WO2015145907A1 - Organic metal compound-containing gas supply device - Google Patents
Organic metal compound-containing gas supply device Download PDFInfo
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- WO2015145907A1 WO2015145907A1 PCT/JP2014/084328 JP2014084328W WO2015145907A1 WO 2015145907 A1 WO2015145907 A1 WO 2015145907A1 JP 2014084328 W JP2014084328 W JP 2014084328W WO 2015145907 A1 WO2015145907 A1 WO 2015145907A1
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- organometallic compound
- compound
- specific gravity
- containing gas
- supply device
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
Definitions
- the present invention relates to an apparatus for supplying an organometallic compound-containing gas.
- Patent Document 1 describes an apparatus having a container filled with a solid organometallic compound at room temperature as a gas supply apparatus containing an organometallic compound.
- organometallic compound-containing gas supply device There is a demand for supplying an organometallic compound-containing gas in a predetermined concentration range from an organometallic compound-containing gas supply device. That is, the organometallic compound-containing gas supply device is required to be able to supply the organometallic compound-containing gas stably over a long period of time.
- the main object of the present invention is to provide an organometallic compound supply device capable of stably supplying an organometallic compound-containing gas over a long period of time.
- the organometallic compound-containing gas supply device is a device that supplies a gas containing an organometallic compound that is solid at room temperature.
- An organometallic compound-containing gas supply device includes a container, a supply unit, and a high specific gravity material.
- the container has an internal space, a carrier gas introduction port, and a discharge port.
- the introduction port is connected to the lower part of the internal space.
- the discharge port is connected to the upper part of the internal space.
- the supply unit is located in the internal space.
- a mixture of the organometallic compound-containing particles and the filler is disposed in the supply unit.
- the high specific gravity is disposed on the supply unit in the internal space.
- the high specific gravity has a higher specific gravity than the organometallic compound-containing particles.
- an organometallic compound supply apparatus capable of stably supplying an organometallic compound-containing gas over a long period of time.
- FIG. 1 is a schematic cross-sectional view of the organometallic compound-containing gas supply device according to the first embodiment.
- FIG. 2 is a graph schematically showing the concentration of the organometallic compound in the organometallic compound-containing gas when no high specific gravity material is provided.
- FIG. 3 is a schematic cross-sectional view of the organometallic compound-containing gas supply device according to the second embodiment.
- FIG. 4 is a schematic cross-sectional view of the organometallic compound-containing gas supply device according to the third embodiment.
- FIG. 5 is a schematic cross-sectional view of the organometallic compound-containing gas supply device according to the fourth embodiment.
- FIG. 6 is a schematic cross-sectional view of the organometallic compound-containing gas supply device according to the fifth embodiment.
- FIG. 7 is a schematic cross-sectional view of an organometallic compound-containing gas supply device according to a sixth embodiment.
- FIG. 8 is a schematic cross-sectional view of the organometallic compound-containing
- FIG. 1 is a schematic cross-sectional view of the organometallic compound-containing gas supply device according to the first embodiment.
- An organometallic compound-containing gas supply apparatus 1 shown in FIG. 1 is an apparatus that supplies a gas containing an organometallic compound that is solid at room temperature. Specifically, a carrier gas is supplied to the supply device 1.
- the supply device 1 is a device that supplies a mixed gas of a carrier gas and an organometallic compound that is solid at room temperature.
- organometallic compound that is solid at room temperature is not particularly limited.
- organometallic compounds that are solid at room temperature include, for example, organolithium compounds, organoindium compounds, organozinc compounds, organoaluminum compounds, organogallium compounds, organomagnesium compounds, organobismuth compounds, organomanganese compounds, and organoiron compounds.
- organic lithium compound include t-butyl lithium.
- organic indium compound examples include trimethylindium, dimethylchloroindium, cyclopentadienylindium, trimethylindium / trimethylarsine adduct, and trimethylindium / trimethylphosphine adduct.
- organic zinc compound examples include ethyl zinc iodide, ethyl cyclopentadienyl zinc, cyclopentadienyl zinc and the like.
- organoaluminum compound examples include methyldichloroaluminum, triphenylaluminum, tris (dimethylamido) aluminum and the like.
- organic gallium compound examples include methyldichlorogallium, dimethylchlorogallium, dimethylbromogallium and the like.
- organic magnesium compound examples include bis (cyclopentadienyl) magnesium and bis (dimethylamido) magnesium.
- organic bismuth compound examples include triphenyl bismuth and the like.
- organic manganese compound examples include bis (cyclopentadienyl) manganese and bis (dimethylamido) manganese.
- organic iron compound examples include ferrocene.
- organic barium compound examples include bis (acetylacetonato) barium, dipivaloylmethanatobarium • 1,10-phenanthroline adduct, and the like.
- organic strontium compound examples include bis (acetylacetonato) strontium, dipivaloylmethanatostrontium, and the like.
- organic copper compound examples include bis (acetylacetonato) copper, dipivaloylmethanatocopper, and the like.
- organic calcium compound examples include bis (acetylacetonato) calcium and dipivaloylmethanatocalcium.
- organic yttrium compound examples include dipivaloylmethanatoribium and the like.
- organic cobalt compound examples include bis (dimethylamido) cobalt, (t-butylmethylacetylene) (hexacarbonyl) dicobalt, and the like.
- the supply device 1 includes a container 10, a supply unit 13, and a high specific gravity material.
- the container 10 has an internal space 10a, an introduction port 10b, and a discharge port 10c.
- the internal space 10a may be columnar, for example.
- the internal space 10a may be, for example, a columnar shape, a prismatic shape, or the like.
- the internal space 10a is cylindrical.
- the inlet 10b is connected to the lower part of the internal space 10a.
- the discharge port 10c is connected to the upper part of the internal space 10a. Accordingly, the carrier gas supplied from the inlet 10b flows in the internal space from the lower side to the upper side and is discharged from the outlet port 10c.
- the introduction port 10 b is provided on the bottom wall of the container 10.
- the discharge port 10 c is provided on the upper wall of the container 10.
- the supply unit 13 supplies an organic metal compound gas to the carrier gas. By supplying an organic metal compound gas from the supply unit 13, an organic metal compound-containing gas is generated.
- the supply unit 13 is located in the internal space 10a.
- the internal space 10a includes a first region 10a1 and a second region 10a2 located on the first region 10a1.
- the supply unit 13 is disposed in the first region 10a1.
- the volume of the first region 10a1 in which the supply unit 13 is disposed is preferably 20% to 80% of the volume of the internal space 10a.
- the supply unit 13 is provided with a mixture of organometallic compound-containing particles and filler.
- the organometallic compound-containing particles may be particles composed of an organometallic compound, or may be particles having a carrier and an organometallic compound supported on the carrier.
- the carrier can be composed of, for example, inorganic oxide particles, metal particles, resin particles, and the like.
- the carrier is, for example, alumina, silica, mullite, glassy carbon, graphite, potassium titanate, sponge titanium, quartz, silicon nitride, boron nitride, silicon carbide, stainless steel, aluminum, nickel, titanium, tungsten, fluorinated resin, glass, etc. It can comprise by the particle
- the specific gravity of the organometallic compound-containing particles is preferably 0.5 g / ml to 3.0 g / ml.
- the particle diameter of the organometallic compound-containing particles is preferably 0.01 mm to 10.0 mm, and preferably 0.05 mm to 8.0 mm.
- the organometallic compound-containing particles may be spherical or may be an irregular shape such as a pulverized product.
- the filler is particles that do not substantially contain an organometallic compound.
- the filler can be composed of, for example, inorganic oxide particles, metal particles, resin particles, and the like.
- Fillers include, for example, alumina, silica, mullite, glassy carbon, graphite, potassium titanate, sponge titanium, quartz, silicon nitride, boron nitride, silicon carbide, stainless steel, aluminum, nickel, titanium, tungsten, fluorinated resin, glass It can be constituted by particles made up of and the like.
- the shape of the filler is not particularly limited.
- the filler may be, for example, a spherical shape or may be an irregular shape such as a pulverized product.
- the specific gravity of the filler is preferably 1.0 g / ml to 15.0 g / ml, and more preferably 2.0 g / ml to 10.0 g / ml.
- the particle diameter of the filler is preferably 0.01 mm to 10.0 mm, and more preferably 0.1 mm to 8.0 mm.
- High specific gravity is arranged on the supply unit 13 in the internal space 10a.
- the high specific gravity is located in a part of the second region 10a2.
- the high specific gravity object is disposed in a part of the second region 10a2 on the lower side in the vertical direction.
- the high specific gravity is disposed in a portion excluding the upper portion of the second region 10a2.
- the upper part in the vertical direction of the second region 10a2 is a space.
- the shape of the high specific gravity is not particularly limited.
- the high specific gravity material may be, for example, a plate shape or the like, but in the present embodiment is a particle shape.
- a plurality of high specific gravity materials are provided on the supply unit 13.
- the plurality of high specific gravity objects are provided in layers on the supply unit 13.
- the plurality of high specific gravity objects constitute a high specific gravity layer 14 located on the supply unit 13.
- the high specific gravity layer 14 covers substantially the entire supply unit 13. However, in the present invention, it is not always necessary that a plurality of high specific gravity objects are arranged. For example, a single plate-like high specific gravity object having a plurality of through holes may be disposed on the supply unit 13.
- the amount of sublimation of the organometallic compound is larger than the amount of aggregation of the organometallic compound in an upstream portion of the internal space through which the carrier gas having a low organometallic compound concentration passes.
- the amount of aggregation of the organometallic compound is larger than the amount of sublimation of the organometallic compound in the downstream portion of the internal space through which the carrier gas having a high organometallic compound concentration passes. For this reason, grain growth of organometallic compound-containing particles may occur in the downstream portion of the internal space.
- a portion having a high ventilation resistance and a portion having a low ventilation resistance may occur in the downstream portion of the internal space. It is conceivable that so-called channeling occurs in which the carrier gas preferentially passes through a portion having a lower ventilation resistance than other portions. When channeling occurs, the organometallic compound located in the vicinity of the portion with low ventilation resistance is preferentially consumed, and the organometallic compound located in the portion with high ventilation resistance is less likely to be consumed. As a result, the consumption of the organometallic compound until the concentration of the organometallic compound in the mixed gas falls below a predetermined concentration may be reduced.
- the organometallic compound-containing gas supply device 1 a mixture of organometallic compound-containing particles and particulate filler is arranged in the internal space 10a. For this reason, there is also a portion in which a filler is interposed between adjacent organometallic compound-containing particles. For this reason, even when the amount of aggregation of the organometallic compound is larger than the amount of sublimation of the organometallic compound, there are few portions where the organometallic compounds are adjacent to each other, which is accompanied by the joining of the organometallic compound-containing particles. The occurrence of channeling is suppressed. Therefore, according to the supply apparatus 1, the consumption of the organometallic compound until the density
- the content of the filler in the supply unit 13 is 20% by volume to 80% by volume. It is preferably 30% by volume to 70% by volume.
- organolithium compounds, organoindium compounds, organozinc compounds, organoaluminum compounds, organogallium compounds, organomagnesium compounds, organobismuth compounds, organomanganese compounds, organoiron compounds, organobarium compounds, organostrontium compounds as organometallic compounds
- the supply device 1 is more useful when using at least one of an organic copper compound, an organic calcium compound, an organic yttrium compound, and an organic cobalt compound.
- the present inventors have found that when a mixture of organometallic compound-containing particles and particulate filler is disposed in the internal space 10a, the organometallic compound-containing gas immediately after the start of the supply of the carrier gas. It was discovered that the concentration of the organometallic compound becomes too high. Specifically, as in the schematic graph shown in FIG. 2, immediately after the start of the supply of the carrier gas, the concentration of the organometallic compound in the organometallic compound-containing gas becomes stable once it suddenly increases.
- the concentration of the organometallic compound in the organometallic compound-containing gas is allowed to be an allowable lower limit C1 and the allowable lower limit until the concentration of the organometallic compound is stabilized after the supply of the carrier gas is started. There are cases where it does not fall within the upper limit C2.
- the period until the concentration of the organometallic compound in the organometallic compound-containing gas falls below the allowable lower limit C1 is shortened. That is, the period T1 in which the concentration of the organometallic compound in the organometallic compound-containing gas is located between the allowable lower limit value C1 and the allowable upper limit value C2 is shortened.
- the cause of the above phenomenon is that at least the upper part of the mixture disposed in the supply unit 13 rises with the carrier gas at the start of the supply of the carrier gas.
- the higher specific gravity of the organometallic compound-containing particles and the filler gathers downward, and the lower specific gravity gathers upward.
- the specific gravity of the organometallic compound-containing particles is lower than the specific gravity of the filler, the organometallic compound-containing particles gather together.
- a layer having a high concentration of the organometallic compound-containing particles is formed.
- a high specific gravity material having a higher specific gravity than the organometallic compound-containing particles is arranged on the supply unit 13. It is possible to prevent the organometallic compound-containing particles and the filler disposed in the supply unit 13 from rising due to the high specific gravity when the carrier gas starts to be supplied. Therefore, as shown in FIG. 2, it is possible to suppress the concentration of the organometallic compound from exceeding the allowable upper limit C2 at the start of the supply of the carrier gas. Moreover, since excessive consumption of the organometallic compound is unlikely to occur at the start of the supply of the carrier gas, the organometallic compound-containing gas having a concentration equal to or higher than the allowable lower limit C1 can be supplied over a long period. Therefore, the supplyable period T2 of the organic metal compound-containing gas having a concentration located between the allowable lower limit value C1 and the allowable upper limit value C2 can be lengthened.
- the organometallic compound-containing gas having a predetermined concentration it is preferable to arrange a high specific gravity so as to cover the supply unit 13. From this viewpoint, it is preferable that the high specific gravity layer 14 including a plurality of high specific gravity materials is provided on the supply unit 13.
- the specific gravity of the high specific gravity material is preferably 1.01 times or more, more preferably 1.10 times or more of the specific gravity of the organometallic compound-containing particles.
- FIG. 3 is a schematic cross-sectional view of the organometallic compound-containing gas supply device 1a according to the second embodiment.
- the high specific gravity layer 14 includes a first high specific gravity layer 14a and a second high specific gravity layer 14b.
- the second high specific gravity layer 14b is located on the first high specific gravity layer 14a.
- the specific gravity of the second high specific gravity material arranged in the second high specific gravity material layer 14b is higher than the specific gravity of the first high specific gravity material arranged in the first high specific gravity material layer 14a.
- the scattering of the organometallic compound-containing particles and the filler at the start of the supply of the carrier gas is more effectively suppressed. be able to.
- the present invention is not limited to this configuration.
- the first high specific gravity product and the second high specific gravity product may be mixed and arranged.
- FIG. 4 is a schematic cross-sectional view of the organometallic compound-containing gas supply device 1b according to the third embodiment.
- the diffusion layer 15 is disposed below the supply unit 13 (on the introduction port 10b side) in the internal space 10a.
- the diffusion layer 15 can be comprised with a filler, for example.
- FIG. 5 is a schematic cross-sectional view of the organometallic compound-containing gas supply device 1c according to the fourth embodiment.
- the supply device 1 c includes a container 20 in addition to the container 10.
- the container 20 is connected to the container 10 in series.
- the discharge port 20 c connected to the internal space 20 a of the container 20 is connected to the introduction port 10 b of the container 10.
- the carrier gas inlet 20 b of the container 20 is provided at the upper part of the container 20, and the outlet 20 c is provided at the lower part of the container 20. For this reason, in the container 20, the carrier gas flows downward from above.
- the supply unit 23 is substantially the same as the supply unit 13. In the supply unit 23, organometallic compound-containing particles and a filler are arranged.
- a filler layer 21 in which a filler is disposed is provided below the supply unit 23, a filler layer 21 in which a filler is disposed is provided.
- an organometallic compound-containing gas supply device is required to be able to supply an organometallic compound-containing gas stably over a long period of time. That is, it is preferable that a carrier gas containing an organometallic compound at a concentration equal to or higher than a predetermined concentration is supplied from a discharge port over a long period of time. In order to realize this, it is important to increase the consumption of the organometallic compound until the concentration of the organometallic compound in the mixed gas falls below a predetermined concentration.
- the reason why the consumption of the organometallic compound is reduced until the concentration of the organometallic compound in the mixed gas falls below a predetermined concentration is that the portion of the container filled with the organometallic compound has the airflow resistance of the carrier gas at the other portion. It is conceivable that so-called channeling occurs in which a lower portion is generated and the carrier gas preferentially passes through a portion in which the carrier gas ventilation resistance is low. When channeling occurs, the organometallic compound located in the vicinity of the portion with low ventilation resistance is preferentially consumed, and the organometallic compound located in the portion with high ventilation resistance is less likely to be consumed.
- the consumption of the organometallic compound until the concentration of the organometallic compound in the mixed gas falls below a predetermined concentration may be reduced.
- the carrier gas ventilation resistance in the entire filler layer 21 is higher than the carrier gas ventilation resistance in the entire supply unit 23.
- the filler layer 21 is filled with the filler.
- the filler layer 21 having a relatively high carrier gas ventilation resistance is present, whereby the carrier gas ventilation resistance is provided in the supply unit 23.
- the carrier gas passes through the supply unit 23 with high uniformity.
- the carrier gas containing the organometallic compound at a concentration equal to or higher than a predetermined concentration can be supplied from the discharge port over a long period of time.
- the carrier gas ventilation resistance in the entire filler layer 21 is higher than the carrier gas ventilation resistance in the entire supply unit 23.
- a method in which the porosity in the filler layer 21 is lower than the porosity in the supply unit 23 is conceivable.
- the average particle diameter of the filler filled in the filler layer 21 is equal to or smaller than the average particle diameter of the carrier of the carrier filled in the supply unit 23.
- the average particle diameter of the filler filled in the filler layer 21 is similarly set to the average particle of the filler in the supply unit 13. It can be considered that the diameter is equal to or smaller than the diameter.
- the ratio of the amount of the organometallic compound remaining in the container 20 to the amount of the organometallic compound in the container 20 before use of the supply device 1c ((the amount of the organometallic compound remaining in the container 20) / (supply When the amount of the organometallic compound in the container 20 before use of the apparatus 1c) is 40% or less, the carrier gas ventilation resistance in the entire filler layer 21 is more than the carrier gas ventilation resistance in the entire supply unit 23. It is only necessary that the filler layer 21 is filled with a filler so as to be high.
- the filler layer 21 may be filled with a filler so that the carrier gas ventilation resistance in the entire filler layer 21 is higher than the carrier gas ventilation resistance in the entire supply unit 23.
- the portion of the internal space 20a on the discharge port 20c side is tapered toward the discharge port 20c side.
- the end of the supply unit 23 on the filler layer 21 side and the filler layer 21 are tapered toward the discharge port 20c as a whole.
- the amount of consumption of the organometallic compound until the concentration of the organometallic compound in the mixed gas falls below a predetermined concentration can be increased.
- Container 20 Taper at the lower end of the internal space: 10.1cc A cylindrical portion excluding the tapered portion at the lower end of the internal space: 182.4 cc 21 cc of alumina spheres with a diameter of 0.5 mm are placed at the bottom of the internal space, and a mixture of 24.9 g (48 cc) of Cp2Mg and 42 cc of alumina spheres with a diameter of 0.5 mm is placed on it. Were provided with 86 cc of alumina spheres having a diameter of 0.5 mm.
- Container 10 A 1.1 cc tapered portion that thickens upward at the lower end of the inner space A cylindrical portion excluding the tapered portion of the inner space: 18.8 cc A mixture of 1.90 g (4 cc) of Cp2Mg and 10.7 cc of alumina spheres having a diameter of 0.5 mm was disposed at the bottom of the internal space, and 8 cc of alumina spheres having a diameter of 0.5 mm were disposed thereon.
- Example 2 A mixture of Cp2Mg 24.61 g (50 cc) and an alumina sphere 44 cc having a diameter of 0.5 mm was disposed at the lowermost part of the internal space of the container 20, and an alumina sphere 109 cc having a diameter of 0.5 mm was disposed thereon. .
- a mixture of 1.65 g (3.7 cc) of Cp2Mg and 12.2 cc of alumina spheres having a diameter of 0.5 mm is disposed at the lowermost part of the internal space of the container 10, and an alumina sphere having a diameter of 0.5 mm is disposed thereon. 9cc was distributed.
- an organometallic compound-containing gas supply device was produced under the same conditions as in Experimental Example 1. (Evaluation) Argon gas was supplied as a carrier gas at 2000 ccm to the organometallic compound-containing gas supply device produced in each of Experimental Example 1 and Experimental Example 2 under the conditions of 60 ° C. and 760 Torr. At that time, the amount of Cp2Mg extracted per unit time (removal speed) in the gas supplied from the supply device was measured.
- the amount of Cp2Mg taken out in (3) / the amount of Cp2Mg charged) was determined as the stable end point (%).
- the stable extraction end point was about 75%
- Experimental Example 1 the stable extraction end point was about 95%.
- FIG. 6 is a schematic cross-sectional view of the organometallic compound-containing gas supply device 1d according to the fifth embodiment. From the viewpoint of filling a larger amount of the organometallic compound in the container, it is preferable to fill the tapered second portion with the organometallic compound. However, as a result of intensive studies, the inventors have found that when the tapered second portion is filled with an organometallic compound, the organometallic compound-containing gas cannot be stably supplied over a long period of time.
- the present inventors have found that when the tapered second portion is filled with the organometallic compound, the carrier gas containing the organometallic compound at a concentration equal to or higher than a predetermined concentration cannot be supplied from the discharge port over a long period of time. .
- the cause of this is not clear, but the flow rate of the carrier gas in the portion near the side wall of the tapered second portion is smaller than the flow rate of the carrier gas in the other portions. This is considered to be because the utilization efficiency of the organometallic compound disposed in the vicinity of the side wall of the metal decreases. Therefore, as shown in FIG. 6, in the supply device 1d, in addition to the tapered portion of the internal space 20a, the filler layer 21 is located above the tapered portion.
- the utilization efficiency of the organometallic compound is high. Therefore, according to the supply apparatus 1d, the carrier gas containing the organometallic compound at a concentration equal to or higher than a predetermined concentration can be supplied over a long period from the discharge port. That is, according to the supply apparatus 1d, the organometallic compound-containing gas can be stably supplied over a long period of time.
- Example 3 44 cc of alumina spheres with a diameter of 0.5 mm are arranged at the lowermost part of the inner space of the container 20, and a mixture of 24.9 g (48 cc) of Cp2Mg and 44 cc of alumina spheres with a diameter of 0.5 mm is placed thereon. Furthermore, 66 cc of alumina spheres having a diameter of 0.5 mm were arranged thereon.
- the amount of Cp2Mg extracted per unit time (removal speed) in the gas supplied from the supply device was measured.
- the ratio of the amount of Cp2Mg taken out until the takeout speed becomes 5% of the takeout speed at the beginning of use with respect to the charged amount of Cp2Mg was determined as the stable end point (%).
- the stable extraction end point was about 75%
- the stable extraction end point was about 95%.
- FIG. 7 is a schematic cross-sectional view of an organometallic compound-containing gas supply device 1e according to the sixth embodiment.
- a diffusion layer 25 is disposed on the upstream side of the supply unit 23.
- the diffusion layer 25 has substantially the same configuration and the same function as the diffusion layer 15. By disposing the diffusion layer 25, the carrier gas can be uniformly supplied to the entire supply unit 23.
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Abstract
Description
図1は、第1の実施形態に係る有機金属化合物含有ガスの供給装置の模式的断面図である。図1に示される有機金属化合物含有ガスの供給装置1は、常温で固体である有機金属化合物を含むガスを供給する装置である。具体的には、供給装置1には、キャリアガスが供給される。供給装置1は、キャリアガスと、常温で固体である有機金属化合物との混合ガスを供給する装置である。 (First embodiment)
FIG. 1 is a schematic cross-sectional view of the organometallic compound-containing gas supply device according to the first embodiment. An organometallic compound-containing
図3は、第2の実施形態に係る有機金属化合物含有ガスの供給装置1aの模式的断面図である。図3に示すように、本実施形態では、高比重物層14が、第1の高比重物層14aと、第2の高比重物層14bとを有する。第2の高比重物層14bは、第1の高比重物層14aの上に位置している。第2の高比重物層14bに配された第2の高比重物の比重は、第1の高比重物層14aに配された第1の高比重物の比重より高い。このように、さらに高比重な高比重物を含む第2の高比重物層14bを設けることにより、キャリアガスの供給開始時における有機金属化合物含有粒子や充填材の飛散をより効果的に抑制することができる。 (Second Embodiment)
FIG. 3 is a schematic cross-sectional view of the organometallic compound-containing
図4は、第3の実施形態に係る有機金属化合物含有ガスの供給装置1bの模式的断面図である。図4に示すように、供給装置1bでは、内部空間10aにおいて、供給部13の下(導入口10b側)に、拡散層15が配されている。拡散層15を設けることにより、供給部13の全体に対してキャリアガスを均一に供給することができる。なお、拡散層15は、例えば、充填材により構成することができる。 (Third embodiment)
FIG. 4 is a schematic cross-sectional view of the organometallic compound-containing
図5は、第4の実施形態に係る有機金属化合物含有ガスの供給装置1cの模式的断面図である。 (Fourth embodiment)
FIG. 5 is a schematic cross-sectional view of the organometallic compound-containing
混合ガスにおける有機金属化合物の濃度が所定の濃度を下回るまでの有機金属化合物の消費量が少なくなる原因としては、容器の有機金属化合物が充填された部分に、キャリアガスの通気抵抗が他の部分よりも低い部分が発生し、キャリアガスの通気抵抗が低い部分をキャリアガスが優先的に通過する所謂チャネリングが発生することが考えられる。チャネリングが発生すると、通気抵抗が低い部分の近傍に位置していた有機金属化合物が優先的に消費され、通気抵抗が高い部分に位置している有機金属化合物が消費されにくくなる。その結果、混合ガスにおける有機金属化合物の濃度が所定の濃度を下回るまでの有機金属化合物の消費量が少なくなる場合がある。
供給装置1cでは、容器20内の有機金属化合物の6割以上が消費されたときに、供給部23全体におけるキャリアガスの通気抵抗よりも、充填材層21全体におけるキャリアガスの通気抵抗が高くなるように、充填材層21に充填材が充填されている。このため、容器20内の有機金属化合物の6割以上が消費されたときに、相対的にキャリアガスの通気抵抗が高い充填材層21が存在することによって、供給部23にキャリアガスの通気抵抗が他の部分よりも低い部分が発生し難い。従って、キャリアガスが高い均一性で供給部23を通過する。その結果、混合ガスにおける有機金属化合物の濃度が所定の濃度を下回るまでの有機金属化合物の消費量を多くすることができる。すなわち、供給装置1によれば、所定の濃度以上の濃度で有機金属化合物を含むキャリアガスが排出口から長期間にわたって供給することができる。 By the way, an organometallic compound-containing gas supply device is required to be able to supply an organometallic compound-containing gas stably over a long period of time. That is, it is preferable that a carrier gas containing an organometallic compound at a concentration equal to or higher than a predetermined concentration is supplied from a discharge port over a long period of time. In order to realize this, it is important to increase the consumption of the organometallic compound until the concentration of the organometallic compound in the mixed gas falls below a predetermined concentration.
The reason why the consumption of the organometallic compound is reduced until the concentration of the organometallic compound in the mixed gas falls below a predetermined concentration is that the portion of the container filled with the organometallic compound has the airflow resistance of the carrier gas at the other portion. It is conceivable that so-called channeling occurs in which a lower portion is generated and the carrier gas preferentially passes through a portion in which the carrier gas ventilation resistance is low. When channeling occurs, the organometallic compound located in the vicinity of the portion with low ventilation resistance is preferentially consumed, and the organometallic compound located in the portion with high ventilation resistance is less likely to be consumed. As a result, the consumption of the organometallic compound until the concentration of the organometallic compound in the mixed gas falls below a predetermined concentration may be reduced.
In the
(実験例1)
実験例1では、図8に示される有機金属化合物含有ガスの供給装置を以下の条件で作製した。
容器20:
内部空間の下端部のテーパー部:10.1cc
内部空間の下端部のテーパー部を除いた円柱状の部分:182.4cc
内部空間の最下部に直径が0.5mmのアルミナ球を21cc配置し、その上に、Cp2Mg24.9g(48cc)と、直径が0.5mmのアルミナ球42ccとの混合物を配置し、さらにその上に、直径が0.5mmのアルミナ球86ccを配した。
容器10:
内部空間の下端部に、上方に向かって太くなる1.1ccのテーパー部を設けた
内部空間の上記テーパー部を除いた円柱状の部分:18.8cc
内部空間の最下部に、Cp2Mg1.90g(4cc)と、直径が0.5mmのアルミナ球10.7ccとの混合物を配置し、その上に、直径が0.5mmのアルミナ球8ccを配した。
(実験例2)
容器20の内部空間の最下部に、Cp2Mg24.61g(50cc)と、直径が0.5mmのアルミナ球44ccとの混合物を配置し、その上に、直径が0.5mmのアルミナ球109ccを配した。容器10の内部空間の最下部に、Cp2Mg1.65g(3.7cc)と、直径が0.5mmのアルミナ球12.2ccとの混合物を配置し、その上に、直径が0.5mmのアルミナ球9ccを配した。それ以外は、実験例1と同様の条件で有機金属化合物含有ガスの供給装置を作製した。
(評価)
実験例1及び実験例2のそれぞれで作製した有機金属化合物含有ガスの供給装置に、60℃、760Torrの条件で、キャリアガスとして、アルゴンガスを2000ccmで流した。そのときに供給装置から供給されたガスにおけるCp2Mgの単位時間当たりの取り出し量(取り出し速度)を測定した。取り出し速度が、使用初期の取り出し速度の5%になったときまでに取り出されたCp2Mgの量の、Cp2Mgの仕込み量に対する割合(取り出し速度が、使用初期の取り出し速度の5%になったときまでに取り出されたCp2Mg量/Cp2Mgの仕込み量)を、安定取り出し終点(%)として求めた。その結果、実験例2では、安定取り出し終点が約75%であったのに対して、実験例1では、安定取り出し終点が約95%であった。 In the present embodiment, the portion of the
(Experimental example 1)
In Experimental Example 1, the organometallic compound-containing gas supply device shown in FIG. 8 was produced under the following conditions.
Container 20:
Taper at the lower end of the internal space: 10.1cc
A cylindrical portion excluding the tapered portion at the lower end of the internal space: 182.4 cc
21 cc of alumina spheres with a diameter of 0.5 mm are placed at the bottom of the internal space, and a mixture of 24.9 g (48 cc) of Cp2Mg and 42 cc of alumina spheres with a diameter of 0.5 mm is placed on it. Were provided with 86 cc of alumina spheres having a diameter of 0.5 mm.
Container 10:
A 1.1 cc tapered portion that thickens upward at the lower end of the inner space A cylindrical portion excluding the tapered portion of the inner space: 18.8 cc
A mixture of 1.90 g (4 cc) of Cp2Mg and 10.7 cc of alumina spheres having a diameter of 0.5 mm was disposed at the bottom of the internal space, and 8 cc of alumina spheres having a diameter of 0.5 mm were disposed thereon.
(Experimental example 2)
A mixture of Cp2Mg 24.61 g (50 cc) and an alumina sphere 44 cc having a diameter of 0.5 mm was disposed at the lowermost part of the internal space of the
(Evaluation)
Argon gas was supplied as a carrier gas at 2000 ccm to the organometallic compound-containing gas supply device produced in each of Experimental Example 1 and Experimental Example 2 under the conditions of 60 ° C. and 760 Torr. At that time, the amount of Cp2Mg extracted per unit time (removal speed) in the gas supplied from the supply device was measured. The ratio of the amount of Cp2Mg taken out until the takeout speed becomes 5% of the takeout speed at the beginning of use with respect to the charged amount of Cp2Mg (until the takeout speed becomes 5% of the takeout speed at the beginning of use) The amount of Cp2Mg taken out in (3) / the amount of Cp2Mg charged) was determined as the stable end point (%). As a result, in Experimental Example 2, the stable extraction end point was about 75%, whereas in Experimental Example 1, the stable extraction end point was about 95%.
図6は、第5の実施形態に係る有機金属化合物含有ガスの供給装置1dの模式的断面図である。
容器内により多くの有機金属化合物を充填する観点からは、テーパ状の第2の部分にも有機金属化合物を充填することが好ましい。しかしながら、本発明者らは、鋭意研究の結果、テーパ状の第2の部分に有機金属化合物を充填すると、長期間にわたって安定的に有機金属化合物含有ガスが供給できないことを見出した。すなわち、本発明者らは、テーパ状の第2の部分に有機金属化合物を充填すると、所定の濃度以上の濃度で有機金属化合物を含むキャリアガスが排出口から長期間にわたって供給できないことを見出した。
この原因としては、定かではないが、テーパ状の第2の部分の側壁近傍の部分におけるキャリアガスの流量が、他の部分におけるキャリアガスの流量よりも少なくなるため、テーパ状の第2の部分の側壁近傍の部分に配された有機金属化合物の利用効率が低下するためであると考えられる。
そこで、図6に示すように、供給装置1dでは、内部空間20aのテーパ状の部分に加え、そのテーパ状部分の上方にまで充填材層21が位置している。このため、供給装置1dでは、有機金属化合物の利用効率が高い。よって、供給装置1dによれば、所定の濃度以上の濃度で有機金属化合物を含むキャリアガスを排出口から長期間にわたって供給することができる。すなわち、供給装置1dによれば、長期間にわたって安定的に有機金属化合物含有ガスを供給することができる。
(実験例3)
容器20の内部空間の最下部に、直径が0.5mmのアルミナ球を44cc配し、その上に、Cp2Mg24.9g(48cc)と、直径が0.5mmのアルミナ球44ccとの混合物を配置し、さらにその上に、直径が0.5mmのアルミナ球66ccを配した。容器20の内部空間の最下部に、Cp2Mg1.90g(4cc)と、直径が0.5mmのアルミナ球8ccとの混合物を配置し、その上に、直径が0.5mmのアルミナ球8ccを配した。それ以外は、実験例1と同様の条件で有機金属化合物含有ガスの供給装置を作製した。
(評価)
実験例3で作製した有機金属化合物含有ガスの供給装置に、60℃、760Torrの条件で、キャリアガスとして、アルゴンガスを2000ccmで流した。そのときに供給装置から供給されたガスにおけるCp2Mgの単位時間当たりの取り出し量(取り出し速度)を測定した。取り出し速度が、使用初期の取り出し速度の5%になったときまでに取り出されたCp2Mgの量の、Cp2Mgの仕込み量に対する割合(取り出し速度が、使用初期の取り出し速度の5%になったときまでに取り出されたCp2Mg量/Cp2Mgの仕込み量)を、安定取り出し終点(%)として求めた。その結果、上述のように、実験例2では、安定取り出し終点が約75%であったのに対して、実験例1,3では、それぞれ安定取り出し終点が約95%であった。 (Fifth embodiment)
FIG. 6 is a schematic cross-sectional view of the organometallic compound-containing
From the viewpoint of filling a larger amount of the organometallic compound in the container, it is preferable to fill the tapered second portion with the organometallic compound. However, as a result of intensive studies, the inventors have found that when the tapered second portion is filled with an organometallic compound, the organometallic compound-containing gas cannot be stably supplied over a long period of time. That is, the present inventors have found that when the tapered second portion is filled with the organometallic compound, the carrier gas containing the organometallic compound at a concentration equal to or higher than a predetermined concentration cannot be supplied from the discharge port over a long period of time. .
The cause of this is not clear, but the flow rate of the carrier gas in the portion near the side wall of the tapered second portion is smaller than the flow rate of the carrier gas in the other portions. This is considered to be because the utilization efficiency of the organometallic compound disposed in the vicinity of the side wall of the metal decreases.
Therefore, as shown in FIG. 6, in the
(Experimental example 3)
44 cc of alumina spheres with a diameter of 0.5 mm are arranged at the lowermost part of the inner space of the
(Evaluation)
Argon gas was supplied as a carrier gas at 2000 ccm to the organometallic compound-containing gas supply device prepared in Experimental Example 3 under the conditions of 60 ° C. and 760 Torr. At that time, the amount of Cp2Mg extracted per unit time (removal speed) in the gas supplied from the supply device was measured. The ratio of the amount of Cp2Mg taken out until the takeout speed becomes 5% of the takeout speed at the beginning of use with respect to the charged amount of Cp2Mg (until the takeout speed becomes 5% of the takeout speed at the beginning of use) The amount of Cp2Mg taken out in (3) / the amount of Cp2Mg charged) was determined as the stable end point (%). As a result, as described above, in Experimental Example 2, the stable extraction end point was about 75%, whereas in Experimental Examples 1 and 3, the stable extraction end point was about 95%.
図7は、第6の実施形態に係る有機金属化合物含有ガスの供給装置1eの模式的断面図である。 (Sixth embodiment)
FIG. 7 is a schematic cross-sectional view of an organometallic compound-containing
10,20 容器
10a,20a 内部空間
10a1 第1の領域
10a2 第2の領域
10b,20b 導入口
10c,20c 排出口
13,23 供給部
14 高比重物層
14a 第1の高比重物層
14b 第2の高比重物層
15,25 拡散層
21 充填材層 1, 1a, 1b, 1c, 1d, 1e
Claims (13)
- 常温で固体である有機金属化合物を含むガスを供給する装置であって、
内部空間と、前記内部空間の下部に接続されたキャリアガスの導入口と、前記内部空間の上部に接続された排出口と、を有する容器と、
前記内部空間に位置しており、有機金属化合物含有粒子と充填材との混合物が配された供給部と、
前記内部空間において、前記供給部の上に配されており、前記有機金属化合物含有粒子よりも高比重な高比重物と、
を備える、有機金属化合物含有ガスの供給装置。 An apparatus for supplying a gas containing an organometallic compound that is solid at room temperature,
A container having an internal space, a carrier gas inlet connected to a lower portion of the internal space, and a discharge port connected to an upper portion of the internal space;
A supply section located in the internal space, in which a mixture of organometallic compound-containing particles and filler is disposed;
In the internal space, arranged on the supply unit, a high specific gravity material having a higher specific gravity than the organometallic compound-containing particles,
An apparatus for supplying an organometallic compound-containing gas. - 前記高比重物は、前記供給部を覆うように配されている、請求項1に記載の有機金属化合物含有ガスの供給装置。 The organometallic compound-containing gas supply device according to claim 1, wherein the high specific gravity material is disposed so as to cover the supply unit.
- 前記高比重物は、第1の高比重物と、前記第1の高比重物よりも高比重な第2の高比重物とを含む請求項1又は2に記載の有機金属化合物含有ガスの供給装置。 The supply of the organometallic compound-containing gas according to claim 1, wherein the high specific gravity includes a first high specific gravity and a second high specific gravity having a higher specific gravity than the first high specific gravity. apparatus.
- 前記第1の高比重物の上に、前記第2の高比重物が配されている、請求項3に記載の有機金属化合物含有ガスの供給装置。 4. The organometallic compound-containing gas supply device according to claim 3, wherein the second high specific gravity material is disposed on the first high specific gravity material.
- 前記第1の高比重物と、前記第2の高比重物とが混合されて配されている請求項3に記載の有機金属化合物含有ガスの供給装置。 The apparatus for supplying an organometallic compound-containing gas according to claim 3, wherein the first high-specific gravity material and the second high-specific gravity material are mixed and arranged.
- 前記高比重物の比重が、前記有機金属化合物含有粒子の比重の1.01倍以上である、請求項1~5のいずれか一項に記載の有機金属化合物含有ガスの供給装置。 The organometallic compound-containing gas supply device according to any one of claims 1 to 5, wherein the specific gravity of the high specific gravity material is 1.01 or more times that of the organometallic compound-containing particles.
- 内部空間と、当該内部空間に接続されたキャリアガスの導入口と、当該内部空間に接続されていると共に、前記容器の排出口に接続された排出口とを有し、前記内部空間が前記導入口側の第1の部分と、前記第1の部分よりも前記排出口側に位置する第2の部分とを含む別の容器と、
前記第1の部分に配された有機金属化合物と、
前記第2の部分に充填された充填材と、
を備え、
前記容器内の有機金属化合物の6割以上が消費されたときに、前記第1の部分におけるキャリアガスの通気抵抗よりも、前記第2の部分におけるキャリアガスの通気抵抗が高くなるように前記第2の部分に前記充填材が充填されている、請求項1~6のいずれか一項に記載の有機金属化合物含有ガスの供給装置。 An internal space; a carrier gas introduction port connected to the internal space; and a discharge port connected to the internal space and connected to the discharge port of the container. Another container including a first part on the mouth side and a second part located on the outlet side from the first part;
An organometallic compound disposed in the first portion;
A filler filled in the second portion;
With
When 60% or more of the organometallic compound in the container is consumed, the air resistance of the carrier gas in the second portion is higher than the air resistance of the carrier gas in the first portion. The organometallic compound-containing gas supply device according to any one of claims 1 to 6, wherein the portion 2 is filled with the filler. - 前記第1の部分の前記第2の部分側の端部と前記第2の部分とが、前記排出口側に向かって先細っている、請求項7に記載の有機金属化合物含有ガスの供給装置。 The device for supplying an organometallic compound-containing gas according to claim 7, wherein an end of the first part on the second part side and the second part are tapered toward the discharge port side. .
- 前記容器内の有機金属化合物の6割以上が消費されたときに、前記第1の部分における空隙率よりも前記第2の部分における空隙率が低い、請求項7又は8に記載の有機金属化合物含有ガスの供給装置。 The organometallic compound according to claim 7 or 8, wherein when 60% or more of the organometallic compound in the container is consumed, the porosity in the second portion is lower than the porosity in the first portion. Supply device for contained gas.
- 前記第1の部分に、担体に担持された有機金属化合物が充填されており、
前記充填材の平均粒子径が前記担体の平均粒子径以下である、請求項7~9のいずれか一項に記載の有機金属化合物含有ガスの供給装置。 The first portion is filled with an organometallic compound supported on a carrier;
The organometallic compound-containing gas supply device according to any one of claims 7 to 9, wherein an average particle diameter of the filler is equal to or less than an average particle diameter of the carrier. - 前記第1の部分に、充填材と前記有機金属化合物との混合物が充填されており、
前記第2の部分に配された充填材の平均粒子径が前記第1の部分に配された充填材の平均粒子径以下である、請求項7~9のいずれか一項に記載の有機金属化合物含有ガスの供給装置。 The first portion is filled with a mixture of a filler and the organometallic compound,
The organic metal according to any one of claims 7 to 9, wherein an average particle diameter of the filler disposed in the second portion is equal to or less than an average particle diameter of the filler disposed in the first portion. Compound gas supply device. - 前記混合物における充填材の含有量が20体積%~80体積%である、請求項1~11のいずれか一項に記載の有機金属化合物含有ガスの供給装置。 12. The organometallic compound-containing gas supply device according to claim 1, wherein the filler content in the mixture is 20% by volume to 80% by volume.
- 前記有機金属化合物が、有機リチウム化合物、有機インジウム化合物、有機亜鉛化合物、有機アルミニウム化合物、有機ガリウム化合物、有機マグネシウム化合物、有機ビスマス化合物、有機マンガン化合物、有機鉄化合物、有機バリウム化合物、有機ストロンチウム化合物、有機銅化合物、有機カルシウム化合物、有機イットリビウム化合物、及び有機コバルト化合物からなる群から選ばれた少なくとも一種である、請求項1~12のいずれか一項に記載の有機金属化合物含有ガスの供給装置。
The organometallic compound is an organolithium compound, an organoindium compound, an organozinc compound, an organoaluminum compound, an organogallium compound, an organomagnesium compound, an organobismuth compound, an organomanganese compound, an organoiron compound, an organobarium compound, an organostrontium compound, The apparatus for supplying an organometallic compound-containing gas according to any one of claims 1 to 12, which is at least one selected from the group consisting of an organic copper compound, an organic calcium compound, an organic yttrium compound, and an organic cobalt compound.
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PCT/JP2014/084328 WO2015145907A1 (en) | 2014-03-27 | 2014-12-25 | Organic metal compound-containing gas supply device |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6237882B2 (en) |
KR (1) | KR20160137961A (en) |
CN (1) | CN106062244A (en) |
TW (1) | TW201600629A (en) |
WO (1) | WO2015145907A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022118744A1 (en) * | 2020-12-04 | 2022-06-09 | 株式会社高純度化学研究所 | Vapor deposition raw material for use in production of film containing indium and at least one another metal, and method for producing film containing indium and at least one another metal |
Citations (3)
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JPH08250440A (en) * | 1995-03-09 | 1996-09-27 | Shin Etsu Chem Co Ltd | Organometallic compound supply apparatus |
JP2007314878A (en) * | 2006-05-22 | 2007-12-06 | Rohm & Haas Electronic Materials Llc | Delivery device |
JP2010248628A (en) * | 2009-03-27 | 2010-11-04 | Ube Ind Ltd | Feeder of organometallic compound |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH0726364Y2 (en) * | 1989-06-23 | 1995-06-14 | 日本酸素株式会社 | Solid material feeder for vapor phase growth equipment |
CN1160929A (en) * | 1995-12-20 | 1997-10-01 | 三菱电机株式会社 | Compound semicondudctor N-doping method, and electronic and optical devices produced using the same method |
JP4352783B2 (en) * | 2002-08-23 | 2009-10-28 | 東京エレクトロン株式会社 | Gas supply system and processing system |
KR20140075019A (en) * | 2006-05-30 | 2014-06-18 | 우베 고산 가부시키가이샤 | Device for supplying organic metal compound |
CN101595250A (en) * | 2007-01-31 | 2009-12-02 | 住友化学株式会社 | Be used to prepare the method for III-V-group compound semiconductor |
JP5262083B2 (en) | 2007-11-26 | 2013-08-14 | 宇部興産株式会社 | Solid organometallic compound feeder |
JP5407290B2 (en) * | 2008-11-14 | 2014-02-05 | 宇部興産株式会社 | Filling container and method for vaporizing and supplying low melting point compound using the filling container |
-
2014
- 2014-12-25 KR KR1020167021981A patent/KR20160137961A/en not_active Application Discontinuation
- 2014-12-25 CN CN201480076925.2A patent/CN106062244A/en active Pending
- 2014-12-25 JP JP2016509916A patent/JP6237882B2/en not_active Expired - Fee Related
- 2014-12-25 WO PCT/JP2014/084328 patent/WO2015145907A1/en active Application Filing
-
2015
- 2015-03-02 TW TW104106547A patent/TW201600629A/en unknown
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08250440A (en) * | 1995-03-09 | 1996-09-27 | Shin Etsu Chem Co Ltd | Organometallic compound supply apparatus |
JP2007314878A (en) * | 2006-05-22 | 2007-12-06 | Rohm & Haas Electronic Materials Llc | Delivery device |
JP2010248628A (en) * | 2009-03-27 | 2010-11-04 | Ube Ind Ltd | Feeder of organometallic compound |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022118744A1 (en) * | 2020-12-04 | 2022-06-09 | 株式会社高純度化学研究所 | Vapor deposition raw material for use in production of film containing indium and at least one another metal, and method for producing film containing indium and at least one another metal |
Also Published As
Publication number | Publication date |
---|---|
CN106062244A (en) | 2016-10-26 |
JP6237882B2 (en) | 2017-11-29 |
KR20160137961A (en) | 2016-12-02 |
JPWO2015145907A1 (en) | 2017-04-13 |
TW201600629A (en) | 2016-01-01 |
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