WO2019082844A1 - Ink, solidified film of ink, and photoelectric conversion element - Google Patents
Ink, solidified film of ink, and photoelectric conversion elementInfo
- Publication number
- WO2019082844A1 WO2019082844A1 PCT/JP2018/039195 JP2018039195W WO2019082844A1 WO 2019082844 A1 WO2019082844 A1 WO 2019082844A1 JP 2018039195 W JP2018039195 W JP 2018039195W WO 2019082844 A1 WO2019082844 A1 WO 2019082844A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- group
- solvent
- photoelectric conversion
- ink
- type semiconductor
- Prior art date
Links
- 238000006243 chemical reaction Methods 0.000 title claims abstract description 107
- 239000000463 material Substances 0.000 claims abstract description 121
- -1 nitrogen-containing heterocyclic compound Chemical class 0.000 claims abstract description 107
- 239000002904 solvent Substances 0.000 claims abstract description 103
- 239000004065 semiconductor Substances 0.000 claims abstract description 88
- 125000001424 substituent group Chemical group 0.000 claims description 63
- 238000000034 method Methods 0.000 claims description 60
- 238000001514 detection method Methods 0.000 claims description 47
- 238000000576 coating method Methods 0.000 claims description 40
- 238000004519 manufacturing process Methods 0.000 claims description 23
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical class C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 claims description 22
- 239000011248 coating agent Substances 0.000 claims description 21
- SMWDFEZZVXVKRB-UHFFFAOYSA-N Quinoline Chemical compound N1=CC=CC2=CC=CC=C21 SMWDFEZZVXVKRB-UHFFFAOYSA-N 0.000 claims description 18
- LBUJPTNKIBCYBY-UHFFFAOYSA-N 1,2,3,4-tetrahydroquinoline Chemical compound C1=CC=C2CCCNC2=C1 LBUJPTNKIBCYBY-UHFFFAOYSA-N 0.000 claims description 17
- XSCHRSMBECNVNS-UHFFFAOYSA-N quinoxaline Chemical compound N1=CC=NC2=CC=CC=C21 XSCHRSMBECNVNS-UHFFFAOYSA-N 0.000 claims description 14
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical group C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 claims description 12
- 125000005842 heteroatom Chemical group 0.000 claims description 12
- 150000004945 aromatic hydrocarbons Chemical class 0.000 claims description 11
- 229910052757 nitrogen Inorganic materials 0.000 claims description 10
- 125000004433 nitrogen atom Chemical group N* 0.000 claims description 9
- 230000008569 process Effects 0.000 claims description 7
- 125000003373 pyrazinyl group Chemical group 0.000 claims description 6
- 125000004853 tetrahydropyridinyl group Chemical group N1(CCCC=C1)* 0.000 claims description 6
- 125000003386 piperidinyl group Chemical group 0.000 claims description 4
- 230000006872 improvement Effects 0.000 abstract description 2
- 125000002029 aromatic hydrocarbon group Chemical group 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 102
- 239000000976 ink Substances 0.000 description 82
- 239000010408 film Substances 0.000 description 50
- 239000000758 substrate Substances 0.000 description 50
- 229910052799 carbon Inorganic materials 0.000 description 31
- 150000001875 compounds Chemical class 0.000 description 31
- 150000001721 carbon Chemical group 0.000 description 27
- 125000000217 alkyl group Chemical group 0.000 description 26
- 230000005525 hole transport Effects 0.000 description 21
- 125000004432 carbon atom Chemical group C* 0.000 description 18
- 125000000623 heterocyclic group Chemical group 0.000 description 18
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 18
- 125000003118 aryl group Chemical group 0.000 description 15
- 239000000203 mixture Substances 0.000 description 15
- 238000007789 sealing Methods 0.000 description 15
- 125000003545 alkoxy group Chemical group 0.000 description 14
- 229920000642 polymer Polymers 0.000 description 14
- 125000006615 aromatic heterocyclic group Chemical group 0.000 description 12
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 10
- 125000003342 alkenyl group Chemical group 0.000 description 10
- 239000011229 interlayer Substances 0.000 description 10
- 125000004414 alkyl thio group Chemical group 0.000 description 9
- 125000003277 amino group Chemical group 0.000 description 9
- 230000015572 biosynthetic process Effects 0.000 description 9
- 125000004122 cyclic group Chemical group 0.000 description 9
- 229910003472 fullerene Inorganic materials 0.000 description 9
- 150000002466 imines Chemical group 0.000 description 9
- CXWXQJXEFPUFDZ-UHFFFAOYSA-N tetralin Chemical compound C1=CC=C2CCCCC2=C1 CXWXQJXEFPUFDZ-UHFFFAOYSA-N 0.000 description 9
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 8
- OCKPCBLVNKHBMX-UHFFFAOYSA-N butylbenzene Chemical compound CCCCC1=CC=CC=C1 OCKPCBLVNKHBMX-UHFFFAOYSA-N 0.000 description 8
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000002184 metal Substances 0.000 description 8
- GWHJZXXIDMPWGX-UHFFFAOYSA-N 1,2,4-trimethylbenzene Chemical compound CC1=CC=C(C)C(C)=C1 GWHJZXXIDMPWGX-UHFFFAOYSA-N 0.000 description 7
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 7
- 239000002253 acid Substances 0.000 description 7
- 238000003384 imaging method Methods 0.000 description 7
- QPUYECUOLPXSFR-UHFFFAOYSA-N 1-methylnaphthalene Chemical compound C1=CC=C2C(C)=CC=CC2=C1 QPUYECUOLPXSFR-UHFFFAOYSA-N 0.000 description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 6
- URLKBWYHVLBVBO-UHFFFAOYSA-N Para-Xylene Chemical group CC1=CC=C(C)C=C1 URLKBWYHVLBVBO-UHFFFAOYSA-N 0.000 description 6
- KYQCOXFCLRTKLS-UHFFFAOYSA-N Pyrazine Chemical compound C1=CN=CC=N1 KYQCOXFCLRTKLS-UHFFFAOYSA-N 0.000 description 6
- 125000000304 alkynyl group Chemical group 0.000 description 6
- 125000003368 amide group Chemical group 0.000 description 6
- 125000005110 aryl thio group Chemical group 0.000 description 6
- 125000004104 aryloxy group Chemical group 0.000 description 6
- 125000005462 imide group Chemical group 0.000 description 6
- PQNFLJBBNBOBRQ-UHFFFAOYSA-N indane Chemical compound C1=CC=C2CCCC2=C1 PQNFLJBBNBOBRQ-UHFFFAOYSA-N 0.000 description 6
- IVSZLXZYQVIEFR-UHFFFAOYSA-N m-xylene Chemical group CC1=CC=CC(C)=C1 IVSZLXZYQVIEFR-UHFFFAOYSA-N 0.000 description 6
- 125000005740 oxycarbonyl group Chemical group [*:1]OC([*:2])=O 0.000 description 6
- SMUQFGGVLNAIOZ-UHFFFAOYSA-N quinaldine Chemical compound C1=CC=CC2=NC(C)=CC=C21 SMUQFGGVLNAIOZ-UHFFFAOYSA-N 0.000 description 6
- YTZKOQUCBOVLHL-UHFFFAOYSA-N tert-butylbenzene Chemical compound CC(C)(C)C1=CC=CC=C1 YTZKOQUCBOVLHL-UHFFFAOYSA-N 0.000 description 6
- 125000002252 acyl group Chemical group 0.000 description 5
- 125000000732 arylene group Chemical group 0.000 description 5
- 238000001035 drying Methods 0.000 description 5
- 238000011156 evaluation Methods 0.000 description 5
- 239000011521 glass Substances 0.000 description 5
- 125000005843 halogen group Chemical group 0.000 description 5
- 239000007788 liquid Substances 0.000 description 5
- 229920000123 polythiophene Polymers 0.000 description 5
- 239000011787 zinc oxide Substances 0.000 description 5
- ALHUXMDEZNLFTA-UHFFFAOYSA-N 2-methylquinoxaline Chemical compound C1=CC=CC2=NC(C)=CN=C21 ALHUXMDEZNLFTA-UHFFFAOYSA-N 0.000 description 4
- DTBDAFLSBDGPEA-UHFFFAOYSA-N 3-methylquinoline Chemical compound C1=CC=CC2=CC(C)=CN=C21 DTBDAFLSBDGPEA-UHFFFAOYSA-N 0.000 description 4
- LUYISICIYVKBTA-UHFFFAOYSA-N 6-methylquinoline Chemical compound N1=CC=CC2=CC(C)=CC=C21 LUYISICIYVKBTA-UHFFFAOYSA-N 0.000 description 4
- JRLTTZUODKEYDH-UHFFFAOYSA-N 8-methylquinoline Chemical compound C1=CN=C2C(C)=CC=CC2=C1 JRLTTZUODKEYDH-UHFFFAOYSA-N 0.000 description 4
- UUIQMZJEGPQKFD-UHFFFAOYSA-N Methyl butyrate Chemical compound CCCC(=O)OC UUIQMZJEGPQKFD-UHFFFAOYSA-N 0.000 description 4
- 238000007611 bar coating method Methods 0.000 description 4
- 230000004888 barrier function Effects 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 238000013461 design Methods 0.000 description 4
- 239000006185 dispersion Substances 0.000 description 4
- 229910052731 fluorine Inorganic materials 0.000 description 4
- 150000002391 heterocyclic compounds Chemical class 0.000 description 4
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- AWJUIBRHMBBTKR-UHFFFAOYSA-N isoquinoline Chemical compound C1=NC=CC2=CC=CC=C21 AWJUIBRHMBBTKR-UHFFFAOYSA-N 0.000 description 4
- 150000002739 metals Chemical class 0.000 description 4
- 239000012046 mixed solvent Substances 0.000 description 4
- 239000002105 nanoparticle Substances 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
- 229920000767 polyaniline Polymers 0.000 description 4
- 239000000047 product Substances 0.000 description 4
- 150000003384 small molecules Chemical class 0.000 description 4
- 238000004528 spin coating Methods 0.000 description 4
- 239000000725 suspension Substances 0.000 description 4
- 238000002834 transmittance Methods 0.000 description 4
- 229910000838 Al alloy Inorganic materials 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- PCNDJXKNXGMECE-UHFFFAOYSA-N Phenazine Natural products C1=CC=CC2=NC3=CC=CC=C3N=C21 PCNDJXKNXGMECE-UHFFFAOYSA-N 0.000 description 3
- CZPWVGJYEJSRLH-UHFFFAOYSA-N Pyrimidine Chemical compound C1=CN=CN=C1 CZPWVGJYEJSRLH-UHFFFAOYSA-N 0.000 description 3
- 150000004982 aromatic amines Chemical group 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 239000000470 constituent Substances 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 125000004093 cyano group Chemical group *C#N 0.000 description 3
- 239000007772 electrode material Substances 0.000 description 3
- 125000005678 ethenylene group Chemical group [H]C([*:1])=C([H])[*:2] 0.000 description 3
- 125000001153 fluoro group Chemical group F* 0.000 description 3
- AUHZEENZYGFFBQ-UHFFFAOYSA-N mesitylene Substances CC1=CC(C)=CC(C)=C1 AUHZEENZYGFFBQ-UHFFFAOYSA-N 0.000 description 3
- 125000001827 mesitylenyl group Chemical group [H]C1=C(C(*)=C(C([H])=C1C([H])([H])[H])C([H])([H])[H])C([H])([H])[H] 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 3
- 229940078552 o-xylene Drugs 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 3
- 239000004810 polytetrafluoroethylene Substances 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 3
- 125000000714 pyrimidinyl group Chemical group 0.000 description 3
- ZJMWRROPUADPEA-UHFFFAOYSA-N sec-butylbenzene Chemical compound CCC(C)C1=CC=CC=C1 ZJMWRROPUADPEA-UHFFFAOYSA-N 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- FYGHSUNMUKGBRK-UHFFFAOYSA-N 1,2,3-trimethylbenzene Chemical compound CC1=CC=CC(C)=C1C FYGHSUNMUKGBRK-UHFFFAOYSA-N 0.000 description 2
- JZICUKPOZUKZLL-UHFFFAOYSA-N 2-methyl-1,2,3,4-tetrahydroquinoline Chemical compound C1=CC=C2NC(C)CCC2=C1 JZICUKPOZUKZLL-UHFFFAOYSA-N 0.000 description 2
- UJOBWOGCFQCDNV-UHFFFAOYSA-N 9H-carbazole Chemical compound C1=CC=C2C3=CC=CC=C3NC2=C1 UJOBWOGCFQCDNV-UHFFFAOYSA-N 0.000 description 2
- 229910001316 Ag alloy Inorganic materials 0.000 description 2
- AZSFNTBGCTUQFX-UHFFFAOYSA-N C12=C3C(C4=C5C=6C7=C8C9=C(C%10=6)C6=C%11C=%12C%13=C%14C%11=C9C9=C8C8=C%11C%15=C%16C=%17C(C=%18C%19=C4C7=C8C%15=%18)=C4C7=C8C%15=C%18C%20=C(C=%178)C%16=C8C%11=C9C%14=C8C%20=C%13C%18=C8C9=%12)=C%19C4=C2C7=C2C%15=C8C=4C2=C1C12C3=C5C%10=C3C6=C9C=4C32C1(CCCC(=O)OC)C1=CC=CC=C1 Chemical compound C12=C3C(C4=C5C=6C7=C8C9=C(C%10=6)C6=C%11C=%12C%13=C%14C%11=C9C9=C8C8=C%11C%15=C%16C=%17C(C=%18C%19=C4C7=C8C%15=%18)=C4C7=C8C%15=C%18C%20=C(C=%178)C%16=C8C%11=C9C%14=C8C%20=C%13C%18=C8C9=%12)=C%19C4=C2C7=C2C%15=C8C=4C2=C1C12C3=C5C%10=C3C6=C9C=4C32C1(CCCC(=O)OC)C1=CC=CC=C1 AZSFNTBGCTUQFX-UHFFFAOYSA-N 0.000 description 2
- YLQBMQCUIZJEEH-UHFFFAOYSA-N Furan Chemical compound C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 2
- 229910000846 In alloy Inorganic materials 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 229920002873 Polyethylenimine Polymers 0.000 description 2
- KAESVJOAVNADME-UHFFFAOYSA-N Pyrrole Chemical compound C=1C=CNC=1 KAESVJOAVNADME-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- YTPLMLYBLZKORZ-UHFFFAOYSA-N Thiophene Chemical compound C=1C=CSC=1 YTPLMLYBLZKORZ-UHFFFAOYSA-N 0.000 description 2
- MCEWYIDBDVPMES-UHFFFAOYSA-N [60]pcbm Chemical compound C123C(C4=C5C6=C7C8=C9C%10=C%11C%12=C%13C%14=C%15C%16=C%17C%18=C(C=%19C=%20C%18=C%18C%16=C%13C%13=C%11C9=C9C7=C(C=%20C9=C%13%18)C(C7=%19)=C96)C6=C%11C%17=C%15C%13=C%15C%14=C%12C%12=C%10C%10=C85)=C9C7=C6C2=C%11C%13=C2C%15=C%12C%10=C4C23C1(CCCC(=O)OC)C1=CC=CC=C1 MCEWYIDBDVPMES-UHFFFAOYSA-N 0.000 description 2
- 150000004705 aldimines Chemical class 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- SESFRYSPDFLNCH-UHFFFAOYSA-N benzyl benzoate Chemical compound C=1C=CC=CC=1C(=O)OCC1=CC=CC=C1 SESFRYSPDFLNCH-UHFFFAOYSA-N 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 2
- 239000000839 emulsion Substances 0.000 description 2
- 150000002148 esters Chemical group 0.000 description 2
- MTZQAGJQAFMTAQ-UHFFFAOYSA-N ethyl benzoate Chemical compound CCOC(=O)C1=CC=CC=C1 MTZQAGJQAFMTAQ-UHFFFAOYSA-N 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910002804 graphite Inorganic materials 0.000 description 2
- 239000010439 graphite Substances 0.000 description 2
- 238000007756 gravure coating Methods 0.000 description 2
- 150000002605 large molecules Chemical class 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- QPJVMBTYPHYUOC-UHFFFAOYSA-N methyl benzoate Chemical compound COC(=O)C1=CC=CC=C1 QPJVMBTYPHYUOC-UHFFFAOYSA-N 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- 229910000476 molybdenum oxide Inorganic materials 0.000 description 2
- 150000002894 organic compounds Chemical class 0.000 description 2
- AQIXEPGDORPWBJ-UHFFFAOYSA-N pentan-3-ol Chemical compound CCC(O)CC AQIXEPGDORPWBJ-UHFFFAOYSA-N 0.000 description 2
- 125000005007 perfluorooctyl group Chemical group FC(C(C(C(C(C(C(C(F)(F)F)(F)F)(F)F)(F)F)(F)F)(F)F)(F)F)(F)* 0.000 description 2
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 229920003227 poly(N-vinyl carbazole) Polymers 0.000 description 2
- 229920000553 poly(phenylenevinylene) Polymers 0.000 description 2
- 229920000548 poly(silane) polymer Polymers 0.000 description 2
- 229920002098 polyfluorene Polymers 0.000 description 2
- 229920000128 polypyrrole Polymers 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 150000004032 porphyrins Chemical class 0.000 description 2
- 238000007639 printing Methods 0.000 description 2
- JWVCLYRUEFBMGU-UHFFFAOYSA-N quinazoline Chemical compound N1=CN=CC2=CC=CC=C21 JWVCLYRUEFBMGU-UHFFFAOYSA-N 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910052717 sulfur Inorganic materials 0.000 description 2
- 125000004434 sulfur atom Chemical group 0.000 description 2
- 238000010345 tape casting Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 2
- 229910001887 tin oxide Inorganic materials 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 2
- JYEUMXHLPRZUAT-UHFFFAOYSA-N 1,2,3-triazine Chemical compound C1=CN=NN=C1 JYEUMXHLPRZUAT-UHFFFAOYSA-N 0.000 description 1
- AZQWKYJCGOJGHM-UHFFFAOYSA-N 1,4-benzoquinone Chemical compound O=C1C=CC(=O)C=C1 AZQWKYJCGOJGHM-UHFFFAOYSA-N 0.000 description 1
- 125000006039 1-hexenyl group Chemical group 0.000 description 1
- 125000001637 1-naphthyl group Chemical group [H]C1=C([H])C([H])=C2C(*)=C([H])C([H])=C([H])C2=C1[H] 0.000 description 1
- 125000005978 1-naphthyloxy group Chemical group 0.000 description 1
- 125000006017 1-propenyl group Chemical group 0.000 description 1
- 125000000530 1-propynyl group Chemical group [H]C([H])([H])C#C* 0.000 description 1
- WJFKNYWRSNBZNX-UHFFFAOYSA-N 10H-phenothiazine Chemical compound C1=CC=C2NC3=CC=CC=C3SC2=C1 WJFKNYWRSNBZNX-UHFFFAOYSA-N 0.000 description 1
- TZMSYXZUNZXBOL-UHFFFAOYSA-N 10H-phenoxazine Chemical compound C1=CC=C2NC3=CC=CC=C3OC2=C1 TZMSYXZUNZXBOL-UHFFFAOYSA-N 0.000 description 1
- DJMUYABFXCIYSC-UHFFFAOYSA-N 1H-phosphole Chemical compound C=1C=CPC=1 DJMUYABFXCIYSC-UHFFFAOYSA-N 0.000 description 1
- NRKYWOKHZRQRJR-UHFFFAOYSA-N 2,2,2-trifluoroacetamide Chemical group NC(=O)C(F)(F)F NRKYWOKHZRQRJR-UHFFFAOYSA-N 0.000 description 1
- YQTCQNIPQMJNTI-UHFFFAOYSA-N 2,2-dimethylpropan-1-one Chemical group CC(C)(C)[C]=O YQTCQNIPQMJNTI-UHFFFAOYSA-N 0.000 description 1
- WPWWHXPRJFDTTJ-UHFFFAOYSA-N 2,3,4,5,6-pentafluorobenzamide Chemical group NC(=O)C1=C(F)C(F)=C(F)C(F)=C1F WPWWHXPRJFDTTJ-UHFFFAOYSA-N 0.000 description 1
- VFBJMPNFKOMEEW-UHFFFAOYSA-N 2,3-diphenylbut-2-enedinitrile Chemical group C=1C=CC=CC=1C(C#N)=C(C#N)C1=CC=CC=C1 VFBJMPNFKOMEEW-UHFFFAOYSA-N 0.000 description 1
- 125000004974 2-butenyl group Chemical group C(C=CC)* 0.000 description 1
- 125000000069 2-butynyl group Chemical group [H]C([H])([H])C#CC([H])([H])* 0.000 description 1
- 125000006176 2-ethylbutyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(C([H])([H])*)C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000001622 2-naphthyl group Chemical group [H]C1=C([H])C([H])=C2C([H])=C(*)C([H])=C([H])C2=C1[H] 0.000 description 1
- 125000005979 2-naphthyloxy group Chemical group 0.000 description 1
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- 125000001494 2-propynyl group Chemical group [H]C#CC([H])([H])* 0.000 description 1
- KSXHZOTTWSNEHY-UHFFFAOYSA-N 3-[3-(2-cyanoethoxy)-2,2-bis(2-cyanoethoxymethyl)propoxy]propanenitrile Chemical group N#CCCOCC(COCCC#N)(COCCC#N)COCCC#N KSXHZOTTWSNEHY-UHFFFAOYSA-N 0.000 description 1
- 125000004975 3-butenyl group Chemical group C(CC=C)* 0.000 description 1
- 125000000474 3-butynyl group Chemical group [H]C#CC([H])([H])C([H])([H])* 0.000 description 1
- 125000006201 3-phenylpropyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- CMSGUKVDXXTJDQ-UHFFFAOYSA-N 4-(2-naphthalen-1-ylethylamino)-4-oxobutanoic acid Chemical compound C1=CC=C2C(CCNC(=O)CCC(=O)O)=CC=CC2=C1 CMSGUKVDXXTJDQ-UHFFFAOYSA-N 0.000 description 1
- DDTHMESPCBONDT-UHFFFAOYSA-N 4-(4-oxocyclohexa-2,5-dien-1-ylidene)cyclohexa-2,5-dien-1-one Chemical class C1=CC(=O)C=CC1=C1C=CC(=O)C=C1 DDTHMESPCBONDT-UHFFFAOYSA-N 0.000 description 1
- 125000006043 5-hexenyl group Chemical group 0.000 description 1
- IGDNJMOBPOHHRN-UHFFFAOYSA-N 5h-benzo[b]phosphindole Chemical compound C1=CC=C2C3=CC=CC=C3PC2=C1 IGDNJMOBPOHHRN-UHFFFAOYSA-N 0.000 description 1
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical group [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 1
- 239000005725 8-Hydroxyquinoline Substances 0.000 description 1
- DLFVBJFMPXGRIB-UHFFFAOYSA-N Acetamide Chemical group CC(N)=O DLFVBJFMPXGRIB-UHFFFAOYSA-N 0.000 description 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- KXDAEFPNCMNJSK-UHFFFAOYSA-N Benzamide Chemical group NC(=O)C1=CC=CC=C1 KXDAEFPNCMNJSK-UHFFFAOYSA-N 0.000 description 1
- KYNSBQPICQTCGU-UHFFFAOYSA-N Benzopyrane Chemical compound C1=CC=C2C=CCOC2=C1 KYNSBQPICQTCGU-UHFFFAOYSA-N 0.000 description 1
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical group [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 1
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- 0 Cc1cc(CNC*c2c-3[n]c(C)c2)c-3[n]1 Chemical compound Cc1cc(CNC*c2c-3[n]c(C)c2)c-3[n]1 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- VMQMZMRVKUZKQL-UHFFFAOYSA-N Cu+ Chemical compound [Cu+] VMQMZMRVKUZKQL-UHFFFAOYSA-N 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- ZHNUHDYFZUAESO-UHFFFAOYSA-N Formamide Chemical group NC=O ZHNUHDYFZUAESO-UHFFFAOYSA-N 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- 229910000861 Mg alloy Inorganic materials 0.000 description 1
- ZSBDPRIWBYHIAF-UHFFFAOYSA-N N-acetyl-acetamide Chemical group CC(=O)NC(C)=O ZSBDPRIWBYHIAF-UHFFFAOYSA-N 0.000 description 1
- 229930192627 Naphthoquinone Natural products 0.000 description 1
- ZCQWOFVYLHDMMC-UHFFFAOYSA-N Oxazole Chemical compound C1=COC=N1 ZCQWOFVYLHDMMC-UHFFFAOYSA-N 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 description 1
- 229920000292 Polyquinoline Polymers 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- 229910052772 Samarium Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229910052771 Terbium Inorganic materials 0.000 description 1
- FZWLAAWBMGSTSO-UHFFFAOYSA-N Thiazole Chemical compound C1=CSC=N1 FZWLAAWBMGSTSO-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910052769 Ytterbium Inorganic materials 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- ULGYAEQHFNJYML-UHFFFAOYSA-N [AlH3].[Ca] Chemical compound [AlH3].[Ca] ULGYAEQHFNJYML-UHFFFAOYSA-N 0.000 description 1
- GANNOFFDYMSBSZ-UHFFFAOYSA-N [AlH3].[Mg] Chemical compound [AlH3].[Mg] GANNOFFDYMSBSZ-UHFFFAOYSA-N 0.000 description 1
- JFBZPFYRPYOZCQ-UHFFFAOYSA-N [Li].[Al] Chemical compound [Li].[Al] JFBZPFYRPYOZCQ-UHFFFAOYSA-N 0.000 description 1
- JHYLKGDXMUDNEO-UHFFFAOYSA-N [Mg].[In] Chemical compound [Mg].[In] JHYLKGDXMUDNEO-UHFFFAOYSA-N 0.000 description 1
- 125000002777 acetyl group Chemical group [H]C([H])([H])C(*)=O 0.000 description 1
- 125000005073 adamantyl group Chemical group C12(CC3CC(CC(C1)C3)C2)* 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 150000001408 amides Chemical class 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- PYKYMHQGRFAEBM-UHFFFAOYSA-N anthraquinone Natural products CCC(=O)c1c(O)c2C(=O)C3C(C=CC=C3O)C(=O)c2cc1CC(=O)OC PYKYMHQGRFAEBM-UHFFFAOYSA-N 0.000 description 1
- 150000004056 anthraquinones Chemical class 0.000 description 1
- 125000001204 arachidyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000003710 aryl alkyl group Chemical group 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- 125000003236 benzoyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C(*)=O 0.000 description 1
- 229960002903 benzyl benzoate Drugs 0.000 description 1
- DNSISZSEWVHGLH-UHFFFAOYSA-N butanamide Chemical group CCCC(N)=O DNSISZSEWVHGLH-UHFFFAOYSA-N 0.000 description 1
- 125000004744 butyloxycarbonyl group Chemical group 0.000 description 1
- 125000004063 butyryl group Chemical group O=C([*])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- TVFDJXOCXUVLDH-UHFFFAOYSA-N caesium atom Chemical compound [Cs] TVFDJXOCXUVLDH-UHFFFAOYSA-N 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 239000011575 calcium Substances 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- ZMIGMASIKSOYAM-UHFFFAOYSA-N cerium Chemical compound [Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce] ZMIGMASIKSOYAM-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 125000001309 chloro group Chemical group Cl* 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 229920001940 conductive polymer Polymers 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- PDZKZMQQDCHTNF-UHFFFAOYSA-M copper(1+);thiocyanate Chemical compound [Cu+].[S-]C#N PDZKZMQQDCHTNF-UHFFFAOYSA-M 0.000 description 1
- 239000004148 curcumin Substances 0.000 description 1
- 125000006165 cyclic alkyl group Chemical group 0.000 description 1
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 1
- 125000004210 cyclohexylmethyl group Chemical group [H]C([H])(*)C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C1([H])[H] 0.000 description 1
- 229910052805 deuterium Inorganic materials 0.000 description 1
- 125000004431 deuterium atom Chemical group 0.000 description 1
- 125000004663 dialkyl amino group Chemical group 0.000 description 1
- 125000004986 diarylamino group Chemical group 0.000 description 1
- 125000001664 diethylamino group Chemical group [H]C([H])([H])C([H])([H])N(*)C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 125000002147 dimethylamino group Chemical group [H]C([H])([H])N(*)C([H])([H])[H] 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 1
- 125000003754 ethoxycarbonyl group Chemical group C(=O)(OCC)* 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 125000004705 ethylthio group Chemical group C(C)S* 0.000 description 1
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 1
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 description 1
- 239000000706 filtrate Substances 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 150000008376 fluorenones Chemical class 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 239000002803 fossil fuel Substances 0.000 description 1
- 125000002541 furyl group Chemical group 0.000 description 1
- 238000007646 gravure printing Methods 0.000 description 1
- 239000005431 greenhouse gas Substances 0.000 description 1
- 238000011899 heat drying method Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 125000005935 hexyloxycarbonyl group Chemical group 0.000 description 1
- 125000005980 hexynyl group Chemical group 0.000 description 1
- 238000007602 hot air drying Methods 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 150000003949 imides Chemical class 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- LHJOPRPDWDXEIY-UHFFFAOYSA-N indium lithium Chemical compound [Li].[In] LHJOPRPDWDXEIY-UHFFFAOYSA-N 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- YZASAXHKAQYPEH-UHFFFAOYSA-N indium silver Chemical compound [Ag].[In] YZASAXHKAQYPEH-UHFFFAOYSA-N 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000009830 intercalation Methods 0.000 description 1
- 230000002687 intercalation Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 238000007733 ion plating Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 125000002510 isobutoxy group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])O* 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 125000005929 isobutyloxycarbonyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])OC(*)=O 0.000 description 1
- 125000001972 isopentyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 125000005928 isopropyloxycarbonyl group Chemical group [H]C([H])([H])C([H])(OC(*)=O)C([H])([H])[H] 0.000 description 1
- 125000005956 isoquinolyl group Chemical group 0.000 description 1
- 229930192419 itoside Natural products 0.000 description 1
- 150000004658 ketimines Chemical class 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000002346 layers by function Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- GCICAPWZNUIIDV-UHFFFAOYSA-N lithium magnesium Chemical compound [Li].[Mg] GCICAPWZNUIIDV-UHFFFAOYSA-N 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- SJCKRGFTWFGHGZ-UHFFFAOYSA-N magnesium silver Chemical compound [Mg].[Ag] SJCKRGFTWFGHGZ-UHFFFAOYSA-N 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 description 1
- 125000001160 methoxycarbonyl group Chemical group [H]C([H])([H])OC(*)=O 0.000 description 1
- 229940095102 methyl benzoate Drugs 0.000 description 1
- 125000002816 methylsulfanyl group Chemical group [H]C([H])([H])S[*] 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 125000001421 myristyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- ZHDORMMHAKXTPT-UHFFFAOYSA-N n-benzoylbenzamide Chemical group C=1C=CC=CC=1C(=O)NC(=O)C1=CC=CC=C1 ZHDORMMHAKXTPT-UHFFFAOYSA-N 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- AIDQCFHFXWPAFG-UHFFFAOYSA-N n-formylformamide Chemical group O=CNC=O AIDQCFHFXWPAFG-UHFFFAOYSA-N 0.000 description 1
- 125000003136 n-heptyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000001298 n-hexoxy group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])O* 0.000 description 1
- 125000003935 n-pentoxy group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])O* 0.000 description 1
- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 150000002791 naphthoquinones Chemical class 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000007645 offset printing Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- WCPAKWJPBJAGKN-UHFFFAOYSA-N oxadiazole Chemical compound C1=CON=N1 WCPAKWJPBJAGKN-UHFFFAOYSA-N 0.000 description 1
- 150000004866 oxadiazoles Chemical class 0.000 description 1
- PQQKPALAQIIWST-UHFFFAOYSA-N oxomolybdenum Chemical compound [Mo]=O PQQKPALAQIIWST-UHFFFAOYSA-N 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- 229960003540 oxyquinoline Drugs 0.000 description 1
- 125000000913 palmityl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 150000002964 pentacenes Chemical class 0.000 description 1
- 125000006340 pentafluoro ethyl group Chemical group FC(F)(F)C(F)(F)* 0.000 description 1
- 125000001148 pentyloxycarbonyl group Chemical group 0.000 description 1
- 125000005003 perfluorobutyl group Chemical group FC(F)(F)C(F)(F)C(F)(F)C(F)(F)* 0.000 description 1
- 125000005005 perfluorohexyl group Chemical group FC(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)* 0.000 description 1
- 150000002987 phenanthrenes Chemical class 0.000 description 1
- 229950000688 phenothiazine Drugs 0.000 description 1
- 125000000951 phenoxy group Chemical group [H]C1=C([H])C([H])=C(O*)C([H])=C1[H] 0.000 description 1
- 125000006678 phenoxycarbonyl group Chemical group 0.000 description 1
- 125000000843 phenylene group Chemical group C1(=C(C=CC=C1)*)* 0.000 description 1
- 125000003356 phenylsulfanyl group Chemical group [*]SC1=C([H])C([H])=C([H])C([H])=C1[H] 0.000 description 1
- 125000005936 piperidyl group Chemical group 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920000172 poly(styrenesulfonic acid) Polymers 0.000 description 1
- 229920006254 polymer film Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229940005642 polystyrene sulfonic acid Drugs 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- QLNJFJADRCOGBJ-UHFFFAOYSA-N propionamide Chemical group CCC(N)=O QLNJFJADRCOGBJ-UHFFFAOYSA-N 0.000 description 1
- 125000001501 propionyl group Chemical group O=C([*])C([H])([H])C([H])([H])[H] 0.000 description 1
- KRIOVPPHQSLHCZ-UHFFFAOYSA-N propiophenone Chemical compound CCC(=O)C1=CC=CC=C1 KRIOVPPHQSLHCZ-UHFFFAOYSA-N 0.000 description 1
- 125000004742 propyloxycarbonyl group Chemical group 0.000 description 1
- PBMFSQRYOILNGV-UHFFFAOYSA-N pyridazine Chemical compound C1=CC=NN=C1 PBMFSQRYOILNGV-UHFFFAOYSA-N 0.000 description 1
- 125000004076 pyridyl group Chemical group 0.000 description 1
- 125000000168 pyrrolyl group Chemical group 0.000 description 1
- MCJGNVYPOGVAJF-UHFFFAOYSA-N quinolin-8-ol Chemical compound C1=CN=C2C(O)=CC=CC2=C1 MCJGNVYPOGVAJF-UHFFFAOYSA-N 0.000 description 1
- 125000002943 quinolinyl group Chemical group N1=C(C=CC2=CC=CC=C12)* 0.000 description 1
- 125000005493 quinolyl group Chemical group 0.000 description 1
- 150000003252 quinoxalines Chemical class 0.000 description 1
- 125000001567 quinoxalinyl group Chemical group N1=C(C=NC2=CC=CC=C12)* 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 229910052701 rubidium Inorganic materials 0.000 description 1
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 description 1
- KZUNJOHGWZRPMI-UHFFFAOYSA-N samarium atom Chemical compound [Sm] KZUNJOHGWZRPMI-UHFFFAOYSA-N 0.000 description 1
- 229910052706 scandium Inorganic materials 0.000 description 1
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 239000000565 sealant Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- 125000000547 substituted alkyl group Chemical group 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 125000005931 tert-butyloxycarbonyl group Chemical group [H]C([H])([H])C(OC(*)=O)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 150000003518 tetracenes Chemical class 0.000 description 1
- UWYZHKAOTLEWKK-UHFFFAOYSA-N tetrahydro-isoquinoline Natural products C1=CC=C2CNCCC2=C1 UWYZHKAOTLEWKK-UHFFFAOYSA-N 0.000 description 1
- VLLMWSRANPNYQX-UHFFFAOYSA-N thiadiazole Chemical compound C1=CSN=N1.C1=CSN=N1 VLLMWSRANPNYQX-UHFFFAOYSA-N 0.000 description 1
- 125000001544 thienyl group Chemical group 0.000 description 1
- 229930192474 thiophene Natural products 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 125000003944 tolyl group Chemical group 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 125000004306 triazinyl group Chemical group 0.000 description 1
- 125000005034 trifluormethylthio group Chemical group FC(S*)(F)F 0.000 description 1
- 125000004044 trifluoroacetyl group Chemical group FC(C(=O)*)(F)F 0.000 description 1
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 1
- PWYVVBKROXXHEB-UHFFFAOYSA-M trimethyl-[3-(1-methyl-2,3,4,5-tetraphenylsilol-1-yl)propyl]azanium;iodide Chemical compound [I-].C[N+](C)(C)CCC[Si]1(C)C(C=2C=CC=CC=2)=C(C=2C=CC=CC=2)C(C=2C=CC=CC=2)=C1C1=CC=CC=C1 PWYVVBKROXXHEB-UHFFFAOYSA-M 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 210000003462 vein Anatomy 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- NAWDYIZEMPQZHO-UHFFFAOYSA-N ytterbium Chemical compound [Yb] NAWDYIZEMPQZHO-UHFFFAOYSA-N 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K39/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic radiation-sensitive element covered by group H10K30/00
- H10K39/30—Devices controlled by radiation
- H10K39/32—Organic image sensors
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/02—Printing inks
- C09D11/03—Printing inks characterised by features other than the chemical nature of the binder
- C09D11/033—Printing inks characterised by features other than the chemical nature of the binder characterised by the solvent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/80—Constructional details
- H10K30/88—Passivation; Containers; Encapsulations
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to an ink, a solidified film of the ink, and a photoelectric conversion element.
- Patent Document 1 a solar cell having an active layer containing a p-type semiconductor material and an n-type semiconductor material is known, and a technology for forming an active layer by an ink composition containing a combination of these semiconductor materials and a specific solvent is known.
- a photoelectric conversion element can function as a light detection element when light is irradiated in a state where a reverse bias voltage is applied, and a photocurrent flows. In order to improve the detection sensitivity of the light detection element, it is required to improve the external quantum efficiency of the photoelectric conversion element.
- the photoelectric conversion element can function as a solar cell. Solar cells that use natural energy do not consume resources such as fossil fuels during power generation and do not emit greenhouse gases. Therefore, a solar cell is expected as a power supply source using green energy, and its performance improvement is required. Therefore, also when making a photoelectric conversion element function as a solar cell, higher external quantum efficiency is calculated
- the present inventor has found that the external quantum efficiency of a photoelectric conversion element in which an active layer is formed using an ink containing a specific solvent can be improved, and completes the present invention I did. That is, the present invention provides the following.
- An ink comprising a p-type semiconductor material, an n-type semiconductor material, a first solvent which is a nitrogen-containing heterocyclic compound, and a second solvent which is an aromatic hydrocarbon.
- the nitrogen-containing heterocyclic compound contains a six-membered ring structure, and the six-membered ring structure contains one or two hetero atoms, and the one or two hetero atoms are each a nitrogen atom, The ink according to [1] or [2].
- the ink according to [3], wherein the 6-membered ring structure is a pyridine ring structure, a tetrahydropyridine ring structure, a piperidine ring structure, or a pyrazine ring structure.
- the first solvent may have quinoline which may have a substituent, 1,2,3,4-tetrahydroquinoline which may have a substituent, and may have a substituent
- the photoelectric conversion device according to [10] which is a light detection device.
- An image sensor comprising the photoelectric conversion element according to [10] or [11].
- a fingerprint authentication apparatus comprising the photoelectric conversion device according to [10] or [11].
- a step (i) of applying the ink according to any one of [1] to [8] to a coating target to obtain a coated film, and a step of removing a solvent from the obtained coated film (ii) A method of producing a solidified film, comprising: [15] A method of manufacturing a photoelectric conversion element, comprising a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode in this order, The process of forming the said active layer including the process of forming the said active layer, apply
- the present invention can improve the external quantum efficiency of the photoelectric conversion element.
- FIG. 1 is a schematic view showing an embodiment of the photoelectric conversion element of the present invention.
- FIG. 2 is a view schematically showing a configuration example of an image detection unit for a solid-state imaging device.
- FIG. 3 is a view schematically showing a configuration example of a fingerprint detection unit configured integrally with the display device.
- the “polymer compound” means a polymer having a molecular weight distribution and having a polystyrene-equivalent number average molecular weight of 1 ⁇ 10 3 or more and 1 ⁇ 10 8 or less.
- the structural units contained in the polymer compound are 100 mol% in total.
- the "constituent unit” means a unit which is present in one or more in the polymer compound.
- the "hydrogen atom” may be a light hydrogen atom or a deuterium atom.
- halogen atom includes fluorine atom, chlorine atom, bromine atom and iodine atom.
- the "alkyl group” may be linear, branched or cyclic.
- the number of carbon atoms of the linear alkyl group is usually 1 to 50, preferably 1 to 30, and more preferably 1 to 20, not including the number of carbon atoms of the substituent.
- the carbon atom number of the branched or cyclic alkyl group is usually 3 to 50, preferably 3 to 30, and more preferably 4 to 20, not including the carbon atom number of the substituent.
- the alkyl group may have a substituent.
- Specific examples of the alkyl group include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, tert-butyl group, n-pentyl group, isoamyl group, 2-ethylbutyl group, n- Hexyl, cyclohexyl, n-heptyl, cyclohexylmethyl, cyclohexylethyl, n-octyl, 2-ethylhexyl, 3-n-propylheptyl, adamantyl, n-decyl, 3,7-dimethyl Non-substituted alkyl group such as octyl group, 2-ethyloctyl group, 2-n-hexyl-decyl group, n-dodecyl group, tetrade
- aryl group means an atomic group remaining after removing one hydrogen atom directly bonded to a carbon atom constituting a ring from an aromatic hydrocarbon which may have a substituent.
- the aryl group may have a substituent.
- Specific examples of the aryl group include phenyl group, 1-naphthyl group, 2-naphthyl group, 1-anthracenyl group, 2-anthracenyl group, 9-anthracenyl group, 1-pyrenyl group, 2-pyrenyl group, 4-pyrenyl group 2-fluorenyl group, 3-fluorenyl group, 4-fluorenyl group, 2-phenylphenyl group, 3-phenylphenyl group, 4-phenylphenyl group, and a hydrogen atom in these groups is an alkyl group, an alkoxy group, An aryl group, a group substituted with a fluorine atom and the like can be mentioned.
- the "alkoxy group” may be linear, branched or cyclic.
- the carbon atom number of the linear alkoxy group is usually 1 to 40, preferably 1 to 10, not including the carbon atom number of the substituent.
- the carbon atom number of the branched or cyclic alkoxy group is usually 3 to 40, preferably 4 to 10, not including the carbon atom number of the substituent.
- the alkoxy group may have a substituent.
- Specific examples of the alkoxy group include methoxy group, ethoxy group, n-propyloxy group, isopropyloxy group, n-butyloxy group, isobutyloxy group, tert-butyloxy group, n-pentyloxy group, n-hexyloxy group, And cyclohexyloxy, n-heptyloxy, n-octyloxy, 2-ethylhexyloxy, n-nonyloxy, n-decyloxy, 3,7-dimethyloctyloxy, and lauryloxy groups.
- the number of carbon atoms of the “aryloxy group” is usually 6 to 60, preferably 6 to 48, not including the number of carbon atoms of the substituent.
- the aryloxy group may have a substituent.
- Specific examples of the aryloxy group include phenoxy group, 1-naphthyloxy group, 2-naphthyloxy group, 1-anthracenyloxy group, 9-anthracenyloxy group, 1-pyrenyloxy group, and these groups
- the hydrogen atom in is substituted by an alkyl group, an alkoxy group, a fluorine atom and the like.
- alkylthio group may be linear, branched or cyclic.
- the carbon atom number of the linear alkylthio group is usually 1 to 40, preferably 1 to 10, not including the carbon atom number of the substituent.
- the carbon atom number of the branched and cyclic alkylthio group is usually 3 to 40, preferably 4 to 10, not including the carbon atom number of the substituent.
- the alkylthio group may have a substituent.
- Specific examples of the alkylthio group are methylthio group, ethylthio group, propylthio group, isopropylthio group, butylthio group, isobutylthio group, tert-butylthio group, pentylthio group, hexylthio group, cyclohexylthio group, heptylthio group, octylthio group, 2 And -ethylhexylthio group, nonylthio group, decylthio group, 3,7-dimethyloctylthio group, laurylthio group, and trifluoromethylthio group.
- the number of carbon atoms of the “arylthio group” is usually 6 to 60, preferably 6 to 48, not including the number of carbon atoms of the substituent.
- the arylthio group may have a substituent.
- the arylthio group include phenylthio group and C1 to C12 alkyloxyphenylthio group (C1 to C12 indicate that the number of carbon atoms of the group described immediately thereafter is 1 to 12. The same applies to the following.
- the “p-valent heterocyclic group” (p represents an integer of 1 or more) is a direct bond from a heterocyclic compound which may have a substituent to a carbon atom or a heteroatom constituting a ring. It means the remaining atomic groups excluding p hydrogen atoms among the hydrogen atoms. Among p-valent heterocyclic groups, “p-valent aromatic heterocyclic group” is preferable.
- the “p-valent aromatic heterocyclic group” is a p-membered hydrogen atom directly bonded to a carbon atom or a hetero atom constituting a ring, from the aromatic heterocyclic compound which may have a substituent. Means the remaining atomic groups excluding the hydrogen atom of
- Examples of the substituent which the heterocyclic compound may have include a halogen atom, an alkyl group, an aryl group, an alkoxy group, an aryloxy group, an alkylthio group, an arylthio group, a monovalent heterocyclic group, and a substituted amino group.
- Aromatic heterocyclic compounds include, in addition to compounds in which the heterocycle itself exhibits aromaticity, compounds in which an aromatic ring is fused to the heterocycle even if the heterocycle itself exhibits no aromaticity are included Ru.
- aromatic heterocyclic compounds specific examples of compounds in which the heterocycle itself exhibits aromaticity include oxadiazole, thiadiazole, thiazole, oxazole, thiophene, pyrrole, phosphole, furan, pyridine, pyrazine, pyrimidine, triazine And pyridazine, quinoline, isoquinoline, carbazole, and dibenzophosphole.
- aromatic heterocyclic compounds specific examples of compounds in which the aromatic heterocycle itself does not exhibit aromaticity and in which an aromatic ring is fused to the heterocycle include phenoxazine, phenothiazine, dibenzoborole, and dibenzo. And silole and benzopyran.
- the carbon atom number of the monovalent heterocyclic group is usually 2 to 60, preferably 4 to 20, not including the carbon atom number of the substituent.
- the monovalent heterocyclic group may have a substituent, and examples of the monovalent heterocyclic group include, for example, thienyl group, pyrrolyl group, furyl group, pyridyl group, piperidyl group, quinolyl group, and the like. Examples include an isoquinolyl group, a pyrimidinyl group, a triazinyl group, and a group in which a hydrogen atom in these groups is substituted with an alkyl group, an alkoxy group or the like.
- the “substituted amino group” means an amino group having two substituents.
- monohydric heterocyclic group are mentioned as an example of the substituent which an amino group has, An alkyl group, an aryl group, or a monovalent
- the carbon atom number of the substituted amino group is usually 2-30.
- substituted amino group examples include dialkylamino groups such as dimethylamino and diethylamino; diphenylamino, bis (4-methylphenyl) amino, bis (4-tert-butylphenyl) amino, bis (3, And diarylamino groups such as 5-di-tert-butylphenyl) amino group.
- the "acyl group” usually has about 2 to 20 carbon atoms, and preferably 2 to 18 carbon atoms. Specific examples of the acyl group include acetyl group, propionyl group, butyryl group, isobutyryl group, pivaloyl group, benzoyl group, trifluoroacetyl group, and pentafluorobenzoyl group.
- the “imine residue” refers to an atomic group obtained by removing one hydrogen atom directly bonded to a carbon atom or a nitrogen atom constituting a carbon atom-nitrogen atom double bond from an imine compound.
- the "imine compound” means an organic compound having a carbon atom-nitrogen atom double bond in the molecule.
- the imine compound include aldimine, ketimine, and a compound in which a hydrogen atom bonded to a nitrogen atom constituting a carbon atom-nitrogen atom double bond in the aldimine is substituted with an alkyl group or the like.
- the imine residue usually has about 2 to 20 carbon atoms, and preferably 2 to 18 carbon atoms.
- Examples of imine residues include groups represented by the following structural formula.
- the "amide group” means the remaining group except one hydrogen atom bonded to the nitrogen atom from the amide.
- the carbon atom number of the amide group is usually about 1 to 20, preferably 1 to 18.
- Specific examples of the amide group include formamide group, acetamide group, propioamide group, butyroamide group, benzamide group, trifluoroacetamide group, pentafluorobenzamide group, diformamide group, diacetamide group, dipropioamide group, dibutyroamide group, dibenzamide group , Ditrifluoroacetamide group, and dipentafluorobenzamide group.
- the "acid imide group” refers to the remaining atomic group from acid imide except one hydrogen atom bonded to a nitrogen atom.
- the number of carbon atoms of the acid imide group is usually about 4 to 20.
- Specific examples of the acid imide group include the groups shown below.
- R ′ represents an alkyl group, an aryl group, an arylalkyl group, or a monovalent heterocyclic group.
- the substituted oxycarbonyl group usually has about 2 to 60 carbon atoms, and preferably 2 to 48 carbon atoms.
- substituted oxycarbonyl group examples include methoxycarbonyl group, ethoxycarbonyl group, propoxycarbonyl group, isopropoxycarbonyl group, butoxycarbonyl group, isobutoxycarbonyl group, tert-butoxycarbonyl group, pentyloxycarbonyl group, hexyloxycarbonyl group Group, cyclohexyloxycarbonyl group, heptyloxycarbonyl group, octyloxycarbonyl group, 2-ethylhexyloxycarbonyl group, nonyloxycarbonyl group, decyloxycarbonyl group, 3, 7-dimethyloctyloxycarbonyl group, dodecyloxycarbonyl group, tri Fluoromethoxycarbonyl group, pentafluoroethoxycarbonyl group, perfluorobutoxycarbonyl group, perfluorohexyloxycarbonyl , Perfluorooctyl group,
- alkenyl group may be linear, branched or cyclic.
- the carbon atom number of the linear alkenyl group is usually 2 to 30, preferably 3 to 20, not including the carbon atom number of the substituent.
- the carbon atom number of the branched or cyclic alkenyl group is usually 3 to 30, preferably 4 to 20, not including the carbon atom number of the substituent.
- the alkenyl group may have a substituent.
- Specific examples of the alkenyl group include vinyl group, 1-propenyl group, 2-propenyl group, 2-butenyl group, 3-butenyl group, 3-pentenyl group, 4-pentenyl group, 1-hexenyl group, 5-hexenyl group And 7-octenyl groups, and groups in which a hydrogen atom in these groups is substituted with an alkyl group, an alkoxy group or the like.
- the "alkynyl group” may be linear, branched or cyclic.
- the carbon atom number of the linear alkenyl group is usually 2 to 20, preferably 3 to 20, not including the carbon atom number of the substituent.
- the carbon atom number of the branched or cyclic alkenyl group is usually 4 to 30, preferably 4 to 20, not including the carbon atom number of the substituent.
- the alkynyl group may have a substituent.
- Specific examples of the alkynyl group include ethynyl group, 1-propynyl group, 2-propynyl group, 2-butynyl group, 3-butynyl group, 3-pentynyl group, 4-pentynyl group, 4-pentynyl group, 1-hexynyl group, 5-hexynyl group And groups in which a hydrogen atom in these groups is substituted with an alkyl group, an alkoxy group or the like.
- the term “ink” means a liquid used in a coating method and is not limited to colored liquids.
- the term “coating method” includes a method of forming a film using a liquid substance, for example, slit coating method, knife coating method, spin coating method, casting method, microgravure coating method, gravure coating method, bar Coating method, roll coating method, wire bar coating method, dip coating method, spray coating method, screen printing method, gravure printing method, flexographic printing method, offset printing method, ink jet coating method, dispenser printing method, nozzle coating method, capillary The coat method is mentioned.
- the “ink” may be a solution, or may be a dispersion, such as a dispersion, an emulsion (emulsion), a suspension (suspension) or the like.
- the ink of the present invention comprises a p-type semiconductor material, an n-type semiconductor material, a first solvent, and a second solvent.
- the first solvent is a nitrogen-containing heterocyclic compound.
- the ink of the present invention contains a nitrogen-containing heterocyclic compound as the first solvent, the external quantum efficiency of the photoelectric conversion element can be improved. Although the reason is not to limit the present invention, the following mechanism is presumed.
- the nitrogen-containing heterocyclic compound as the first solvent and the n-type semiconductor material such as the fullerene derivative strongly interact with each other due to a hydrogen bond, a dispersing force and the like.
- the strong interaction between the nitrogen-containing heterocyclic compound and the n-type semiconductor material causes the n-type semiconductor material to be coated as well as removing the solvent. It is thought that it becomes possible to move (migration) easily in the middle.
- a network of n-type semiconductor material functioning as a charge transfer path is sufficiently formed to improve the external quantum efficiency.
- the nitrogen-containing heterocyclic compound includes, for example, pyridine which may have a substituent, quinoline which may have a substituent, quinoxaline which may have a substituent, and the like. And 1,2,3,4-tetrahydroquinoline, pyrimidine which may have a substituent, pyrazine which may have a substituent, and quinazoline which may have a substituent. .
- the first solvent may be composed of one type of nitrogen-containing heterocyclic compound or may be composed of two or more types of nitrogen-containing heterocyclic compounds.
- the first solvent is composed of one nitrogen-containing heterocyclic compound.
- the nitrogen-containing heterocyclic compound may have a substituent on the ring structure.
- a substituent which the ring structure (eg, quinoline ring structure, 1,2,3,4-tetrahydroquinoline ring structure, quinoxaline ring structure) of the nitrogen-containing heterocyclic compound may have, for example, the number of carbon atoms
- an alkyl group of 1 to 5 an alkoxy group of 1 to 5 carbon atoms, a halogen group and an alkylthio group.
- the nitrogen-containing heterocyclic compound as the first solvent contains a six-membered ring structure, and the six-membered ring structure contains one or two hetero atoms, and the one or two hetero atoms are respectively nitrogen atoms Is preferred.
- the 6-membered ring structure containing one hetero atom and wherein one hetero atom is a nitrogen atom include a pyridine ring structure, a tetrahydropyridine ring structure, and a piperidine ring structure.
- Examples of the 6-membered ring structure containing two hetero atoms, wherein the two hetero atoms are nitrogen atoms include a pyrazine ring structure and a pyrimidine ring structure.
- nitrogen-containing heterocyclic compound containing a pyridine ring structure for example, pyridine which may have a substituent, quinoline which may have a substituent, and isoquinoline which may have a substituent are exemplified. It can be mentioned.
- nitrogen-containing cyclic compound containing a tetrahydropyridine ring structure examples include optionally substituted 1,2,3,4-tetrahydroquinoline and optionally substituted 1,2,3 3,4- tetrahydroisoquinoline is mentioned.
- nitrogen-containing cyclic compound containing a pyrazine ring structure examples include pyrazine which may have a substituent and quinoxaline which may have a substituent.
- nitrogen-containing cyclic compound containing a pyrimidine ring structure examples include pyrimidine which may have a substituent, and quinazoline which may have a substituent.
- the first solvent is a nitrogen-containing heterocyclic compound containing a pyridine ring structure, a tetrahydropyridine ring structure, a piperidine ring structure or a pyrazine ring structure, and more preferably a nitrogen-containing heterocyclic compound containing a pyridine ring structure, a tetrahydropyridine ring or a pyrazine ring structure
- a heterocyclic compound More preferably, it is selected from the group consisting of quinoline which may have a substituent, 1,2,3,4-tetrahydroquinoline which may have a substituent, and quinoxaline which may have a substituent.
- the first solvent is Preferably, quinoline which may have a substituent, 1,2,3,4-tetrahydroquinoline which may have a substituent, or quinoxaline which may have a substituent is preferable. More preferably, quinoline having an alkyl group, 1,2,3,4-tetrahydroquinoline having an alkyl group, or quinoxaline having an alkyl group, More preferably, 2-methylquinoline, 3-methylquinoline, 6-methylquinoline, 8-methylquinoline, 1,2,3,4-tetrahydroquinaldine, or 2-methylquinoxaline.
- the second solvent is an aromatic hydrocarbon.
- a solvent capable of dissolving the p-type semiconductor material is preferable.
- aromatic hydrocarbon for example, toluene, xylene (eg, o-xylene, m-xylene, p-xylene), trimethylbenzene (eg, mesitylene, 1,2,4-trimethylbenzene (pseudocumene)), butylbenzene
- xylene eg, o-xylene, m-xylene, p-xylene
- trimethylbenzene eg, mesitylene, 1,2,4-trimethylbenzene (pseudocumene)
- butylbenzene examples are (for example, n-butylbenzene, sec-butylbenzene, tert-butylbenzene), methylnaphthalene (eg 1-methylnaphthalene), tetralin and indane.
- the second solvent may be composed of one aromatic hydrocarbon or may be composed of two or more aromatic hydrocarbons.
- the second solvent is composed of one aromatic hydrocarbon.
- the second solvent is preferably toluene, o-xylene, m-xylene, p-xylene, mesitylene, 1,2,4-trimethylbenzene, n-butylbenzene, sec-butylbenzene, tert-butylbenzene, methyl At least one selected from the group consisting of naphthalene, tetralin and indane, More preferably, toluene, o-xylene, m-xylene, p-xylene, mesitylene, 1,2,4-trimethylbenzene, n-butylbenzene, sec-butylbenzene, tert-butylbenzene, methyl naphthalene, tetralin or indane It is.
- the weight ratio of the first solvent to the second solvent is preferably 1/99 from the viewpoint of improving the solubility of the p-type semiconductor material and the n-type semiconductor material. Or more, more preferably 3/97 or more, still more preferably 5/95 or more, preferably 20/80 or less, more preferably 15/85 or less, more preferably 10/90 or less, preferably 1/99 20/80 or less, more preferably 3/97 or more and 15/85 or less, still more preferably 5/95 or more and 10/90 or less.
- the total weight of the first solvent and the second solvent contained in the ink is preferably from the viewpoint of making the solubility of the p-type semiconductor material and the n-type semiconductor material better with respect to 100% by weight of the total weight of the ink. Is 90% by weight or more, more preferably 92% by weight or more, still more preferably 95% by weight, and from the viewpoint of facilitating formation of a film having a certain thickness or more, preferably 99% by weight or less, more preferably 98% by weight % Or less, more preferably 97.5% by weight or less.
- the ink may comprise any solvent other than the first solvent and the second solvent.
- the content of the optional solvent is preferably 5% by weight or less, more preferably 3% by weight or less, still more preferably 1% by weight or less, based on 100% by weight of the total weight of all the solvents contained in the ink. Particularly preferably, it is 0% by weight.
- the p-type semiconductor material may be a low molecular weight compound or a high molecular weight compound.
- Examples of p-type semiconductor materials which are low molecular weight compounds include phthalocyanines, metal phthalocyanines, porphyrins, metal porphyrins, oligothiophenes, tetracenes, pentacenes, and rubrenes.
- the p-type semiconductor material which is a polymer compound, for example, polyvinylcarbazole and its derivative, polysilane and its derivative, polysiloxane derivative having aromatic amine structure in side chain or main chain, polyaniline and its derivative, polythiophene and its derivative And polypyrrole and derivatives thereof, polyphenylene vinylene and derivatives thereof, polythienylene vinylene and derivatives thereof, polyfluorene and derivatives thereof and the like.
- the p-type semiconductor material is preferably a polymer compound from the viewpoint of making the stability of the ink excellent, and from the viewpoint of making the external quantum efficiency of the photoelectric conversion device excellent, the following formula (I) It is preferable that it is a high molecular compound containing the structural unit represented by the structural unit represented by, and / or following formula (II).
- Ar 1 and Ar 2 each represent a trivalent aromatic heterocyclic group
- Z is a group represented by any one of the following formulas (Z-1) to (Z-7) Represents
- Ar 3 represents a divalent aromatic heterocyclic group.
- R represents a hydrogen atom, a halogen atom, an alkyl group, an aryl group, an alkoxy group, an aryloxy group, an alkylthio group, an arylthio group, a monovalent heterocyclic group, a substituted group It represents an amino group, an acyl group, an imine residue, an amido group, an acid imide group, a substituted oxycarbonyl group, an alkenyl group, an alkynyl group, a cyano group or a nitro group.
- two R's may be the same as or different from each other.
- the constitutional unit represented by the formula (I) is preferably a constitutional unit represented by the following formula (I-1).
- Z represents the same meaning as described above.
- Examples of the structural unit represented by the formula (I-1) include structural units represented by the following formulas (501) to (505).
- R represents the same meaning as described above.
- two R's may be the same or different.
- the number of carbon atoms of the divalent aromatic heterocyclic group represented by Ar 3 is generally 2 to 60, preferably 4 to 60, and more preferably 4 to 20.
- the divalent aromatic heterocyclic group represented by Ar 3 may have a substituent.
- substituent which the divalent aromatic heterocyclic group represented by Ar 3 may have include a halogen atom, an alkyl group, an aryl group, an alkoxy group, an aryloxy group, an alkylthio group, an arylthio group, Examples thereof include monovalent heterocyclic groups, substituted amino groups, acyl groups, imine residues, amide groups, acid imide groups, substituted oxycarbonyl groups, alkenyl groups, alkynyl groups, cyano groups, and nitro groups.
- Examples of the divalent aromatic heterocyclic group represented by Ar 3 include groups represented by the following formulas (101) to (185).
- R represents the same meaning as described above.
- the plurality of R's may be the same or different.
- constitutional units represented by the formula (II) constitutional units represented by the following formulas (II-1) to (II-6) are preferable.
- X 1 and X 2 each independently represent an oxygen atom or a sulfur atom, and R represents the same meaning as described above. When a plurality of R's are present, the plurality of R's may be the same or different.
- each of X 1 and X 2 in the formulas (II-1) to (II-6) is a sulfur atom because the raw material compounds are easily available.
- the polymer compound which is a p-type semiconductor material may contain two or more structural units of the formula (I), and may contain two or more structural units of the formula (II).
- the polymer compound which is a p-type semiconductor material may contain a constitutional unit represented by the following formula (III).
- Ar 4 represents an arylene group.
- the arylene group represented by Ar 4 means an atomic group remaining after removing two hydrogen atoms from an aromatic hydrocarbon which may have a substituent.
- the aromatic hydrocarbon also includes a compound having a condensed ring, and a compound in which two or more members selected from the group consisting of independent benzene rings and condensed rings are directly or linked via a divalent group such as vinylene.
- Examples of the substituent which the aromatic hydrocarbon may have include the same substituents as the examples mentioned above as the substituent which the heterocyclic compound may have.
- the carbon atom number of the arylene group excluding the substituent is usually 6 to 60, and preferably 6 to 20.
- the number of carbon atoms of the arylene group including the substituent is usually about 6 to 100.
- arylene groups include phenylene (for example, the following formulas 1 to 3), naphthalene-diyl (for example, the following formulas 4 to 13), anthracene-diyl (for example, the following formulas 14 to 19), Biphenyl-diyl group (for example, the following formulas 20 to 25), terphenyl-diyl group (for example, the following formulas 26 to 28), fused ring compound group (for example, the following formulas 29 to 35), fluorene-diyl group (For example, the following formulas 36 to 38), and a benzofluorene-diyl group (for example, the following formulas 39 to 46).
- phenylene for example, the following formulas 1 to 3
- naphthalene-diyl for example, the following formulas 4 to 13
- anthracene-diyl for example, the following formulas 14 to 19
- Biphenyl-diyl group for example,
- the polymer compound as the p-type semiconductor material contains the constitutional unit represented by the formula (I) and / or the constitutional unit represented by the formula (II), the constitutional unit represented by the formula (I) and the formula
- the total amount of the constituent units represented by (II) is usually 20 to 100 mol%, assuming that the amount of all constituent units contained in the polymer compound is 100 mol%, and the charge transportability as a p-type semiconductor material Preferably from 40 to 100 mol%, more preferably from 50 to 100 mol%.
- polymer compound as the p-type semiconductor material examples include polymer compounds represented by the following formula
- the polymer compound as a p-type semiconductor material has a polystyrene equivalent weight average molecular weight of usually 1 ⁇ 10 3 to 1 ⁇ 10 8 and is preferably 1 ⁇ 10 3 to 3 in view of improving the solubility in a solvent. It is 1 ⁇ 10 6 .
- the ink may contain only one p-type semiconductor material, or may contain two or more arbitrary proportions.
- the n-type semiconductor material may be a low molecular weight compound or a high molecular weight compound.
- n-type semiconductor materials which are low molecular weight compounds
- n-type semiconductor materials which are low molecular weight compounds
- n-type semiconductor materials which are low molecular weight compounds
- oxadiazole derivatives anthraquinodimethane and its derivatives, benzoquinone and its derivatives, naphthoquinone and its derivatives, anthraquinone and its derivatives, tetracyano Anthraquinodimethane and derivatives thereof, fluorenone derivatives, diphenyldicyanoethylene and derivatives thereof, diphenoquinone derivatives, metal complexes of 8-hydroxyquinoline and derivatives thereof, fullerenes such as C 60 fullerene and derivatives thereof, and phenanthrene derivatives such as vasocuproin Can be mentioned.
- n-type semiconductor materials which are high molecular compounds include polyvinylcarbazole and derivatives thereof, polysilane and derivatives thereof, polysiloxane derivatives having an aromatic amine structure in the side chain or main chain, polyaniline and the like Derivatives, polythiophene and derivatives thereof, polypyrrole and derivatives thereof, polyphenylene vinylene and derivatives thereof, polythienylene vinylene and derivatives thereof, polyquinoline and derivatives thereof, polyquinoxaline and derivatives thereof, and polyfluorene and derivatives thereof can be mentioned.
- the n-type semiconductor material is preferably at least one selected from fullerenes and fullerene derivatives, and more preferably fullerene derivatives.
- fullerene examples include C 84 fullerene.
- fullerene derivatives include derivatives of these fullerenes.
- the fullerene derivative means a compound in which at least a part of the fullerene is modified.
- Examples of the fullerene derivative include compounds represented by the following formulas (N-1) to (N-4).
- R a represents an alkyl group, an aryl group, a monovalent heterocyclic group, or a group having an ester structure.
- the plurality of Ras may be the same as or different from each other.
- R b represents an alkyl group or an aryl group.
- Plural R b 's may be the same as or different from each other.
- Examples of the group having an ester structure represented by Ra include a group represented by the following formula (19).
- u1 represents an integer of 1 to 6.
- u2 represents an integer of 0 to 6;
- R c represents an alkyl group, an aryl group or a monovalent heterocyclic group.
- Examples of C 60 fullerene derivatives include the following compounds.
- fullerene derivative examples include [6,6] -phenyl-C61 butyric acid methyl ester (C60PCBM, [6,6] -phenyl C61 butyric acid methyl ester), [6,6] -phenyl-C71 butyric acid methyl ester ( C70PCBM, [6,6] -Phenyl C71 butyric acid methyl ester, [6,6] -phenyl-C85 butyric acid methyl ester (C84PCBM, [6,6] -phenyl C85 butyric acid methyl ester), and [6,6] ] -Thienyl-C61 butyric acid methyl ester ([6,6] -Thienyl C61 butyric acid methyl ester).
- the ink may contain only one n-type semiconductor material, or may contain two or more arbitrary proportions of combinations.
- the weight ratio of the p-type semiconductor material to the n-type semiconductor material in the ink is preferably 1: 9 to 9: 1, and 1: 9 to 2: 1. Is more preferable, 1: 9 or more and 1: 1 or less is further preferable, and 1: 5 or more and 1: 1 or less is particularly preferable.
- the ink may contain any component other than the first solvent, the second solvent, the p-type semiconductor material, and the n-type semiconductor material as long as the effects of the present invention are not impaired.
- Optional components include, for example, solvents other than the first solvent and the second solvent as described above, propiophenone, methyl benzoate, ethyl benzoate and benzyl benzoate.
- the total concentration of the p-type semiconductor material and the n-type semiconductor material in the ink is preferably 0.01% by weight or more and 20% by weight or less, and more preferably 0.01% by weight or more and 10% by weight or less More preferably, it is 0.01% by weight or more and 5% by weight or less, and particularly preferably 0.1% by weight or more and 5% by weight or less.
- the p-type semiconductor material and the n-type semiconductor material may be dissolved or dispersed, but preferably at least a part is dissolved, and more preferably all is dissolved.
- the ink can be produced by a known method. For example, a method of preparing a mixed solvent by mixing a first solvent and a second solvent, and adding a p-type semiconductor material and an n-type semiconductor material to the mixed solvent for production; a p-type semiconductor material in the first solvent And the n-type semiconductor material is added to the second solvent, and then the mixture is manufactured by mixing the first solvent and the second solvent to which each material is added; .
- the first solvent and the second solvent, and the p-type semiconductor material and the n-type semiconductor material may be heated to a temperature equal to or lower than the boiling point of the solvent and mixed.
- the resulting composition may be filtered using a filter, and the filtrate may be used as an ink.
- a filter for example, a filter formed of a fluorine resin such as polytetrafluoroethylene (PTFE) can be used.
- PTFE polytetrafluoroethylene
- the application of the ink of the present invention is optional.
- the ink of the present invention can be used to form a film containing a p-type semiconductor material and an n-type semiconductor material.
- the ink of the present invention is suitably used to form an active layer contained in a photoelectric conversion element.
- the light detection element including the active layer formed using the ink of the present invention has improved EQE when a reverse bias voltage is applied. Therefore, the ink of the present invention is particularly suitably used to form an active layer contained in a light detection element.
- the dimensions, such as thickness, of the solidified film of the ink are not particularly limited.
- the solidified film of the ink is suitably used for the application described as the application of the ink.
- the solidified film of the ink can be manufactured by any manufacturing method.
- One embodiment of a method for producing a solidified film of ink includes a step (i) of applying an ink to an application target to obtain a coating, and a step (ii) of removing a solvent from the obtained coating.
- the coating method is preferably a slit coating method, a knife coating method, a spin coating method, a microgravure coating method, a gravure coating method, a bar coating method, an ink jet coating method, a nozzle coating method or a capillary coating method.
- the coating method, the capillary coating method, or the bar coating method is more preferable, and the slit coating method or the spin coating method is more preferable.
- the ink is applied to any application target.
- the ink may be applied on a functional layer of a photoelectric conversion element, such as an electrode (anode or cathode), an electron transport layer, or a hole transport layer, in a manufacturing process of the photoelectric conversion element.
- a photoelectric conversion element such as an electrode (anode or cathode), an electron transport layer, or a hole transport layer, in a manufacturing process of the photoelectric conversion element.
- Arbitrary methods can be used as a method of removing a solvent from a coating film.
- the method of removing the solvent include drying methods such as a hot air drying method, an infrared heat drying method, a flash lamp annealing drying method, and a reduced pressure drying method.
- the photoelectric conversion element of the present invention comprises a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode in this order, and the active layer is a solidified film of ink. .
- the active layer includes p-type semiconductor material and n-type semiconductor material.
- the active layer is a solidified film of the above-mentioned ink. Examples and preferred examples of the p-type semiconductor material, the n-type semiconductor material, and the ink are the same as those described in [2. Ink] is the same as the example described in the section.
- the EQE is improved by the active layer being a solidified film of the ink.
- EQE improves when a reverse bias voltage is applied to the photoelectric conversion element. Therefore, the photoelectric conversion element of the present invention is suitable as a light detection element.
- the photoelectric conversion element may have a plurality of active layers.
- At least one of the first electrode and the second electrode is a transparent or translucent electrode.
- the substrate is opaque, it is preferable that one of the first electrode and the second electrode which is farther from the substrate is transparent or translucent.
- transparent or translucent electrodes include conductive metal oxide films and translucent metal thin films.
- Specific examples of the transparent or translucent electrode material include, for example, indium oxide, zinc oxide, tin oxide, and a complex thereof (eg, indium tin oxide (ITO), indium zinc oxide), These include NESA, gold, platinum, silver and copper.
- ITO indium tin oxide
- the transparent or translucent electrode material one or more selected from ITO, indium zinc oxide and tin oxide are preferable.
- Examples of the method for producing the electrode include a vacuum evaporation method, a sputtering method, an ion plating method, and a plating method.
- a transparent conductive film composed of an organic compound such as polyaniline and a derivative thereof and polythiophene and a derivative thereof may be used as the transparent or translucent electrode.
- One of the first electrode and the second electrode may be an electrode with low light transmittance.
- the material of the low light transmitting electrode include metals and conductive polymers.
- Specific examples of the electrode material include metals such as lithium, sodium, potassium, rubidium, cesium, magnesium, calcium, strontium, barium, aluminum, scandium, vanadium, zinc, yttrium, indium, cerium, samarium, europium, terbium, ytterbium and the like And alloys of two or more of them; one or more of the above metals and one or more metals selected from the group consisting of gold, silver, platinum, copper, manganese, titanium, cobalt, nickel, tungsten and tin Graphite; graphite intercalation compounds; polyaniline and its derivatives; polythiophene and its derivatives.
- magnesium-silver alloy for example, magnesium-silver alloy, magnesium-indium alloy, magnesium-aluminium alloy, indium-silver alloy, lithium-aluminium alloy, lithium-magnesium alloy, lithium-indium alloy, calcium- Aluminum alloy is mentioned.
- the photoelectric conversion element may include elements other than the first electrode, the active layer, and the second electrode.
- Optional elements include, for example, a substrate, a hole transport layer, an electron transport layer, and a sealing layer.
- the photoelectric conversion element is usually formed on a substrate (supporting substrate).
- the substrate is preferably formed of a material that does not change chemically when forming the electrode and forming the organic layer. Examples of substrate materials include glass, plastic, polymer films, and silicon.
- the substrate may have low light transmittance, but in the photoelectric conversion element, for example, when taking in light from the substrate, the substrate is preferably transparent or translucent.
- the substrate In the case of manufacturing a photoelectric conversion element on a substrate with low light transmittance, light can not be taken in from the electrode side closer to the substrate, so a transparent or semitransparent electrode is used for the electrode far from the substrate. It is preferred to use.
- a transparent or translucent electrode for the electrode far from the substrate light can be taken in from the electrode far from the substrate, even if a substrate with low light transmittance is used.
- a hole transport layer In the photoelectric conversion element, a hole transport layer may be provided between an electrode which is an anode and an active layer.
- the hole transport layer has a function of transporting holes from the active layer to the electrode.
- the hole transport layer provided in contact with the electrode may be particularly referred to as a hole injection layer.
- the hole transport layer (hole injection layer) provided in contact with the electrode has a function of promoting the injection of holes into the electrode.
- the hole transport layer (hole injection layer) may be in contact with the active layer.
- the hole transport layer contains a hole transport material.
- the hole transporting material include polythiophene and derivatives thereof, an aromatic amine compound, a polymer compound containing a constitutional unit having an aromatic amine residue, CuSCN, CuI, NiO, and molybdenum oxide (MoOx). .
- an electron transport layer may be provided between an electrode which is a cathode and an active layer.
- the electron transport layer has a function of transporting electrons from the active layer to the electrode.
- the electron transport layer may be in contact with the electrode.
- the electron transport layer may be in contact with the active layer.
- the electron transport layer contains an electron transport material.
- electron transporting materials include zinc oxide nanoparticles, gallium-doped zinc oxide nanoparticles, aluminum-doped zinc oxide nanoparticles, polyethyleneimine, polyethyleneimine ethoxylated, and PFN-P2.
- the photoelectric conversion element may include a sealing layer.
- the sealing layer is provided, for example, on the electrode side far from the substrate.
- the sealing layer can be formed of a material having a moisture blocking property (water vapor barrier property) or an oxygen blocking property (oxygen barrier property).
- FIG. 1 is a schematic view showing an embodiment of the photoelectric conversion element of the present invention.
- the photoelectric conversion element 10 of the present embodiment is provided on the support substrate 11 and includes the first electrode 12 as an anode, the hole transport layer 13, the active layer 14, the electron transport layer 15, And the two electrodes 16 in this order.
- the first electrode 12 is provided to be in contact with one of two main surfaces of the support substrate 10.
- a hole transport layer 13 is provided in contact with the first electrode 12.
- An active layer 14 is provided in contact with the hole transport layer 13.
- An electron transport layer 15 is provided in contact with the active layer 14.
- a second electrode 16 as a cathode is provided in contact with the electron transport layer 15.
- the material constituting the supporting substrate 11 and the material constituting each element (the first electrode 12, the hole transport layer 13, the active layer 14, the electron transport layer 15, the second electrode 16) included in the photoelectric conversion element 10 are as follows.
- the material mentioned as an example as a material which constitutes each above-mentioned element may be sufficient.
- the photoelectric conversion element of the present invention can be produced by any method.
- the photoelectric conversion element of the present invention is, for example, the above item [4. Method of Producing Solidified Film of Ink]
- the method can be produced by the method including the method of producing a solidified film of ink described in the above.
- the photoelectric conversion element of the present invention can be manufactured by a method including the above-mentioned step (i) and step (ii).
- the photoelectric conversion element of the present invention generates photovoltaic power between electrodes by being irradiated with light such as sunlight, and can be operated as a solar cell. Further, by integrating a plurality of solar cells, it can also be used as a thin film solar cell module.
- the photoelectric conversion element of the present invention can flow a photocurrent by irradiating light to a transparent or semi-transparent electrode in a state where a voltage is applied between the electrodes, and as a light sensor (light detection element) It can be operated. It can also be used as an image sensor by integrating a plurality of light sensors.
- the photoelectric conversion device according to the embodiment of the present invention described above is suitably applied to detection units included in various electronic devices such as workstations, personal computers, portable information terminals, room access control systems, digital cameras, and medical devices. can do.
- the photoelectric conversion element (light detection element) of the present invention is included in the electronic device illustrated above, for example, an image detection unit (image sensor) for a solid-state imaging device such as an X-ray imaging device and a CMOS image sensor, a fingerprint detection unit
- an image detection unit image sensor
- a detection unit that detects predetermined features of a part of a living body such as a face detection unit, a vein detection unit, and an iris detection unit
- a detection unit of an optical biosensor such as a pulse oximeter.
- FIG. 2 is a view schematically showing a configuration example of an image detection unit for a solid-state imaging device.
- the image detection unit 1 includes a CMOS transistor substrate 20, an interlayer insulating film 30 provided so as to cover the CMOS transistor substrate 20, and photoelectric conversion according to an embodiment of the present invention provided on the interlayer insulating film 30. It is provided so as to penetrate element 10 and interlayer insulating film 30, and is provided so as to cover photoelectric conversion element 10 and interlayer wiring portion 32 electrically connecting CMOS transistor substrate 20 and photoelectric conversion element 10. And a color filter 50 provided on the sealing layer.
- the CMOS transistor substrate 20 has any suitable configuration known in the art according to the design.
- the CMOS transistor substrate 20 includes transistors, capacitors and the like formed within the thickness of the substrate, and is equipped with functional elements such as a CMOS transistor circuit (MOS transistor circuit) for realizing various functions.
- MOS transistor circuit CMOS transistor circuit
- Examples of the functional element include a floating diffusion, a reset transistor, an output transistor, and a selection transistor.
- a signal readout circuit or the like is built in the CMOS transistor substrate 20 by such functional elements, wirings, and the like.
- the interlayer insulating film 30 can be made of, for example, any conventionally known suitable insulating material such as silicon oxide or insulating resin.
- the interlayer wiring portion 32 can be made of, for example, any conventionally known suitable conductive material (wiring material) such as copper, tungsten or the like.
- the interlayer wiring section 32 may be, for example, an in-hole wiring formed simultaneously with the formation of the wiring layer, or may be a buried plug formed separately from the wiring layer.
- the sealing layer 40 is made of any conventionally known suitable material, on the condition that penetration of harmful substances such as oxygen and water which may cause the photoelectric conversion element 10 to be functionally deteriorated can be prevented or suppressed. Can.
- color filter 50 for example, a primary color filter that is made of any suitable material known in the related art and corresponds to the design of the image detection unit 1 can be used. Further, as the color filter 50, a complementary color filter which can be thinner than the primary color filter can be used. As complementary color filters, for example, 3 types of (yellow, cyan, magenta), 3 types of (yellow, cyan, transparent), 3 types of (yellow, transparent, magenta), and 3 of (transparent, cyan, magenta) Color filters of different types can be used. These can be arranged in any suitable manner corresponding to the design of the photoelectric conversion element 10 and the CMOS transistor substrate 20, provided that color image data can be generated.
- the light received by the photoelectric conversion element 10 through the color filter 50 is converted by the photoelectric conversion element 10 into an electrical signal according to the amount of light received, and the light reception signal outside the photoelectric conversion element 10 through the electrode, ie, an imaging target Is output as an electrical signal corresponding to
- the light reception signal output from the photoelectric conversion element 10 is input to the CMOS transistor substrate 20 through the interlayer wiring portion 32, and is read by a signal readout circuit built in the CMOS transistor substrate 20, and further not shown.
- Signal processing is performed by any suitable conventional known functional unit to generate image information based on an imaging target.
- FIG. 3 is a view schematically showing a configuration example of a fingerprint detection unit configured integrally with the display device.
- the display device 2 of the portable information terminal includes a fingerprint detection unit 100 including the photoelectric conversion element 10 according to the embodiment of the present invention as a main component, and a display panel provided on the fingerprint detection unit 100 and displaying a predetermined image. And a unit 200.
- the fingerprint detection unit 100 is provided in an area substantially corresponding to the display area 200 a of the display panel unit 200.
- the display panel unit 200 is integrally stacked above the fingerprint detection unit 100.
- the fingerprint detection unit 100 may be provided in correspondence with only the part of the display area 200a.
- the fingerprint detection unit 100 includes the photoelectric conversion element 10 according to the embodiment of the present invention as a functional unit that performs essential functions.
- the fingerprint detection unit 100 may be any desired conventionally known member such as a protection film (protection film), a support substrate, a sealing substrate, a sealing member, a barrier film, a band pass filter, an infrared cut film, etc. not shown. It can be provided in a manner corresponding to the design to obtain the characteristics.
- the fingerprint detection unit 100 may adopt the configuration of the image detection unit described above.
- the photoelectric conversion element 10 can be included in any mode in the display area 200a.
- a plurality of photoelectric conversion elements 10 may be arranged in a matrix.
- the photoelectric conversion element 10 is provided on the support substrate 11 or the sealing substrate, and the support substrate 11 is provided with an electrode (anode or cathode) in a matrix, for example.
- the light received by the photoelectric conversion element 10 is converted by the photoelectric conversion element 10 into an electric signal according to the amount of light received, and the light reception signal outside the photoelectric conversion element 10 through the electrodes, that is, the electric corresponding to the captured fingerprint It is output as a signal.
- the display panel unit 200 is configured as an organic electroluminescence display panel (organic EL display panel) including a touch sensor panel in this configuration example.
- the display panel unit 200 may be configured of, for example, a display panel having an arbitrary suitable conventionally known configuration such as a liquid crystal display panel including a light source such as a backlight instead of the organic EL display panel.
- the display panel unit 200 is provided on the fingerprint detection unit 100 described above.
- the display panel unit 200 includes an organic electroluminescent element (organic EL element) 220 as a functional part that performs essential functions.
- the display panel unit 200 further includes any substrate such as a conventionally known glass substrate (support substrate 210 or sealing substrate 240), sealing member, barrier film, polarizing plate such as circular polarizing plate, touch sensor panel 230, etc. Suitable previously known components can be provided in a manner corresponding to the desired properties.
- the organic EL element 220 is used not only as a light source for pixels in the display area 200 a but also as a light source for capturing a fingerprint in the fingerprint detection unit 100.
- the fingerprint detection unit 100 detects a fingerprint using light emitted from the organic EL element 220 of the display panel unit 200. Specifically, light emitted from the organic EL element 220 is transmitted through components existing between the organic EL element 220 and the photoelectric conversion element 10 of the fingerprint detection unit 100, and the display is in the display region 200a. The light is reflected by the skin (finger surface) of the fingertip of the finger placed in contact with the surface of the panel unit 200. At least a part of the light reflected by the finger surface is transmitted through the component present between them, received by the photoelectric conversion element 10, and converted into an electrical signal according to the amount of light received by the photoelectric conversion element 10. Then, from the converted electrical signal, image information on the fingerprint on the finger surface is constructed.
- the portable information terminal provided with the display device 2 performs fingerprint authentication by comparing the obtained image information with fingerprint data for fingerprint authentication recorded in advance by any conventionally known and suitable steps.
- the method for producing a photoelectric conversion element of the present invention is a method for producing a photoelectric conversion element comprising, in order, a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode. And the step of forming the active layer, wherein the step of forming the active layer is a step (i) of applying the ink to a target to be coated to obtain a coating, and removing the solvent from the coating obtained Step (ii) is included.
- the step of forming an active layer preferably includes step (i) and step (ii) in this order.
- Any application method can be used as a method of applying the ink to the application target.
- a more preferable coating method, and a further preferable coating method the items [4. Method of Producing Solidified Film of Ink] The same method as the method described in [Step (i)] may be mentioned.
- Arbitrary methods can be used as a method of removing a solvent from the obtained coating film.
- the above item [4. Method of Producing Solidified Film of Ink]
- the same method as the method described in [Step (ii)] may be mentioned.
- the step of forming the active layer may include an optional step other than the above step (ii) and step (ii).
- the ink is applied over the layer to form the active layer. Therefore, the application object of the ink differs depending on the layer configuration of the photoelectric conversion element to be manufactured and the order of lamination. For example, when the photoelectric conversion element has a layer configuration of substrate / anode / hole transport layer / active layer / electron transport layer / cathode and is laminated in the order of the elements described on the left, the application of the ink The subject is usually a hole transport layer. Also, for example, when the photoelectric conversion element has a layer configuration of substrate / cathode / electron transport layer / active layer / hole transport layer / anode, and is stacked in the order of the elements described on the left, the ink The object of application is usually the electron transport layer.
- the method of manufacturing a photoelectric conversion device may be a method of manufacturing a photoelectric conversion device having a plurality of active layers, and even if step (i) and step (ii) are repeated a plurality of times. Good.
- the method of manufacturing a photoelectric conversion element of the present invention can improve the EQE of the photoelectric conversion element.
- EQE can be improved when a reverse bias voltage is applied to the photoelectric conversion element. Therefore, the method for producing a photoelectric conversion element of the present invention is suitable as a method for producing a light detection element.
- semiconductor material used in the embodiment In this embodiment, p-type semiconductor materials and n-type semiconductor materials described in the following table are used.
- As the material P-1 a material synthesized with reference to the method described in WO2013 / 051676 was used.
- As the material P-2 a product manufactured by 1-material, product name: PCE10 is used.
- As a material P-3 a 1-material company make, brand name: PDTSTPD is used.
- As the material P-4 Lumtec's product name: PDPP3T is used.
- As the material P-5 a material synthesized with reference to the method described in JP-A-2010-74127 is used.
- As the material P-6 a material synthesized using the method described in WO 2011/052709 as a reference was used.
- a trade name: E100 manufactured by Frontier Carbon, Inc. was used as the material N-1.
- As the material N-2 a product manufactured by American Die Source, trade name: ADS71 BFA is used.
- Example 1 [A. Preparation of ink] A mixed solvent was prepared using 2-methylquinoline as the first solvent, pseudocumene as the second solvent, and a weight ratio of the first solvent to the second solvent of 10:90. In the mixed solvent, 2 wt% of the material P-1 as p-type semiconductor material with respect to the total weight of the composition and 3 wt% of the material N-1 as n-type semiconductor material with respect to the total weight of the composition are mixed. After stirring at 12 ° C. for 12 hours, the mixture was filtered through a PTFE filter with a pore size of 5 ⁇ m to obtain a composition (I-1) as an ink.
- a PTFE filter with a pore size of 5 ⁇ m
- a glass substrate on which an ITO film was formed to a thickness of 150 nm by sputtering was prepared.
- the glass substrate on which the ITO film was formed was subjected to surface treatment by ozone UV treatment.
- composition (I-1) was spin-coated on the hole transport layer and then dried in a vacuum dryer (0.1 mbar) to form an active layer.
- the thickness of the active layer after drying was about 400 nm.
- the photoelectric conversion elements of Examples 1 to 6 had higher external quantum efficiency when a reverse bias voltage of 3 V was applied, as compared with the photoelectric conversion elements of Comparative Examples 1 to 3.
- compositions (I-7) to (I-11) and (C-4) to (C-6) were used instead of the composition (I-1), [B. Production and Evaluation of Photoelectric Conversion Element]
- the photoelectric conversion element was produced and evaluated in the same manner as the procedure described in the section. The results are shown in Table 8.
- the photoelectric conversion elements of Examples 7 to 11 had higher external quantum efficiency when a reverse bias voltage of 3 V was applied, as compared with the photoelectric conversion elements of Comparative Examples 4 to 6.
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Wood Science & Technology (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Life Sciences & Earth Sciences (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Inks, Pencil-Leads, Or Crayons (AREA)
- Photovoltaic Devices (AREA)
- Light Receiving Elements (AREA)
Abstract
There is a demand for improvement in the external quantum efficiency of a photoelectric conversion element. This ink contains a p-type semiconductor material, an n-type semiconductor material, a first solvent that is a nitrogen-containing heterocyclic compound, and a second solvent that is an aromatic hydrocarbon. An active layer in this photoelectric conversion element is a solidified film of the ink.
Description
本発明は、インク、インクの固化膜、及び光電変換素子に関する。
The present invention relates to an ink, a solidified film of the ink, and a photoelectric conversion element.
従来、p型半導体材料及びn型半導体材料を含む活性層を有する太陽電池が知られており、これら半導体材料と特定の溶媒の組み合わせとを含むインク組成物により活性層を形成する技術が知られている(特許文献1)。
Conventionally, a solar cell having an active layer containing a p-type semiconductor material and an n-type semiconductor material is known, and a technology for forming an active layer by an ink composition containing a combination of these semiconductor materials and a specific solvent is known. (Patent Document 1).
光電変換素子は、逆バイアスの電圧を印加した状態で光が照射されると、光電流が流れ、光検出素子として機能させることができる。光検出素子の検出感度を向上させるために、光電変換素子の外部量子効率を向上させることが求められている。
また、光電変換素子は、太陽電池として機能させることができる。自然エネルギーを利用する太陽電池は、発電の際に化石燃料などの資源を消費せず、また温室効果ガスを排出しない。そのため、太陽電池は、グリーンエネルギーを利用する電力供給元として期待されており、その性能向上が求められている。したがって、光電変換素子を太陽電池として機能させる場合も同様に、光電変換素子にはより高い外部量子効率が求められている。 A photoelectric conversion element can function as a light detection element when light is irradiated in a state where a reverse bias voltage is applied, and a photocurrent flows. In order to improve the detection sensitivity of the light detection element, it is required to improve the external quantum efficiency of the photoelectric conversion element.
In addition, the photoelectric conversion element can function as a solar cell. Solar cells that use natural energy do not consume resources such as fossil fuels during power generation and do not emit greenhouse gases. Therefore, a solar cell is expected as a power supply source using green energy, and its performance improvement is required. Therefore, also when making a photoelectric conversion element function as a solar cell, higher external quantum efficiency is calculated | required by the photoelectric conversion element similarly.
また、光電変換素子は、太陽電池として機能させることができる。自然エネルギーを利用する太陽電池は、発電の際に化石燃料などの資源を消費せず、また温室効果ガスを排出しない。そのため、太陽電池は、グリーンエネルギーを利用する電力供給元として期待されており、その性能向上が求められている。したがって、光電変換素子を太陽電池として機能させる場合も同様に、光電変換素子にはより高い外部量子効率が求められている。 A photoelectric conversion element can function as a light detection element when light is irradiated in a state where a reverse bias voltage is applied, and a photocurrent flows. In order to improve the detection sensitivity of the light detection element, it is required to improve the external quantum efficiency of the photoelectric conversion element.
In addition, the photoelectric conversion element can function as a solar cell. Solar cells that use natural energy do not consume resources such as fossil fuels during power generation and do not emit greenhouse gases. Therefore, a solar cell is expected as a power supply source using green energy, and its performance improvement is required. Therefore, also when making a photoelectric conversion element function as a solar cell, higher external quantum efficiency is calculated | required by the photoelectric conversion element similarly.
上記課題を解決すべく、本発明者は鋭意検討した結果、特定の溶媒を含むインクを用いて活性層を形成した光電変換素子の外部量子効率を向上させることができることを見出し、本発明を完成させた。すなわち、本発明は、下記を提供する。
In order to solve the above problems, as a result of intensive investigations, the present inventor has found that the external quantum efficiency of a photoelectric conversion element in which an active layer is formed using an ink containing a specific solvent can be improved, and completes the present invention I did. That is, the present invention provides the following.
[1] p型半導体材料と、n型半導体材料と、含窒素複素環式化合物である第1の溶媒と、芳香族炭化水素である第2の溶媒とを含む、インク。
[2] n型半導体材料が、フラーレン誘導体である、[1]に記載のインク。
[3] 含窒素複素環式化合物が、6員環構造を含み、前記6員環構造は、ヘテロ原子を1つ又は2つ含み、前記1つ又は2つのヘテロ原子はそれぞれ窒素原子である、[1]又は[2]に記載のインク。
[4] 6員環構造が、ピリジン環構造、テトラヒドロピリジン環構造、ピペリジン環構造、又はピラジン環構造である、[3]に記載のインク。
[5] 第1の溶媒が、置換基を有していてもよいキノリン、置換基を有していてもよい1,2,3,4-テトラヒドロキノリン、及び置換基を有していてもよいキノキサリンからなる群から選択される1種以上である、[1]~[4]のいずれか1つに記載のインク。
[6] 第1の溶媒の第2の溶媒に対する重量比率(第1の溶媒/第2の溶媒)が、1/99以上20/80以下である、[1]~[5]のいずれか1つに記載のインク。
[7] インクにおける第1の溶媒及び第2の溶媒の合計の重量百分率が、95重量%以上99重量%以下である、[1]~[6]のいずれか1つに記載のインク。
[8] 光電変換素子の活性層形成用である、[1]~[7]のいずれか1つに記載のインク。
[9] [1]~[8]のいずれか1つに記載のインクの固化膜。
[10] 第1の電極と、p型半導体材料及びn型半導体材料を含む活性層と、第2の電極とをこの順で含み、前記活性層が[9]に記載の固化膜である、光電変換素子。
[11] 光検出素子である、[10]に記載の光電変換素子。
[12] [10]又は[11]に記載の光電変換素子を含む、イメージセンサー。
[13] [10]又は[11]に記載の光電変換素子を含む、指紋認証装置。
[14] [1]~[8]のいずれか1つに記載のインクを塗布対象に塗布して塗膜を得る工程(i)、及び得られた塗膜から溶媒を除去する工程(ii)を含む、固化膜の製造方法。
[15] 第1の電極と、p型半導体材料及びn型半導体材料を含む活性層と、第2の電極とをこの順で含む光電変換素子の製造方法であって、
前記活性層を形成する工程を含み、前記活性層を形成する工程が、[1]~[8]のいずれか1つに記載のインクを塗布対象に塗布して塗膜を得る工程(i)、及び得られた塗膜から溶媒を除去する工程(ii)を含む、光電変換素子の製造方法。 [1] An ink comprising a p-type semiconductor material, an n-type semiconductor material, a first solvent which is a nitrogen-containing heterocyclic compound, and a second solvent which is an aromatic hydrocarbon.
[2] The ink according to [1], wherein the n-type semiconductor material is a fullerene derivative.
[3] The nitrogen-containing heterocyclic compound contains a six-membered ring structure, and the six-membered ring structure contains one or two hetero atoms, and the one or two hetero atoms are each a nitrogen atom, The ink according to [1] or [2].
[4] The ink according to [3], wherein the 6-membered ring structure is a pyridine ring structure, a tetrahydropyridine ring structure, a piperidine ring structure, or a pyrazine ring structure.
[5] The first solvent may have quinoline which may have a substituent, 1,2,3,4-tetrahydroquinoline which may have a substituent, and may have a substituent The ink according to any one of [1] to [4], which is one or more selected from the group consisting of quinoxalines.
[6] Any one of [1] to [5], wherein the weight ratio of the first solvent to the second solvent (first solvent / second solvent) is 1/99 or more and 20/80 or less Ink described in
[7] The ink according to any one of [1] to [6], wherein the weight percentage of the total of the first solvent and the second solvent in the ink is 95% by weight or more and 99% by weight or less.
[8] The ink according to any one of [1] to [7], which is for forming an active layer of a photoelectric conversion element.
[9] A solidified film of the ink according to any one of [1] to [8].
[10] A solidified film according to [9], comprising a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode in this order, Photoelectric conversion element.
[11] The photoelectric conversion device according to [10], which is a light detection device.
[12] An image sensor comprising the photoelectric conversion element according to [10] or [11].
[13] A fingerprint authentication apparatus comprising the photoelectric conversion device according to [10] or [11].
[14] A step (i) of applying the ink according to any one of [1] to [8] to a coating target to obtain a coated film, and a step of removing a solvent from the obtained coated film (ii) A method of producing a solidified film, comprising:
[15] A method of manufacturing a photoelectric conversion element, comprising a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode in this order,
The process of forming the said active layer including the process of forming the said active layer, apply | coating the ink as described in any one of [1]-[8] to application object, and obtaining a coating film (i) And the process (ii) of removing a solvent from the obtained coating film, The manufacturing method of a photoelectric conversion element.
[2] n型半導体材料が、フラーレン誘導体である、[1]に記載のインク。
[3] 含窒素複素環式化合物が、6員環構造を含み、前記6員環構造は、ヘテロ原子を1つ又は2つ含み、前記1つ又は2つのヘテロ原子はそれぞれ窒素原子である、[1]又は[2]に記載のインク。
[4] 6員環構造が、ピリジン環構造、テトラヒドロピリジン環構造、ピペリジン環構造、又はピラジン環構造である、[3]に記載のインク。
[5] 第1の溶媒が、置換基を有していてもよいキノリン、置換基を有していてもよい1,2,3,4-テトラヒドロキノリン、及び置換基を有していてもよいキノキサリンからなる群から選択される1種以上である、[1]~[4]のいずれか1つに記載のインク。
[6] 第1の溶媒の第2の溶媒に対する重量比率(第1の溶媒/第2の溶媒)が、1/99以上20/80以下である、[1]~[5]のいずれか1つに記載のインク。
[7] インクにおける第1の溶媒及び第2の溶媒の合計の重量百分率が、95重量%以上99重量%以下である、[1]~[6]のいずれか1つに記載のインク。
[8] 光電変換素子の活性層形成用である、[1]~[7]のいずれか1つに記載のインク。
[9] [1]~[8]のいずれか1つに記載のインクの固化膜。
[10] 第1の電極と、p型半導体材料及びn型半導体材料を含む活性層と、第2の電極とをこの順で含み、前記活性層が[9]に記載の固化膜である、光電変換素子。
[11] 光検出素子である、[10]に記載の光電変換素子。
[12] [10]又は[11]に記載の光電変換素子を含む、イメージセンサー。
[13] [10]又は[11]に記載の光電変換素子を含む、指紋認証装置。
[14] [1]~[8]のいずれか1つに記載のインクを塗布対象に塗布して塗膜を得る工程(i)、及び得られた塗膜から溶媒を除去する工程(ii)を含む、固化膜の製造方法。
[15] 第1の電極と、p型半導体材料及びn型半導体材料を含む活性層と、第2の電極とをこの順で含む光電変換素子の製造方法であって、
前記活性層を形成する工程を含み、前記活性層を形成する工程が、[1]~[8]のいずれか1つに記載のインクを塗布対象に塗布して塗膜を得る工程(i)、及び得られた塗膜から溶媒を除去する工程(ii)を含む、光電変換素子の製造方法。 [1] An ink comprising a p-type semiconductor material, an n-type semiconductor material, a first solvent which is a nitrogen-containing heterocyclic compound, and a second solvent which is an aromatic hydrocarbon.
[2] The ink according to [1], wherein the n-type semiconductor material is a fullerene derivative.
[3] The nitrogen-containing heterocyclic compound contains a six-membered ring structure, and the six-membered ring structure contains one or two hetero atoms, and the one or two hetero atoms are each a nitrogen atom, The ink according to [1] or [2].
[4] The ink according to [3], wherein the 6-membered ring structure is a pyridine ring structure, a tetrahydropyridine ring structure, a piperidine ring structure, or a pyrazine ring structure.
[5] The first solvent may have quinoline which may have a substituent, 1,2,3,4-tetrahydroquinoline which may have a substituent, and may have a substituent The ink according to any one of [1] to [4], which is one or more selected from the group consisting of quinoxalines.
[6] Any one of [1] to [5], wherein the weight ratio of the first solvent to the second solvent (first solvent / second solvent) is 1/99 or more and 20/80 or less Ink described in
[7] The ink according to any one of [1] to [6], wherein the weight percentage of the total of the first solvent and the second solvent in the ink is 95% by weight or more and 99% by weight or less.
[8] The ink according to any one of [1] to [7], which is for forming an active layer of a photoelectric conversion element.
[9] A solidified film of the ink according to any one of [1] to [8].
[10] A solidified film according to [9], comprising a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode in this order, Photoelectric conversion element.
[11] The photoelectric conversion device according to [10], which is a light detection device.
[12] An image sensor comprising the photoelectric conversion element according to [10] or [11].
[13] A fingerprint authentication apparatus comprising the photoelectric conversion device according to [10] or [11].
[14] A step (i) of applying the ink according to any one of [1] to [8] to a coating target to obtain a coated film, and a step of removing a solvent from the obtained coated film (ii) A method of producing a solidified film, comprising:
[15] A method of manufacturing a photoelectric conversion element, comprising a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode in this order,
The process of forming the said active layer including the process of forming the said active layer, apply | coating the ink as described in any one of [1]-[8] to application object, and obtaining a coating film (i) And the process (ii) of removing a solvent from the obtained coating film, The manufacturing method of a photoelectric conversion element.
本発明は、光電変換素子の外部量子効率を向上させることができる。
The present invention can improve the external quantum efficiency of the photoelectric conversion element.
以下、本発明について実施形態及び例示物を示して詳細に説明する。ただし、本発明は以下に説明する実施形態及び例示物に限定されるものではなく、請求の範囲及びその均等の範囲を逸脱しない範囲において任意に変更して実施してもよい。
Hereinafter, the present invention will be described in detail by way of embodiments and exemplifications. However, the present invention is not limited to the embodiments and exemplifications described below, and may be arbitrarily changed and implemented without departing from the scope of the claims and the equivalents thereof.
[1.共通する用語の説明]
本明細書において、「高分子化合物」とは、分子量分布を有し、ポリスチレン換算の数平均分子量が、1×103以上1×108以下である重合体を意味する。高分子化合物に含まれる構成単位は、合計100モル%である。 [1. Explanation of common terms]
In the present specification, the “polymer compound” means a polymer having a molecular weight distribution and having a polystyrene-equivalent number average molecular weight of 1 × 10 3 or more and 1 × 10 8 or less. The structural units contained in the polymer compound are 100 mol% in total.
本明細書において、「高分子化合物」とは、分子量分布を有し、ポリスチレン換算の数平均分子量が、1×103以上1×108以下である重合体を意味する。高分子化合物に含まれる構成単位は、合計100モル%である。 [1. Explanation of common terms]
In the present specification, the “polymer compound” means a polymer having a molecular weight distribution and having a polystyrene-equivalent number average molecular weight of 1 × 10 3 or more and 1 × 10 8 or less. The structural units contained in the polymer compound are 100 mol% in total.
本明細書において、「構成単位」とは、高分子化合物中に1個以上存在する単位を意味する。
In the present specification, the "constituent unit" means a unit which is present in one or more in the polymer compound.
本明細書において、「水素原子」は、軽水素原子であっても、重水素原子であってもよい。
In the present specification, the "hydrogen atom" may be a light hydrogen atom or a deuterium atom.
本明細書において、「ハロゲン原子」は、フッ素原子、塩素原子、臭素原子、及びヨウ素原子を包含する。
As used herein, "halogen atom" includes fluorine atom, chlorine atom, bromine atom and iodine atom.
本明細書において、別に断らない限り、「アルキル基」は、直鎖状、分岐状、及び環状のいずれであってもよい。直鎖状のアルキル基の炭素原子数は、置換基の炭素原子数を含まないで、通常1~50であり、好ましくは1~30であり、より好ましくは1~20である。分岐状又は環状であるアルキル基の炭素原子数は、置換基の炭素原子数を含まないで、通常3~50であり、好ましくは3~30であり、より好ましくは4~20である。
In the present specification, unless otherwise specified, the "alkyl group" may be linear, branched or cyclic. The number of carbon atoms of the linear alkyl group is usually 1 to 50, preferably 1 to 30, and more preferably 1 to 20, not including the number of carbon atoms of the substituent. The carbon atom number of the branched or cyclic alkyl group is usually 3 to 50, preferably 3 to 30, and more preferably 4 to 20, not including the carbon atom number of the substituent.
アルキル基は、置換基を有していてもよい。アルキル基の具体例としては、メチル基、エチル基、n-プロピル基、イソプロピル基、n-ブチル基、イソブチル基、tert-ブチル基、n-ペンチル基、イソアミル基、2-エチルブチル基、n-ヘキシル基、シクロヘキシル基、n-ヘプチル基、シクロヘキシルメチル基、シクロヘキシルエチル基、n-オクチル基、2-エチルヘキシル基、3-n-プロピルヘプチル基、アダマンチル基、n-デシル基、3,7-ジメチルオクチル基、2-エチルオクチル基、2-n-ヘキシル-デシル基、n-ドデシル基、テトラデシル基、ヘキサデシル墓、オクタデシル基、エイコシル基等の非置換アルキル基;トリフルオロメチル基、ペンタフルオロエチル基、パーフルオロブチル基、パーフルオロヘキシル基、パーフルオロオクチル基、3-フェニルプロピル基、3-(4-メチルフェニル)プロピル基、3-(3,5-ジ-n-ヘキシルフェニル)プロピル基、6-エチルオキシヘキシル基等の置換アルキル基が挙げられる。
The alkyl group may have a substituent. Specific examples of the alkyl group include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, tert-butyl group, n-pentyl group, isoamyl group, 2-ethylbutyl group, n- Hexyl, cyclohexyl, n-heptyl, cyclohexylmethyl, cyclohexylethyl, n-octyl, 2-ethylhexyl, 3-n-propylheptyl, adamantyl, n-decyl, 3,7-dimethyl Non-substituted alkyl group such as octyl group, 2-ethyloctyl group, 2-n-hexyl-decyl group, n-dodecyl group, tetradecyl group, hexadecyl tomb, octadecyl group, eicosyl group; trifluoromethyl group, pentafluoroethyl group , Perfluorobutyl group, perfluorohexyl group, perfluorooctyl group, 3 Phenylpropyl, 3- (4-methylphenyl) propyl group, 3- (3,5-di -n- hexyl phenyl) propyl group, and substituted alkyl groups such as 6-ethyloxy-hexyl group.
「アリール基」は、置換基を有していてもよい芳香族炭化水素から環を構成する炭素原子に直接結合する水素原子1つを除いた残りの原子団を意味する。
The “aryl group” means an atomic group remaining after removing one hydrogen atom directly bonded to a carbon atom constituting a ring from an aromatic hydrocarbon which may have a substituent.
アリール基は、置換基を有していてもよい。アリール基の具体例としては、フェニル基、1-ナフチル基、2-ナフチル基、1-アントラセニル基、2-アントラセニル基、9-アントラセニル基、1-ピレニル基、2-ピレニル基、4-ピレニル基、2-フルオレニル基、3-フルオレニル基、4-フルオレニル基、2-フェニルフェニル基、3-フェニルフェニル基、4-フェニルフェニル基、及び、これらの基における水素原子が、アルキル基、アルコキシ基、アリール基、フッ素原子等で置換された基が挙げられる。
The aryl group may have a substituent. Specific examples of the aryl group include phenyl group, 1-naphthyl group, 2-naphthyl group, 1-anthracenyl group, 2-anthracenyl group, 9-anthracenyl group, 1-pyrenyl group, 2-pyrenyl group, 4-pyrenyl group 2-fluorenyl group, 3-fluorenyl group, 4-fluorenyl group, 2-phenylphenyl group, 3-phenylphenyl group, 4-phenylphenyl group, and a hydrogen atom in these groups is an alkyl group, an alkoxy group, An aryl group, a group substituted with a fluorine atom and the like can be mentioned.
「アルコキシ基」は、直鎖状、分岐状、及び環状のいずれであってもよい。直鎖状のアルコキシ基の炭素原子数は、置換基の炭素原子数を含まないで、通常1~40であり、好ましくは1~10である。分岐状又は環状のアルコキシ基の炭素原子数は、置換基の炭素原子数を含まないで、通常3~40であり、好ましくは4~10である。
The "alkoxy group" may be linear, branched or cyclic. The carbon atom number of the linear alkoxy group is usually 1 to 40, preferably 1 to 10, not including the carbon atom number of the substituent. The carbon atom number of the branched or cyclic alkoxy group is usually 3 to 40, preferably 4 to 10, not including the carbon atom number of the substituent.
アルコキシ基は、置換基を有していてもよい。アルコキシ基の具体例としては、メトキシ基、エトキシ基、n-プロピルオキシ基、イソプロピルオキシ基、n-ブチルオキシ基、イソブチルオキシ基、tert-ブチルオキシ基、n-ペンチルオキシ基、n-ヘキシルオキシ基、シクロヘキシルオキシ基、n-ヘプチルオキシ基、n-オクチルオキシ基、2-エチルヘキシルオキシ基、n-ノニルオキシ基、n-デシルオキシ基、3,7-ジメチルオクチルオキシ基、及びラウリルオキシ基が挙げられる。
The alkoxy group may have a substituent. Specific examples of the alkoxy group include methoxy group, ethoxy group, n-propyloxy group, isopropyloxy group, n-butyloxy group, isobutyloxy group, tert-butyloxy group, n-pentyloxy group, n-hexyloxy group, And cyclohexyloxy, n-heptyloxy, n-octyloxy, 2-ethylhexyloxy, n-nonyloxy, n-decyloxy, 3,7-dimethyloctyloxy, and lauryloxy groups.
「アリールオキシ基」の炭素原子数は、置換基の炭素原子数を含まないで、通常6~60であり、好ましくは6~48である。
The number of carbon atoms of the “aryloxy group” is usually 6 to 60, preferably 6 to 48, not including the number of carbon atoms of the substituent.
アリールオキシ基は、置換基を有していてもよい。アリールオキシ基の具体例としては、フェノキシ基、1-ナフチルオキシ基、2-ナフチルオキシ基、1-アントラセニルオキシ基、9-アントラセニルオキシ基、1-ピレニルオキシ基、及び、これらの基における水素原子が、アルキル基、アルコキシ基、フッ素原子等で置換された基が挙げられる。
The aryloxy group may have a substituent. Specific examples of the aryloxy group include phenoxy group, 1-naphthyloxy group, 2-naphthyloxy group, 1-anthracenyloxy group, 9-anthracenyloxy group, 1-pyrenyloxy group, and these groups And the hydrogen atom in is substituted by an alkyl group, an alkoxy group, a fluorine atom and the like.
「アルキルチオ基」は、直鎖状、分岐状、及び環状のいずれであってもよい。直鎖状のアルキルチオ基の炭素原子数は、置換基の炭素原子数を含まないで、通常1~40であり、好ましくは1~10である。分岐状および環状のアルキルチオ基の炭素原子数は、置換基の炭素原子数を含まないで、通常3~40であり、好ましくは4~10である。
The "alkylthio group" may be linear, branched or cyclic. The carbon atom number of the linear alkylthio group is usually 1 to 40, preferably 1 to 10, not including the carbon atom number of the substituent. The carbon atom number of the branched and cyclic alkylthio group is usually 3 to 40, preferably 4 to 10, not including the carbon atom number of the substituent.
アルキルチオ基は、置換基を有していてもよい。アルキルチオ基の具体例としては、メチルチオ基、エチルチオ基、プロピルチオ基、イソプロピルチオ基、ブチルチオ基、イソブチルチオ基、tert-ブチルチオ基、ペンチルチオ基、ヘキシルチオ基、シクロヘキシルチオ基、ヘプチルチオ基、オクチルチオ基、2-エチルヘキシルチオ基、ノニルチオ基、デシルチオ基、3,7-ジメチルオクチルチオ基、ラウリルチオ基、及びトリフルオロメチルチオ基が挙げられる。
The alkylthio group may have a substituent. Specific examples of the alkylthio group are methylthio group, ethylthio group, propylthio group, isopropylthio group, butylthio group, isobutylthio group, tert-butylthio group, pentylthio group, hexylthio group, cyclohexylthio group, heptylthio group, octylthio group, 2 And -ethylhexylthio group, nonylthio group, decylthio group, 3,7-dimethyloctylthio group, laurylthio group, and trifluoromethylthio group.
「アリールチオ基」の炭素原子数は、置換基の炭素原子数を含まないで、通常6~60であり、好ましくは6~48である。
The number of carbon atoms of the “arylthio group” is usually 6 to 60, preferably 6 to 48, not including the number of carbon atoms of the substituent.
アリールチオ基は、置換基を有していてもよい。アリールチオ基の例としては、フェニルチオ基、C1~C12アルキルオキシフェニルチオ基(C1~C12は、その直後に記載された基の炭素原子数が1~12であることを示す。以下も同様である。)、C1~C12アルキルフェニルチオ基、1-ナフチルチオ基、2-ナフチルチオ基、及びペンタフルオロフェニルチオ基が挙げられる。
The arylthio group may have a substituent. Examples of the arylthio group include phenylthio group and C1 to C12 alkyloxyphenylthio group (C1 to C12 indicate that the number of carbon atoms of the group described immediately thereafter is 1 to 12. The same applies to the following. And C1-C12 alkylphenylthio group, 1-naphthylthio group, 2-naphthylthio group, and pentafluorophenylthio group.
「p価の複素環基」(pは、1以上の整数を表す。)とは、置換基を有していてもよい複素環式化合物から、環を構成する炭素原子又はヘテロ原子に直接結合している水素原子のうちp個の水素原子を除いた残りの原子団を意味する。p価の複素環基の中でも、「p価の芳香族複素環基」が好ましい。「p価の芳香族複素環基」は、置換基を有していてもよい芳香族複素環式化合物から、環を構成する炭素原子またはヘテロ原子に直接結合している水素原子のうちp個の水素原子を除いた残りの原子団を意味する。
The “p-valent heterocyclic group” (p represents an integer of 1 or more) is a direct bond from a heterocyclic compound which may have a substituent to a carbon atom or a heteroatom constituting a ring. It means the remaining atomic groups excluding p hydrogen atoms among the hydrogen atoms. Among p-valent heterocyclic groups, “p-valent aromatic heterocyclic group” is preferable. The “p-valent aromatic heterocyclic group” is a p-membered hydrogen atom directly bonded to a carbon atom or a hetero atom constituting a ring, from the aromatic heterocyclic compound which may have a substituent. Means the remaining atomic groups excluding the hydrogen atom of
複素環式化合物が有していてもよい置換基としては、例えば、ハロゲン原子、アルキル基、アリール基、アルコキシ基、アリールオキシ基、アルキルチオ基、アリールチオ基、1価の複素環基、置換アミノ基、アシル基、イミン残基、アミド基、酸イミド基、置換オキシカルボニル基、アルケニル基、アルキニル基、シアノ基、及びニトロ基が挙げられる。
Examples of the substituent which the heterocyclic compound may have include a halogen atom, an alkyl group, an aryl group, an alkoxy group, an aryloxy group, an alkylthio group, an arylthio group, a monovalent heterocyclic group, and a substituted amino group. And an acyl group, an imine residue, an amido group, an acid imide group, a substituted oxycarbonyl group, an alkenyl group, an alkynyl group, a cyano group, and a nitro group.
芳香族複素環式化合物には、複素環自体が芳香族性を示す化合物に加えて、複素環自体は芳香族性を示さなくとも、複素環に芳香環が縮環している化合物が包含される。
Aromatic heterocyclic compounds include, in addition to compounds in which the heterocycle itself exhibits aromaticity, compounds in which an aromatic ring is fused to the heterocycle even if the heterocycle itself exhibits no aromaticity are included Ru.
芳香族複素環式化合物のうち、複素環自体が芳香族性を示す化合物の具体例としては、オキサジアゾール、チアジアゾール、チアゾール、オキサゾール、チオフェン、ピロール、ホスホール、フラン、ピリジン、ピラジン、ピリミジン、トリアジン、ピリダジン、キノリン、イソキノリン、カルバゾール、及びジベンゾホスホールが挙げられる。
Among the aromatic heterocyclic compounds, specific examples of compounds in which the heterocycle itself exhibits aromaticity include oxadiazole, thiadiazole, thiazole, oxazole, thiophene, pyrrole, phosphole, furan, pyridine, pyrazine, pyrimidine, triazine And pyridazine, quinoline, isoquinoline, carbazole, and dibenzophosphole.
芳香族複素環式化合物のうち、芳香族複素環自体が芳香族性を示さず、複素環に芳香環が縮環している化合物の具体例としては、フェノキサジン、フェノチアジン、ジベンゾボロール、ジベンゾシロール、及びベンゾピランが挙げられる。
Among the aromatic heterocyclic compounds, specific examples of compounds in which the aromatic heterocycle itself does not exhibit aromaticity and in which an aromatic ring is fused to the heterocycle include phenoxazine, phenothiazine, dibenzoborole, and dibenzo. And silole and benzopyran.
1価の複素環基の炭素原子数は、置換基の炭素原子数を含まないで、通常2~60であり、好ましくは4~20である。
The carbon atom number of the monovalent heterocyclic group is usually 2 to 60, preferably 4 to 20, not including the carbon atom number of the substituent.
1価の複素環基は、置換基を有していてもよく、1価の複素環基の具体例としては、例えば、チエニル基、ピロリル基、フリル基、ピリジル基、ピペリジル基、キノリル基、イソキノリル基、ピリミジニル基、トリアジニル基、及び、これらの基における水素原子が、アルキル基、アルコキシ基等で置換された基が挙げられる。
The monovalent heterocyclic group may have a substituent, and examples of the monovalent heterocyclic group include, for example, thienyl group, pyrrolyl group, furyl group, pyridyl group, piperidyl group, quinolyl group, and the like. Examples include an isoquinolyl group, a pyrimidinyl group, a triazinyl group, and a group in which a hydrogen atom in these groups is substituted with an alkyl group, an alkoxy group or the like.
「置換アミノ基」とは、2つの置換基を有するアミノ基を意味する。アミノ基が有する置換基の例としては、アルキル基、アリール基、及び1価の複素環基が挙げられ、アルキル基、アリール基、又は1価の複素環基が好ましい。置換アミノ基の炭素原子数は、通常2~30である。
The “substituted amino group” means an amino group having two substituents. An alkyl group, an aryl group, and a monovalent | monohydric heterocyclic group are mentioned as an example of the substituent which an amino group has, An alkyl group, an aryl group, or a monovalent | monohydric heterocyclic group is preferable. The carbon atom number of the substituted amino group is usually 2-30.
置換アミノ基の例としては、ジメチルアミノ基、ジエチルアミノ基等のジアルキルアミノ基;ジフェニルアミノ基、ビス(4-メチルフェニル)アミノ基、ビス(4-tert-ブチルフェニル)アミノ基、ビス(3,5-ジ-tert-ブチルフェニル)アミノ基等のジアリールアミノ基が挙げられる。
Examples of the substituted amino group include dialkylamino groups such as dimethylamino and diethylamino; diphenylamino, bis (4-methylphenyl) amino, bis (4-tert-butylphenyl) amino, bis (3, And diarylamino groups such as 5-di-tert-butylphenyl) amino group.
「アシル基」は、炭素原子数が通常2~20程度であり、好ましくは炭素原子数が2~18である。アシル基の具体例としては、アセチル基、プロピオニル基、ブチリル基、イソブチリル基、ピバロイル基、ベンゾイル基、トリフルオロアセチル基、及びペンタフルオロベンゾイル基が挙げられる。
The "acyl group" usually has about 2 to 20 carbon atoms, and preferably 2 to 18 carbon atoms. Specific examples of the acyl group include acetyl group, propionyl group, butyryl group, isobutyryl group, pivaloyl group, benzoyl group, trifluoroacetyl group, and pentafluorobenzoyl group.
「イミン残基」とは、イミン化合物から、炭素原子-窒素原子二重結合を構成する炭素原子又は窒素原子に直接結合する水素原子1つを除いた残りの原子団を意味する。「イミン化合物」とは、分子内に、炭素原子-窒素原子二重結合を有する有機化合物を意味する。イミン化合物の例として、アルジミン、ケチミン、及びアルジミン中の炭素原子-窒素原子二重結合を構成する窒素原子に結合している水素原子が、アルキル基等で置換された化合物が挙げられる。
The “imine residue” refers to an atomic group obtained by removing one hydrogen atom directly bonded to a carbon atom or a nitrogen atom constituting a carbon atom-nitrogen atom double bond from an imine compound. The "imine compound" means an organic compound having a carbon atom-nitrogen atom double bond in the molecule. Examples of the imine compound include aldimine, ketimine, and a compound in which a hydrogen atom bonded to a nitrogen atom constituting a carbon atom-nitrogen atom double bond in the aldimine is substituted with an alkyl group or the like.
イミン残基は、通常炭素原子数が2~20程度であり、好ましくは炭素原子数が2~18である。イミン残基の例としては、以下の構造式で示される基が挙げられる。
The imine residue usually has about 2 to 20 carbon atoms, and preferably 2 to 18 carbon atoms. Examples of imine residues include groups represented by the following structural formula.
「アミド基」は、アミドから窒素原子に結合した水素原子1つを除いた残りの原子団を意味する。アミド基の炭素原子数は、通常1~20程度であり、好ましくは1~18である。アミド基の具体例としては、ホルムアミド基、アセトアミド基、プロピオアミド基、ブチロアミド基、ベンズアミド基、トリフルオロアセトアミド基、ペンタフルオロベンズアミド基、ジホルムアミド基、ジアセトアミド基、ジプロピオアミド基、ジブチロアミド基、ジベンズアミド基、ジトリフルオロアセトアミド基、及びジペンタフルオロベンズアミド基が挙げられる。
The "amide group" means the remaining group except one hydrogen atom bonded to the nitrogen atom from the amide. The carbon atom number of the amide group is usually about 1 to 20, preferably 1 to 18. Specific examples of the amide group include formamide group, acetamide group, propioamide group, butyroamide group, benzamide group, trifluoroacetamide group, pentafluorobenzamide group, diformamide group, diacetamide group, dipropioamide group, dibutyroamide group, dibenzamide group , Ditrifluoroacetamide group, and dipentafluorobenzamide group.
「酸イミド基」とは、酸イミドから窒素原子に結合した水素原子1つを除いた残りの原子団を意味する。酸イミド基の炭素原子数は、通常4~20程度である。酸イミド基の具体例としては、以下に示す基が挙げられる。
The "acid imide group" refers to the remaining atomic group from acid imide except one hydrogen atom bonded to a nitrogen atom. The number of carbon atoms of the acid imide group is usually about 4 to 20. Specific examples of the acid imide group include the groups shown below.
「置換オキシカルボニル基」とは、R’-O-(C=O)-で表される基を意味する。ここで、R’は、アルキル基、アリール基、アリールアルキル基、又は1価の複素環基を表す。
置換オキシカルボニル基は、炭素原子数が通常2~60程度であり、好ましくは炭素原子数が2~48である。 The “substituted oxycarbonyl group” means a group represented by R′—O— (C = O) —. Here, R ′ represents an alkyl group, an aryl group, an arylalkyl group, or a monovalent heterocyclic group.
The substituted oxycarbonyl group usually has about 2 to 60 carbon atoms, and preferably 2 to 48 carbon atoms.
置換オキシカルボニル基は、炭素原子数が通常2~60程度であり、好ましくは炭素原子数が2~48である。 The “substituted oxycarbonyl group” means a group represented by R′—O— (C = O) —. Here, R ′ represents an alkyl group, an aryl group, an arylalkyl group, or a monovalent heterocyclic group.
The substituted oxycarbonyl group usually has about 2 to 60 carbon atoms, and preferably 2 to 48 carbon atoms.
置換オキシカルボニル基の具体例としては、メトキシカルボニル基、エトキシカルボニル基、プロポキシカルボニル基、イソプロポキシカルボニル基、ブトキシカルボニル基、イソブトキシカルボニル基、tert-ブトキシカルボニル基、ペンチルオキシカルボニル基、ヘキシルオキシカルボニル基、シクロヘキシルオキシカルボニル基、ヘプチルオキシカルボニル基、オクチルオキシカルボニル基、2-エチルヘキシルオキシカルボニル基、ノニルオキシカルボニル基、デシルオキシカルボニル基、3,7-ジメチルオクチルオキシカルボニル基、ドデシルオキシカルボニル基、トリフルオロメトキシカルボニル基、ペンタフルオロエトキシカルボニル基、パーフルオロブトキシカルボニル基、パーフルオロヘキシルオキシカルボニル基、パーフルオロオクチルオキシカルボニル基、フェノキシカルボニル基、ナフトキシカルボニル基、及びピリジルオキシカルボニル基が挙げられる。
Specific examples of the substituted oxycarbonyl group include methoxycarbonyl group, ethoxycarbonyl group, propoxycarbonyl group, isopropoxycarbonyl group, butoxycarbonyl group, isobutoxycarbonyl group, tert-butoxycarbonyl group, pentyloxycarbonyl group, hexyloxycarbonyl group Group, cyclohexyloxycarbonyl group, heptyloxycarbonyl group, octyloxycarbonyl group, 2-ethylhexyloxycarbonyl group, nonyloxycarbonyl group, decyloxycarbonyl group, 3, 7-dimethyloctyloxycarbonyl group, dodecyloxycarbonyl group, tri Fluoromethoxycarbonyl group, pentafluoroethoxycarbonyl group, perfluorobutoxycarbonyl group, perfluorohexyloxycarbonyl , Perfluorooctyl group, phenoxycarbonyl group, naphthoxycarbonyl group, and a pyridyloxycarbonyl group.
「アルケニル基」は、直鎖状、分岐状、及び環状のいずれであってもよい。直鎖状のアルケニル基の炭素原子数は、置換基の炭素原子数を含まないで、通常2~30であり、好ましくは3~20である。分岐状又は環状のアルケニル基の炭素原子数は、置換基の炭素原子数を含まないで、通常3~30であり、好ましくは4~20である。
The "alkenyl group" may be linear, branched or cyclic. The carbon atom number of the linear alkenyl group is usually 2 to 30, preferably 3 to 20, not including the carbon atom number of the substituent. The carbon atom number of the branched or cyclic alkenyl group is usually 3 to 30, preferably 4 to 20, not including the carbon atom number of the substituent.
アルケニル基は、置換基を有していてもよい。アルケニル基の具体例としては、ビニル基、1-プロペニル基、2-プロペニル基、2-ブテニル基、3-ブテニル基、3-ペンテニル基、4-ペンテニル基、1-ヘキセニル基、5-ヘキセニル基、7-オクテニル基、及び、これらの基における水素原子がアルキル基、アルコキシ基等で置換された基が挙げられる。
The alkenyl group may have a substituent. Specific examples of the alkenyl group include vinyl group, 1-propenyl group, 2-propenyl group, 2-butenyl group, 3-butenyl group, 3-pentenyl group, 4-pentenyl group, 1-hexenyl group, 5-hexenyl group And 7-octenyl groups, and groups in which a hydrogen atom in these groups is substituted with an alkyl group, an alkoxy group or the like.
「アルキニル基」は、直鎖状、分岐状、及び環状のいずれであってもよい。直鎖状のアルケニル基の炭素原子数は、置換基の炭素原子数を含まないで、通常2~20であり、好ましくは3~20である。分岐状又は環状のアルケニル基の炭素原子数は、置換基の炭素原子数を含まないで、通常4~30であり、好ましくは4~20である。
The "alkynyl group" may be linear, branched or cyclic. The carbon atom number of the linear alkenyl group is usually 2 to 20, preferably 3 to 20, not including the carbon atom number of the substituent. The carbon atom number of the branched or cyclic alkenyl group is usually 4 to 30, preferably 4 to 20, not including the carbon atom number of the substituent.
アルキニル基は置換基を有していてもよい。アルキニル基の具体例としては、エチニル基、1-プロピニル基、2-プロピニル基、2-ブチニル基、3-ブチニル基、3-ペンチニル基、4-ペンチニル基、1-ヘキシニル基、5-ヘキシニル基、及び、これらの基における水素原子がアルキル基、アルコキシ基等で置換された基が挙げられる。
The alkynyl group may have a substituent. Specific examples of the alkynyl group include ethynyl group, 1-propynyl group, 2-propynyl group, 2-butynyl group, 3-butynyl group, 3-pentynyl group, 4-pentynyl group, 4-pentynyl group, 1-hexynyl group, 5-hexynyl group And groups in which a hydrogen atom in these groups is substituted with an alkyl group, an alkoxy group or the like.
本明細書において、用語「インク」は、塗布法に用いられる液を意味し、着色した液に限定されない。また、用語「塗布法」は、液状物質を用いて膜を形成する方法を包含し、例えば、スリットコート法、ナイフコート法、スピンコート法、キャスティング法、マイクログラビアコート法、グラビアコート法、バーコート法、ロールコート法、ワイアーバーコート法、ディップコート法、スプレーコート法、スクリーン印刷法、グラビア印刷法、フレキソ印刷法、オフセット印刷法、インクジェットコート法、ディスペンサー印刷法、ノズルコート法、及びキャピラリーコート法が挙げられる。
As used herein, the term "ink" means a liquid used in a coating method and is not limited to colored liquids. In addition, the term "coating method" includes a method of forming a film using a liquid substance, for example, slit coating method, knife coating method, spin coating method, casting method, microgravure coating method, gravure coating method, bar Coating method, roll coating method, wire bar coating method, dip coating method, spray coating method, screen printing method, gravure printing method, flexographic printing method, offset printing method, ink jet coating method, dispenser printing method, nozzle coating method, capillary The coat method is mentioned.
「インク」は、溶液であってもよく、分散液、エマルション(乳濁液)、サスペンション(懸濁液)等の分散液であってもよい。
The "ink" may be a solution, or may be a dispersion, such as a dispersion, an emulsion (emulsion), a suspension (suspension) or the like.
[2.インク]
本発明のインクは、p型半導体材料と、n型半導体材料と、第1の溶媒と、第2の溶媒とを含む。 [2. ink]
The ink of the present invention comprises a p-type semiconductor material, an n-type semiconductor material, a first solvent, and a second solvent.
本発明のインクは、p型半導体材料と、n型半導体材料と、第1の溶媒と、第2の溶媒とを含む。 [2. ink]
The ink of the present invention comprises a p-type semiconductor material, an n-type semiconductor material, a first solvent, and a second solvent.
[インクの成分]
(第1の溶媒)
第1の溶媒は、含窒素複素環式化合物である。本発明のインクが、第1の溶媒として含窒素複素環式化合物を含むことにより、光電変換素子の外部量子効率を向上させることができる。その理由としては、本発明を限定するものではないが、下記の機構が推定される。 [Ink component]
(First solvent)
The first solvent is a nitrogen-containing heterocyclic compound. When the ink of the present invention contains a nitrogen-containing heterocyclic compound as the first solvent, the external quantum efficiency of the photoelectric conversion element can be improved. Although the reason is not to limit the present invention, the following mechanism is presumed.
(第1の溶媒)
第1の溶媒は、含窒素複素環式化合物である。本発明のインクが、第1の溶媒として含窒素複素環式化合物を含むことにより、光電変換素子の外部量子効率を向上させることができる。その理由としては、本発明を限定するものではないが、下記の機構が推定される。 [Ink component]
(First solvent)
The first solvent is a nitrogen-containing heterocyclic compound. When the ink of the present invention contains a nitrogen-containing heterocyclic compound as the first solvent, the external quantum efficiency of the photoelectric conversion element can be improved. Although the reason is not to limit the present invention, the following mechanism is presumed.
第1溶媒としての含窒素複素環式化合物とフラーレン誘導体等のn型半導体材料とは、水素結合、分散力等により、強く相互作用すると考えられる。インクから塗膜を形成し、塗膜から溶媒を乾燥等により除去する際に、含窒素複素環式化合物とn型半導体材料との強い相互作用により、溶媒の除去と共にn型半導体材料が塗膜中を容易に移動(マイグレーション)できるようになると考えられる。その結果、塗膜から溶媒を除去することにより得られた固化膜中において、電荷移動経路として機能する、n型半導体材料のネットワークが十分に形成され、外部量子効率が向上すると考えられる。
It is considered that the nitrogen-containing heterocyclic compound as the first solvent and the n-type semiconductor material such as the fullerene derivative strongly interact with each other due to a hydrogen bond, a dispersing force and the like. When a coating is formed from the ink and the solvent is removed from the coating by drying or the like, the strong interaction between the nitrogen-containing heterocyclic compound and the n-type semiconductor material causes the n-type semiconductor material to be coated as well as removing the solvent. It is thought that it becomes possible to move (migration) easily in the middle. As a result, in the solidified film obtained by removing the solvent from the coating film, it is considered that a network of n-type semiconductor material functioning as a charge transfer path is sufficiently formed to improve the external quantum efficiency.
含窒素複素環式化合物としては、例えば、置換基を有していてもよいピリジン、置換基を有していてもよいキノリン、置換基を有していてもよいキノキサリン、置換基を有していてもよい1,2,3,4-テトラヒドロキノリン、置換基を有していてもよいピリミジン、置換基を有していてもよいピラジン、及び置換基を有していてもよいキナゾリンが挙げられる。第1の溶媒は、1種の含窒素複素環式化合物で構成されていても、2種以上の含窒素複素環式化合物で構成されていてもよい。好ましくは、第1の溶媒は1種の含窒素複素環式化合物で構成される。
The nitrogen-containing heterocyclic compound includes, for example, pyridine which may have a substituent, quinoline which may have a substituent, quinoxaline which may have a substituent, and the like. And 1,2,3,4-tetrahydroquinoline, pyrimidine which may have a substituent, pyrazine which may have a substituent, and quinazoline which may have a substituent. . The first solvent may be composed of one type of nitrogen-containing heterocyclic compound or may be composed of two or more types of nitrogen-containing heterocyclic compounds. Preferably, the first solvent is composed of one nitrogen-containing heterocyclic compound.
含窒素複素環式化合物は、環構造上に置換基を有していてもよい。
含窒素複素環式化合物の環構造(例、キノリン環構造、1,2,3,4-テトラヒドロキノリン環構造、キノキサリン環構造)が有していてもよい置換基としては、例えば、炭素原子数1~5のアルキル基、炭素原子数1~5のアルコキシ基、ハロゲン基、及びアルキルチオ基が挙げられる。 The nitrogen-containing heterocyclic compound may have a substituent on the ring structure.
As a substituent which the ring structure (eg, quinoline ring structure, 1,2,3,4-tetrahydroquinoline ring structure, quinoxaline ring structure) of the nitrogen-containing heterocyclic compound may have, for example, the number of carbon atoms There may be mentioned an alkyl group of 1 to 5, an alkoxy group of 1 to 5 carbon atoms, a halogen group and an alkylthio group.
含窒素複素環式化合物の環構造(例、キノリン環構造、1,2,3,4-テトラヒドロキノリン環構造、キノキサリン環構造)が有していてもよい置換基としては、例えば、炭素原子数1~5のアルキル基、炭素原子数1~5のアルコキシ基、ハロゲン基、及びアルキルチオ基が挙げられる。 The nitrogen-containing heterocyclic compound may have a substituent on the ring structure.
As a substituent which the ring structure (eg, quinoline ring structure, 1,2,3,4-tetrahydroquinoline ring structure, quinoxaline ring structure) of the nitrogen-containing heterocyclic compound may have, for example, the number of carbon atoms There may be mentioned an alkyl group of 1 to 5, an alkoxy group of 1 to 5 carbon atoms, a halogen group and an alkylthio group.
第1の溶媒としての含窒素複素環式化合物は、6員環構造を含み、前記6員環構造が、ヘテロ原子を1つ又は2つ含み、前記1つ又は2つのヘテロ原子がそれぞれ窒素原子であることが好ましい。ヘテロ原子を1つ含み、前記1つのヘテロ原子が窒素原子である6員環構造としては、例えば、ピリジン環構造、テトラヒドロピリジン環構造、及びピペリジン環構造が挙げられる。ヘテロ原子を2つ含み、前記2つのヘテロ原子が窒素原子である6員環構造としては、例えば、ピラジン環構造及びピリミジン環構造が挙げられる。
The nitrogen-containing heterocyclic compound as the first solvent contains a six-membered ring structure, and the six-membered ring structure contains one or two hetero atoms, and the one or two hetero atoms are respectively nitrogen atoms Is preferred. Examples of the 6-membered ring structure containing one hetero atom and wherein one hetero atom is a nitrogen atom include a pyridine ring structure, a tetrahydropyridine ring structure, and a piperidine ring structure. Examples of the 6-membered ring structure containing two hetero atoms, wherein the two hetero atoms are nitrogen atoms include a pyrazine ring structure and a pyrimidine ring structure.
ピリジン環構造を含む含窒素複素環式化合物としては、例えば、置換基を有していてもよいピリジン、置換基を有していてもよいキノリン、及び置換基を有していてもよいイソキノリンが挙げられる。
As the nitrogen-containing heterocyclic compound containing a pyridine ring structure, for example, pyridine which may have a substituent, quinoline which may have a substituent, and isoquinoline which may have a substituent are exemplified. It can be mentioned.
テトラヒドロピリジン環構造を含む含窒素環式化合物としては、例えば、置換基を有していてもよい1,2,3,4-テトラヒドロキノリン、及び置換基を有していてもよい1,2,3,4-テトラヒドロイソキノリンが挙げられる。
Examples of the nitrogen-containing cyclic compound containing a tetrahydropyridine ring structure include optionally substituted 1,2,3,4-tetrahydroquinoline and optionally substituted 1,2,3 3,4- tetrahydroisoquinoline is mentioned.
ピラジン環構造を含む含窒素環式化合物としては、例えば、置換基を有していてもよいピラジン、置換基を有していてもよいキノキサリンが挙げられる。
Examples of the nitrogen-containing cyclic compound containing a pyrazine ring structure include pyrazine which may have a substituent and quinoxaline which may have a substituent.
ピリミジン環構造を含む含窒素環式化合物としては、例えば、置換基を有していてもよいピリミジン、及び置換基を有していてもよいキナゾリンが挙げられる。
Examples of the nitrogen-containing cyclic compound containing a pyrimidine ring structure include pyrimidine which may have a substituent, and quinazoline which may have a substituent.
第1の溶媒は、
好ましくは、ピリジン環構造、テトラヒドロピリジン環構造、ピペリジン環構造、又はピラジン環構造を含む含窒素複素環式化合物であり、より好ましくはピリジン環構造、テトラヒドロピリジン環、又はピラジン環構造を含む含窒素複素環式化合物であり、
更に好ましくは置換基を有していてもよいキノリン、置換基を有していてもよい1,2,3,4-テトラヒドロキノリン、及び置換基を有していてもよいキノキサリンからなる群から選択される1種以上であり、
更に好ましくはアルキル基を有するキノリン、アルキル基を有する1,2,3,4-テトラヒドロキノリン、及びアルキル基を有するキノキサリンからなる群から選択される1種以上であり、
更に好ましくは、2-メチルキノリン、3-メチルキノリン、6-メチルキノリン、8-メチルキノリン、1,2,3,4-テトラヒドロキナルジン、及び2-メチルキノキサリンからなる群から選択される1種以上である。 The first solvent is
Preferably, it is a nitrogen-containing heterocyclic compound containing a pyridine ring structure, a tetrahydropyridine ring structure, a piperidine ring structure or a pyrazine ring structure, and more preferably a nitrogen-containing heterocyclic compound containing a pyridine ring structure, a tetrahydropyridine ring or a pyrazine ring structure A heterocyclic compound,
More preferably, it is selected from the group consisting of quinoline which may have a substituent, 1,2,3,4-tetrahydroquinoline which may have a substituent, and quinoxaline which may have a substituent. At least one of
More preferably, it is one or more selected from the group consisting of quinoline having an alkyl group, 1,2,3,4-tetrahydroquinoline having an alkyl group, and quinoxaline having an alkyl group,
More preferably, one kind selected from the group consisting of 2-methylquinoline, 3-methylquinoline, 6-methylquinoline, 8-methylquinoline, 1,2,3,4-tetrahydroquinaldine, and 2-methylquinoxaline It is above.
好ましくは、ピリジン環構造、テトラヒドロピリジン環構造、ピペリジン環構造、又はピラジン環構造を含む含窒素複素環式化合物であり、より好ましくはピリジン環構造、テトラヒドロピリジン環、又はピラジン環構造を含む含窒素複素環式化合物であり、
更に好ましくは置換基を有していてもよいキノリン、置換基を有していてもよい1,2,3,4-テトラヒドロキノリン、及び置換基を有していてもよいキノキサリンからなる群から選択される1種以上であり、
更に好ましくはアルキル基を有するキノリン、アルキル基を有する1,2,3,4-テトラヒドロキノリン、及びアルキル基を有するキノキサリンからなる群から選択される1種以上であり、
更に好ましくは、2-メチルキノリン、3-メチルキノリン、6-メチルキノリン、8-メチルキノリン、1,2,3,4-テトラヒドロキナルジン、及び2-メチルキノキサリンからなる群から選択される1種以上である。 The first solvent is
Preferably, it is a nitrogen-containing heterocyclic compound containing a pyridine ring structure, a tetrahydropyridine ring structure, a piperidine ring structure or a pyrazine ring structure, and more preferably a nitrogen-containing heterocyclic compound containing a pyridine ring structure, a tetrahydropyridine ring or a pyrazine ring structure A heterocyclic compound,
More preferably, it is selected from the group consisting of quinoline which may have a substituent, 1,2,3,4-tetrahydroquinoline which may have a substituent, and quinoxaline which may have a substituent. At least one of
More preferably, it is one or more selected from the group consisting of quinoline having an alkyl group, 1,2,3,4-tetrahydroquinoline having an alkyl group, and quinoxaline having an alkyl group,
More preferably, one kind selected from the group consisting of 2-methylquinoline, 3-methylquinoline, 6-methylquinoline, 8-methylquinoline, 1,2,3,4-tetrahydroquinaldine, and 2-methylquinoxaline It is above.
また別の態様では、第1の溶媒は、
好ましくは、置換基を有していてもよいキノリン、置換基を有していてもよい1,2,3,4-テトラヒドロキノリン、又は置換基を有していてもよいキノキサリンであり、
より好ましくは、アルキル基を有するキノリン、アルキル基を有する1,2,3,4-テトラヒドロキノリン、又はアルキル基を有するキノキサリンであり、
更に好ましくは、2-メチルキノリン、3-メチルキノリン、6-メチルキノリン、8-メチルキノリン、1,2,3,4-テトラヒドロキナルジン、又は2-メチルキノキサリンである。 In another aspect, the first solvent is
Preferably, quinoline which may have a substituent, 1,2,3,4-tetrahydroquinoline which may have a substituent, or quinoxaline which may have a substituent is preferable.
More preferably, quinoline having an alkyl group, 1,2,3,4-tetrahydroquinoline having an alkyl group, or quinoxaline having an alkyl group,
More preferably, 2-methylquinoline, 3-methylquinoline, 6-methylquinoline, 8-methylquinoline, 1,2,3,4-tetrahydroquinaldine, or 2-methylquinoxaline.
好ましくは、置換基を有していてもよいキノリン、置換基を有していてもよい1,2,3,4-テトラヒドロキノリン、又は置換基を有していてもよいキノキサリンであり、
より好ましくは、アルキル基を有するキノリン、アルキル基を有する1,2,3,4-テトラヒドロキノリン、又はアルキル基を有するキノキサリンであり、
更に好ましくは、2-メチルキノリン、3-メチルキノリン、6-メチルキノリン、8-メチルキノリン、1,2,3,4-テトラヒドロキナルジン、又は2-メチルキノキサリンである。 In another aspect, the first solvent is
Preferably, quinoline which may have a substituent, 1,2,3,4-tetrahydroquinoline which may have a substituent, or quinoxaline which may have a substituent is preferable.
More preferably, quinoline having an alkyl group, 1,2,3,4-tetrahydroquinoline having an alkyl group, or quinoxaline having an alkyl group,
More preferably, 2-methylquinoline, 3-methylquinoline, 6-methylquinoline, 8-methylquinoline, 1,2,3,4-tetrahydroquinaldine, or 2-methylquinoxaline.
(第2の溶媒)
第2の溶媒は、芳香族炭化水素である。第2の溶媒としては、p型半導体材料を溶解可能な溶媒が好ましい。 (Second solvent)
The second solvent is an aromatic hydrocarbon. As the second solvent, a solvent capable of dissolving the p-type semiconductor material is preferable.
第2の溶媒は、芳香族炭化水素である。第2の溶媒としては、p型半導体材料を溶解可能な溶媒が好ましい。 (Second solvent)
The second solvent is an aromatic hydrocarbon. As the second solvent, a solvent capable of dissolving the p-type semiconductor material is preferable.
芳香族炭化水素としては、例えば、トルエン、キシレン(例、o-キシレン、m-キシレン、p-キシレン)、トリメチルベンゼン(例、メシチレン、1,2,4-トリメチルベンゼン(プソイドクメン))、ブチルベンゼン(例、n-ブチルベンゼン、sec-ブチルベンゼン、tert-ブチルベンゼン)、メチルナフタレン(例、1-メチルナフタレン)、テトラリン、及びインダンが挙げられる。
As the aromatic hydrocarbon, for example, toluene, xylene (eg, o-xylene, m-xylene, p-xylene), trimethylbenzene (eg, mesitylene, 1,2,4-trimethylbenzene (pseudocumene)), butylbenzene Examples are (for example, n-butylbenzene, sec-butylbenzene, tert-butylbenzene), methylnaphthalene (eg 1-methylnaphthalene), tetralin and indane.
第2の溶媒は、1種の芳香族炭化水素から構成されていても、2種以上の芳香族炭化水素から構成されていてもよい。好ましくは、第2の溶媒は、1種の芳香族炭化水素から構成される。
The second solvent may be composed of one aromatic hydrocarbon or may be composed of two or more aromatic hydrocarbons. Preferably, the second solvent is composed of one aromatic hydrocarbon.
第2の溶媒は、好ましくは、トルエン、o-キシレン、m-キシレン、p-キシレン、メシチレン、1,2,4-トリメチルベンゼン、n-ブチルベンゼン、sec-ブチルベンゼン、tert-ブチルベンゼン、メチルナフタレン、テトラリン、及びインダンからなる群から選択される1種以上であり、
より好ましくはトルエン、o-キシレン、m-キシレン、p-キシレン、メシチレン、1,2,4-トリメチルベンゼン、n-ブチルベンゼン、sec-ブチルベンゼン、tert-ブチルベンゼン、メチルナフタレン、テトラリン、又はインダンである。 The second solvent is preferably toluene, o-xylene, m-xylene, p-xylene, mesitylene, 1,2,4-trimethylbenzene, n-butylbenzene, sec-butylbenzene, tert-butylbenzene, methyl At least one selected from the group consisting of naphthalene, tetralin and indane,
More preferably, toluene, o-xylene, m-xylene, p-xylene, mesitylene, 1,2,4-trimethylbenzene, n-butylbenzene, sec-butylbenzene, tert-butylbenzene, methyl naphthalene, tetralin or indane It is.
より好ましくはトルエン、o-キシレン、m-キシレン、p-キシレン、メシチレン、1,2,4-トリメチルベンゼン、n-ブチルベンゼン、sec-ブチルベンゼン、tert-ブチルベンゼン、メチルナフタレン、テトラリン、又はインダンである。 The second solvent is preferably toluene, o-xylene, m-xylene, p-xylene, mesitylene, 1,2,4-trimethylbenzene, n-butylbenzene, sec-butylbenzene, tert-butylbenzene, methyl At least one selected from the group consisting of naphthalene, tetralin and indane,
More preferably, toluene, o-xylene, m-xylene, p-xylene, mesitylene, 1,2,4-trimethylbenzene, n-butylbenzene, sec-butylbenzene, tert-butylbenzene, methyl naphthalene, tetralin or indane It is.
(第1の溶媒及び第2の溶媒の組み合わせ)
第1の溶媒及び第2の溶媒の組み合わせとしては、例えば下記の表に示す組み合わせが挙げられる。 (Combination of the first solvent and the second solvent)
As a combination of a 1st solvent and a 2nd solvent, the combination shown, for example in the following table | surface is mentioned.
第1の溶媒及び第2の溶媒の組み合わせとしては、例えば下記の表に示す組み合わせが挙げられる。 (Combination of the first solvent and the second solvent)
As a combination of a 1st solvent and a 2nd solvent, the combination shown, for example in the following table | surface is mentioned.
(第1の溶媒及び第2の溶媒の重量比)
第1の溶媒の第2の溶媒に対する重量比率(第1の溶媒/第2の溶媒)は、p型半導体材料及びn型半導体材料の溶解性をより良好とする観点から、好ましくは1/99以上、より好ましくは3/97以上、更に好ましくは5/95以上であり、好ましくは20/80以下、より好ましくは15/85以下、更に好ましくは10/90以下であり、好ましくは1/99以上20/80以下、より好ましくは3/97以上15/85以下、更に好ましくは5/95以上10/90以下である。 (Weight ratio of first solvent and second solvent)
The weight ratio of the first solvent to the second solvent (first solvent / second solvent) is preferably 1/99 from the viewpoint of improving the solubility of the p-type semiconductor material and the n-type semiconductor material. Or more, more preferably 3/97 or more, still more preferably 5/95 or more, preferably 20/80 or less, more preferably 15/85 or less, more preferably 10/90 or less, preferably 1/99 20/80 or less, more preferably 3/97 or more and 15/85 or less, still more preferably 5/95 or more and 10/90 or less.
第1の溶媒の第2の溶媒に対する重量比率(第1の溶媒/第2の溶媒)は、p型半導体材料及びn型半導体材料の溶解性をより良好とする観点から、好ましくは1/99以上、より好ましくは3/97以上、更に好ましくは5/95以上であり、好ましくは20/80以下、より好ましくは15/85以下、更に好ましくは10/90以下であり、好ましくは1/99以上20/80以下、より好ましくは3/97以上15/85以下、更に好ましくは5/95以上10/90以下である。 (Weight ratio of first solvent and second solvent)
The weight ratio of the first solvent to the second solvent (first solvent / second solvent) is preferably 1/99 from the viewpoint of improving the solubility of the p-type semiconductor material and the n-type semiconductor material. Or more, more preferably 3/97 or more, still more preferably 5/95 or more, preferably 20/80 or less, more preferably 15/85 or less, more preferably 10/90 or less, preferably 1/99 20/80 or less, more preferably 3/97 or more and 15/85 or less, still more preferably 5/95 or more and 10/90 or less.
(インクにおける第1の溶媒及び第2の溶媒の合計の重量百分率)
インクに含まれる第1の溶媒及び第2の溶媒の総重量は、インクの全重量100重量%に対して、p型半導体材料及びn型半導体材料の溶解性をより良好とする観点から、好ましくは90重量%以上、より好ましくは92重量%以上、更に好ましくは95重量%以上であり、一定の厚み以上の膜を形成し易くする観点から、好ましくは99重量%以下、より好ましくは98重量%以下、更に好ましくは97.5重量%以下である。 (Weight percentage of the sum of the first solvent and the second solvent in the ink)
The total weight of the first solvent and the second solvent contained in the ink is preferably from the viewpoint of making the solubility of the p-type semiconductor material and the n-type semiconductor material better with respect to 100% by weight of the total weight of the ink. Is 90% by weight or more, more preferably 92% by weight or more, still more preferably 95% by weight, and from the viewpoint of facilitating formation of a film having a certain thickness or more, preferably 99% by weight or less, more preferably 98% by weight % Or less, more preferably 97.5% by weight or less.
インクに含まれる第1の溶媒及び第2の溶媒の総重量は、インクの全重量100重量%に対して、p型半導体材料及びn型半導体材料の溶解性をより良好とする観点から、好ましくは90重量%以上、より好ましくは92重量%以上、更に好ましくは95重量%以上であり、一定の厚み以上の膜を形成し易くする観点から、好ましくは99重量%以下、より好ましくは98重量%以下、更に好ましくは97.5重量%以下である。 (Weight percentage of the sum of the first solvent and the second solvent in the ink)
The total weight of the first solvent and the second solvent contained in the ink is preferably from the viewpoint of making the solubility of the p-type semiconductor material and the n-type semiconductor material better with respect to 100% by weight of the total weight of the ink. Is 90% by weight or more, more preferably 92% by weight or more, still more preferably 95% by weight, and from the viewpoint of facilitating formation of a film having a certain thickness or more, preferably 99% by weight or less, more preferably 98% by weight % Or less, more preferably 97.5% by weight or less.
(任意の溶媒)
インクは、第1の溶媒及び第2の溶媒以外の任意の溶媒を含んでいてもよい。インクに含まれる全溶媒の合計重量100重量%に対して、任意の溶媒の含有率は、好ましくは5重量%以下であり、より好ましくは3重量%以下であり、更に好ましくは1重量%以下であり、特に好ましくは0重量%である。 (Any solvent)
The ink may comprise any solvent other than the first solvent and the second solvent. The content of the optional solvent is preferably 5% by weight or less, more preferably 3% by weight or less, still more preferably 1% by weight or less, based on 100% by weight of the total weight of all the solvents contained in the ink. Particularly preferably, it is 0% by weight.
インクは、第1の溶媒及び第2の溶媒以外の任意の溶媒を含んでいてもよい。インクに含まれる全溶媒の合計重量100重量%に対して、任意の溶媒の含有率は、好ましくは5重量%以下であり、より好ましくは3重量%以下であり、更に好ましくは1重量%以下であり、特に好ましくは0重量%である。 (Any solvent)
The ink may comprise any solvent other than the first solvent and the second solvent. The content of the optional solvent is preferably 5% by weight or less, more preferably 3% by weight or less, still more preferably 1% by weight or less, based on 100% by weight of the total weight of all the solvents contained in the ink. Particularly preferably, it is 0% by weight.
(p型半導体材料)
p型半導体材料は、低分子化合物であっても高分子化合物であってもよい。 (P-type semiconductor material)
The p-type semiconductor material may be a low molecular weight compound or a high molecular weight compound.
p型半導体材料は、低分子化合物であっても高分子化合物であってもよい。 (P-type semiconductor material)
The p-type semiconductor material may be a low molecular weight compound or a high molecular weight compound.
低分子化合物であるp型半導体材料としては、例えば、フタロシアニン、金属フタロシアニン、ポルフィリン、金属ポルフィリン、オリゴチオフェン、テトラセン、ペンタセン、及びルブレンが挙げられる。
Examples of p-type semiconductor materials which are low molecular weight compounds include phthalocyanines, metal phthalocyanines, porphyrins, metal porphyrins, oligothiophenes, tetracenes, pentacenes, and rubrenes.
高分子化合物であるp型半導体材料としては、例えば、ポリビニルカルバゾール及びその誘導体、ポリシラン及びその誘導体、側鎖又は主鎖に芳香族アミン構造を含むポリシロキサン誘導体、ポリアニリン及びその誘導体、ポリチオフェン及びその誘導体、ポリピロール及びその誘導体、ポリフェニレンビニレン及びその誘導体、ポリチエニレンビニレン及びその誘導体、ポリフルオレン及びその誘導体等が挙げられる。
As the p-type semiconductor material which is a polymer compound, for example, polyvinylcarbazole and its derivative, polysilane and its derivative, polysiloxane derivative having aromatic amine structure in side chain or main chain, polyaniline and its derivative, polythiophene and its derivative And polypyrrole and derivatives thereof, polyphenylene vinylene and derivatives thereof, polythienylene vinylene and derivatives thereof, polyfluorene and derivatives thereof and the like.
p型半導体材料は、インクの安定性を優れたものにする観点から、高分子化合物であることが好ましく、更に光電変換素子の外部量子効率を優れたものにする観点から、下記式(I)で表される構成単位及び/又は下記式(II)で表される構成単位を含む高分子化合物であることが好ましい。
The p-type semiconductor material is preferably a polymer compound from the viewpoint of making the stability of the ink excellent, and from the viewpoint of making the external quantum efficiency of the photoelectric conversion device excellent, the following formula (I) It is preferable that it is a high molecular compound containing the structural unit represented by the structural unit represented by, and / or following formula (II).
式(I)中、Ar1及びAr2は、3価の芳香族複素環基を表し、Zは下記式(Z-1)~式(Z-7)のいずれか1つで表される基を表す。
In formula (I), Ar 1 and Ar 2 each represent a trivalent aromatic heterocyclic group, and Z is a group represented by any one of the following formulas (Z-1) to (Z-7) Represents
式(II)中、Ar3は2価の芳香族複素環基を表す。
In formula (II), Ar 3 represents a divalent aromatic heterocyclic group.
式(Z-1)~(Z-7)中、Rは、水素原子、ハロゲン原子、アルキル基、アリール基、アルコキシ基、アリールオキシ基、アルキルチオ基、アリールチオ基、1価の複素環基、置換アミノ基、アシル基、イミン残基、アミド基、酸イミド基、置換オキシカルボニル基、アルケニル基、アルキニル基、シアノ基、又はニトロ基を表す。式(Z-1)~式(Z-7)のそれぞれにおいて、Rが2つ存在する場合、2つのRは互いに同一でも異なっていてもよい。
In formulas (Z-1) to (Z-7), R represents a hydrogen atom, a halogen atom, an alkyl group, an aryl group, an alkoxy group, an aryloxy group, an alkylthio group, an arylthio group, a monovalent heterocyclic group, a substituted group It represents an amino group, an acyl group, an imine residue, an amido group, an acid imide group, a substituted oxycarbonyl group, an alkenyl group, an alkynyl group, a cyano group or a nitro group. When two R's are present in each of Formula (Z-1) to Formula (Z-7), two R's may be the same as or different from each other.
式(I)で表される構成単位は、下記式(I-1)で表される構成単位であることが好ましい。
The constitutional unit represented by the formula (I) is preferably a constitutional unit represented by the following formula (I-1).
式(I-1)中、Zは前記と同様の意味を表す。
In formula (I-1), Z represents the same meaning as described above.
式(I-1)で表される構成単位の例としては、下記式(501)~式(505)で表される構成単位が挙げられる。
Examples of the structural unit represented by the formula (I-1) include structural units represented by the following formulas (501) to (505).
上記式(501)~式(505)中、Rは前記と同様の意味を表す。Rが2つ存在する場合、2つのRは互いに同一でも異なっていてもよい。
In the above formulas (501) to (505), R represents the same meaning as described above. When two R's are present, two R's may be the same or different.
Ar3で表される2価の芳香族複素環基が有する炭素原子数は、通常2~60であり、好ましくは4~60であり、より好ましくは4~20である。Ar3で表される2価の芳香族複素環基は置換基を有していてもよい。Ar3で表される2価の芳香族複素環基が有していてもよい置換基の例としては、ハロゲン原子、アルキル基、アリール基、アルコキシ基、アリールオキシ基、アルキルチオ基、アリールチオ基、1価の複素環基、置換アミノ基、アシル基、イミン残基、アミド基、酸イミド基、置換オキシカルボニル基、アルケニル基、アルキニル基、シアノ基、及びニトロ基が挙げられる。
The number of carbon atoms of the divalent aromatic heterocyclic group represented by Ar 3 is generally 2 to 60, preferably 4 to 60, and more preferably 4 to 20. The divalent aromatic heterocyclic group represented by Ar 3 may have a substituent. Examples of the substituent which the divalent aromatic heterocyclic group represented by Ar 3 may have include a halogen atom, an alkyl group, an aryl group, an alkoxy group, an aryloxy group, an alkylthio group, an arylthio group, Examples thereof include monovalent heterocyclic groups, substituted amino groups, acyl groups, imine residues, amide groups, acid imide groups, substituted oxycarbonyl groups, alkenyl groups, alkynyl groups, cyano groups, and nitro groups.
Ar3で表される2価の芳香族複素環基の例としては、下記式(101)~式(185)で表される基が挙げられる。
Examples of the divalent aromatic heterocyclic group represented by Ar 3 include groups represented by the following formulas (101) to (185).
式(101)~式(185)中、Rは前記と同じ意味を表す。Rが複数存在する場合、複数のRは、互いに同一でも異なっていてもよい。
In formulas (101) to (185), R represents the same meaning as described above. When a plurality of R's are present, the plurality of R's may be the same or different.
前記式(II)で表される構成単位としては、下記式(II-1)~式(II-6)で表される構成単位が好ましい。
As the constitutional unit represented by the formula (II), constitutional units represented by the following formulas (II-1) to (II-6) are preferable.
式(II-1)~式(II-6)中、X1及びX2は、それぞれ独立に、酸素原子又は硫黄原子を表し、Rは上記と同じ意味を表す。Rが複数存在する場合、複数のRは、互いに同一でも異なっていてもよい。
In formulas (II-1) to (II-6), X 1 and X 2 each independently represent an oxygen atom or a sulfur atom, and R represents the same meaning as described above. When a plurality of R's are present, the plurality of R's may be the same or different.
原料化合物の入手がし易いので、式(II-1)~式(II-6)中のX1及びX2は、いずれも硫黄原子であることが好ましい。
It is preferable that each of X 1 and X 2 in the formulas (II-1) to (II-6) is a sulfur atom because the raw material compounds are easily available.
p型半導体材料である高分子化合物は、2種以上の式(I)の構成単位を含んでいてもよく、2種以上の式(II)の構成単位を含んでいてもよい。
The polymer compound which is a p-type semiconductor material may contain two or more structural units of the formula (I), and may contain two or more structural units of the formula (II).
溶媒に対する溶解性を向上させるため、p型半導体材料である高分子化合物は、下記式(III)で表される構成単位を含んでいてもよい。
In order to improve the solubility in a solvent, the polymer compound which is a p-type semiconductor material may contain a constitutional unit represented by the following formula (III).
式(III)中、Ar4はアリーレン基を表す。
In formula (III), Ar 4 represents an arylene group.
Ar4で表されるアリーレン基とは、置換基を有していてもよい芳香族炭化水素から、水素原子2つを除いた残りの原子団を意味する。芳香族炭化水素には、縮合環を有する化合物、独立したベンゼン環及び縮合環からなる群から選ばれる2つ以上が、直接又はビニレン等の2価の基を介して結合した化合物も含まれる。
The arylene group represented by Ar 4 means an atomic group remaining after removing two hydrogen atoms from an aromatic hydrocarbon which may have a substituent. The aromatic hydrocarbon also includes a compound having a condensed ring, and a compound in which two or more members selected from the group consisting of independent benzene rings and condensed rings are directly or linked via a divalent group such as vinylene.
芳香族炭化水素が有していてもよい置換基の例としては、複素環式化合物が有していてもよい置換基として挙げた上記例と同様の置換基が挙げられる。
Examples of the substituent which the aromatic hydrocarbon may have include the same substituents as the examples mentioned above as the substituent which the heterocyclic compound may have.
アリーレン基における、置換基を除いた部分の炭素原子数は、通常6~60であり、好ましくは6~20である。置換基を含めたアリーレン基の炭素原子数は、通常6~100程度である。
The carbon atom number of the arylene group excluding the substituent is usually 6 to 60, and preferably 6 to 20. The number of carbon atoms of the arylene group including the substituent is usually about 6 to 100.
アリーレン基の例としては、フェニレン基(例えば、下記式1~式3)、ナフタレン-ジイル基(例えば、下記式4~式13)、アントラセン-ジイル基(例えば、下記式14~式19)、ビフェニル-ジイル基(例えば、下記式20~式25)、ターフェニル-ジイル基(例えば、下記式26~式28)、縮合環化合物基(例えば、下記式29~式35)、フルオレン-ジイル基(例えば、下記式36~式38)、及びベンゾフルオレン-ジイル基(例えば、下記式39~式46)が挙げられる。
Examples of arylene groups include phenylene (for example, the following formulas 1 to 3), naphthalene-diyl (for example, the following formulas 4 to 13), anthracene-diyl (for example, the following formulas 14 to 19), Biphenyl-diyl group (for example, the following formulas 20 to 25), terphenyl-diyl group (for example, the following formulas 26 to 28), fused ring compound group (for example, the following formulas 29 to 35), fluorene-diyl group (For example, the following formulas 36 to 38), and a benzofluorene-diyl group (for example, the following formulas 39 to 46).
p型半導体材料としての高分子化合物が、式(I)で表される構成単位及び/又は式(II)で表される構成単位を含む場合、式(I)で表される構成単位及び式(II)で表される構成単位の合計量は、高分子化合物が含むすべての構成単位の量を100モル%とすると、通常20~100モル%であり、p型半導体材料としての電荷輸送性を向上させるので、好ましくは40~100モル%であり、より好ましくは50~100モル%である。
When the polymer compound as the p-type semiconductor material contains the constitutional unit represented by the formula (I) and / or the constitutional unit represented by the formula (II), the constitutional unit represented by the formula (I) and the formula The total amount of the constituent units represented by (II) is usually 20 to 100 mol%, assuming that the amount of all constituent units contained in the polymer compound is 100 mol%, and the charge transportability as a p-type semiconductor material Preferably from 40 to 100 mol%, more preferably from 50 to 100 mol%.
p型半導体材料としての高分子化合物の具体例としては、下記式で表される高分子化合物が挙げられる
Examples of the polymer compound as the p-type semiconductor material include polymer compounds represented by the following formula
p型半導体材料としての高分子化合物は、ポリスチレン換算の重量平均分子量が、通常1×103~1×108であり、溶媒への溶解性を向上させる観点から、好ましくは1×103~1×106である。
The polymer compound as a p-type semiconductor material has a polystyrene equivalent weight average molecular weight of usually 1 × 10 3 to 1 × 10 8 and is preferably 1 × 10 3 to 3 in view of improving the solubility in a solvent. It is 1 × 10 6 .
インクは、p型半導体材料を1種のみ含んでいてもよく、2種以上の任意の割合の組み合わせとして含んでいてもよい。
The ink may contain only one p-type semiconductor material, or may contain two or more arbitrary proportions.
(n型半導体材料)
n型半導体材料は、低分子化合物であっても高分子化合物であってもよい。 (N-type semiconductor material)
The n-type semiconductor material may be a low molecular weight compound or a high molecular weight compound.
n型半導体材料は、低分子化合物であっても高分子化合物であってもよい。 (N-type semiconductor material)
The n-type semiconductor material may be a low molecular weight compound or a high molecular weight compound.
低分子化合物であるn型半導体材料(電子受容性化合物)の例としては、オキサジアゾール誘導体、アントラキノジメタン及びその誘導体、ベンゾキノン及びその誘導体、ナフトキノン及びその誘導体、アントラキノン及びその誘導体、テトラシアノアントラキノジメタン及びその誘導体、フルオレノン誘導体、ジフェニルジシアノエチレン及びその誘導体、ジフェノキノン誘導体、8-ヒドロキシキノリン及びその誘導体の金属錯体、C60フラーレン等のフラーレン類及びその誘導体、並びに、バソクプロイン等のフェナントレン誘導体が挙げられる。
Examples of n-type semiconductor materials (electron accepting compounds) which are low molecular weight compounds include oxadiazole derivatives, anthraquinodimethane and its derivatives, benzoquinone and its derivatives, naphthoquinone and its derivatives, anthraquinone and its derivatives, tetracyano Anthraquinodimethane and derivatives thereof, fluorenone derivatives, diphenyldicyanoethylene and derivatives thereof, diphenoquinone derivatives, metal complexes of 8-hydroxyquinoline and derivatives thereof, fullerenes such as C 60 fullerene and derivatives thereof, and phenanthrene derivatives such as vasocuproin Can be mentioned.
高分子化合物であるn型半導体材料(電子受容性化合物)の例としては、ポリビニルカルバゾール及びその誘導体、ポリシラン及びその誘導体、側鎖又は主鎖に芳香族アミン構造を有するポリシロキサン誘導体、ポリアニリン及びその誘導体、ポリチオフェン及びその誘導体、ポリピロール及びその誘導体、ポリフェニレンビニレン及びその誘導体、ポリチエニレンビニレン及びその誘導体、ポリキノリン及びその誘導体、ポリキノキサリン及びその誘導体、並びに、ポリフルオレン及びその誘導体が挙げられる。
Examples of n-type semiconductor materials (electron accepting compounds) which are high molecular compounds include polyvinylcarbazole and derivatives thereof, polysilane and derivatives thereof, polysiloxane derivatives having an aromatic amine structure in the side chain or main chain, polyaniline and the like Derivatives, polythiophene and derivatives thereof, polypyrrole and derivatives thereof, polyphenylene vinylene and derivatives thereof, polythienylene vinylene and derivatives thereof, polyquinoline and derivatives thereof, polyquinoxaline and derivatives thereof, and polyfluorene and derivatives thereof can be mentioned.
n型半導体材料としては、フラーレン及びフラーレン誘導体から選ばれる1種以上が好ましく、フラーレン誘導体がより好ましい。
The n-type semiconductor material is preferably at least one selected from fullerenes and fullerene derivatives, and more preferably fullerene derivatives.
フラーレンの例としては、C60フラーレン、C70フラーレン、C76フラーレン、C78フラーレン、及びC84フラーレンが挙げられる。フラーレン誘導体の例としては、これらのフラーレンの誘導体が挙げられる。フラーレン誘導体とは、フラーレンの少なくとも一部が修飾された化合物を意味する。
Examples of fullerene, C 60 fullerene, C 70 fullerene, C 76 fullerene, C 78 fullerene, and include C 84 fullerene. Examples of fullerene derivatives include derivatives of these fullerenes. The fullerene derivative means a compound in which at least a part of the fullerene is modified.
フラーレン誘導体の例としては、下記式(N-1)~式(N-4)で表される化合物が挙げられる。
Examples of the fullerene derivative include compounds represented by the following formulas (N-1) to (N-4).
式(N-1)~式(N-4)中、
Raは、アルキル基、アリール基、1価の複素環基、又はエステル構造を有する基を表す。複数あるRaは、互いに同一であっても異なっていてもよい。
Rbは、アルキル基、又はアリール基を表す。複数あるRbは、互いに同一であっても異なっていてもよい。 In formulas (N-1) to (N-4),
R a represents an alkyl group, an aryl group, a monovalent heterocyclic group, or a group having an ester structure. The plurality of Ras may be the same as or different from each other.
R b represents an alkyl group or an aryl group. Plural R b 's may be the same as or different from each other.
Raは、アルキル基、アリール基、1価の複素環基、又はエステル構造を有する基を表す。複数あるRaは、互いに同一であっても異なっていてもよい。
Rbは、アルキル基、又はアリール基を表す。複数あるRbは、互いに同一であっても異なっていてもよい。 In formulas (N-1) to (N-4),
R a represents an alkyl group, an aryl group, a monovalent heterocyclic group, or a group having an ester structure. The plurality of Ras may be the same as or different from each other.
R b represents an alkyl group or an aryl group. Plural R b 's may be the same as or different from each other.
Raで表されるエステル構造を有する基の例としては、下記式(19)で表される基が挙げられる。
Examples of the group having an ester structure represented by Ra include a group represented by the following formula (19).
式(19)中、u1は、1~6の整数を表す。u2は、0~6の整数を表す。Rcは、アルキル基、アリール基、又は1価の複素環基を表す。
In formula (19), u1 represents an integer of 1 to 6. u2 represents an integer of 0 to 6; R c represents an alkyl group, an aryl group or a monovalent heterocyclic group.
C60フラーレン誘導体の例としては、下記の化合物が挙げられる。
Examples of C 60 fullerene derivatives include the following compounds.
C70フラーレン誘導体の例としては、下記の化合物が挙げられる。
The following compounds may be mentioned as examples of C 70 fullerene derivatives.
フラーレン誘導体の具体例としては、[6,6]-フェニル-C61酪酸メチルエステル(C60PCBM、[6,6]-Phenyl C61 butyric acid methyl ester)、[6,6]-フェニル-C71酪酸メチルエステル(C70PCBM、[6,6]-Phenyl C71 butyric acid methyl ester)、[6,6」-フェニル-C85酪酸メチルエステル(C84PCBM、[6,6]-Phenyl C85 butyric acid methyl ester)、及び[6,6]-チエニル-C61酪酸メチルエステル([6,6]-Thienyl C61 butyric acid methyl ester)が挙げられる。
Specific examples of the fullerene derivative include [6,6] -phenyl-C61 butyric acid methyl ester (C60PCBM, [6,6] -phenyl C61 butyric acid methyl ester), [6,6] -phenyl-C71 butyric acid methyl ester ( C70PCBM, [6,6] -Phenyl C71 butyric acid methyl ester, [6,6] -phenyl-C85 butyric acid methyl ester (C84PCBM, [6,6] -phenyl C85 butyric acid methyl ester), and [6,6] ] -Thienyl-C61 butyric acid methyl ester ([6,6] -Thienyl C61 butyric acid methyl ester).
インクは、n型半導体材料を1種のみ含んでいてもよく、2種以上の任意の割合の組み合わせとして含んでいてもよい。
The ink may contain only one n-type semiconductor material, or may contain two or more arbitrary proportions of combinations.
(p型半導体材料及びn型半導体材料の組成比)
インク中のp型半導体材料及びn型半導体材料の重量比(p型半導体材料:n型半導体材料)は、1:9以上9:1以下であることが好ましく、1:9以上2:1以下であることがより好ましく、1:9以上1:1以下であることが更に好ましく、1:5以上1:1以下であることが特に好ましい。 (Composition ratio of p-type semiconductor material and n-type semiconductor material)
The weight ratio of the p-type semiconductor material to the n-type semiconductor material in the ink (p-type semiconductor material: n-type semiconductor material) is preferably 1: 9 to 9: 1, and 1: 9 to 2: 1. Is more preferable, 1: 9 or more and 1: 1 or less is further preferable, and 1: 5 or more and 1: 1 or less is particularly preferable.
インク中のp型半導体材料及びn型半導体材料の重量比(p型半導体材料:n型半導体材料)は、1:9以上9:1以下であることが好ましく、1:9以上2:1以下であることがより好ましく、1:9以上1:1以下であることが更に好ましく、1:5以上1:1以下であることが特に好ましい。 (Composition ratio of p-type semiconductor material and n-type semiconductor material)
The weight ratio of the p-type semiconductor material to the n-type semiconductor material in the ink (p-type semiconductor material: n-type semiconductor material) is preferably 1: 9 to 9: 1, and 1: 9 to 2: 1. Is more preferable, 1: 9 or more and 1: 1 or less is further preferable, and 1: 5 or more and 1: 1 or less is particularly preferable.
(任意の成分)
インクには、上記第1の溶媒、第2の溶媒、p型半導体材料、及びn型半導体材料の他に、本発明の効果を阻害しない限度において、任意の成分が含まれていてもよい。
任意の成分としては、例えば、上述したような第1の溶媒及び第2の溶媒以外の溶媒、プロピオフェノン、安息香酸メチル、安息香酸エチル、及び安息香酸ベンジルが挙げられる。 (Any ingredient)
The ink may contain any component other than the first solvent, the second solvent, the p-type semiconductor material, and the n-type semiconductor material as long as the effects of the present invention are not impaired.
Optional components include, for example, solvents other than the first solvent and the second solvent as described above, propiophenone, methyl benzoate, ethyl benzoate and benzyl benzoate.
インクには、上記第1の溶媒、第2の溶媒、p型半導体材料、及びn型半導体材料の他に、本発明の効果を阻害しない限度において、任意の成分が含まれていてもよい。
任意の成分としては、例えば、上述したような第1の溶媒及び第2の溶媒以外の溶媒、プロピオフェノン、安息香酸メチル、安息香酸エチル、及び安息香酸ベンジルが挙げられる。 (Any ingredient)
The ink may contain any component other than the first solvent, the second solvent, the p-type semiconductor material, and the n-type semiconductor material as long as the effects of the present invention are not impaired.
Optional components include, for example, solvents other than the first solvent and the second solvent as described above, propiophenone, methyl benzoate, ethyl benzoate and benzyl benzoate.
(インクにおけるp型半導体材料及びn型半導体材料の濃度)
インクにおける、p型半導体材料及びn型半導体材料の合計の濃度は、0.01重量%以上20重量%以下であることが好ましく、0.01重量%以上10重量%以下であることがより好ましく、0.01重量%以上5重量%以下であることが更に好ましく、0.1重量%以上5重量%以下であることが特に好ましい。インク中、p型半導体材料及びn型半導体材料は溶解していても分散していてもよいが、好ましくは少なくとも一部が溶解しており、より好ましくは全部が溶解している。 (Concentration of p-type semiconductor material and n-type semiconductor material in ink)
The total concentration of the p-type semiconductor material and the n-type semiconductor material in the ink is preferably 0.01% by weight or more and 20% by weight or less, and more preferably 0.01% by weight or more and 10% by weight or less More preferably, it is 0.01% by weight or more and 5% by weight or less, and particularly preferably 0.1% by weight or more and 5% by weight or less. In the ink, the p-type semiconductor material and the n-type semiconductor material may be dissolved or dispersed, but preferably at least a part is dissolved, and more preferably all is dissolved.
インクにおける、p型半導体材料及びn型半導体材料の合計の濃度は、0.01重量%以上20重量%以下であることが好ましく、0.01重量%以上10重量%以下であることがより好ましく、0.01重量%以上5重量%以下であることが更に好ましく、0.1重量%以上5重量%以下であることが特に好ましい。インク中、p型半導体材料及びn型半導体材料は溶解していても分散していてもよいが、好ましくは少なくとも一部が溶解しており、より好ましくは全部が溶解している。 (Concentration of p-type semiconductor material and n-type semiconductor material in ink)
The total concentration of the p-type semiconductor material and the n-type semiconductor material in the ink is preferably 0.01% by weight or more and 20% by weight or less, and more preferably 0.01% by weight or more and 10% by weight or less More preferably, it is 0.01% by weight or more and 5% by weight or less, and particularly preferably 0.1% by weight or more and 5% by weight or less. In the ink, the p-type semiconductor material and the n-type semiconductor material may be dissolved or dispersed, but preferably at least a part is dissolved, and more preferably all is dissolved.
[インクの製造方法]
インクは、公知の方法により製造することができる。例えば、第1の溶媒及び第2の溶媒を混合して混合溶媒を調製し、混合溶媒にp型半導体材料及びn型半導体材料を添加して製造する方法;第1の溶媒にp型半導体材料を添加し、第2の溶媒にn型半導体材料を添加してから、各材料が添加された第1の溶媒及び第2の溶媒を混合して製造する方法;などにより、製造することができる。 [Method of producing ink]
The ink can be produced by a known method. For example, a method of preparing a mixed solvent by mixing a first solvent and a second solvent, and adding a p-type semiconductor material and an n-type semiconductor material to the mixed solvent for production; a p-type semiconductor material in the first solvent And the n-type semiconductor material is added to the second solvent, and then the mixture is manufactured by mixing the first solvent and the second solvent to which each material is added; .
インクは、公知の方法により製造することができる。例えば、第1の溶媒及び第2の溶媒を混合して混合溶媒を調製し、混合溶媒にp型半導体材料及びn型半導体材料を添加して製造する方法;第1の溶媒にp型半導体材料を添加し、第2の溶媒にn型半導体材料を添加してから、各材料が添加された第1の溶媒及び第2の溶媒を混合して製造する方法;などにより、製造することができる。 [Method of producing ink]
The ink can be produced by a known method. For example, a method of preparing a mixed solvent by mixing a first solvent and a second solvent, and adding a p-type semiconductor material and an n-type semiconductor material to the mixed solvent for production; a p-type semiconductor material in the first solvent And the n-type semiconductor material is added to the second solvent, and then the mixture is manufactured by mixing the first solvent and the second solvent to which each material is added; .
第1の溶媒及び第2の溶媒とp型半導体材料及びn型半導体材料とを、溶媒の沸点以下の温度まで加温して混合してもよい。
The first solvent and the second solvent, and the p-type semiconductor material and the n-type semiconductor material may be heated to a temperature equal to or lower than the boiling point of the solvent and mixed.
第1の溶媒及び第2の溶媒とp型半導体材料及びn型半導体材料とを混合した後、得られる組成物をフィルターを用いて濾過し、濾液をインクとして用いてもよい。フィルターとしては、例えば、ポリテトラフルオロエチレン(PTFE)等のフッ素樹脂で形成されたフィルターを用いることができる。
After mixing the first solvent and the second solvent with the p-type semiconductor material and the n-type semiconductor material, the resulting composition may be filtered using a filter, and the filtrate may be used as an ink. As the filter, for example, a filter formed of a fluorine resin such as polytetrafluoroethylene (PTFE) can be used.
[インクの用途]
本発明のインクの用途は任意である。本発明のインクは、p型半導体材料及びn型半導体材料を含む膜を形成するために用いることができる。
本発明のインクは、光電変換素子に含まれる活性層を形成するために好適に用いられる。特に、本発明のインクを用いて形成された活性層を含む光検出素子は、逆バイアスの電圧を印加したときのEQEが向上している。したがって、本発明のインクは、光検出素子に含まれる活性層を形成するために特に好適に用いられる。 [Use of ink]
The application of the ink of the present invention is optional. The ink of the present invention can be used to form a film containing a p-type semiconductor material and an n-type semiconductor material.
The ink of the present invention is suitably used to form an active layer contained in a photoelectric conversion element. In particular, the light detection element including the active layer formed using the ink of the present invention has improved EQE when a reverse bias voltage is applied. Therefore, the ink of the present invention is particularly suitably used to form an active layer contained in a light detection element.
本発明のインクの用途は任意である。本発明のインクは、p型半導体材料及びn型半導体材料を含む膜を形成するために用いることができる。
本発明のインクは、光電変換素子に含まれる活性層を形成するために好適に用いられる。特に、本発明のインクを用いて形成された活性層を含む光検出素子は、逆バイアスの電圧を印加したときのEQEが向上している。したがって、本発明のインクは、光検出素子に含まれる活性層を形成するために特に好適に用いられる。 [Use of ink]
The application of the ink of the present invention is optional. The ink of the present invention can be used to form a film containing a p-type semiconductor material and an n-type semiconductor material.
The ink of the present invention is suitably used to form an active layer contained in a photoelectric conversion element. In particular, the light detection element including the active layer formed using the ink of the present invention has improved EQE when a reverse bias voltage is applied. Therefore, the ink of the present invention is particularly suitably used to form an active layer contained in a light detection element.
[3.インクの固化膜]
インクにより膜を形成した後、膜から溶媒を除去して膜を固化させると、インクの固化膜が得られる。 [3. Solidified film of ink]
After the film is formed by the ink, the solvent is removed from the film and the film is solidified to obtain a solidified film of the ink.
インクにより膜を形成した後、膜から溶媒を除去して膜を固化させると、インクの固化膜が得られる。 [3. Solidified film of ink]
After the film is formed by the ink, the solvent is removed from the film and the film is solidified to obtain a solidified film of the ink.
インクの固化膜の、厚みなどの寸法は特に限定されない。
The dimensions, such as thickness, of the solidified film of the ink are not particularly limited.
インクの固化膜は、上記インクの用途として説明した用途に好適に用いられる。
The solidified film of the ink is suitably used for the application described as the application of the ink.
[4.インクの固化膜の製造方法]
インクの固化膜は、任意の製造方法により製造することができる。インクの固化膜の製造方法の一実施形態は、インクを塗布対象に塗布して塗膜を得る工程(i)、及び得られた塗膜から溶媒を除去する工程(ii)を含む。 [4. Method of producing solidified film of ink]
The solidified film of the ink can be manufactured by any manufacturing method. One embodiment of a method for producing a solidified film of ink includes a step (i) of applying an ink to an application target to obtain a coating, and a step (ii) of removing a solvent from the obtained coating.
インクの固化膜は、任意の製造方法により製造することができる。インクの固化膜の製造方法の一実施形態は、インクを塗布対象に塗布して塗膜を得る工程(i)、及び得られた塗膜から溶媒を除去する工程(ii)を含む。 [4. Method of producing solidified film of ink]
The solidified film of the ink can be manufactured by any manufacturing method. One embodiment of a method for producing a solidified film of ink includes a step (i) of applying an ink to an application target to obtain a coating, and a step (ii) of removing a solvent from the obtained coating.
[工程(i)]
インクを塗布対象に塗布する方法としては、任意の塗布法を用いることができる。塗布法としては、スリットコート法、ナイフコート法、スピンコート法、マイクログラビアコート法、グラビアコート法、バーコート法、インクジェットコート法、ノズルコート法、又はキャピラリーコート法が好ましく、スリットコート法、スピンコート法、キャピラリーコート法、又はバーコート法がより好ましく、スリットコート法又はスピンコート法が更に好ましい。 [Step (i)]
Any application method can be used as a method of applying the ink to the application target. The coating method is preferably a slit coating method, a knife coating method, a spin coating method, a microgravure coating method, a gravure coating method, a bar coating method, an ink jet coating method, a nozzle coating method or a capillary coating method. The coating method, the capillary coating method, or the bar coating method is more preferable, and the slit coating method or the spin coating method is more preferable.
インクを塗布対象に塗布する方法としては、任意の塗布法を用いることができる。塗布法としては、スリットコート法、ナイフコート法、スピンコート法、マイクログラビアコート法、グラビアコート法、バーコート法、インクジェットコート法、ノズルコート法、又はキャピラリーコート法が好ましく、スリットコート法、スピンコート法、キャピラリーコート法、又はバーコート法がより好ましく、スリットコート法又はスピンコート法が更に好ましい。 [Step (i)]
Any application method can be used as a method of applying the ink to the application target. The coating method is preferably a slit coating method, a knife coating method, a spin coating method, a microgravure coating method, a gravure coating method, a bar coating method, an ink jet coating method, a nozzle coating method or a capillary coating method. The coating method, the capillary coating method, or the bar coating method is more preferable, and the slit coating method or the spin coating method is more preferable.
インクは、任意の塗布対象に塗布される。例えば、インクは、光電変換素子の製造工程において、電極(陽極又は陰極)、又は電子輸送層、正孔輸送層等の、光電変換素子が有する機能層の上に塗布されてよい。
The ink is applied to any application target. For example, the ink may be applied on a functional layer of a photoelectric conversion element, such as an electrode (anode or cathode), an electron transport layer, or a hole transport layer, in a manufacturing process of the photoelectric conversion element.
[工程(ii)]
塗膜から、溶媒を除去する方法としては、任意の方法を用いることができる。溶媒を除去する方法の例としては、熱風乾燥法、赤外線加熱乾燥法、フラッシュランプアニール乾燥法、減圧乾燥法などの乾燥法が挙げられる。 [Step (ii)]
Arbitrary methods can be used as a method of removing a solvent from a coating film. Examples of the method of removing the solvent include drying methods such as a hot air drying method, an infrared heat drying method, a flash lamp annealing drying method, and a reduced pressure drying method.
塗膜から、溶媒を除去する方法としては、任意の方法を用いることができる。溶媒を除去する方法の例としては、熱風乾燥法、赤外線加熱乾燥法、フラッシュランプアニール乾燥法、減圧乾燥法などの乾燥法が挙げられる。 [Step (ii)]
Arbitrary methods can be used as a method of removing a solvent from a coating film. Examples of the method of removing the solvent include drying methods such as a hot air drying method, an infrared heat drying method, a flash lamp annealing drying method, and a reduced pressure drying method.
[5.光電変換素子]
本発明の光電変換素子は、第1の電極と、p型半導体材料及びn型半導体材料を含む活性層と、第2の電極とをこの順で含み、前記活性層がインクの固化膜である。 [5. Photoelectric conversion element]
The photoelectric conversion element of the present invention comprises a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode in this order, and the active layer is a solidified film of ink. .
本発明の光電変換素子は、第1の電極と、p型半導体材料及びn型半導体材料を含む活性層と、第2の電極とをこの順で含み、前記活性層がインクの固化膜である。 [5. Photoelectric conversion element]
The photoelectric conversion element of the present invention comprises a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode in this order, and the active layer is a solidified film of ink. .
[光電変換素子の要素]
(活性層)
活性層は、p型半導体材料及びn型半導体材料を含む。また、活性層は、上記インクの固化膜である。p型半導体材料、n型半導体材料、インクの例及び好ましい例は、前記[2.インク]の項で説明した例と同様である。 [Elements of photoelectric conversion element]
(Active layer)
The active layer includes p-type semiconductor material and n-type semiconductor material. The active layer is a solidified film of the above-mentioned ink. Examples and preferred examples of the p-type semiconductor material, the n-type semiconductor material, and the ink are the same as those described in [2. Ink] is the same as the example described in the section.
(活性層)
活性層は、p型半導体材料及びn型半導体材料を含む。また、活性層は、上記インクの固化膜である。p型半導体材料、n型半導体材料、インクの例及び好ましい例は、前記[2.インク]の項で説明した例と同様である。 [Elements of photoelectric conversion element]
(Active layer)
The active layer includes p-type semiconductor material and n-type semiconductor material. The active layer is a solidified film of the above-mentioned ink. Examples and preferred examples of the p-type semiconductor material, the n-type semiconductor material, and the ink are the same as those described in [2. Ink] is the same as the example described in the section.
光電変換素子は、活性層が上記インクの固化膜であることにより、EQEが向上する。特に、光電変換素子に逆バイアスの電圧を印加したときのEQEが向上する。したがって、本発明の光電変換素子は、光検出素子として好適である。
In the photoelectric conversion element, the EQE is improved by the active layer being a solidified film of the ink. In particular, EQE improves when a reverse bias voltage is applied to the photoelectric conversion element. Therefore, the photoelectric conversion element of the present invention is suitable as a light detection element.
光電変換素子は、活性層を複数有していてもよい。
The photoelectric conversion element may have a plurality of active layers.
(電極)
第1の電極及び第2の電極は、少なくともいずれかが透明又は半透明の電極であることが好ましい。基板が、不透明である場合、第1の電極及び第2の電極のうち、基板から遠い方の電極が透明又は半透明であることが好ましい。 (electrode)
Preferably, at least one of the first electrode and the second electrode is a transparent or translucent electrode. When the substrate is opaque, it is preferable that one of the first electrode and the second electrode which is farther from the substrate is transparent or translucent.
第1の電極及び第2の電極は、少なくともいずれかが透明又は半透明の電極であることが好ましい。基板が、不透明である場合、第1の電極及び第2の電極のうち、基板から遠い方の電極が透明又は半透明であることが好ましい。 (electrode)
Preferably, at least one of the first electrode and the second electrode is a transparent or translucent electrode. When the substrate is opaque, it is preferable that one of the first electrode and the second electrode which is farther from the substrate is transparent or translucent.
透明又は半透明の電極としては、導電性の金属酸化物膜、半透明の金属薄膜等が挙げられる。透明又は半透明の電極材料としては、具体的には、例えば、酸化インジウム、酸化亜鉛、酸化スズ、及びそれらの複合体(例、インジウム・スズ・オキサイド(ITO)、インジウム・亜鉛・オキサイド)、NESA、金、白金、銀、並びに銅が挙げられる。なかでも、透明又は半透明の電極材料としては、ITO、インジウム・亜鉛・オキサイド、及び酸化スズから選ばれる1種以上が好ましい。
Examples of transparent or translucent electrodes include conductive metal oxide films and translucent metal thin films. Specific examples of the transparent or translucent electrode material include, for example, indium oxide, zinc oxide, tin oxide, and a complex thereof (eg, indium tin oxide (ITO), indium zinc oxide), These include NESA, gold, platinum, silver and copper. Among them, as the transparent or translucent electrode material, one or more selected from ITO, indium zinc oxide and tin oxide are preferable.
電極の作製方法としては、真空蒸着法、スパッタリング法、イオンプレーティング法、メッキ法等が挙げられる。
Examples of the method for producing the electrode include a vacuum evaporation method, a sputtering method, an ion plating method, and a plating method.
透明又は半透明の電極として、ポリアニリン及びその誘導体、ポリチオフェン及びその誘導体等の有機化合物から構成される透明導電膜を用いてもよい。
A transparent conductive film composed of an organic compound such as polyaniline and a derivative thereof and polythiophene and a derivative thereof may be used as the transparent or translucent electrode.
第1の電極及び第2の電極のうち、一方の電極は光透過性の低い電極であってもよい。光透過性の低い電極の材料としては、例えば、金属、導電性高分子が挙げられる。電極材料の具体例としては、リチウム、ナトリウム、カリウム、ルビジウム、セシウム、マグネシウム、カルシウム、ストロンチウム、バリウム、アルミニウム、スカンジウム、バナジウム、亜鉛、イットリウム、インジウム、セリウム、サマリウム、ユーロピウム、テルビウム、イッテルビウム等の金属;及びそれらのうち2つ以上の合金;1種以上の前記金属と、金、銀、白金、銅、マンガン、チタン、コバルト、ニッケル、タングステン及び錫からなる群から選ばれる1種以上の金属との合金;グラファイト;グラファイト層間化合物;ポリアニリン及びその誘導体;ポリチオフェン及びその誘導体が挙げられる。
One of the first electrode and the second electrode may be an electrode with low light transmittance. Examples of the material of the low light transmitting electrode include metals and conductive polymers. Specific examples of the electrode material include metals such as lithium, sodium, potassium, rubidium, cesium, magnesium, calcium, strontium, barium, aluminum, scandium, vanadium, zinc, yttrium, indium, cerium, samarium, europium, terbium, ytterbium and the like And alloys of two or more of them; one or more of the above metals and one or more metals selected from the group consisting of gold, silver, platinum, copper, manganese, titanium, cobalt, nickel, tungsten and tin Graphite; graphite intercalation compounds; polyaniline and its derivatives; polythiophene and its derivatives.
さらに具体的には、合金としては、例えば、マグネシウム-銀合金、マグネシウム-インジウム合金、マグネシウム-アルミニウム合金、インジウム-銀合金、リチウム-アルミニウム合金、リチウム-マグネシウム合金、リチウム-インジウム合金、及びカルシウム-アルミニウム合金が挙げられる。
More specifically, as the alloy, for example, magnesium-silver alloy, magnesium-indium alloy, magnesium-aluminium alloy, indium-silver alloy, lithium-aluminium alloy, lithium-magnesium alloy, lithium-indium alloy, calcium- Aluminum alloy is mentioned.
[任意の要素]
光電変換素子は、第1の電極、活性層、及び第2の電極以外の要素を含んでいてもよい。任意の要素としては、例えば、基板、正孔輸送層、電子輸送層、及び封止層が挙げられる。 [Any element]
The photoelectric conversion element may include elements other than the first electrode, the active layer, and the second electrode. Optional elements include, for example, a substrate, a hole transport layer, an electron transport layer, and a sealing layer.
光電変換素子は、第1の電極、活性層、及び第2の電極以外の要素を含んでいてもよい。任意の要素としては、例えば、基板、正孔輸送層、電子輸送層、及び封止層が挙げられる。 [Any element]
The photoelectric conversion element may include elements other than the first electrode, the active layer, and the second electrode. Optional elements include, for example, a substrate, a hole transport layer, an electron transport layer, and a sealing layer.
(基板)
光電変換素子は、通常、基板(支持基板)上に形成される。基板は、電極を形成し、有機物の層を形成する際に化学的に変化しない材料で形成されていることが好ましい。基板の材料の例としては、ガラス、プラスチック、高分子フィルム、及びシリコンが挙げられる。 (substrate)
The photoelectric conversion element is usually formed on a substrate (supporting substrate). The substrate is preferably formed of a material that does not change chemically when forming the electrode and forming the organic layer. Examples of substrate materials include glass, plastic, polymer films, and silicon.
光電変換素子は、通常、基板(支持基板)上に形成される。基板は、電極を形成し、有機物の層を形成する際に化学的に変化しない材料で形成されていることが好ましい。基板の材料の例としては、ガラス、プラスチック、高分子フィルム、及びシリコンが挙げられる。 (substrate)
The photoelectric conversion element is usually formed on a substrate (supporting substrate). The substrate is preferably formed of a material that does not change chemically when forming the electrode and forming the organic layer. Examples of substrate materials include glass, plastic, polymer films, and silicon.
基板は、光透過性が低くてもよいが、光電変換素子において、例えば基板から光を取り込む場合、基板は、透明又は半透明であることが好ましい。光透過性の低い基板上に光電変換素子を作製する場合には、基板に近い方の電極側から光を取り込むことができないため、基板から遠い方の電極には、透明又は半透明の電極を用いることが好ましい。基板から遠い方の電極に、透明又は半透明の電極を用いることにより、光透過性の低い基板を用いたとしても、基板から遠い方の電極から光を取り込むことができる。
The substrate may have low light transmittance, but in the photoelectric conversion element, for example, when taking in light from the substrate, the substrate is preferably transparent or translucent. In the case of manufacturing a photoelectric conversion element on a substrate with low light transmittance, light can not be taken in from the electrode side closer to the substrate, so a transparent or semitransparent electrode is used for the electrode far from the substrate. It is preferred to use. By using a transparent or translucent electrode for the electrode far from the substrate, light can be taken in from the electrode far from the substrate, even if a substrate with low light transmittance is used.
(正孔輸送層)
光電変換素子は、陽極である電極と活性層との間に、正孔輸送層が設けられていてもよい。正孔輸送層は、活性層から電極へ正孔を輸送する機能を有する。 (Hole transport layer)
In the photoelectric conversion element, a hole transport layer may be provided between an electrode which is an anode and an active layer. The hole transport layer has a function of transporting holes from the active layer to the electrode.
光電変換素子は、陽極である電極と活性層との間に、正孔輸送層が設けられていてもよい。正孔輸送層は、活性層から電極へ正孔を輸送する機能を有する。 (Hole transport layer)
In the photoelectric conversion element, a hole transport layer may be provided between an electrode which is an anode and an active layer. The hole transport layer has a function of transporting holes from the active layer to the electrode.
電極に接して設けられる正孔輸送層を、特に正孔注入層という場合がある。電極に接して設けられる正孔輸送層(正孔注入層)は、電極への正孔の注入を促進する機能を有する。正孔輸送層(正孔注入層)は、活性層に接していてもよい。
The hole transport layer provided in contact with the electrode may be particularly referred to as a hole injection layer. The hole transport layer (hole injection layer) provided in contact with the electrode has a function of promoting the injection of holes into the electrode. The hole transport layer (hole injection layer) may be in contact with the active layer.
正孔輸送層は、正孔輸送性材料を含む。正孔輸送性材料の例としては、ポリチオフェン及びその誘導体、芳香族アミン化合物、芳香族アミン残基を有する構成単位を含む高分子化合物、CuSCN、CuI、NiO、及び酸化モリブデン(MoOx)が挙げられる。
The hole transport layer contains a hole transport material. Examples of the hole transporting material include polythiophene and derivatives thereof, an aromatic amine compound, a polymer compound containing a constitutional unit having an aromatic amine residue, CuSCN, CuI, NiO, and molybdenum oxide (MoOx). .
(電子輸送層)
光電変換素子は、陰極である電極と活性層との間に、電子輸送層が設けられていてもよい。電子輸送層は、活性層から電極へ電子を輸送する機能を有する。電子輸送層は、電極に接していてもよい。電子輸送層は活性層に接していてもよい。 (Electron transport layer)
In the photoelectric conversion element, an electron transport layer may be provided between an electrode which is a cathode and an active layer. The electron transport layer has a function of transporting electrons from the active layer to the electrode. The electron transport layer may be in contact with the electrode. The electron transport layer may be in contact with the active layer.
光電変換素子は、陰極である電極と活性層との間に、電子輸送層が設けられていてもよい。電子輸送層は、活性層から電極へ電子を輸送する機能を有する。電子輸送層は、電極に接していてもよい。電子輸送層は活性層に接していてもよい。 (Electron transport layer)
In the photoelectric conversion element, an electron transport layer may be provided between an electrode which is a cathode and an active layer. The electron transport layer has a function of transporting electrons from the active layer to the electrode. The electron transport layer may be in contact with the electrode. The electron transport layer may be in contact with the active layer.
電子輸送層は、電子輸送性材料を含む。電子輸送性材料の例としては、酸化亜鉛のナノ粒子、ガリウムドープ酸化亜鉛のナノ粒子、アルミニウムドープ酸化亜鉛のナノ粒子、ポリエチレンイミン、ポリエチレンイミンエトキシレイテッド、及びPFN-P2が挙げられる。
The electron transport layer contains an electron transport material. Examples of electron transporting materials include zinc oxide nanoparticles, gallium-doped zinc oxide nanoparticles, aluminum-doped zinc oxide nanoparticles, polyethyleneimine, polyethyleneimine ethoxylated, and PFN-P2.
(封止層)
光電変換素子は、封止層を含んでいてもよい。封止層は、例えば、基板から遠い方の電極側に設けられる。封止層は、水分を遮断する性質(水蒸気バリア性)又は酸素を遮断する性質(酸素バリア性)を有する材料により形成することができる。 (Sealing layer)
The photoelectric conversion element may include a sealing layer. The sealing layer is provided, for example, on the electrode side far from the substrate. The sealing layer can be formed of a material having a moisture blocking property (water vapor barrier property) or an oxygen blocking property (oxygen barrier property).
光電変換素子は、封止層を含んでいてもよい。封止層は、例えば、基板から遠い方の電極側に設けられる。封止層は、水分を遮断する性質(水蒸気バリア性)又は酸素を遮断する性質(酸素バリア性)を有する材料により形成することができる。 (Sealing layer)
The photoelectric conversion element may include a sealing layer. The sealing layer is provided, for example, on the electrode side far from the substrate. The sealing layer can be formed of a material having a moisture blocking property (water vapor barrier property) or an oxygen blocking property (oxygen barrier property).
以下に、本発明の光電変換素子の一実施形態について、図を用いて説明する。
図1は、本発明の光電変換素子の一実施形態を示す模式図である。
本実施形態の光電変換素子10は、支持基板11の上に設けられており、陽極としての第1の電極12と、正孔輸送層13と、活性層14と、電子輸送層15と、第2の電極16とをこの順で含む。支持基板10が有する2つの主面のうちの1つの面に接するように、第1の電極12が設けられている。第1の電極12に接するように、正孔輸送層13が設けられている。正孔輸送層13に接するように、活性層14が設けられている。活性層14に接するように、電子輸送層15が設けられている。電子輸送層15に接するように、陰極としての第2の電極16が設けられている。支持基板11を構成する材料及び光電変換素子10が有する各要素(第1の電極12、正孔輸送層13、活性層14、電子輸送層15、第2の電極16)を構成する材料は、上記それぞれの要素を構成する材料として例に挙げた材料であり得る。 Below, one Embodiment of the photoelectric conversion element of this invention is described using figures.
FIG. 1 is a schematic view showing an embodiment of the photoelectric conversion element of the present invention.
Thephotoelectric conversion element 10 of the present embodiment is provided on the support substrate 11 and includes the first electrode 12 as an anode, the hole transport layer 13, the active layer 14, the electron transport layer 15, And the two electrodes 16 in this order. The first electrode 12 is provided to be in contact with one of two main surfaces of the support substrate 10. A hole transport layer 13 is provided in contact with the first electrode 12. An active layer 14 is provided in contact with the hole transport layer 13. An electron transport layer 15 is provided in contact with the active layer 14. A second electrode 16 as a cathode is provided in contact with the electron transport layer 15. The material constituting the supporting substrate 11 and the material constituting each element (the first electrode 12, the hole transport layer 13, the active layer 14, the electron transport layer 15, the second electrode 16) included in the photoelectric conversion element 10 are as follows. The material mentioned as an example as a material which constitutes each above-mentioned element may be sufficient.
図1は、本発明の光電変換素子の一実施形態を示す模式図である。
本実施形態の光電変換素子10は、支持基板11の上に設けられており、陽極としての第1の電極12と、正孔輸送層13と、活性層14と、電子輸送層15と、第2の電極16とをこの順で含む。支持基板10が有する2つの主面のうちの1つの面に接するように、第1の電極12が設けられている。第1の電極12に接するように、正孔輸送層13が設けられている。正孔輸送層13に接するように、活性層14が設けられている。活性層14に接するように、電子輸送層15が設けられている。電子輸送層15に接するように、陰極としての第2の電極16が設けられている。支持基板11を構成する材料及び光電変換素子10が有する各要素(第1の電極12、正孔輸送層13、活性層14、電子輸送層15、第2の電極16)を構成する材料は、上記それぞれの要素を構成する材料として例に挙げた材料であり得る。 Below, one Embodiment of the photoelectric conversion element of this invention is described using figures.
FIG. 1 is a schematic view showing an embodiment of the photoelectric conversion element of the present invention.
The
本発明の光電変換素子は、任意の方法により製造することができる。本発明の光電変換素子は、例えば、上記項目[4.インクの固化膜の製造方法]で説明した、インクの固化膜を製造する方法を含む方法により製造することができる。具体的には、例えば、本発明の光電変換素子は、上記工程(i)及び工程(ii)を含む方法により製造することができる。
The photoelectric conversion element of the present invention can be produced by any method. The photoelectric conversion element of the present invention is, for example, the above item [4. Method of Producing Solidified Film of Ink] The method can be produced by the method including the method of producing a solidified film of ink described in the above. Specifically, for example, the photoelectric conversion element of the present invention can be manufactured by a method including the above-mentioned step (i) and step (ii).
[光電変換素子の用途]
本発明の光電変換素子は、太陽光等の光が照射されることにより、電極間に光起電力が発生し、太陽電池として動作させることができる。また太陽電池を複数集積することにより薄膜太陽電池モジュールとして用いることもできる。 [Use of photoelectric conversion element]
The photoelectric conversion element of the present invention generates photovoltaic power between electrodes by being irradiated with light such as sunlight, and can be operated as a solar cell. Further, by integrating a plurality of solar cells, it can also be used as a thin film solar cell module.
本発明の光電変換素子は、太陽光等の光が照射されることにより、電極間に光起電力が発生し、太陽電池として動作させることができる。また太陽電池を複数集積することにより薄膜太陽電池モジュールとして用いることもできる。 [Use of photoelectric conversion element]
The photoelectric conversion element of the present invention generates photovoltaic power between electrodes by being irradiated with light such as sunlight, and can be operated as a solar cell. Further, by integrating a plurality of solar cells, it can also be used as a thin film solar cell module.
また、本発明の光電変換素子は、電極間に電圧を印加した状態で、透明又は半透明の電極に光を照射することにより、光電流を流すことができ、光センサー(光検出素子)として動作させることができる。光センサーを複数集積することによりイメージセンサーとして用いることもできる。
Further, the photoelectric conversion element of the present invention can flow a photocurrent by irradiating light to a transparent or semi-transparent electrode in a state where a voltage is applied between the electrodes, and as a light sensor (light detection element) It can be operated. It can also be used as an image sensor by integrating a plurality of light sensors.
(光電変換素子の適用例)
既に説明した本発明の実施形態にかかる光電変換素子は、ワークステーション、パーソナルコンピュータ、携帯情報端末、入退室管理システム、デジタルカメラ、および医療機器などの種々の電子装置が備える検出部に好適に適用することができる。 (Application example of photoelectric conversion element)
The photoelectric conversion device according to the embodiment of the present invention described above is suitably applied to detection units included in various electronic devices such as workstations, personal computers, portable information terminals, room access control systems, digital cameras, and medical devices. can do.
既に説明した本発明の実施形態にかかる光電変換素子は、ワークステーション、パーソナルコンピュータ、携帯情報端末、入退室管理システム、デジタルカメラ、および医療機器などの種々の電子装置が備える検出部に好適に適用することができる。 (Application example of photoelectric conversion element)
The photoelectric conversion device according to the embodiment of the present invention described above is suitably applied to detection units included in various electronic devices such as workstations, personal computers, portable information terminals, room access control systems, digital cameras, and medical devices. can do.
本発明の光電変換素子(光検出素子)は、上記例示の電子装置が備える、例えば、X線撮像装置およびCMOSイメージセンサーなどの固体撮像装置用のイメージ検出部(イメージセンサー)、指紋検出部、顔検出部、静脈検出部および虹彩検出部などの生体の一部分の所定の特徴を検出する検出部、パルスオキシメーターなどの光学バイオセンサーの検出部などに好適に適用することができる。
The photoelectric conversion element (light detection element) of the present invention is included in the electronic device illustrated above, for example, an image detection unit (image sensor) for a solid-state imaging device such as an X-ray imaging device and a CMOS image sensor, a fingerprint detection unit The present invention can be suitably applied to a detection unit that detects predetermined features of a part of a living body such as a face detection unit, a vein detection unit, and an iris detection unit, and a detection unit of an optical biosensor such as a pulse oximeter.
以下、本発明の実施形態にかかる光電変換素子が好適に適用され得る検出部のうち、固体撮像装置用のイメージ検出部、生体情報認証装置(指紋認証装置)のための指紋検出部の構成例について、図面を参照して説明する。
Hereinafter, among detection units to which the photoelectric conversion element according to the embodiment of the present invention can be suitably applied, an example configuration of an image detection unit for a solid-state imaging device and a fingerprint detection unit for a biometric information authentication device (fingerprint authentication device) Will be described with reference to the drawings.
(イメージ検出部)
図2は、固体撮像装置用のイメージ検出部の構成例を模式的に示す図である。 (Image detection unit)
FIG. 2 is a view schematically showing a configuration example of an image detection unit for a solid-state imaging device.
図2は、固体撮像装置用のイメージ検出部の構成例を模式的に示す図である。 (Image detection unit)
FIG. 2 is a view schematically showing a configuration example of an image detection unit for a solid-state imaging device.
イメージ検出部1は、CMOSトランジスタ基板20と、CMOSトランジスタ基板20を覆うように設けられている層間絶縁膜30と、層間絶縁膜30上に設けられている、本発明の実施形態にかかる光電変換素子10と、層間絶縁膜30を貫通するように設けられており、CMOSトランジスタ基板20と光電変換素子10とを電気的に接続する層間配線部32と、光電変換素子10を覆うように設けられている封止層40と、封止層上に設けられているカラーフィルター50とを備えている。
The image detection unit 1 includes a CMOS transistor substrate 20, an interlayer insulating film 30 provided so as to cover the CMOS transistor substrate 20, and photoelectric conversion according to an embodiment of the present invention provided on the interlayer insulating film 30. It is provided so as to penetrate element 10 and interlayer insulating film 30, and is provided so as to cover photoelectric conversion element 10 and interlayer wiring portion 32 electrically connecting CMOS transistor substrate 20 and photoelectric conversion element 10. And a color filter 50 provided on the sealing layer.
CMOSトランジスタ基板20は、従来公知の任意好適な構成を設計に応じた態様で備えている。
The CMOS transistor substrate 20 has any suitable configuration known in the art according to the design.
CMOSトランジスタ基板20は、基板の厚さ内に形成されたトランジスタ、コンデンサなどを含み、種々の機能を実現するためのCMOSトランジスタ回路(MOSトランジスタ回路)などの機能素子を備えている。
The CMOS transistor substrate 20 includes transistors, capacitors and the like formed within the thickness of the substrate, and is equipped with functional elements such as a CMOS transistor circuit (MOS transistor circuit) for realizing various functions.
機能素子としては、例えば、フローティングディフュージョン、リセットトランジスタ、出力トランジスタ、選択トランジスタが挙げられる。
このような機能素子、配線などにより、CMOSトランジスタ基板20には、信号読み出し回路などが、作り込まれている。 Examples of the functional element include a floating diffusion, a reset transistor, an output transistor, and a selection transistor.
A signal readout circuit or the like is built in theCMOS transistor substrate 20 by such functional elements, wirings, and the like.
このような機能素子、配線などにより、CMOSトランジスタ基板20には、信号読み出し回路などが、作り込まれている。 Examples of the functional element include a floating diffusion, a reset transistor, an output transistor, and a selection transistor.
A signal readout circuit or the like is built in the
層間絶縁膜30は、例えば酸化シリコン、絶縁性樹脂などの従来公知の任意好適な絶縁性材料により構成することができる。層間配線部32は、例えば、銅、タングステンなどの従来公知の任意好適な導電性材料(配線材料)により構成することができる。層間配線部32は、例えば、配線層の形成と同時に形成されるホール内配線であっても、配線層とは別途形成される埋込みプラグであってもよい。
The interlayer insulating film 30 can be made of, for example, any conventionally known suitable insulating material such as silicon oxide or insulating resin. The interlayer wiring portion 32 can be made of, for example, any conventionally known suitable conductive material (wiring material) such as copper, tungsten or the like. The interlayer wiring section 32 may be, for example, an in-hole wiring formed simultaneously with the formation of the wiring layer, or may be a buried plug formed separately from the wiring layer.
封止層40は、光電変換素子10を機能的に劣化させてしまうおそれのある酸素、水などの有害物質の浸透を防止または抑制できることを条件として、従来公知の任意好適な材料により構成することができる。
The sealing layer 40 is made of any conventionally known suitable material, on the condition that penetration of harmful substances such as oxygen and water which may cause the photoelectric conversion element 10 to be functionally deteriorated can be prevented or suppressed. Can.
カラーフィルター50としては、従来公知の任意好適な材料により構成され、かつイメージ検出部1の設計に対応した例えば原色カラーフィルターを用いることができる。また、カラーフィルター50としては、原色カラーフィルターと比較して、厚さを薄くすることができる補色カラーフィルターを用いることもできる。補色カラーフィルターとしては、例えば(イエロー、シアン、マゼンタ)の3種類、(イエロー、シアン、透明)の3種類、(イエロー、透明、マゼンタ)の3種類、および(透明、シアン、マゼンタ)の3種類が組み合わされたカラーフィルターを用いることができる。これらは、カラー画像データを生成できることを条件として、光電変換素子10およびCMOSトランジスタ基板20の設計に対応した任意好適な配置とすることができる。
As the color filter 50, for example, a primary color filter that is made of any suitable material known in the related art and corresponds to the design of the image detection unit 1 can be used. Further, as the color filter 50, a complementary color filter which can be thinner than the primary color filter can be used. As complementary color filters, for example, 3 types of (yellow, cyan, magenta), 3 types of (yellow, cyan, transparent), 3 types of (yellow, transparent, magenta), and 3 of (transparent, cyan, magenta) Color filters of different types can be used. These can be arranged in any suitable manner corresponding to the design of the photoelectric conversion element 10 and the CMOS transistor substrate 20, provided that color image data can be generated.
カラーフィルター50を介して光電変換素子10が受光した光は、光電変換素子10によって、受光量に応じた電気信号に変換され、電極を介して、光電変換素子10外に受光信号、すなわち撮像対象に対応する電気信号として出力される。
The light received by the photoelectric conversion element 10 through the color filter 50 is converted by the photoelectric conversion element 10 into an electrical signal according to the amount of light received, and the light reception signal outside the photoelectric conversion element 10 through the electrode, ie, an imaging target Is output as an electrical signal corresponding to
次いで、光電変換素子10から出力された受光信号は、層間配線部32を介して、CMOSトランジスタ基板20に入力され、CMOSトランジスタ基板20に作り込まれた信号読み出し回路により読み出され、図示しないさらなる任意好適な従来公知の機能部によって信号処理されることにより、撮像対象に基づく画像情報が生成される。
Next, the light reception signal output from the photoelectric conversion element 10 is input to the CMOS transistor substrate 20 through the interlayer wiring portion 32, and is read by a signal readout circuit built in the CMOS transistor substrate 20, and further not shown. Signal processing is performed by any suitable conventional known functional unit to generate image information based on an imaging target.
(指紋検出部)
図3は、表示装置に一体的に構成される指紋検出部の構成例を模式的に示す図である。 (Fingerprint detection unit)
FIG. 3 is a view schematically showing a configuration example of a fingerprint detection unit configured integrally with the display device.
図3は、表示装置に一体的に構成される指紋検出部の構成例を模式的に示す図である。 (Fingerprint detection unit)
FIG. 3 is a view schematically showing a configuration example of a fingerprint detection unit configured integrally with the display device.
携帯情報端末の表示装置2は、本発明の実施形態にかかる光電変換素子10を主たる構成要素として含む指紋検出部100と、当該指紋検出部100上に設けられ、所定の画像を表示する表示パネル部200とを備えている。
The display device 2 of the portable information terminal includes a fingerprint detection unit 100 including the photoelectric conversion element 10 according to the embodiment of the present invention as a main component, and a display panel provided on the fingerprint detection unit 100 and displaying a predetermined image. And a unit 200.
この構成例では、表示パネル部200の表示領域200aと略一致する領域に指紋検出部100が設けられている。換言すると、指紋検出部100の上方に、表示パネル部200が一体的に積層されている。
In this configuration example, the fingerprint detection unit 100 is provided in an area substantially corresponding to the display area 200 a of the display panel unit 200. In other words, the display panel unit 200 is integrally stacked above the fingerprint detection unit 100.
表示領域200aのうちの一部の領域においてのみ指紋検出を行う場合には、当該一部の領域のみに対応させて指紋検出部100を設ければよい。
In the case of performing fingerprint detection only in a part of the display area 200a, the fingerprint detection unit 100 may be provided in correspondence with only the part of the display area 200a.
指紋検出部100は、本発明の実施形態にかかる光電変換素子10を本質的な機能を奏する機能部として含む。指紋検出部100は、図示されていない保護フィルム(protection film)、支持基板、封止基板、封止部材、バリアフィルム、バンドパスフィルター、赤外線カットフィルムなどの任意好適な従来公知の部材を所望の特性が得られるような設計に対応した態様で備え得る。指紋検出部100には、既に説明したイメージ検出部の構成を採用することもできる。
The fingerprint detection unit 100 includes the photoelectric conversion element 10 according to the embodiment of the present invention as a functional unit that performs essential functions. The fingerprint detection unit 100 may be any desired conventionally known member such as a protection film (protection film), a support substrate, a sealing substrate, a sealing member, a barrier film, a band pass filter, an infrared cut film, etc. not shown. It can be provided in a manner corresponding to the design to obtain the characteristics. The fingerprint detection unit 100 may adopt the configuration of the image detection unit described above.
光電変換素子10は、表示領域200a内において、任意の態様で含まれ得る。例えば、複数の光電変換素子10が、マトリクス状に配置されていてもよい。
The photoelectric conversion element 10 can be included in any mode in the display area 200a. For example, a plurality of photoelectric conversion elements 10 may be arranged in a matrix.
光電変換素子10は、既に説明したとおり、支持基板11または封止基板に設けられており、支持基板11には、例えばマトリクス状に電極(陽極または陰極)が設けられている。
As described above, the photoelectric conversion element 10 is provided on the support substrate 11 or the sealing substrate, and the support substrate 11 is provided with an electrode (anode or cathode) in a matrix, for example.
光電変換素子10が受光した光は、光電変換素子10によって、受光量に応じた電気信号に変換され、電極を介して、光電変換素子10外に受光信号、すなわち撮像された指紋に対応する電気信号として出力される。
The light received by the photoelectric conversion element 10 is converted by the photoelectric conversion element 10 into an electric signal according to the amount of light received, and the light reception signal outside the photoelectric conversion element 10 through the electrodes, that is, the electric corresponding to the captured fingerprint It is output as a signal.
表示パネル部200は、この構成例では、タッチセンサーパネルを含む有機エレクトロルミネッセンス表示パネル(有機EL表示パネル)として構成されている。表示パネル部200は、例えば有機EL表示パネルの代わりに、バックライトなどの光源を含む液晶表示パネルなどの任意好適な従来公知の構成を有する表示パネルにより構成されていてもよい。
The display panel unit 200 is configured as an organic electroluminescence display panel (organic EL display panel) including a touch sensor panel in this configuration example. The display panel unit 200 may be configured of, for example, a display panel having an arbitrary suitable conventionally known configuration such as a liquid crystal display panel including a light source such as a backlight instead of the organic EL display panel.
表示パネル部200は、既に説明した指紋検出部100上に設けられている。表示パネル部200は、有機エレクトロルミネッセンス素子(有機EL素子)220を本質的な機能を奏する機能部として含む。表示パネル部200は、さらに任意好適な従来公知のガラス基板といった基板(支持基板210または封止基板240)、封止部材、バリアフィルム、円偏光板などの偏光板、タッチセンサーパネル230などの任意好適な従来公知の部材を所望の特性に対応した態様で備え得る。
The display panel unit 200 is provided on the fingerprint detection unit 100 described above. The display panel unit 200 includes an organic electroluminescent element (organic EL element) 220 as a functional part that performs essential functions. The display panel unit 200 further includes any substrate such as a conventionally known glass substrate (support substrate 210 or sealing substrate 240), sealing member, barrier film, polarizing plate such as circular polarizing plate, touch sensor panel 230, etc. Suitable previously known components can be provided in a manner corresponding to the desired properties.
以上説明した構成例において、有機EL素子220は、表示領域200aにおける画素の光源として用いられるとともに、指紋検出部100における指紋の撮像のための光源としても用いられる。
In the configuration example described above, the organic EL element 220 is used not only as a light source for pixels in the display area 200 a but also as a light source for capturing a fingerprint in the fingerprint detection unit 100.
ここで、指紋検出部100の動作について簡単に説明する。
指紋認証の実行時には、表示パネル部200の有機EL素子220から放射される光を用いて指紋検出部100が指紋を検出する。具体的には、有機EL素子220から放射された光は、有機EL素子220と指紋検出部100の光電変換素子10との間に存在する構成要素を透過して、表示領域200a内である表示パネル部200の表面に接するように載置された手指の指先の皮膚(指表面)によって反射される。指表面によって反射された光のうちの少なくとも一部は、間に存在する構成要素を透過して光電変換素子10によって受光され、光電変換素子10の受光量に応じた電気信号に変換される。そして、変換された電気信号から、指表面の指紋についての画像情報が構成される。 Here, the operation of thefingerprint detection unit 100 will be briefly described.
When fingerprint authentication is performed, thefingerprint detection unit 100 detects a fingerprint using light emitted from the organic EL element 220 of the display panel unit 200. Specifically, light emitted from the organic EL element 220 is transmitted through components existing between the organic EL element 220 and the photoelectric conversion element 10 of the fingerprint detection unit 100, and the display is in the display region 200a. The light is reflected by the skin (finger surface) of the fingertip of the finger placed in contact with the surface of the panel unit 200. At least a part of the light reflected by the finger surface is transmitted through the component present between them, received by the photoelectric conversion element 10, and converted into an electrical signal according to the amount of light received by the photoelectric conversion element 10. Then, from the converted electrical signal, image information on the fingerprint on the finger surface is constructed.
指紋認証の実行時には、表示パネル部200の有機EL素子220から放射される光を用いて指紋検出部100が指紋を検出する。具体的には、有機EL素子220から放射された光は、有機EL素子220と指紋検出部100の光電変換素子10との間に存在する構成要素を透過して、表示領域200a内である表示パネル部200の表面に接するように載置された手指の指先の皮膚(指表面)によって反射される。指表面によって反射された光のうちの少なくとも一部は、間に存在する構成要素を透過して光電変換素子10によって受光され、光電変換素子10の受光量に応じた電気信号に変換される。そして、変換された電気信号から、指表面の指紋についての画像情報が構成される。 Here, the operation of the
When fingerprint authentication is performed, the
表示装置2を備える携帯情報端末は、従来公知の任意好適なステップにより、得られた画像情報と、予め記録されていた指紋認証用の指紋データとを比較して、指紋認証を行う。
The portable information terminal provided with the display device 2 performs fingerprint authentication by comparing the obtained image information with fingerprint data for fingerprint authentication recorded in advance by any conventionally known and suitable steps.
[6.光電変換素子の製造方法]
本発明の光電変換素子の製造方法は、第1の電極と、p型半導体材料及びn型半導体材料を含む活性層と、第2の電極とをこの順で含む光電変換素子の製造方法であって、前記活性層を形成する工程を含み、前記活性層を形成する工程が、上記インクを塗布対象に塗布して塗膜を得る工程(i)、及び得られた塗膜から溶媒を除去する工程(ii)を含む。 [6. Method of manufacturing photoelectric conversion element]
The method for producing a photoelectric conversion element of the present invention is a method for producing a photoelectric conversion element comprising, in order, a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode. And the step of forming the active layer, wherein the step of forming the active layer is a step (i) of applying the ink to a target to be coated to obtain a coating, and removing the solvent from the coating obtained Step (ii) is included.
本発明の光電変換素子の製造方法は、第1の電極と、p型半導体材料及びn型半導体材料を含む活性層と、第2の電極とをこの順で含む光電変換素子の製造方法であって、前記活性層を形成する工程を含み、前記活性層を形成する工程が、上記インクを塗布対象に塗布して塗膜を得る工程(i)、及び得られた塗膜から溶媒を除去する工程(ii)を含む。 [6. Method of manufacturing photoelectric conversion element]
The method for producing a photoelectric conversion element of the present invention is a method for producing a photoelectric conversion element comprising, in order, a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode. And the step of forming the active layer, wherein the step of forming the active layer is a step (i) of applying the ink to a target to be coated to obtain a coating, and removing the solvent from the coating obtained Step (ii) is included.
本発明の光電変換素子の製造方法において、活性層を形成する工程は、好ましくは工程(i)及び工程(ii)をこの順で含む。
In the method for producing a photoelectric conversion element of the present invention, the step of forming an active layer preferably includes step (i) and step (ii) in this order.
p型半導体材料、n型半導体材料、及びインクの例及び好ましい例については、上記項目[2.インク]で説明した例と同様である。
Regarding examples and preferable examples of the p-type semiconductor material, the n-type semiconductor material, and the ink, the items [2. The same as the example described in [Ink]
インクを塗布対象に塗布する方法としては、任意の塗布法を用いることができる。好ましい塗布法、より好ましい塗布法、更に好ましい塗布法としては、上記項目[4.インクの固化膜の製造方法][工程(i)]において記載された方法と同様の方法が挙げられる。
Any application method can be used as a method of applying the ink to the application target. As a preferable coating method, a more preferable coating method, and a further preferable coating method, the items [4. Method of Producing Solidified Film of Ink] The same method as the method described in [Step (i)] may be mentioned.
得られた塗膜から、溶媒を除去する方法としては、任意の方法を用いることができる。溶媒を除去する方法の例としては、上記項目[4.インクの固化膜の製造方法][工程(ii)]において記載された方法と同様の方法が挙げられる。
Arbitrary methods can be used as a method of removing a solvent from the obtained coating film. As an example of the method of removing the solvent, the above item [4. Method of Producing Solidified Film of Ink] The same method as the method described in [Step (ii)] may be mentioned.
活性層を形成する工程は、上記工程(ii)及び工程(ii)以外に、任意の工程を含んでいてもよい。
The step of forming the active layer may include an optional step other than the above step (ii) and step (ii).
インクは、活性層を形成すべき層の上に塗布される。したがって、インクの塗布対象は、製造される光電変換素子の層構成及び積層の順序によって異なる。例えば、光電変換素子が、基板/陽極/正孔輸送層/活性層/電子輸送層/陰極の層構成を有しており、左に記載された要素の順で積層される場合、インクの塗布対象は、通常正孔輸送層である。また、例えば、光電変換素子が、基板/陰極/電子輸送層/活性層/正孔輸送層/陽極の層構成を有しており、左に記載された要素の順で積層される場合、インクの塗布対象は通常電子輸送層である。
The ink is applied over the layer to form the active layer. Therefore, the application object of the ink differs depending on the layer configuration of the photoelectric conversion element to be manufactured and the order of lamination. For example, when the photoelectric conversion element has a layer configuration of substrate / anode / hole transport layer / active layer / electron transport layer / cathode and is laminated in the order of the elements described on the left, the application of the ink The subject is usually a hole transport layer. Also, for example, when the photoelectric conversion element has a layer configuration of substrate / cathode / electron transport layer / active layer / hole transport layer / anode, and is stacked in the order of the elements described on the left, the ink The object of application is usually the electron transport layer.
一実施形態である光電変換素子の製造方法は、活性層を複数有する光電変換素子を製造する方法であってもよく、工程(i)及び工程(ii)が複数回繰り返される方法であってもよい。
The method of manufacturing a photoelectric conversion device according to an embodiment may be a method of manufacturing a photoelectric conversion device having a plurality of active layers, and even if step (i) and step (ii) are repeated a plurality of times. Good.
本発明の光電変換素子の製造方法は、光電変換素子のEQEを向上させることができる。特に、光電変換素子に逆バイアスの電圧を印加したときのEQEを向上させることができる。したがって、本発明の光電変換素子の製造方法は、光検出素子の製造方法として好適である。
The method of manufacturing a photoelectric conversion element of the present invention can improve the EQE of the photoelectric conversion element. In particular, EQE can be improved when a reverse bias voltage is applied to the photoelectric conversion element. Therefore, the method for producing a photoelectric conversion element of the present invention is suitable as a method for producing a light detection element.
以下、本発明を更に詳細に説明するために実施例を示す。本発明は下記の実施例に限定されない。
The following examples are provided to further illustrate the present invention. The invention is not limited to the following examples.
[評価方法]
(外部量子効率(EQE)の測定方法)
光電変換素子に3Vの逆バイアス電圧を印加した状態で、ソーラーシミュレーター(分光計器製、商品名:CEP-2000型)を用いて、300nmから1200nmの波長範囲において10nmごとに一定の光子数(1.0×1016)の光を光電変換素子に照射し、発生する電流の電流値を測定し、公知の手法により波長300nmから1200nmにおけるEQEスペクトルを求めた。 [Evaluation method]
(Method of measuring external quantum efficiency (EQE))
While applying a reverse bias voltage of 3 V to the photoelectric conversion element, using a solar simulator (trade name: CEP-2000 type), a fixed number of photons (1 per 10 nm) in the wavelength range of 300 nm to 1200 nm the light .0 × 10 16) is irradiated to the photoelectric conversion element, to measure the current value of the current generated to determine the EQE spectrum at 1200nm wavelength 300nm by a known method.
(外部量子効率(EQE)の測定方法)
光電変換素子に3Vの逆バイアス電圧を印加した状態で、ソーラーシミュレーター(分光計器製、商品名:CEP-2000型)を用いて、300nmから1200nmの波長範囲において10nmごとに一定の光子数(1.0×1016)の光を光電変換素子に照射し、発生する電流の電流値を測定し、公知の手法により波長300nmから1200nmにおけるEQEスペクトルを求めた。 [Evaluation method]
(Method of measuring external quantum efficiency (EQE))
While applying a reverse bias voltage of 3 V to the photoelectric conversion element, using a solar simulator (trade name: CEP-2000 type), a fixed number of photons (1 per 10 nm) in the wavelength range of 300 nm to 1200 nm the light .0 × 10 16) is irradiated to the photoelectric conversion element, to measure the current value of the current generated to determine the EQE spectrum at 1200nm wavelength 300nm by a known method.
[実施例で使用される半導体材料]
本実施例では、下表に記載したp型半導体材料及びn型半導体材料を使用する。 [Semiconductor material used in the embodiment]
In this embodiment, p-type semiconductor materials and n-type semiconductor materials described in the following table are used.
本実施例では、下表に記載したp型半導体材料及びn型半導体材料を使用する。 [Semiconductor material used in the embodiment]
In this embodiment, p-type semiconductor materials and n-type semiconductor materials described in the following table are used.
材料P-1として、WO2013/051676に記載の方法を参考に合成された材料を使用した。
材料P-2として、1-material社製、商品名:PCE10を使用する。
材料P-3として、1-material社製、商品名:PDTSTPDを使用する。
材料P-4として、Lumtec社製、商品名:PDPP3Tを使用する。
材料P-5として、特開2010-74127号公報に記載の方法を参考に合成された材料を使用する。
材料P-6として、WO2011/052709に記載の方法を参考に合成された材料を使用した。
材料N-1として、フロンティアカーボン社製、商品名:E100を使用した。
材料N-2として、アメリカンダイソース社製、商品名:ADS71BFAを使用する。 As the material P-1, a material synthesized with reference to the method described in WO2013 / 051676 was used.
As the material P-2, a product manufactured by 1-material, product name: PCE10 is used.
As a material P-3, a 1-material company make, brand name: PDTSTPD is used.
As the material P-4, Lumtec's product name: PDPP3T is used.
As the material P-5, a material synthesized with reference to the method described in JP-A-2010-74127 is used.
As the material P-6, a material synthesized using the method described in WO 2011/052709 as a reference was used.
A trade name: E100 manufactured by Frontier Carbon, Inc. was used as the material N-1.
As the material N-2, a product manufactured by American Die Source, trade name: ADS71 BFA is used.
材料P-2として、1-material社製、商品名:PCE10を使用する。
材料P-3として、1-material社製、商品名:PDTSTPDを使用する。
材料P-4として、Lumtec社製、商品名:PDPP3Tを使用する。
材料P-5として、特開2010-74127号公報に記載の方法を参考に合成された材料を使用する。
材料P-6として、WO2011/052709に記載の方法を参考に合成された材料を使用した。
材料N-1として、フロンティアカーボン社製、商品名:E100を使用した。
材料N-2として、アメリカンダイソース社製、商品名:ADS71BFAを使用する。 As the material P-1, a material synthesized with reference to the method described in WO2013 / 051676 was used.
As the material P-2, a product manufactured by 1-material, product name: PCE10 is used.
As a material P-3, a 1-material company make, brand name: PDTSTPD is used.
As the material P-4, Lumtec's product name: PDPP3T is used.
As the material P-5, a material synthesized with reference to the method described in JP-A-2010-74127 is used.
As the material P-6, a material synthesized using the method described in WO 2011/052709 as a reference was used.
A trade name: E100 manufactured by Frontier Carbon, Inc. was used as the material N-1.
As the material N-2, a product manufactured by American Die Source, trade name: ADS71 BFA is used.
本実施例で使用する溶媒及びその沸点(bp)は、下表のとおりである。
The solvents used in this example and their boiling points (bp) are as shown in the table below.
<実施例1>
[A.インクの調製]
第1の溶媒として2-メチルキノリン、第2の溶媒としてプソイドクメンを用い、第1の溶媒と第2の溶媒との重量比を10:90として混合溶媒を調製した。前記混合溶媒に、p型半導体材料として材料P-1を組成物全体重量に対し2重量%、及びn型半導体材料として材料N-1を組成物全体重量に対し3重量%を混合し、80℃で12時間撹拌を行った後、孔径5μmのPTFEフィルターにて濾過を行い、インクとしての組成物(I-1)を得た。 Example 1
[A. Preparation of ink]
A mixed solvent was prepared using 2-methylquinoline as the first solvent, pseudocumene as the second solvent, and a weight ratio of the first solvent to the second solvent of 10:90. In the mixed solvent, 2 wt% of the material P-1 as p-type semiconductor material with respect to the total weight of the composition and 3 wt% of the material N-1 as n-type semiconductor material with respect to the total weight of the composition are mixed. After stirring at 12 ° C. for 12 hours, the mixture was filtered through a PTFE filter with a pore size of 5 μm to obtain a composition (I-1) as an ink.
[A.インクの調製]
第1の溶媒として2-メチルキノリン、第2の溶媒としてプソイドクメンを用い、第1の溶媒と第2の溶媒との重量比を10:90として混合溶媒を調製した。前記混合溶媒に、p型半導体材料として材料P-1を組成物全体重量に対し2重量%、及びn型半導体材料として材料N-1を組成物全体重量に対し3重量%を混合し、80℃で12時間撹拌を行った後、孔径5μmのPTFEフィルターにて濾過を行い、インクとしての組成物(I-1)を得た。 Example 1
[A. Preparation of ink]
A mixed solvent was prepared using 2-methylquinoline as the first solvent, pseudocumene as the second solvent, and a weight ratio of the first solvent to the second solvent of 10:90. In the mixed solvent, 2 wt% of the material P-1 as p-type semiconductor material with respect to the total weight of the composition and 3 wt% of the material N-1 as n-type semiconductor material with respect to the total weight of the composition are mixed. After stirring at 12 ° C. for 12 hours, the mixture was filtered through a PTFE filter with a pore size of 5 μm to obtain a composition (I-1) as an ink.
[B.光電変換素子の作製及び評価]
スパッタ法により150nmの厚みでITO膜を形成したガラス基板を用意した。ITO膜が形成されたガラス基板に対してオゾンUV処理による表面処理を行った。 [B. Fabrication and evaluation of photoelectric conversion element]
A glass substrate on which an ITO film was formed to a thickness of 150 nm by sputtering was prepared. The glass substrate on which the ITO film was formed was subjected to surface treatment by ozone UV treatment.
スパッタ法により150nmの厚みでITO膜を形成したガラス基板を用意した。ITO膜が形成されたガラス基板に対してオゾンUV処理による表面処理を行った。 [B. Fabrication and evaluation of photoelectric conversion element]
A glass substrate on which an ITO film was formed to a thickness of 150 nm by sputtering was prepared. The glass substrate on which the ITO film was formed was subjected to surface treatment by ozone UV treatment.
(正孔輸送層の形成)
ポリ(3,4-エチレンジオキシチオフェン)/ポリスチレンスルホン酸を水に溶解させた懸濁液(ヘレウス社製、Clevios P VP AI4083)を孔径0.45μmのフィルターで濾過した。濾過後の懸濁液を、表面処理された基板のITO側の表面にスピンコートして、40nmの厚みの膜を形成した。次いで、大気中において、膜が形成された基板をホットプレート上に載せ、200℃で10分間の条件で膜を乾燥させ、正孔輸送層を形成した。 (Formation of hole transport layer)
A suspension of poly (3,4-ethylenedioxythiophene) / polystyrene sulfonic acid in water (Clevios P VP AI4083 manufactured by Heraeus) was filtered through a filter with a pore size of 0.45 μm. The filtered suspension was spin-coated on the surface of the surface-treated substrate on the ITO side to form a 40 nm thick film. Next, the substrate on which the film was formed was placed on a hot plate in the air, and the film was dried at 200 ° C. for 10 minutes to form a hole transport layer.
ポリ(3,4-エチレンジオキシチオフェン)/ポリスチレンスルホン酸を水に溶解させた懸濁液(ヘレウス社製、Clevios P VP AI4083)を孔径0.45μmのフィルターで濾過した。濾過後の懸濁液を、表面処理された基板のITO側の表面にスピンコートして、40nmの厚みの膜を形成した。次いで、大気中において、膜が形成された基板をホットプレート上に載せ、200℃で10分間の条件で膜を乾燥させ、正孔輸送層を形成した。 (Formation of hole transport layer)
A suspension of poly (3,4-ethylenedioxythiophene) / polystyrene sulfonic acid in water (Clevios P VP AI4083 manufactured by Heraeus) was filtered through a filter with a pore size of 0.45 μm. The filtered suspension was spin-coated on the surface of the surface-treated substrate on the ITO side to form a 40 nm thick film. Next, the substrate on which the film was formed was placed on a hot plate in the air, and the film was dried at 200 ° C. for 10 minutes to form a hole transport layer.
(活性層の形成)
次に、組成物(I-1)を、該正孔輸送層上にスピンコートした後、真空乾燥機中(0.1mbar)で乾燥を行い、活性層を形成した。乾燥後の活性層の厚みは、約400nmであった。 (Formation of active layer)
Next, the composition (I-1) was spin-coated on the hole transport layer and then dried in a vacuum dryer (0.1 mbar) to form an active layer. The thickness of the active layer after drying was about 400 nm.
次に、組成物(I-1)を、該正孔輸送層上にスピンコートした後、真空乾燥機中(0.1mbar)で乾燥を行い、活性層を形成した。乾燥後の活性層の厚みは、約400nmであった。 (Formation of active layer)
Next, the composition (I-1) was spin-coated on the hole transport layer and then dried in a vacuum dryer (0.1 mbar) to form an active layer. The thickness of the active layer after drying was about 400 nm.
(電子輸送層の形成)
次いで、酸化亜鉛ナノ粒子(粒径20~30nm)の45重量%イソプロパノール分散液(テイカ社製,HTD-711Z)を、当該分散液の10倍重量部の3-ペンタノールで希釈し、塗布液を調製した。この塗布液を、スピンコートにより該活性層上に40nmの膜厚で塗布し、窒素ガス雰囲気下で乾燥させることにより電子輸送層を形成した。 (Formation of electron transport layer)
Subsequently, a 45 wt% isopropanol dispersion (manufactured by Tayca, HTD-711Z) of zinc oxide nanoparticles (particle size 20 to 30 nm) is diluted with 10 times by weight of the dispersion, 3-pentanol, and the coating liquid Was prepared. The coating liquid was applied by spin coating to a thickness of 40 nm on the active layer, and dried under a nitrogen gas atmosphere to form an electron transport layer.
次いで、酸化亜鉛ナノ粒子(粒径20~30nm)の45重量%イソプロパノール分散液(テイカ社製,HTD-711Z)を、当該分散液の10倍重量部の3-ペンタノールで希釈し、塗布液を調製した。この塗布液を、スピンコートにより該活性層上に40nmの膜厚で塗布し、窒素ガス雰囲気下で乾燥させることにより電子輸送層を形成した。 (Formation of electron transport layer)
Subsequently, a 45 wt% isopropanol dispersion (manufactured by Tayca, HTD-711Z) of zinc oxide nanoparticles (
(電極の形成及び封止層の形成)
その後、抵抗加熱蒸着装置内にて、電子輸送層の上にAg膜を約80nmの厚みで形成し、電極を形成した。次いで、UV硬化性封止剤を、電極が形成された基板の周囲に塗布し、ガラス板を張り合わせた後、UV光を照射することで封止し、光電変換素子を得た。得られた光電変換素子の形状は1cm×1cmの正方形であった。 (Formation of electrode and formation of sealing layer)
Thereafter, in the resistance heating vapor deposition apparatus, an Ag film was formed to a thickness of about 80 nm on the electron transporting layer to form an electrode. Next, a UV curable sealant was applied to the periphery of the substrate on which the electrode was formed, and a glass plate was laminated, and then sealed by irradiation with UV light to obtain a photoelectric conversion element. The shape of the obtained photoelectric conversion element was a square of 1 cm × 1 cm.
その後、抵抗加熱蒸着装置内にて、電子輸送層の上にAg膜を約80nmの厚みで形成し、電極を形成した。次いで、UV硬化性封止剤を、電極が形成された基板の周囲に塗布し、ガラス板を張り合わせた後、UV光を照射することで封止し、光電変換素子を得た。得られた光電変換素子の形状は1cm×1cmの正方形であった。 (Formation of electrode and formation of sealing layer)
Thereafter, in the resistance heating vapor deposition apparatus, an Ag film was formed to a thickness of about 80 nm on the electron transporting layer to form an electrode. Next, a UV curable sealant was applied to the periphery of the substrate on which the electrode was formed, and a glass plate was laminated, and then sealed by irradiation with UV light to obtain a photoelectric conversion element. The shape of the obtained photoelectric conversion element was a square of 1 cm × 1 cm.
(光電変換素子の評価)
得られた素子について、上記のとおりの方法で外部量子効率を測定した。300nmから1200nmの波長範囲において、最大の外部量子効率(EQE)は68%であった。結果を表6に示す。 (Evaluation of photoelectric conversion element)
The external quantum efficiency of the resulting device was measured by the method described above. In the wavelength range of 300 nm to 1200 nm, the maximum external quantum efficiency (EQE) was 68%. The results are shown in Table 6.
得られた素子について、上記のとおりの方法で外部量子効率を測定した。300nmから1200nmの波長範囲において、最大の外部量子効率(EQE)は68%であった。結果を表6に示す。 (Evaluation of photoelectric conversion element)
The external quantum efficiency of the resulting device was measured by the method described above. In the wavelength range of 300 nm to 1200 nm, the maximum external quantum efficiency (EQE) was 68%. The results are shown in Table 6.
<実施例2~6及び比較例1~3>
第1の溶媒及び第2の溶媒として表5に示した溶媒を使用した以外は、実施例1の[A.インクの調製]に記載された手順と同様にして、組成物(I-2)~(I-6)及び(C-1)~(C-3)を調製した。 Examples 2 to 6 and Comparative Examples 1 to 3
[A.1 in Example 1] except that the solvents shown in Table 5 were used as the first solvent and the second solvent. Preparation of Ink] Compositions (I-2) to (I-6) and (C-1) to (C-3) were prepared in the same manner as the procedure described in the following.
第1の溶媒及び第2の溶媒として表5に示した溶媒を使用した以外は、実施例1の[A.インクの調製]に記載された手順と同様にして、組成物(I-2)~(I-6)及び(C-1)~(C-3)を調製した。 Examples 2 to 6 and Comparative Examples 1 to 3
[A.1 in Example 1] except that the solvents shown in Table 5 were used as the first solvent and the second solvent. Preparation of Ink] Compositions (I-2) to (I-6) and (C-1) to (C-3) were prepared in the same manner as the procedure described in the following.
(活性層の形成)において、組成物(I-1)の代わりに組成物(I-2)~(I-6)、(C-1)~(C-3)を使用した以外は、実施例1の[B.光電変換素子の作製及び評価]に記載された手順と同様にして、光電変換素子を作製し、評価した。結果を表6に示す。
In (Formation of Active Layer), the procedure is carried out except that the compositions (I-2) to (I-6) and (C-1) to (C-3) are used instead of the composition (I-1). Example 1 [B. Production and Evaluation of Photoelectric Conversion Element] The photoelectric conversion element was produced and evaluated in the same manner as the procedure described in the section. The results are shown in Table 6.
実施例1~6の光電変換素子は、比較例1~3の光電変換素子と比較して、3Vの逆バイアス電圧を印加した場合における外部量子効率が高かった。
The photoelectric conversion elements of Examples 1 to 6 had higher external quantum efficiency when a reverse bias voltage of 3 V was applied, as compared with the photoelectric conversion elements of Comparative Examples 1 to 3.
<実施例7~11及び比較例4~6>
第1の溶媒および第2の溶媒として下表に記載した溶媒を使用し、p型半導体材料として材料P-1の代わりに材料P-6を使用した以外は、実施例1の[A.インクの調製]に記載された手順と同様にして、インクとしての組成物(I-7)~(I-11)及び(C-4)~(C-6)を調製した。 Examples 7 to 11 and Comparative Examples 4 to 6
The solvents listed in the table below were used as the first solvent and the second solvent, and the material P-6 was used instead of the material P-1 as the p-type semiconductor material [A. Preparation of Inks] Compositions (I-7) to (I-11) and (C-4) to (C-6) as inks were prepared in the same manner as the procedure described in the following.
第1の溶媒および第2の溶媒として下表に記載した溶媒を使用し、p型半導体材料として材料P-1の代わりに材料P-6を使用した以外は、実施例1の[A.インクの調製]に記載された手順と同様にして、インクとしての組成物(I-7)~(I-11)及び(C-4)~(C-6)を調製した。 Examples 7 to 11 and Comparative Examples 4 to 6
The solvents listed in the table below were used as the first solvent and the second solvent, and the material P-6 was used instead of the material P-1 as the p-type semiconductor material [A. Preparation of Inks] Compositions (I-7) to (I-11) and (C-4) to (C-6) as inks were prepared in the same manner as the procedure described in the following.
(活性層の形成)において、組成物(I-1)の代わりに、組成物(I-7)~(I-11)、(C-4)~(C-6)を使用した以外は、実施例1の[B.光電変換素子の作製及び評価]に記載された手順と同様にして、光電変換素子を作製し、評価した。結果を表8に示す。
In (Formation of Active Layer), the compositions (I-7) to (I-11) and (C-4) to (C-6) were used instead of the composition (I-1), [B. Production and Evaluation of Photoelectric Conversion Element] The photoelectric conversion element was produced and evaluated in the same manner as the procedure described in the section. The results are shown in Table 8.
実施例7~11の光電変換素子は、比較例4~6の光電変換素子と比較して、3Vの逆バイアス電圧を印加した場合における外部量子効率が高かった。
The photoelectric conversion elements of Examples 7 to 11 had higher external quantum efficiency when a reverse bias voltage of 3 V was applied, as compared with the photoelectric conversion elements of Comparative Examples 4 to 6.
1 イメージ検出部
2 表示装置
10 光電変換素子
11、210 支持基板
12 第1の電極
13 正孔輸送層
14 活性層
15 電子輸送層
16 第2の電極
20 CMOSトランジスタ基板
30 層間絶縁膜
32 層間配線部
40 封止層
50 カラーフィルター
100 指紋検出部
200 表示パネル部
200a 表示領域
220 有機EL素子
230 タッチセンサーパネル
240 封止基板 DESCRIPTION OFSYMBOLS 1 image detection part 2 display 10 photoelectric conversion element 11 and 210 support substrate 12 1st electrode 13 hole transport layer 14 active layer 15 electron transport layer 16 2nd electrode 20 CMOS transistor substrate 30 interlayer insulation film 32 interlayer wiring part 40 sealing layer 50 color filter 100 fingerprint detection unit 200 display panel unit 200a display area 220 organic EL element 230 touch sensor panel 240 sealing substrate
2 表示装置
10 光電変換素子
11、210 支持基板
12 第1の電極
13 正孔輸送層
14 活性層
15 電子輸送層
16 第2の電極
20 CMOSトランジスタ基板
30 層間絶縁膜
32 層間配線部
40 封止層
50 カラーフィルター
100 指紋検出部
200 表示パネル部
200a 表示領域
220 有機EL素子
230 タッチセンサーパネル
240 封止基板 DESCRIPTION OF
Claims (15)
- p型半導体材料と、n型半導体材料と、含窒素複素環式化合物である第1の溶媒と、芳香族炭化水素である第2の溶媒とを含む、インク。 An ink comprising a p-type semiconductor material, an n-type semiconductor material, a first solvent which is a nitrogen-containing heterocyclic compound, and a second solvent which is an aromatic hydrocarbon.
- n型半導体材料が、フラーレン誘導体である、請求項1に記載のインク。 The ink according to claim 1, wherein the n-type semiconductor material is a fullerene derivative.
- 含窒素複素環式化合物が、6員環構造を含み、前記6員環構造は、ヘテロ原子を1つ又は2つ含み、前記1つ又は2つのヘテロ原子はそれぞれ窒素原子である、請求項1又は2に記載のインク。 The nitrogen-containing heterocyclic compound comprises a six-membered ring structure, wherein the six-membered ring structure comprises one or two hetero atoms, and the one or two hetero atoms are each a nitrogen atom. Or the ink as described in 2.
- 6員環構造が、ピリジン環構造、テトラヒドロピリジン環構造、ピペリジン環構造、又はピラジン環構造である、請求項3に記載のインク。 The ink according to claim 3, wherein the six-membered ring structure is a pyridine ring structure, a tetrahydropyridine ring structure, a piperidine ring structure, or a pyrazine ring structure.
- 第1の溶媒が、置換基を有していてもよいキノリン、置換基を有していてもよい1,2,3,4-テトラヒドロキノリン、及び置換基を有していてもよいキノキサリンからなる群から選択される1種以上である、請求項1~4のいずれか1項に記載のインク。 The first solvent comprises quinoline which may have a substituent, 1,2,3,4-tetrahydroquinoline which may have a substituent, and quinoxaline which may have a substituent. The ink according to any one of claims 1 to 4, which is one or more selected from the group.
- 第1の溶媒の第2の溶媒に対する重量比率(第1の溶媒/第2の溶媒)が、1/99以上20/80以下である、請求項1~5のいずれか1項に記載のインク。 The ink according to any one of claims 1 to 5, wherein a weight ratio of the first solvent to the second solvent (first solvent / second solvent) is 1/99 or more and 20/80 or less. .
- インクにおける第1の溶媒及び第2の溶媒の合計の重量百分率が、95重量%以上99重量%以下である、請求項1~6のいずれか1項に記載のインク。 The ink according to any one of claims 1 to 6, wherein the weight percentage of the total of the first solvent and the second solvent in the ink is 95 wt% or more and 99 wt% or less.
- 光電変換素子の活性層形成用である、請求項1~7のいずれか1項に記載のインク。 The ink according to any one of claims 1 to 7, which is for forming an active layer of a photoelectric conversion element.
- 請求項1~8のいずれか1項に記載のインクの固化膜。 A solidified film of the ink according to any one of claims 1 to 8.
- 第1の電極と、p型半導体材料及びn型半導体材料を含む活性層と、第2の電極とをこの順で含み、前記活性層が請求項9に記載の固化膜である、光電変換素子。 A photoelectric conversion device comprising a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode in this order, the active layer being a solidified film according to claim 9 .
- 光検出素子である、請求項10に記載の光電変換素子。 The photoelectric conversion element according to claim 10, which is a light detection element.
- 請求項10又は11に記載の光電変換素子を含む、イメージセンサー。 An image sensor comprising the photoelectric conversion element according to claim 10.
- 請求項10又は11に記載の光電変換素子を含む、指紋認証装置。 A fingerprint authentication apparatus, comprising the photoelectric conversion device according to claim 10.
- 請求項1~8のいずれか1項に記載のインクを塗布対象に塗布して塗膜を得る工程(i)、及び得られた塗膜から溶媒を除去する工程(ii)を含む、固化膜の製造方法。 A solidified film comprising the step (i) of applying the ink according to any one of claims 1 to 8 to a coating target to obtain a coating, and removing the solvent from the obtained coating (ii). Manufacturing method.
- 第1の電極と、p型半導体材料及びn型半導体材料を含む活性層と、第2の電極とをこの順で含む光電変換素子の製造方法であって、
前記活性層を形成する工程を含み、前記活性層を形成する工程が、請求項1~8のいずれか1項に記載のインクを塗布対象に塗布して塗膜を得る工程(i)、及び得られた塗膜から溶媒を除去する工程(ii)を含む、光電変換素子の製造方法。 A method of manufacturing a photoelectric conversion element, comprising a first electrode, an active layer containing a p-type semiconductor material and an n-type semiconductor material, and a second electrode in this order,
A process (i) of applying the ink according to any one of claims 1 to 8 to a coating object to obtain a coating film, including the process of forming the active layer, and the process of forming the active layer The manufacturing method of a photoelectric conversion element including the process (ii) of removing a solvent from the obtained coating film.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019551121A JP7129995B2 (en) | 2017-10-23 | 2018-10-22 | Ink, solidified ink film, and photoelectric conversion element |
CN201880068520.2A CN111263982A (en) | 2017-10-23 | 2018-10-22 | Ink, ink cured film, and photoelectric conversion element |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017204193 | 2017-10-23 | ||
JP2017-204193 | 2017-10-23 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2019082844A1 true WO2019082844A1 (en) | 2019-05-02 |
Family
ID=66246554
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2018/039195 WO2019082844A1 (en) | 2017-10-23 | 2018-10-22 | Ink, solidified film of ink, and photoelectric conversion element |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP7129995B2 (en) |
CN (1) | CN111263982A (en) |
WO (1) | WO2019082844A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6932279B1 (en) * | 2021-03-24 | 2021-09-08 | 住友化学株式会社 | Ink composition manufacturing method |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7250982B1 (en) * | 2022-06-08 | 2023-04-03 | 住友化学株式会社 | Ink composition for forming active layer of photodetector, film, and photodetector |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013504210A (en) * | 2009-09-04 | 2013-02-04 | プレックストロニクス インコーポレーティッド | Organic electronic devices and polymers, including photovoltaic cells and diketone-based and diketopyrrolopyrrole-based polymers |
WO2013051676A1 (en) * | 2011-10-07 | 2013-04-11 | 住友化学株式会社 | Polymer compound and electronic element |
US20140147996A1 (en) * | 2010-11-29 | 2014-05-29 | Arizon Board of Regents Acting for and on Behalf Arizona State University | Methods for fabricating bulk heterojunctions using solution processing techniques |
WO2016059972A1 (en) * | 2014-10-14 | 2016-04-21 | 東レ株式会社 | Organic semiconductor composition, photovoltaic element, photoelectric conversion device, and method for manufacturing photovoltaic element |
WO2016076213A1 (en) * | 2014-11-13 | 2016-05-19 | 住友化学株式会社 | Ink composition and photoelectric conversion element produced using same |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107210371A (en) * | 2015-01-22 | 2017-09-26 | 住友化学株式会社 | Photo-electric conversion element and its manufacture method |
JP2017092096A (en) * | 2015-11-04 | 2017-05-25 | 住友化学株式会社 | Organic photoelectric conversion element |
-
2018
- 2018-10-22 CN CN201880068520.2A patent/CN111263982A/en active Pending
- 2018-10-22 WO PCT/JP2018/039195 patent/WO2019082844A1/en active Application Filing
- 2018-10-22 JP JP2019551121A patent/JP7129995B2/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013504210A (en) * | 2009-09-04 | 2013-02-04 | プレックストロニクス インコーポレーティッド | Organic electronic devices and polymers, including photovoltaic cells and diketone-based and diketopyrrolopyrrole-based polymers |
US20140147996A1 (en) * | 2010-11-29 | 2014-05-29 | Arizon Board of Regents Acting for and on Behalf Arizona State University | Methods for fabricating bulk heterojunctions using solution processing techniques |
WO2013051676A1 (en) * | 2011-10-07 | 2013-04-11 | 住友化学株式会社 | Polymer compound and electronic element |
WO2016059972A1 (en) * | 2014-10-14 | 2016-04-21 | 東レ株式会社 | Organic semiconductor composition, photovoltaic element, photoelectric conversion device, and method for manufacturing photovoltaic element |
WO2016076213A1 (en) * | 2014-11-13 | 2016-05-19 | 住友化学株式会社 | Ink composition and photoelectric conversion element produced using same |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6932279B1 (en) * | 2021-03-24 | 2021-09-08 | 住友化学株式会社 | Ink composition manufacturing method |
WO2022202439A1 (en) * | 2021-03-24 | 2022-09-29 | 住友化学株式会社 | Method for producing ink composition |
JP2022148301A (en) * | 2021-03-24 | 2022-10-06 | 住友化学株式会社 | Production method of ink composition |
EP4116381A4 (en) * | 2021-03-24 | 2024-04-24 | Sumitomo Chemical Company, Limited | Method for producing ink composition |
US12043749B2 (en) | 2021-03-24 | 2024-07-23 | Sumitomo Chemical Company, Limited | Method for producing ink composition |
Also Published As
Publication number | Publication date |
---|---|
CN111263982A (en) | 2020-06-09 |
JPWO2019082844A1 (en) | 2020-11-19 |
JP7129995B2 (en) | 2022-09-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP7080131B2 (en) | Photodetection | |
JP7339239B2 (en) | Photoelectric conversion element | |
JP6637638B2 (en) | Photoelectric conversion element | |
JP6697833B2 (en) | Photoelectric conversion element and manufacturing method thereof | |
WO2020026975A1 (en) | Light detecting element and fingerprint authenticating device | |
JP7129995B2 (en) | Ink, solidified ink film, and photoelectric conversion element | |
WO2021200316A1 (en) | Photodetector element, sensor and biometric device including same, composition, and ink | |
JP7315531B2 (en) | Photodetector | |
WO2022202439A1 (en) | Method for producing ink composition | |
JP7235465B2 (en) | Photoelectric conversion element and manufacturing method thereof | |
JP7080132B2 (en) | Photodetection | |
JP6621967B2 (en) | Photoelectric conversion element and manufacturing method thereof | |
TWI858246B (en) | Light detection element, sensor, biometric authentication device, X-ray sensor, near infrared sensor, composition, and ink composition | |
WO2021200315A1 (en) | Photodetector element | |
CN111819706B (en) | Photoelectric conversion element | |
JP2020088170A (en) | Organic photoelectric conversion element | |
CN115052916A (en) | Polymer compound, composition, ink, and photoelectric conversion element |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 18871554 Country of ref document: EP Kind code of ref document: A1 |
|
ENP | Entry into the national phase |
Ref document number: 2019551121 Country of ref document: JP Kind code of ref document: A |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 18871554 Country of ref document: EP Kind code of ref document: A1 |