by the observation device and re-determines the electronic components classified as non-defective products as non-defective products and non-defective products.
  • the method of supplying parts includes a wafer supply in which parts are supplied from a wafer as in the invention described in Patent Document 1 and a reel supply in which parts are supplied from a reel. It is also known that, as in the invention described in Patent Document 2, the parts arranged on the wafer are transferred to a reel to supply the reel. Conventionally, in reel supply, parts to be supplied in reel units are managed, which is not sufficient as traceability information. Specifically, it is necessary to trace all the parts supplied from the reel accommodating the parts to be traced, and the tracing work is complicated.
  • this specification discloses a parts management device and a parts management method capable of improving traceability for reel-supplied parts in which parts are sequentially supplied from a carrier tape.
  • a parts management device including an acquisition unit and a storage unit.
  • the acquisition unit acquires position information of the cavity in which the component is housed when the component is sequentially supplied from a carrier tape having a plurality of cavities containing the component to be mounted on the substrate.
  • the storage unit stores the position information of the cavity acquired by the acquisition unit and the identification information for identifying the reel around which the carrier tape is wound in the storage device in association with each other.
  • this specification discloses a parts management method including an acquisition process and a storage process.
  • the acquisition step when the parts are sequentially supplied from a carrier tape having a plurality of cavities containing the parts to be mounted on the substrate, the position information of the cavities containing the parts is acquired.
  • the storage step the position information of the cavity acquired by the acquisition step and the identification information for identifying the reel on which the carrier tape is wound are stored in the storage device in association with each other.
  • the parts management device has an acquisition unit and a storage unit.
  • the parts management device can store the position information of the cavity in which the supplied parts are housed in the storage device in association with the identification information for identifying the reel. Therefore, the user of the parts management device can easily narrow down the parts to be traced based on the position information of the cavity from the parts supplied from the carrier tape of the reel, and the traceability is improved.
  • the above-mentioned matters regarding the parts management device can be applied to the parts management method as well.
  • the component mounting machine 10 includes a board transfer device 11, a component supply device 12, a component transfer device 13, a component camera 14, a board camera 15, and a control device 16.
  • the substrate transfer device 11 is composed of a belt conveyor or the like, and conveys the substrate 90 in the transfer direction (X-axis direction).
  • the substrate 90 is a circuit board and forms at least one of an electronic circuit and an electric circuit.
  • the board transfer device 11 carries the board 90 into the machine of the component mounting machine 10 and positions the board 90 at a predetermined position in the machine.
  • the board transfer device 11 carries out the board 90 to the outside of the component mounting machine 10 after the mounting process of the component 91 by the component mounting machine 10 is completed.
  • the component supply device 12 sequentially supplies the components 91 to be mounted on the substrate 90.
  • the component supply device 12 includes a plurality of feeders 121 provided along the transport direction (X-axis direction) of the substrate 90.
  • Each of the plurality of feeders 121 includes a reel RL0, and a carrier tape 80 is wound around the reel RL0.
  • the feeder 121 pitch-feeds the carrier tape 80 containing the plurality of parts 91, and supplies the parts 91 so that the parts 91 can be collected at the collection position PP1 provided on the tip end side of the feeder 121.
  • the parts transfer device 13 includes a head drive device 131 and a moving table 132.
  • the head driving device 131 is configured so that the moving table 132 can be moved in the X-axis direction and the Y-axis direction by a linear motion mechanism.
  • a mounting head 20 is detachably (replaceably) provided on the moving table 132 by a clamp member.
  • the mounting head 20 uses at least one holding member 30 to collect and hold the component 91 supplied by the component supply device 12, and mounts the component 91 on the substrate 90 positioned by the substrate transfer device 11.
  • the holding member 30 for example, a suction nozzle, a chuck, or the like can be used.
  • a known imaging device can be used for the component camera 14 and the substrate camera 15.
  • the component camera 14 is fixed to the base of the component mounting machine 10 so that the optical axis faces upward (vertically upward) in the Z-axis direction.
  • the component camera 14 can take an image of the component 91 held by the holding member 30 from below.
  • the board camera 15 is provided on the moving table 132 of the component transfer device 13 so that the optical axis faces downward (vertically downward) in the Z-axis direction.
  • the substrate camera 15 can image the substrate 90 from above.
  • the board camera 15 can also take an image of the component 91 from above at the sampling position PP1 of the component 91.
  • the component camera 14 and the substrate camera 15 perform imaging based on a control signal transmitted from the control device 16.
  • the image data captured by the component camera 14 and the substrate camera 15 is transmitted to the control device 16.
  • the control device 16 includes a known arithmetic unit and a storage device DS0, and constitutes a control circuit. Information, image data, and the like output from various sensors provided in the component mounting machine 10 are input to the control device 16. The control device 16 sends a control signal to each device based on a control program, a predetermined mounting condition set in advance, and the like.
  • control device 16 causes the board camera 15 to image the board 90 positioned by the board transfer device 11.
  • the control device 16 processes the image captured by the substrate camera 15 to recognize the positioning state of the substrate 90.
  • control device 16 causes the holding member 30 to collect and hold the component 91 supplied by the component supply device 12, and causes the component camera 14 to image the component 91 held by the holding member 30.
  • the control device 16 processes the image captured by the component camera 14 to recognize the suitability of the component 91 and the holding posture of the component 91.
  • the control device 16 moves the holding member 30 toward the upper side of the planned mounting position set in advance by a control program or the like. Further, the control device 16 corrects the planned mounting position based on the positioning state of the board 90, the holding posture of the component 91, and the like, and sets the mounting position where the component 91 is actually mounted.
  • the planned mounting position and the mounting position include the rotation angle in addition to the position (X coordinate and Y coordinate).
  • the control device 16 corrects the target position (X coordinate and Y coordinate) and rotation angle of the holding member 30 according to the mounting position.
  • the control device 16 lowers the holding member 30 at the corrected rotation angle at the corrected target position, and mounts the component 91 on the substrate 90.
  • the control device 16 executes a mounting process for mounting the plurality of components 91 on the substrate 90.
  • the parts management device 40 of the present embodiment is provided in the control device 16 of the parts mounting machine 10.
  • the parts management device 40 can be formed, for example, on a line management device that manages a board production line including a plurality of component mounting machines 10, a host computer that manages a plurality of board production lines, a cloud, or the like.
  • the parts management device 40 includes an acquisition unit 41 and a storage unit 42 when regarded as a control block.
  • the parts management device 40 may further include a discriminating unit 43.
  • the parts management device 40 of the present embodiment includes an acquisition unit 41, a storage unit 42, and a discrimination unit 43.
  • the parts management device 40 executes the control program according to the flowchart shown in FIG.
  • the acquisition unit 41 performs the process shown in step S11.
  • the storage unit 42 performs the processes shown in steps S12 and S13.
  • the determination unit 43 performs the determination and processing shown in steps S14 to S16.
  • Acquisition unit 41 When the parts 91 are sequentially supplied from the carrier tape 80 having a plurality of cavities 81 containing the parts 91 to be mounted on the substrate 90, the acquisition unit 41 obtains the position information of the cavities 81 containing the parts 91. Acquire (step S11 shown in FIG. 3).
  • the carrier tape 80 includes a plurality of cavities 81, a plurality of feed holes 82, and a cover tape 83.
  • Each of the plurality of cavities 81 houses a component 91.
  • the plurality of feed holes 82 are formed at predetermined intervals in the transport direction of the carrier tape 80 (longitudinal direction of the carrier tape 80).
  • a cover tape 83 is adhered to the upper surface of the carrier tape 80, and the openings of the plurality of cavities 81 are closed.
  • the cover tape 83 of the carrier tape 80 transported to the collection position PP1 shown in FIGS. 1 and 4 is peeled off so that the holding member 30 can collect the component 91.
  • the feeder 121 peels off the cover tape 83 while conveying the carrier tape 80, and positions the plurality of cavities 81 in order at the collection position PP1.
  • the component 91 housed in the cavity 81 positioned at the sampling position PP1 can be sampled by the holding member 30, and the component 91 can be supplied.
  • the plurality of cavities 81 are formed at predetermined intervals in the transport direction of the carrier tape 80.
  • the interval T1 of the cavities 81 is appropriately set according to the dimensions of the component 91 to be accommodated and the like. As shown in FIG. 4, in the present embodiment, the interval T1 of the cavity 81 is set to an integral multiple (twice in the figure) of the interval T2 of the feed hole 82.
  • the feeder 121 feeds the carrier tape 80 by a predetermined amount (twice the interval T2 of the feed holes 82 in the figure) and pitch feeds, the cavity 81 is positioned at the sampling position PP1 and one component 91 is supplied. The number of remaining parts 91 remaining on the carrier tape 80 is reduced by one.
  • the acquisition unit 41 can acquire the position information of the cavity 81 in the carrier tape 80 based on the number of the parts 91 supplied from the carrier tape 80.
  • the number of parts 91 to be supplied can be obtained from the feed amount of the feeder 121 pitch-feeding the carrier tape 80.
  • the acquisition unit 41 moves the position of the leading (first) cavity 81 of the carrier tape 80. Acquire the position information indicating.
  • the acquisition unit 41 acquires the position information indicating the position of the second cavity 81 from the beginning of the carrier tape 80. The same can be said for the position information indicating the positions of the cavities 81 after the third from the beginning of the carrier tape 80.
  • the operator when the operator attaches the reel RL0 on which the carrier tape 80 is wound to the feeder 121, the operator reads the identification code attached to the reel RL0 using a reading device. Further, when the feeder 121 is installed in the slot of the component supply device 12, the operator reads the identification code attached to the feeder 121 by using the reading device.
  • the feeder 121 When the feeder 121 is installed in the slot, electric power is supplied from the component mounting machine 10 via the connector, and the feeder 121 is in a state of being able to communicate with the component mounting machine 10.
  • the slot of the component supply device 12 the identification information of the feeder 121 installed in the slot, and the identification information of the reel RL0 attached to the feeder 121 are associated with each other, and the storage device DS0 of the control device 16 is associated with the slot. Is remembered in. Further, the storage device DS0 records the initial number of components 91 in the carrier tape 80 and the number of remaining components 91 remaining in the carrier tape 80.
  • the acquisition unit 41 acquires the position information indicating the position of the second cavity 81 from the beginning of the carrier tape 80.
  • the acquisition unit 41 acquires the position information indicating the position of the cavity 81 (NI0-NR0 + 1) th from the beginning of the carrier tape 80.
  • the storage unit 42 stores the position information of the cavity 81 acquired by the acquisition unit 41 and the identification information for identifying the reel RL0 around which the carrier tape 80 is wound in the storage device DS0 in association with each other (shown in FIG. 3). Step S12).
  • the slot of the component supply device 12, the identification information of the feeder 121 installed in the slot, and the identification information of the reel RL0 attached to the feeder 121 are associated with each other to form the control device 16. It is stored in the storage device DS0. Therefore, the storage unit 42 can store the position information of the cavity 81 acquired by the acquisition unit 41 and the identification information for identifying the reel RL0 around which the carrier tape 80 is wound in the storage device DS0 in association with each other. ..
  • the storage unit 42 can store at least one of the board information, the device information, the holding information, and the mounting information in the storage device DS0 in association with the position information of the cavity 81 and the identification information of the reel RL0.
  • the board information refers to information about the board 90 on which the component 91 is mounted.
  • the board information includes identification information for identifying the board 90, the type of the board 90, information for specifying the mounting position where the component 91 is mounted (for example, a circuit symbol), and the like.
  • the types of the substrate 90 include, for example, a multi-chamfered substrate in which a plurality of substrates 90 are divisible, a single-sided mounting substrate in which the component 91 is mounted on only one of the front surface and the back surface of the substrate 90, and a substrate.
  • a double-sided mounting board on which the component 91 is mounted on both sides (front surface and back surface) of the 90 is included.
  • the device information refers to the information related to the device DD0 used for mounting the component 91.
  • the device DD0 includes a device that is detachably provided on the component mounting machine 10 such as the mounting head 20, the holding member 30, and the feeder 121. Further, in a substrate production line including a plurality of component mounting machines 10, it is necessary to identify the component mounting machines 10.
  • the device DD0 includes, for example, the component mounting machine 10.
  • the device information includes identification information for identifying the device DD0, usage conditions of the device DD0, and the like.
  • the holding information refers to information regarding the holding state of the part 91 when the part 91 is collected and held by the holding member 30.
  • the holding information includes the amount of deviation of the component 91 collected and held by the holding member 30 with respect to the regular holding position, the rotation angle with respect to the regular holding posture, the determination result of the holding state, the location of the image data, and the like. ..
  • the determination result of the holding state is determined by whether or not the deviation amount and the rotation angle of the component 91 collected and held by the holding member 30 are included in the allowable range.
  • the holding information can be obtained by performing image processing on the image captured by the component camera 14, for example.
  • the mounting information refers to information regarding the mounting state of the component 91 when the component 91 is mounted on the substrate 90 by the holding member 30.
  • the mounting information includes the amount of deviation of the component 91 mounted on the substrate 90 with respect to the regular mounting position, the rotation angle with respect to the regular mounting state, the determination result of the mounting state, the location of the image data, and the like.
  • the determination result of the mounting state is determined by whether or not the deviation amount and the rotation angle of the component 91 mounted on the substrate 90 are included in the allowable range.
  • the mounting information can be obtained, for example, by a visual inspection machine that inspects the component 91 mounted on the substrate 90.
  • FIG. 5 schematically shows an example of information stored in the storage device DS0.
  • the position information of the cavity 81 of the carrier tape 80 wound around the reel RL0 of the identification information DID1 is indicated by "1", "2", and "3" from the beginning of the carrier tape 80.
  • the component 91 housed in the cavity 81 at the top (first) of the carrier tape 80 is mounted at the mounting position indicated by the circuit symbol R1 on the substrate 90 of the identification information BID1. Further, the component 91 is collected (suctioned) by the holding member 30 (suction nozzle) identified by the nozzle number NZ1 and held and mounted on the substrate 90. Further, the determination results of the holding state and the mounting state of the component 91 are both good (OK).
  • the component 91 housed in the second and subsequent cavities 81 of the carrier tape 80 can be said for the component 91 housed in the carrier tape 80 wound around the reel RL0 of the identification information DID2.
  • the component 91 mounted at the mounting position indicated by the circuit symbol R10 on the board 90 of the identification information BID1 has a defective (NG) determination result in both the holding state and the mounting state.
  • the operator traces all the components 91 housed in the reel RL0 of the identification information DID1. It is necessary and the tracing work is complicated.
  • the user of the parts management device 40 uses the carrier tape 80 in which the parts 91 whose determination result is defective are wound around the reel RL0 of the identification information DID1 based on the information shown in FIG. It can be known that it was housed in the second cavity 81 from the beginning.
  • the user of the parts management device 40 can easily narrow down the parts 91 to be traced based on the position information of the cavity 81 from the parts 91 supplied from the reel RL0 of the identification information DID1, and the traceability is improved. To do. Further, for example, it is assumed that the component 91 whose determination result is poor is often housed in the cavity 81 on the tail side of the carrier tape 80. The component 91 housed in the cavity 81 on the tail side of the carrier tape 80 has a longer elapsed time from the start of use of the carrier tape 80.
  • the cause of the defect of the component 91 is, for example, the defect of the storage state of the carrier tape 80.
  • the component 91 housed in the cavity 81 on the tail side of the carrier tape 80 is more susceptible to the pressure of the carrier tape 80 when the carrier tape 80 is wound. Therefore, it can be estimated that the cause of the defect of the component 91 is, for example, the defect of the wound state of the carrier tape 80.
  • the method of supplying the component 91 includes a wafer supply in which the component 91 is supplied from the wafer WF0 and a reel supply in which the component 91 is supplied from the reel RL0.
  • the wafer WF0 has a part (island) that is partially defective in the manufacturing process, and a part that does not satisfy a predetermined quality is managed as a defective die (Bad Die) on a map. Defective dies are detected in advance by optical inspection or the like, but dies that are not determined to be defective dies may later be found to be defective dies.
  • the dies may be concentrated in a specific region of the wafer WF0.
  • the manufacturer modifies the determination condition for determining the quality of the die so that the die can be detected to reduce the omission of detection of the defective die.
  • the parts supply device corresponding to wafer supply is generally more expensive than the parts supply device 12 corresponding to reel supply, the types and number of parts 91 that can be supplied are small, and the replenishment work of the parts 91 is complicated. It is easy to become. Therefore, it is known that the parts 91 arranged on the wafer WF0 are transferred to the reel RL0 to supply the reels.
  • the carrier tape 80 of the present embodiment accommodates the wafer component 91W, which is the component 91 arranged on the wafer WF0.
  • the XW axis and the YW axis shown in FIG. 6 show an example of orthogonal coordinate axes in the wafer WF0.
  • the wafer parts 91W are arranged, for example, by a predetermined number of minutes in the XW axis direction from a predetermined region (arrangement order is 1) on the origin side of the orthogonal coordinate axes.
  • the wafer parts 91W are arranged in the XW axis direction for a predetermined number of minutes from the region in which the coordinates of the YW axis are increased by one from the predetermined region.
  • the parts 91 (wafer parts 91W) arranged on the wafer WF0 can be specified by the above-mentioned arrangement order.
  • the wafer-related information shown in FIG. 7 includes identification information of the wafer WF0, array information (arrangement order) of the wafer component 91W, array information (coordinate information) of the wafer component 91W, and wafer component information.
  • the wafer component 91W arranged in the predetermined region (arrangement order is 1)
  • the coordinates in the XW axis direction are indicated by the coordinates XW1
  • the coordinates in the YW axis direction are indicated by the coordinates YW1.
  • the wafer component 91W is, for example, a wafer component 91W whose quality is not specified.
  • the wafer component 91W is, for example, a reference member RM0 indicating a reference position of the wafer WF0.
  • the reference member RM0 is provided at a predetermined position on the wafer WF0, and indicates a reference position when the wafer component 91W is taken from the wafer WF0.
  • the reference member RM0 is usually not housed in the carrier tape 80 in order to prevent erroneous mounting.
  • the coordinates in the XW axis direction are indicated by the coordinates XW3, and the coordinates in the YW axis direction are the coordinates YW1. It is indicated by.
  • the wafer component 91W is, for example, a defective wafer component 91W (defective component BM0).
  • the defective component BM0 is a component found in the manufacturing process of the wafer component 91W, and is usually not accommodated in the carrier tape 80 in order to prevent erroneous mounting.
  • the coordinates in the XW axis direction are indicated by the coordinates XWA1
  • the coordinates in the YW axis direction are indicated by the coordinates YWA1.
  • the wafer component 91W is, for example, a wafer component 91WA having a quality of A rank.
  • the coordinates in the XW axis direction are indicated by the coordinates XWA2
  • the coordinates in the YW axis direction are indicated by the coordinates YWA2.
  • the wafer component 91W is, for example, a wafer component 91WB having a quality of B rank.
  • the coordinates in the XW axis direction are indicated by the coordinates XWA3, and the coordinates in the YW axis direction are indicated by the coordinates YWA3.
  • the wafer component 91W is, for example, a wafer component 91WC having a quality of C rank. In this specification, for example, it is assumed that the quality of the wafer component 91W deteriorates in the order of the A-rank wafer component 91WA, the B-rank wafer component 91WB, and the C-rank wafer component 91WC. Further, the method of setting the quality of the wafer component 91W is not limited.
  • the wafer WF0 includes various wafer parts 91W. Therefore, in the supply of the component 91 using the carrier tape 80 accommodating the wafer component 91W, there is a request to know the arrangement information of the wafer component 91W in the wafer WF0.
  • the storage unit 42 stores the arrangement information of the wafer component 91W in the wafer WF0 and the position information of the cavity 81 in which the wafer component 91W is housed in the carrier tape 80 in advance in association with each other before supplying the component 91. It is good to store it in the device DS0.
  • the storage unit 42 accommodates the arrangement information of the wafer parts 91W whose arrangement order is arranged in the region of the order AJ1, the position information of the cavity 81 in which the wafer parts 91W are housed, and the wafer parts 91W.
  • the identification information of the reel RL0 of the carrier tape 80 is stored in the storage device DS0 in association with the identification information.
  • the user of the component management device 40 finds that the supplied component 91 is a wafer component 91W, and the wafer component 91W is located in the area of the XW axis coordinate XWA1 and the YW axis coordinate YWA1 on the wafer WF0. It can be known that it was arranged. Further, the user of the parts management device 40 can know that the arrangement order of the wafer parts 91W is the order AJ1 and the quality is the wafer parts 91WA of rank A.
  • the storage unit 42 identifies the position information of the cavity 81 containing the wafer component 91W and the reel RL0 of the carrier tape 80 containing the wafer component 91W.
  • the information can be further associated and stored in the storage device DS0.
  • the wafer parts 91W are arranged in a predetermined order on the wafer WF0, and are housed in the carrier tape 80 in the arrangement order on the wafer WF0. Therefore, it is sufficient for the storage unit 42 to store the predetermined wafer component 91W housed in the carrier tape 80 in the storage device DS0. Further, the wafer component 91W may be accommodated in a plurality of carrier tapes 80 in the arrangement order in the wafer WF0.
  • the storage unit 42 provides the identification information for identifying the wafer WF0, the identification information for identifying the plurality of reels RL0 around which the carrier tape 80 is wound, and the predetermined arrangement information before supplying the component 91. It can be associated in advance and stored in the storage device DS0.
  • the predetermined arrangement information refers to the arrangement information including the arrangement order in the wafer WF0 of the predetermined wafer component 91W housed in each carrier tape 80.
  • the wafer parts 91W arranged on the wafer WF0 of the identification information WID1 are housed in, for example, the carrier tape 80 of a plurality of (five) reels RL0. Therefore, the identification information WID1 of the wafer WF0 and the identification information DID1 to the identification information DID5 of the plurality of (five) reels RL0 are associated and stored in the storage device DS0. Further, for example, in the reel RL0 of the identification information DID1, the arrangement order of the wafer parts 91W housed in the cavity 81 at the head (first) of the carrier tape 80 is 1, and the wafer parts 91W are in the XW axis direction. The coordinates are indicated by the coordinates XW1, and the coordinates in the YW axis direction are indicated by the coordinates YW1.
  • the arrangement order of the wafer parts 91W housed in the cavity 81 at the head (first) of the carrier tape 80 is the order BJ1
  • the coordinates of the wafer parts 91W in the XW axis direction are the coordinates. It is indicated by XWB1
  • the coordinates in the YW axis direction are indicated by the coordinates YWB1.
  • the arrangement order of the wafer parts 91W housed in the cavity 81 at the head (first) of the carrier tape 80 is the order CJ1
  • the coordinates of the wafer parts 91W in the XW axis direction are the coordinates. It is indicated by XWC1
  • the coordinates in the YW axis direction are indicated by the coordinates YWC1.
  • the carrier tape 80 of the reel RL0 of the identification information DID2 accommodates (CJ1-BJ1) wafer parts 91W. The same can be said for the reels RL0 of the identification information DID3 to the identification information DID5.
  • the storage unit 42 separately stores the number of wafer parts 91W accommodated in the reel RL0 in the storage device DS0. Further, the storage unit 42 can store the arrangement information of the wafer component 91W housed in the arbitrary cavity 81 of each carrier tape 80. Further, the storage unit 42 can also store the arrangement information including the arrangement order of the cumulative wafer parts 91W up to the immediately preceding carrier tape 80. In this case, the reel RL0 of the identification information DID1 which is the first reel RL0 has zero arrangement order of the cumulative wafer parts 91W and does not include the arrangement information.
  • a defective wafer component 91W (defective component BM0) included in the wafer WF0, a wafer component 91W having a quality of a predetermined rank or less, and a reference member RM0 indicating a reference position of the wafer WF0 is specified.
  • the defective wafer component 91W (defective component BM0) and the reference member RM0 indicating the reference position of the wafer WF0 are usually not accommodated in the carrier tape 80 in order to prevent erroneous mounting.
  • the wafer component 91W having a quality of a predetermined rank or lower (in this case, the wafer component 91WC of the C rank) is erroneously mounted.
  • the carrier tape 80 may not be accommodated.
  • the carrier tape 80 in which the wafer component 91W following the specific member SM0 in the arrangement order of the wafer WF0 is carried up and accommodated in the specific cavity 81S, which is the cavity 81 in which the specific member SM0 is scheduled to be housed included.
  • the third cavity 81 shown in FIG. 9 is the specific cavity 81S.
  • the wafer component 91W to be accommodated in the No. 4 cavity 81 is accommodated in the No. 3 specific cavity 81S.
  • the wafer component 91W to be housed in the cavity 81 of No. 5 is housed in the cavity 81 of No. 4.
  • the wafer component 91W following the specific member SM0 in the arrangement order of the wafer WF0 is moved up and accommodated in the cavity 81.
  • the storage unit 42 may store the specific cavity information including the position and the number of the specific cavities 81S in the storage device DS0 in advance before supplying the component 91.
  • the component management device 40 can match the arrangement information of the wafer component 91W on the wafer WF0 with the position information of the cavity 81 in which the wafer component 91W is housed on the carrier tape 80.
  • the position of the specific cavity 81S is the third cavity 81, and the number of the specific cavities 81S is one.
  • the carrier tape 80 includes a carrier tape 80 in which the specific cavity 81S scheduled to accommodate the specific member SM0 is set in the empty cavity 81E.
  • the third cavity 81 shown in FIG. 9 is the specific cavity 81S.
  • the third specific cavity 81S is set to the empty cavity 81E.
  • the empty cavity 81E is an unaccommodated cavity 81 that does not accommodate the wafer component 91W and the specific member SM0.
  • the wafer component 91W to be accommodated in the No. 4 cavity 81 is accommodated in the No. 4 cavity 81.
  • the same applies and the above-mentioned wafer component 91W is not carried forward and accommodated.
  • the storage unit 42 may store the empty cavity information including the position and the number of the empty cavities 81E in the storage device DS0 in advance before supplying the component 91.
  • the component supply device 12 can pitch-feed the carrier tape 80 to the cavity 81 in which the wafer component 91W is housed, and can supply the wafer component 91W.
  • the position of the empty cavity 81E is the third cavity 81, and the number of empty cavities 81E is one.
  • the carrier tape 80 may not be conveyed even if the carrier tape 80 is pitch-fed due to improper installation of the reel RL0. Further, when a mistake in collecting the part 91 occurs, the operator may rewind the carrier tape 80. In these cases, the arrangement information of the wafer component 91W on the wafer WF0 and the position information of the cavity 81 in which the wafer component 91W is housed on the carrier tape 80 do not match.
  • the carrier tape 80 includes a carrier tape 80 in which a predetermined cavity 81 for accommodating the wafer component 91W is set in the empty cavity 81E.
  • the empty cavity 81E may be set at a predetermined cycle (for example, for each supply of a predetermined number of parts 91).
  • the storage unit 42 may store the empty cavity information including the position and the number of the empty cavities 81E in the storage device DS0 in advance before supplying the component 91.
  • the component management device 40 can periodically check whether or not the arrangement information of the wafer component 91W and the position information of the cavity 81 in which the wafer component 91W is housed in the carrier tape 80 are consistent. it can. Also in this case, the component supply device 12 can pitch-feed the carrier tape 80 to the cavity 81 in which the wafer component 91W is housed, and can supply the wafer component 91W.
  • Discriminating unit 43 The determination unit 43 pitch-feeds the carrier tape 80 and supplies the components 91 in order.
  • the discriminating unit 43 causes the substrate camera 15 to image the cavity 81 while the component supply device 12 is supplying the component 91, and the cavity 81 is an empty cavity based on the image captured by the substrate camera 15. It can be determined whether or not it is 81E. Specifically, the discriminating unit 43 determines that the cavity 81 to accommodate the component 91 is an empty cavity 81E when the component 91 is not imaged in the above image.
  • the discrimination unit 43 continues the supply of the component 91 by the component supply device 12 when the empty cavity information matches, and stops the supply of the component 91 by the component supply device 12 when the empty cavity information does not match. Specifically, the determination unit 43 determines whether or not the empty cavity information matches (step S14 shown in FIG. 3). When the empty cavity information matches (Yes in step S14), the discriminating unit 43 continues the supply of the component 91 by the component supply device 12 (step S15).
  • the discriminating unit 43 stops the supply of the component 91 by the component supply device 12 (step S16).
  • the component management device 40 warns the operator that the arrangement information of the wafer component 91W and the position information of the cavity 81 in which the wafer component 91W is housed in the carrier tape 80 do not match. As a result, the operator can confirm the misalignment of the carrier tape 80 and correct the misalignment of the carrier tape 80.
  • the component supply device 12 can also convey the carrier tape 80 so that the nearest empty cavity 81E reaches the sampling position PP1 when the determination unit 43 determines that the empty cavity information does not match.
  • the arrangement information of the wafer component 91W and the position information of the cavity 81 in which the wafer component 91W is housed in the carrier tape 80 are matched, and the misalignment of the carrier tape 80 is corrected.
  • the discriminating unit 43 causes the component camera 14 to image the holding member 30, and the cavity 81 is empty based on the image captured by the component camera 14. It is also possible to determine whether or not the cavity is 81E. Specifically, when the component 91 is not imaged in the above image (the holding member 30 does not hold the component 91), the discriminating unit 43 uses an empty cavity 81E for the cavity 81 to accommodate the component 91. It can be judged that there is.
  • the carrier tape 80 of the embodiment does not contain the specific member SM0.
  • the component supply device 12 can also supply the wafer component 91W from the carrier tape 80 in which the specific member SM0 is housed. In this case, when the cavity 81 containing the specific member SM0 is detected, the component supply device 12 pitch-feeds the carrier tape 80 to the cavity 81 containing the wafer component 91W, and the wafer component 91W. Can be supplied.
  • the wafer component 91W can also be applied to the component 91 produced in the same production lot. Specifically, it is assumed that the parts 91 produced in the same production lot are housed in a plurality of carrier tapes 80 in the production order.
  • the storage unit 42 provides the identification information for identifying the production lot, the identification information for identifying the plurality of reels RL0 around which the carrier tape 80 is wound, and the predetermined production information before supplying the component 91. It is preferable to store the information in the storage device DS0 in advance.
  • the predetermined production information includes the production order of the predetermined parts 91 housed in each carrier tape 80.
  • the predetermined component 91 can be, for example, a component 91 housed in the head (first) cavity 81 of each carrier tape 80.
  • a predetermined cavity 81 for accommodating the component 91 may be set in the empty cavity 81E.
  • the storage unit 42 can store the empty cavity information including the position and the number of the empty cavities 81E in the storage device DS0 in advance before supplying the component 91.
  • the determination unit 43 determines whether or not the empty cavity information detected when the component supply device 12 supplies the component 91 and the empty cavity information stored in the storage device DS0 match. You can also do it. Further, the discriminating unit 43 continues the supply of the component 91 by the component supply device 12 when the empty cavity information matches, and stops the supply of the component 91 by the component supply device 12 when the empty cavity information does not match. You can also do it.
  • the parts management method includes an acquisition process and a storage process.
  • the acquisition process corresponds to the control performed by the acquisition unit 41.
  • the storage step corresponds to the control performed by the storage unit 42.
  • the parts management method can further include a discrimination step.
  • the discrimination step corresponds to the control performed by the discrimination unit 43.
  • the acquisition unit 41 and the storage unit 42 are provided.
  • the component management device 40 can store the position information of the cavity 81 in which the supplied component 91 is housed in the storage device DS0 in association with the identification information that identifies the reel RL0. Therefore, the user of the parts management device 40 can easily narrow down the parts 91 to be traced based on the position information of the cavity 81 from the parts 91 supplied from the carrier tape 80 of the reel RL0, and the traceability is improved. To do. The same can be said for the parts management device 40 as described above for the parts management method.

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Operations Research (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

This component management device is provided with an acquiring unit and a storage unit. The acquiring unit, when components are successively supplied from a carrier tape having a plurality of cavities accommodating components to be mounted on a substrate, acquires position information pertaining to the cavities accommodating the components. The storage unit causes the cavity position information acquired by the acquiring unit and identifying information identifying a reel on which the carrier tape is wound to be associated with each other and stored in a storage device.

Description

部品管理装置および部品管理方法Parts management device and parts management method
 本明細書は、部品管理装置および部品管理方法に関する技術を開示する。 This specification discloses the technology related to the parts management device and the parts management method.
 特許文献1に記載の情報管理装置は、採取元情報取得手段と、実装先情報取得手段と、記憶手段とを備えている。採取元情報取得手段は、ウエハを識別するための識別情報と、ウエハにおける部品の採取位置に関する採取位置情報とを含む採取元情報を取得する。実装先情報取得手段は、基材を識別するための識別情報と、基材における部品の実装位置に関する実装位置情報とを含む実装先情報を取得する。記憶手段は、部品が基材に実装されるときに、実装された実装部品の採取元情報と、実装部品の実装先情報とを関連付けた実装実績情報を記憶する。 The information management device described in Patent Document 1 includes a collection source information acquisition means, a mounting destination information acquisition means, and a storage means. The collection source information acquisition means acquires collection source information including identification information for identifying the wafer and collection position information regarding the collection position of parts on the wafer. The mounting destination information acquisition means acquires mounting destination information including identification information for identifying the base material and mounting position information regarding the mounting position of the component on the base material. When the component is mounted on the base material, the storage means stores the mounting record information in which the collection source information of the mounted mounting component and the mounting destination information of the mounting component are associated with each other.
 特許文献2に記載の電子部品搬送装置は、搬送経路を形成する搬送テーブルと、電子部品の収容体を保持する収容体保持手段と、搬送経路内の電子部品を観察する観察手段と、搬送テーブルの周囲に配置される複数のキャリアテープ走行装置とを備えている。なお、収容体保持手段は、電子部品をアレイ状に並べたウエハリングを保持するウエハリング保持部、または、平面を格子状に仕切って電子部品をアレイ状に並べたトレイを保持するトレイ保持部である。 The electronic component transporting device described in Patent Document 2 includes a transport table that forms a transport path, an accommodating body holding means that holds an accommodating body of electronic components, an observation means that observes electronic components in the transport path, and a transport table. It is equipped with a plurality of carrier tape traveling devices arranged around the. The housing holding means is a wafer ring holding unit that holds a wafer ring in which electronic components are arranged in an array, or a tray holding unit that holds a tray in which electronic components are arranged in an array by partitioning a plane in a grid pattern. Is.
 また、特許文献2に記載の電子部品搬送装置は、ウエハリングの各電子部品を良品または良品以外に分類する。良品用のキャリアテープ走行装置は、キャリアテープをリールの搬送方向に走行させながら、キャリアテープのポケットに電子部品を収納し、シールテープで封止する。リールは、シールテープで封止されたキャリアテープを巻き取る。良品の電子部品のキャリアテープへの梱包が完了すると、良品以外と分類された電子部品は、再検査される。再検査では、観測装置で得られたデータを作業員がチェックして、良品以外と分類された電子部品を、良品と良品以外に再判定し直す。 Further, the electronic component transfer device described in Patent Document 2 classifies each electronic component of the wafer ring into a non-defective product or a non-good product. In the carrier tape traveling device for non-defective products, the electronic components are stored in the pockets of the carrier tape and sealed with the sealing tape while the carrier tape is traveled in the transport direction of the reel. The reel winds up a carrier tape sealed with sealing tape. Once the non-defective electronic components have been packed into the carrier tape, the non-defective electronic components are re-inspected. In the re-inspection, the worker checks the data obtained by the observation device and re-determines the electronic components classified as non-defective products as non-defective products and non-defective products.
特開2018-056306号公報Japanese Unexamined Patent Publication No. 2018-056306 特開2016-100394号公報Japanese Unexamined Patent Publication No. 2016-100394
 部品の供給方法には、特許文献1に記載の発明のようにウエハから部品を供給するウエハ供給と、リールから部品を供給するリール供給とが含まれる。また、特許文献2に記載の発明のように、ウエハに配列されていた部品をリールに移して、リール供給を行うことも知られている。従来、リール供給では、リール単位で供給する部品の管理が行われており、トレーサビリティ情報として十分ではなかった。具体的には、トレース対象の部品を収容するリールから供給されたすべての部品についてトレースする必要があり、トレース作業が煩雑であった。 The method of supplying parts includes a wafer supply in which parts are supplied from a wafer as in the invention described in Patent Document 1 and a reel supply in which parts are supplied from a reel. It is also known that, as in the invention described in Patent Document 2, the parts arranged on the wafer are transferred to a reel to supply the reel. Conventionally, in reel supply, parts to be supplied in reel units are managed, which is not sufficient as traceability information. Specifically, it is necessary to trace all the parts supplied from the reel accommodating the parts to be traced, and the tracing work is complicated.
 このような事情に鑑みて、本明細書は、キャリアテープから部品が順に供給されるリール供給部品について、トレーサビリティを向上可能な部品管理装置および部品管理方法を開示する。 In view of such circumstances, this specification discloses a parts management device and a parts management method capable of improving traceability for reel-supplied parts in which parts are sequentially supplied from a carrier tape.
 本明細書は、取得部と、記憶部とを備える部品管理装置を開示する。前記取得部は、基板に装着する部品を収容しているキャビティを複数備えるキャリアテープから前記部品が順に供給されるときに、当該部品が収容されている前記キャビティの位置情報を取得する。前記記憶部は、前記取得部によって取得された前記キャビティの位置情報、および、前記キャリアテープが巻回されているリールを識別する識別情報を関連付けて記憶装置に記憶させる。 This specification discloses a parts management device including an acquisition unit and a storage unit. The acquisition unit acquires position information of the cavity in which the component is housed when the component is sequentially supplied from a carrier tape having a plurality of cavities containing the component to be mounted on the substrate. The storage unit stores the position information of the cavity acquired by the acquisition unit and the identification information for identifying the reel around which the carrier tape is wound in the storage device in association with each other.
 また、本明細書は、取得工程と、記憶工程とを備える部品管理方法を開示する。前記取得工程は、基板に装着する部品を収容しているキャビティを複数備えるキャリアテープから前記部品が順に供給されるときに、当該部品が収容されている前記キャビティの位置情報を取得する。前記記憶工程は、前記取得工程によって取得された前記キャビティの位置情報、および、前記キャリアテープが巻回されているリールを識別する識別情報を関連付けて記憶装置に記憶させる。 Further, this specification discloses a parts management method including an acquisition process and a storage process. In the acquisition step, when the parts are sequentially supplied from a carrier tape having a plurality of cavities containing the parts to be mounted on the substrate, the position information of the cavities containing the parts is acquired. In the storage step, the position information of the cavity acquired by the acquisition step and the identification information for identifying the reel on which the carrier tape is wound are stored in the storage device in association with each other.
 上記の部品管理装置によれば、取得部と、記憶部とを備えている。これにより、部品管理装置は、供給された部品が収容されていたキャビティの位置情報と、リールを識別する識別情報とを関連付けて記憶装置に記憶させることができる。よって、部品管理装置の利用者は、リールのキャリアテープから供給した部品の中から、キャビティの位置情報に基づいてトレース対象の部品を絞り込むことが容易であり、トレーサビリティが向上する。部品管理装置について上述されていることは、部品管理方法についても同様に言える。 According to the above parts management device, it has an acquisition unit and a storage unit. As a result, the parts management device can store the position information of the cavity in which the supplied parts are housed in the storage device in association with the identification information for identifying the reel. Therefore, the user of the parts management device can easily narrow down the parts to be traced based on the position information of the cavity from the parts supplied from the carrier tape of the reel, and the traceability is improved. The above-mentioned matters regarding the parts management device can be applied to the parts management method as well.
部品装着機の構成例を示す平面図である。It is a top view which shows the structural example of the component mounting machine. 部品管理装置の制御ブロックの一例を示すブロック図である。It is a block diagram which shows an example of the control block of a component management apparatus. 部品管理装置の制御手順の一例を示すフローチャートである。It is a flowchart which shows an example of the control procedure of a parts management apparatus. キャリアテープの一例を示す平面図である。It is a top view which shows an example of a carrier tape. 記憶装置が記憶する情報の一例を示す模式図である。It is a schematic diagram which shows an example of the information which a storage device stores. ウエハの一例を示す平面図である。It is a top view which shows an example of a wafer. ウエハ関連情報の一例を示す模式図である。It is a schematic diagram which shows an example of the wafer-related information. 記憶装置が記憶する情報の他の一例を示す模式図である。It is a schematic diagram which shows another example of the information which a storage device stores. キャビティ、特定キャビティおよび空キャビティの一例を示すキャリアテープの平面図である。It is a top view of the carrier tape which shows an example of a cavity, a specific cavity and an empty cavity.
 1.実施形態
 1-1.部品装着機10の構成例
 図1に示すように、部品装着機10は、基板搬送装置11、部品供給装置12、部品移載装置13、部品カメラ14、基板カメラ15および制御装置16を備えている。基板搬送装置11は、ベルトコンベアなどにより構成され、基板90を搬送方向(X軸方向)に搬送する。基板90は、回路基板であり、電子回路および電気回路のうちの少なくとも一方を形成する。基板搬送装置11は、部品装着機10の機内に基板90を搬入するとともに、機内の所定位置に基板90を位置決めする。基板搬送装置11は、部品装着機10による部品91の装着処理が終了した後に、基板90を部品装着機10の機外に搬出する。
1. 1. Embodiment 1-1. Configuration Example of the Component Mounting Machine 10 As shown in FIG. 1, the component mounting machine 10 includes a board transfer device 11, a component supply device 12, a component transfer device 13, a component camera 14, a board camera 15, and a control device 16. There is. The substrate transfer device 11 is composed of a belt conveyor or the like, and conveys the substrate 90 in the transfer direction (X-axis direction). The substrate 90 is a circuit board and forms at least one of an electronic circuit and an electric circuit. The board transfer device 11 carries the board 90 into the machine of the component mounting machine 10 and positions the board 90 at a predetermined position in the machine. The board transfer device 11 carries out the board 90 to the outside of the component mounting machine 10 after the mounting process of the component 91 by the component mounting machine 10 is completed.
 部品供給装置12は、基板90に装着する部品91を順に供給する。具体的には、部品供給装置12は、基板90の搬送方向(X軸方向)に沿って設けられる複数のフィーダ121を備えている。複数のフィーダ121の各々は、リールRL0を備えており、リールRL0には、キャリアテープ80が巻回されている。フィーダ121は、複数の部品91が収容されているキャリアテープ80をピッチ送りさせて、フィーダ121の先端側に設けられる採取位置PP1において、部品91を採取可能に供給する。 The component supply device 12 sequentially supplies the components 91 to be mounted on the substrate 90. Specifically, the component supply device 12 includes a plurality of feeders 121 provided along the transport direction (X-axis direction) of the substrate 90. Each of the plurality of feeders 121 includes a reel RL0, and a carrier tape 80 is wound around the reel RL0. The feeder 121 pitch-feeds the carrier tape 80 containing the plurality of parts 91, and supplies the parts 91 so that the parts 91 can be collected at the collection position PP1 provided on the tip end side of the feeder 121.
 部品移載装置13は、ヘッド駆動装置131および移動台132を備えている。ヘッド駆動装置131は、直動機構により移動台132を、X軸方向およびY軸方向に移動可能に構成されている。移動台132には、クランプ部材により装着ヘッド20が着脱可能に(交換可能に)設けられている。装着ヘッド20は、少なくとも一つの保持部材30を用いて、部品供給装置12によって供給された部品91を採取し保持して、基板搬送装置11によって位置決めされた基板90に部品91を装着する。保持部材30は、例えば、吸着ノズル、チャックなどを用いることができる。 The parts transfer device 13 includes a head drive device 131 and a moving table 132. The head driving device 131 is configured so that the moving table 132 can be moved in the X-axis direction and the Y-axis direction by a linear motion mechanism. A mounting head 20 is detachably (replaceably) provided on the moving table 132 by a clamp member. The mounting head 20 uses at least one holding member 30 to collect and hold the component 91 supplied by the component supply device 12, and mounts the component 91 on the substrate 90 positioned by the substrate transfer device 11. As the holding member 30, for example, a suction nozzle, a chuck, or the like can be used.
 部品カメラ14および基板カメラ15は、公知の撮像装置を用いることができる。部品カメラ14は、光軸がZ軸方向の上向き(鉛直上方方向)になるように、部品装着機10の基台に固定されている。部品カメラ14は、保持部材30に保持されている部品91を下方から撮像することができる。基板カメラ15は、光軸がZ軸方向の下向き(鉛直下方方向)になるように、部品移載装置13の移動台132に設けられている。基板カメラ15は、基板90を上方から撮像することができる。 A known imaging device can be used for the component camera 14 and the substrate camera 15. The component camera 14 is fixed to the base of the component mounting machine 10 so that the optical axis faces upward (vertically upward) in the Z-axis direction. The component camera 14 can take an image of the component 91 held by the holding member 30 from below. The board camera 15 is provided on the moving table 132 of the component transfer device 13 so that the optical axis faces downward (vertically downward) in the Z-axis direction. The substrate camera 15 can image the substrate 90 from above.
 また、基板カメラ15は、部品91の採取位置PP1において、部品91を上方から撮像することもできる。部品カメラ14および基板カメラ15は、制御装置16から送出される制御信号に基づいて撮像を行う。部品カメラ14および基板カメラ15によって撮像された画像データは、制御装置16に送信される。 The board camera 15 can also take an image of the component 91 from above at the sampling position PP1 of the component 91. The component camera 14 and the substrate camera 15 perform imaging based on a control signal transmitted from the control device 16. The image data captured by the component camera 14 and the substrate camera 15 is transmitted to the control device 16.
 制御装置16は、公知の演算装置および記憶装置DS0を備えており、制御回路が構成されている。制御装置16には、部品装着機10に設けられる各種センサから出力される情報、画像データなどが入力される。制御装置16は、制御プログラムおよび予め設定されている所定の装着条件などに基づいて、各装置に対して制御信号を送出する。 The control device 16 includes a known arithmetic unit and a storage device DS0, and constitutes a control circuit. Information, image data, and the like output from various sensors provided in the component mounting machine 10 are input to the control device 16. The control device 16 sends a control signal to each device based on a control program, a predetermined mounting condition set in advance, and the like.
 例えば、制御装置16は、基板搬送装置11によって位置決めされた基板90を基板カメラ15に撮像させる。制御装置16は、基板カメラ15によって撮像された画像を画像処理して、基板90の位置決め状態を認識する。また、制御装置16は、部品供給装置12によって供給された部品91を保持部材30に採取させ保持させて、保持部材30に保持されている部品91を部品カメラ14に撮像させる。制御装置16は、部品カメラ14によって撮像された画像を画像処理して、部品91の適否、部品91の保持姿勢を認識する。 For example, the control device 16 causes the board camera 15 to image the board 90 positioned by the board transfer device 11. The control device 16 processes the image captured by the substrate camera 15 to recognize the positioning state of the substrate 90. Further, the control device 16 causes the holding member 30 to collect and hold the component 91 supplied by the component supply device 12, and causes the component camera 14 to image the component 91 held by the holding member 30. The control device 16 processes the image captured by the component camera 14 to recognize the suitability of the component 91 and the holding posture of the component 91.
 制御装置16は、制御プログラムなどによって予め設定される装着予定位置の上方に向かって、保持部材30を移動させる。また、制御装置16は、基板90の位置決め状態、部品91の保持姿勢などに基づいて、装着予定位置を補正して、実際に部品91を装着する装着位置を設定する。装着予定位置および装着位置は、位置(X座標およびY座標)の他に回転角度を含む。 The control device 16 moves the holding member 30 toward the upper side of the planned mounting position set in advance by a control program or the like. Further, the control device 16 corrects the planned mounting position based on the positioning state of the board 90, the holding posture of the component 91, and the like, and sets the mounting position where the component 91 is actually mounted. The planned mounting position and the mounting position include the rotation angle in addition to the position (X coordinate and Y coordinate).
 制御装置16は、装着位置に合わせて、保持部材30の目標位置(X座標およびY座標)および回転角度を補正する。制御装置16は、補正された目標位置において補正された回転角度で保持部材30を下降させて、基板90に部品91を装着する。制御装置16は、上記のピックアンドプレースサイクルを繰り返すことによって、基板90に複数の部品91を装着する装着処理を実行する。 The control device 16 corrects the target position (X coordinate and Y coordinate) and rotation angle of the holding member 30 according to the mounting position. The control device 16 lowers the holding member 30 at the corrected rotation angle at the corrected target position, and mounts the component 91 on the substrate 90. By repeating the above pick-and-place cycle, the control device 16 executes a mounting process for mounting the plurality of components 91 on the substrate 90.
 1-2.部品管理装置40の構成例
 図2に示すように、本実施形態の部品管理装置40は、部品装着機10の制御装置16に設けられている。部品管理装置40は、例えば、複数の部品装着機10を備える基板生産ラインを管理するライン管理装置、複数の基板生産ラインを管理するホストコンピュータ、クラウド上などに形成することもできる。
1-2. Configuration Example of Parts Management Device 40 As shown in FIG. 2, the parts management device 40 of the present embodiment is provided in the control device 16 of the parts mounting machine 10. The parts management device 40 can be formed, for example, on a line management device that manages a board production line including a plurality of component mounting machines 10, a host computer that manages a plurality of board production lines, a cloud, or the like.
 また、部品管理装置40は、制御ブロックとして捉えると、取得部41と、記憶部42とを備えている。部品管理装置40は、判別部43をさらに備えることもできる。図2に示すように、本実施形態の部品管理装置40は、取得部41と、記憶部42と、判別部43とを備えている。さらに、部品管理装置40は、図3に示すフローチャートに従って、制御プログラムを実行する。取得部41は、ステップS11に示す処理を行う。記憶部42は、ステップS12およびステップS13に示す処理を行う。判別部43は、ステップS14~ステップS16に示す判断および処理を行う。 Further, the parts management device 40 includes an acquisition unit 41 and a storage unit 42 when regarded as a control block. The parts management device 40 may further include a discriminating unit 43. As shown in FIG. 2, the parts management device 40 of the present embodiment includes an acquisition unit 41, a storage unit 42, and a discrimination unit 43. Further, the parts management device 40 executes the control program according to the flowchart shown in FIG. The acquisition unit 41 performs the process shown in step S11. The storage unit 42 performs the processes shown in steps S12 and S13. The determination unit 43 performs the determination and processing shown in steps S14 to S16.
 1-2-1.取得部41
 取得部41は、基板90に装着する部品91を収容しているキャビティ81を複数備えるキャリアテープ80から部品91が順に供給されるときに、当該部品91が収容されているキャビティ81の位置情報を取得する(図3に示すステップS11)。
1-2-1. Acquisition unit 41
When the parts 91 are sequentially supplied from the carrier tape 80 having a plurality of cavities 81 containing the parts 91 to be mounted on the substrate 90, the acquisition unit 41 obtains the position information of the cavities 81 containing the parts 91. Acquire (step S11 shown in FIG. 3).
 図4に示すように、キャリアテープ80は、複数のキャビティ81と、複数の送り孔82と、カバーテープ83とを備えている。複数のキャビティ81の各々は、部品91を収容している。複数の送り孔82は、キャリアテープ80の搬送方向(キャリアテープ80の長手方向)において、所定の間隔で形成されている。キャリアテープ80は、上面にカバーテープ83が接着されており、複数のキャビティ81の各々の開口部が閉塞されている。 As shown in FIG. 4, the carrier tape 80 includes a plurality of cavities 81, a plurality of feed holes 82, and a cover tape 83. Each of the plurality of cavities 81 houses a component 91. The plurality of feed holes 82 are formed at predetermined intervals in the transport direction of the carrier tape 80 (longitudinal direction of the carrier tape 80). A cover tape 83 is adhered to the upper surface of the carrier tape 80, and the openings of the plurality of cavities 81 are closed.
 図1および図4に示す採取位置PP1まで搬送されたキャリアテープ80は、保持部材30が部品91を採取可能にカバーテープ83が剥離される。具体的には、フィーダ121は、キャリアテープ80を搬送しつつ、カバーテープ83を剥離して、採取位置PP1において複数のキャビティ81を順に位置決めする。これにより、採取位置PP1に位置決めされたキャビティ81に収容されている部品91が保持部材30によって採取可能になり、当該部品91が供給可能になる。 The cover tape 83 of the carrier tape 80 transported to the collection position PP1 shown in FIGS. 1 and 4 is peeled off so that the holding member 30 can collect the component 91. Specifically, the feeder 121 peels off the cover tape 83 while conveying the carrier tape 80, and positions the plurality of cavities 81 in order at the collection position PP1. As a result, the component 91 housed in the cavity 81 positioned at the sampling position PP1 can be sampled by the holding member 30, and the component 91 can be supplied.
 複数のキャビティ81は、キャリアテープ80の搬送方向において、所定の間隔で形成されている。キャビティ81の間隔T1は、収容する部品91の寸法などに応じて適宜設定される。図4に示すように、本実施形態では、キャビティ81の間隔T1は、送り孔82の間隔T2の整数倍(同図では、二倍)に設定されている。フィーダ121がキャリアテープ80を所定量(同図の場合、送り孔82の間隔T2の二倍)、ピッチ送りするごとに、採取位置PP1にキャビティ81が位置決めされ部品91が一つ供給されて、キャリアテープ80に残存している部品91の残存数が一つ減少する。 The plurality of cavities 81 are formed at predetermined intervals in the transport direction of the carrier tape 80. The interval T1 of the cavities 81 is appropriately set according to the dimensions of the component 91 to be accommodated and the like. As shown in FIG. 4, in the present embodiment, the interval T1 of the cavity 81 is set to an integral multiple (twice in the figure) of the interval T2 of the feed hole 82. Each time the feeder 121 feeds the carrier tape 80 by a predetermined amount (twice the interval T2 of the feed holes 82 in the figure) and pitch feeds, the cavity 81 is positioned at the sampling position PP1 and one component 91 is supplied. The number of remaining parts 91 remaining on the carrier tape 80 is reduced by one.
 よって、取得部41は、キャリアテープ80から部品91を供給した部品91の供給数に基づいて、キャリアテープ80におけるキャビティ81の位置情報を取得することができる。部品91の供給数は、フィーダ121がキャリアテープ80をピッチ送りした送り量から取得することができる。例えば、キャリアテープ80の先頭(1番目)のキャビティ81が採取位置PP1に位置決めされ部品91が一つ供給されると、取得部41は、キャリアテープ80の先頭(1番目)のキャビティ81の位置を示す位置情報を取得する。 Therefore, the acquisition unit 41 can acquire the position information of the cavity 81 in the carrier tape 80 based on the number of the parts 91 supplied from the carrier tape 80. The number of parts 91 to be supplied can be obtained from the feed amount of the feeder 121 pitch-feeding the carrier tape 80. For example, when the leading (first) cavity 81 of the carrier tape 80 is positioned at the sampling position PP1 and one component 91 is supplied, the acquisition unit 41 moves the position of the leading (first) cavity 81 of the carrier tape 80. Acquire the position information indicating.
 フィーダ121がキャリアテープ80を上記所定量、ピッチ送りすると、キャリアテープ80の先頭から2番目のキャビティ81が採取位置PP1に位置決めされ部品91が一つ供給される。これにより、取得部41は、キャリアテープ80の先頭から2番目のキャビティ81の位置を示す位置情報を取得する。上述したことは、キャリアテープ80の先頭から3番目以降のキャビティ81の位置を示す位置情報についても、同様に言える。 When the feeder 121 pitch-feeds the carrier tape 80 by the predetermined amount, the second cavity 81 from the beginning of the carrier tape 80 is positioned at the sampling position PP1 and one component 91 is supplied. As a result, the acquisition unit 41 acquires the position information indicating the position of the second cavity 81 from the beginning of the carrier tape 80. The same can be said for the position information indicating the positions of the cavities 81 after the third from the beginning of the carrier tape 80.
 また、作業者は、キャリアテープ80が巻回されているリールRL0をフィーダ121に取り付けるときに、リールRL0に取り付けられている識別コードを読み取り装置を用いて読み取る。さらに、作業者は、フィーダ121を部品供給装置12のスロットに装備するときに、フィーダ121に取り付けられている識別コードを読み取り装置を用いて読み取る。 Further, when the operator attaches the reel RL0 on which the carrier tape 80 is wound to the feeder 121, the operator reads the identification code attached to the reel RL0 using a reading device. Further, when the feeder 121 is installed in the slot of the component supply device 12, the operator reads the identification code attached to the feeder 121 by using the reading device.
 フィーダ121は、スロットに装備されると、コネクタを介して部品装着機10から電力が供給され、部品装着機10との間で通信可能な状態になる。これにより、部品供給装置12のスロットと、当該スロットに装備されているフィーダ121の識別情報と、フィーダ121に取り付けられているリールRL0の識別情報とが関連付けられて、制御装置16の記憶装置DS0に記憶される。また、記憶装置DS0には、キャリアテープ80における部品91の初期収容数と、キャリアテープ80に残存している部品91の残存数とが記録される。 When the feeder 121 is installed in the slot, electric power is supplied from the component mounting machine 10 via the connector, and the feeder 121 is in a state of being able to communicate with the component mounting machine 10. As a result, the slot of the component supply device 12, the identification information of the feeder 121 installed in the slot, and the identification information of the reel RL0 attached to the feeder 121 are associated with each other, and the storage device DS0 of the control device 16 is associated with the slot. Is remembered in. Further, the storage device DS0 records the initial number of components 91 in the carrier tape 80 and the number of remaining components 91 remaining in the carrier tape 80.
 そこで、取得部41は、キャリアテープ80における部品91の初期収容数と、キャリアテープ80に残存している部品91の残存数とに基づいて、キャリアテープ80におけるキャビティ81の位置情報を取得することもできる。例えば、部品91の初期収容数が5000点であり、部品91の残存数が5000点の場合、1(=5000-5000+1)点目の部品91の供給である。この場合、取得部41は、キャリアテープ80の先頭(1番目)のキャビティ81の位置を示す位置情報を取得する。 Therefore, the acquisition unit 41 acquires the position information of the cavity 81 in the carrier tape 80 based on the initial number of the parts 91 in the carrier tape 80 and the remaining number of the parts 91 remaining in the carrier tape 80. You can also. For example, when the initial storage number of the parts 91 is 5000 points and the remaining number of the parts 91 is 5000 points, the 1st (= 5000-5000 + 1) point component 91 is supplied. In this case, the acquisition unit 41 acquires the position information indicating the position of the cavity 81 at the head (first) of the carrier tape 80.
 部品91の初期収容数が5000点であり、部品91の残存数が4999点の場合、2(=5000-4999+1)点目の部品91の供給である。この場合、取得部41は、キャリアテープ80の先頭から2番目のキャビティ81の位置を示す位置情報を取得する。このように、部品91の初期収容数がNI0点であり、部品91の残存数がNR0点の場合、(NI0-NR0+1)点目の部品91の供給である。この場合、取得部41は、キャリアテープ80の先頭から(NI0-NR0+1)番目のキャビティ81の位置を示す位置情報を取得する。 When the initial capacity of the part 91 is 5000 points and the remaining number of the parts 91 is 4999 points, the 2nd (= 5000-4999 + 1) point component 91 is supplied. In this case, the acquisition unit 41 acquires the position information indicating the position of the second cavity 81 from the beginning of the carrier tape 80. As described above, when the initial capacity of the component 91 is NI0 point and the remaining number of component 91 is NR0 point, the component 91 at the (NI0-NR0 + 1) point is supplied. In this case, the acquisition unit 41 acquires the position information indicating the position of the cavity 81 (NI0-NR0 + 1) th from the beginning of the carrier tape 80.
 1-2-2.記憶部42
 記憶部42は、取得部41によって取得されたキャビティ81の位置情報、および、キャリアテープ80が巻回されているリールRL0を識別する識別情報を関連付けて記憶装置DS0に記憶させる(図3に示すステップS12)。
1-2-2. Memory 42
The storage unit 42 stores the position information of the cavity 81 acquired by the acquisition unit 41 and the identification information for identifying the reel RL0 around which the carrier tape 80 is wound in the storage device DS0 in association with each other (shown in FIG. 3). Step S12).
 既述したように、部品供給装置12のスロットと、当該スロットに装備されているフィーダ121の識別情報と、フィーダ121に取り付けられているリールRL0の識別情報とが関連付けられて、制御装置16の記憶装置DS0に記憶されている。よって、記憶部42は、取得部41によって取得されたキャビティ81の位置情報と、キャリアテープ80が巻回されているリールRL0を識別する識別情報とを関連付けて記憶装置DS0に記憶させることができる。 As described above, the slot of the component supply device 12, the identification information of the feeder 121 installed in the slot, and the identification information of the reel RL0 attached to the feeder 121 are associated with each other to form the control device 16. It is stored in the storage device DS0. Therefore, the storage unit 42 can store the position information of the cavity 81 acquired by the acquisition unit 41 and the identification information for identifying the reel RL0 around which the carrier tape 80 is wound in the storage device DS0 in association with each other. ..
 また、記憶部42は、基板情報、機器情報、保持情報および装着情報のうちの少なくとも一つを、キャビティ81の位置情報およびリールRL0の識別情報と関連付けて記憶装置DS0に記憶させることができる(図3に示すステップS13)。基板情報は、部品91が装着された基板90に関する情報をいう。例えば、基板情報には、基板90を識別する識別情報、基板90の種類、部品91が装着された装着位置を特定する情報(例えば、回路記号)などが含まれる。基板90の種類には、例えば、複数の基板90が分割可能に形成されている多面取り基板、基板90の表面および裏面のうちの一方の面のみに部品91が装着される片面装着基板、基板90の両面(表面および裏面)に部品91が装着される両面装着基板などが含まれる。 Further, the storage unit 42 can store at least one of the board information, the device information, the holding information, and the mounting information in the storage device DS0 in association with the position information of the cavity 81 and the identification information of the reel RL0. Step S13 shown in FIG. The board information refers to information about the board 90 on which the component 91 is mounted. For example, the board information includes identification information for identifying the board 90, the type of the board 90, information for specifying the mounting position where the component 91 is mounted (for example, a circuit symbol), and the like. The types of the substrate 90 include, for example, a multi-chamfered substrate in which a plurality of substrates 90 are divisible, a single-sided mounting substrate in which the component 91 is mounted on only one of the front surface and the back surface of the substrate 90, and a substrate. A double-sided mounting board on which the component 91 is mounted on both sides (front surface and back surface) of the 90 is included.
 機器情報は、部品91の装着に使用された機器DD0に関する情報をいう。例えば、機器DD0には、装着ヘッド20、保持部材30、フィーダ121などの部品装着機10に着脱可能に設けられる機器が含まれる。また、複数の部品装着機10を備える基板生産ラインでは、部品装着機10を識別する必要がある。この場合、機器DD0には、例えば、部品装着機10が含まれる。さらに、機器情報には、機器DD0を識別する識別情報、機器DD0の使用条件などが含まれる。 The device information refers to the information related to the device DD0 used for mounting the component 91. For example, the device DD0 includes a device that is detachably provided on the component mounting machine 10 such as the mounting head 20, the holding member 30, and the feeder 121. Further, in a substrate production line including a plurality of component mounting machines 10, it is necessary to identify the component mounting machines 10. In this case, the device DD0 includes, for example, the component mounting machine 10. Further, the device information includes identification information for identifying the device DD0, usage conditions of the device DD0, and the like.
 保持情報は、部品91が保持部材30によって採取され保持されているときの部品91の保持状態に関する情報をいう。例えば、保持情報には、保持部材30によって採取され保持されている部品91の正規の保持位置に対するずれ量、正規の保持姿勢に対する回転角度、保持状態の判定結果、画像データの所在などが含まれる。保持状態の判定結果は、保持部材30によって採取され保持されている部品91の上記ずれ量および上記回転角度が許容範囲に含まれるか否かによって判定される。保持情報は、例えば、部品カメラ14によって撮像された画像を画像処理して取得することができる。 The holding information refers to information regarding the holding state of the part 91 when the part 91 is collected and held by the holding member 30. For example, the holding information includes the amount of deviation of the component 91 collected and held by the holding member 30 with respect to the regular holding position, the rotation angle with respect to the regular holding posture, the determination result of the holding state, the location of the image data, and the like. .. The determination result of the holding state is determined by whether or not the deviation amount and the rotation angle of the component 91 collected and held by the holding member 30 are included in the allowable range. The holding information can be obtained by performing image processing on the image captured by the component camera 14, for example.
 装着情報は、部品91が保持部材30によって基板90に装着されたときの部品91の装着状態に関する情報をいう。例えば、装着情報には、基板90に装着された部品91の正規の装着位置に対するずれ量、正規の装着状態に対する回転角度、装着状態の判定結果、画像データの所在などが含まれる。装着状態の判定結果は、基板90に装着された部品91の上記ずれ量および上記回転角度が許容範囲に含まれるか否かによって判定される。装着情報は、例えば、基板90に装着された部品91を検査する外観検査機によって取得することができる。 The mounting information refers to information regarding the mounting state of the component 91 when the component 91 is mounted on the substrate 90 by the holding member 30. For example, the mounting information includes the amount of deviation of the component 91 mounted on the substrate 90 with respect to the regular mounting position, the rotation angle with respect to the regular mounting state, the determination result of the mounting state, the location of the image data, and the like. The determination result of the mounting state is determined by whether or not the deviation amount and the rotation angle of the component 91 mounted on the substrate 90 are included in the allowable range. The mounting information can be obtained, for example, by a visual inspection machine that inspects the component 91 mounted on the substrate 90.
 図5は、記憶装置DS0が記憶する情報の一例を模式的に示している。例えば、識別情報DID1のリールRL0に巻回されているキャリアテープ80のキャビティ81の位置情報は、キャリアテープ80の先頭から「1」、「2」、「3」で示されている。当該キャリアテープ80の先頭(1番目)のキャビティ81に収容されていた部品91は、識別情報BID1の基板90の回路記号R1で示される装着位置に装着されている。また、当該部品91は、ノズル番号NZ1で識別される保持部材30(吸着ノズル)によって採取(吸着)され保持されて基板90に装着されている。さらに、当該部品91の保持状態および装着状態の判定結果は、いずれも良好(OK)である。 FIG. 5 schematically shows an example of information stored in the storage device DS0. For example, the position information of the cavity 81 of the carrier tape 80 wound around the reel RL0 of the identification information DID1 is indicated by "1", "2", and "3" from the beginning of the carrier tape 80. The component 91 housed in the cavity 81 at the top (first) of the carrier tape 80 is mounted at the mounting position indicated by the circuit symbol R1 on the substrate 90 of the identification information BID1. Further, the component 91 is collected (suctioned) by the holding member 30 (suction nozzle) identified by the nozzle number NZ1 and held and mounted on the substrate 90. Further, the determination results of the holding state and the mounting state of the component 91 are both good (OK).
 上述したことは、当該キャリアテープ80の先頭から2番目以降のキャビティ81に収容されていた部品91についても同様に言える。また、上述したことは、識別情報DID2のリールRL0に巻回されているキャリアテープ80に収容されていた部品91についても同様に言える。例えば、識別情報BID1の基板90の回路記号R10で示される装着位置に装着されている部品91は、保持状態および装着状態の判定結果が、いずれも不良(NG)である。 The same can be said for the component 91 housed in the second and subsequent cavities 81 of the carrier tape 80. Further, the above can be said for the component 91 housed in the carrier tape 80 wound around the reel RL0 of the identification information DID2. For example, the component 91 mounted at the mounting position indicated by the circuit symbol R10 on the board 90 of the identification information BID1 has a defective (NG) determination result in both the holding state and the mounting state.
 リールRL0単位で供給する部品91の管理が行われ、部品91自体に不良の原因があると考えられる場合、作業者は、識別情報DID1のリールRL0に収容されているすべての部品91についてトレースする必要があり、トレース作業が煩雑である。これに対して、部品管理装置40の利用者は、図5に示す情報に基づいて、判定結果が不良となった部品91が、識別情報DID1のリールRL0に巻回されているキャリアテープ80の先頭から2番目のキャビティ81に収容されていたことを知得することができる。 When the component 91 supplied in units of reel RL0 is managed and the cause of the defect is considered to be the component 91 itself, the operator traces all the components 91 housed in the reel RL0 of the identification information DID1. It is necessary and the tracing work is complicated. On the other hand, the user of the parts management device 40 uses the carrier tape 80 in which the parts 91 whose determination result is defective are wound around the reel RL0 of the identification information DID1 based on the information shown in FIG. It can be known that it was housed in the second cavity 81 from the beginning.
 よって、部品管理装置40の利用者は、識別情報DID1のリールRL0から供給した部品91の中から、キャビティ81の位置情報に基づいてトレース対象の部品91を絞り込むことが容易であり、トレーサビリティが向上する。また、例えば、判定結果が不良であった部品91が、キャリアテープ80の後尾側のキャビティ81に収容されていることが多いことが判明したとする。キャリアテープ80の後尾側のキャビティ81に収容されている部品91ほど、キャリアテープ80の使用を開始してからの経過時間が長くなる。 Therefore, the user of the parts management device 40 can easily narrow down the parts 91 to be traced based on the position information of the cavity 81 from the parts 91 supplied from the reel RL0 of the identification information DID1, and the traceability is improved. To do. Further, for example, it is assumed that the component 91 whose determination result is poor is often housed in the cavity 81 on the tail side of the carrier tape 80. The component 91 housed in the cavity 81 on the tail side of the carrier tape 80 has a longer elapsed time from the start of use of the carrier tape 80.
 そのため、部品91の不良の原因は、例えば、キャリアテープ80の保管状態の不良によるものと推定することができる。また、キャリアテープ80の後尾側のキャビティ81に収容されている部品91ほど、キャリアテープ80が巻回されているときのキャリアテープ80による圧力の影響を受け易い。そのため、部品91の不良の原因は、例えば、キャリアテープ80の巻回し状態の不良によるものと推定することもできる。 Therefore, it can be estimated that the cause of the defect of the component 91 is, for example, the defect of the storage state of the carrier tape 80. Further, the component 91 housed in the cavity 81 on the tail side of the carrier tape 80 is more susceptible to the pressure of the carrier tape 80 when the carrier tape 80 is wound. Therefore, it can be estimated that the cause of the defect of the component 91 is, for example, the defect of the wound state of the carrier tape 80.
 部品91の供給方法には、ウエハWF0から部品91を供給するウエハ供給と、リールRL0から部品91を供給するリール供給とが含まれる。ウエハWF0は、製造工程上、部分的に不良となる箇所(洲)があり、所定の品質を満たさない箇所は、不良ダイ(Bad Die)として、マップで管理される。不良ダイは、事前に光学的検査などによって検知されるが、不良ダイと判定されなかったダイが後に不良ダイと判明する場合がある。このような検知漏れが生じた複数のダイについて、例えば、製造者がトレーサビリティ情報からウエハWF0における座標位置の分布を取得すると、当該ダイがウエハWF0の特定領域に集中している場合がある。この場合、製造者は、当該ダイを検知できるようにダイの良否を判定する判定条件を修正して、不良ダイの検知漏れの低減を図る。 The method of supplying the component 91 includes a wafer supply in which the component 91 is supplied from the wafer WF0 and a reel supply in which the component 91 is supplied from the reel RL0. The wafer WF0 has a part (island) that is partially defective in the manufacturing process, and a part that does not satisfy a predetermined quality is managed as a defective die (Bad Die) on a map. Defective dies are detected in advance by optical inspection or the like, but dies that are not determined to be defective dies may later be found to be defective dies. For a plurality of dies in which such detection omission has occurred, for example, when the manufacturer acquires the distribution of the coordinate positions on the wafer WF0 from the traceability information, the dies may be concentrated in a specific region of the wafer WF0. In this case, the manufacturer modifies the determination condition for determining the quality of the die so that the die can be detected to reduce the omission of detection of the defective die.
 しかしながら、ウエハ供給に対応する部品供給装置は、リール供給に対応する部品供給装置12と比べて、一般に高価であり、供給可能な部品91の種類および供給数が少なく、部品91の補給作業も煩雑になり易い。そのため、ウエハWF0に配列されていた部品91をリールRL0に移して、リール供給を行うことが知られている。 However, the parts supply device corresponding to wafer supply is generally more expensive than the parts supply device 12 corresponding to reel supply, the types and number of parts 91 that can be supplied are small, and the replenishment work of the parts 91 is complicated. It is easy to become. Therefore, it is known that the parts 91 arranged on the wafer WF0 are transferred to the reel RL0 to supply the reels.
 本実施形態のキャリアテープ80は、ウエハWF0に配列されていた部品91であるウエハ部品91Wを収容する。図6に示すXW軸およびYW軸は、ウエハWF0における直交座標軸の一例を示している。ウエハ部品91Wは、例えば、直交座標軸の原点側の所定領域(配列順序が1)から、XW軸方向に所定数分、配列される。次に、ウエハ部品91Wは、当該所定領域よりYW軸の座標が一つ増加した領域から、XW軸方向に所定数分、配列される。ウエハWF0では、上述した配列が繰り返されており、上述した配列順序によって、ウエハWF0に配列されていた部品91(ウエハ部品91W)を特定することができる。 The carrier tape 80 of the present embodiment accommodates the wafer component 91W, which is the component 91 arranged on the wafer WF0. The XW axis and the YW axis shown in FIG. 6 show an example of orthogonal coordinate axes in the wafer WF0. The wafer parts 91W are arranged, for example, by a predetermined number of minutes in the XW axis direction from a predetermined region (arrangement order is 1) on the origin side of the orthogonal coordinate axes. Next, the wafer parts 91W are arranged in the XW axis direction for a predetermined number of minutes from the region in which the coordinates of the YW axis are increased by one from the predetermined region. In the wafer WF0, the above-mentioned arrangement is repeated, and the parts 91 (wafer parts 91W) arranged on the wafer WF0 can be specified by the above-mentioned arrangement order.
 図7に示すウエハ関連情報は、ウエハWF0の識別情報と、ウエハ部品91Wの配列情報(配列順序)と、ウエハ部品91Wの配列情報(座標情報)と、ウエハ部品情報とを含んでいる。例えば、上記所定領域(配列順序が1)に配列されていたウエハ部品91Wは、XW軸方向の座標が座標XW1で示され、YW軸方向の座標が座標YW1で示されている。当該ウエハ部品91Wは、例えば、品質が規定されていないウエハ部品91Wである。 The wafer-related information shown in FIG. 7 includes identification information of the wafer WF0, array information (arrangement order) of the wafer component 91W, array information (coordinate information) of the wafer component 91W, and wafer component information. For example, in the wafer component 91W arranged in the predetermined region (arrangement order is 1), the coordinates in the XW axis direction are indicated by the coordinates XW1, and the coordinates in the YW axis direction are indicated by the coordinates YW1. The wafer component 91W is, for example, a wafer component 91W whose quality is not specified.
 配列順序が1の領域とXW軸方向に隣接する領域(配列順序が2)に配列されていたウエハ部品91Wは、XW軸方向の座標が座標XW2で示され、YW軸方向の座標が座標YW1で示されている。当該ウエハ部品91Wは、例えば、ウエハWF0の基準位置を示す基準部材RM0である。基準部材RM0は、ウエハWF0の所定位置に設けられ、ウエハWF0からウエハ部品91Wを採取する際の基準位置を示す。基準部材RM0は、誤装着を防止するため、通常、キャリアテープ80には収容されない。 For the wafer component 91W arranged in the region where the arrangement order is 1 and the region adjacent to the XW axis direction (the arrangement order is 2), the coordinates in the XW axis direction are indicated by the coordinates XW2, and the coordinates in the YW axis direction are the coordinates YW1. It is indicated by. The wafer component 91W is, for example, a reference member RM0 indicating a reference position of the wafer WF0. The reference member RM0 is provided at a predetermined position on the wafer WF0, and indicates a reference position when the wafer component 91W is taken from the wafer WF0. The reference member RM0 is usually not housed in the carrier tape 80 in order to prevent erroneous mounting.
 配列順序が2の領域とXW軸方向に隣接する領域(配列順序が3)に配列されていたウエハ部品91Wは、XW軸方向の座標が座標XW3で示され、YW軸方向の座標が座標YW1で示されている。当該ウエハ部品91Wは、例えば、不良のウエハ部品91W(不良部品BM0)である。不良部品BM0は、ウエハ部品91Wの製造工程において発見されたものをいい、誤装着を防止するため、通常、キャリアテープ80には収容されない。 In the wafer component 91W arranged in the region having the arrangement order 2 and the region adjacent to the XW axis direction (the arrangement order is 3), the coordinates in the XW axis direction are indicated by the coordinates XW3, and the coordinates in the YW axis direction are the coordinates YW1. It is indicated by. The wafer component 91W is, for example, a defective wafer component 91W (defective component BM0). The defective component BM0 is a component found in the manufacturing process of the wafer component 91W, and is usually not accommodated in the carrier tape 80 in order to prevent erroneous mounting.
 同様に、配列順序が順序AJ1の領域に配列されていたウエハ部品91Wは、XW軸方向の座標が座標XWA1で示され、YW軸方向の座標が座標YWA1で示されている。当該ウエハ部品91Wは、例えば、品質がAランクのウエハ部品91WAである。また、配列順序が順序AJ2の領域に配列されていたウエハ部品91Wは、XW軸方向の座標が座標XWA2で示され、YW軸方向の座標が座標YWA2で示されている。当該ウエハ部品91Wは、例えば、品質がBランクのウエハ部品91WBである。 Similarly, in the wafer component 91W whose arrangement order is arranged in the region of the order AJ1, the coordinates in the XW axis direction are indicated by the coordinates XWA1, and the coordinates in the YW axis direction are indicated by the coordinates YWA1. The wafer component 91W is, for example, a wafer component 91WA having a quality of A rank. Further, in the wafer component 91W whose arrangement order is arranged in the region of the order AJ2, the coordinates in the XW axis direction are indicated by the coordinates XWA2, and the coordinates in the YW axis direction are indicated by the coordinates YWA2. The wafer component 91W is, for example, a wafer component 91WB having a quality of B rank.
 さらに、配列順序が順序AJ3の領域に配列されていたウエハ部品91Wは、XW軸方向の座標が座標XWA3で示され、YW軸方向の座標が座標YWA3で示されている。当該ウエハ部品91Wは、例えば、品質がCランクのウエハ部品91WCである。なお、本明細書では、例えば、Aランクのウエハ部品91WA、Bランクのウエハ部品91WB、Cランクのウエハ部品91WCの順に、ウエハ部品91Wの品質が劣化するものとする。また、ウエハ部品91Wの品質の設定方法は、限定されない。 Further, in the wafer component 91W whose arrangement order is arranged in the region of the order AJ3, the coordinates in the XW axis direction are indicated by the coordinates XWA3, and the coordinates in the YW axis direction are indicated by the coordinates YWA3. The wafer component 91W is, for example, a wafer component 91WC having a quality of C rank. In this specification, for example, it is assumed that the quality of the wafer component 91W deteriorates in the order of the A-rank wafer component 91WA, the B-rank wafer component 91WB, and the C-rank wafer component 91WC. Further, the method of setting the quality of the wafer component 91W is not limited.
 このように、ウエハWF0には、種々のウエハ部品91Wが含まれる。そのため、ウエハ部品91Wを収容するキャリアテープ80を用いた部品91の供給では、ウエハWF0におけるウエハ部品91Wの配列情報を知得したいという要請がある。この場合、記憶部42は、ウエハWF0におけるウエハ部品91Wの配列情報と、キャリアテープ80においてウエハ部品91Wが収容されているキャビティ81の位置情報とを、部品91を供給する前に予め関連付けて記憶装置DS0に記憶させておくと良い。 As described above, the wafer WF0 includes various wafer parts 91W. Therefore, in the supply of the component 91 using the carrier tape 80 accommodating the wafer component 91W, there is a request to know the arrangement information of the wafer component 91W in the wafer WF0. In this case, the storage unit 42 stores the arrangement information of the wafer component 91W in the wafer WF0 and the position information of the cavity 81 in which the wafer component 91W is housed in the carrier tape 80 in advance in association with each other before supplying the component 91. It is good to store it in the device DS0.
 例えば、記憶部42は、配列順序が順序AJ1の領域に配列されていたウエハ部品91Wの配列情報と、当該ウエハ部品91Wが収容されているキャビティ81の位置情報と、当該ウエハ部品91Wが収容されているキャリアテープ80のリールRL0の識別情報とを関連付けて記憶装置DS0に記憶させておく。これにより、部品管理装置40の利用者は、供給された部品91がウエハ部品91Wであり、当該ウエハ部品91Wは、ウエハWF0において、XW軸方向の座標XWA1およびYW軸方向の座標YWA1の領域に配列されていたことを知得することができる。また、部品管理装置40の利用者は、当該ウエハ部品91Wの配列順序が順序AJ1であり、品質がAランクのウエハ部品91WAであることを知得することができる。 For example, the storage unit 42 accommodates the arrangement information of the wafer parts 91W whose arrangement order is arranged in the region of the order AJ1, the position information of the cavity 81 in which the wafer parts 91W are housed, and the wafer parts 91W. The identification information of the reel RL0 of the carrier tape 80 is stored in the storage device DS0 in association with the identification information. As a result, the user of the component management device 40 finds that the supplied component 91 is a wafer component 91W, and the wafer component 91W is located in the area of the XW axis coordinate XWA1 and the YW axis coordinate YWA1 on the wafer WF0. It can be known that it was arranged. Further, the user of the parts management device 40 can know that the arrangement order of the wafer parts 91W is the order AJ1 and the quality is the wafer parts 91WA of rank A.
 上述したことは、他のウエハ部品91Wについても、同様に言える。このように、記憶部42は、図7に示すウエハ関連情報において、ウエハ部品91Wが収容されているキャビティ81の位置情報と、当該ウエハ部品91Wが収容されているキャリアテープ80のリールRL0の識別情報とを、さらに関連付けて記憶装置DS0に記憶させることができる。 The same can be said for other wafer parts 91W. As described above, in the wafer-related information shown in FIG. 7, the storage unit 42 identifies the position information of the cavity 81 containing the wafer component 91W and the reel RL0 of the carrier tape 80 containing the wafer component 91W. The information can be further associated and stored in the storage device DS0.
 なお、ウエハ部品91Wは、ウエハWF0において所定の順序で配列され、キャリアテープ80においてウエハWF0における配列順序で収容される。よって、記憶部42は、キャリアテープ80に収容されている所定のウエハ部品91Wについて、記憶装置DS0に記憶させておけば十分である。また、ウエハ部品91Wは、複数のキャリアテープ80においてウエハWF0における配列順序で収容される場合もある。 The wafer parts 91W are arranged in a predetermined order on the wafer WF0, and are housed in the carrier tape 80 in the arrangement order on the wafer WF0. Therefore, it is sufficient for the storage unit 42 to store the predetermined wafer component 91W housed in the carrier tape 80 in the storage device DS0. Further, the wafer component 91W may be accommodated in a plurality of carrier tapes 80 in the arrangement order in the wafer WF0.
 そこで、記憶部42は、ウエハWF0を識別する識別情報と、キャリアテープ80が巻回されている複数のリールRL0を識別する識別情報と、所定の配列情報とを、部品91を供給する前に予め関連付けて記憶装置DS0に記憶させておくことができる。所定の配列情報は、各キャリアテープ80に収容されている所定のウエハ部品91WのウエハWF0における配列順序を含む配列情報をいう。 Therefore, the storage unit 42 provides the identification information for identifying the wafer WF0, the identification information for identifying the plurality of reels RL0 around which the carrier tape 80 is wound, and the predetermined arrangement information before supplying the component 91. It can be associated in advance and stored in the storage device DS0. The predetermined arrangement information refers to the arrangement information including the arrangement order in the wafer WF0 of the predetermined wafer component 91W housed in each carrier tape 80.
 図8に示すように、識別情報WID1のウエハWF0に配列されていたウエハ部品91Wは、例えば、複数(5つ)のリールRL0のキャリアテープ80に収容されている。よって、ウエハWF0の識別情報WID1と、複数(5つ)のリールRL0の識別情報DID1~識別情報DID5とが関連付けられて記憶装置DS0に記憶されている。また、例えば、識別情報DID1のリールRL0は、キャリアテープ80の先頭(1番目)のキャビティ81に収容されているウエハ部品91Wの配列順序が1であり、当該ウエハ部品91Wは、XW軸方向の座標が座標XW1で示され、YW軸方向の座標が座標YW1で示されている。 As shown in FIG. 8, the wafer parts 91W arranged on the wafer WF0 of the identification information WID1 are housed in, for example, the carrier tape 80 of a plurality of (five) reels RL0. Therefore, the identification information WID1 of the wafer WF0 and the identification information DID1 to the identification information DID5 of the plurality of (five) reels RL0 are associated and stored in the storage device DS0. Further, for example, in the reel RL0 of the identification information DID1, the arrangement order of the wafer parts 91W housed in the cavity 81 at the head (first) of the carrier tape 80 is 1, and the wafer parts 91W are in the XW axis direction. The coordinates are indicated by the coordinates XW1, and the coordinates in the YW axis direction are indicated by the coordinates YW1.
 識別情報DID2のリールRL0は、キャリアテープ80の先頭(1番目)のキャビティ81に収容されているウエハ部品91Wの配列順序が順序BJ1であり、当該ウエハ部品91Wは、XW軸方向の座標が座標XWB1で示され、YW軸方向の座標が座標YWB1で示されている。上記のウエハ部品91Wの配列順序から、識別情報DID1のリールRL0のキャリアテープ80には、(BJ1-1)個のウエハ部品91Wが収容されていることが分かる。 In the reel RL0 of the identification information DID2, the arrangement order of the wafer parts 91W housed in the cavity 81 at the head (first) of the carrier tape 80 is the order BJ1, and the coordinates of the wafer parts 91W in the XW axis direction are the coordinates. It is indicated by XWB1, and the coordinates in the YW axis direction are indicated by the coordinates YWB1. From the arrangement order of the wafer parts 91W described above, it can be seen that the carrier tape 80 of the reel RL0 of the identification information DID1 contains (BJ1-1) of the wafer parts 91W.
 識別情報DID3のリールRL0は、キャリアテープ80の先頭(1番目)のキャビティ81に収容されているウエハ部品91Wの配列順序が順序CJ1であり、当該ウエハ部品91Wは、XW軸方向の座標が座標XWC1で示され、YW軸方向の座標が座標YWC1で示されている。同様に、ウエハ部品91Wの配列順序から、識別情報DID2のリールRL0のキャリアテープ80には、(CJ1-BJ1)個のウエハ部品91Wが収容されていることが分かる。上述したことは、識別情報DID3~識別情報DID5のリールRL0についても、同様に言える。 In the reel RL0 of the identification information DID3, the arrangement order of the wafer parts 91W housed in the cavity 81 at the head (first) of the carrier tape 80 is the order CJ1, and the coordinates of the wafer parts 91W in the XW axis direction are the coordinates. It is indicated by XWC1, and the coordinates in the YW axis direction are indicated by the coordinates YWC1. Similarly, from the arrangement order of the wafer parts 91W, it can be seen that the carrier tape 80 of the reel RL0 of the identification information DID2 accommodates (CJ1-BJ1) wafer parts 91W. The same can be said for the reels RL0 of the identification information DID3 to the identification information DID5.
 なお、同図に示す記憶方法では、識別情報DID5のリールRL0について、ウエハ部品91Wの収容数が不明である。そのため、記憶部42は、当該リールRL0についてウエハ部品91Wの収容数を別途、記憶装置DS0に記憶させておくと良い。また、記憶部42は、各キャリアテープ80の任意のキャビティ81に収容されているウエハ部品91Wの配列情報を記憶させることができる。さらに、記憶部42は、直前のキャリアテープ80までの累積のウエハ部品91Wの配列順序を含む配列情報を記憶させることもできる。この場合、最初のリールRL0である識別情報DID1のリールRL0は、累積のウエハ部品91Wの配列順序がゼロであり、配列情報を含まない。 In the storage method shown in the figure, the number of wafer parts 91W accommodated in the reel RL0 of the identification information DID5 is unknown. Therefore, it is preferable that the storage unit 42 separately stores the number of wafer parts 91W accommodated in the reel RL0 in the storage device DS0. Further, the storage unit 42 can store the arrangement information of the wafer component 91W housed in the arbitrary cavity 81 of each carrier tape 80. Further, the storage unit 42 can also store the arrangement information including the arrangement order of the cumulative wafer parts 91W up to the immediately preceding carrier tape 80. In this case, the reel RL0 of the identification information DID1 which is the first reel RL0 has zero arrangement order of the cumulative wafer parts 91W and does not include the arrangement information.
 ここで、ウエハWF0に含まれる不良のウエハ部品91W(不良部品BM0)、品質が所定ランク以下のウエハ部品91W、および、ウエハWF0の基準位置を示す基準部材RM0のうちの少なくとも一つを特定部材SM0とする。既述したように、不良のウエハ部品91W(不良部品BM0)およびウエハWF0の基準位置を示す基準部材RM0は、誤装着を防止するため、通常、キャリアテープ80には収容されない。また、例えば、Bランク以上のウエハ部品91Wなど所定品質のウエハ部品91Wの供給が要求される場合、品質が所定ランク以下のウエハ部品91W(この場合、Cランクのウエハ部品91WC)は、誤装着を防止するため、キャリアテープ80に収容されない場合がある。 Here, at least one of a defective wafer component 91W (defective component BM0) included in the wafer WF0, a wafer component 91W having a quality of a predetermined rank or less, and a reference member RM0 indicating a reference position of the wafer WF0 is specified. Let it be SM0. As described above, the defective wafer component 91W (defective component BM0) and the reference member RM0 indicating the reference position of the wafer WF0 are usually not accommodated in the carrier tape 80 in order to prevent erroneous mounting. Further, for example, when the supply of a wafer component 91W of a predetermined quality such as a wafer component 91W of a rank B or higher is required, the wafer component 91W having a quality of a predetermined rank or lower (in this case, the wafer component 91WC of the C rank) is erroneously mounted. In order to prevent the above, the carrier tape 80 may not be accommodated.
 そのため、キャリアテープ80には、特定部材SM0を収容予定のキャビティ81である特定キャビティ81Sに、ウエハWF0における配列順序が特定部材SM0より後続のウエハ部品91Wが繰り上げて収容されているキャリアテープ80が含まれる。例えば、図9に示す3番のキャビティ81が特定キャビティ81Sであったとする。この場合、3番の特定キャビティ81Sには、4番のキャビティ81に収容予定のウエハ部品91Wが収容される。また、4番のキャビティ81には、5番のキャビティ81に収容予定のウエハ部品91Wが収容される。以下、同様であり、ウエハWF0における配列順序が特定部材SM0より後続のウエハ部品91Wが繰り上げてキャビティ81に収容される。 Therefore, in the carrier tape 80, the carrier tape 80 in which the wafer component 91W following the specific member SM0 in the arrangement order of the wafer WF0 is carried up and accommodated in the specific cavity 81S, which is the cavity 81 in which the specific member SM0 is scheduled to be housed included. For example, it is assumed that the third cavity 81 shown in FIG. 9 is the specific cavity 81S. In this case, the wafer component 91W to be accommodated in the No. 4 cavity 81 is accommodated in the No. 3 specific cavity 81S. Further, the wafer component 91W to be housed in the cavity 81 of No. 5 is housed in the cavity 81 of No. 4. Hereinafter, the same applies, and the wafer component 91W following the specific member SM0 in the arrangement order of the wafer WF0 is moved up and accommodated in the cavity 81.
 この場合、記憶部42は、特定キャビティ81Sの位置および個数を含む特定キャビティ情報を、部品91を供給する前に予め記憶装置DS0に記憶させておくと良い。これにより、部品管理装置40は、ウエハWF0におけるウエハ部品91Wの配列情報と、キャリアテープ80においてウエハ部品91Wが収容されているキャビティ81の位置情報とを整合させることができる。上記の例では、特定キャビティ81Sの位置は、3番のキャビティ81であり、特定キャビティ81Sの個数は、一つである。 In this case, the storage unit 42 may store the specific cavity information including the position and the number of the specific cavities 81S in the storage device DS0 in advance before supplying the component 91. As a result, the component management device 40 can match the arrangement information of the wafer component 91W on the wafer WF0 with the position information of the cavity 81 in which the wafer component 91W is housed on the carrier tape 80. In the above example, the position of the specific cavity 81S is the third cavity 81, and the number of the specific cavities 81S is one.
 また、キャリアテープ80には、特定部材SM0を収容予定の特定キャビティ81Sが空キャビティ81Eに設定されているキャリアテープ80が含まれる。例えば、図9に示す3番のキャビティ81が特定キャビティ81Sであったとする。この場合、3番の特定キャビティ81Sは、空キャビティ81Eに設定される。空キャビティ81Eは、ウエハ部品91Wおよび特定部材SM0を収容していない未収容のキャビティ81である。この場合、例えば、4番のキャビティ81には、4番のキャビティ81に収容予定のウエハ部品91Wが収容される。以下、同様であり、上述したウエハ部品91Wの繰り上げ収容は行われない。 Further, the carrier tape 80 includes a carrier tape 80 in which the specific cavity 81S scheduled to accommodate the specific member SM0 is set in the empty cavity 81E. For example, it is assumed that the third cavity 81 shown in FIG. 9 is the specific cavity 81S. In this case, the third specific cavity 81S is set to the empty cavity 81E. The empty cavity 81E is an unaccommodated cavity 81 that does not accommodate the wafer component 91W and the specific member SM0. In this case, for example, the wafer component 91W to be accommodated in the No. 4 cavity 81 is accommodated in the No. 4 cavity 81. Hereinafter, the same applies, and the above-mentioned wafer component 91W is not carried forward and accommodated.
 この場合、記憶部42は、空キャビティ81Eの位置および個数を含む空キャビティ情報を、部品91を供給する前に予め記憶装置DS0に記憶させておくと良い。これにより、部品供給装置12は、ウエハ部品91Wが収容されているキャビティ81まで、キャリアテープ80をピッチ送りすることができ、ウエハ部品91Wを供給することができる。上記の例では、空キャビティ81Eの位置は、3番のキャビティ81であり、空キャビティ81Eの個数は、一つである。 In this case, the storage unit 42 may store the empty cavity information including the position and the number of the empty cavities 81E in the storage device DS0 in advance before supplying the component 91. As a result, the component supply device 12 can pitch-feed the carrier tape 80 to the cavity 81 in which the wafer component 91W is housed, and can supply the wafer component 91W. In the above example, the position of the empty cavity 81E is the third cavity 81, and the number of empty cavities 81E is one.
 なお、リールRL0の取り付け不良などによって、キャリアテープ80をピッチ送りしても、キャリアテープ80が搬送されない場合がある。また、部品91の採取ミスなどが生じたときに、作業者がキャリアテープ80を巻き戻す可能性がある。これらの場合、ウエハWF0におけるウエハ部品91Wの配列情報と、キャリアテープ80においてウエハ部品91Wが収容されているキャビティ81の位置情報とが整合しなくなる。 Note that the carrier tape 80 may not be conveyed even if the carrier tape 80 is pitch-fed due to improper installation of the reel RL0. Further, when a mistake in collecting the part 91 occurs, the operator may rewind the carrier tape 80. In these cases, the arrangement information of the wafer component 91W on the wafer WF0 and the position information of the cavity 81 in which the wafer component 91W is housed on the carrier tape 80 do not match.
 よって、キャリアテープ80には、ウエハ部品91Wを収容予定の所定のキャビティ81が空キャビティ81Eに設定されているキャリアテープ80が含まれる。この場合、空キャビティ81Eは、所定の周期で(例えば、所定数の部品91の供給ごとに)設定されていると良い。記憶部42は、空キャビティ81Eの位置および個数を含む空キャビティ情報を、部品91を供給する前に予め記憶装置DS0に記憶させておくと良い。 Therefore, the carrier tape 80 includes a carrier tape 80 in which a predetermined cavity 81 for accommodating the wafer component 91W is set in the empty cavity 81E. In this case, the empty cavity 81E may be set at a predetermined cycle (for example, for each supply of a predetermined number of parts 91). The storage unit 42 may store the empty cavity information including the position and the number of the empty cavities 81E in the storage device DS0 in advance before supplying the component 91.
 これにより、部品管理装置40は、ウエハ部品91Wの配列情報と、キャリアテープ80においてウエハ部品91Wが収容されているキャビティ81の位置情報とが整合しているか否かを定期的に確認することができる。なお、この場合も、部品供給装置12は、ウエハ部品91Wが収容されているキャビティ81まで、キャリアテープ80をピッチ送りすることができ、ウエハ部品91Wを供給することができる。 As a result, the component management device 40 can periodically check whether or not the arrangement information of the wafer component 91W and the position information of the cavity 81 in which the wafer component 91W is housed in the carrier tape 80 are consistent. it can. Also in this case, the component supply device 12 can pitch-feed the carrier tape 80 to the cavity 81 in which the wafer component 91W is housed, and can supply the wafer component 91W.
 1-2-3.判別部43
 判別部43は、キャリアテープ80をピッチ送りして部品91を順に供給する部品供給装置12が部品91を供給しているときに検出された空キャビティ情報と、記憶装置DS0に記憶されている空キャビティ情報とが一致するか否かを判別する。例えば、判別部43は、部品供給装置12が部品91を供給しているときに、基板カメラ15にキャビティ81を撮像させて、基板カメラ15によって撮像された画像に基づいて、キャビティ81が空キャビティ81Eであるか否かを判断することができる。具体的には、判別部43は、上記画像において部品91が撮像されていないときに、当該部品91を収容予定のキャビティ81が空キャビティ81Eであると判断する。
1-2-3. Discriminating unit 43
The determination unit 43 pitch-feeds the carrier tape 80 and supplies the components 91 in order. The empty cavity information detected when the component supply device 12 supplies the components 91 and the empty cavity stored in the storage device DS0. Determine if the cavity information matches. For example, the discriminating unit 43 causes the substrate camera 15 to image the cavity 81 while the component supply device 12 is supplying the component 91, and the cavity 81 is an empty cavity based on the image captured by the substrate camera 15. It can be determined whether or not it is 81E. Specifically, the discriminating unit 43 determines that the cavity 81 to accommodate the component 91 is an empty cavity 81E when the component 91 is not imaged in the above image.
 判別部43は、空キャビティ情報が一致するときに、部品供給装置12による部品91の供給を継続させ、空キャビティ情報が一致しないときに、部品供給装置12による部品91の供給を停止させる。具体的には、判別部43は、空キャビティ情報が一致したか否かを判断する(図3に示すステップS14)。空キャビティ情報が一致した場合(ステップS14でYesの場合)、判別部43は、部品供給装置12による部品91の供給を継続させる(ステップS15)。 The discrimination unit 43 continues the supply of the component 91 by the component supply device 12 when the empty cavity information matches, and stops the supply of the component 91 by the component supply device 12 when the empty cavity information does not match. Specifically, the determination unit 43 determines whether or not the empty cavity information matches (step S14 shown in FIG. 3). When the empty cavity information matches (Yes in step S14), the discriminating unit 43 continues the supply of the component 91 by the component supply device 12 (step S15).
 空キャビティ情報が一致しない場合(ステップS14でNoの場合)、判別部43は、部品供給装置12による部品91の供給を停止させる(ステップS16)。この場合、部品管理装置40は、ウエハ部品91Wの配列情報と、キャリアテープ80においてウエハ部品91Wが収容されているキャビティ81の位置情報とが整合していない旨を作業者に警告する。これにより、作業者は、キャリアテープ80の位置ずれを確認することができ、キャリアテープ80の位置ずれを修正することができる。 When the empty cavity information does not match (No in step S14), the discriminating unit 43 stops the supply of the component 91 by the component supply device 12 (step S16). In this case, the component management device 40 warns the operator that the arrangement information of the wafer component 91W and the position information of the cavity 81 in which the wafer component 91W is housed in the carrier tape 80 do not match. As a result, the operator can confirm the misalignment of the carrier tape 80 and correct the misalignment of the carrier tape 80.
 また、部品供給装置12は、判別部43によって空キャビティ情報が一致しないと判断されたときに、直近の空キャビティ81Eが採取位置PP1に到達するように、キャリアテープ80を搬送することもできる。これにより、ウエハ部品91Wの配列情報と、キャリアテープ80においてウエハ部品91Wが収容されているキャビティ81の位置情報とが整合され、キャリアテープ80の位置ずれが修正される。 Further, the component supply device 12 can also convey the carrier tape 80 so that the nearest empty cavity 81E reaches the sampling position PP1 when the determination unit 43 determines that the empty cavity information does not match. As a result, the arrangement information of the wafer component 91W and the position information of the cavity 81 in which the wafer component 91W is housed in the carrier tape 80 are matched, and the misalignment of the carrier tape 80 is corrected.
 なお、判別部43は、部品供給装置12が部品91を供給しているときに、部品カメラ14に保持部材30を撮像させて、部品カメラ14によって撮像された画像に基づいて、キャビティ81が空キャビティ81Eであるか否かを判断することもできる。具体的には、判別部43は、上記画像において部品91が撮像されていない(保持部材30が部品91を保持していない)ときに、当該部品91を収容予定のキャビティ81が空キャビティ81Eであると判断することができる。 When the component supply device 12 is supplying the component 91, the discriminating unit 43 causes the component camera 14 to image the holding member 30, and the cavity 81 is empty based on the image captured by the component camera 14. It is also possible to determine whether or not the cavity is 81E. Specifically, when the component 91 is not imaged in the above image (the holding member 30 does not hold the component 91), the discriminating unit 43 uses an empty cavity 81E for the cavity 81 to accommodate the component 91. It can be judged that there is.
 2.その他
 誤装着を防止するため、実施形態のキャリアテープ80には、特定部材SM0が収容されていない。部品供給装置12は、特定部材SM0が収容されているキャリアテープ80からウエハ部品91Wを供給することもできる。この場合、部品供給装置12は、特定部材SM0が収容されているキャビティ81が検出されたときに、ウエハ部品91Wが収容されているキャビティ81まで、キャリアテープ80をピッチ送りして、ウエハ部品91Wを供給することができる。
2. Others In order to prevent erroneous mounting, the carrier tape 80 of the embodiment does not contain the specific member SM0. The component supply device 12 can also supply the wafer component 91W from the carrier tape 80 in which the specific member SM0 is housed. In this case, when the cavity 81 containing the specific member SM0 is detected, the component supply device 12 pitch-feeds the carrier tape 80 to the cavity 81 containing the wafer component 91W, and the wafer component 91W. Can be supplied.
 また、ウエハ部品91Wについて上述されていることは、同一の製造ロットで生産された部品91についても、適用することができる。具体的には、同一の製造ロットで生産された部品91が、複数のキャリアテープ80において生産順序で収容されている場合が想定される。この場合、記憶部42は、製造ロットを識別する識別情報と、キャリアテープ80が巻回されている複数のリールRL0を識別する識別情報と、所定の生産情報とを、部品91を供給する前に予め関連付けて記憶装置DS0に記憶させておくと良い。所定の生産情報には、各キャリアテープ80に収容されている所定の部品91の生産順序が含まれる。所定の部品91は、例えば、各キャリアテープ80の先頭(1番目)のキャビティ81に収容されている部品91とすることができる。 Further, what is described above for the wafer component 91W can also be applied to the component 91 produced in the same production lot. Specifically, it is assumed that the parts 91 produced in the same production lot are housed in a plurality of carrier tapes 80 in the production order. In this case, the storage unit 42 provides the identification information for identifying the production lot, the identification information for identifying the plurality of reels RL0 around which the carrier tape 80 is wound, and the predetermined production information before supplying the component 91. It is preferable to store the information in the storage device DS0 in advance. The predetermined production information includes the production order of the predetermined parts 91 housed in each carrier tape 80. The predetermined component 91 can be, for example, a component 91 housed in the head (first) cavity 81 of each carrier tape 80.
 さらに、キャリアテープ80は、部品91を収容予定の所定のキャビティ81が空キャビティ81Eに設定されていても良い。この場合、記憶部42は、空キャビティ81Eの位置および個数を含む空キャビティ情報を、部品91を供給する前に予め記憶装置DS0に記憶させておくことができる。そして、判別部43は、部品供給装置12が部品91を供給しているときに検出された空キャビティ情報と、記憶装置DS0に記憶されている空キャビティ情報とが一致するか否かを判別することもできる。また、判別部43は、空キャビティ情報が一致するときに、部品供給装置12による部品91の供給を継続させ、空キャビティ情報が一致しないときに、部品供給装置12による部品91の供給を停止させることもできる。 Further, in the carrier tape 80, a predetermined cavity 81 for accommodating the component 91 may be set in the empty cavity 81E. In this case, the storage unit 42 can store the empty cavity information including the position and the number of the empty cavities 81E in the storage device DS0 in advance before supplying the component 91. Then, the determination unit 43 determines whether or not the empty cavity information detected when the component supply device 12 supplies the component 91 and the empty cavity information stored in the storage device DS0 match. You can also do it. Further, the discriminating unit 43 continues the supply of the component 91 by the component supply device 12 when the empty cavity information matches, and stops the supply of the component 91 by the component supply device 12 when the empty cavity information does not match. You can also do it.
 3.部品管理方法
 部品管理装置40について既述されていることは、部品管理方法についても同様に言える。具体的には、部品管理方法は、取得工程と、記憶工程とを備える。取得工程は、取得部41が行う制御に相当する。記憶工程は、記憶部42が行う制御に相当する。また、部品管理方法は、判別工程をさらに備えることができる。判別工程は、判別部43が行う制御に相当する。
3. 3. Parts management method The same applies to the parts management method described above for the parts management device 40. Specifically, the parts management method includes an acquisition process and a storage process. The acquisition process corresponds to the control performed by the acquisition unit 41. The storage step corresponds to the control performed by the storage unit 42. Further, the parts management method can further include a discrimination step. The discrimination step corresponds to the control performed by the discrimination unit 43.
 4.実施形態の効果の一例
 部品管理装置40によれば、取得部41と、記憶部42とを備えている。これにより、部品管理装置40は、供給された部品91が収容されていたキャビティ81の位置情報と、リールRL0を識別する識別情報とを関連付けて記憶装置DS0に記憶させることができる。よって、部品管理装置40の利用者は、リールRL0のキャリアテープ80から供給した部品91の中から、キャビティ81の位置情報に基づいてトレース対象の部品91を絞り込むことが容易であり、トレーサビリティが向上する。部品管理装置40について上述されていることは、部品管理方法についても同様に言える。
4. An example of the effect of the embodiment According to the parts management device 40, the acquisition unit 41 and the storage unit 42 are provided. As a result, the component management device 40 can store the position information of the cavity 81 in which the supplied component 91 is housed in the storage device DS0 in association with the identification information that identifies the reel RL0. Therefore, the user of the parts management device 40 can easily narrow down the parts 91 to be traced based on the position information of the cavity 81 from the parts 91 supplied from the carrier tape 80 of the reel RL0, and the traceability is improved. To do. The same can be said for the parts management device 40 as described above for the parts management method.
12:部品供給装置、30:保持部材、40:部品管理装置、
41:取得部、42:記憶部、43:判別部、80:キャリアテープ、
81:キャビティ、81S:特定キャビティ、81E:空キャビティ、
90:基板、91:部品、91W:ウエハ部品、DD0:機器、
DS0:記憶装置、RL0:リール、WF0:ウエハ、
RM0:基準部材、SM0:特定部材。
12: Parts supply device, 30: Holding member, 40: Parts management device,
41: Acquisition unit, 42: Storage unit, 43: Discrimination unit, 80: Carrier tape,
81: Cavity, 81S: Specific Cavity, 81E: Empty Cavity,
90: Substrate, 91: Parts, 91W: Wafer parts, DD0: Equipment,
DS0: Storage device, RL0: Reel, WF0: Wafer,
RM0: reference member, SM0: specific member.

Claims (12)

  1.  基板に装着する部品を収容しているキャビティを複数備えるキャリアテープから前記部品が順に供給されるときに、当該部品が収容されている前記キャビティの位置情報を取得する取得部と、
     前記取得部によって取得された前記キャビティの位置情報、および、前記キャリアテープが巻回されているリールを識別する識別情報を関連付けて記憶装置に記憶させる記憶部と、
    を備える部品管理装置。
    When the parts are sequentially supplied from the carrier tape having a plurality of cavities containing the parts to be mounted on the substrate, the acquisition unit for acquiring the position information of the cavities containing the parts, and the acquisition unit.
    A storage unit that stores the position information of the cavity acquired by the acquisition unit and the identification information that identifies the reel around which the carrier tape is wound in a storage device in association with each other.
    Parts management device equipped with.
  2.  前記取得部は、前記キャリアテープにおける前記部品の初期収容数と、前記キャリアテープに残存している前記部品の残存数とに基づいて、前記キャリアテープにおける前記キャビティの位置情報を取得する請求項1に記載の部品管理装置。 The acquisition unit acquires the position information of the cavity in the carrier tape based on the initial number of the parts accommodated in the carrier tape and the remaining number of the parts remaining in the carrier tape. The parts management device described in.
  3.  前記取得部は、前記キャリアテープから前記部品を供給した前記部品の供給数に基づいて、前記キャリアテープにおける前記キャビティの位置情報を取得する請求項1に記載の部品管理装置。 The parts management device according to claim 1, wherein the acquisition unit acquires position information of the cavity in the carrier tape based on the number of the parts supplied from the carrier tape.
  4.  前記記憶部は、前記部品が装着された前記基板に関する基板情報、前記部品の装着に使用された機器に関する機器情報、前記部品が保持部材によって採取され保持されているときの前記部品の保持状態に関する保持情報、および、前記部品が前記保持部材によって前記基板に装着されたときの前記部品の装着状態に関する装着情報のうちの少なくとも一つを、前記キャビティの位置情報および前記リールの識別情報と関連付けて前記記憶装置に記憶させる請求項1~請求項3のいずれか一項に記載の部品管理装置。 The storage unit relates to board information regarding the substrate on which the component is mounted, device information regarding the device used for mounting the component, and a holding state of the component when the component is collected and held by a holding member. At least one of the holding information and the mounting information regarding the mounting state of the component when the component is mounted on the substrate by the holding member is associated with the position information of the cavity and the identification information of the reel. The parts management device according to any one of claims 1 to 3, which is stored in the storage device.
  5.  前記キャリアテープは、ウエハに配列されていた前記部品であるウエハ部品を収容し、
     前記記憶部は、前記ウエハにおける前記ウエハ部品の配列情報と、前記キャリアテープにおいて前記ウエハ部品が収容されている前記キャビティの位置情報とを、前記部品を供給する前に予め関連付けて前記記憶装置に記憶させておく請求項1~請求項4のいずれか一項に記載の部品管理装置。
    The carrier tape accommodates the wafer component, which is the component arranged on the wafer.
    The storage unit associates the arrangement information of the wafer parts on the wafer with the position information of the cavity in which the wafer parts are housed in the carrier tape in advance before supplying the parts to the storage device. The parts management device according to any one of claims 1 to 4, which is stored.
  6.  前記ウエハ部品は、複数の前記キャリアテープにおいて前記ウエハにおける配列順序で収容されており、
     前記記憶部は、前記ウエハを識別する識別情報と、前記キャリアテープが巻回されている複数の前記リールを識別する識別情報と、各前記キャリアテープに収容されている所定の前記ウエハ部品の前記ウエハにおける前記配列順序を含む前記配列情報とを、前記部品を供給する前に予め関連付けて前記記憶装置に記憶させておく請求項5に記載の部品管理装置。
    The wafer parts are housed in the plurality of carrier tapes in the order of arrangement on the wafer.
    The storage unit includes identification information for identifying the wafer, identification information for identifying a plurality of reels around which the carrier tape is wound, and the predetermined wafer component housed in each carrier tape. The parts management device according to claim 5, wherein the arrangement information including the arrangement order on the wafer is stored in the storage device in advance in association with the arrangement information before supplying the parts.
  7.  前記キャリアテープは、前記ウエハに含まれる不良の前記ウエハ部品、品質が所定ランク以下の前記ウエハ部品、および、前記ウエハの基準位置を示す基準部材のうちの少なくとも一つである特定部材を収容予定の前記キャビティである特定キャビティに、前記ウエハにおける配列順序が前記特定部材より後続の前記ウエハ部品が繰り上げて収容されており、
     前記記憶部は、前記特定キャビティの位置および個数を含む特定キャビティ情報を、前記部品を供給する前に予め前記記憶装置に記憶させておく請求項5または請求項6に記載の部品管理装置。
    The carrier tape is scheduled to contain the defective wafer component contained in the wafer, the wafer component having a quality of a predetermined rank or less, and a specific member which is at least one of a reference member indicating a reference position of the wafer. In the specific cavity, which is the cavity, the wafer component following the specific member in the arrangement order of the wafer is housed in the specific cavity.
    The component management device according to claim 5 or 6, wherein the storage unit stores specific cavity information including the position and number of the specific cavities in the storage device in advance before supplying the component.
  8.  前記キャリアテープは、前記ウエハに含まれる不良の前記ウエハ部品、品質が所定ランク以下の前記ウエハ部品、および、前記ウエハの基準位置を示す基準部材のうちの少なくとも一つである特定部材を収容予定の前記キャビティである特定キャビティが空キャビティに設定されており、
     前記記憶部は、前記空キャビティの位置および個数を含む空キャビティ情報を、前記部品を供給する前に予め前記記憶装置に記憶させておく請求項5または請求項6に記載の部品管理装置。
    The carrier tape is scheduled to contain the defective wafer component contained in the wafer, the wafer component having a quality of a predetermined rank or less, and a specific member which is at least one of a reference member indicating a reference position of the wafer. The specific cavity, which is the above-mentioned cavity, is set as an empty cavity.
    The component management device according to claim 5 or 6, wherein the storage unit stores empty cavity information including the position and number of the empty cavities in the storage device in advance before supplying the component.
  9.  前記キャリアテープは、前記ウエハ部品を収容予定の所定の前記キャビティが空キャビティに設定されており、
     前記記憶部は、前記空キャビティの位置および個数を含む空キャビティ情報を、前記部品を供給する前に予め前記記憶装置に記憶させておく請求項5または請求項6に記載の部品管理装置。
    In the carrier tape, a predetermined cavity in which the wafer component is to be housed is set as an empty cavity.
    The component management device according to claim 5 or 6, wherein the storage unit stores empty cavity information including the position and number of the empty cavities in the storage device in advance before supplying the component.
  10.  前記キャリアテープをピッチ送りして前記部品を順に供給する部品供給装置が前記部品を供給しているときに検出された前記空キャビティ情報と、前記記憶装置に記憶されている前記空キャビティ情報とが一致するか否かを判別する判別部をさらに備える請求項8または請求項9に記載の部品管理装置。 The empty cavity information detected when the component supply device that feeds the carrier tape at a pitch and sequentially supplies the components supplies the components, and the empty cavity information stored in the storage device The parts management device according to claim 8 or 9, further comprising a discriminating unit for determining whether or not they match.
  11.  前記判別部は、前記空キャビティ情報が一致するときに、前記部品供給装置による前記部品の供給を継続させ、前記空キャビティ情報が一致しないときに、前記部品供給装置による前記部品の供給を停止させる請求項10に記載の部品管理装置。 When the empty cavity information matches, the discriminating unit continues the supply of the component by the component supply device, and stops the supply of the component by the component supply device when the empty cavity information does not match. The parts management device according to claim 10.
  12.  基板に装着する部品を収容しているキャビティを複数備えるキャリアテープから前記部品が順に供給されるときに、当該部品が収容されている前記キャビティの位置情報を取得する取得工程と、
     前記取得工程によって取得された前記キャビティの位置情報、および、前記キャリアテープが巻回されているリールを識別する識別情報を関連付けて記憶装置に記憶させる記憶工程と、
    を備える部品管理方法。
    When the parts are sequentially supplied from the carrier tape having a plurality of cavities containing the parts to be mounted on the substrate, the acquisition step of acquiring the position information of the cavities containing the parts, and the acquisition step.
    A storage step of associating the position information of the cavity acquired by the acquisition step with the identification information for identifying the reel around which the carrier tape is wound and storing the information in the storage device.
    Parts management method including.
PCT/JP2019/046460 2019-11-27 2019-11-27 Component management device and component management method WO2021106119A1 (en)

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