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WO2020158521A1 - Composition for forming release layer for slit die coating, and release layer - Google Patents

Composition for forming release layer for slit die coating, and release layer Download PDF

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Publication number
WO2020158521A1
WO2020158521A1 PCT/JP2020/002014 JP2020002014W WO2020158521A1 WO 2020158521 A1 WO2020158521 A1 WO 2020158521A1 JP 2020002014 W JP2020002014 W JP 2020002014W WO 2020158521 A1 WO2020158521 A1 WO 2020158521A1
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WIPO (PCT)
Prior art keywords
group
release layer
carbon atoms
formula
composition
Prior art date
Application number
PCT/JP2020/002014
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French (fr)
Japanese (ja)
Inventor
和也 進藤
江原 和也
Original Assignee
日産化学株式会社
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Filing date
Publication date
Application filed by 日産化学株式会社 filed Critical 日産化学株式会社
Priority to CN202080011017.0A priority Critical patent/CN113365742B/en
Priority to JP2020569540A priority patent/JP7459802B2/en
Priority to KR1020217026468A priority patent/KR20210121104A/en
Publication of WO2020158521A1 publication Critical patent/WO2020158521A1/en

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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D179/00Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen, with or without oxygen, or carbon only, not provided for in groups C09D161/00 - C09D177/00
    • C09D179/04Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05DPROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D1/00Processes for applying liquids or other fluent materials
    • B05D1/26Processes for applying liquids or other fluent materials performed by applying the liquid or other fluent material from an outlet device in contact with, or almost in contact with, the surface
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05DPROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D5/00Processes for applying liquids or other fluent materials to surfaces to obtain special surface effects, finishes or structures
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B37/00Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding
    • B32B37/14Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by the properties of the layers
    • B32B37/26Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by the properties of the layers with at least one layer which influences the bonding during the lamination process, e.g. release layers or pressure equalising layers
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/0008Organic ingredients according to more than one of the "one dot" groups of C08K5/01 - C08K5/59
    • C08K5/0025Crosslinking or vulcanising agents; including accelerators
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/04Oxygen-containing compounds
    • C08K5/13Phenols; Phenolates
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/16Nitrogen-containing compounds
    • C08K5/34Heterocyclic compounds having nitrogen in the ring
    • C08K5/3442Heterocyclic compounds having nitrogen in the ring having two nitrogen atoms in the ring
    • C08K5/3445Five-membered rings
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/16Nitrogen-containing compounds
    • C08K5/34Heterocyclic compounds having nitrogen in the ring
    • C08K5/3467Heterocyclic compounds having nitrogen in the ring having more than two nitrogen atoms in the ring
    • C08K5/3477Six-membered rings
    • C08K5/3492Triazines
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/16Nitrogen-containing compounds
    • C08K5/34Heterocyclic compounds having nitrogen in the ring
    • C08K5/3467Heterocyclic compounds having nitrogen in the ring having more than two nitrogen atoms in the ring
    • C08K5/3477Six-membered rings
    • C08K5/3492Triazines
    • C08K5/34922Melamine; Derivatives thereof
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/36Sulfur-, selenium-, or tellurium-containing compounds
    • C08K5/41Compounds containing sulfur bound to oxygen
    • C08K5/42Sulfonic acids; Derivatives thereof
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L33/00Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides or nitriles thereof; Compositions of derivatives of such polymers
    • C08L33/04Homopolymers or copolymers of esters
    • C08L33/14Homopolymers or copolymers of esters of esters containing halogen, nitrogen, sulfur, or oxygen atoms in addition to the carboxy oxygen
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L33/00Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides or nitriles thereof; Compositions of derivatives of such polymers
    • C08L33/04Homopolymers or copolymers of esters
    • C08L33/14Homopolymers or copolymers of esters of esters containing halogen, nitrogen, sulfur, or oxygen atoms in addition to the carboxy oxygen
    • C08L33/16Homopolymers or copolymers of esters containing halogen atoms
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L79/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
    • C08L79/04Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D5/00Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
    • C09D5/008Temporary coatings

Definitions

  • the present invention relates to a release layer forming composition for a slit die coat and a release layer.
  • an active matrix full-color TFT display panel that uses a lightweight flexible plastic substrate (hereinafter also referred to as a resin substrate).
  • a material corresponding to flexibility such as a transparent electrode and a resin substrate of a touch panel used in combination with a display panel.
  • the transparent electrode other transparent electrode materials such as a transparent conductive polymer that can be bent such as PEDOT, metal nanowires and a mixed system thereof have been proposed as the transparent electrode (Patent Documents 1 to 4). ..
  • the base material of the touch panel film is also made of glass or a sheet made of plastic such as polyethylene terephthalate (PET), polyimide, cycloolefin, or acrylic, and a transparent flexible touch screen panel having flexibility has been developed ( Patent Documents 5 to 7).
  • a peeling layer (adhesive layer) is formed on a supporting substrate such as a glass substrate, a device is formed on the peeling layer, and then peeling is performed.
  • a peeling layer Is manufactured in Japan (Patent Document 8). This peeling layer must not be peeled from the supporting substrate during the process, but a low peeling force is required when peeling.
  • the slit die coating method has been used in the production line from the viewpoints of the suppression of use of the coating liquid and the productivity accompanying the simplification of the process (Patent Documents 9 and 10).
  • This method unlike the spin coating method, contains a large number of solvents after film formation, and thus requires a vacuum drying process. This process is carried out between the coating treatment and the heat treatment, and is essential for stabilizing the unstable film immediately after coating.
  • uneven coating occurs due to the influence of the residual solvent due to the reduced pressure, it was necessary to improve this uneven coating.
  • An object of the present invention is to provide a composition for forming a release layer for slit die coating, which can provide a release layer having a release property.
  • the present inventors have conducted extensive studies to achieve the above-mentioned object, and as a result, (A) polyurea containing a predetermined repeating unit, (B) an acid compound or a salt thereof, (C) a hydroxyalkyl group and/or an alkoxy. Contains a cross-linking agent selected from compounds having a nitrogen atom substituted with a methyl group, (D) a polymer additive containing a predetermined repeating unit, and (E) a solvent having a vapor pressure at 20° C. of 800 Pa or less.
  • the composition for forming a release layer is excellent as a composition for slit die coating, and it is possible to give a release layer having excellent adhesion to a substrate, appropriate adhesion to a resin substrate and release property with good reproducibility. Heading, the present invention was completed.
  • the present invention provides the following composition for forming a release layer for slit die coating and a release layer.
  • a polyurea containing a repeating unit represented by the following formula (1) (B) an acid compound or a salt thereof, (C) a cross-linking agent selected from compounds having a nitrogen atom substituted with a hydroxyalkyl group and/or an alkoxymethyl group, (D) A polymer additive containing a repeating unit represented by the following formula (a1), a repeating unit represented by the following formula (b) and a repeating unit represented by the following formula (c), and (E) 20 Including a solvent containing at least one solvent having a vapor pressure at 800° C.
  • a 1 , A 2 , A 3 , A 4 , A 5 and A 6 are each independently a hydrogen atom, a methyl group or an ethyl group
  • X 1 is a group represented by the following formula (1-1), (1-2), (1-3) or (1-4)
  • R 1 and R 2 are each independently a hydrogen atom, an alkyl group having 1 to 6 carbon atoms, an alkenyl group having 3 to 6 carbon atoms, a benzyl group or a phenyl group, and the phenyl group is a carbon atom.
  • R 1 and R 2 may combine with each other to form a ring having 3 to 6 carbon atoms together with the carbon atom to which they are bonded, and R 3 has 1 to 6 carbon atoms.
  • Q 1 is a group represented by the following formula (1-5) or (1-6).
  • X 2 is a group represented by the formula (1-1), the formula (1-2) or the formula (1-4), and Q 2 is an alkylene group having 1 to 10 carbon atoms, or phenylene.
  • Q 2 is an alkylene group having 1 to 10 carbon atoms, or phenylene.
  • R A is each independently a hydrogen atom or a methyl group
  • R B1 is a branched alkyl group having 3 or 4 carbon atoms in which at least one hydrogen atom is substituted with a fluorine atom
  • R C is a hydroxyalkyl group having 1 to 10 carbon atoms
  • R D is a polycyclic alkyl group having 6 to 20 carbon atoms or an aryl group having 6 to 12 carbon atoms.
  • R C is a hydroxyalkyl group having 2 to 10 carbon atoms, and the carbon atom to which the hydroxy group is bonded is a secondary carbon atom.
  • the content of the repeating unit represented by the formula (a1) is 30 mol% or more based on all repeating units of the polymer additive (D).
  • the crosslinking agent (C) is a compound represented by any of the following formulas (C-1) to (C-7).
  • R 11 to R 38 are each independently a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, and R 39 is a hydrogen atom or a methyl group.
  • Manufacture of a resin substrate including a step of forming a resin substrate having a light transmittance of 400% at a wavelength of 400% or more on the peeling layer, and peeling the resin substrate with a peeling force of 0.15 N/25 mm or less Method.
  • the composition for forming a release layer for slit die coating of the present invention By using the composition for forming a release layer for slit die coating of the present invention, coating unevenness does not occur, excellent adhesion to the substrate, a suitable adhesion to the resin substrate and a release layer having a suitable releasability. It can be obtained with good reproducibility. Further, in the process of manufacturing a flexible electronic device, it is possible to separate the resin substrate from the base body together with the circuit and the like without damaging the resin substrate formed on the base body or a circuit or the like provided thereon. It will be possible. Therefore, the composition for forming a release layer for a slit die coat of the present invention can contribute to speeding up the manufacturing process of a flexible electronic device including a resin substrate, improving its yield, and the like.
  • composition for forming a release layer for slit die coating of the present invention is substituted with (A) a polyurea containing a predetermined repeating unit, (B) an acid compound or a salt thereof, (C) a hydroxyalkyl group and/or an alkoxymethyl group. It contains a crosslinking agent selected from compounds having a nitrogen atom, (D) a polymer additive containing a predetermined repeating unit, and (E) a solvent.
  • the polyurea as the component (A) contains a repeating unit represented by the following formula (1).
  • a 1 , A 2 , A 3 , A 4 , A 5 and A 6 are each independently a hydrogen atom, a methyl group or an ethyl group, but from the viewpoint of releasability and productivity, All of A 1 to A 6 are preferably hydrogen atoms.
  • X 1 is a group represented by the following formula (1-1), (1-2), (1-3) or (1-4).
  • R 1 and R 2 are each independently a hydrogen atom, an alkyl group having 1 to 6 carbon atoms, an alkenyl group having 3 to 6 carbon atoms, a benzyl group or phenyl.
  • the phenyl group is a group consisting of an alkyl group having 1 to 6 carbon atoms, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, a nitro group, a cyano group, a hydroxy group and an alkylthio group having 1 to 6 carbon atoms. It may be substituted with at least one group selected from the following, and R 1 and R 2 may be bonded to each other to form a ring having 3 to 6 carbon atoms together with the carbon atom to which they are bonded.
  • R 3 is an alkyl group having 1 to 6 carbon atoms, an alkenyl group having 3 to 6 carbon atoms, a benzyl group or a phenyl group, and the phenyl group is an alkyl group having 1 to 6 carbon atoms. It may be substituted with at least one group selected from the group consisting of a group, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, a nitro group, a cyano group, a hydroxy group and an alkylthio group having 1 to 6 carbon atoms.
  • Q 1 is a group represented by the following formula (1-5) or (1-6).
  • X 2 is a group represented by formula (1-1), formula (1-2) or formula (1-4).
  • formula (1-5 for example, when X 2 is a group represented by the formula (1-2), its structure is represented by the following formula (1-5-1). (In the formula, R 1 and R 2 are the same as above.)
  • Q 2 is an alkylene group having 1 to 10 carbon atoms, a phenylene group, a naphthylene group or an anthrylene group.
  • the phenylene group, naphthylene group and anthrylene group include an alkyl group having 1 to 6 carbon atoms, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, a nitro group, a cyano group, a hydroxy group and an alkylthio group having 1 to 6 carbon atoms.
  • Q 2 is a phenylene group, a naphthylene group or an anthrylene group
  • the position of their bond is not particularly limited. That is, for example, when the phenylene group is bonded at the 1-position and 2-position, when it is bonded at the 1-position and 3-position, or when it is bonded at the 1-position and 4-position, the naphthylene group is 1 When bonded at position 2 and position, bonded at position 1 and position 4, bonded at position 1 and position 5 or bonded at position 2 and position 3, the anthrylene group is There may be a bond at the 1-position and the 2-position, a bond at the 1-position and the 4-position, a bond at the 9-position and the 10-position, etc.
  • the alkyl group having 1 to 6 carbon atoms may be linear, branched or cyclic, and examples thereof include a methyl group, an ethyl group, an isopropyl group, an n-butyl group and a cyclohexyl group.
  • the alkenyl group having 3 to 6 carbon atoms may be linear, branched or cyclic, and examples thereof include a 2-propenyl group and a 3-butenyl group.
  • the alkoxy group having 1 to 6 carbon atoms may be linear, branched or cyclic, and examples thereof include a methoxy group, an ethoxy group, an isopropoxy group, an n-pentyloxy group and a cyclohexyloxy group. ..
  • the alkylthio group having 1 to 6 carbon atoms may be linear, branched or cyclic, and examples thereof include a methylthio group, an ethylthio group, an isopropylthio group, an n-pentylthio group and a cyclohexylthio group.
  • halogen atom examples include a fluorine atom, a chlorine atom, a bromine atom and an iodine atom.
  • examples of the ring having 3 to 6 carbon atoms formed by combining R 1 and R 2 include a cyclobutane ring, a cyclopentane ring, a cyclohexane ring and the like.
  • the alkylene group having 1 to 10 carbon atoms may be linear, branched or cyclic and includes, for example, methylene group, ethylene group, propylene group, pentamethylene group, cyclohexylene group, 2-methylpropylene group and the like. Are listed.
  • Q 1 preferably contains a cyclic structure from the viewpoint of heat resistance of the polyurea as the component (A). That is, Q 1 is a group represented by the formula (1-5) or a group represented by the formula (1-6), and Q 2 is a cyclic alkylene group, a phenylene group, a naphthylene group or an anthrylene group. Is preferred, and a group represented by formula (1-5) is more preferred.
  • the component (A) polyurea can be synthesized with reference to, for example, International Publication No. 2005/098542.
  • the weight average molecular weight (Mw) of (A) polyurea is preferably from 1,000 to 200,000, more preferably from 3,000 to 100,000, even more preferably from 4,000 to 30,000, and from 5,000 to 20,000 is more preferable.
  • the dispersity (Mw/Mn) thereof is preferably 1.3 to 4.0, more preferably 1.4 to 2.5.
  • Mn is a number average molecular weight and Mw and Mn are polystyrene conversion measurement values by gel permeation chromatography (GPC).
  • the composition for forming a release layer of the present invention contains an acid compound or a salt thereof as the component (B).
  • the acid compound include p-toluenesulfonic acid, trifluoromethanesulfonic acid, pyridinium-p-toluenesulfonate, salicylic acid, camphorsulfonic acid, sulfosalicylic acid, 4-chlorobenzenesulfonic acid, 4-hydroxybenzenesulfonic acid, benzenedisulfonic acid, Examples thereof include sulfonic acid compounds such as 1-naphthalene sulfonic acid, and carboxylic acid compounds such as salicylic acid, sulfosalicylic acid, citric acid, benzoic acid, and hydroxybenzoic acid.
  • Examples of the salt of the acid compound include pyridinium salt, isopropanolamine salt, N-methylmorpholine salt and the like of the acid, and specific examples thereof include pyridinium p-toluenesulfonate, pyridinium 1-naphthalenesulfonate, and isopropanol. Examples thereof include amine p-toluene sulfonate and N-methylmorpholine p-toluene sulfonate.
  • the content of the component (B) is preferably 0.01 to 30 parts by mass, and more preferably 0.1 to 20 parts by mass, relative to 100 parts by mass of the polyurea of the component (A).
  • the acid compound (B) or a salt thereof may be used alone or in combination of two or more.
  • the composition for forming a release layer of the present invention contains a crosslinking agent as the component (C).
  • the cross-linking agent is selected from compounds having a nitrogen atom substituted with a hydroxyalkyl group and/or an alkoxymethyl group.
  • crosslinking agent compounds represented by any of the following formulas (C-1) to (C-7) are preferable.
  • R 11 to R 38 are each independently a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, preferably an alkyl group having 1 to 6 carbon atoms.
  • R 39 is a hydrogen atom or a methyl group.
  • cross-linking agent examples include hexamethylolmelamine, tetramethylolbenzoguanamine, 1,3,4,6-tetramethylolglycoluril, hexamethoxymethylmelamine, tetramethoxymethylbenzoguanamine, 1,3,4,6-tetrakis( Examples thereof include nitrogen-containing compounds such as methoxymethyl)glycoluril, 1,3,4,6-tetrakis(butoxymethyl)glycoluril, and 1,3,4,6-tetrakis(hydroxymethyl)glycoluril.
  • Ornex Co. methoxymethyl type melamine compound (trade name Cymel (registered trademark) 300, Cymel 301, Cymel 303, Cymel 350), butoxymethyl type melamine compound (trade name Mycoat (registered trademark) 506, Mycoat 508), glycoluril compound (trade name Cymel 1170, POWDERLINK 1174), methylated urea resin (trade name UFR65), butylated urea resin (trade names UFR300, U-VAN10S60, U-VAN10R, U-VAN11HV), Commercially available nitrogen-containing compounds such as urea/formaldehyde resin (trade name: Beckamine (registered trademark) J-300S, Beckamine P-955, Beckamine N) manufactured by DIC Corporation can be used.
  • urea/formaldehyde resin (trade name: Beckamine (registered trademark) J-300S, Beckamine P-955, Beckamine N) manufactured by DIC Corporation can be used.
  • cross-linking agent 3,3'-5,5'-tetrakis(methoxymethyl)-[1,1'-biphenyl]-4,4'-diol, 5,5'-(1-methylethylidene)bis
  • aromatic ring compounds such as [2-hydroxy-1,3-benzenedimethanol].
  • a hydroxymethyl group or an alkoxymethyl group such as N-hydroxymethyl(meth)acrylamide, N-methoxymethyl(meth)acrylamide, N-ethoxymethyl(meth)acrylamide, N-butoxymethyl(meth)acrylamide, etc.
  • a polymer produced using a (meth)acrylamide compound substituted with can be used. Examples of such a polymer include poly(N-butoxymethyl(meth)acrylamide), a copolymer of N-butoxymethyl(meth)acrylamide and styrene, N-hydroxymethyl(meth)acrylamide and methyl(meth).
  • Copolymer with acrylate Copolymer with N-ethoxymethylmethacrylamide and benzyl methacrylate
  • Copolymer with N-butoxymethyl (meth)acrylamide Copolymer with benzyl (meth)acrylate and 2-hydroxypropyl (meth)acrylate, etc.
  • the crosslinking agent is hexamethoxymethylmelamine, tetramethoxymethylbenzoguanamine, 1,3,4,6-tetrakis(methoxymethyl)glycoluril (POWDERLINK 1174), 1,3,4,6-tetrakis(butoxymethyl). ) Glycoluril, 1,3,4,6-tetrakis(hydroxymethyl)glycoluril.
  • cross-linking agents can cause a cross-linking reaction by self-condensation. Further, it can cause a crosslinking reaction with the hydroxy group in the polyurea as the component (A). Then, by such a crosslinking reaction, the peeling layer formed becomes strong and becomes a peeling layer having low solubility in an organic solvent.
  • the content of the component (C) is preferably 10 to 100 parts by mass, more preferably 20 to 50 parts by mass, relative to 100 parts by mass of the polyurea of the component (A).
  • the (C) crosslinking agent may be used alone or in combination of two or more kinds.
  • the release layer-forming composition of the present invention is represented by the repeating unit represented by the following formula (a1), the repeating unit represented by the following formula (b), and the following formula (c) as the component (D). It includes a polymeric additive containing repeating units.
  • R A's are each independently a hydrogen atom or a methyl group.
  • R B1 is a branched alkyl group having 3 or 4 carbon atoms in which at least one hydrogen atom is substituted with a fluorine atom.
  • R C is a hydroxyalkyl group having 1 to 10 carbon atoms.
  • R D is a polycyclic alkyl group having 6 to 20 carbon atoms or an aryl group having 6 to 12 carbon atoms.
  • Examples of the branched alkyl group having 3 or 4 carbon atoms include isopropyl group, isobutyl group, sec-butyl group and tert-butyl group.
  • R B1 is preferably one in which at least one hydrogen atom of these branched alkyl groups is substituted with a fluorine atom, and specific examples include a 1,1,1-trifluoroisopropyl group, 1,1,1, Examples thereof include a 3,3,3-hexafluoroisopropyl group and a nonafluorotert-butyl group.
  • hydroxyalkyl group having 1 to 10 carbon atoms examples include hydroxymethyl group, 2-hydroxyethyl group, 3-hydroxypropyl group, 4-hydroxybutyl group, 5-hydroxypentyl group, 6-hydroxyhexyl group and 7-hydroxy group.
  • Examples of the polycyclic alkyl group having 6 to 20 carbon atoms include 1-adamantyl group, 2-adamantyl group, isobornyl group and norbornyl group.
  • Examples of the aryl group having 6 to 12 carbon atoms include phenyl group, 1-naphthyl group, 2-naphthyl group, 1-biphenylyl group and 2-biphenylyl group.
  • the polymer additive (D) includes a repeating unit represented by the following formula (a2), a repeating unit represented by the following formula (b), a repeating unit represented by the following formula (c), and a following formula ( It may contain a repeating unit represented by d).
  • R A , R C and R D are the same as above.
  • R B2 is a branched alkyl group having 3 or 4 carbon atoms in which at least one hydrogen atom is substituted with a fluorine atom (provided that 2-methyl-1,1,1,3,3,3-hexafluoro). Excluding isopropyl group.).
  • Examples of the branched alkyl group having 3 or 4 carbon atoms include the same ones as described above.
  • R E is a single bond, a polycyclic alkylene group having 6 to 20 carbon atoms or an arylene group having 6 to 12 carbon atoms.
  • R F is a single bond or an alkylene group having 1 to 10 carbon atoms.
  • R G is a methyl group, an ethyl group or a hydroxy group.
  • Examples of the polycyclic alkylene group having 6 to 20 carbon atoms include groups obtained by removing one hydrogen atom from the above-mentioned specific examples of polycyclic alkyl groups having 6 to 20 carbon atoms, and examples thereof include an adamantylene group, Examples thereof include an isobornylene group and a norbornylene group.
  • Examples of the arylene group having 6 to 12 carbon atoms include a group obtained by removing one hydrogen atom from the specific examples of the aryl group having 6 to 12 carbon atoms described above, and examples thereof include a phenylene group, a naphthylene group and a biphenylylene group. Can be mentioned.
  • alkylene group having 1 to 10 carbon atoms are the same as those exemplified in the description of Q 2 .
  • an alkylene group having 1 to 5 carbon atoms is preferable, a methylene group and an ethylene group are more preferable, and a methylene group is even more preferable.
  • repeating unit represented by the formula (a1) or (a2) examples include, but are not limited to, those represented by the following formulas (a-1) to (a-3).
  • R A is the same as above.
  • repeating unit represented by the formula (b) examples include, but are not limited to, those represented by the following formulas (b-1) to (b-16).
  • R A is the same as above.
  • repeating unit represented by the formula (c) examples include, but are not limited to, those represented by the following formulas (c-1) to (c-13).
  • R A is the same as above.
  • repeating unit represented by the formula (d) examples include, but are not limited to, those represented by the following formulas (d-1) to (d-8).
  • R A is the same as above.
  • the polymer additive (D) contains a repeating unit represented by the formula (a1), a repeating unit represented by the formula (b) and a repeating unit represented by the formula (c),
  • the content of the repeating unit represented by the formula (a1) is In all the repeating units, 30 to 60 mol% is preferable, and 35 to 50 mol% is more preferable.
  • the content of the repeating unit represented by the formula (b) is preferably 10 to 35 mol% and more preferably 15 to 30 mol% in all repeating units.
  • the content of the repeating unit represented by the formula (c) is preferably 5 to 60 mol% and more preferably 20 to 50 mol% in all repeating units.
  • the polymer additive (D) contains a repeating unit represented by the formula (a1), a repeating unit represented by the formula (b) and a repeating unit represented by the formula (c),
  • the content of the repeating unit represented by the formula (a1) is , 15 to 60 mol% is preferable, 25 to 60 mol% is more preferable, 30 to 60 mol% is much more preferable, and 35 to 50 mol% is further preferable.
  • the content of the repeating unit represented by the formula (b) is preferably from 8 to 38 mol%, more preferably from 10 to 38 mol%, further preferably from 10 to 35 mol%, more preferably from 15 to 30 mol%, based on all repeating units. Is even more preferable.
  • the content of the repeating unit represented by the formula (c) is preferably from 2 to 77 mol%, more preferably from 2 to 65 mol%, even more preferably from 5 to 60 mol%, and further preferably from 20 to 50, based on all repeating units. More preferred is mol %.
  • the polymer additive is represented by the repeating unit represented by the formula (a2), the repeating unit represented by the formula (b), the repeating unit represented by the formula (c), and the formula (d).
  • the content of the repeating unit represented by the formula (a2) is preferably from 2 to 45 mol%, more preferably from 5 to 35 mol%, based on all repeating units.
  • the content of the repeating unit represented by the formula (b) is preferably 20 to 35 mol% and more preferably 25 to 35 mol% in all repeating units.
  • the content of the repeating unit represented by the formula (c) is preferably 30 to 45 mol% and more preferably 35 to 45 mol% in all repeating units.
  • the content of the repeating unit represented by the formula (d) is preferably 5 to 18 mol% and more preferably 5 to 15 mol% in all repeating units.
  • the Mw of the polymer additive is preferably 2,000 to 10,000, more preferably 3,000 to 8,000.
  • the Mw/Mn thereof is preferably 1.0 to 2.1, more preferably 1.0 to 1.9.
  • the content of the polymer additive of the component (D) is 3 to 100 parts by mass with respect to 100 parts by mass of the polyurea of the component (A), more preferably 3 to 80 parts by mass, and 3 to 50 parts by mass. Even more preferable. If the content of the polymer additive is less than 3 parts by mass, the peeling force may increase, and if it exceeds 100 parts by mass, it may repel during film formation.
  • the polymer additives (D) may be used alone or in combination of two or more.
  • the composition for forming a release layer of the present invention contains a solvent as the component (E).
  • the solvent is preferably a glycol ether solvent having 3 to 20 carbon atoms, an ester solvent having 3 to 20 carbon atoms, a ketone solvent having 3 to 20 carbon atoms, or a cyclic compound solvent having 3 to 20 carbon atoms.
  • glycol ether solvent propylene glycol monomethyl ether (PGME), propylene glycol monomethyl ether acetate (PGMEA), propylene glycol monoethyl ether, propylene glycol monoethyl ether acetate, propylene glycol monopropyl ether, propylene glycol monobutyl ether, ethylene Glycol monomethyl ether, ethylene glycol dimethyl ether, ethylene glycol diethyl ether, ethylene glycol monomethyl ether acetate, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol dimethyl ether (Diglyce), diethylene glycol diethyl ether, diethylene glycol monohexyl ether, diethylene glycol butyl methyl ether, triethylene Glycol monomethyl ether, triethylene glycol dimethyl ether (Triglyme), diethylene glycol monobutyl ether, diethylene glycol ethyl methyl ether, diethylene glycol
  • ester solvent examples include ethyl acetate, butyl acetate, methoxybutyl acetate, amyl acetate, isopropyl acetate, methyl lactate, ethyl lactate (EL), butyl lactate, methyl 2-hydroxyisobutyrate, ethyl 2-hydroxyisobutyrate, and 3 -Ethyl ethoxypropionate and the like can be mentioned.
  • ketone solvent examples include methyl ethyl ketone, methyl propyl ketone, methyl isobutyl ketone, diisobutyl ketone, diacetone alcohol, cyclohexanone and cyclopentanone.
  • Examples of the solvent for the cyclic compound include tetrahydrofuran, 1,4-dioxane, 1,3-dioxolane, 2-pyrrolidone, N-methylpyrrolidone (NMP), N-ethylpyrrolidone (NEP) and 1,3-dimethyl-2-imidazo.
  • Examples thereof include ridinone (DMI) and ⁇ -butyrolactone (GBL).
  • the component (E) solvent contains at least one solvent having a vapor pressure at 20° C. of 800 Pa or less.
  • the vapor pressure of the solvent is preferably 700 Pa or less, more preferably 600 Pa or less, from the viewpoint of volatility during reduced pressure drying.
  • the lower limit of the vapor pressure is not particularly limited, but is usually 0.1 Pa or higher, preferably 0.5 Pa or higher.
  • the solvent having a vapor pressure of 800 Pa or less those having a vapor pressure of 800 Pa or less are preferable among the above-mentioned solvents.
  • Examples of such a solvent include PGMEA, propylene glycol monoethyl ether acetate, propylene glycol monobutyl ether, ethylene glycol diethyl ether, ethylene glycol monomethyl ether acetate, diethylene glycol monomethyl ether, Diglyme, diethylene glycol diethyl ether, ethylene glycol butyl methyl ether, Triglyme, Diethylene glycol dibutyl ether, diethylene glycol ethyl methyl ether, diethylene glycol isopropyl methyl ether, dimethoxytetraethylene glycol, dipropylene glycol methyl ether, dipropylene glycol dimethyl ether, DEGEEA, methoxymethyl butanol, triethylene glycol butyl methyl ether, EL, butyl lactate, 2- Methyl hydroxyisobutyrate, ethyl 2-hydroxyisobutyrate, ethyl 3-ethoxypropionate, diacetone alcohol
  • the content of the solvent having a vapor pressure of 800 Pa or less at 20° C. is preferably 1 to 99.9% by mass, more preferably 1 to 90% by mass in the composition of the present invention from the viewpoint of nonvolatility during drying under reduced pressure. It is more preferably 5 to 80% by mass.
  • the content of the solvent (E) is preferably such that the solid content concentration in the release layer-forming composition of the present invention is 0.1 to 40% by mass, and more preferably 0.5 to 20% by mass. An amount of 0.5 to 10% by mass is more preferable.
  • the solid content is a general term for components other than the solvent among all components of the composition for forming a release layer.
  • the solvent may be used alone or in combination of two or more.
  • the release layer-forming composition of the present invention may contain a surfactant, if necessary. By adding the surfactant, the coating property of the release layer-forming composition on the substrate can be improved.
  • a surfactant known surfactants such as nonionic surfactants, fluorine-based surfactants and silicone-based surfactants can be used.
  • nonionic surfactant examples include polyoxyethylene alkyl ethers such as polyoxyethylene lauryl ether, polyoxyethylene stearyl ether, polyoxyethylene cetyl ether, and polyoxyethylene oleyl ether; polyoxyethylene octyl.
  • Polyoxyethylene alkylaryl ethers such as phenyl ether and polyoxyethylene nonylphenyl ether; polyoxyethylene/polyoxypropylene block copolymers; sorbitan monolaurate, sorbitan monopalmitate, sorbitan monostearate, sorbitan monooleate, Sorbitan fatty acid esters such as sorbitan trioleate and sorbitan tristearate; polyoxyethylene sorbitan monolaurate, polyoxyethylene sorbitan monopalmitate, polyoxyethylene sorbitan monostearate, polyoxyethylene sorbitan trioleate, polyoxyethylene sorbitan Examples thereof include polyoxyethylene sorbitan fatty acid esters such as tristearate.
  • fluorine-based surfactants examples include Ftop (registered trademark) EF301, EF303, EF352 (manufactured by Mitsubishi Materials Electronic Chemicals Co., Ltd.), Megafac (registered trademark) F171, F173, F554, F559, F563, R- 30, R-40, R-40-LM, DS-21 (manufactured by DIC Corporation), FLUORAD (registered trademark) FC430, FC431 (manufactured by 3M), Asahi Guard (registered trademark) AG710, Surflon (registered trademark) Examples thereof include S-382, SC101, SC102, SC103, SC104, SC105, SC106 (manufactured by Asahi Glass Co., Ltd.).
  • silicone-based surfactant examples include organosiloxane polymer KP341 (manufactured by Shin-Etsu Chemical Co., Ltd.) and the like.
  • composition for forming a release layer contains a surfactant
  • the content thereof is preferably 0.0001 to 1 part by mass, and 0.001 to 0.5 part by mass, relative to 100 parts by mass of (A) polyurea. More preferable.
  • the surfactants may be used alone or in combination of two or more.
  • composition for forming release layer for slit die coat The method for preparing the composition for forming a release layer for slit die coating of the present invention is not particularly limited.
  • a preparation method for example, a solution of the component (A) dissolved in a solvent is mixed with the components (B), (C), (D) and (E) at a predetermined ratio to form a uniform solution. And a method in which other additives are further added and mixed at an appropriate stage of the above-mentioned preparation method, if necessary.
  • the solution of the specific copolymer (polymer) obtained by the polymerization reaction in the solvent can be used as it is.
  • the component (A), the component (B), the component (C), the component (D), and the component (E) are added to the solution as described above to form a uniform solution.
  • a solvent may be additionally added for the purpose of adjusting the concentration.
  • the solvent used in the production process of the component (A) and the solvent used for adjusting the concentration of the release layer-forming composition may be the same or different.
  • the prepared solution of the composition for forming a release layer after filtering it with a filter having a pore size of about 0.2 ⁇ m.
  • the viscosity of the release layer-forming composition of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, etc., but in particular, a film having a thickness of about 0.01 to 5 ⁇ m can be reproducibly obtained.
  • it is usually about 1 to 5,000 mPa ⁇ s at 25° C., preferably about 1 to 2,000 mPa ⁇ s.
  • the viscosity is measured using a commercially available liquid viscometer for measuring the viscosity of the composition for forming the release layer at a temperature of 25° C., for example, by referring to the procedure described in JIS K7117-2. can do.
  • a conical plate type (cone plate type) rotational viscometer is used as the viscometer, and 1°34′ ⁇ R24 is preferably used as a standard cone rotor with the same type of viscometer, and a composition for forming a peeling layer is used. It can be measured under the condition that the temperature of the object is 25°C.
  • An example of such a rotational viscometer is TVE-25L manufactured by Toki Sangyo Co., Ltd.
  • the composition for forming a release layer for slit die coat of the present invention is applied to a substrate by a slit die coater using a slit die coater and then baked at 180 to 250°C. It is possible to obtain a release layer having an adhesiveness, an appropriate adhesiveness with a resin substrate, and an appropriate releasability.
  • the heating time cannot be specified because it depends on the heating temperature, but it is usually 1 minute to 5 hours.
  • the firing temperature may include a step of firing at a temperature lower than the maximum temperature as long as it falls within the above range.
  • a preferable example of the heating mode in the present invention is a mode in which after heating at 50 to 150° C. for 1 minute to 1 hour, the heating temperature is raised as it is and heating at 180 to 250° C. for 5 minutes to 4 hours.
  • a more preferable example of the heating mode is a mode in which heating is performed at 50 to 150° C. for 1 minute to 1 hour, and heating is performed at 200 to 250° C. for 5 minutes to 2 hours.
  • the release layer of the present invention When the release layer of the present invention is formed on a substrate, the release layer may be formed on a partial surface of the substrate or may be formed on the entire surface.
  • the mode of forming the release layer on a part of the surface of the substrate is such that the release layer is formed only in a predetermined range on the surface of the substrate, or the release layer is formed in a pattern such as a dot pattern or a line and space pattern on the entire surface of the substrate.
  • the substrate means a substrate whose surface is coated with the composition for forming a release layer, which is used for manufacturing a flexible electronic device or the like.
  • the substrate examples include glass, metal (silicon wafer, etc.), slate, and the like.
  • the release layer obtained from the release layer-forming composition of the present invention has sufficient adhesion to it. Glass is preferable because it has.
  • the surface of the substrate may be made of a single material or may be made of two or more materials. As a mode in which the substrate surface is composed of two or more materials, a certain range of the substrate surface is composed of a certain material, and the remaining surface is composed of another material. , A pattern-like material such as a line-and-space pattern exists in another material.
  • Examples of equipment used for heating include hot plates and ovens.
  • the heating atmosphere may be under air or under an inert gas, and may be under normal pressure or under reduced pressure.
  • the thickness of the release layer is usually about 0.01 to 50 ⁇ m, preferably about 0.01 to 20 ⁇ m, more preferably about 0.01 to 5 ⁇ m from the viewpoint of productivity, and the thickness of the coating film before heating. To achieve the desired thickness.
  • the release layer of the present invention has excellent adhesion to a substrate, particularly a glass substrate, and appropriate adhesion to a resin substrate and appropriate release properties. Therefore, the peeling layer of the present invention is used for peeling the resin substrate together with the circuit and the like formed on the resin substrate from the substrate in the manufacturing process of the flexible electronic device without damaging the resin substrate of the device. Can be suitably used.
  • composition for forming a release layer for slit die coating of the present invention is used to form a release layer on a glass substrate by the method described above.
  • a resin substrate fixed on a glass substrate via the release layer of the present invention by applying a resin substrate forming solution for forming a resin substrate on the release layer and baking the resulting coating film. To form.
  • the baking temperature of the coating film is appropriately set according to the type of resin, etc., but in the present invention, the maximum temperature during baking is preferably 200 to 250° C., and 210 to 250° C. It is more preferable that the temperature is 220 to 240° C.
  • the maximum temperature during firing during the production of the resin substrate is preferably 200 to 250° C., and 210 to 250° C. It is more preferable that the temperature is 220 to 240° C.
  • the resin substrate covers the release layer entirely, and the resin substrate is formed in an area larger than the area of the release layer.
  • the resin substrate include a resin substrate made of an acrylic polymer and a resin substrate made of a cycloolefin polymer.
  • the resin substrate may be formed by a conventional method.
  • the resin substrate preferably has a light transmittance of 80% or more at a wavelength of 400 nm.
  • a desired circuit is formed, if necessary, on the resin substrate fixed to the substrate via the release layer of the present invention, and then the resin substrate is cut along the release layer, for example.
  • the resin substrate is separated from the release layer to separate the resin substrate and the base body.
  • a part of the substrate may be cut together with the release layer.
  • the release layer of the present invention the resin substrate can be released from the release layer with a release force of 0.15 N/25 mm or less, particularly 0.1 N/25 mm or less.
  • PGME Propylene glycol monomethyl ether
  • PGMEA Propylene glycol monomethyl ether acetate (vapor pressure 500 Pa)
  • EL Ethyl lactate (vapor pressure 279 Pa)
  • GBL ⁇ -butyrolactone (vapor pressure 150 Pa)
  • DEGEEA Diethylene glycol monoethyl ether acetate (vapor pressure 6 Pa)
  • Triglyme Triethylene glycol dimethyl ether (vapor pressure 120 Pa)
  • Diglyme Diethylene glycol dimethyl ether (vapor pressure 330 Pa)
  • PL-LI 1,3,4,6-tetrakis(methoxyethyl)glycoluril (manufactured by Ornex, trade name: POWDERLINK 1174)
  • PPTS pyridinium p-toluenesulfonate
  • IBXA isobornyl methacrylate
  • HPMA 2-hydroxypropyl methacrylate
  • the weight average molecular weight (Mw) of the polymer is measured by a GPC device manufactured by JASCO Corporation (column: Shodex (registered trademark) KD801 and KD805 (manufactured by Showa Denko KK); eluent: dimethylformamide/LiBr. H 2 O (29.6 mM)/H 3 PO 4 (29.6 mM)/THF (0.1% by mass); flow rate: 1.0 mL/min; column temperature: 40° C.; Mw: standard polystyrene conversion value) It was done using.
  • Example 1-2 Preparation of release layer-forming composition 2
  • the release layer was prepared in the same manner as in Example 1-1, except that the solid content concentration was 5% by mass and the PGMEA concentration was 70% by mass.
  • a forming composition 2 was prepared.
  • Example 1-3 Preparation of release layer-forming composition 3
  • Example 1 was repeated except that EL was used instead of PGMEA so that the solid content concentration was 5% by mass and the EL concentration was 30% by mass.
  • a release layer-forming composition 3 was prepared in the same manner as in -1.
  • Example 1-4 Preparation of release layer-forming composition 4
  • Example 1 was repeated except that EL was used instead of PGMEA so that the solid content concentration was 5% by mass and the EL concentration was 70% by mass.
  • a release layer-forming composition 4 was prepared in the same manner as in -1.
  • Example 1-5 Preparation of release layer-forming composition 5
  • Example 1 was repeated except that GBL was used instead of PGMEA so that the solid content concentration was 5% by mass and the GBL concentration was 30% by mass.
  • a release layer forming composition 5 was prepared in the same manner as in -1.
  • Example 1-6 Preparation of release layer-forming composition 6
  • Example 1 was repeated except that GBL was used instead of PGMEA so that the solid content concentration was 5% by mass and the GBL concentration was 10% by mass.
  • a release layer-forming composition 6 was prepared in the same manner as in -1.
  • Example 1-7 Preparation of release layer-forming composition 7
  • Example 1 was repeated except that Triglyme was used instead of PGMEA so that the solid content concentration was 5% by mass and the Triglyme concentration was 30% by mass.
  • a release layer forming composition 7 was prepared in the same manner as in -1.
  • Example 1-8 Preparation of release layer-forming composition 8 Example 1 was repeated except that Triglyme was used instead of PGMEA so that the solid content concentration was 5% by mass and the Triglyme concentration was 10% by mass.
  • a release layer forming composition 8 was prepared in the same manner as in -1.
  • Example 1-9 Preparation of release layer-forming composition 9
  • Example 1 was repeated except that Diglyme was used instead of PGMEA so that the solid content concentration was 5 mass% and the Diglyme concentration was 10 mass %.
  • a release layer forming composition 9 was prepared in the same manner as in -1.
  • Example 1-10 Preparation of release layer-forming composition 10 Example 1 was repeated except that DEGEEA was used instead of PGMEA so that the solid content concentration was 5% by mass and the DEGEEA concentration was 30% by mass.
  • a release layer forming composition 10 was prepared in the same manner as in -1.
  • release layer-forming composition 11 To 20 g of the reaction solution obtained in Synthesis Example 1, PL-LI (1.28 g), PPTS (0.12 g), acrylic polymer (S1) solution (6.00 g) and PGMEA were added. In addition, a release layer-forming composition 11 was prepared by diluting with PGME so that the solid content concentration was 5% by mass and the PGMEA concentration was 30% by mass.
  • Example 1-12 Preparation of release layer forming composition 12 To 20 g of the reaction solution obtained in Synthesis Example 1, PL-LI 1.00 g, PPTS 0.12 g, acrylic polymer (S2) solution 1.50 g and PGMEA were added. In addition, the release layer forming composition 12 was prepared by diluting with PGM such that the solid content concentration was 5% by mass and the PGMEA concentration was 30% by mass.
  • Example 1-13 Preparation of release layer-forming composition 13 To 20 g of the reaction solution obtained in Synthesis Example 1, PL-LI 1.00 g, PPTS 0.60 g, acrylic polymer (S2) solution 1.50 g and GBL were added. In addition, the release layer-forming composition 13 was prepared by diluting with PGME so that the solid content concentration was 5% by mass and the GBL concentration was 30% by mass.
  • Example 1-14 Preparation of release layer-forming composition 14 To 20 g of the reaction solution obtained in Synthesis Example 1, PL-LI (1.00 g), PPTS (0.60 g), acrylic polymer (S1) solution (1.50 g) and PGMEA were added. In addition, the release layer-forming composition 14 was prepared by diluting with PGME so that the solid content concentration was 5% by mass and the PGMEA concentration was 30% by mass.
  • Example 1-15 Preparation of release layer-forming composition 15 To 1 g of the reaction solution obtained in Synthesis Example 1, 3,3'-5,5'-tetrakis(methoxymethyl)-[1,1'- Biphenyl]-4,4'-diol 0.06 g, PPTS 0.01 g, acrylic polymer (S1) solution 0.08 g, and PGMEA were added so that the solid content concentration was 5% by mass and the PGMEA concentration was 30% by mass. It was diluted with PGME to prepare a release layer-forming composition 15.
  • Example 1-1 Preparation of release layer forming composition 16 Example 1-1 except that PGME was used instead of PGMEA so that the solid content concentration was 5% by mass and the PGME concentration was 95% by mass.
  • a release layer-forming composition 16 was prepared in the same manner as in.
  • Example 2-1 The composition 1 for forming a release layer was formed on a glass substrate (100 mm ⁇ 100 mm, the same applies hereinafter) with a slit die coater (manufactured by Techno Machine Co., Ltd., product name: table die, conditions: liquid volume 7 ⁇ L, gap 25 ⁇ m, coating speed 20 mm/ sec) was used for coating. After that, the obtained coating film was made to reach a reduced pressure level in 5 seconds by a vacuum desiccator (a reduced pressure level of 60 Pa) and vacuum dried. Next, using a hot plate, heating at 100° C. for 2 minutes, and further using a hot plate at 230° C. for 10 minutes, a peeling layer having a thickness of about 0.1 ⁇ m is formed on the glass substrate. A glass substrate 1 was obtained.
  • Example 2-2 A glass substrate 2 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 2 was used in place of the release layer forming composition 1.
  • Example 2-3 A glass substrate 3 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 3 was used in place of the release layer forming composition 1.
  • Example 2-4 A glass substrate 4 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 4 was used in place of the release layer forming composition 1.
  • Example 2-5 A glass substrate 5 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 5 was used in place of the release layer forming composition 1.
  • Example 2-6 A glass substrate 6 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 6 was used in place of the release layer forming composition 1.
  • Example 2-7 A glass substrate 7 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 7 was used in place of the release layer forming composition 1.
  • Example 2-8 A glass substrate 8 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 8 was used in place of the release layer forming composition 1.
  • Example 2-9 A glass substrate 9 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 9 was used in place of the release layer forming composition 1.
  • Example 2-10 A glass substrate 10 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 10 was used in place of the release layer forming composition 1.
  • Example 2-11 A glass substrate 11 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 11 was used in place of the release layer forming composition 1.
  • Example 2-12 A glass substrate 12 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 12 was used in place of the release layer forming composition 1.
  • Example 2-13 A glass substrate 13 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 13 was used in place of the release layer forming composition 1.
  • Example 2-14 A glass substrate 14 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer-forming composition 14 was used in place of the release layer-forming composition 1.
  • Example 2-15 A glass substrate 15 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 15 was used in place of the release layer forming composition 1.
  • Example 2-1 A glass substrate 16 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 16 was used in place of the release layer forming composition 1. When the unevenness of the peeling layer was confirmed with a Na lamp, the peeling layer became cloudy and many irregularities were confirmed.
  • Example 3-2 A resin substrate/release layer-attached glass substrate 2 was obtained in the same manner as in Example 3-1, except that the release layer-attached glass substrate 2 was used instead of the release layer-attached glass substrate 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-3 A resin substrate/glass substrate with release layer 3 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 3 was used instead of the glass substrate with release layer 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-4 A resin substrate/release layer-attached glass substrate 4 was obtained in the same manner as in Example 3-1, except that the release layer-attached glass substrate 4 was used instead of the release layer-attached glass substrate 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-5 A resin substrate/glass substrate with release layer 5 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 5 was used instead of the glass substrate with release layer 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-6 A resin substrate/glass substrate with release layer 6 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 6 was used instead of the glass substrate with release layer 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-7 A resin substrate/glass substrate with release layer 7 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 7 was used instead of the glass substrate with release layer 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-8 A resin substrate/glass substrate with release layer 8 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 8 was used instead of the glass substrate with release layer 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-9 A resin substrate/release layer-attached glass substrate 9 was obtained in the same manner as in Example 3-1, except that the release layer-attached glass substrate 9 was used instead of the release layer-attached glass substrate 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-10 A resin substrate/release layer-attached glass substrate 10 was obtained in the same manner as in Example 3-1, except that the release layer-attached glass substrate 10 was used instead of the release layer-attached glass substrate 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-11 A resin substrate/glass substrate with release layer 11 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 11 was used instead of the glass substrate with release layer 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-12 A resin substrate/glass substrate with release layer 12 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 12 was used instead of the glass substrate with release layer 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-13 A resin substrate/release layer-attached glass substrate 13 was obtained in the same manner as in Example 3-1, except that the release layer-attached glass substrate 13 was used in place of the release layer-attached glass substrate 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-14 A resin substrate/release layer-attached glass substrate 14 was obtained in the same manner as in Example 3-1, except that the release layer-attached glass substrate 14 was used in place of the release layer-attached glass substrate 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • Example 3-15 A resin substrate/release layer-attached glass substrate 15 was obtained in the same manner as in Example 3-1 except that the release layer-attached glass substrate 15 was used in place of the release layer-attached glass substrate 1.
  • the resin substrate showed a transmittance of 90% or more at 400 nm.
  • the peeling layer of the example was excellent in adhesion to the glass substrate and also excellent in peeling from the resin substrate.
  • the peeling layer of Comparative Example had many irregularities on the surface and was cloudy.

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Abstract

The present invention provides a composition for forming a release layer for slit die coating, which contains (A) a polyurea that contains a repeating unit represented by formula (1), (B) an acid compound or a salt thereof, (C) a crosslinking agent that is selected from among compounds having nitrogen atoms which are substituted by a hydroxyalkyl group and/or an alkoxymethyl group, (D) a polymer additive which contains a repeating unit represented by formula (a1), a repeating unit represented by formula (b) and a repeating unit represented by formula (c), and (E) a solvent that contains at least one solvent which has a vapor pressure of 800 Pa or less at 20°C; and this composition is configured such that 3-100 parts by mass of the polymer additive (D) is contained per 100 parts by mass of the polyurea (A).

Description

スリットダイコート用剥離層形成用組成物及び剥離層Composition for forming release layer for slit die coat and release layer
 本発明は、スリットダイコート用剥離層形成用組成物及び剥離層に関する。 The present invention relates to a release layer forming composition for a slit die coat and a release layer.
 近年、電子デバイスには、薄型化及び軽量化という特性に加え、曲げることができるという機能を付与することが求められている。このことから、従来の重く脆弱で曲げることができないガラス基板にかわって、軽量なフレキシブルプラスチック基板を用いることが求められる。 In recent years, electronic devices have been required to have the function of being bendable in addition to the characteristics of being thin and lightweight. For this reason, it is required to use a lightweight flexible plastic substrate in place of the conventional glass substrate which is heavy and fragile and cannot be bent.
 特に、新世代ディスプレイでは、軽量なフレキシブルプラスチック基板(以下、樹脂基板ともいう。)を用いたアクティブマトリクス型フルカラーTFTディスプレイパネルの開発が求められている。また、タッチパネル式ディスプレイは、ディスプレイパネルに組み合わせて使用されるタッチパネルの透明電極や樹脂基板等、フレキシブル化に対応する材料が開発されている。透明電極としては、従来使用されていたITOから、PEDOT等曲げ加工が可能な透明導電性ポリマー、金属ナノワイヤ及びその混合系等、別の透明電極材料が提案されている(特許文献1~4)。 In particular, for new-generation displays, it is required to develop an active matrix full-color TFT display panel that uses a lightweight flexible plastic substrate (hereinafter also referred to as a resin substrate). In addition, for the touch panel type display, a material corresponding to flexibility, such as a transparent electrode and a resin substrate of a touch panel used in combination with a display panel, has been developed. As the transparent electrode, other transparent electrode materials such as a transparent conductive polymer that can be bent such as PEDOT, metal nanowires and a mixed system thereof have been proposed as the transparent electrode (Patent Documents 1 to 4). ..
 一方、タッチパネルフィルムの基材も、ガラスからポリエチレンテレフタレート(PET)、ポリイミド、シクロオレフィン、アクリル等のプラスチックからなるシート等になり、フレキシブル性を持たせた透明フレキシブルタッチスクリーンパネルが開発されている(特許文献5~7)。 On the other hand, the base material of the touch panel film is also made of glass or a sheet made of plastic such as polyethylene terephthalate (PET), polyimide, cycloolefin, or acrylic, and a transparent flexible touch screen panel having flexibility has been developed ( Patent Documents 5 to 7).
 一般的に、フレキシブルタッチスクリーンパネルは、生産と剥離とを安定的に行うため、ガラス基板等の支持基板上に剥離層(粘着層)を作製し、その上でデバイスを作製した後剥離することで生産される(特許文献8)。この剥離層は、行程中では支持基板から剥離してはならない一方、剥離する際は低剥離力が必要とされる。 Generally, in a flexible touch screen panel, in order to stably perform production and peeling, a peeling layer (adhesive layer) is formed on a supporting substrate such as a glass substrate, a device is formed on the peeling layer, and then peeling is performed. Is manufactured in Japan (Patent Document 8). This peeling layer must not be peeled from the supporting substrate during the process, but a low peeling force is required when peeling.
 また、近年、塗布液の使用抑制と、工程の簡略化に伴う生産性の観点から、生産ラインでスリットダイコート法が用いられている(特許文献9、10)。この方法は、スピンコート法と異なり、製膜後に多数の溶媒を含有するため、減圧乾燥プロセスが必要となる。このプロセスは、塗布処理と加熱処理との間に実施されており、塗布直後の不安定な膜を安定化させるために必須である。ただし、減圧による残存溶媒の影響によって、塗布ムラが発生するため、この塗布ムラを改善する必要があった。 In addition, in recent years, the slit die coating method has been used in the production line from the viewpoints of the suppression of use of the coating liquid and the productivity accompanying the simplification of the process (Patent Documents 9 and 10). This method, unlike the spin coating method, contains a large number of solvents after film formation, and thus requires a vacuum drying process. This process is carried out between the coating treatment and the heat treatment, and is essential for stabilizing the unstable film immediately after coating. However, since uneven coating occurs due to the influence of the residual solvent due to the reduced pressure, it was necessary to improve this uneven coating.
国際公開第2012/147235号International Publication No. 2012/147235 特開2009-283410号公報JP, 2009-283410, A 特表2010-507199号公報Japanese Patent Publication No. 2010-507199 特開2009-205924号公報JP, 2009-205924, A 国際公開第2017/002664号International Publication No. 2017/002664 国際公開第2016/160338号International Publication No. 2016/160338 特開2015-166145号公報JP, 2005-166145, A 特開2016-531358号公報Japanese Patent Laid-Open No. 2016-531358 特開2014-102490号公報JP, 2014-102490, A 特開2014-106956号公報Japanese Patent Laid-Open No. 2014-106956
 本発明は、前記事情に鑑みてなされたものであり、スリットダイコート法によって塗布した場合でも、塗布ムラが発生せず、基体との優れた密着性、樹脂基板との適度な密着性及び適度な剥離性を有する剥離層を与え得るスリットダイコート用剥離層形成用組成物を提供することを目的とする。 The present invention has been made in view of the above circumstances, even when applied by the slit die coating method, coating unevenness does not occur, excellent adhesion with the substrate, moderate adhesion with the resin substrate and appropriate An object of the present invention is to provide a composition for forming a release layer for slit die coating, which can provide a release layer having a release property.
 本発明者らは、前記目的を達成するために鋭意検討を重ねた結果、(A)所定の繰り返し単位を含むポリウレア、(B)酸化合物又はその塩、(C)ヒドロキシアルキル基及び/又はアルコキシメチル基で置換された窒素原子を有する化合物から選ばれる架橋剤、(D)所定の繰り返し単位を含む高分子添加剤、及び(E)20℃における蒸気圧が800Pa以下の溶剤からなる溶剤を含む剥離層形成用組成物が、スリットダイコート用の組成物として優れ、基体との優れた密着性、樹脂基板との適度な密着性及び適度な剥離性を有する剥離層を再現性よく与え得ることを見出し、本発明を完成した。 The present inventors have conducted extensive studies to achieve the above-mentioned object, and as a result, (A) polyurea containing a predetermined repeating unit, (B) an acid compound or a salt thereof, (C) a hydroxyalkyl group and/or an alkoxy. Contains a cross-linking agent selected from compounds having a nitrogen atom substituted with a methyl group, (D) a polymer additive containing a predetermined repeating unit, and (E) a solvent having a vapor pressure at 20° C. of 800 Pa or less. The composition for forming a release layer is excellent as a composition for slit die coating, and it is possible to give a release layer having excellent adhesion to a substrate, appropriate adhesion to a resin substrate and release property with good reproducibility. Heading, the present invention was completed.
 すなわち、本発明は、下記スリットダイコート用剥離層形成用組成物及び剥離層を提供する。
1.(A)下記式(1)で表される繰り返し単位を含むポリウレア、
(B)酸化合物又はその塩、
(C)ヒドロキシアルキル基及び/又はアルコキシメチル基で置換された窒素原子を有する化合物から選ばれる架橋剤、
(D)下記式(a1)で表される繰り返し単位、下記式(b)で表される繰り返し単位及び下記式(c)で表される繰り返し単位を含む高分子添加剤、並びに
(E)20℃における蒸気圧が800Pa以下の溶剤を少なくとも1種含む溶剤
を含み、
 (D)高分子添加剤が、(A)ポリウレア100質量部に対し、3~100質量部含まれる、スリットダイコート用剥離層形成用組成物。
Figure JPOXMLDOC01-appb-C000006
[式中、A1、A2、A3、A4、A5及びA6は、それぞれ独立に、水素原子、メチル基又はエチル基であり、
 X1は、下記式(1-1)、(1-2)、(1-3)又は(1-4)で表される基であり、
Figure JPOXMLDOC01-appb-C000007
(式中、R1及びR2は、それぞれ独立に、水素原子、炭素数1~6のアルキル基、炭素数3~6のアルケニル基、ベンジル基又はフェニル基であり、前記フェニル基は、炭素数1~6のアルキル基、ハロゲン原子、炭素数1~6のアルコキシ基、ニトロ基、シアノ基、ヒドロキシ基及び炭素数1~6のアルキルチオ基からなる群から選ばれる少なくとも1種の基で置換されていてもよく、また、R1及びR2は、互いに結合してこれらが結合する炭素原子と共に炭素数3~6の環を形成してもよく、R3は、炭素数1~6のアルキル基、炭素数3~6のアルケニル基、ベンジル基又はフェニル基であり、前記フェニル基は、炭素数1~6のアルキル基、ハロゲン原子、炭素数1~6のアルコキシ基、ニトロ基、シアノ基、ヒドロキシ基及び炭素数1~6のアルキルチオ基からなる群から選ばれる少なくとも1種の基で置換されていてもよい。)
 Q1は、下記式(1-5)又は(1-6)で表される基である。
Figure JPOXMLDOC01-appb-C000008
(式中、X2は、式(1-1)、式(1-2)又は式(1-4)で表される基であり、Q2は、炭素数1~10のアルキレン基、フェニレン基、ナフチレン基又はアントリレン基であり、前記フェニレン基、ナフチレン基及びアントリレン基は、炭素数1~6のアルキル基、ハロゲン原子、炭素数1~6のアルコキシ基、ニトロ基、シアノ基、ヒドロキシ基、及び炭素数1~6のアルキルチオ基からなる群から選ばれる少なくとも1種の基で置換されていてもよく、n1及びn2は、それぞれ独立に、0又は1である。)]
Figure JPOXMLDOC01-appb-C000009
(式中、RAは、それぞれ独立に、水素原子又はメチル基であり、RB1は、少なくとも1つの水素原子がフッ素原子で置換された炭素数3又は4の分岐状のアルキル基であり、RCは、炭素数1~10のヒドロキシアルキル基であり、RDは、炭素数6~20の多環式アルキル基又は炭素数6~12のアリール基である。)
2.(D)高分子添加物の式(b)で表される繰り返し単位において、RCが、炭素数2~10のヒドロキシアルキル基であって、ヒドロキシ基が結合する炭素原子が第2級炭素原子であり、かつ、式(a1)で表される繰り返し単位の含有割合が、(D)高分子添加物の全繰り返し単位中30モル%以上である1のスリットダイコート用剥離層形成用組成物。
3.X1が、式(1-3)で表される基である1又は2のスリットダイコート用剥離層形成用組成物。
4.R3が、2-プロペニル基である3のスリットダイコート用剥離層形成用組成物。
5.Q1が、式(1-5)で表される基である1~4のいずれかのスリットダイコート用剥離層形成用組成物。
6.(B)成分が、スルホン酸化合物又はその塩である1~5のいずれかのスリットダイコート用剥離層形成用組成物。
7.(C)架橋剤が、下記式(C-1)~(C-7)のいずれかで表される化合物である1~6のいずれかのスリットダイコート用剥離層形成用組成物。
Figure JPOXMLDOC01-appb-C000010
(式中、R11~R38は、それぞれ独立に、水素原子又は炭素数1~6のアルキル基であり、R39は、水素原子又はメチル基である。)
8.(C)架橋剤の含有量が、(A)ポリウレア100質量部に対し、10~100質量部である1~7のいずれかのスリットダイコート用剥離層形成用組成物。
9.1~8のいずれかのスリットダイコート用剥離層形成用組成物から得られる剥離層。
10.9の剥離層に、波長400nmの光透過率が80%以上である樹脂層が積層された積層体。
11.1~8のいずれかのスリットダイコート用剥離層形成用組成物を基体に塗布し、剥離層を形成する工程、
 前記剥離層上に、波長400nmの光透過率が80%以上である樹脂基板を形成する工程、及び
 前記樹脂基板を、0.15N/25mm以下の剥離力で剥離する工程
を含む樹脂基板の製造方法。
That is, the present invention provides the following composition for forming a release layer for slit die coating and a release layer.
1. (A) a polyurea containing a repeating unit represented by the following formula (1),
(B) an acid compound or a salt thereof,
(C) a cross-linking agent selected from compounds having a nitrogen atom substituted with a hydroxyalkyl group and/or an alkoxymethyl group,
(D) A polymer additive containing a repeating unit represented by the following formula (a1), a repeating unit represented by the following formula (b) and a repeating unit represented by the following formula (c), and (E) 20 Including a solvent containing at least one solvent having a vapor pressure at 800° C. of 800 Pa or less,
A composition for forming a release layer for a slit die coat, wherein the polymer additive (D) is contained in an amount of 3 to 100 parts by mass relative to 100 parts by mass of the polyurea (A).
Figure JPOXMLDOC01-appb-C000006
[In the formula, A 1 , A 2 , A 3 , A 4 , A 5 and A 6 are each independently a hydrogen atom, a methyl group or an ethyl group,
X 1 is a group represented by the following formula (1-1), (1-2), (1-3) or (1-4),
Figure JPOXMLDOC01-appb-C000007
(In the formula, R 1 and R 2 are each independently a hydrogen atom, an alkyl group having 1 to 6 carbon atoms, an alkenyl group having 3 to 6 carbon atoms, a benzyl group or a phenyl group, and the phenyl group is a carbon atom. Substituted with at least one group selected from the group consisting of an alkyl group having 1 to 6 carbon atoms, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, a nitro group, a cyano group, a hydroxy group and an alkylthio group having 1 to 6 carbon atoms. R 1 and R 2 may combine with each other to form a ring having 3 to 6 carbon atoms together with the carbon atom to which they are bonded, and R 3 has 1 to 6 carbon atoms. An alkyl group, an alkenyl group having 3 to 6 carbon atoms, a benzyl group or a phenyl group, wherein the phenyl group is an alkyl group having 1 to 6 carbon atoms, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, a nitro group, cyano May be substituted with at least one group selected from the group consisting of a group, a hydroxy group and an alkylthio group having 1 to 6 carbon atoms.)
Q 1 is a group represented by the following formula (1-5) or (1-6).
Figure JPOXMLDOC01-appb-C000008
(In the formula, X 2 is a group represented by the formula (1-1), the formula (1-2) or the formula (1-4), and Q 2 is an alkylene group having 1 to 10 carbon atoms, or phenylene. Group, naphthylene group or anthrylene group, wherein the phenylene group, naphthylene group and anthrylene group are an alkyl group having 1 to 6 carbon atoms, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, a nitro group, a cyano group, a hydroxy group. , And at least one group selected from the group consisting of alkylthio groups having 1 to 6 carbon atoms, and n 1 and n 2 are each independently 0 or 1.)]
Figure JPOXMLDOC01-appb-C000009
(In the formula, R A is each independently a hydrogen atom or a methyl group, and R B1 is a branched alkyl group having 3 or 4 carbon atoms in which at least one hydrogen atom is substituted with a fluorine atom, R C is a hydroxyalkyl group having 1 to 10 carbon atoms, and R D is a polycyclic alkyl group having 6 to 20 carbon atoms or an aryl group having 6 to 12 carbon atoms.)
2. (D) In the repeating unit represented by the formula (b) of the polymer additive, R C is a hydroxyalkyl group having 2 to 10 carbon atoms, and the carbon atom to which the hydroxy group is bonded is a secondary carbon atom. And the content of the repeating unit represented by the formula (a1) is 30 mol% or more based on all repeating units of the polymer additive (D).
3. The composition for forming a release layer for slit die coating according to 1 or 2, wherein X 1 is a group represented by formula (1-3).
4. The composition for forming a release layer for slit die coating according to 3, wherein R 3 is a 2-propenyl group.
5. The composition for forming a release layer for slit die coating according to any one of 1 to 4, wherein Q 1 is a group represented by the formula (1-5).
6. The composition for forming a release layer for slit die coating according to any one of 1 to 5, wherein the component (B) is a sulfonic acid compound or a salt thereof.
7. The composition for forming a release layer for slit die coat according to any one of 1 to 6, wherein the crosslinking agent (C) is a compound represented by any of the following formulas (C-1) to (C-7).
Figure JPOXMLDOC01-appb-C000010
(In the formula, R 11 to R 38 are each independently a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, and R 39 is a hydrogen atom or a methyl group.)
8. The composition for forming a release layer for slit die coating according to any one of 1 to 7, wherein the content of the cross-linking agent (C) is 10 to 100 parts by mass relative to 100 parts by mass of (A) polyurea.
9. A release layer obtained from the composition for forming a release layer for slit die coating according to any one of 1 to 8.
A laminate in which a resin layer having a light transmittance at a wavelength of 400 nm of 80% or more is laminated on a release layer of 10.9.
A step of applying a release layer-forming composition for slit die coating according to any one of 11.1 to 8 to a substrate to form a release layer;
Manufacture of a resin substrate including a step of forming a resin substrate having a light transmittance of 400% at a wavelength of 400% or more on the peeling layer, and peeling the resin substrate with a peeling force of 0.15 N/25 mm or less Method.
 本発明のスリットダイコート用剥離層形成用組成物を用いることで、塗布ムラが発生せず、基体との優れた密着性、樹脂基板との適度な密着性及び適度な剥離性を有する剥離層を再現性よく得ることできる。また、フレキシブル電子デバイスの製造プロセスにおいて、基体上に形成された樹脂基板や、更にその上に設けられる回路等に損傷を与えることなく、当該回路等とともに当該樹脂基板を当該基体から分離することが可能となる。したがって、本発明のスリットダイコート用剥離層形成用組成物は、樹脂基板を備えるフレキシブル電子デバイスの製造プロセスの高速化やその歩留り向上等に寄与し得る。 By using the composition for forming a release layer for slit die coating of the present invention, coating unevenness does not occur, excellent adhesion to the substrate, a suitable adhesion to the resin substrate and a release layer having a suitable releasability. It can be obtained with good reproducibility. Further, in the process of manufacturing a flexible electronic device, it is possible to separate the resin substrate from the base body together with the circuit and the like without damaging the resin substrate formed on the base body or a circuit or the like provided thereon. It will be possible. Therefore, the composition for forming a release layer for a slit die coat of the present invention can contribute to speeding up the manufacturing process of a flexible electronic device including a resin substrate, improving its yield, and the like.
[スリットダイコート用剥離層形成用組成物]
 本発明のスリットダイコート用剥離層形成用組成物は、(A)所定の繰り返し単位を含むポリウレア、(B)酸化合物又はその塩、(C)ヒドロキシアルキル基及び/又はアルコキシメチル基で置換された窒素原子を有する化合物から選ばれる架橋剤、(D)所定の繰り返し単位を含む高分子添加剤、並びに(E)溶剤を含むものである。
[Release layer forming composition for slit die coat]
The composition for forming a release layer for slit die coating of the present invention is substituted with (A) a polyurea containing a predetermined repeating unit, (B) an acid compound or a salt thereof, (C) a hydroxyalkyl group and/or an alkoxymethyl group. It contains a crosslinking agent selected from compounds having a nitrogen atom, (D) a polymer additive containing a predetermined repeating unit, and (E) a solvent.
[(A)ポリウレア]
 (A)成分のポリウレアは、下記式(1)で表される繰り返し単位を含むものである。
Figure JPOXMLDOC01-appb-C000011
[(A) Polyurea]
The polyurea as the component (A) contains a repeating unit represented by the following formula (1).
Figure JPOXMLDOC01-appb-C000011
 式(1)中、A1、A2、A3、A4、A5及びA6は、それぞれ独立に、水素原子、メチル基又はエチル基であるが、剥離性と生産性の観点から、A1~A6が全て水素原子であることが好ましい。 In the formula (1), A 1 , A 2 , A 3 , A 4 , A 5 and A 6 are each independently a hydrogen atom, a methyl group or an ethyl group, but from the viewpoint of releasability and productivity, All of A 1 to A 6 are preferably hydrogen atoms.
 式(1)中、X1は、下記式(1-1)、(1-2)、(1-3)又は(1-4)で表される基である。
Figure JPOXMLDOC01-appb-C000012
In the formula (1), X 1 is a group represented by the following formula (1-1), (1-2), (1-3) or (1-4).
Figure JPOXMLDOC01-appb-C000012
 式(1-1)及び(1-2)中、R1及びR2は、それぞれ独立に、水素原子、炭素数1~6のアルキル基、炭素数3~6のアルケニル基、ベンジル基又はフェニル基であり、前記フェニル基は、炭素数1~6のアルキル基、ハロゲン原子、炭素数1~6のアルコキシ基、ニトロ基、シアノ基、ヒドロキシ基及び炭素数1~6のアルキルチオ基からなる群から選ばれる少なくとも1種の基で置換されていてもよく、また、R1及びR2は、互いに結合してこれらが結合する炭素原子と共に炭素数3~6の環を形成してもよい。 In formulas (1-1) and (1-2), R 1 and R 2 are each independently a hydrogen atom, an alkyl group having 1 to 6 carbon atoms, an alkenyl group having 3 to 6 carbon atoms, a benzyl group or phenyl. The phenyl group is a group consisting of an alkyl group having 1 to 6 carbon atoms, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, a nitro group, a cyano group, a hydroxy group and an alkylthio group having 1 to 6 carbon atoms. It may be substituted with at least one group selected from the following, and R 1 and R 2 may be bonded to each other to form a ring having 3 to 6 carbon atoms together with the carbon atom to which they are bonded.
 式(1-3)中、R3は、炭素数1~6のアルキル基、炭素数3~6のアルケニル基、ベンジル基又はフェニル基であり、前記フェニル基は、炭素数1~6のアルキル基、ハロゲン原子、炭素数1~6のアルコキシ基、ニトロ基、シアノ基、ヒドロキシ基及び炭素数1~6のアルキルチオ基からなる群から選ばれる少なくとも1種の基で置換されていてもよい。 In the formula (1-3), R 3 is an alkyl group having 1 to 6 carbon atoms, an alkenyl group having 3 to 6 carbon atoms, a benzyl group or a phenyl group, and the phenyl group is an alkyl group having 1 to 6 carbon atoms. It may be substituted with at least one group selected from the group consisting of a group, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, a nitro group, a cyano group, a hydroxy group and an alkylthio group having 1 to 6 carbon atoms.
 式(1)中、Q1は、下記式(1-5)又は(1-6)で表される基である。
Figure JPOXMLDOC01-appb-C000013
In the formula (1), Q 1 is a group represented by the following formula (1-5) or (1-6).
Figure JPOXMLDOC01-appb-C000013
 式(1-5)中、X2は、式(1-1)、式(1-2)又は式(1-4)で表される基である。式(1-5)において、例えば、X2が式(1-2)で表される基の場合、その構造は下記式(1-5-1)で表されるものとなる。
Figure JPOXMLDOC01-appb-C000014
(式中、R1及びR2は、前記と同じ。)
In formula (1-5), X 2 is a group represented by formula (1-1), formula (1-2) or formula (1-4). In the formula (1-5), for example, when X 2 is a group represented by the formula (1-2), its structure is represented by the following formula (1-5-1).
Figure JPOXMLDOC01-appb-C000014
(In the formula, R 1 and R 2 are the same as above.)
 式(1-6)中、Q2は、炭素数1~10のアルキレン基、フェニレン基、ナフチレン基又はアントリレン基である。前記フェニレン基、ナフチレン基及びアントリレン基は、炭素数1~6のアルキル基、ハロゲン原子、炭素数1~6のアルコキシ基、ニトロ基、シアノ基、ヒドロキシ基及び炭素数1~6のアルキルチオ基からなる群から選ばれる少なくとも1種の基で置換されていてもよい。また、Q2がフェニレン基、ナフチレン基又はアントリレン基である場合、それらの結合の位置は特に限定されない。すなわち、例えば、フェニレン基が1位と2位とで結合している場合、1位と3位とで結合している場合又は1位と4位とで結合している場合、ナフチレン基が1位と2位で結合している場合、1位と4位で結合している場合、1位と5位で結合している場合又は2位と3位で結合している場合、アントリレン基が1位と2位で結合している場合、1位と4位で結合している場合又は9位と10位で結合している場合等がありえるが、いずれであってもよい。 In the formula (1-6), Q 2 is an alkylene group having 1 to 10 carbon atoms, a phenylene group, a naphthylene group or an anthrylene group. The phenylene group, naphthylene group and anthrylene group include an alkyl group having 1 to 6 carbon atoms, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, a nitro group, a cyano group, a hydroxy group and an alkylthio group having 1 to 6 carbon atoms. It may be substituted with at least one group selected from the group consisting of Further, when Q 2 is a phenylene group, a naphthylene group or an anthrylene group, the position of their bond is not particularly limited. That is, for example, when the phenylene group is bonded at the 1-position and 2-position, when it is bonded at the 1-position and 3-position, or when it is bonded at the 1-position and 4-position, the naphthylene group is 1 When bonded at position 2 and position, bonded at position 1 and position 4, bonded at position 1 and position 5 or bonded at position 2 and position 3, the anthrylene group is There may be a bond at the 1-position and the 2-position, a bond at the 1-position and the 4-position, a bond at the 9-position and the 10-position, etc.
 前記炭素数1~6のアルキル基としては、直鎖状、分岐状、環状のいずれでもよく、例えば、メチル基、エチル基、イソプロピル基、n-ブチル基、シクロヘキシル基等が挙げられる。前記炭素数3~6のアルケニル基としては、直鎖状、分岐状、環状のいずれでもよく、例えば、2-プロペニル基、3-ブテニル基等が挙げられる。 The alkyl group having 1 to 6 carbon atoms may be linear, branched or cyclic, and examples thereof include a methyl group, an ethyl group, an isopropyl group, an n-butyl group and a cyclohexyl group. The alkenyl group having 3 to 6 carbon atoms may be linear, branched or cyclic, and examples thereof include a 2-propenyl group and a 3-butenyl group.
 前記炭素数1~6のアルコキシ基としては、直鎖状、分岐状、環状のいずれでもよく、例えば、メトキシ基、エトキシ基、イソプロポキシ基、n-ペンチルオキシ基及びシクロヘキシルオキシ基等が挙げられる。炭素数1~6のアルキルチオ基としては、直鎖状、分岐状、環状のいずれでもよく、例えば、メチルチオ基、エチルチオ基、イソプロピルチオ基、n-ペンチルチオ基、シクロヘキシルチオ基等が挙げられる。前記ハロゲン原子としては、フッ素原子、塩素原子、臭素原子、ヨウ素原子等が挙げられる。また、R1とR2が結合して形成される炭素数3~6の環としては、シクロブタン環、シクロペンタン環、シクロヘキサン環等が挙げられる。 The alkoxy group having 1 to 6 carbon atoms may be linear, branched or cyclic, and examples thereof include a methoxy group, an ethoxy group, an isopropoxy group, an n-pentyloxy group and a cyclohexyloxy group. .. The alkylthio group having 1 to 6 carbon atoms may be linear, branched or cyclic, and examples thereof include a methylthio group, an ethylthio group, an isopropylthio group, an n-pentylthio group and a cyclohexylthio group. Examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom and an iodine atom. Further, examples of the ring having 3 to 6 carbon atoms formed by combining R 1 and R 2 include a cyclobutane ring, a cyclopentane ring, a cyclohexane ring and the like.
 前記炭素数1~10のアルキレン基としては、直鎖状、分岐状、環状のいずれでもよく、例えば、メチレン基、エチレン基、プロピレン基、ペンタメチレン基、シクロヘキシレン基、2-メチルプロピレン基等が挙げられる。 The alkylene group having 1 to 10 carbon atoms may be linear, branched or cyclic and includes, for example, methylene group, ethylene group, propylene group, pentamethylene group, cyclohexylene group, 2-methylpropylene group and the like. Are listed.
 なお、式(1)において、X1が式(1-2)で表される基の場合、その構造は下記式(2)で表されるものとなり、X1が式(1-3)で表される基の場合、その構造は下記式(3)で表されるものとなる。また、式(3)において、R3が、2-プロペニル基であるものが好ましい。
Figure JPOXMLDOC01-appb-C000015
(式中、A1~A6、R1~R3及びQ1は、前記と同じ。)
In the formula (1), when X 1 is a group represented by the formula (1-2), the structure is represented by the following formula (2), and X 1 is the formula (1-3). In the case of the group represented, its structure is represented by the following formula (3). Further, in the formula (3), it is preferable that R 3 is a 2-propenyl group.
Figure JPOXMLDOC01-appb-C000015
(In the formula, A 1 to A 6 , R 1 to R 3 and Q 1 are the same as above.)
 式(1)中、Q1は、(A)成分のポリウレアの耐熱性の観点から、環状構造を含んでいることが好ましい。すなわち、Q1が、式(1-5)で表される基又は式(1-6)で表される基であってQ2が環状アルキレン基、フェニレン基、ナフチレン基又はアントリレン基であることが好ましく、式(1-5)で表される基であることがより好ましい。 In the formula (1), Q 1 preferably contains a cyclic structure from the viewpoint of heat resistance of the polyurea as the component (A). That is, Q 1 is a group represented by the formula (1-5) or a group represented by the formula (1-6), and Q 2 is a cyclic alkylene group, a phenylene group, a naphthylene group or an anthrylene group. Is preferred, and a group represented by formula (1-5) is more preferred.
 式(1)で表される繰り返し単位としては、下記式(4)~式(22)で表されるものが好ましい。なお、下記式中、Meはメチル基であり、Etはエチル基である。
Figure JPOXMLDOC01-appb-C000016
As the repeating unit represented by the formula (1), those represented by the following formulas (4) to (22) are preferable. In the formula below, Me is a methyl group and Et is an ethyl group.
Figure JPOXMLDOC01-appb-C000016
Figure JPOXMLDOC01-appb-C000017
Figure JPOXMLDOC01-appb-C000017
Figure JPOXMLDOC01-appb-C000018
Figure JPOXMLDOC01-appb-C000018
Figure JPOXMLDOC01-appb-C000019
Figure JPOXMLDOC01-appb-C000019
Figure JPOXMLDOC01-appb-C000020
Figure JPOXMLDOC01-appb-C000020
 (A)成分のポリウレアは、例えば、国際公開第2005/098542号を参考にして合成することができる。 The component (A) polyurea can be synthesized with reference to, for example, International Publication No. 2005/098542.
 (A)ポリウレアの重量平均分子量(Mw)は、1,000~200,000が好ましく、3,000~100,000がより好ましく、4,000~30,000がより一層好ましく、5,000~20,000が更に好ましい。また、その分散度(Mw/Mn)は、1.3~4.0が好ましく、1.4~2.5がより好ましい。なお、Mnは数平均分子量であり、Mw及びMnはゲルパーミエーションクロマトグラフィー(GPC)によるポリスチレン換算測定値である。 The weight average molecular weight (Mw) of (A) polyurea is preferably from 1,000 to 200,000, more preferably from 3,000 to 100,000, even more preferably from 4,000 to 30,000, and from 5,000 to 20,000 is more preferable. The dispersity (Mw/Mn) thereof is preferably 1.3 to 4.0, more preferably 1.4 to 2.5. In addition, Mn is a number average molecular weight and Mw and Mn are polystyrene conversion measurement values by gel permeation chromatography (GPC).
[(B)酸化合物又はその塩]
 本発明の剥離層形成用組成物は、(B)成分として酸化合物又はその塩を含む。前記酸化合物としては、p-トルエンスルホン酸、トリフルオロメタンスルホン酸、ピリジニウム-p-トルエンスルホネート、サリチル酸、カンファースルホン酸、スルホサリチル酸、4-クロロベンゼンスルホン酸、4-ヒドロキシベンゼンスルホン酸、ベンゼンジスルホン酸、1-ナフタレンスルホン酸等のスルホン酸化合物や、サリチル酸、スルホサリチル酸、クエン酸、安息香酸、ヒドロキシ安息香酸等のカルボン酸化合物が挙げられる。また、前記酸化合物の塩としては、前記酸のピリジニウム塩、イソプロパノールアミン塩、N-メチルモルホリン塩等が挙げられ、具体的には、p-トルエンスルホン酸ピリジニウム、1-ナフタレンスルホン酸ピリジニウム、イソプロパノールアミンp-トルエンスルホン酸塩、N-メチルモルホリンp-トルエンスルホン酸塩等が挙げられる。
[(B) Acid compound or salt thereof]
The composition for forming a release layer of the present invention contains an acid compound or a salt thereof as the component (B). Examples of the acid compound include p-toluenesulfonic acid, trifluoromethanesulfonic acid, pyridinium-p-toluenesulfonate, salicylic acid, camphorsulfonic acid, sulfosalicylic acid, 4-chlorobenzenesulfonic acid, 4-hydroxybenzenesulfonic acid, benzenedisulfonic acid, Examples thereof include sulfonic acid compounds such as 1-naphthalene sulfonic acid, and carboxylic acid compounds such as salicylic acid, sulfosalicylic acid, citric acid, benzoic acid, and hydroxybenzoic acid. Examples of the salt of the acid compound include pyridinium salt, isopropanolamine salt, N-methylmorpholine salt and the like of the acid, and specific examples thereof include pyridinium p-toluenesulfonate, pyridinium 1-naphthalenesulfonate, and isopropanol. Examples thereof include amine p-toluene sulfonate and N-methylmorpholine p-toluene sulfonate.
 (B)成分の含有量は、(A)成分のポリウレア100質量部に対し、0.01~30質量部が好ましく、0.1~20質量部がより好ましい。(B)成分の含有量が前記範囲であれば、高い耐熱性と適度な剥離性とを有し、製膜後の安定性に優れる剥離層を与え得る組成物が得られる。(B)酸化合物又はその塩は、1種単独で使用してもよく、2種以上を組み合わせて使用してもよい。 The content of the component (B) is preferably 0.01 to 30 parts by mass, and more preferably 0.1 to 20 parts by mass, relative to 100 parts by mass of the polyurea of the component (A). When the content of the component (B) is within the above range, it is possible to obtain a composition which has a high heat resistance and an appropriate peeling property and can give a peeling layer having excellent stability after film formation. The acid compound (B) or a salt thereof may be used alone or in combination of two or more.
[(C)架橋剤]
 本発明の剥離層形成用組成物は、(C)成分として架橋剤を含む。前記架橋剤は、ヒドロキシアルキル基及び/又はアルコキシメチル基で置換された窒素原子を有する化合物から選択されるものである。
[(C) Crosslinking agent]
The composition for forming a release layer of the present invention contains a crosslinking agent as the component (C). The cross-linking agent is selected from compounds having a nitrogen atom substituted with a hydroxyalkyl group and/or an alkoxymethyl group.
 前記架橋剤としては、下記式(C-1)~(C-7)のいずれかで表される化合物が好ましい。
Figure JPOXMLDOC01-appb-C000021
As the crosslinking agent, compounds represented by any of the following formulas (C-1) to (C-7) are preferable.
Figure JPOXMLDOC01-appb-C000021
 式中、R11~R38は、それぞれ独立に、水素原子又は炭素数1~6のアルキル基であるが、炭素数1~6のアルキル基が好ましい。R39は、水素原子又はメチル基である。 In the formula, R 11 to R 38 are each independently a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, preferably an alkyl group having 1 to 6 carbon atoms. R 39 is a hydrogen atom or a methyl group.
 前記架橋剤として具体的には、ヘキサメチロールメラミン、テトラメチロールベンゾグアナミン、1,3,4,6-テトラメチロールグリコールウリル、ヘキサメトキシメチルメラミン、テトラメトキシメチルベンゾグアナミン、1,3,4,6-テトラキス(メトキシメチル)グリコールウリル、1,3,4,6-テトラキス(ブトキシメチル)グリコールウリル、1,3,4,6-テトラキス(ヒドロキシメチル)グリコールウリル等の含窒素化合物が挙げられる。 Specific examples of the cross-linking agent include hexamethylolmelamine, tetramethylolbenzoguanamine, 1,3,4,6-tetramethylolglycoluril, hexamethoxymethylmelamine, tetramethoxymethylbenzoguanamine, 1,3,4,6-tetrakis( Examples thereof include nitrogen-containing compounds such as methoxymethyl)glycoluril, 1,3,4,6-tetrakis(butoxymethyl)glycoluril, and 1,3,4,6-tetrakis(hydroxymethyl)glycoluril.
 また、架橋剤として、オルネクス社製メトキシメチルタイプメラミン化合物(商品名サイメル(登録商標)300、サイメル301、サイメル303、サイメル350)、ブトキシメチルタイプメラミン化合物(商品名マイコート(登録商標)506、マイコート508)、グリコールウリル化合物(商品名サイメル1170、POWDERLINK 1174)、メチル化尿素樹脂(商品名UFR65)、ブチル化尿素樹脂(商品名UFR300、U-VAN10S60、U-VAN10R、U-VAN11HV)、DIC(株)製尿素/ホルムアルデヒド系樹脂(商品名ベッカミン(登録商標)J-300S、ベッカミンP-955、ベッカミンN)等の市販されている含窒素化合物が挙げられる。 Further, as a cross-linking agent, Ornex Co. methoxymethyl type melamine compound (trade name Cymel (registered trademark) 300, Cymel 301, Cymel 303, Cymel 350), butoxymethyl type melamine compound (trade name Mycoat (registered trademark) 506, Mycoat 508), glycoluril compound (trade name Cymel 1170, POWDERLINK 1174), methylated urea resin (trade name UFR65), butylated urea resin (trade names UFR300, U-VAN10S60, U-VAN10R, U-VAN11HV), Commercially available nitrogen-containing compounds such as urea/formaldehyde resin (trade name: Beckamine (registered trademark) J-300S, Beckamine P-955, Beckamine N) manufactured by DIC Corporation can be used.
 また、架橋剤として、3,3'-5,5'-テトラキス(メトキシメチル)-[1,1'-ビフェニル]-4,4'-ジオール、5,5'-(1-メチルエチリデン)ビス[2-ヒドロキシ-1,3-ベンゼンジメタノール]等の含芳香環化合物が挙げられる。 In addition, as a cross-linking agent, 3,3'-5,5'-tetrakis(methoxymethyl)-[1,1'-biphenyl]-4,4'-diol, 5,5'-(1-methylethylidene)bis Examples thereof include aromatic ring compounds such as [2-hydroxy-1,3-benzenedimethanol].
 更に、架橋剤として、N-ヒドロキシメチル(メタ)アクリルアミド、N-メトキシメチル(メタ)アクリルアミド、N-エトキシメチル(メタ)アクリルアミド、N-ブトキシメチル(メタ)アクリルアミド等のヒドロキシメチル基又はアルコキシメチル基で置換された(メタ)アクリルアミド化合物を使用して製造されるポリマーを用いることができる。そのようなポリマーとしては、例えば、ポリ(N-ブトキシメチル(メタ)アクリルアミド)、N-ブトキシメチル(メタ)アクリルアミドとスチレンとの共重合体、N-ヒドロキシメチル(メタ)アクリルアミドとメチル(メタ)アクリレートとの共重合体、N-エトキシメチルメタクリルアミドとベンジルメタクリレートの共重合体、N-ブトキシメチル(メタ)アクリルアミドとベンジル(メタ)アクリレートと2-ヒドロキシプロピル(メタ)アクリレートとの共重合体等が挙げられる。 Further, as a cross-linking agent, a hydroxymethyl group or an alkoxymethyl group such as N-hydroxymethyl(meth)acrylamide, N-methoxymethyl(meth)acrylamide, N-ethoxymethyl(meth)acrylamide, N-butoxymethyl(meth)acrylamide, etc. A polymer produced using a (meth)acrylamide compound substituted with can be used. Examples of such a polymer include poly(N-butoxymethyl(meth)acrylamide), a copolymer of N-butoxymethyl(meth)acrylamide and styrene, N-hydroxymethyl(meth)acrylamide and methyl(meth). Copolymer with acrylate, Copolymer with N-ethoxymethylmethacrylamide and benzyl methacrylate, Copolymer with N-butoxymethyl (meth)acrylamide, benzyl (meth)acrylate and 2-hydroxypropyl (meth)acrylate, etc. Are listed.
 前記架橋剤としてより好ましくは、ヘキサメトキシメチルメラミン、テトラメトキシメチルベンゾグアナミン、1,3,4,6-テトラキス(メトキシメチル)グリコールウリル(POWDERLINK 1174)、1,3,4,6-テトラキス(ブトキシメチル)グリコールウリル、1,3,4,6-テトラキス(ヒドロキシメチル)グリコールウリルが挙げられる。 More preferably, the crosslinking agent is hexamethoxymethylmelamine, tetramethoxymethylbenzoguanamine, 1,3,4,6-tetrakis(methoxymethyl)glycoluril (POWDERLINK 1174), 1,3,4,6-tetrakis(butoxymethyl). ) Glycoluril, 1,3,4,6-tetrakis(hydroxymethyl)glycoluril.
 これら架橋剤は、自己縮合による架橋反応を起こすことができる。また、(A)成分のポリウレア中のヒドロキシ基と架橋反応を起こすことができる。そして、このような架橋反応によって、形成される剥離層は強固になり、有機溶剤に対する溶解性が低い剥離層となる。 These cross-linking agents can cause a cross-linking reaction by self-condensation. Further, it can cause a crosslinking reaction with the hydroxy group in the polyurea as the component (A). Then, by such a crosslinking reaction, the peeling layer formed becomes strong and becomes a peeling layer having low solubility in an organic solvent.
 (C)成分の含有量は、(A)成分のポリウレア100質量部に対し、10~100質量部が好ましく、20~50質量部がより好ましい。(C)成分の含有量が前記範囲であれば、高耐熱性と適度な剥離性とを有し、製膜後の安定性に優れる剥離層を与え得る組成物が得られる。(C)架橋剤は、1種単独で使用してもよく、2種以上を組み合わせて使用してもよい。 The content of the component (C) is preferably 10 to 100 parts by mass, more preferably 20 to 50 parts by mass, relative to 100 parts by mass of the polyurea of the component (A). When the content of the component (C) is within the above range, a composition having high heat resistance and appropriate peelability and capable of providing a peeling layer having excellent stability after film formation can be obtained. The (C) crosslinking agent may be used alone or in combination of two or more kinds.
[(D)高分子添加剤]
 本発明の剥離層形成用組成物は、(D)成分として、下記式(a1)で表される繰り返し単位、下記式(b)で表される繰り返し単位及び下記式(c)で表される繰り返し単位を含む高分子添加剤を含む。
Figure JPOXMLDOC01-appb-C000022
[(D) Polymer additive]
The release layer-forming composition of the present invention is represented by the repeating unit represented by the following formula (a1), the repeating unit represented by the following formula (b), and the following formula (c) as the component (D). It includes a polymeric additive containing repeating units.
Figure JPOXMLDOC01-appb-C000022
 式中、RAは、それぞれ独立に、水素原子又はメチル基である。RB1は、少なくとも1つの水素原子がフッ素原子で置換された炭素数3又は4の分岐状のアルキル基である。RCは、炭素数1~10のヒドロキシアルキル基である。RDは、炭素数6~20の多環式アルキル基又は炭素数6~12のアリール基である。 In the formula, R A's are each independently a hydrogen atom or a methyl group. R B1 is a branched alkyl group having 3 or 4 carbon atoms in which at least one hydrogen atom is substituted with a fluorine atom. R C is a hydroxyalkyl group having 1 to 10 carbon atoms. R D is a polycyclic alkyl group having 6 to 20 carbon atoms or an aryl group having 6 to 12 carbon atoms.
 前記炭素数3又は4の分岐状アルキル基としては、イソプロピル基、イソブチル基、sec-ブチル基及びtert-ブチル基が挙げられる。RB1としては、これらの分岐状アルキル基の少なくとも1つの水素原子がフッ素原子で置換されたものが好ましく、具体例としては、1,1,1-トリフルオロイソプロピル基、1,1,1,3,3,3-ヘキサフルオロイソプロピル基、ノナフルオロtert-ブチル基等が挙げられる。 Examples of the branched alkyl group having 3 or 4 carbon atoms include isopropyl group, isobutyl group, sec-butyl group and tert-butyl group. R B1 is preferably one in which at least one hydrogen atom of these branched alkyl groups is substituted with a fluorine atom, and specific examples include a 1,1,1-trifluoroisopropyl group, 1,1,1, Examples thereof include a 3,3,3-hexafluoroisopropyl group and a nonafluorotert-butyl group.
 前記炭素数1~10のヒドロキシアルキル基としては、ヒドロキシメチル基、2-ヒドロキシエチル基、3-ヒドロキシプロピル基、4-ヒドロキシブチル基、5-ヒドロキシペンチル基、6-ヒドロキシヘキシル基、7-ヒドロキシヘプチル基、8-ヒドロキシオクチル基、9-ヒドロキシノニル基、10-ヒドロキシデシル基、2-ヒドロキシ-1-メチルエチル基、2-ヒドロキシ-1,1-ジメチルエチル基、3-ヒドロキシ-1-メチルプロピル基、3-ヒドロキシ-2-メチルプロピル基、3-ヒドロキシ-1,1-ジメチルプロピル基、3-ヒドロキシ-1,2-ジメチルプロピル基、3-ヒドロキシ-2,2-ジメチルプロピル基、4-ヒドロキシ-1-メチルブチル基、4-ヒドロキシ-2-メチルブチル基、4-ヒドロキシ-3-メチルブチル基等の炭素数1~10のヒドロキシアルキル基であって、ヒドロキシ基が結合する炭素原子が第1級炭素原子であるもの;1-ヒドロキシエチル基、1-ヒドロキシプロピル基、2-ヒドロキシプロピル基、1-ヒドロキシブチル基、2-ヒドロキシブチル基、1-ヒドロキシヘキシル基、2-ヒドロキシヘキシル基、1-ヒドロキシオクチル基、2-ヒドロキシオクチル基、1-ヒドロキシデシル基、2-ヒドロキシデシル基、1-ヒドロキシ-1-メチルエチル基、2-ヒドロキシ-2-メチルプロピル基等の炭素数2~10のヒドロキシアルキル基であって、ヒドロキシ基が結合する炭素原子が第2級又は第3級炭素原子であるものが挙げられる。RCとしては、特に、炭素数2~10のヒドロキシアルキル基であってヒドロキシ基が結合する炭素原子が第2級炭素原子であるものが好ましい。 Examples of the hydroxyalkyl group having 1 to 10 carbon atoms include hydroxymethyl group, 2-hydroxyethyl group, 3-hydroxypropyl group, 4-hydroxybutyl group, 5-hydroxypentyl group, 6-hydroxyhexyl group and 7-hydroxy group. Heptyl group, 8-hydroxyoctyl group, 9-hydroxynonyl group, 10-hydroxydecyl group, 2-hydroxy-1-methylethyl group, 2-hydroxy-1,1-dimethylethyl group, 3-hydroxy-1-methyl Propyl group, 3-hydroxy-2-methylpropyl group, 3-hydroxy-1,1-dimethylpropyl group, 3-hydroxy-1,2-dimethylpropyl group, 3-hydroxy-2,2-dimethylpropyl group, 4 A hydroxyalkyl group having 1 to 10 carbon atoms such as -hydroxy-1-methylbutyl group, 4-hydroxy-2-methylbutyl group, 4-hydroxy-3-methylbutyl group, etc., wherein the carbon atom to which the hydroxy group is bonded is the first Primary carbon atom; 1-hydroxyethyl group, 1-hydroxypropyl group, 2-hydroxypropyl group, 1-hydroxybutyl group, 2-hydroxybutyl group, 1-hydroxyhexyl group, 2-hydroxyhexyl group, 1 -Hydroxyoctyl group, 2-hydroxyoctyl group, 1-hydroxydecyl group, 2-hydroxydecyl group, 1-hydroxy-1-methylethyl group, 2-hydroxy-2-methylpropyl group and the like having 2 to 10 carbon atoms Examples thereof include hydroxyalkyl groups in which the carbon atom to which the hydroxy group is bonded is a secondary or tertiary carbon atom. R C is particularly preferably a hydroxyalkyl group having 2 to 10 carbon atoms in which the carbon atom to which the hydroxy group is bonded is a secondary carbon atom.
 前記炭素数6~20の多環式アルキル基としては、1-アダマンチル基、2-アダマンチル基、イソボルニル基、ノルボルニル基等が挙げられる。前記炭素数6~12のアリール基としては、フェニル基、1-ナフチル基、2-ナフチル基、1-ビフェニリル基、2-ビフェニリル基等が挙げられる。 Examples of the polycyclic alkyl group having 6 to 20 carbon atoms include 1-adamantyl group, 2-adamantyl group, isobornyl group and norbornyl group. Examples of the aryl group having 6 to 12 carbon atoms include phenyl group, 1-naphthyl group, 2-naphthyl group, 1-biphenylyl group and 2-biphenylyl group.
 また、(D)高分子添加剤は、下記式(a2)で表される繰り返し単位、下記式(b)で表される繰り返し単位、下記式(c)で表される繰り返し単位及び下記式(d)で表される繰り返し単位を含むものであってもよい。
Figure JPOXMLDOC01-appb-C000023
Further, the polymer additive (D) includes a repeating unit represented by the following formula (a2), a repeating unit represented by the following formula (b), a repeating unit represented by the following formula (c), and a following formula ( It may contain a repeating unit represented by d).
Figure JPOXMLDOC01-appb-C000023
 式中、RA、RC及びRDは、前記と同じ。RB2は、少なくとも1つの水素原子がフッ素原子で置換された炭素数3又は4の分岐状のアルキル基である(ただし、2-メチル-1,1,1,3,3,3-ヘキサフルオロイソプロピル基を除く。)。前記炭素数3又は4の分岐状のアルキル基としては、前述したものと同様のものが挙げられる。REは、単結合、炭素数6~20の多環式アルキレン基又は炭素数6~12のアリーレン基である。RFは、単結合又は炭素数1~10のアルキレン基である。RGは、メチル基、エチル基又はヒドロキシ基である。 In the formula, R A , R C and R D are the same as above. R B2 is a branched alkyl group having 3 or 4 carbon atoms in which at least one hydrogen atom is substituted with a fluorine atom (provided that 2-methyl-1,1,1,3,3,3-hexafluoro). Excluding isopropyl group.). Examples of the branched alkyl group having 3 or 4 carbon atoms include the same ones as described above. R E is a single bond, a polycyclic alkylene group having 6 to 20 carbon atoms or an arylene group having 6 to 12 carbon atoms. R F is a single bond or an alkylene group having 1 to 10 carbon atoms. R G is a methyl group, an ethyl group or a hydroxy group.
 前記炭素数6~20の多環式アルキレン基としては、前述した炭素数6~20の多環式アルキル基の具体例から水素原子を1つ除いた基が挙げられ、例えば、アダマンチレン基、イソボルニレン基、ノルボルニレン基等が挙げられる。 Examples of the polycyclic alkylene group having 6 to 20 carbon atoms include groups obtained by removing one hydrogen atom from the above-mentioned specific examples of polycyclic alkyl groups having 6 to 20 carbon atoms, and examples thereof include an adamantylene group, Examples thereof include an isobornylene group and a norbornylene group.
 前記炭素数6~12のアリーレン基としては、前述した炭素数6~12のアリール基の具体例から水素原子を1つ除いた基が挙げられ、例えば、フェニレン基、ナフチレン基、ビフェニリレン基等が挙げられる。 Examples of the arylene group having 6 to 12 carbon atoms include a group obtained by removing one hydrogen atom from the specific examples of the aryl group having 6 to 12 carbon atoms described above, and examples thereof include a phenylene group, a naphthylene group and a biphenylylene group. Can be mentioned.
 前記炭素数1~10のアルキレン基としては、前記Q2の説明において例示したものと同様のものを挙げることができる。本発明では、炭素数1~5のアルキレン基が好ましく、メチレン基及びエチレン基がより好ましく、メチレン基がより一層好ましい。 Examples of the alkylene group having 1 to 10 carbon atoms are the same as those exemplified in the description of Q 2 . In the present invention, an alkylene group having 1 to 5 carbon atoms is preferable, a methylene group and an ethylene group are more preferable, and a methylene group is even more preferable.
 式(a1)又は(a2)で表される繰り返し単位としては、下記式(a-1)~(a-3)で表されるものが挙げられるが、これらに限定されない。なお、下記式中、RAは、前記と同じである。
Figure JPOXMLDOC01-appb-C000024
Examples of the repeating unit represented by the formula (a1) or (a2) include, but are not limited to, those represented by the following formulas (a-1) to (a-3). In the formula below, R A is the same as above.
Figure JPOXMLDOC01-appb-C000024
 式(b)で表される繰り返し単位としては、下記式(b-1)~(b-16)で表されるものが挙げられるが、これらに限定されない。なお、下記式中、RAは、前記と同じである。
Figure JPOXMLDOC01-appb-C000025
Examples of the repeating unit represented by the formula (b) include, but are not limited to, those represented by the following formulas (b-1) to (b-16). In the formula below, R A is the same as above.
Figure JPOXMLDOC01-appb-C000025
 式(c)で表される繰り返し単位としては、下記式(c-1)~(c-13)で表されるものが挙げられるが、これらに限定されない。なお、下記式中、RAは、前記と同じである。
Figure JPOXMLDOC01-appb-C000026
Examples of the repeating unit represented by the formula (c) include, but are not limited to, those represented by the following formulas (c-1) to (c-13). In the formula below, R A is the same as above.
Figure JPOXMLDOC01-appb-C000026
 式(d)で表される繰り返し単位としては、下記式(d-1)~(d-8)で表されるものが挙げられるが、これらに限定されない。なお、下記式中、RAは、前記と同じである。
Figure JPOXMLDOC01-appb-C000027
Examples of the repeating unit represented by the formula (d) include, but are not limited to, those represented by the following formulas (d-1) to (d-8). In the formula below, R A is the same as above.
Figure JPOXMLDOC01-appb-C000027
 (D)高分子添加剤が、式(a1)で表される繰り返し単位、式(b)で表される繰り返し単位及び式(c)で表される繰り返し単位を含むものであって、式(b)で表される繰り返し単位中のヒドロキシアルキル基においてヒドロキシ基が結合する炭素原子が第2級又は第3級炭素原子である場合、式(a1)で表される繰り返し単位の含有率は、全繰り返し単位中、30~60モル%が好ましく、35~50モル%がより好ましい。式(b)で表される繰り返し単位の含有率は、全繰り返し単位中、10~35モル%が好ましく、15~30モル%がより好ましい。式(c)で表される繰り返し単位の含有率は、全繰り返し単位中、5~60モル%が好ましく、20~50モル%がより好ましい。 The polymer additive (D) contains a repeating unit represented by the formula (a1), a repeating unit represented by the formula (b) and a repeating unit represented by the formula (c), When the carbon atom to which the hydroxy group is bonded in the hydroxyalkyl group in the repeating unit represented by b) is a secondary or tertiary carbon atom, the content of the repeating unit represented by the formula (a1) is In all the repeating units, 30 to 60 mol% is preferable, and 35 to 50 mol% is more preferable. The content of the repeating unit represented by the formula (b) is preferably 10 to 35 mol% and more preferably 15 to 30 mol% in all repeating units. The content of the repeating unit represented by the formula (c) is preferably 5 to 60 mol% and more preferably 20 to 50 mol% in all repeating units.
 (D)高分子添加剤が、式(a1)で表される繰り返し単位、式(b)で表される繰り返し単位及び式(c)で表される繰り返し単位を含むものであって、式(b)で表される繰り返し単位中のヒドロキシアルキル基においてヒドロキシ基が結合する炭素原子が第1級炭素原子である場合、式(a1)で表される繰り返し単位の含有率は、全繰り返し単位中、15~60モル%が好ましく、25~60モル%がより好ましく、30~60モル%がより一層好ましく、35~50モル%が更に好ましい。式(b)で表される繰り返し単位の含有率は、全繰り返し単位中、8~38モル%が好ましく、10~38モル%が好ましく、10~35モル%がより好ましく、15~30モル%がより一層好ましい。式(c)で表される繰り返し単位の含有率は、全繰り返し単位中、2~77モル%が好ましく、2~65モル%がより好ましく、5~60モル%がより一層好ましく、20~50モル%が更に好ましい。 The polymer additive (D) contains a repeating unit represented by the formula (a1), a repeating unit represented by the formula (b) and a repeating unit represented by the formula (c), When the carbon atom to which the hydroxy group is bonded in the hydroxyalkyl group in the repeating unit represented by b) is a primary carbon atom, the content of the repeating unit represented by the formula (a1) is , 15 to 60 mol% is preferable, 25 to 60 mol% is more preferable, 30 to 60 mol% is much more preferable, and 35 to 50 mol% is further preferable. The content of the repeating unit represented by the formula (b) is preferably from 8 to 38 mol%, more preferably from 10 to 38 mol%, further preferably from 10 to 35 mol%, more preferably from 15 to 30 mol%, based on all repeating units. Is even more preferable. The content of the repeating unit represented by the formula (c) is preferably from 2 to 77 mol%, more preferably from 2 to 65 mol%, even more preferably from 5 to 60 mol%, and further preferably from 20 to 50, based on all repeating units. More preferred is mol %.
 (D)高分子添加剤が、式(a2)で表される繰り返し単位、式(b)で表される繰り返し単位、式(c)で表される繰り返し単位及び式(d)で表される繰り返し単位を含むものである場合、式(a2)で表される繰り返し単位の含有率は、全繰り返し単位中、2~45モル%が好ましく、5~35モル%がより好ましい。式(b)で表される繰り返し単位の含有率は、全繰り返し単位中、20~35モル%が好ましく、25~35モル%がより好ましい。式(c)で表される繰り返し単位の含有率は、全繰り返し単位中、30~45モル%が好ましく、35~45モル%がより好ましい。式(d)で表される繰り返し単位の含有率は、全繰り返し単位中、5~18モル%が好ましく、5~15モル%がより好ましい。 (D) The polymer additive is represented by the repeating unit represented by the formula (a2), the repeating unit represented by the formula (b), the repeating unit represented by the formula (c), and the formula (d). When it contains a repeating unit, the content of the repeating unit represented by the formula (a2) is preferably from 2 to 45 mol%, more preferably from 5 to 35 mol%, based on all repeating units. The content of the repeating unit represented by the formula (b) is preferably 20 to 35 mol% and more preferably 25 to 35 mol% in all repeating units. The content of the repeating unit represented by the formula (c) is preferably 30 to 45 mol% and more preferably 35 to 45 mol% in all repeating units. The content of the repeating unit represented by the formula (d) is preferably 5 to 18 mol% and more preferably 5 to 15 mol% in all repeating units.
 (D)高分子添加剤のMwは、2,000~10,000が好ましく、3,000~8,000がより好ましい。また、そのMw/Mnは、1.0~2.1が好ましく、1.0~1.9がより好ましい。 (D) The Mw of the polymer additive is preferably 2,000 to 10,000, more preferably 3,000 to 8,000. The Mw/Mn thereof is preferably 1.0 to 2.1, more preferably 1.0 to 1.9.
 (D)成分の高分子添加剤の含有量は、(A)成分のポリウレア100質量部に対し、3~100質量部であるが、3~80質量部がより好ましく、3~50質量部がより一層好ましい。高分子添加剤の含有量が3質量部未満であると、剥離力が大きくなることがあり、100質量部を超えると、製膜時にはじくことがある。(D)高分子添加剤は、1種単独で使用してもよく、2種以上を組み合わせて使用してもよい。 The content of the polymer additive of the component (D) is 3 to 100 parts by mass with respect to 100 parts by mass of the polyurea of the component (A), more preferably 3 to 80 parts by mass, and 3 to 50 parts by mass. Even more preferable. If the content of the polymer additive is less than 3 parts by mass, the peeling force may increase, and if it exceeds 100 parts by mass, it may repel during film formation. The polymer additives (D) may be used alone or in combination of two or more.
[(E)溶剤]
 本発明の剥離層形成用組成物は、(E)成分として溶剤を含む。前記溶剤としては、炭素数3~20のグリコールエーテル系溶剤、炭素数3~20のエステル系溶剤、炭素数3~20のケトン系溶剤又は炭素数3~20の環状化合物系溶剤が好ましい。
[(E) Solvent]
The composition for forming a release layer of the present invention contains a solvent as the component (E). The solvent is preferably a glycol ether solvent having 3 to 20 carbon atoms, an ester solvent having 3 to 20 carbon atoms, a ketone solvent having 3 to 20 carbon atoms, or a cyclic compound solvent having 3 to 20 carbon atoms.
 前記グリコールエーテル系溶剤としては、プロピレングリコールモノメチルエーテル(PGME)、プロピレングリコールモノメチルエーテルアセテート(PGMEA)、プロピレングリコールモノエチルエーテル、プロピレングリコールモノエチルエーテルアセテート、プロピレングリコールモノプロピルエーテル、プロピレングリコールモノブチルエーテル、エチレングリコールモノメチルエーテル、エチレングリコールジメチルエーテル、エチレングリコールジエチルエーテル、エチレングリコールモノメチルエーテルアセテート、ジエチレングリコールモノメチルエーテル、ジエチレングリコールモノエチルエーテル、ジエチレングリコールジメチルエーテル(Diglyme)、ジエチレングリコールジエチルエーテル、ジエチレングリコールモノヘキシルエーテル、ジエチレングリコールブチルメチルエーテル、トリエチレングリコールモノメチルエーテル、トリエチレングリコールジメチルエーテル(Triglyme)、ジエチレングリコールモノブチルエーテル、ジエチレングリコールエチルメチルエーテル、ジエチレングリコールイソプロピルメチルエーテル、ジエチレングリコールジブチルエーテル、ジメトキシテトラエチレングリコール、ジプロピレングリコールメチルエーテル、ジプロピレングリコールジメチルエーテル、ジプロピレングリコールモノメチルエーテル、ジエチレングリコールモノエチルエーテルアセタート(DEGEEA)、メトキシメチルブタノール、トリプロピレングリコールジメチルエーテル、トリエチレングリコールブチルメチルエーテル等が挙げられる。 As the glycol ether solvent, propylene glycol monomethyl ether (PGME), propylene glycol monomethyl ether acetate (PGMEA), propylene glycol monoethyl ether, propylene glycol monoethyl ether acetate, propylene glycol monopropyl ether, propylene glycol monobutyl ether, ethylene Glycol monomethyl ether, ethylene glycol dimethyl ether, ethylene glycol diethyl ether, ethylene glycol monomethyl ether acetate, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol dimethyl ether (Diglyce), diethylene glycol diethyl ether, diethylene glycol monohexyl ether, diethylene glycol butyl methyl ether, triethylene Glycol monomethyl ether, triethylene glycol dimethyl ether (Triglyme), diethylene glycol monobutyl ether, diethylene glycol ethyl methyl ether, diethylene glycol isopropyl methyl ether, diethylene glycol dibutyl ether, dimethoxytetraethylene glycol, dipropylene glycol methyl ether, dipropylene glycol dimethyl ether, dipropylene glycol monomethyl ether Examples thereof include ether, diethylene glycol monoethyl ether acetate (DEGEEA), methoxymethyl butanol, tripropylene glycol dimethyl ether, and triethylene glycol butyl methyl ether.
 前記エステル系溶剤としては、酢酸エチル、酢酸ブチル、酢酸メトキシブチル、酢酸アミル、酢酸イソプロピル、乳酸メチル、乳酸エチル(EL)、乳酸ブチル、2-ヒドロキシイソ酪酸メチル、2-ヒドロキシイソ酪酸エチル、3-エトキシプロピオン酸エチル等が挙げられる。 Examples of the ester solvent include ethyl acetate, butyl acetate, methoxybutyl acetate, amyl acetate, isopropyl acetate, methyl lactate, ethyl lactate (EL), butyl lactate, methyl 2-hydroxyisobutyrate, ethyl 2-hydroxyisobutyrate, and 3 -Ethyl ethoxypropionate and the like can be mentioned.
 前記ケトン系溶剤としては、メチルエチルケトン、メチルプロピルケトン、メチルイソブチルケトン、ジイソブチルケトン、ジアセトンアルコール、シクロヘキサノン、シクロペンタノン等が挙げられる。 Examples of the ketone solvent include methyl ethyl ketone, methyl propyl ketone, methyl isobutyl ketone, diisobutyl ketone, diacetone alcohol, cyclohexanone and cyclopentanone.
 前記環状化合物溶剤としては、テトラヒドロフラン、1,4-ジオキサン、1,3-ジオキソラン、2-ピロリドン、N-メチルピロリドン(NMP)、N-エチルピロリドン(NEP)、1,3-ジメチル-2-イミダゾリジノン(DMI)、γ-ブチロラクトン(GBL)等が挙げられる。 Examples of the solvent for the cyclic compound include tetrahydrofuran, 1,4-dioxane, 1,3-dioxolane, 2-pyrrolidone, N-methylpyrrolidone (NMP), N-ethylpyrrolidone (NEP) and 1,3-dimethyl-2-imidazo. Examples thereof include ridinone (DMI) and γ-butyrolactone (GBL).
 (E)成分の溶剤は、20℃における蒸気圧が800Pa以下の溶剤を少なくとも1種含む。前記溶剤の蒸気圧は、減圧乾燥時の揮発性の観点から、700Pa以下のものが好ましく、600Pa以下のものがより好ましい。蒸気圧の下限は、特に限定されないが、通常0.1Pa以上であり、0.5Pa以上が好ましい。蒸気圧が800Pa以下の溶剤としては、前述の溶剤のうち蒸気圧が800Pa以下のものが好ましい。このような溶剤としては、PGMEA、プロピレングリコールモノエチルエーテルアセテート、プロピレングリコールモノブチルエーテル、エチレングリコールジエチルエーテル、エチレングリコールモノメチルエーテルアセテート、ジエチレングリコールモノメチルエーテル、Diglyme、ジエチレングリコールジエチルエーテル、エチレングリコールブチルメチルエーテル、Triglyme、ジエチレングリコールジブチルエーテル、ジエチレングリコールエチルメチルエーテル、ジエチレングリコールイソプロピルメチルエーテル、ジメトキシテトラエチレングリコール、ジプロピレングリコールメチルエーテル、ジプロピレングリコールジメチルエーテル、DEGEEA、メトキシメチルブタノール、トリエチレングリコールブチルメチルエーテル、EL、乳酸ブチル、2-ヒドロキシイソ酪酸メチル、2-ヒドロキシイソ酪酸エチル、3-エトキシプロピオン酸エチル、ジアセトンアルコール、シクロヘキサノン、2-ピロリドン、NMP、NEP、DMI、GBL等が好ましい。 The component (E) solvent contains at least one solvent having a vapor pressure at 20° C. of 800 Pa or less. The vapor pressure of the solvent is preferably 700 Pa or less, more preferably 600 Pa or less, from the viewpoint of volatility during reduced pressure drying. The lower limit of the vapor pressure is not particularly limited, but is usually 0.1 Pa or higher, preferably 0.5 Pa or higher. As the solvent having a vapor pressure of 800 Pa or less, those having a vapor pressure of 800 Pa or less are preferable among the above-mentioned solvents. Examples of such a solvent include PGMEA, propylene glycol monoethyl ether acetate, propylene glycol monobutyl ether, ethylene glycol diethyl ether, ethylene glycol monomethyl ether acetate, diethylene glycol monomethyl ether, Diglyme, diethylene glycol diethyl ether, ethylene glycol butyl methyl ether, Triglyme, Diethylene glycol dibutyl ether, diethylene glycol ethyl methyl ether, diethylene glycol isopropyl methyl ether, dimethoxytetraethylene glycol, dipropylene glycol methyl ether, dipropylene glycol dimethyl ether, DEGEEA, methoxymethyl butanol, triethylene glycol butyl methyl ether, EL, butyl lactate, 2- Methyl hydroxyisobutyrate, ethyl 2-hydroxyisobutyrate, ethyl 3-ethoxypropionate, diacetone alcohol, cyclohexanone, 2-pyrrolidone, NMP, NEP, DMI, GBL and the like are preferable.
 20℃における蒸気圧が800Pa以下の溶剤の含有量は、減圧乾燥時の不揮発性の観点から、本発明の組成物中、1~99.9質量%が好ましく、1~90質量%がより好ましく、5~80質量%がより好ましい。 The content of the solvent having a vapor pressure of 800 Pa or less at 20° C. is preferably 1 to 99.9% by mass, more preferably 1 to 90% by mass in the composition of the present invention from the viewpoint of nonvolatility during drying under reduced pressure. It is more preferably 5 to 80% by mass.
 (E)溶剤の含有量は、本発明の剥離層形成用組成物中の固形分濃度が、0.1~40質量%となる量が好ましく、0.5~20質量%となる量がより好ましく、0.5~10質量%となる量がより一層好ましい。なお、固形分とは、剥離層形成用組成物の全成分のうち、溶剤以外のものの総称である。溶剤は、1種単独で使用してもよく、2種以上を組み合わせて使用してもよい。 The content of the solvent (E) is preferably such that the solid content concentration in the release layer-forming composition of the present invention is 0.1 to 40% by mass, and more preferably 0.5 to 20% by mass. An amount of 0.5 to 10% by mass is more preferable. In addition, the solid content is a general term for components other than the solvent among all components of the composition for forming a release layer. The solvent may be used alone or in combination of two or more.
[その他の添加物]
 本発明の剥離層形成用組成物は、必要に応じて界面活性剤を含んでもよい。界面活性剤を添加することで、基板に対する前記剥離層形成用組成物の塗布性を向上させることができる。前記界面活性剤としては、ノニオン系界面活性剤、フッ素系界面活性剤、シリコーン系界面活性剤等の公知の界面活性剤を用いることができる。
[Other additives]
The release layer-forming composition of the present invention may contain a surfactant, if necessary. By adding the surfactant, the coating property of the release layer-forming composition on the substrate can be improved. As the surfactant, known surfactants such as nonionic surfactants, fluorine-based surfactants and silicone-based surfactants can be used.
 前記ノニオン系界面活性剤の具体例としては、例えば、ポリオキシエチレンラウリルエーテル、ポリオキシエチレンステアリルエーテル、ポリオキシエチレンセチルエーテル、ポリオキシエチレンオレイルエーテル等のポリオキシエチレンアルキルエーテル類;ポリオキシエチレンオクチルフェニルエーテル、ポリオキシエチレンノニルフェニルエーテル等のポリオキシエチレンアルキルアリールエーテル類;ポリオキシエチレン・ポリオキシプロピレンブロックコポリマー類;ソルビタンモノラウレート、ソルビタンモノパルミテート、ソルビタンモノステアレート、ソルビタンモノオレエート、ソルビタントリオレエート、ソルビタントリステアレート等のソルビタン脂肪酸エステル類;ポリオキシエチレンソルビタンモノラウレート、ポリオキシエチレンソルビタンモノパルミテート、ポリオキシエチレンソルビタンモノステアレート、ポリオキシエチレンソルビタントリオレエート、ポリオキシエチレンソルビタントリステアレート等のポリオキシエチレンソルビタン脂肪酸エステル類等が挙げられる。 Specific examples of the nonionic surfactant include polyoxyethylene alkyl ethers such as polyoxyethylene lauryl ether, polyoxyethylene stearyl ether, polyoxyethylene cetyl ether, and polyoxyethylene oleyl ether; polyoxyethylene octyl. Polyoxyethylene alkylaryl ethers such as phenyl ether and polyoxyethylene nonylphenyl ether; polyoxyethylene/polyoxypropylene block copolymers; sorbitan monolaurate, sorbitan monopalmitate, sorbitan monostearate, sorbitan monooleate, Sorbitan fatty acid esters such as sorbitan trioleate and sorbitan tristearate; polyoxyethylene sorbitan monolaurate, polyoxyethylene sorbitan monopalmitate, polyoxyethylene sorbitan monostearate, polyoxyethylene sorbitan trioleate, polyoxyethylene sorbitan Examples thereof include polyoxyethylene sorbitan fatty acid esters such as tristearate.
 前記フッ素系界面活性剤等としては、エフトップ(登録商標)EF301、EF303、EF352(三菱マテリアル電子化成(株)製)、メガファック(登録商標)F171、F173、F554、F559、F563、R-30、R-40、R-40-LM、DS-21(DIC(株)製)、FLUORAD(登録商標)FC430、FC431(スリーエム社製)、アサヒガード(登録商標)AG710、サーフロン(登録商標)S-382、SC101、SC102、SC103、SC104、SC105、SC106(旭硝子(株)製)等が挙げられる。 Examples of the fluorine-based surfactants include Ftop (registered trademark) EF301, EF303, EF352 (manufactured by Mitsubishi Materials Electronic Chemicals Co., Ltd.), Megafac (registered trademark) F171, F173, F554, F559, F563, R- 30, R-40, R-40-LM, DS-21 (manufactured by DIC Corporation), FLUORAD (registered trademark) FC430, FC431 (manufactured by 3M), Asahi Guard (registered trademark) AG710, Surflon (registered trademark) Examples thereof include S-382, SC101, SC102, SC103, SC104, SC105, SC106 (manufactured by Asahi Glass Co., Ltd.).
 また、シリコーン系界面活性剤としては、オルガノシロキサンポリマーKP341(信越化学工業(株)製)等が挙げられる。 Also, examples of the silicone-based surfactant include organosiloxane polymer KP341 (manufactured by Shin-Etsu Chemical Co., Ltd.) and the like.
 前記剥離層形成用組成物が界面活性剤を含む場合、その含有量は、(A)ポリウレア100質量部に対し、0.0001~1質量部が好ましく、0.001~0.5質量部がより好ましい。前記界面活性剤は、1種単独で使用してもよく、2種以上を組み合わせて使用してもよい。 When the composition for forming a release layer contains a surfactant, the content thereof is preferably 0.0001 to 1 part by mass, and 0.001 to 0.5 part by mass, relative to 100 parts by mass of (A) polyurea. More preferable. The surfactants may be used alone or in combination of two or more.
[スリットダイコート用剥離層形成用組成物の調製]
 本発明のスリットダイコート用剥離層形成用組成物の調製方法は、特に限定されない。調製方法としては、例えば、溶剤に溶解した(A)成分の溶液に(B)成分、(C)成分、(D)成分及び(E)成分等を所定の割合で混合し、均一な溶液とする方法や、前記調製方法の適当な段階において、必要に応じてその他添加剤を更に添加して混合する方法が挙げられる。
[Preparation of composition for forming release layer for slit die coat]
The method for preparing the composition for forming a release layer for slit die coating of the present invention is not particularly limited. As a preparation method, for example, a solution of the component (A) dissolved in a solvent is mixed with the components (B), (C), (D) and (E) at a predetermined ratio to form a uniform solution. And a method in which other additives are further added and mixed at an appropriate stage of the above-mentioned preparation method, if necessary.
 本発明の剥離層形成用組成物の調製においては、溶剤中の重合反応によって得られる特定共重合体(ポリマー)の溶液をそのまま使用することができる。この場合、例えば、(A)成分の溶液に、前記と同様に(B)成分、更には(C)成分、(D)成分、(E)成分等を入れて均一な溶液とする。この際に、濃度調整を目的として更に溶剤を追加投入してもよい。このとき、(A)成分の生成過程で用いられる溶剤と、剥離層形成用組成物の濃度調整に用いられる溶剤とは同一であってもよく、また異なってもよい。 In the preparation of the release layer-forming composition of the present invention, the solution of the specific copolymer (polymer) obtained by the polymerization reaction in the solvent can be used as it is. In this case, for example, the component (A), the component (B), the component (C), the component (D), and the component (E) are added to the solution as described above to form a uniform solution. At this time, a solvent may be additionally added for the purpose of adjusting the concentration. At this time, the solvent used in the production process of the component (A) and the solvent used for adjusting the concentration of the release layer-forming composition may be the same or different.
 また、調製された剥離層形成用組成物の溶液は、孔径が0.2μm程度のフィルター等を用いて濾過した後、使用することが好ましい。 Also, it is preferable to use the prepared solution of the composition for forming a release layer after filtering it with a filter having a pore size of about 0.2 μm.
 本発明の剥離層形成用組成物の粘度は、作製する剥離層の厚み等を勘案して適宜設定するものではあるが、特に0.01~5μm程度の厚さの膜を再現性よく得ることを目的とする場合、通常、25℃で1~5,000mPa・s程度、好ましくは1~2,000mPa・s程度である。 The viscosity of the release layer-forming composition of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, etc., but in particular, a film having a thickness of about 0.01 to 5 μm can be reproducibly obtained. For the purpose, it is usually about 1 to 5,000 mPa·s at 25° C., preferably about 1 to 2,000 mPa·s.
 ここで、粘度は、市販の液体の粘度測定用粘度計を使用して、例えば、JIS K7117-2に記載の手順を参照して、剥離層形成用組成物の温度25℃の条件にて測定することができる。好ましくは、粘度計としては、円錐平板型(コーンプレート型)回転粘度計を使用し、好ましくは同型の粘度計で標準コーンロータとして1°34'×R24を使用して、剥離層形成用組成物の温度25℃の条件にて測定することができる。このような回転粘度計としては、例えば、東機産業(株)製TVE-25Lが挙げられる。 Here, the viscosity is measured using a commercially available liquid viscometer for measuring the viscosity of the composition for forming the release layer at a temperature of 25° C., for example, by referring to the procedure described in JIS K7117-2. can do. Preferably, a conical plate type (cone plate type) rotational viscometer is used as the viscometer, and 1°34′×R24 is preferably used as a standard cone rotor with the same type of viscometer, and a composition for forming a peeling layer is used. It can be measured under the condition that the temperature of the object is 25°C. An example of such a rotational viscometer is TVE-25L manufactured by Toki Sangyo Co., Ltd.
[剥離層]
 本発明のスリットダイコート用剥離層形成用組成物を、スリットダイコータを用いて基体上にスリットダイコート法によって塗布した後、180~250℃で焼成する工程を含む焼成法にて、基体との優れた密着性及び樹脂基板との適度な密着性と適度な剥離性とを有する剥離層を得ることができる。
[Peeling layer]
The composition for forming a release layer for slit die coat of the present invention is applied to a substrate by a slit die coater using a slit die coater and then baked at 180 to 250°C. It is possible to obtain a release layer having an adhesiveness, an appropriate adhesiveness with a resin substrate, and an appropriate releasability.
 加熱時間は、加熱温度によって異なるため一概に規定できないが、通常1分間~5時間である。また、前記焼成時の温度は、最高温度が前記範囲となる限り、それ以下の温度で焼成する工程を含んでもよい。 ㆍThe heating time cannot be specified because it depends on the heating temperature, but it is usually 1 minute to 5 hours. Further, the firing temperature may include a step of firing at a temperature lower than the maximum temperature as long as it falls within the above range.
 本発明における加熱態様の好ましい一例としては、50~150℃で1分間~1時間加熱した後に、そのまま加熱温度を上昇させて180~250℃で5分間~4時間加熱する態様が挙げられる。特に、加熱態様のより好ましい一例としては、50~150℃で1分間~1時間加熱し、200~250℃で5分間~2時間加熱する態様が挙げられる。更に、加熱態様のより好ましい他の一例としては、50~150℃で1~30分間加熱した後に、200~250℃で5分間~1時間加熱する態様が挙げられる。 A preferable example of the heating mode in the present invention is a mode in which after heating at 50 to 150° C. for 1 minute to 1 hour, the heating temperature is raised as it is and heating at 180 to 250° C. for 5 minutes to 4 hours. In particular, a more preferable example of the heating mode is a mode in which heating is performed at 50 to 150° C. for 1 minute to 1 hour, and heating is performed at 200 to 250° C. for 5 minutes to 2 hours. Further, as another more preferable example of the heating mode, there is a mode of heating at 50 to 150° C. for 1 to 30 minutes and then heating at 200 to 250° C. for 5 minutes to 1 hour.
 なお、本発明の剥離層を基体上に形成する場合、剥離層は基体の一部表面に形成されていてもよいし、全面に形成されていてもよい。基体の一部表面に剥離層を形成する態様としては、基体表面のうち所定の範囲にのみ剥離層を形成する態様、基体表面全面にドットパターン、ラインアンドスペースパターン等のパターン状に剥離層を形成する態様等がある。なお、本発明において、基体とは、その表面に本発明の剥離層形成用組成物が塗られるものであって、フレキシブル電子デバイス等の製造に用いられるものを意味する。 When the release layer of the present invention is formed on a substrate, the release layer may be formed on a partial surface of the substrate or may be formed on the entire surface. The mode of forming the release layer on a part of the surface of the substrate is such that the release layer is formed only in a predetermined range on the surface of the substrate, or the release layer is formed in a pattern such as a dot pattern or a line and space pattern on the entire surface of the substrate. There is a mode of forming the like. In addition, in the present invention, the substrate means a substrate whose surface is coated with the composition for forming a release layer, which is used for manufacturing a flexible electronic device or the like.
 基体(基材)としては、例えば、ガラス、金属(シリコンウエハ等)、スレート等が挙げられるが、特に、本発明の剥離層形成用組成物から得られる剥離層がそれに対する十分な密着性を有することから、ガラスが好ましい。なお、基体表面は、単一の材料で構成されていてもよく、2以上の材料で構成されていてもよい。2以上の材料で基体表面が構成される態様としては、基体表面のうち、ある範囲はある材料で構成され、その余の表面はその他の材料で構成されている態様、基体表面全体にドットパターン、ラインアンドスペースパターン等のパターン状にある材料がその他の材料中に存在する態様等がある。 Examples of the substrate (substrate) include glass, metal (silicon wafer, etc.), slate, and the like. In particular, the release layer obtained from the release layer-forming composition of the present invention has sufficient adhesion to it. Glass is preferable because it has. The surface of the substrate may be made of a single material or may be made of two or more materials. As a mode in which the substrate surface is composed of two or more materials, a certain range of the substrate surface is composed of a certain material, and the remaining surface is composed of another material. , A pattern-like material such as a line-and-space pattern exists in another material.
 加熱に用いる器具としては、例えば、ホットプレート、オーブン等が挙げられる。加熱雰囲気は、空気下であっても不活性ガス下であってもよく、また、常圧下であっても減圧下であってもよい。 Examples of equipment used for heating include hot plates and ovens. The heating atmosphere may be under air or under an inert gas, and may be under normal pressure or under reduced pressure.
 剥離層の厚さは、通常0.01~50μm程度、生産性の観点から、好ましくは0.01~20μm程度、より好ましくは0.01~5μm程度であり、加熱前の塗膜の厚さを調整して所望の厚さを実現する。 The thickness of the release layer is usually about 0.01 to 50 μm, preferably about 0.01 to 20 μm, more preferably about 0.01 to 5 μm from the viewpoint of productivity, and the thickness of the coating film before heating. To achieve the desired thickness.
 本発明の剥離層は、基体、特にガラスの基体との優れた密着性、並びに樹脂基板との適度な密着性及び適度な剥離性を有する。それ故、本発明の剥離層は、フレキシブル電子デバイスの製造プロセスにおいて、当該デバイスの樹脂基板に損傷を与えることなく、当該樹脂基板をその樹脂基板上に形成された回路等とともに基体から剥離させるために好適に用いることができる。 The release layer of the present invention has excellent adhesion to a substrate, particularly a glass substrate, and appropriate adhesion to a resin substrate and appropriate release properties. Therefore, the peeling layer of the present invention is used for peeling the resin substrate together with the circuit and the like formed on the resin substrate from the substrate in the manufacturing process of the flexible electronic device without damaging the resin substrate of the device. Can be suitably used.
[樹脂基板の製造方法]
 本発明の剥離層を用いたフレキシブル電子デバイスの製造方法の一例について説明する。まず、本発明のスリットダイコート用剥離層形成用組成物を用いて、前述の方法によって、ガラス基体上に剥離層を形成する。この剥離層の上に、樹脂基板を形成するための樹脂基板形成用溶液を塗布し、得られた塗膜を焼成することで、本発明の剥離層を介してガラス基体に固定された樹脂基板を形成する。
[Method of manufacturing resin substrate]
An example of a method for manufacturing a flexible electronic device using the release layer of the present invention will be described. First, the composition for forming a release layer for slit die coating of the present invention is used to form a release layer on a glass substrate by the method described above. A resin substrate fixed on a glass substrate via the release layer of the present invention by applying a resin substrate forming solution for forming a resin substrate on the release layer and baking the resulting coating film. To form.
 前記塗膜の焼成温度は、樹脂の種類等に応じて適宜設定されるものであるが、本発明では、この焼成時の最高温度を200~250℃とすることが好ましく、210~250℃とすることがより好ましく、220~240℃とすることが更に好ましい。樹脂基板作製の際の焼成時の最高温度をこの範囲とすることで、下地である剥離層と基体との密着性や、剥離層と樹脂基板との適度な密着性及び剥離性をより向上させることができる。この場合も、最高温度が前記範囲となる限り、それ以下の温度で焼成する工程を含んでもよい。 The baking temperature of the coating film is appropriately set according to the type of resin, etc., but in the present invention, the maximum temperature during baking is preferably 200 to 250° C., and 210 to 250° C. It is more preferable that the temperature is 220 to 240° C. By setting the maximum temperature during firing during the production of the resin substrate within this range, the adhesiveness between the base release layer and the substrate, and the appropriate adhesiveness and release property between the release layer and the resin substrate are further improved. be able to. Also in this case, as long as the maximum temperature falls within the above range, a step of firing at a temperature below that may be included.
 樹脂基板は剥離層を全て覆うようにして、剥離層の面積と比較して大きい面積で、樹脂基板を形成する。樹脂基板としては、アクリルポリマーからなる樹脂基板やシクロオレフィンポリマーからなる樹脂基板が挙げられる。当該樹脂基板の形成方法は、常法に従えばよい。また、前記樹脂基板としては、波長400nmの光透過率が80%以上であるものが好ましい。 -The resin substrate covers the release layer entirely, and the resin substrate is formed in an area larger than the area of the release layer. Examples of the resin substrate include a resin substrate made of an acrylic polymer and a resin substrate made of a cycloolefin polymer. The resin substrate may be formed by a conventional method. The resin substrate preferably has a light transmittance of 80% or more at a wavelength of 400 nm.
 次に、本発明の剥離層を介して基体に固定された当該樹脂基板の上に、必要に応じて所望の回路を形成し、その後、例えば剥離層に沿って樹脂基板をカットし、この回路とともに樹脂基板を剥離層から剥離して、樹脂基板と基体とを分離する。この際、基体の一部を剥離層とともにカットしてもよい。本発明の剥離層を用いれば、樹脂基板を剥離層から0.15N/25mm以下、特に0.1N/25mm以下の剥離力で剥離することができる。 Next, a desired circuit is formed, if necessary, on the resin substrate fixed to the substrate via the release layer of the present invention, and then the resin substrate is cut along the release layer, for example. At the same time, the resin substrate is separated from the release layer to separate the resin substrate and the base body. At this time, a part of the substrate may be cut together with the release layer. When the release layer of the present invention is used, the resin substrate can be released from the release layer with a release force of 0.15 N/25 mm or less, particularly 0.1 N/25 mm or less.
 以下、合成例、調製例、実施例及び比較例を挙げて本発明を更に詳しく説明するが、本発明は、下記実施例に限定されない。 Hereinafter, the present invention will be described in more detail with reference to Synthesis Examples, Preparation Examples, Examples, and Comparative Examples, but the present invention is not limited to the following Examples.
 下記例で使用した化合物は、以下のとおりである。なお、蒸気圧は20℃における値である。
PGME:プロピレングリコールモノメチルエーテル(蒸気圧1200Pa)
PGMEA:プロピレングリコールモノメチルエーテルアセテート(蒸気圧500Pa)
EL:エチルラクテート(蒸気圧279Pa)
GBL:γ-ブチロラクトン(蒸気圧150Pa)
DEGEEA:ジエチレングリコールモノエチルエーテルアセタート(蒸気圧6Pa)
Triglyme:トリエチレングリコールジメチルエーテル(蒸気圧120Pa)
Diglyme:ジエチレングリコールジメチルエーテル(蒸気圧330Pa)
PL-LI:1,3,4,6-テトラキス(メトキシエチル)グリコールウリル(オルネクス社製、商品名:POWDERLINK 1174)
PPTS:p-トルエンスルホン酸ピリジニウム
IBXA:メタクリル酸イソボルニル
HPMA:メタクリル酸2-ヒドロキシプロピル
ADMA:メタクリル酸2-アダマンチル
HFiPMA:メタクリル酸1,1,1,3,3,3-ヘキサフルオロイソプロピル
AIBN:アゾビスイソブチロニトリル
The compounds used in the following examples are as follows. The vapor pressure is the value at 20°C.
PGME: Propylene glycol monomethyl ether (vapor pressure 1200 Pa)
PGMEA: Propylene glycol monomethyl ether acetate (vapor pressure 500 Pa)
EL: Ethyl lactate (vapor pressure 279 Pa)
GBL: γ-butyrolactone (vapor pressure 150 Pa)
DEGEEA: Diethylene glycol monoethyl ether acetate (vapor pressure 6 Pa)
Triglyme: Triethylene glycol dimethyl ether (vapor pressure 120 Pa)
Diglyme: Diethylene glycol dimethyl ether (vapor pressure 330 Pa)
PL-LI: 1,3,4,6-tetrakis(methoxyethyl)glycoluril (manufactured by Ornex, trade name: POWDERLINK 1174)
PPTS: pyridinium p-toluenesulfonate IBXA: isobornyl methacrylate HPMA: 2-hydroxypropyl methacrylate ADMA: 2-adamantyl methacrylate HFiPMA: 1,1,1,3,3,3-hexafluoroisopropyl methacrylate AIBN:azo Bisisobutyronitrile
 また、ポリマーの重量平均分子量(Mw)の測定は、日本分光(株)製GPC装置(カラム:Shodex(登録商標)KD801及びKD805(昭和電工(株)製);溶離液:ジメチルホルムアミド/LiBr・H2O(29.6mM)/H3PO4(29.6mM)/THF(0.1質量%);流量:1.0mL/分;カラム温度:40℃;Mw:標準ポリスチレン換算値)を用いて行った。 Further, the weight average molecular weight (Mw) of the polymer is measured by a GPC device manufactured by JASCO Corporation (column: Shodex (registered trademark) KD801 and KD805 (manufactured by Showa Denko KK); eluent: dimethylformamide/LiBr. H 2 O (29.6 mM)/H 3 PO 4 (29.6 mM)/THF (0.1% by mass); flow rate: 1.0 mL/min; column temperature: 40° C.; Mw: standard polystyrene conversion value) It was done using.
[1]ポリマーの合成
[合成例1]ポリウレア(L1)の合成
 モノアリルジグリシジルイソシアヌル酸(四国化成工業(株)製)100g、5,5-ジエチルバルビツール酸66.4g及びベンジルトリエチルアンモニウムクロリド4.1gをPGME682gに溶解させた後、130℃で24時間反応させ、ポリウレア(L1)を含む溶液(固形分濃度20質量%)を得た。GPC分析の結果、得られたポリウレア(L1)のMwは8,000、Mw/Mnは1.5であった。
[1] Synthesis of Polymer [Synthesis Example 1] Synthesis of Polyurea (L1) 100 g of monoallyl diglycidyl isocyanuric acid (manufactured by Shikoku Chemicals Co., Ltd.), 66.4 g of 5,5-diethylbarbituric acid and benzyltriethylammonium chloride After dissolving 4.1 g of PGME682g, it was made to react at 130 degreeC for 24 hours, and the solution (solid content concentration 20 mass%) containing polyurea (L1) was obtained. As a result of GPC analysis, the obtained polyurea (L1) had Mw of 8,000 and Mw/Mn of 1.5.
[合成例2]アクリルポリマー(S1)の合成
 HFiPMA4.02g、HPMA2.22g、ADMA5.00g及びAIBN0.47gをPGME49.1gに溶解し、70℃にて20時間反応させ、アクリルポリマー(S1)溶液(固形分濃度20質量%)を得た。各単位の組成比は、HFiPMA:HPMA:ADMA=30:30:40であった。GPC分析の結果、得られたアクリルポリマー(S1)のMwは5,040、Mw/Mnは1.7であった。
[Synthesis Example 2] Synthesis of acrylic polymer (S1) 4.02 g of HFiPMA, 2.22 g of HPMA, 4.00 g of ADMA and 0.47 g of AIBN were dissolved in 49.1 g of PGME and reacted at 70° C. for 20 hours to prepare an acrylic polymer (S1) solution. (Solid content concentration 20% by mass) was obtained. The composition ratio of each unit was HFiPMA:HPMA:ADMA=30:30:40. As a result of GPC analysis, the acrylic polymer (S1) obtained had Mw of 5,040 and Mw/Mn of 1.7.
[合成例3]アクリルポリマー(S2)の合成
 HFiPMA3.98g、HPMA2.43g、IBXA5.00g及びAIBN0.46gをPGME49.8gに溶解し、70℃にて20時間反応させ、アクリルポリマー(S2)溶液(固形分濃度20質量%)を得た。各単位の組成比は、HFiPMA:HPMA:IBXA=30:30:40であった。GPC分析の結果、得られたアクリルポリマー(S2)のMwは4,720、Mw/Mnは1.7であった。
[Synthesis Example 3] Synthesis of acrylic polymer (S2) 3.98 g of HFiPMA, 2.43 g of HPMA, 5.00 g of IBXA and 0.46 g of AIBN were dissolved in 49.8 g of PGME and reacted at 70°C for 20 hours to prepare an acrylic polymer (S2) solution. (Solid content concentration 20% by mass) was obtained. The composition ratio of each unit was HFiPMA:HPMA:IBXA=30:30:40. As a result of GPC analysis, the acrylic polymer (S2) obtained had Mw of 4,720 and Mw/Mn of 1.7.
[2]樹脂基板形成用組成物の調製
[調製例1]樹脂基板形成用組成物F1の調製
 四塩化炭素100gを入れたナスフラスコに、ゼオノア(登録商標)1020R(日本ゼオン(株)製シクロオレフィンポリマー)10g及びエポリード(登録商標)GT401((株)ダイセル製)3gを添加した。この溶液を、窒素雰囲気下、24時間攪拌して溶解し、樹脂基板形成用組成物F1を調製した。
[2] Preparation of Resin Substrate Forming Composition [Preparation Example 1] Preparation of Resin Substrate Forming Composition F1 In a round-bottomed flask containing 100 g of carbon tetrachloride, ZEONOR (registered trademark) 1020R (manufactured by ZEON CORPORATION) 10 g of olefin polymer and 3 g of Epolide (registered trademark) GT401 (manufactured by Daicel Corporation) were added. This solution was stirred and dissolved in a nitrogen atmosphere for 24 hours to prepare a resin substrate-forming composition F1.
[3]スリットダイコート用剥離層形成用組成物の調製
[実施例1-1]剥離層形成用組成物1の調製
 合成例1で得られた反応液20gに、PL-LI1.00g、PPTS0.12g、アクリルポリマー(S1)溶液1.50g及びPGMEAを加え、固形分濃度が5質量%、PGMEA濃度が30質量%となるようにPGMEで希釈し、剥離層形成用組成物1を調製した。
[3] Preparation of Release Layer Forming Composition for Slit Die Coat [Example 1-1] Preparation of Release Layer Forming Composition 1 20 g of the reaction solution obtained in Synthesis Example 1 was mixed with 1.00 g of PL-LI and 0.005 of PPTS. 12 g, an acrylic polymer (S1) solution 1.50 g and PGMEA were added, and diluted with PGME so that the solid content concentration was 5% by mass and the PGMEA concentration was 30% by mass to prepare a release layer forming composition 1.
[実施例1-2]剥離層形成用組成物2の調製
 固形分濃度が5質量%、PGMEA濃度が70質量%となるようにした以外は、実施例1-1と同様の方法で剥離層形成用組成物2を調製した。
[Example 1-2] Preparation of release layer-forming composition 2 The release layer was prepared in the same manner as in Example 1-1, except that the solid content concentration was 5% by mass and the PGMEA concentration was 70% by mass. A forming composition 2 was prepared.
[実施例1-3]剥離層形成用組成物3の調製
 PGMEAのかわりにELを使用し、固形分濃度が5質量%、EL濃度が30質量%となるようにした以外は、実施例1-1と同様の方法で剥離層形成用組成物3を調製した。
[Example 1-3] Preparation of release layer-forming composition 3 Example 1 was repeated except that EL was used instead of PGMEA so that the solid content concentration was 5% by mass and the EL concentration was 30% by mass. A release layer-forming composition 3 was prepared in the same manner as in -1.
[実施例1-4]剥離層形成用組成物4の調製
 PGMEAのかわりにELを使用し、固形分濃度が5質量%、EL濃度が70質量%となるようにした以外は、実施例1-1と同様の方法で剥離層形成用組成物4を調製した。
[Example 1-4] Preparation of release layer-forming composition 4 Example 1 was repeated except that EL was used instead of PGMEA so that the solid content concentration was 5% by mass and the EL concentration was 70% by mass. A release layer-forming composition 4 was prepared in the same manner as in -1.
[実施例1-5]剥離層形成用組成物5の調製
 PGMEAのかわりにGBLを使用し、固形分濃度が5質量%、GBL濃度が30質量%となるようにした以外は、実施例1-1と同様の方法で剥離層形成用組成物5を調製した。
[Example 1-5] Preparation of release layer-forming composition 5 Example 1 was repeated except that GBL was used instead of PGMEA so that the solid content concentration was 5% by mass and the GBL concentration was 30% by mass. A release layer forming composition 5 was prepared in the same manner as in -1.
[実施例1-6]剥離層形成用組成物6の調製
 PGMEAのかわりにGBLを使用し、固形分濃度が5質量%、GBL濃度が10質量%となるようにした以外は、実施例1-1と同様の方法で剥離層形成用組成物6を調製した。
[Example 1-6] Preparation of release layer-forming composition 6 Example 1 was repeated except that GBL was used instead of PGMEA so that the solid content concentration was 5% by mass and the GBL concentration was 10% by mass. A release layer-forming composition 6 was prepared in the same manner as in -1.
[実施例1-7]剥離層形成用組成物7の調製
 PGMEAのかわりにTriglymeを使用し、固形分濃度が5質量%、Triglyme濃度が30質量%となるようにした以外は、実施例1-1と同様の方法で剥離層形成用組成物7を調製した。
[Example 1-7] Preparation of release layer-forming composition 7 Example 1 was repeated except that Triglyme was used instead of PGMEA so that the solid content concentration was 5% by mass and the Triglyme concentration was 30% by mass. A release layer forming composition 7 was prepared in the same manner as in -1.
[実施例1-8]剥離層形成用組成物8の調製
 PGMEAのかわりにTriglymeを使用し、固形分濃度が5質量%、Triglyme濃度が10質量%となるようにした以外は、実施例1-1と同様の方法で剥離層形成用組成物8を調製した。
[Example 1-8] Preparation of release layer-forming composition 8 Example 1 was repeated except that Triglyme was used instead of PGMEA so that the solid content concentration was 5% by mass and the Triglyme concentration was 10% by mass. A release layer forming composition 8 was prepared in the same manner as in -1.
[実施例1-9]剥離層形成用組成物9の調製
 PGMEAのかわりにDiglymeを使用し、固形分濃度が5質量%、Diglyme濃度が10質量%となるようにした以外は、実施例1-1と同様の方法で剥離層形成用組成物9を調製した。
[Example 1-9] Preparation of release layer-forming composition 9 Example 1 was repeated except that Diglyme was used instead of PGMEA so that the solid content concentration was 5 mass% and the Diglyme concentration was 10 mass %. A release layer forming composition 9 was prepared in the same manner as in -1.
[実施例1-10]剥離層形成用組成物10の調製
 PGMEAのかわりにDEGEEAを使用し、固形分濃度が5質量%、DEGEEA濃度が30質量%となるようにした以外は、実施例1-1と同様の方法で剥離層形成用組成物10を調製した。
[Example 1-10] Preparation of release layer-forming composition 10 Example 1 was repeated except that DEGEEA was used instead of PGMEA so that the solid content concentration was 5% by mass and the DEGEEA concentration was 30% by mass. A release layer forming composition 10 was prepared in the same manner as in -1.
[実施例1-11]剥離層形成用組成物11の調製
 合成例1で得られた反応液20gに、PL-LI1.28g、PPTS0.12g、アクリルポリマー(S1)溶液6.00g及びPGMEAを加え、固形分濃度が5質量%、PGMEA濃度が30質量%となるようにPGMEで希釈し、剥離層形成用組成物11を調製した。
[Example 1-11] Preparation of release layer-forming composition 11 To 20 g of the reaction solution obtained in Synthesis Example 1, PL-LI (1.28 g), PPTS (0.12 g), acrylic polymer (S1) solution (6.00 g) and PGMEA were added. In addition, a release layer-forming composition 11 was prepared by diluting with PGME so that the solid content concentration was 5% by mass and the PGMEA concentration was 30% by mass.
[実施例1-12]剥離層形成用組成物12の調製
 合成例1で得られた反応液20gに、PL-LI1.00g、PPTS0.12g、アクリルポリマー(S2)溶液1.50g及びPGMEAを加え、固形分濃度が5質量%、PGMEA濃度が30質量%となるようにPGMEで希釈し、剥離層形成用組成物12を調製した。
[Example 1-12] Preparation of release layer forming composition 12 To 20 g of the reaction solution obtained in Synthesis Example 1, PL-LI 1.00 g, PPTS 0.12 g, acrylic polymer (S2) solution 1.50 g and PGMEA were added. In addition, the release layer forming composition 12 was prepared by diluting with PGM such that the solid content concentration was 5% by mass and the PGMEA concentration was 30% by mass.
[実施例1-13]剥離層形成用組成物13の調製
 合成例1で得られた反応液20gに、PL-LI1.00g、PPTS0.60g、アクリルポリマー(S2)溶液1.50g及びGBLを加え、固形分濃度が5質量%、GBL濃度が30質量%となるようにPGMEで希釈し、剥離層形成用組成物13を調製した。
[Example 1-13] Preparation of release layer-forming composition 13 To 20 g of the reaction solution obtained in Synthesis Example 1, PL-LI 1.00 g, PPTS 0.60 g, acrylic polymer (S2) solution 1.50 g and GBL were added. In addition, the release layer-forming composition 13 was prepared by diluting with PGME so that the solid content concentration was 5% by mass and the GBL concentration was 30% by mass.
[実施例1-14]剥離層形成用組成物14の調製
 合成例1で得られた反応液20gに、PL-LI1.00g、PPTS0.60g、アクリルポリマー(S1)溶液1.50g及びPGMEAを加え、固形分濃度が5質量%、PGMEA濃度が30質量%となるようにPGMEで希釈し、剥離層形成用組成物14を調製した。
[Example 1-14] Preparation of release layer-forming composition 14 To 20 g of the reaction solution obtained in Synthesis Example 1, PL-LI (1.00 g), PPTS (0.60 g), acrylic polymer (S1) solution (1.50 g) and PGMEA were added. In addition, the release layer-forming composition 14 was prepared by diluting with PGME so that the solid content concentration was 5% by mass and the PGMEA concentration was 30% by mass.
[実施例1-15]剥離層形成用組成物15の調製
 合成例1で得られた反応液1gに、3,3'-5,5'-テトラキス(メトキシメチル)-[1,1'-ビフェニル]-4,4'-ジオール0.06g、PPTS0.01g、アクリルポリマー(S1)溶液0.08g、及びPGMEAを加え、固形分濃度が5質量%、PGMEA濃度が30質量%となるようにPGMEで希釈し、剥離層形成用組成物15を調製した。
[Example 1-15] Preparation of release layer-forming composition 15 To 1 g of the reaction solution obtained in Synthesis Example 1, 3,3'-5,5'-tetrakis(methoxymethyl)-[1,1'- Biphenyl]-4,4'-diol 0.06 g, PPTS 0.01 g, acrylic polymer (S1) solution 0.08 g, and PGMEA were added so that the solid content concentration was 5% by mass and the PGMEA concentration was 30% by mass. It was diluted with PGME to prepare a release layer-forming composition 15.
[比較例1]剥離層形成用組成物16の調製
 PGMEAのかわりにPGMEを使用し、固形分濃度が5質量%、PGME濃度が95質量%となるようにした以外は、実施例1-1と同様の方法で剥離層形成用組成物16を調製した。
[Comparative Example 1] Preparation of release layer forming composition 16 Example 1-1 except that PGME was used instead of PGMEA so that the solid content concentration was 5% by mass and the PGME concentration was 95% by mass. A release layer-forming composition 16 was prepared in the same manner as in.
[4]剥離層の作製及びその評価
[実施例2-1]
 剥離層形成用組成物1を、ガラス基板(100mm×100mm、以下同様)上にスリットダイコータ((株)テクノマシーン製、製品名:卓ダイ、条件:液量7μL、ギャップ25μm、塗布速度20mm/sec)を用いて塗布した。その後、得られた塗膜を、真空デシケータ(減圧度60Pa)で5秒間で減圧度に到達させ、真空乾燥させた。次に、ホットプレートを用いて100℃で2分間加熱し、更にホットプレートを用いて230℃で10分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成し、剥離層付きガラス基板1を得た。
[4] Preparation of release layer and evaluation thereof [Example 2-1]
The composition 1 for forming a release layer was formed on a glass substrate (100 mm×100 mm, the same applies hereinafter) with a slit die coater (manufactured by Techno Machine Co., Ltd., product name: table die, conditions: liquid volume 7 μL, gap 25 μm, coating speed 20 mm/ sec) was used for coating. After that, the obtained coating film was made to reach a reduced pressure level in 5 seconds by a vacuum desiccator (a reduced pressure level of 60 Pa) and vacuum dried. Next, using a hot plate, heating at 100° C. for 2 minutes, and further using a hot plate at 230° C. for 10 minutes, a peeling layer having a thickness of about 0.1 μm is formed on the glass substrate. A glass substrate 1 was obtained.
[実施例2-2]
 剥離層形成用組成物1のかわりに剥離層形成用組成物2を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板2を得た。
[Example 2-2]
A glass substrate 2 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 2 was used in place of the release layer forming composition 1.
[実施例2-3]
 剥離層形成用組成物1のかわりに剥離層形成用組成物3を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板3を得た。
[Example 2-3]
A glass substrate 3 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 3 was used in place of the release layer forming composition 1.
[実施例2-4]
 剥離層形成用組成物1のかわりに剥離層形成用組成物4を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板4を得た。
[Example 2-4]
A glass substrate 4 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 4 was used in place of the release layer forming composition 1.
[実施例2-5]
 剥離層形成用組成物1のかわりに剥離層形成用組成物5を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板5を得た。
[Example 2-5]
A glass substrate 5 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 5 was used in place of the release layer forming composition 1.
[実施例2-6]
 剥離層形成用組成物1のかわりに剥離層形成用組成物6を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板6を得た。
[Example 2-6]
A glass substrate 6 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 6 was used in place of the release layer forming composition 1.
[実施例2-7]
 剥離層形成用組成物1のかわりに剥離層形成用組成物7を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板7を得た。
[Example 2-7]
A glass substrate 7 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 7 was used in place of the release layer forming composition 1.
[実施例2-8]
 剥離層形成用組成物1のかわりに剥離層形成用組成物8を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板8を得た。
[Example 2-8]
A glass substrate 8 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 8 was used in place of the release layer forming composition 1.
[実施例2-9]
 剥離層形成用組成物1のかわりに剥離層形成用組成物9を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板9を得た。
[Example 2-9]
A glass substrate 9 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 9 was used in place of the release layer forming composition 1.
[実施例2-10]
 剥離層形成用組成物1のかわりに剥離層形成用組成物10を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板10を得た。
[Example 2-10]
A glass substrate 10 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 10 was used in place of the release layer forming composition 1.
[実施例2-11]
 剥離層形成用組成物1のかわりに剥離層形成用組成物11を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板11を得た。
[Example 2-11]
A glass substrate 11 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 11 was used in place of the release layer forming composition 1.
[実施例2-12]
 剥離層形成用組成物1のかわりに剥離層形成用組成物12を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板12を得た。
[Example 2-12]
A glass substrate 12 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 12 was used in place of the release layer forming composition 1.
[実施例2-13]
 剥離層形成用組成物1のかわりに剥離層形成用組成物13を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板13を得た。
[Example 2-13]
A glass substrate 13 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 13 was used in place of the release layer forming composition 1.
[実施例2-14]
 剥離層形成用組成物1のかわりに剥離層形成用組成物14を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板14を得た。
[Example 2-14]
A glass substrate 14 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer-forming composition 14 was used in place of the release layer-forming composition 1.
[実施例2-15]
 剥離層形成用組成物1のかわりに剥離層形成用組成物15を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板15を得た。
[Example 2-15]
A glass substrate 15 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 15 was used in place of the release layer forming composition 1.
[比較例2-1]
 剥離層形成用組成物1のかわりに剥離層形成用組成物16を用いた以外は、実施例2-1と同様の方法で剥離層付きガラス基板16を得た。剥離層のムラをNaランプで確認したところ、剥離層が白濁し、多数のムラを確認した。
[Comparative Example 2-1]
A glass substrate 16 with a release layer was obtained in the same manner as in Example 2-1, except that the release layer forming composition 16 was used in place of the release layer forming composition 1. When the unevenness of the peeling layer was confirmed with a Na lamp, the peeling layer became cloudy and many irregularities were confirmed.
[5]樹脂基板の作製
[実施例3-1]
 剥離層付ガラス基板1上にスピンコータ(条件:回転数200rpmで約15秒)を用いて、前記ガラス基板上の剥離層(樹脂薄膜)の上に樹脂基板形成用組成物F1を塗布した。得られた塗膜を、ホットプレートを用いて80℃で2分間加熱し、その後、ホットプレートを用いて230℃で30分間加熱し、剥離層上に厚さ約3μmの樹脂基板を形成し、樹脂基板・剥離層付きガラス基板1を得た。その後、紫外可視分光光度計((株)島津製作所製UV-2600)を用いて光透過率を測定した結果、樹脂基板は、400nmで90%以上の透過率を示した。
[5] Production of Resin Substrate [Example 3-1]
The composition F1 for resin substrate formation was applied onto the release layer (resin thin film) on the glass substrate by using a spin coater (condition: rotation speed 200 rpm for about 15 seconds) on the glass substrate 1 with release layer. The obtained coating film is heated at 80° C. for 2 minutes using a hot plate, and then at 230° C. for 30 minutes using a hot plate to form a resin substrate having a thickness of about 3 μm on the release layer, A resin substrate/glass substrate 1 with a release layer was obtained. Then, the light transmittance was measured using an ultraviolet-visible spectrophotometer (UV-2600 manufactured by Shimadzu Corporation), and as a result, the resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-2]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板2を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板2を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-2]
A resin substrate/release layer-attached glass substrate 2 was obtained in the same manner as in Example 3-1, except that the release layer-attached glass substrate 2 was used instead of the release layer-attached glass substrate 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-3]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板3を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板3を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-3]
A resin substrate/glass substrate with release layer 3 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 3 was used instead of the glass substrate with release layer 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-4]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板4を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板4を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-4]
A resin substrate/release layer-attached glass substrate 4 was obtained in the same manner as in Example 3-1, except that the release layer-attached glass substrate 4 was used instead of the release layer-attached glass substrate 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-5]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板5を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板5を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-5]
A resin substrate/glass substrate with release layer 5 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 5 was used instead of the glass substrate with release layer 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-6]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板6を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板6を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-6]
A resin substrate/glass substrate with release layer 6 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 6 was used instead of the glass substrate with release layer 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-7]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板7を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板7を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-7]
A resin substrate/glass substrate with release layer 7 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 7 was used instead of the glass substrate with release layer 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-8]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板8を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板8を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-8]
A resin substrate/glass substrate with release layer 8 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 8 was used instead of the glass substrate with release layer 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-9]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板9を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板9を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-9]
A resin substrate/release layer-attached glass substrate 9 was obtained in the same manner as in Example 3-1, except that the release layer-attached glass substrate 9 was used instead of the release layer-attached glass substrate 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-10]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板10を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板10を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-10]
A resin substrate/release layer-attached glass substrate 10 was obtained in the same manner as in Example 3-1, except that the release layer-attached glass substrate 10 was used instead of the release layer-attached glass substrate 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-11]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板11を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板11を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-11]
A resin substrate/glass substrate with release layer 11 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 11 was used instead of the glass substrate with release layer 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-12]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板12を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板12を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-12]
A resin substrate/glass substrate with release layer 12 was obtained in the same manner as in Example 3-1, except that the glass substrate with release layer 12 was used instead of the glass substrate with release layer 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-13]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板13を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板13を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-13]
A resin substrate/release layer-attached glass substrate 13 was obtained in the same manner as in Example 3-1, except that the release layer-attached glass substrate 13 was used in place of the release layer-attached glass substrate 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-14]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板14を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板14を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-14]
A resin substrate/release layer-attached glass substrate 14 was obtained in the same manner as in Example 3-1, except that the release layer-attached glass substrate 14 was used in place of the release layer-attached glass substrate 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[実施例3-15]
 剥離層付ガラス基板1のかわりに剥離層付ガラス基板15を用いた以外は、実施例3-1と同様の方法で樹脂基板・剥離層付きガラス基板15を得た。樹脂基板は、400nmで90%以上の透過率を示した。
[Example 3-15]
A resin substrate/release layer-attached glass substrate 15 was obtained in the same manner as in Example 3-1 except that the release layer-attached glass substrate 15 was used in place of the release layer-attached glass substrate 1. The resin substrate showed a transmittance of 90% or more at 400 nm.
[6]剥離性の評価
 剥離層付きガラス基板1~16について剥離層とガラス基板との密着性を、剥離層のムラが生じなかった樹脂基板・剥離層付きガラス基板1~15について剥離層と樹脂皮膜との剥離性を下記方法にて確認した。なお、下記の試験は、同一のガラス基板で行った。
[6] Evaluation of Releasability With respect to the glass substrates 1 to 16 with release layer, the adhesion between the release layer and the glass substrate was evaluated with respect to the resin substrate and the glass substrates with release layer 1 to 15 without release layer unevenness. The peelability from the resin film was confirmed by the following method. The following tests were conducted on the same glass substrate.
(1)剥離層とガラス基板との密着性評価
 剥離層付きガラス基板1~16上の剥離層をクロスカット(縦横2mm間隔、以下同様)し、25マスカットを行った。すなわち、このクロスカットにより、2mm四方のマス目を25個形成した。この25マスカット部分に粘着テープを張り付けて、そのテープを剥がし、以下の基準に基づき、密着性を評価した。結果を表1に示す。
<判定基準>
  5B:0%剥離(剥離なし)
  4B:5%未満の剥離
  3B:5~15%未満の剥離
  2B:15~35%未満の剥離
  1B:35~65%未満の剥離
  0B:65%~80%未満の剥離
   B:80%~95%未満の剥離
   A:95%~100%未満の剥離
  AA:100%剥離(すべて剥離)
(1) Evaluation of Adhesion between Release Layer and Glass Substrate The release layers on the glass substrates 1 to 16 with release layer were cross-cut (2 mm in length and width, the same applies hereinafter), and 25 mass cuts were performed. That is, this cross cut formed 25 squares of 2 mm square. An adhesive tape was attached to the 25 muscat portion, the tape was peeled off, and the adhesiveness was evaluated based on the following criteria. The results are shown in Table 1.
<Judgment criteria>
5B: 0% peeling (no peeling)
4B: less than 5% peeling 3B: 5 to less than 15% peeling 2B: 15 to less than 35% peeling 1B: 35 to less than 65% peeling 0B: 65% to less than 80% peeling B: 80% to 95% % Peeling A: 95% to less than 100% peeling AA: 100% peeling (all peeling)
(2)剥離層と樹脂基板との剥離力評価
 樹脂基板・剥離層付きガラス基板1~15に、25mm×50mmの短冊を作製した。更に、セロテープ(登録商標)(ニチバン(株)製CT-24)を貼った後、オートグラフAGS-X500N((株)島津製作所製)を用いて、剥離角度90°、剥離速度300mm/minで剥離し、剥離力を測定した。なお、剥離できないものは、剥離不可とした。結果を表1に示す。
(2) Evaluation of Peeling Force between Release Layer and Resin Substrate Strips of 25 mm×50 mm were prepared on the glass substrates 1 to 15 with resin substrate/release layer. Furthermore, after sticking Cellotape (registered trademark) (CT-24 manufactured by Nichiban Co., Ltd.), using an autograph AGS-X500N (manufactured by Shimadzu Corporation) at a peeling angle of 90° and a peeling speed of 300 mm/min. It peeled and the peeling force was measured. Those that could not be peeled were not peeled. The results are shown in Table 1.
Figure JPOXMLDOC01-appb-T000028
Figure JPOXMLDOC01-appb-T000028
 表1に示した結果より、実施例の剥離層は、ガラス基板との密着性に優れ、かつ樹脂基板との剥離性に優れていた。一方、比較例の剥離層は、表面にムラが多数見られ、白濁していた。 From the results shown in Table 1, the peeling layer of the example was excellent in adhesion to the glass substrate and also excellent in peeling from the resin substrate. On the other hand, the peeling layer of Comparative Example had many irregularities on the surface and was cloudy.
 以上の結果より、本発明のスリットダイコート用剥離層形成用組成物を用いれば、スリットダイコート法で塗布した場合でも、塗布ムラが発生せず、基体との優れた密着性、樹脂基板との適度な密着性及び適度な剥離性を有する剥離層を得られることが示された。 From the above results, by using the composition for forming a release layer for slit die coating of the present invention, even when applied by the slit die coating method, coating unevenness does not occur, excellent adhesion with the substrate, moderate with the resin substrate It was shown that a peeling layer having good adhesion and moderate peelability can be obtained.

Claims (11)

  1.  (A)下記式(1)で表される繰り返し単位を含むポリウレア、
    (B)酸化合物又はその塩、
    (C)ヒドロキシアルキル基及び/又はアルコキシメチル基で置換された窒素原子を有する化合物から選ばれる架橋剤、
    (D)下記式(a1)で表される繰り返し単位、下記式(b)で表される繰り返し単位及び下記式(c)で表される繰り返し単位を含む高分子添加剤、並びに
    (E)20℃における蒸気圧が800Pa以下の溶剤を少なくとも1種含む溶剤
    を含み、
     (D)高分子添加剤が、(A)ポリウレア100質量部に対し、3~100質量部含まれる、スリットダイコート用剥離層形成用組成物。
    Figure JPOXMLDOC01-appb-C000001
    [式中、A1、A2、A3、A4、A5及びA6は、それぞれ独立に、水素原子、メチル基又はエチル基であり、
     X1は、下記式(1-1)、(1-2)、(1-3)又は(1-4)で表される基であり、
    Figure JPOXMLDOC01-appb-C000002
    (式中、R1及びR2は、それぞれ独立に、水素原子、炭素数1~6のアルキル基、炭素数3~6のアルケニル基、ベンジル基又はフェニル基であり、前記フェニル基は、炭素数1~6のアルキル基、ハロゲン原子、炭素数1~6のアルコキシ基、ニトロ基、シアノ基、ヒドロキシ基及び炭素数1~6のアルキルチオ基からなる群から選ばれる少なくとも1種の基で置換されていてもよく、また、R1及びR2は、互いに結合してこれらが結合する炭素原子と共に炭素数3~6の環を形成してもよく、R3は、炭素数1~6のアルキル基、炭素数3~6のアルケニル基、ベンジル基又はフェニル基であり、前記フェニル基は、炭素数1~6のアルキル基、ハロゲン原子、炭素数1~6のアルコキシ基、ニトロ基、シアノ基、ヒドロキシ基及び炭素数1~6のアルキルチオ基からなる群から選ばれる少なくとも1種の基で置換されていてもよい。)
     Q1は、下記式(1-5)又は(1-6)で表される基である。
    Figure JPOXMLDOC01-appb-C000003
    (式中、X2は、式(1-1)、式(1-2)又は式(1-4)で表される基であり、Q2は、炭素数1~10のアルキレン基、フェニレン基、ナフチレン基又はアントリレン基であり、前記フェニレン基、ナフチレン基及びアントリレン基は、炭素数1~6のアルキル基、ハロゲン原子、炭素数1~6のアルコキシ基、ニトロ基、シアノ基、ヒドロキシ基、及び炭素数1~6のアルキルチオ基からなる群から選ばれる少なくとも1種の基で置換されていてもよく、n1及びn2は、それぞれ独立に、0又は1である。)]
    Figure JPOXMLDOC01-appb-C000004
    (式中、RAは、それぞれ独立に、水素原子又はメチル基であり、RB1は、少なくとも1つの水素原子がフッ素原子で置換された炭素数3又は4の分岐状のアルキル基であり、RCは、炭素数1~10のヒドロキシアルキル基であり、RDは、炭素数6~20の多環式アルキル基又は炭素数6~12のアリール基である。)
    (A) a polyurea containing a repeating unit represented by the following formula (1),
    (B) an acid compound or a salt thereof,
    (C) a cross-linking agent selected from compounds having a nitrogen atom substituted with a hydroxyalkyl group and/or an alkoxymethyl group,
    (D) A polymer additive containing a repeating unit represented by the following formula (a1), a repeating unit represented by the following formula (b) and a repeating unit represented by the following formula (c), and (E) 20 Including a solvent containing at least one solvent having a vapor pressure at 800° C. of 800 Pa or less,
    A composition for forming a release layer for a slit die coat, wherein the polymer additive (D) is contained in an amount of 3 to 100 parts by mass relative to 100 parts by mass of the polyurea (A).
    Figure JPOXMLDOC01-appb-C000001
    [In the formula, A 1 , A 2 , A 3 , A 4 , A 5 and A 6 are each independently a hydrogen atom, a methyl group or an ethyl group,
    X 1 is a group represented by the following formula (1-1), (1-2), (1-3) or (1-4),
    Figure JPOXMLDOC01-appb-C000002
    (In the formula, R 1 and R 2 are each independently a hydrogen atom, an alkyl group having 1 to 6 carbon atoms, an alkenyl group having 3 to 6 carbon atoms, a benzyl group or a phenyl group, and the phenyl group is a carbon atom. Substituted with at least one group selected from the group consisting of an alkyl group having 1 to 6 carbon atoms, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, a nitro group, a cyano group, a hydroxy group and an alkylthio group having 1 to 6 carbon atoms. R 1 and R 2 may combine with each other to form a ring having 3 to 6 carbon atoms together with the carbon atom to which they are bonded, and R 3 has 1 to 6 carbon atoms. An alkyl group, an alkenyl group having 3 to 6 carbon atoms, a benzyl group or a phenyl group, wherein the phenyl group is an alkyl group having 1 to 6 carbon atoms, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, a nitro group, cyano May be substituted with at least one group selected from the group consisting of a group, a hydroxy group and an alkylthio group having 1 to 6 carbon atoms.)
    Q 1 is a group represented by the following formula (1-5) or (1-6).
    Figure JPOXMLDOC01-appb-C000003
    (In the formula, X 2 is a group represented by the formula (1-1), the formula (1-2) or the formula (1-4), and Q 2 is an alkylene group having 1 to 10 carbon atoms, or phenylene. Group, naphthylene group or anthrylene group, wherein the phenylene group, naphthylene group and anthrylene group are an alkyl group having 1 to 6 carbon atoms, a halogen atom, an alkoxy group having 1 to 6 carbon atoms, a nitro group, a cyano group, a hydroxy group. , And at least one group selected from the group consisting of alkylthio groups having 1 to 6 carbon atoms, and n 1 and n 2 are each independently 0 or 1.)]
    Figure JPOXMLDOC01-appb-C000004
    (In the formula, R A is each independently a hydrogen atom or a methyl group, and R B1 is a branched alkyl group having 3 or 4 carbon atoms in which at least one hydrogen atom is substituted with a fluorine atom, R C is a hydroxyalkyl group having 1 to 10 carbon atoms, and R D is a polycyclic alkyl group having 6 to 20 carbon atoms or an aryl group having 6 to 12 carbon atoms.)
  2.  (D)高分子添加物の式(b)で表される繰り返し単位において、RCが、炭素数2~10のヒドロキシアルキル基であって、ヒドロキシ基が結合する炭素原子が第2級炭素原子であり、かつ、式(a1)で表される繰り返し単位の含有割合が、(D)高分子添加物の全繰り返し単位中30モル%以上である請求項1記載のスリットダイコート用剥離層形成用組成物。 (D) In the repeating unit represented by the formula (b) of the polymer additive, R C is a hydroxyalkyl group having 2 to 10 carbon atoms, and the carbon atom to which the hydroxy group is bonded is a secondary carbon atom. And the content ratio of the repeating unit represented by the formula (a1) is 30 mol% or more based on all repeating units of the polymer additive (D), for forming a release layer for a slit die coat. Composition.
  3.  X1が、式(1-3)で表される基である請求項1又は2記載のスリットダイコート用剥離層形成用組成物。 The composition for forming a release layer for slit die coating according to claim 1 or 2, wherein X 1 is a group represented by the formula (1-3).
  4.  R3が、2-プロペニル基である請求項3記載のスリットダイコート用剥離層形成用組成物。 The composition for forming a release layer for slit die coating according to claim 3 , wherein R 3 is a 2-propenyl group.
  5.  Q1が、式(1-5)で表される基である請求項1~4のいずれか1項記載のスリットダイコート用剥離層形成用組成物。 Q 1 is a group represented by the formula (1-5), wherein the composition for forming a release layer for slit die coat according to any one of claims 1 to 4.
  6.  (B)成分が、スルホン酸化合物又はその塩である請求項1~5のいずれか1項記載のスリットダイコート用剥離層形成用組成物。 The composition for forming a release layer for a slit die coat according to any one of claims 1 to 5, wherein the component (B) is a sulfonic acid compound or a salt thereof.
  7.  (C)架橋剤が、下記式(C-1)~(C-7)のいずれかで表される化合物である請求項1~6のいずれか1項記載のスリットダイコート用剥離層形成用組成物。
    Figure JPOXMLDOC01-appb-C000005
    (式中、R11~R38は、それぞれ独立に、水素原子又は炭素数1~6のアルキル基であり、R39は、水素原子又はメチル基である。)
    The composition for forming a release layer for a slit die coat according to any one of claims 1 to 6, wherein the crosslinking agent (C) is a compound represented by any one of the following formulas (C-1) to (C-7). Stuff.
    Figure JPOXMLDOC01-appb-C000005
    (In the formula, R 11 to R 38 are each independently a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, and R 39 is a hydrogen atom or a methyl group.)
  8.  (C)架橋剤の含有量が、(A)ポリウレア100質量部に対し、10~100質量部である請求項1~7のいずれか1項記載のスリットダイコート用剥離層形成用組成物。 The composition for forming a release layer for a slit die coat according to any one of claims 1 to 7, wherein the content of (C) the cross-linking agent is 10 to 100 parts by mass relative to 100 parts by mass of (A) polyurea.
  9.  請求項1~8のいずれか1項記載のスリットダイコート用剥離層形成用組成物から得られる剥離層。 A release layer obtained from the composition for forming a release layer for slit die coating according to any one of claims 1 to 8.
  10.  請求項9記載の剥離層に、波長400nmの光透過率が80%以上である樹脂層が積層された積層体。 A laminate in which the release layer according to claim 9 is laminated with a resin layer having a light transmittance of 80% or more at a wavelength of 400 nm.
  11.  請求項1~8のいずれか1項記載のスリットダイコート用剥離層形成用組成物を基体に塗布し、剥離層を形成する工程、
     前記剥離層上に、波長400nmの光透過率が80%以上である樹脂基板を形成する工程、及び
     前記樹脂基板を、0.15N/25mm以下の剥離力で剥離する工程
    を含む樹脂基板の製造方法。
    A step of applying a release layer-forming composition for slit die coat according to any one of claims 1 to 8 to a substrate to form a release layer,
    Manufacture of a resin substrate including a step of forming a resin substrate having a light transmittance of 400 nm at a wavelength of 80% or more on the peeling layer, and a step of peeling the resin substrate with a peeling force of 0.15 N/25 mm or less Method.
PCT/JP2020/002014 2019-01-28 2020-01-22 Composition for forming release layer for slit die coating, and release layer WO2020158521A1 (en)

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