WO2015020011A1 - ガスバリア性フィルム - Google Patents
ガスバリア性フィルム Download PDFInfo
- Publication number
- WO2015020011A1 WO2015020011A1 PCT/JP2014/070516 JP2014070516W WO2015020011A1 WO 2015020011 A1 WO2015020011 A1 WO 2015020011A1 JP 2014070516 W JP2014070516 W JP 2014070516W WO 2015020011 A1 WO2015020011 A1 WO 2015020011A1
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- Prior art keywords
- gas barrier
- group
- layer
- coating
- film
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- UFHILTCGAOPTOV-UHFFFAOYSA-N tetrakis(ethenyl)silane Chemical compound C=C[Si](C=C)(C=C)C=C UFHILTCGAOPTOV-UHFFFAOYSA-N 0.000 description 1
- ZUEKXCXHTXJYAR-UHFFFAOYSA-N tetrapropan-2-yl silicate Chemical compound CC(C)O[Si](OC(C)C)(OC(C)C)OC(C)C ZUEKXCXHTXJYAR-UHFFFAOYSA-N 0.000 description 1
- ZQZCOBSUOFHDEE-UHFFFAOYSA-N tetrapropyl silicate Chemical compound CCCO[Si](OCCC)(OCCC)OCCC ZQZCOBSUOFHDEE-UHFFFAOYSA-N 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 238000007736 thin film deposition technique Methods 0.000 description 1
- 239000004408 titanium dioxide Substances 0.000 description 1
- JMXKSZRRTHPKDL-UHFFFAOYSA-N titanium ethoxide Chemical compound [Ti+4].CC[O-].CC[O-].CC[O-].CC[O-] JMXKSZRRTHPKDL-UHFFFAOYSA-N 0.000 description 1
- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- RLVZHWWAGSWRBR-UHFFFAOYSA-N tri(propan-2-yloxy)gallane Chemical compound [Ga+3].CC(C)[O-].CC(C)[O-].CC(C)[O-] RLVZHWWAGSWRBR-UHFFFAOYSA-N 0.000 description 1
- YZVRVDPMGYFCGL-UHFFFAOYSA-N triacetyloxysilyl acetate Chemical compound CC(=O)O[Si](OC(C)=O)(OC(C)=O)OC(C)=O YZVRVDPMGYFCGL-UHFFFAOYSA-N 0.000 description 1
- JWRQFDQQDBJDHD-UHFFFAOYSA-N tributoxyindigane Chemical compound CCCCO[In](OCCCC)OCCCC JWRQFDQQDBJDHD-UHFFFAOYSA-N 0.000 description 1
- LGQXXHMEBUOXRP-UHFFFAOYSA-N tributyl borate Chemical compound CCCCOB(OCCCC)OCCCC LGQXXHMEBUOXRP-UHFFFAOYSA-N 0.000 description 1
- QORWJWZARLRLPR-UHFFFAOYSA-H tricalcium bis(phosphate) Chemical compound [Ca+2].[Ca+2].[Ca+2].[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O QORWJWZARLRLPR-UHFFFAOYSA-H 0.000 description 1
- FRGPKMWIYVTFIQ-UHFFFAOYSA-N triethoxy(3-isocyanatopropyl)silane Chemical compound CCO[Si](OCC)(OCC)CCCN=C=O FRGPKMWIYVTFIQ-UHFFFAOYSA-N 0.000 description 1
- ZDYQCRCRHOQEED-UHFFFAOYSA-N triethoxy(ethyl)germane Chemical compound CCO[Ge](CC)(OCC)OCC ZDYQCRCRHOQEED-UHFFFAOYSA-N 0.000 description 1
- XVYIJOWQJOQFBG-UHFFFAOYSA-N triethoxy(fluoro)silane Chemical compound CCO[Si](F)(OCC)OCC XVYIJOWQJOQFBG-UHFFFAOYSA-N 0.000 description 1
- JCVQKRGIASEUKR-UHFFFAOYSA-N triethoxy(phenyl)silane Chemical compound CCO[Si](OCC)(OCC)C1=CC=CC=C1 JCVQKRGIASEUKR-UHFFFAOYSA-N 0.000 description 1
- NBXZNTLFQLUFES-UHFFFAOYSA-N triethoxy(propyl)silane Chemical compound CCC[Si](OCC)(OCC)OCC NBXZNTLFQLUFES-UHFFFAOYSA-N 0.000 description 1
- UDUKMRHNZZLJRB-UHFFFAOYSA-N triethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OCC)(OCC)OCC)CCC2OC21 UDUKMRHNZZLJRB-UHFFFAOYSA-N 0.000 description 1
- JXUKBNICSRJFAP-UHFFFAOYSA-N triethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CCO[Si](OCC)(OCC)CCCOCC1CO1 JXUKBNICSRJFAP-UHFFFAOYSA-N 0.000 description 1
- USLHPQORLCHMOC-UHFFFAOYSA-N triethoxygallane Chemical compound CCO[Ga](OCC)OCC USLHPQORLCHMOC-UHFFFAOYSA-N 0.000 description 1
- AJSTXXYNEIHPMD-UHFFFAOYSA-N triethyl borate Chemical compound CCOB(OCC)OCC AJSTXXYNEIHPMD-UHFFFAOYSA-N 0.000 description 1
- UORVGPXVDQYIDP-UHFFFAOYSA-N trihydridoboron Substances B UORVGPXVDQYIDP-UHFFFAOYSA-N 0.000 description 1
- ZNOCGWVLWPVKAO-UHFFFAOYSA-N trimethoxy(phenyl)silane Chemical compound CO[Si](OC)(OC)C1=CC=CC=C1 ZNOCGWVLWPVKAO-UHFFFAOYSA-N 0.000 description 1
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 1
- UAEJRRZPRZCUBE-UHFFFAOYSA-N trimethoxyalumane Chemical compound [Al+3].[O-]C.[O-]C.[O-]C UAEJRRZPRZCUBE-UHFFFAOYSA-N 0.000 description 1
- XIYWAPJTMIWONS-UHFFFAOYSA-N trimethoxygallane Chemical compound [Ga+3].[O-]C.[O-]C.[O-]C XIYWAPJTMIWONS-UHFFFAOYSA-N 0.000 description 1
- LBNVCJHJRYJVPK-UHFFFAOYSA-N trimethyl(4-trimethylsilylbuta-1,3-diynyl)silane Chemical compound C[Si](C)(C)C#CC#C[Si](C)(C)C LBNVCJHJRYJVPK-UHFFFAOYSA-N 0.000 description 1
- CDGIKLPUDRGJQN-UHFFFAOYSA-N trimethyl(octoxy)silane Chemical compound CCCCCCCCO[Si](C)(C)C CDGIKLPUDRGJQN-UHFFFAOYSA-N 0.000 description 1
- DCGLONGLPGISNX-UHFFFAOYSA-N trimethyl(prop-1-ynyl)silane Chemical compound CC#C[Si](C)(C)C DCGLONGLPGISNX-UHFFFAOYSA-N 0.000 description 1
- HYWCXWRMUZYRPH-UHFFFAOYSA-N trimethyl(prop-2-enyl)silane Chemical compound C[Si](C)(C)CC=C HYWCXWRMUZYRPH-UHFFFAOYSA-N 0.000 description 1
- GYIODRUWWNNGPI-UHFFFAOYSA-N trimethyl(trimethylsilylmethyl)silane Chemical compound C[Si](C)(C)C[Si](C)(C)C GYIODRUWWNNGPI-UHFFFAOYSA-N 0.000 description 1
- SIOVKLKJSOKLIF-HJWRWDBZSA-N trimethylsilyl (1z)-n-trimethylsilylethanimidate Chemical compound C[Si](C)(C)OC(/C)=N\[Si](C)(C)C SIOVKLKJSOKLIF-HJWRWDBZSA-N 0.000 description 1
- VFFKJOXNCSJSAQ-UHFFFAOYSA-N trimethylsilyl benzoate Chemical compound C[Si](C)(C)OC(=O)C1=CC=CC=C1 VFFKJOXNCSJSAQ-UHFFFAOYSA-N 0.000 description 1
- CWMFRHBXRUITQE-UHFFFAOYSA-N trimethylsilylacetylene Chemical group C[Si](C)(C)C#C CWMFRHBXRUITQE-UHFFFAOYSA-N 0.000 description 1
- 125000003960 triphenylenyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3C3=CC=CC=C3C12)* 0.000 description 1
- OBROYCQXICMORW-UHFFFAOYSA-N tripropoxyalumane Chemical compound [Al+3].CCC[O-].CCC[O-].CCC[O-] OBROYCQXICMORW-UHFFFAOYSA-N 0.000 description 1
- LTEHWCSSIHAVOQ-UHFFFAOYSA-N tripropyl borate Chemical compound CCCOB(OCCC)OCCC LTEHWCSSIHAVOQ-UHFFFAOYSA-N 0.000 description 1
- LENZDBCJOHFCAS-UHFFFAOYSA-N tris Chemical compound OCC(N)(CO)CO LENZDBCJOHFCAS-UHFFFAOYSA-N 0.000 description 1
- GIRKRMUMWJFNRI-UHFFFAOYSA-N tris(dimethylamino)silicon Chemical compound CN(C)[Si](N(C)C)N(C)C GIRKRMUMWJFNRI-UHFFFAOYSA-N 0.000 description 1
- PKRKCDBTXBGLKV-UHFFFAOYSA-N tris(ethenyl)-methylsilane Chemical compound C=C[Si](C)(C=C)C=C PKRKCDBTXBGLKV-UHFFFAOYSA-N 0.000 description 1
- FUJPAQRDHMJPBB-UHFFFAOYSA-N tris(ethenyl)-phenylsilane Chemical compound C=C[Si](C=C)(C=C)C1=CC=CC=C1 FUJPAQRDHMJPBB-UHFFFAOYSA-N 0.000 description 1
- SCHZCUMIENIQMY-UHFFFAOYSA-N tris(trimethylsilyl)silicon Chemical compound C[Si](C)(C)[Si]([Si](C)(C)C)[Si](C)(C)C SCHZCUMIENIQMY-UHFFFAOYSA-N 0.000 description 1
- MDDPTCUZZASZIQ-UHFFFAOYSA-N tris[(2-methylpropan-2-yl)oxy]alumane Chemical compound [Al+3].CC(C)(C)[O-].CC(C)(C)[O-].CC(C)(C)[O-] MDDPTCUZZASZIQ-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 125000003774 valeryl group Chemical group O=C([*])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 239000002912 waste gas Substances 0.000 description 1
- 229910019901 yttrium aluminum garnet Inorganic materials 0.000 description 1
- 239000010457 zeolite Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
- 229910000166 zirconium phosphate Inorganic materials 0.000 description 1
- LEHFSLREWWMLPU-UHFFFAOYSA-B zirconium(4+);tetraphosphate Chemical compound [Zr+4].[Zr+4].[Zr+4].[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O LEHFSLREWWMLPU-UHFFFAOYSA-B 0.000 description 1
- 239000002043 β-alumina solid electrolyte Substances 0.000 description 1
Images
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- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/16—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers in which all the silicon atoms are connected by linkages other than oxygen atoms
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/06—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by exposure to radiation
- B05D3/061—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by exposure to radiation using U.V.
- B05D3/065—After-treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/50—Multilayers
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- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/04—Coating
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- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
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- C08J7/043—Improving the adhesiveness of the coatings per se, e.g. forming primers
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- C08J7/048—Forming gas barrier coatings
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- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/12—Chemical modification
- C08J7/123—Treatment by wave energy or particle radiation
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/14—Carrier transporting layers
- H10K50/15—Hole transporting layers
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- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
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- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/30—Coordination compounds
- H10K85/341—Transition metal complexes, e.g. Ru(II)polypyridine complexes
- H10K85/342—Transition metal complexes, e.g. Ru(II)polypyridine complexes comprising iridium
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- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
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- H10K85/649—Aromatic compounds comprising a hetero atom
- H10K85/657—Polycyclic condensed heteroaromatic hydrocarbons
- H10K85/6572—Polycyclic condensed heteroaromatic hydrocarbons comprising only nitrogen in the heteroaromatic polycondensed ring system, e.g. phenanthroline or carbazole
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- H10K85/657—Polycyclic condensed heteroaromatic hydrocarbons
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- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/60—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule in which all the silicon atoms are connected by linkages other than oxygen atoms
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- C08J2483/00—Characterised by the use of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen, or carbon only; Derivatives of such polymers
- C08J2483/16—Characterised by the use of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen, or carbon only; Derivatives of such polymers in which all the silicon atoms are connected by linkages other than oxygen atoms
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- H10K2102/301—Details of OLEDs
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Definitions
- the present invention relates to a gas barrier film.
- Japanese Patent Laid-Open No. 2012-599 discloses that a gas barrier layer is formed by forming a coating film on a substrate using a coating liquid containing a polysilazane compound and then irradiating it with vacuum ultraviolet rays using an excimer lamp or the like.
- a process for producing a gas barrier film having a plurality of gas barrier layers, which is repeated a plurality of times, is disclosed.
- Japanese Patent Application Laid-Open No. 2012-250181 discloses a process for batch-modifying a plurality of layers by obtaining a coating film having a plurality of layers using a coating liquid containing a polysilazane compound and then irradiating with vacuum ultraviolet rays using an excimer lamp or the like. Discloses a method for producing a gas barrier film.
- Japanese Patent Application Laid-Open No. 2012-148416 discloses a method for manufacturing a gas barrier film in which a reforming treatment is performed after forming a coating film containing a polysilazane compound on a film formed by vapor deposition.
- the uppermost layer and the layers existing in the vicinity thereof are modified to some extent by increasing the irradiation energy of vacuum ultraviolet rays, but as the number of layers increases.
- the film is not uniformly modified in the film thickness direction, resulting in a laminated film having no adhesion between layers, and as a result, there is a problem that the gas barrier property is lowered as a whole.
- the gas barrier layer since the gas barrier layer has not been uniformly modified, there has been a problem that physical properties such as bending resistance and interlayer adhesion are also lowered.
- the gas barrier film having a plurality of gas barrier layers is subjected to uniform modification treatment in the film thickness direction, and the adhesion and bending resistance between the gas barrier layers are deteriorated even after being stored under high temperature and high humidity conditions. There was a need for technology that did not.
- the present invention has been made in view of the above problems, and is a gas barrier film that is almost uniformly modified in the film thickness direction and has excellent interlayer adhesion and bending resistance even after storage under high temperature and high humidity conditions, and its It aims at providing the manufacturing method and the electronic device containing the said gas-barrier film.
- a coating liquid containing a polysilazane compound is simultaneously applied onto a substrate and dried to obtain a plurality of coating layers. Then, vacuum ultraviolet rays are irradiated from the side of the coating layer farthest from the substrate to improve the coating layer.
- a gas barrier film having a plurality of gas barrier layers obtained by performing a quality treatment, wherein at least one of the gas barrier layers is a member of Groups 2, 13, and 14 of the long-period periodic table
- At least one element selected from the group consisting of elements of Group 2, Group 13, and Group 14 of the long-period periodic table is selected from aluminum, indium, gallium, magnesium, calcium, germanium, and boron.
- the thickness of the substrate is 10 to 100 ⁇ m. Or 2.
- a coating solution containing a polysilazane compound is simultaneously coated on a substrate and dried to obtain a plurality of coating layers, and vacuum ultraviolet rays are irradiated from the side of the coating layer that is furthest away from the substrate.
- An electronic device body ⁇ 4. 4. The gas barrier film according to any one of 5) or 5 above.
- An electronic device comprising: a gas barrier film obtained by the production method described in 1.
- FIG. 30 shows an example of the atmospheric pressure plasma discharge processing apparatus of the system which processes a base material between counter electrodes useful when forming the vapor deposition gas barrier layer which concerns on this invention
- 30 is a plasma discharge processing apparatus
- 31 Is a plasma discharge processing vessel
- 32 is between counter electrodes (discharge space)
- 35 is a roll rotating electrode (first electrode)
- 36 is a square tube type fixed electrode (second electrode)
- 40 is An electric field applying means having two power supplies
- 41 is a first power supply
- 42 is a second power supply
- 43 is a first filter
- 44 is a second filter
- 50 is a gas supply means.
- FIG. 1 is a schematic cross-sectional view showing an example of a vacuum ultraviolet irradiation apparatus, 11 is an apparatus chamber, 12 is an Xe excimer lamp, 13 is an excimer lamp holder that also serves as an external electrode, 14 is a sample stage, and 15 Is a sample in which a layer is formed, and 16 is a light shielding plate.
- a coating solution containing a polysilazane compound (hereinafter also simply referred to as polysilazane) is applied simultaneously on the substrate and dried to obtain a plurality of coating layers.
- a gas barrier film containing at least one element selected from the group consisting of elements of Group 2, Group 13, and Group 14 (excluding silicon and carbon) (hereinafter also simply referred to as additive elements) It is.
- the coating layer is formed. Since it is modified from the surface of the layer, oxygen and moisture do not enter the coating layer, and oxidation to the inside of the coating layer and the interface between the coating layer and the substrate is difficult to proceed. Therefore, the unmodified coating layer remains unstable, and there is a problem that the performance such as gas barrier properties after storing under high temperature and high humidity is deteriorated. As in the technique described in Japanese Patent Application Laid-Open No.
- the layer that does not contain (element) is irradiated with energy rays as a modification treatment, the dangling bond increases as described above, or the absorbance at 250 nm or less increases, and the layer reaches the inside. The energy rays gradually become difficult to penetrate and only the layer surface is modified.
- the reason is not clear, when an additive element is contained, the absorbance on the low wavelength side decreases as the energy beam is irradiated.
- the substrate is irradiated with vacuum ultraviolet rays from the side of the coating layer furthest away from the substrate. Modification of the inner and lower layers from the surface of the coating layer that is farthest from the same is performed in the same way, and the modification is uniform in the film thickness direction, such as the lower layer and the lower layer. As a result, it was found for the first time that a surprising phenomenon occurs in which all layers were modified by one vacuum ultraviolet irradiation.
- the conventional technology may cause curling of the film due to coating and drying, thermal degradation of the substrate due to repeated thermal history, and the like.
- a plurality of coating layers can be obtained by performing the coating step and the drying step only once, thereby reducing the curl of the film or the thermal deterioration of the substrate even if the substrate is thinned. Therefore, it is possible to obtain a gas barrier film excellent in gas barrier properties, interlayer adhesion after storage under high temperature and high humidity conditions, bending resistance, and the like. Therefore, the gas barrier film of the present invention can contribute to weight reduction and thinning of electronic devices.
- X to Y indicating a range means “X or more and Y or less”, “weight” and “mass”, “weight%” and “mass%”, “part by weight” and “weight part”. “Part by mass” is treated as a synonym. Unless otherwise specified, operations and physical properties are measured under conditions of room temperature (20 to 25 ° C.) / Relative humidity 40 to 50% RH.
- the gas barrier film of the present invention has a base material and a plurality of gas barrier layers.
- the gas barrier film of the present invention may further contain other members.
- the gas barrier film of the present invention is, for example, another material between the base material and any gas barrier layer, on any gas barrier layer, or on the other surface of the base material on which no gas barrier layer is formed. You may have a member.
- the other members are not particularly limited, and members used for conventional gas barrier films can be used similarly or appropriately modified.
- a gas barrier layer formed by vapor deposition a smooth layer, an anchor coat layer, a bleed-out prevention layer, an intermediate layer, a protective layer, a desiccant layer (moisture absorption layer), and a functionalized layer of an antistatic layer.
- These other members may be used alone or in combination of two or more.
- the other member may exist as a single layer or may have a laminated structure of two or more layers.
- the plurality of gas barrier layers may be formed on the same surface of at least one of the base materials.
- the gas barrier film of the present invention includes both a form in which a plurality of gas barrier layers are formed on one side of the substrate and a form in which a plurality of gas barrier layers are formed on both sides of the substrate.
- the substrate of the gas barrier film of the present invention is not particularly limited as long as it can hold the gas barrier layer.
- poly (meth) acrylic acid ester polyethylene terephthalate (PET), polybutylene terephthalate, polyethylene naphthalate (PEN), polycarbonate (PC), polyarylate, polyvinyl chloride (PVC), polyethylene (PE), polypropylene (PP ), Polystyrene (PS), nylon (Ny), aromatic polyamide, polyether ether ketone, polysulfone, polyether sulfone, polyimide, polyetherimide, cycloolefin polymer, cycloolefin copolymer, and other resin films, organic-inorganic hybrid structures
- a heat-resistant transparent film product name: Sila-DEC, manufactured by Chisso Corporation having a silsesquioxane having a basic skeleton, and a resin film formed by laminating two or more layers of the above resin It can gel.
- polyethylene terephthalate (PET), polybutylene terephthalate, polyethylene naphthalate (PEN) and the like are preferably used.
- PET polyethylene terephthalate
- PEN polyethylene naphthalate
- PC polycarbonate
- a heat resistant transparent film having a basic skeleton of silsesquioxane having an organic-inorganic hybrid structure can be preferably used.
- polyimide or the like as the heat-resistant substrate.
- thermoelectric substrate ex.Tg> 200 ° C.
- heating at a temperature of 200 ° C. or higher is possible in the device manufacturing process, which is necessary for increasing the area of the device and improving the operating efficiency of the device.
- the resistance of the patterned layer can be reduced by using a transparent conductive layer or metal nanoparticles. That is, the initial characteristics of the device can be greatly improved.
- the thickness of the substrate is not particularly limited, but is preferably 5 to 300 ⁇ m, and more preferably 10 to 100 ⁇ m.
- the base material according to the present invention can be thinner than the conventional one, which can contribute to weight reduction and thinning of the electronic device.
- the substrate may have a functional layer such as a transparent conductive layer, a primer layer, or a clear hard coat layer.
- a functional layer such as a transparent conductive layer, a primer layer, or a clear hard coat layer.
- the functional layer in addition to those described above, those described in paragraph numbers “0036” to “0038” of JP-A-2006-289627 can be preferably used.
- the base material according to the present invention is preferably transparent. Since the base material is transparent and the layer formed on the base material is also transparent, it becomes possible to make a transparent gas barrier film, so that it becomes possible to make a transparent substrate such as an organic EL element. It is.
- the substrate preferably has a high surface smoothness.
- the surface smoothness those having an average surface roughness (Ra) of 2 nm or less are preferable. Although there is no particular lower limit, it is practically 0.01 nm or more. If necessary, both surfaces of the substrate, at least the side on which the gas barrier layer is provided, may be polished to improve smoothness.
- the base material using the above-described resins or the like may be an unstretched film or a stretched film.
- the base material used in the present invention can be produced by a conventionally known general method.
- an unstretched substrate that is substantially amorphous and not oriented can be produced by melting a resin as a material with an extruder, extruding it with an annular die or a T-die, and quenching.
- the unstretched base material is subjected to a known method such as uniaxial stretching, tenter-type sequential biaxial stretching, tenter-type simultaneous biaxial stretching, tubular simultaneous biaxial stretching, etc.
- a stretched substrate can be produced by stretching in the direction perpendicular to the flow direction of the substrate (horizontal axis).
- the draw ratio in this case can be appropriately selected according to the resin as the raw material of the base material, but is preferably 2 to 10 times in each of the vertical axis direction and the horizontal axis direction.
- various known treatments for improving adhesion such as corona discharge treatment, flame treatment, oxidation treatment, plasma treatment, and lamination of a smooth layer to be described later Etc. may be performed, and it is preferable to combine the above treatments as necessary.
- the gas barrier film of the present invention has a plurality (two or more) of gas barrier layers on a substrate.
- the plurality of gas barrier layers are coated on the substrate with a coating solution containing a polysilazane compound and dried to obtain a plurality of coating layers, and then the side of the coating layer furthest from the substrate Is obtained by irradiating with vacuum ultraviolet rays to carry out a modification treatment.
- at least 1 layer of the said gas barrier layer contains an additive element.
- the number of the gas barrier layers is not particularly limited as long as it is 2 or more, but from the viewpoint of gas barrier properties, it is preferably 3 to 10 layers, more preferably 3 to 6 layers.
- the position in the stacking direction of the gas barrier layer containing the additive element is not particularly limited, but is preferably present at a position further away from the base material, and most preferably present at the outermost layer farthest from the base material. If it is this form, the coating layer containing the additive element before the modification treatment will be present in the outermost layer, and by irradiating vacuum ultraviolet rays from the outermost layer side, the lower layer can be modified. It will be done in the same way. Therefore, it is a gas barrier film that is substantially uniformly modified in the film thickness direction and has excellent interlayer adhesion and bending resistance even after being stored under high temperature and high humidity conditions.
- a more preferred form is a form in which gas barrier layers containing additive elements and gas barrier layers not containing additive elements are alternately laminated. If it is this form, the uniformity of the modification
- the gas barrier layer containing the additive element exists in the outermost layer farthest from the substrate, and the gas barrier layer containing the additive element and the gas barrier layer not containing the additive element are alternately laminated. It is.
- the gas barrier layers containing each additive element may have the same composition or different compositions.
- the gas barrier layer containing no additive element is formed by subjecting the coating layer containing no additive element to a modification treatment by irradiation with vacuum ultraviolet rays.
- the gas barrier layer containing the additive element is formed by subjecting a coating layer containing a compound containing the additive element (hereinafter, also simply referred to as additive compound) to a modification treatment by irradiation with vacuum ultraviolet rays.
- additive elements examples include beryllium (Be), magnesium (Mg), calcium (Ca), strontium (Sr), barium (Ba), radium (Ra), boron (B), aluminum (Al), gallium (Ga ), Indium (In), thallium (Tl), germanium (Ge), tin (Sn), and lead (Pb).
- Be beryllium
- Mg magnesium
- Ca calcium
- Sr barium
- Ra radium
- boron B
- Al aluminum
- Ga gallium
- Tl thallium
- germanium Ge
- Sn tin
- lead lead
- additive elements may be used alone or in combination of two or more.
- the content of the additive element in the gas barrier film of the present invention is preferably 0.001 to 50% by mass, more preferably 0.1 to 40% by mass with respect to the mass of the entire gas barrier layer.
- the gas barrier film of the present invention has two or more gas barrier layers containing an additive element, the total content of the additive elements in each layer is taken as the additive element content in the gas barrier film.
- Polysilazane is a polymer having a silicon-nitrogen bond, such as SiO 2 , Si 3 N 4 having a bond such as Si—N, Si—H, or N—H, and ceramics such as both intermediate solid solutions SiO x N y. It is a precursor inorganic polymer.
- the polysilazane preferably has the following structure.
- R 1 , R 2 and R 3 are each independently a hydrogen atom, a substituted or unsubstituted alkyl group, aryl group, vinyl group or (trialkoxysilyl) alkyl group. .
- R 1 , R 2 and R 3 may be the same or different.
- examples of the alkyl group include linear, branched or cyclic alkyl groups having 1 to 8 carbon atoms.
- the aryl group include aryl groups having 6 to 30 carbon atoms.
- non-condensed hydrocarbon groups such as phenyl group, biphenyl group, terphenyl group; pentarenyl group, indenyl group, naphthyl group, azulenyl group, heptaenyl group, biphenylenyl group, fluorenyl group, acenaphthylenyl group, preadenenyl group , Condensed polycyclic hydrocarbon groups such as acenaphthenyl group, phenalenyl group, phenanthryl group, anthryl group, fluoranthenyl group, acephenanthrenyl group, aceantrirenyl group, triphenylenyl group, pyrenyl group, chrysenyl group, naphthacenyl group, etc.
- non-condensed hydrocarbon groups such as phenyl group, biphenyl group, terphenyl group; pentarenyl group, indenyl group, nap
- the (trialkoxysilyl) alkyl group includes an alkyl group having 1 to 8 carbon atoms having a silyl group substituted with an alkoxy group having 1 to 8 carbon atoms. More specific examples include 3- (triethoxysilyl) propyl group and 3- (trimethoxysilyl) propyl group.
- the substituent optionally present in R 1 to R 3 is not particularly limited, and examples thereof include an alkyl group, a halogen atom, a hydroxyl group (—OH), a mercapto group (—SH), a cyano group (—CN), There are a sulfo group (—SO 3 H), a carboxyl group (—COOH), a nitro group (—NO 2 ) and the like. Note that the optionally present substituent is not the same as R 1 to R 3 to be substituted. For example, when R 1 to R 3 are alkyl groups, they are not further substituted with an alkyl group.
- R 1 , R 2 and R 3 are preferably a hydrogen atom, a methyl group, an ethyl group, a propyl group, an isopropyl group, a butyl group, an isobutyl group, a tert-butyl group, a phenyl group, a vinyl group, 3 -(Triethoxysilyl) propyl group or 3- (trimethoxysilylpropyl) group.
- n is an integer
- the polysilazane having the structure represented by the general formula (I) may be determined to have a number average molecular weight of 150 to 150,000 g / mol. preferable.
- one of preferred embodiments is perhydropolysilazane (PHPS) in which all of R 1 , R 2 and R 3 are hydrogen atoms.
- PHPS perhydropolysilazane
- the polysilazane preferably has a structure represented by the following general formula (II).
- R 1 ′ , R 2 ′ , R 3 ′ , R 4 ′ , R 5 ′ and R 6 ′ are each independently a hydrogen atom, a substituted or unsubstituted alkyl group, An aryl group, a vinyl group or a (trialkoxysilyl) alkyl group.
- R 1 ′ , R 2 ′ , R 3 ′ , R 4 ′ , R 5 ′ and R 6 ′ may be the same or different.
- the substituted or unsubstituted alkyl group, aryl group, vinyl group or (trialkoxysilyl) alkyl group in the above is the same as the definition of the general formula (I), and thus the description is omitted.
- n ′ and p are integers, and the polysilazane having the structure represented by the general formula (II) is determined to have a number average molecular weight of 150 to 150,000 g / mol. It is preferred that Note that n ′ and p may be the same or different.
- R 1 ′ , R 3 ′ and R 6 ′ each represent a hydrogen atom, and R 2 ′ , R 4 ′ and R 5 ′ each represent a methyl group;
- R 1 ' , R 3' and R 6 ' each represents a hydrogen atom, R 2' , R 4 ' each represents a methyl group, and R 5' represents a vinyl group;
- R 1 ' , R 3' , R 4 A compound in which ' and R 6' each represent a hydrogen atom and R 2 ' and R 5' each represents a methyl group is preferred.
- the polysilazane preferably has a structure represented by the following general formula (III).
- R 1 ′′ , R 2 ′′ , R 3 ′′ , R 4 ′′ , R 5 ′′ , R 6 ′′ , R 7 ′′ , R 8 ′′ and R 9 ′′ are each independently A hydrogen atom, a substituted or unsubstituted alkyl group, aryl group, vinyl group or (trialkoxysilyl) alkyl group, wherein R 1 ′′ , R 2 ′′ , R 3 ′′ , R 4 ′′ , R 5 ′′ , R 6 ′′ , R 7 ′′ , R 8 ′′ and R 9 ′′ may be the same or different.
- the substituted or unsubstituted alkyl group, aryl group, vinyl group or (trialkoxysilyl) alkyl group in the above is the same as the definition of the general formula (I), and thus the description is omitted.
- n ′′, p ′′ and q are integers, and the polysilazane having the structure represented by the general formula (III) has a number average molecular weight of 150 to 150,000 g / mol. It is preferable to be determined as follows. Note that n ′′ , p ′′ and q may be the same or different.
- R 1 ′′ , R 3 ′′ and R 6 ′′ each represent a hydrogen atom
- R 2 ′′ , R 4 ′′ , R 5 ′′ and R 8 ′′ each represent a methyl group.
- R 9 ′′ represents a (triethoxysilyl) propyl group
- R 7 ′′ represents an alkyl group or a hydrogen atom.
- the organopolysilazane in which a part of the hydrogen atom portion bonded to Si is substituted with an alkyl group or the like has improved adhesion to the base material as a base by having an alkyl group such as a methyl group and is hard.
- the ceramic film made of brittle polysilazane can be toughened, and there is an advantage that the occurrence of cracks can be suppressed even when the (average) film thickness is increased. For this reason, perhydropolysilazane and organopolysilazane may be selected as appropriate according to the application, and may be used in combination.
- Perhydropolysilazane is presumed to have a structure in which a linear structure and a ring structure centered on a 6-membered ring and / or an 8-membered ring coexist.
- the number average molecular weight (Mn) is about 600 to 2000 (polystyrene conversion), and there are liquid or solid substances, and the state varies depending on the molecular weight.
- polysilazanes are commercially available in a solution state dissolved in an organic solvent, and the commercially available product can be used as it is as a coating solution for forming a gas barrier layer containing no additive element.
- examples of commercially available polysilazane solutions include NN120-10, NN120-20, NAX120-20, NN110, NN310, NN320, NL110A, NL120A, NL120-20, NL150A, NP110, NP140, and SP140 manufactured by AZ Electronic Materials Co., Ltd. Is mentioned.
- polysilazane examples include, but are not limited to, for example, a silicon alkoxide-added polysilazane obtained by reacting the polysilazane with a silicon alkoxide (Japanese Patent Laid-Open No. 5-23827), and a glycidol reaction.
- a silicon alkoxide-added polysilazane obtained by reacting the polysilazane with a silicon alkoxide
- glycidol-added polysilazane Japanese Patent Laid-Open No. 6-122852
- alcohol-added polysilazane obtained by reacting alcohol
- metal carboxylate obtained by reacting metal carboxylate Addition polysilazane (JP-A-6-299118), acetylacetonate complex-added polysilazane obtained by reacting a metal-containing acetylacetonate complex (JP-A-6-306329), metal obtained by adding metal fine particles Fine particle added policy Zhang such (JP-A-7-196986), and a polysilazane ceramic at low temperatures.
- the content of polysilazane in the coating layer before the modification treatment may be 100% by mass when the total mass of the coating layer is 100% by mass. Further, when the coating layer contains a material other than polysilazane, the content of polysilazane in the coating layer is preferably 10% by mass or more and 99% by mass or less, and 40% by mass or more and 95% by mass or less. More preferably, it is 70 mass% or more and 95 mass% or less.
- the coating liquid containing polysilazane can contain an inorganic precursor compound.
- the inorganic precursor compound other than polysilazane is not particularly limited as long as a coating liquid can be prepared.
- polysiloxane polysilsesquioxane, tetramethylsilane, trimethylmethoxysilane, dimethyldimethoxysilane, methyltrimethoxysilane, trimethylethoxysilane, dimethyldiethoxysilane, methyltriethoxysilane, tetramethoxysilane , Tetramethoxysilane, hexamethyldisiloxane, hexamethyldisilazane, 1,1-dimethyl-1-silacyclobutane, trimethylvinylsilane, methoxydimethylvinylsilane, trimethoxyvinylsilane, ethyltrimethoxysilane, dimethyldivinylsilane, dimethylethoxyethynylsilane Diacetoxydimethylsilane, dimethoxymethyl-3,3,3-trifluoropropylsilane, 3,3,3
- methyl hydrogen polysiloxane examples include TSF484 manufactured by Momentive.
- the polysilsesquioxane a cage, ladder, or random structure can be preferably used.
- the cage-like polysilsesquioxane for example, Mayaterials Co.
- polysilsesquioxanes that are considered to have a mixture of cage-like, ladder-like, and random-like structures are polyphenylsilsesquioxanes manufactured by Konishi Chemical Industry Co., Ltd., SR-20, SR-21, SR-23, polymethylsilsesquioxane, SR-13, and polymethyl phenylsilsesquioxane, SR-33.
- the Fox series manufactured by Toray Dow Corning Co., Ltd. which is a polyhydrogensilsesquioxane solution commercially available as a spin-on-glass material, can also be preferably used.
- inorganic silicon compounds that are solid at normal temperature are preferred, and silsesquioxane hydride is more preferably used.
- a modification treatment may be performed after forming a coating film layer coated with a coating liquid to which an additive compound has been added and dried.
- the additive compound include a metal alkoxide compound containing an additive element.
- metal alkoxide compound examples include, for example, beryllium acetylacetonate, trimethyl borate, triethyl borate, tri-n-propyl borate, triisopropyl borate, tri-n-butyl borate, tri-tert-borate Butyl, magnesium ethoxide, magnesium ethoxyethoxide, magnesium methoxyethoxide, magnesium acetylacetonate, aluminum trimethoxide, aluminum triethoxide, aluminum tri n-propoxide, aluminum triisopropoxide, aluminum tri n-butoxide, Aluminum tri-sec-butoxide, aluminum tri-tert-butoxide, aluminum acetylacetonate, acetoalkoxyaluminum diisopropylate, aluminum Tylacetoacetate diisopropylate, aluminum ethylacetoacetate di n-butyrate, aluminum diethylacetoacetate mono n-butyrate, aluminum diisopropy
- a compound having a branched alkoxy group is preferable from the viewpoint of reactivity and solubility, and a compound having a 2-propoxy group or a sec-butoxy group is more preferable.
- metal alkoxide compounds having an acetylacetonate group are also preferred.
- the acetylacetonate group is preferable because it has an interaction with the central element of the alkoxide compound due to the carbonyl structure, so that handling is easy.
- a compound having a plurality of alkoxide groups or acetylacetonate groups is more preferable from the viewpoint of reactivity and film composition.
- the central element (additive element) of the metal alkoxide compound an element that easily forms a coordinate bond with a nitrogen atom in polysilazane is preferable, and Al or B having high Lewis acidity is more preferable.
- More preferred metal alkoxide compounds are, specifically, magnesium ethoxide, triisopropyl borate, aluminum trisec-butoxide, aluminum ethyl acetoacetate diisopropylate, calcium isopropoxide, indium isopropoxide, gallium isopropoxide.
- metal alkoxide compound a commercially available product or a synthetic product may be used.
- commercially available products include, for example, AMD (aluminum diisopropylate monosec-butyrate), ASBD (aluminum secondary butyrate), ALCH (aluminum ethyl acetoacetate diisopropylate), ALCH-TR (aluminum tris).
- Ethyl acetoacetate Ethyl acetoacetate
- aluminum chelate M aluminum alkyl acetoacetate / diisopropylate
- aluminum chelate D aluminum chelate
- aluminum chelate A W
- AL-M acetoalkoxy aluminum diisopropylate, Ajinomoto Fine Chemical Co., Ltd.
- Moth Chicks series manufactured by Matsumoto Fine Chemical Co., Ltd.
- the coating liquid containing polysilazane inert gas atmosphere. This is to prevent the metal alkoxide compound from reacting with moisture and oxygen in the atmosphere and causing intense oxidation.
- the additive compound other than the metal alkoxide compound the following compounds can be used.
- Boron compounds Boron oxide, boron tribromide, boron trifluoride, boron triiodide, sodium cyanoborohydride, diborane, boric acid, trimethyl borate, borax, borazine, borane, boronic acid and the like.
- Indium compounds Indium oxide, indium chloride, etc.
- the solvent for preparing the coating solution for forming a coating layer (hereinafter also referred to as coating solution for forming a coating layer) is not particularly limited as long as it can dissolve or disperse polysilazane and / or an additive compound.
- An organic solvent that does not contain water and reactive groups (for example, a hydroxyl group or an amine group) that easily react with polysilazane and is inert to polysilazane is preferable, and an aprotic organic solvent is more preferable.
- the solvent includes an aprotic solvent; for example, carbon such as aliphatic hydrocarbons, alicyclic hydrocarbons, aromatic hydrocarbons such as pentane, hexane, cyclohexane, toluene, xylene, solvesso, and turben.
- an aprotic solvent for example, carbon such as aliphatic hydrocarbons, alicyclic hydrocarbons, aromatic hydrocarbons such as pentane, hexane, cyclohexane, toluene, xylene, solvesso, and turben.
- Hydrogen solvents Halogen hydrocarbon solvents such as methylene chloride and trichloroethane; Esters such as ethyl acetate and butyl acetate; Ketones such as acetone and methyl ethyl ketone; Aliphatic ethers such as dibutyl ether, dioxane and tetrahydrofuran; Alicyclic ethers and the like Ethers: For example, tetrahydrofuran, dibutyl ether, monoalkylene glycol dialkyl ether, polyalkylene glycol dialkyl ether (diglymes) and the like can be mentioned.
- the said solvent may be used independently or may be used with the form of a 2 or more types of mixture.
- the concentration of polysilazane in the coating solution for forming a coating layer is not particularly limited, and is preferably about 0.2 to 35% by mass, although it varies depending on the film thickness of the gas barrier layer and the pot life of the coating solution.
- the amount of the additive compound used in the coating layer forming coating solution when the additive compound is used is not particularly limited, but is preferably 0.01 to 10 times the mass of the solid content of the polysilazane. The mass is more preferably 0.06 to 6 times.
- the coating layer forming coating solution preferably contains a catalyst in order to promote modification.
- a basic catalyst is preferable, and in particular, N, N-diethylethanolamine, N, N-dimethylethanolamine, triethanolamine, triethylamine, 3-morpholinopropylamine, N, N, Amine catalysts such as N ′, N′-tetramethyl-1,3-diaminopropane, N, N, N ′, N′-tetramethyl-1,6-diaminohexane, Pt compounds such as Pt acetylacetonate, propion Examples thereof include metal catalysts such as Pd compounds such as acid Pd, Rh compounds such as Rh acetylacetonate, and N-heterocyclic compounds.
- the concentration of the catalyst added at this time is preferably 0.01 to 2% by mass with respect to polysilazane.
- the following additives can be used in the coating layer forming coating solution as necessary.
- cellulose ethers, cellulose esters for example, ethyl cellulose, nitrocellulose, cellulose acetate, cellulose acetobutyrate, etc.
- natural resins for example, rubber, rosin resin, etc., synthetic resins
- Aminoplasts especially urea resins, melamine formaldehyde resins, alkyd resins, acrylic resins, polyesters or modified polyesters, epoxides, polyisocyanates or blocked polyisocyanates, polysiloxanes, and the like.
- the method of applying the coating liquid for forming a coating layer is a simultaneous multilayer coating method, and a conventionally known appropriate simultaneous multilayer coating method is employed.
- Specific examples include a slide-type curtain coating method, a slide hopper coating method and an extrusion coating method described in US Pat. No. 2,761,419, US Pat. No. 2,761,791, and the like. It is done.
- the gas barrier film of the present invention can contribute to weight reduction and thinning of electronic devices.
- the coating and drying method is not particularly limited, but the coating liquid for forming a coating layer is heated to 20 ° C. or higher, and the coating liquid is applied on the substrate (transparent resin film) at the same time, and then formed. It is preferable that the temperature of the coating layer is preferably cooled (set) to 1 to 15 ° C. and then dried at 10 ° C. or higher. More preferable drying conditions are a wet bulb temperature of 5 to 50 ° C. and a film surface temperature of 10 to 50 ° C. Moreover, as a cooling method immediately after application
- the above-mentioned set means a step of increasing the viscosity of the coating liquid and reducing the fluidity of substances in each layer and in each layer by means such as applying cold air to the coating layer to lower the temperature.
- a state where the finger has no contact with the surface when the cold air is applied from the surface of the coating layer and the finger is pressed against the surface of the coating layer is defined as a state of completion of setting.
- the time (setting time) from application of cold air to completion of setting is within 5 minutes. Further, the lower limit of the time is not particularly limited, but it is preferable to take 45 seconds or more.
- the set time can be adjusted by adjusting the concentration of polysilazane and the concentration of the additive compound.
- the temperature of the cold air is preferably 0 to 25 ° C, more preferably 5 to 20 ° C. Further, the time during which the coating layer is exposed to cold air is preferably 10 to 120 seconds, although it depends on the transport speed of the coating layer.
- the coating thickness (thickness before drying) of the coating solution can be appropriately set according to the purpose.
- the thickness per coating layer (thickness after drying) is preferably 0.1 to 1000 nm, more preferably 1 to 800 nm, and further preferably 5 to 500 nm.
- each thickness of a some coating film layer may be the same, and may differ.
- the coating thickness of the coating solution can be adjusted so that the thickness of the coating layer after drying falls within such a range.
- the coating film After applying the coating solution, the coating film is dried. By drying the coating film, the organic solvent contained in the coating film can be removed. At this time, all of the organic solvent contained in the coating film may be dried or may be partially left. Even when a part of the organic solvent is left, a suitable gas barrier layer can be obtained. The remaining solvent can be removed later.
- the drying temperature of the coating layer varies depending on the substrate to be applied, but is preferably 30 to 200 ° C.
- the drying temperature is preferably set to 150 ° C. or less in consideration of deformation of the substrate due to heat.
- the temperature can be set by using a hot plate, oven, furnace or the like.
- the drying time is preferably set to a short time. For example, when the drying temperature is 150 ° C., the drying time is preferably set within 30 minutes.
- the drying atmosphere may be any condition such as an air atmosphere, a nitrogen atmosphere, an argon atmosphere, a vacuum atmosphere, or a reduced pressure atmosphere with a controlled oxygen concentration.
- the coating film layer obtained by applying the coating liquid containing polysilazane may include a step of removing moisture before or during the modification treatment.
- a form of dehumidification while maintaining a low humidity environment is preferable. Since humidity in a low-humidity environment varies depending on temperature, a preferable form is shown for the relationship between temperature and humidity by defining the dew point temperature.
- the preferable dew point temperature is 4 ° C. or less (temperature 25 ° C./humidity 25%), the more preferable dew point temperature is ⁇ 5 ° C. (temperature 25 ° C./humidity 10%) or less, and the maintaining time depends on the thickness of the gas barrier layer. It is preferable to set appropriately.
- the dew point temperature is ⁇ 5 ° C. or less and the maintaining time is 1 minute or more.
- the lower limit of the dew point temperature is not particularly limited, but is usually ⁇ 50 ° C. or higher, and preferably ⁇ 40 ° C. or higher. From the viewpoint of promoting the dehydration reaction of the gas barrier layer converted to silanol, it is preferable to remove moisture before or during the modification treatment.
- the coating layer modification treatment in the present invention refers to a reaction in which part or all of the polysilazane contained in the coating layer obtained above is converted into silicon oxide, silicon nitride, silicon oxynitride, etc. Specifically, it refers to a reaction in which the gas barrier film of the present invention forms an inorganic thin film at a level that can contribute to the development of gas barrier properties as a whole.
- the modification treatment in the present invention is performed by irradiating vacuum ultraviolet rays from the coating layer side farthest from the substrate.
- Ozone and active oxygen atoms generated by vacuum ultraviolet light (synonymous with vacuum ultraviolet light) have high oxidation ability, and have high density and insulating properties at low temperatures.
- Silicon oxide film, silicon nitride film, silicon oxynitride A film or the like can be formed.
- the base material is heated, and O 2 , H 2 O contributing to ceramics (silica conversion), an ultraviolet absorber, and polysilazane itself are excited and activated, so that polysilazane is excited and polysilazane is excited.
- the formation of ceramics is promoted, and the resulting gas barrier layer becomes denser.
- at least one layer of the coating layer before the modification treatment contains an additive element, it is possible to irradiate a vacuum ultraviolet ray once from the outermost layer side of a plurality of coating layers, The modification of the inner and lower layers from the surface of the most distant coating layer is performed in the same way, and the modification is even in the film thickness direction, such as the lower layer and the lower layer. Done. Therefore, even after being stored under high temperature and high humidity conditions, there is almost no generation of cracks, and the gas barrier film is excellent in interlayer adhesion and bending resistance and hardly deteriorates in gas barrier properties.
- the vacuum ultraviolet ray referred to in the present invention generally means ultraviolet light containing electromagnetic waves having a wavelength of 10 to 200 nm.
- the irradiation intensity and the irradiation time are set within a range in which the substrate carrying the coating layer to be irradiated is not damaged.
- a 2 kW (80 W / cm ⁇ 25 cm) lamp is used, and the strength of the base material surface is 20 to 300 mW / cm 2 , preferably 50 to 200 mW / cm.
- the distance between the base material and the ultraviolet irradiation lamp is set so as to be 2, and irradiation can be performed for 0.1 seconds to 10 minutes.
- the substrate temperature during vacuum ultraviolet irradiation treatment is 150 ° C. or more
- the properties of the substrate are impaired such as deformation of the substrate or deterioration of its strength. become.
- a modification treatment at a higher temperature is possible. Accordingly, there is no general upper limit for the substrate temperature at the time of ultraviolet irradiation, and it can be appropriately set by those skilled in the art depending on the type of substrate.
- Vacuum ultraviolet irradiation can be adapted to both batch processing and continuous processing, and can be appropriately selected depending on the shape of the substrate used.
- a laminate having a coating layer on the surface can be processed in an ultraviolet baking furnace equipped with a vacuum ultraviolet ray generation source as described above.
- the ultraviolet baking furnace itself is generally known.
- an ultraviolet baking furnace manufactured by I-Graphics Co., Ltd. can be used.
- ceramics are irradiated by continuously irradiating an ultraviolet-ray in the drying zone provided with the above ultraviolet-ray generation sources, conveying this.
- the time required for ultraviolet irradiation is generally 0.1 seconds to 10 minutes, preferably 0.5 seconds to 3 minutes, although it depends on the composition and concentration of the substrate and gas barrier layer used.
- the inorganic thin film can be formed at a relatively low temperature (about 200 ° C. or less).
- Examples of such means for generating vacuum ultraviolet rays include, but are not limited to, metal halide lamps, high-pressure mercury lamps, low-pressure mercury lamps, xenon arc lamps, carbon arc lamps, excimer lamps, and UV light lasers.
- the vacuum ultraviolet ray from the source is reflected by the reflector. It is desirable to apply to the polysilazane coating layer before modification.
- a rare gas excimer lamp is preferably used as the vacuum ultraviolet ray source in the present invention.
- rare gas atoms such as Xe, Kr, Ar, and Ne are referred to as inert gases because they are not chemically bonded to form molecules.
- rare gas atoms excited atoms
- the rare gas is xenon, e + Xe ⁇ e + Xe * Xe * + Xe + Xe ⁇ Xe 2 * + Xe
- excimer light vacuum ultraviolet light
- ⁇ Excimer lamps are characterized by high efficiency because radiation concentrates on one wavelength and almost no other light is emitted. Further, since no extra light is emitted, the temperature of the object can be kept low. Furthermore, since no time is required for starting and restarting, instantaneous lighting and blinking are possible.
- Dielectric barrier discharge refers to lightning generated in a gas space by arranging a gas space between both electrodes via a dielectric (transparent quartz in the case of an excimer lamp) and applying a high frequency high voltage of several tens of kHz to the electrode. It is a similar very thin discharge called micro discharge.
- electrodeless electric field discharge is also known as a method for efficiently obtaining excimer light emission.
- the electrodeless field discharge is a discharge due to capacitive coupling, and is also called an RF discharge.
- the lamp and electrodes and their arrangement may be basically the same as those of the dielectric barrier discharge, but the high frequency applied between the two electrodes is lit at several MHz.
- a spatially and temporally uniform discharge can be obtained in this way.
- the Xe excimer lamp is excellent in luminous efficiency because it emits ultraviolet light having a short wavelength of 172 nm at a single wavelength. Since this light has a large oxygen absorption coefficient, it can generate radical oxygen atom species and ozone at a high concentration with a very small amount of oxygen.
- the energy of light having a short wavelength of 172 nm for dissociating the bonds of organic substances has high ability. Due to the high energy of the active oxygen, ozone and ultraviolet radiation, the polysilazane film can be modified in a short time. Therefore, the reforming process can be performed at a higher throughput than a low-pressure mercury lamp that emits light with wavelengths of 185 nm and 254 nm and plasma cleaning, and the process time and the equipment area can be reduced.
- the excimer lamp since the excimer lamp has high light generation efficiency, it can be turned on with low power. In addition, light having a long wavelength that causes a temperature increase due to light is not emitted, and energy of a single wavelength is irradiated in the ultraviolet region, so that an increase in the surface temperature of the irradiation object is suppressed. For this reason, it is suitable for irradiation to a gas barrier film based on an organic material, a plastic substrate, a resin film or the like which is easily damaged by heat, such as polyethylene terephthalate which is easily affected by heat.
- Oxygen is required for the reaction at the time of irradiation with vacuum ultraviolet rays, but since vacuum ultraviolet rays are absorbed by oxygen, the efficiency in the ultraviolet irradiation step tends to decrease in an atmosphere containing oxygen. Therefore, it is preferable that the irradiation with the vacuum ultraviolet ray is performed in a state where the oxygen concentration and the water vapor concentration are as low as possible. That is, the oxygen concentration at the time of vacuum ultraviolet irradiation is preferably 300 to 10,000 volume ppm (1 volume%), more preferably 500 to 5,000 volume ppm. Also, the water vapor concentration during the conversion process is preferably in the range of 1000 to 4000 ppm by volume.
- a dry inert gas is preferable as a gas satisfying the irradiation atmosphere used at the time of vacuum ultraviolet irradiation, and dry nitrogen gas is particularly preferable from the viewpoint of cost.
- the oxygen concentration can be adjusted by measuring the flow rate of oxygen gas and inert gas introduced into the irradiation chamber and changing the flow rate ratio.
- the illuminance of the vacuum ultraviolet ray on the coating surface received by the outermost layer of the coating layer is preferably 1 mW / cm 2 to 10 W / cm 2 , and 30 mW / cm 2 to 200 mW / cm 2. It is more preferable, further preferably a 50mW / cm 2 ⁇ 160mW / cm 2. If it is less than 1 mW / cm 2, there is a concern that the reforming efficiency is greatly reduced, and if it exceeds 10 W / cm 2 , there is a concern that the coating film may be ablated or the substrate may be damaged.
- Irradiation energy amount of the VUV in the outermost layer surface of the coating layer is preferably 10 ⁇ 20000mJ / cm 2, more preferably 20 ⁇ 10000mJ / cm 2, 100 ⁇ More preferably, it is 8000 mJ / cm 2 . If the irradiation energy amount is less than 10 mJ / cm 2, there is a concern that the modification will be insufficient, and if it exceeds 20000 mJ / cm 2 , cracks due to excessive modification and thermal deformation of the substrate may occur.
- heating the coating layer simultaneously with vacuum ultraviolet irradiation is also preferably used to promote the modification treatment.
- the heating method is a method of heating the coating layer by heat conduction by bringing the substrate into contact with a heating element such as a heat block, a method of heating the atmosphere with an external heater such as a resistance wire, and an infrared region such as an IR heater.
- a heating element such as a heat block
- an external heater such as a resistance wire
- an infrared region such as an IR heater.
- the irradiation temperature (heating temperature) of vacuum ultraviolet rays is preferably 50 to 200 ° C., more preferably 80 to 150 ° C. It is preferable for the irradiation conditions (heating conditions) to be within the above-mentioned range since deformation of the base material and deterioration of strength are unlikely to occur and the characteristics of the base material are not impaired.
- the irradiation time (heating time) is preferably in the range of 1 second to 10 hours, and more preferably in the range of 10 seconds to 1 hour.
- the vacuum ultraviolet light used for reforming may be generated by plasma formed in a gas containing at least one of CO 2 and CH 4.
- the gas containing at least one of CO, CO 2 and CH 4 hereinafter also referred to as carbon-containing gas
- the carbon-containing gas may be used alone, but carbon containing rare gas or H 2 as the main gas. It is preferable to add a small amount of the contained gas. Examples of plasma generation methods include capacitively coupled plasma.
- Si—H bonds and N—H bonds in perhydropolysilazane are cleaved relatively easily by excitation with vacuum ultraviolet irradiation and the like. It is considered that they are recombined as N (a dangling bond of Si may be formed). That is, the cured as SiN y composition without oxidizing. In this case, the polymer main chain is not broken. The breaking of Si—H bonds and N—H bonds is promoted by the presence of a catalyst and heating. The cut H is released out of the membrane as H 2 .
- composition of the silicon oxynitride of the gas barrier layer obtained by subjecting the coating layer containing polysilazane to vacuum ultraviolet irradiation is adjusted by appropriately combining the oxidation mechanisms (I) to (IV) described above to control the oxidation state. be able to.
- the Si—H and N—H bonds are broken and the Si—O bonds are generated and converted to ceramics such as silica.
- the degree of this conversion Can be evaluated semi-quantitatively by the SiO / SiN ratio by IR measurement according to the formula (1) defined below.
- the SiO absorbance is calculated from the absorption (absorbance) at about 1160 cm ⁇ 1 and the SiN absorbance is about 840 cm ⁇ 1 . It shows that conversion to the ceramic close
- the SiO / SiN ratio that is an index of the degree of conversion to ceramic is preferably 0.3 or more, and more preferably 0.5 or more. If it is less than 0.3, the expected gas barrier property may not be obtained.
- a measuring method of silica conversion rate ( x in SiOx) it can measure using XPS method, for example.
- the chemical composition in the gas barrier layer can be measured by measuring the atomic composition ratio using an XPS surface analyzer.
- the gas barrier layer can be cut and the cut surface can be measured by measuring the atomic composition ratio with an XPS surface analyzer.
- the chemical composition in the gas barrier layer can be controlled by the types and amounts of polysilazane and additive compounds used when forming the gas barrier layer, conditions for modifying the coating layer, and the like.
- the thickness per layer of the gas barrier layer needs to satisfy both gas barrier properties and flexibility, but if it is too thin, there is a possibility that the gas barrier property may be lowered, and if it is too thick, the flexibility is deteriorated and the film is cracked. There is a risk of doing.
- the thickness per gas barrier layer is preferably 0.1 to 1000 nm after drying, more preferably 1 to 800 nm, and still more preferably 5 to 500 nm.
- the thickness per gas barrier layer can be measured by, for example, a transmission electron microscope.
- the gas barrier film of the present invention may further have a gas barrier layer (hereinafter also simply referred to as a vapor deposition gas barrier layer) formed by a vapor deposition method.
- a gas barrier layer hereinafter also simply referred to as a vapor deposition gas barrier layer
- the film thickness of the vapor deposition gas barrier layer described here is not particularly limited, but is preferably 1 to 800 nm, and more preferably 5 to 500 nm. If it is such a range, it will be excellent in gas barrier performance, bending resistance, cutting process aptitude, etc.
- the elastic modulus of the vapor deposition gas barrier layer is preferably 15 to 45 GPa, more preferably 20 to 40 GPa. If it is this range, gas-barrier performance, bending tolerance, and cutting processability will be obtained.
- the elastic modulus can be measured by a nanoindentation method.
- the vapor deposition method is not particularly limited, and a known thin film deposition technique can be used.
- vapor deposition, reactive vapor deposition, sputtering, reactive sputtering, chemical vapor deposition, and the like can be given.
- the reactive vapor deposition method is a method in which a reactive gas is introduced into a vacuum vessel and the atoms and molecules evaporated from the evaporation source are reacted and deposited, and an excitation source such as plasma is used to promote the reaction. Can also be introduced.
- a reactive gas is introduced into a vacuum vessel and the atoms and molecules evaporated from the evaporation source are reacted and deposited, and an excitation source such as plasma is used to promote the reaction.
- an excitation source such as plasma is used to promote the reaction.
- silicon, silicon nitride, silicon oxide, silicon oxynitride, or the like is used as a deposition source, and nitrogen, hydrogen, ammonia, oxygen, or the like is used as a reactive gas.
- Sputtering is a method of depositing constituent atoms of a sputtered target on a substrate using a sputtering phenomenon in which high-energy ions accelerated by an electric field are incident on a target to strike constituent atoms of the target.
- the reactive sputtering method is a method in which a reactive gas is introduced into a vacuum vessel and reacted with constituent atoms of a sputtered target to be deposited on a substrate.
- silicon, silicon nitride, silicon oxide, silicon oxynitride or the like is used as a target material, and nitrogen, hydrogen, ammonia, oxygen or the like is used as a reactive gas.
- Chemical Vapor Deposition is a method in which a material gas containing the constituent elements of a film is introduced into a vacuum vessel and excited by a specific excitation source to form excited species by chemical reaction. It is a method of depositing on a substrate.
- a material gas containing the constituent elements of a film is introduced into a vacuum vessel and excited by a specific excitation source to form excited species by chemical reaction. It is a method of depositing on a substrate.
- monosilane, hexamethyldisilazane, ammonia, nitrogen, hydrogen, oxygen and the like are used.
- the chemical vapor deposition method is a more promising method because it can form a film at a high speed and has a better covering property on the substrate than a sputtering method or the like.
- a catalytic chemical vapor deposition (Cat-CVD) method using a very high temperature catalyst as an excitation source and a plasma chemical vapor deposition (PECVD) method using a plasma as an excitation source are preferable methods.
- Cat-CVD catalytic chemical vapor deposition
- PECVD plasma chemical vapor deposition
- Cat-CVD method In the Cat-CVD method, a material gas is allowed to flow into a vacuum vessel in which a wire made of tungsten or the like is placed, and a material gas is contacted and decomposed by a wire heated by a power source. It is a method of depositing on a substrate.
- silicon nitride when depositing silicon nitride, monosilane, ammonia, or hydrogen is used as the material gas.
- silicon oxynitride oxygen is added in addition to the above material gas.
- a tungsten wire eg, ⁇ 0.5 mm, length 2.8 m
- monosilane, ammonia, and hydrogen 4/200/200 sccm
- the pressure is maintained at 10 Pa, and a film is deposited on the substrate adjusted to 100 ° C.
- the main deposition species are SiH 3 * and NH 2 *
- H * is a reaction auxiliary species on the film surface.
- PECVD method generates a discharge plasma in a vacuum vessel by flowing material gas into a vacuum vessel equipped with a plasma source and supplying power from the power source to the plasma source.
- the reactive species deposited on the substrate.
- a plasma source method capacitively coupled plasma using parallel plate electrodes, inductively coupled plasma, microwave excitation plasma using surface waves, or the like is used.
- the vapor deposition gas barrier layer obtained by the vacuum plasma CVD method, or the plasma CVD method under atmospheric pressure or near atmospheric pressure has conditions such as the raw material (also referred to as raw material) metal compound, decomposition gas, decomposition temperature, and input power. This is preferable because the desired compound can be produced.
- silicon oxide is generated.
- highly active charged particles and active radicals exist in the plasma space at a high density, so that multistage chemical reactions are accelerated at high speed in the plasma space, and the elements present in the plasma space are thermodynamic. This is because it is converted into an extremely stable compound in a very short time.
- a raw material compound it is preferable to use a silicon compound, a titanium compound, and an aluminum compound. These raw material compounds can be used alone or in combination of two or more.
- titanium compounds include titanium methoxide, titanium ethoxide, titanium isopropoxide, titanium tetraisoporooxide, titanium n-butoxide, titanium diisopropoxide (bis-2,4-pentanedionate), titanium.
- examples thereof include diisopropoxide (bis-2,4-ethylacetoacetate), titanium di-n-butoxide (bis-2,4-pentanedionate), titanium acetylacetonate, butyl titanate dimer, and the like.
- Examples of the aluminum compound include aluminum ethoxide, aluminum triisopropoxide, aluminum isopropoxide, aluminum n-butoxide, aluminum s-butoxide, aluminum t-butoxide, aluminum acetylacetonate, triethyldialuminum tri-s-butoxide, and the like. Can be mentioned.
- a decomposition gas and a discharge gas for decomposing a raw material gas containing these metals to obtain an inorganic compound hydrogen gas, methane gas, acetylene gas, carbon monoxide gas, carbon dioxide gas, nitrogen gas, ammonia gas
- examples include nitrous oxide gas, nitrogen oxide gas, nitrogen dioxide gas, oxygen gas, and water vapor.
- the decomposition gas may be mixed with an inert gas such as argon gas or helium gas.
- a desired vapor deposition gas barrier layer can be obtained by appropriately selecting a source gas containing a source compound and a decomposition gas.
- the vapor deposition gas barrier layer formed by PECVD is a layer containing an oxide, nitride, oxynitride, or oxycarbide.
- FIG. 1 is a schematic view showing an example of an atmospheric pressure plasma discharge processing apparatus for processing a substrate between counter electrodes useful for forming a vapor deposition gas barrier layer according to the present invention.
- the fixed electrode group is inclined with respect to the roll rotating electrode to change or supply the gap between the electrodes.
- the vapor deposition gas barrier layer can be obtained by appropriately selecting the type and supply amount of the film forming raw material to be used, or the output conditions during plasma discharge.
- the atmospheric pressure plasma discharge processing apparatus of FIG. 1 is an apparatus having at least a plasma discharge processing apparatus 30, an electric field applying means 40 having two power sources, a gas supply means 50, and an electrode temperature adjusting means 60. Then, a thin film is formed by subjecting the base material F to plasma discharge treatment between the counter electrodes (discharge space) 32 between the roll rotating electrode (first electrode) 35 and the square tube type fixed electrode (group) (second electrode) 36. To do. In FIG. 1, a pair of rectangular tube type fixed electrode group (second electrode) 36 and roll rotating electrode (first electrode) 35 form one electric field. Is formed. In FIG. 1, a configuration example including a total of five units having such a configuration is shown. By independently controlling the type of raw material to be supplied, the output voltage, and the like in each unit, The vapor deposition gas barrier layer can be formed continuously.
- the roll rotating electrode (first electrode) 35 has a first power source. 41 to the first high-frequency electric field of frequency ⁇ 1 , electric field strength V 1 , current I 1 , and rectangular tube-shaped fixed electrode group (second electrode) 36 from each second power source 42 corresponding to frequency ⁇ 2. A second high frequency electric field of electric field strength V 2 and current I 2 is applied.
- a first filter 43 is installed between the roll rotating electrode (first electrode) 35 and the first power supply 41.
- the first filter 43 facilitates the passage of current from the first power supply 41 to the first electrode, grounds the current from the second power supply 42, and makes it difficult to pass current from the second power supply 42 to the first power supply.
- a second filter 44 is provided between the square tube type fixed electrode group (second electrode) 36 and the second power source 42. The second filter 44 facilitates the passage of current from the second power source 42 to the second electrode, grounds the current from the first power source 41, and prevents passage of current from the first power source 41 to the second power source. Designed to be.
- the roll rotation electrode 35 may be the second electrode, and the rectangular tube-shaped fixed electrode group 36 may be the first electrode.
- the first power source is connected to the first electrode, and the second power source is connected to the second electrode.
- the first power source V 1 preferably applies a higher frequency electric field strength (V 1 > V 2 ) than the second power source V 2 . Further, the frequency has the ability to satisfy ⁇ 1 ⁇ 2 .
- the current is preferably I 1 ⁇ I 2 .
- the current I 1 of the first high-frequency electric field is preferably 0.3 mA / cm 2 to 20 mA / cm 2 , more preferably 1.0 mA / cm 2 to 20 mA / cm 2 .
- the current I 2 of the second high-frequency electric field is preferably 10 mA / cm 2 to 100 mA / cm 2 , more preferably 20 mA / cm 2 to 100 mA / cm 2 .
- the gas G generated by the gas generator 51 of the gas supply means 50 is controlled in flow rate, and is introduced into the plasma discharge processing vessel 31 from the air supply port.
- the base material F is unwound from an original winding (not shown) and conveyed, or is conveyed from a previous process, and air or the like accompanying the base material F via the guide roll 64 and the nip roll 65 is received. It is cut off and transferred to the square tube fixed electrode group 36 while being wound while being in contact with the roll rotating electrode 35. An electric field is applied from both the roll rotating electrode (first electrode) 35 and the square tube type fixed electrode group (second electrode) 36 to generate discharge plasma between the counter electrodes (discharge space) 32. A gas in a plasma state while the base material F (here, the base material includes a form in which the base material has been processed or includes an intermediate layer on the base material) is wound while being in contact with the roll rotating electrode 35. As a result, a thin film is formed. The base material F passes through the nip roll 66 and the guide roll 67 and is taken up by a winder (not shown) or transferred to the next process.
- the treated exhaust gas G ′ subjected to the discharge treatment is discharged from the exhaust port 53.
- a medium whose temperature is adjusted by the electrode temperature adjusting means 60 is used as a liquid feed pump. P is sent to both electrodes through the pipe 61, and the temperature is adjusted from the inside of the electrode.
- Reference numerals 68 and 69 denote partition plates that partition the plasma discharge processing vessel 31 from the outside.
- the raw material gas, the decomposition gas, or the discharge gas may be used alone or in combination of two or more. It can.
- the raw material gas, decomposition gas, and discharge gas used in this case the above-described raw material compounds, decomposition gas, and discharge gas can be appropriately used.
- the plasma discharge treatment vessel 31 is preferably a treatment vessel made of Pyrex (registered trademark) glass or the like, but may be made of metal as long as it can be insulated from the electrodes.
- polyimide resin or the like may be pasted on the inner surface of an aluminum or stainless steel frame, and the metal frame may be thermally sprayed to obtain insulation.
- Applied power symbol Manufacturer Frequency Product name A1 Shinko Electric 3kHz SPG3-4500 A2 Shinko Electric Co., Ltd. 5kHz SPG5-4500 A3 Kasuga Electric 15kHz AGI-023 A4 Shinko Electric 50kHz SPG50-4500 A5 HEIDEN Laboratory 100kHz * PHF-6k A6 Pearl Industry 200kHz CF-2000-200k A7 Pearl Industry 400kHz CF-2000-400k And the like, and any of them can be used.
- * indicates a HEIDEN Laboratory impulse high-frequency power source (100 kHz in continuous mode). Other than that, it is a high-frequency power source that can apply only a continuous sine wave. It is preferable to employ an electrode capable of maintaining a uniform and stable discharge state by applying such an electric field in an atmospheric pressure plasma discharge treatment apparatus.
- power (power density) of 1 W / cm 2 or more is supplied to the second electrode (second high-frequency electric field) to excite the discharge gas to generate plasma and to store the energy in a thin film A thin film is formed by applying the forming gas.
- the upper limit value of the power supplied to the second electrode is preferably 50 W / cm 2 or less, more preferably 20 W / cm 2 or less.
- the lower limit is preferably 1.2 W / cm 2 or more.
- discharge area (cm ⁇ 2 >) points out the area of the range which discharge occurs in an electrode.
- the output density is improved while maintaining the uniformity of the second high frequency electric field. I can do it. Thereby, a further uniform high-density plasma can be generated, and a further improvement in film forming speed and an improvement in film quality can be achieved.
- the upper limit value of the power supplied to the first electrode is preferably 50 W / cm 2 or less.
- the lower limit is preferably 5 W / cm 2 or more.
- the waveform of the high-frequency electric field is not particularly limited.
- a continuous sine wave continuous oscillation mode called a continuous mode
- an intermittent oscillation mode called ON / OFF intermittently called a pulse mode
- the second electrode side second
- the high-frequency electric field is preferably a continuous sine wave because a denser and better quality film can be obtained.
- controlling the film quality it can be achieved by controlling the electric power on the second power source side.
- An electrode used for such a method for forming a thin film by atmospheric pressure plasma must be able to withstand severe conditions in terms of structure and performance.
- Such an electrode is preferably a metal base material coated with a dielectric.
- the formed film may be subjected to excimer treatment (modification treatment).
- excimer treatment vacuum ultraviolet treatment
- a known method can be used, but vacuum ultraviolet treatment as described in the above-mentioned section “ ⁇ Coating layer reforming treatment>” is preferable, and further 100 to 180 nm. Vacuum ultraviolet treatment with light energy of a wavelength of is preferred.
- the oxygen concentration at the time of irradiation with vacuum ultraviolet rays is preferably 300 to 50,000 volume ppm (5 volume%), more preferably 500 to 10,000 volume ppm. It is more preferable.
- the amount of vacuum ultraviolet rays received by the vapor deposition gas barrier layer can be significantly reduced, and oxygen in the atmosphere can be activated to generate ozone and oxygen radicals appropriately.
- the oxygen concentration can be adjusted by measuring the flow rate of oxygen gas and inert gas introduced into the irradiation chamber and changing the flow rate ratio.
- the illuminance of vacuum ultraviolet rays and the amount of irradiation energy of vacuum ultraviolet rays are not particularly limited, but are preferably in the same range as the vacuum ultraviolet ray irradiation treatment in the coating layer containing polysilazane.
- vacuum ultraviolet irradiation is performed from the side of the coating layer containing polysilazane farthest from the base material.
- the vacuum ultraviolet irradiation is performed. Since the vapor deposition gas barrier layer can be modified as described above, it is not necessary to perform vacuum ultraviolet irradiation immediately after the vapor deposition gas barrier layer is formed.
- the position in the stacking direction of the vapor deposition gas barrier layer in the gas barrier film of the present invention is not particularly limited.
- the gas barrier layer formed by the modification treatment is preferably subjected to a post-treatment after applying the coating liquid, which is the previous stage, or after the modification treatment, particularly after the modification treatment.
- the post-treatment described here includes a temperature treatment (heat treatment) at a temperature of 10 ° C. or higher and lower than 800 ° C., a relative humidity of 0% RH to 100% RH, or a humidity treatment immersed in a water bath, and the treatment time is 5 seconds. It is defined as a range selected from the range of 48 days. Both temperature and humidity treatments may be performed, or only one of them may be performed. From the viewpoint of improving gas barrier properties and adhesion, temperature treatment is preferred.
- any method such as a contact method such as placing on a hot plate or a non-contact method where the sample is left on the oven can be used in combination or a single method.
- preferable conditions are a temperature of 30 to 300 ° C., a relative humidity of 30 to 85% RH, and a processing time of 30 seconds to 100 It's time.
- the gas barrier film of the present invention may have an intermediate layer between each gas barrier layer.
- a method of forming the intermediate layer a method of forming a polysiloxane modified layer can be applied.
- a polysiloxane-containing coating solution is applied onto the gas barrier layer by a wet coating method and dried, and then the resulting coating film is irradiated with vacuum ultraviolet rays to form a polysiloxane-modified intermediate layer. It is a method of forming.
- vacuum ultraviolet irradiation is performed from the side of the coating layer containing polysilazane farthest from the base material, but the polysiloxane modified layer can also be formed by this vacuum ultraviolet irradiation, so that the intermediate layer is formed. Immediately after forming the coating film, it is not necessary to perform vacuum ultraviolet irradiation.
- the coating solution used for forming the intermediate layer in the present invention mainly contains polysiloxane and an organic solvent.
- organopolysiloxane represented by following General formula (4) is especially preferable.
- R 8 to R 13 each independently represent the same or different organic group having 1 to 8 carbon atoms, and at this time, at least one of R 8 to R 13 is an alkoxy group It is a group containing either a group or a hydroxyl group, and m is 1 or more.
- Examples of the organic group having 1 to 8 carbon atoms represented by R 8 to R 13 include halogenated alkyl groups such as ⁇ -chloropropyl group and 3,3,3-trifluoropropyl group, vinyl groups, and phenyl groups.
- Aminoalkyl groups such as ⁇ -isocyanatopropyl group, linear or branched alkyl groups such as methyl group, ethyl group, n-propyl group and isopropyl group, alicyclic groups such as cyclohexyl group and cyclopentyl group Linear or branched alkyl such as alkyl group, methoxy group, ethoxy group, n-propoxy group, isopropoxy group, etc. Kokishi group or an acetyl group, a propionyl group, a butyryl group, valeryl group, etc. acyl group such as caproyl group.
- an organopolysiloxane having the general formula (4) in which m is 1 or more and the weight average molecular weight in terms of polystyrene is 1,000 to 20,000 is particularly preferable. If the weight average molecular weight in terms of polystyrene of the organopolysiloxane is 1000 or more, the intermediate layer to be formed is hardly cracked and water vapor barrier properties can be maintained. An intermediate layer having hardness is obtained.
- examples of the organic solvent applicable to the formation of the intermediate layer include alcohol solvents, ketone solvents, amide solvents, ester solvents, aprotic solvents, and the like.
- examples of the alcohol solvent include n-propanol, iso-propanol, n-butanol, iso-butanol, sec-butanol, tert-butanol, n-pentanol, iso-pentanol, 2-methylbutanol, sec- Pentanol, tert-pentanol, 3-methoxybutanol, n-hexanol, 2-methylpentanol, sec-hexanol, 2-ethylbutanol, propylene glycol monomethyl ether, propylene glycol monoethyl ether, propylene glycol monopropyl ether, propylene Glycol monobutyl ether and the like are preferable.
- ketone solvents include acetone, methyl ethyl ketone, methyl-n-propyl ketone, methyl-n-butyl ketone, diethyl ketone, methyl-iso-butyl ketone, methyl-n-pentyl ketone, ethyl-n-butyl ketone, methyl-n-hexyl.
- ketone di-iso-butyl ketone, trimethylnonanone, cyclohexanone, 2-hexanone, methylcyclohexanone, 2,4-pentanedione, acetonylacetone, acetophenone, fenchon, acetylacetone, 2,4-hexanedione, 2 , 4-heptanedione, 3,5-heptanedione, 2,4-octanedione, 3,5-octanedione, 2,4-nonanedione, 3,5-nonanedione, 5-methyl-2,4-hexanedione, 2,2,6,6-tetrame Le-3,5-heptane dione, 1,1,1,5,5,5 beta-diketones such as hexafluoro-2,4-heptane dione and the like.
- ketone solvents may be used alone or in combination of two or more.
- amide solvents include formamide, N-methylformamide, N, N-dimethylformamide, N-ethylformamide, N, N-diethylformamide, acetamide, N-methylacetamide, N, N-dimethylacetamide, N-ethylacetamide N, N-diethylacetamide, N-methylpropionamide, N-methylpyrrolidone, N-formylmorpholine, N-formylpiperidine, N-formylpyrrolidine, N-acetylmorpholine, N-acetylpiperidine, N-acetylpyrrolidine, etc. Can be mentioned. These amide solvents may be used alone or in combination of two or more.
- ester solvents include diethyl carbonate, ethylene carbonate, propylene carbonate, diethyl carbonate, methyl acetate, ethyl acetate, ⁇ -butyrolactone, ⁇ -valerolactone, n-propyl acetate, iso-propyl acetate, n-butyl acetate, and iso -Butyl, sec-butyl acetate, n-pentyl acetate, sec-pentyl acetate, 3-methoxybutyl acetate, methyl pentyl acetate, 2-ethylbutyl acetate, 2-ethylhexyl acetate, benzyl acetate, cyclohexyl acetate, methylcyclohexyl acetate, n-acetate -Nonyl, methyl acetoacetate, ethyl acetoacetate, ethylene glycol monomethyl ether acetate, methyl
- Aprotic solvents include acetonitrile, dimethyl sulfoxide, N, N, N ′, N′-tetraethylsulfamide, hexamethylphosphoric triamide, N-methylmorpholone, N-methylpyrrole, N-ethylpyrrole, N -Methylpiperidine, N-ethylpiperidine, N, N-dimethylpiperazine, N-methylimidazole, N-methyl-4-piperidone, N-methyl-2-piperidone, N-methyl-2-pyrrolidone, 1,3-dimethyl Examples include -2-imidazolidinone and 1,3-dimethyltetrahydro-2 (1H) -pyrimidinone. These organic solvents may be used alone or in combination of two or more.
- the organic solvent used for forming the intermediate layer is preferably an alcohol solvent among the above organic solvents.
- Examples of the coating method for the coating liquid for forming the intermediate layer include spin coating, dipping, roller blade, and spraying.
- the thickness of the intermediate layer formed by the coating liquid for forming the intermediate layer is preferably in the range of 100 nm to 10 ⁇ m.
- the thickness of the intermediate layer is 100 nm or more, gas barrier properties under high humidity can be ensured.
- the film thickness of the intermediate layer is 10 ⁇ m or less, it is possible to obtain a stable coating property at the time of forming the intermediate layer and realize high light transmittance.
- the intermediate layer has a film density of usually 0.35 to 1.2 g / cm 3 , preferably 0.4 to 1.1 g / cm 3 , more preferably 0.5 to 1.0 g / cm 3. It is. If the film density is 0.35 g / cm 3 or more, sufficient mechanical strength of the coating film can be obtained.
- the vacuum ultraviolet light used for the formation of this intermediate layer the vacuum ultraviolet light in the same vacuum ultraviolet light irradiation treatment as that described in the formation of the gas barrier layer can be applied.
- the integrated light quantity of vacuum ultraviolet light for forming the intermediate layer by reforming polysiloxane film is preferably 500 mJ / cm 2 or more 10,000 / cm 2 or less. If the cumulative amount of vacuum ultraviolet light is 500 mJ / cm 2 or more, sufficient barrier performance can be obtained, and if it is 10,000 mJ / cm 2 or less, an intermediate layer having high smoothness without deforming the substrate. Can be formed.
- the intermediate layer in the present invention is preferably formed through a heating step in which the heating temperature is 50 ° C. or higher and 200 ° C. or lower. If the heating temperature is 50 ° C. or higher, sufficient barrier properties can be obtained, and if it is 200 ° C. or lower, an intermediate layer having high smoothness can be formed without deforming the substrate.
- a heating method using a hot plate, an oven, a furnace, or the like can be applied to this heating step.
- the heating atmosphere may be any condition such as air, nitrogen atmosphere, argon atmosphere, vacuum, or reduced pressure with controlled oxygen concentration.
- the intermediate layer covers the gas barrier layer and has a function of preventing the gas barrier layer in the gas barrier film from being damaged, but can also prevent the gas barrier layer from being damaged during the manufacturing process of the gas barrier film.
- the method for forming the intermediate layer is not particularly limited.
- a polysiloxane coating layer is formed on the coating layer containing polysilazane before modification formed during the formation of the gas barrier layer.
- the gas barrier layer and the intermediate layer may be formed by performing heat treatment at 100 ° C. or higher and 250 ° C. or lower after simultaneously irradiating the polysiloxane coating layer with vacuum ultraviolet light.
- a temperature of 100 ° C. or higher and 250 ° C. or lower is obtained.
- a gas barrier layer and an intermediate layer formed by applying a solution containing a polysilazane compound by heat treatment may be formed.
- the heat treatment is performed.
- the generation of minute cracks in the gas barrier layer due to thermal stress can be prevented, and the water vapor barrier performance of the gas barrier layer can be stabilized.
- a protective layer containing an organic compound may be provided on the gas barrier layer formed by coating or the gas barrier layer formed by vapor deposition.
- an organic resin such as an organic monomer, oligomer or polymer, or an organic-inorganic composite resin using a siloxane or silsesquioxane monomer, oligomer or polymer having an organic group is preferably used. it can.
- These organic resins or organic-inorganic composite resins preferably have a polymerizable group or a crosslinkable group, contain these organic resins or organic-inorganic composite resins, and contain a polymerization initiator, a crosslinking agent, etc. as necessary.
- the “crosslinkable group” is a group that can crosslink the binder polymer by a chemical reaction that occurs during light irradiation treatment or heat treatment.
- the chemical structure is not particularly limited as long as it is a group having such a function.
- the functional group capable of addition polymerization include cyclic ether groups such as an ethylenically unsaturated group and an epoxy group / oxetanyl group.
- the functional group which can become a radical by light irradiation may be sufficient,
- a crosslinkable group a thiol group, a halogen atom, an onium salt structure etc. are mentioned, for example.
- ethylenically unsaturated groups are preferable, and include functional groups described in paragraphs “0130” to “0139” of JP-A No. 2007-17948.
- organic-inorganic composite resin for example, an organic-inorganic composite resin described as “ORMOCER (registered trademark)” in US Pat. No. 6,503,634 can be preferably used.
- the elastic modulus of the protective layer can be adjusted to a desired value by appropriately adjusting the structure of the organic resin, the density of the polymerizable group, the density of the crosslinkable group, the ratio of the crosslinking agent, and the curing conditions.
- the organic resin composition examples include a resin composition containing a (meth) acrylate compound having a radical-reactive unsaturated compound, and a resin composition containing a (meth) acrylate compound and a mercapto compound having a thiol group
- Polyfunctional (meth) acrylate monomers such as epoxy (meth) acrylate, urethane (meth) acrylate, polyester (meth) acrylate, polyether (meth) acrylate, polyethylene glycol (meth) acrylate, and glycerol (meth) acrylate are dissolved.
- Resin compositions and the like It is also possible to use an arbitrary mixture of the above resin compositions, and any photosensitive resin containing a reactive monomer having one or more photopolymerizable unsaturated bonds in the molecule can be used. There are no particular restrictions.
- Examples of reactive monomers having at least one photopolymerizable unsaturated bond in the molecule include methyl acrylate, ethyl acrylate, n-propyl acrylate, isopropyl acrylate, n-butyl acrylate, isobutyl acrylate, tert-butyl acrylate, n- Pentyl acrylate, n-hexyl acrylate, 2-ethylhexyl acrylate, n-octyl acrylate, n-decyl acrylate, hydroxyethyl acrylate, hydroxypropyl acrylate, allyl acrylate, benzyl acrylate, butoxyethyl acrylate, butoxyethylene glycol acrylate, cyclohexyl acrylate, di Cyclopentanyl acrylate, 2-ethylhexyl acrylate, glycerol acrylate, Lysidyl acrylate, 2-
- the composition of the photosensitive resin contains a photopolymerization initiator.
- the photopolymerization initiator include benzophenone, methyl o-benzoylbenzoate, 4,4-bis (dimethylamine) benzophenone, 4,4-bis (diethylamine) benzophenone, ⁇ -amino acetophenone, 4,4-dichloro Benzophenone, 4-benzoyl-4-methyldiphenyl ketone, dibenzyl ketone, fluorenone, 2,2-diethoxyacetophenone, 2,2-dimethoxy-2-phenylacetophenone, 2-hydroxy-2-methylpropiophenone, p- tert-butyldichloroacetophenone, thioxanthone, 2-methylthioxanthone, 2-chlorothioxanthone, 2-isopropylthioxanthone, diethylthioxanthone, benzyldimethyl ketal, benzyl
- the protective layer can contain an inorganic material. Inclusion of an inorganic material generally leads to an increase in the elastic modulus of the protective layer.
- the elastic modulus of the protective layer can be adjusted to a desired value by appropriately adjusting the content ratio of the inorganic material.
- inorganic fine particles having a number average particle diameter of 1 to 200 nm are preferable, and inorganic fine particles having a number average particle diameter of 3 to 100 nm are more preferable.
- inorganic fine particles metal oxides are preferable from the viewpoint of transparency.
- metal oxide SiO 2, Al 2 O 3 , TiO 2, ZrO 2, ZnO, SnO 2, In 2 O 3, BaO, SrO, CaO, MgO, VO 2, V 2 O 5, CrO 2, MoO 2, MoO 3 , MnO 2, Mn 2 O 3, WO 3, LiMn 2 O 4, Cd 2 SnO 4, CdIn 2 O 4, Zn 2 SnO 4, ZnSnO 3, Zn 2 In 2 O 5, Examples thereof include Cd 2 SnO 4 , CdIn 2 O 4 , Zn 2 SnO 4 , ZnSnO 3 , and Zn 2 In 2 O 5 . These may be used alone or in combination of two or more.
- inorganic fine particle dispersions In order to obtain a dispersion of inorganic fine particles, it may be prepared in accordance with recent academic papers, but commercially available inorganic fine particle dispersions can also be preferably used.
- These inorganic fine particles may be surface-treated.
- mica groups such as natural mica and synthetic mica, and tabular fine particles such as talc, teniolite, montmorillonite, saponite, hectorite, zirconium phosphate represented by the formula 3MgO ⁇ 4SiO ⁇ H 2 O may be used. it can.
- examples of the natural mica include muscovite, soda mica, phlogopite, biotite and sericite.
- examples of the synthetic mica include non-swelling mica such as fluorine phlogopite mica 3 (AlSi 3 O 10 ) F 2 , potassium tetrasilicon mica KMg 2.5 Si 4 O 10 ) F 2 , and Na tetrasilicic mica NaMg 2.5 (Si 4 O 10 ) F 2 , Na or Li Teniolite (Na, Li) Mg 2 Li (Si 4 O 10 ) F 2 , Montmorillonite-based Na or Li Hectorite (Na, Li) 1/8 Mg Swellable mica such as 2/5 Li 1/8 (Si 4 O 10 ) F 2 can be used. Synthetic smectite is also useful.
- the ratio of the inorganic material in the protective layer is preferably in the range of 10 to 95% by mass, more preferably in the range of 20 to 90% by mass with respect to the entire protective layer.
- a so-called coupling agent can be used alone or mixed with other materials.
- the coupling agent is not particularly limited, such as a silane coupling agent, a titanate coupling agent, and an aluminate coupling agent, but a silane coupling agent is preferable from the viewpoint of the stability of the coating solution.
- silane coupling agent examples include halogen-containing silane coupling agents (2-chloroethyltrimethoxysilane, 2-chloroethyltriethoxysilane, 3-chloropropyltrimethoxysilane, 3-chloropropyltriethoxysilane).
- Epoxy group-containing silane coupling agent [2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, 2- (3,4-epoxycyclohexyl) ethyltriethoxysilane, 3- (3,4-epoxycyclohexyl) ) Propyltrimethoxysilane, 2-glycidyloxyethyltrimethoxysilane, 2-glycidyloxyethyltriethoxysilane, 3-glycidyloxypropyltrimethoxysilane, 3-glycidyloxypropyltriethoxysilane], amino Containing silane coupling agent (2-aminoethyltrimethoxysilane, 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 2- [N- (2-aminoethyl) amino] ethyltrimethoxysilane
- (Meth) acryloyl group-containing silane coupling agents (2-methacryloyloxyethyltrimethoxysilane, 2-methacryloyloxyethyltriethoxysilane, 2-acryloyloxyethyltrimethoxysilane, 3-methacryloyloxypropyltrimethoxysilane, 3- Methacryloyloxypropyltriethoxysilane, 3-acryloyloxypropyltrimethoxysilane, etc.).
- silane coupling agents can be used alone or in combination of two or more.
- the protective layer is blended with the organic resin or inorganic material and other components as necessary, and prepared as a coating solution by using a diluting solvent as necessary, and the coating solution is conventionally known on the substrate surface. It is preferable to form the film by applying it with an application method and then curing it by irradiation with ionizing radiation.
- irradiating with ionizing radiation ultraviolet rays in a wavelength region of 100 to 400 nm, preferably 200 to 400 nm, emitted from an ultrahigh pressure mercury lamp, a high pressure mercury lamp, a low pressure mercury lamp, a carbon arc, a metal halide lamp, or the like are irradiated.
- the irradiation can be performed by irradiating an electron beam having a wavelength region of 100 nm or less emitted from a scanning or curtain type electron beam accelerator.
- the protective layer can be cured by irradiation with vacuum ultraviolet rays using the excimer lamp described above.
- the protective layer is preferably cured by irradiation with vacuum ultraviolet rays using an excimer lamp.
- an alkoxy-modified polysiloxane coating film was formed on the coating layer, and vacuum ultraviolet rays were irradiated from above.
- the alkoxy-modified polysiloxane coating film becomes a protective layer, and further, the lower polysilazane coating film layer can be modified, and an excellent gas barrier layer can be obtained due to storage stability under high temperature and high humidity.
- a method for forming the protective layer a method for forming the polysiloxane modified layer of the intermediate layer can be applied.
- the gas barrier film of the present invention may have a desiccant layer (moisture absorbing layer).
- the material used for the desiccant layer include calcium oxide and organometallic oxide.
- calcium oxide what was disperse
- the organic metal oxide OleDry (registered trademark) series manufactured by Futaba Electronics Co., Ltd. or the like can be used.
- the gas barrier film of the present invention has a smooth layer (underlying layer, primer layer, hard coat layer) between the surface of the base material having the gas barrier layer, preferably between the base material and the first gas barrier layer. May be.
- the smooth layer is provided in order to flatten the rough surface of the base material on which protrusions and the like exist, or to fill the unevenness and pinholes generated in the gas barrier layer with the protrusions on the base material.
- Such a smooth layer may be formed of any material, but preferably includes a carbon-containing polymer, and more preferably includes a carbon-containing polymer. That is, the gas barrier film of the present invention preferably further has a smooth layer containing a carbon-containing polymer between the base material and the first gas barrier layer.
- the smooth layer also contains a carbon-containing polymer, preferably a curable resin.
- the curable resin is not particularly limited, and the active energy ray curable resin or the thermosetting material obtained by irradiating the active energy ray curable material or the like with an active energy ray such as an ultraviolet ray to be cured is heated. And thermosetting resins obtained by curing. These curable resins may be used alone or in combination of two or more.
- Examples of the active energy ray-curable material used for forming the smooth layer include a composition containing a (meth) acrylate compound, a composition containing a (meth) acrylate compound and a mercapto compound containing a thiol group, and an epoxy.
- Examples include compositions containing polyfunctional (meth) acrylate monomers such as (meth) acrylate, urethane (meth) acrylate, polyester (meth) acrylate, polyether (meth) acrylate, polyethylene glycol (meth) acrylate, and glycerol methacrylate. It is done.
- an organic / inorganic hybrid hard coat material OPSTAR (registered trademark) series compound formed by bonding an organic compound having a polymerizable unsaturated group to silica fine particles
- OPSTAR registered trademark
- JSR Corporation an ultraviolet curable material manufactured by JSR Corporation.
- Examples of reactive monomers having at least one photopolymerizable unsaturated bond in the molecule include methyl acrylate, ethyl acrylate, n-propyl acrylate, isopropyl acrylate, n-butyl acrylate, isobutyl acrylate, tert-butyl acrylate, and n-pentyl.
- composition containing the active energy ray-curable material contains a photopolymerization initiator.
- photopolymerization initiator examples include benzophenone, methyl o-benzoylbenzoate, 4,4-bis (dimethylamine) benzophenone, 4,4-bis (diethylamine) benzophenone, ⁇ -amino acetophenone, 4,4-dichloro Benzophenone, 4-benzoyl-4-methyldiphenyl ketone, dibenzyl ketone, fluorenone, 2,2-diethoxyacetophenone, 2,2-dimethoxy-2-phenylacetophenone, 2-hydroxy-2-methylpropiophenone, p- tert-Butyldichloroacetophenone, thioxanthone, 2-methylthioxanthone, 2-chlorothioxanthone, 2-isopropylthioxanthone, diethylthioxanthone, benzyldimethyl ketal, benzylmethoxyethyl acetal, benzo Methyl ether
- thermosetting materials include TutProm Series (Organic Polysilazane) manufactured by Clariant, SP COAT heat-resistant clear paint manufactured by Ceramic Coat, Nanohybrid Silicone manufactured by Adeka, Unicom manufactured by DIC, Inc. Dick (registered trademark) V-8000 series, EPICLON (registered trademark) EXA-4710 (ultra-high heat resistant epoxy resin), silicon resin X-12-2400 (trade name) manufactured by Shin-Etsu Chemical Co., Ltd., Nitto Boseki Co., Ltd.
- thermosetting urethane resin composed of acrylic polyol and isocyanate prepolymer, phenol resin, urea melamine resin, epoxy resin, unsaturated polyester resin, silicone resin, polyamidoamine-epichlorohydrin resin And the like.
- the method for forming the smooth layer is not particularly limited, but a coating solution containing a curable material is applied to a dry coating method such as a spin coating method, a spray method, a blade coating method, a dipping method, a gravure printing method, or a vapor deposition method.
- a dry coating method such as a spin coating method, a spray method, a blade coating method, a dipping method, a gravure printing method, or a vapor deposition method.
- active energy rays such as visible light, infrared rays, ultraviolet rays, X-rays, ⁇ rays, ⁇ rays, ⁇ rays, electron beams, and / or heating.
- a method of forming by curing is preferred.
- an ultra-high pressure mercury lamp, a high-pressure mercury lamp, a low-pressure mercury lamp, a carbon arc, a metal halide lamp or the like is preferably used to irradiate ultraviolet rays in a wavelength region of 100 to 400 nm, more preferably 200 to 400 nm.
- a method of irradiating an electron beam having a wavelength region of 100 nm or less emitted from a scanning or curtain type electron beam accelerator can be used.
- Solvents used when forming a smooth layer using a coating solution in which a curable material is dissolved or dispersed in a solvent include alcohols such as methanol, ethanol, n-propyl alcohol, isopropyl alcohol, ethylene glycol, and propylene glycol Terpenes such as ⁇ - or ⁇ -terpineol, etc., ketones such as acetone, methyl ethyl ketone, cyclohexanone, N-methyl-2-pyrrolidone, diethyl ketone, 2-heptanone, 4-heptanone, toluene, xylene, tetramethylbenzene, etc.
- alcohols such as methanol, ethanol, n-propyl alcohol, isopropyl alcohol, ethylene glycol, and propylene glycol Terpenes such as ⁇ - or ⁇ -terpineol, etc.
- ketones such as acetone, methyl ethyl ketone
- the smooth layer can contain additives such as a thermoplastic resin, an antioxidant, an ultraviolet absorber, and a plasticizer, if necessary, in addition to the above-described materials.
- an appropriate resin or additive may be used for improving the film formability and preventing the occurrence of pinholes in the film.
- the thermoplastic resin include cellulose derivatives such as acetylcellulose, nitrocellulose, acetylbutylcellulose, ethylcellulose and methylcellulose, vinyl acetate and copolymers thereof, vinyl chloride and copolymers thereof, vinylidene chloride and copolymers thereof and the like.
- Examples include resins, acetal resins such as polyvinyl formal and polyvinyl butyral, acrylic resins and copolymers thereof, acrylic resins such as methacrylic resins and copolymers thereof, polystyrene resins, polyamide resins, linear polyester resins, and polycarbonate resins. .
- the smoothness of the smooth layer is a value expressed by the surface roughness specified by JIS B 0601: 2001, and the maximum cross-sectional height Rt (p) is preferably 10 nm or more and 30 nm or less.
- the surface roughness is calculated from an uneven cross-sectional curve continuously measured by an AFM (Atomic Force Microscope) with a detector having a stylus having a minimum tip radius, and the measurement direction is several tens by the stylus having a minimum tip radius. It is the roughness related to the amplitude of fine irregularities measured in a section of ⁇ m many times.
- AFM Anamic Force Microscope
- the thickness of the smooth layer is not particularly limited, but is preferably in the range of 0.1 to 10 ⁇ m.
- an anchor coat layer On the surface of the base material, an anchor coat layer may be formed as an easy-adhesion layer for the purpose of improving adhesiveness (adhesion).
- the anchor coat agent used in this anchor coat layer include polyester resin, isocyanate resin, urethane resin, acrylic resin, ethylene / vinyl alcohol resin, vinyl-modified resin, epoxy resin, modified styrene resin, modified silicon resin, and alkyl titanate. Can be used alone or in combination of two or more.
- a commercially available product may be used as the anchor coating agent. Specifically, a siloxane-based UV curable polymer solution (manufactured by Shin-Etsu Chemical Co., Ltd., “X-12-2400” in 3% isopropyl alcohol) can be used.
- the above-mentioned anchor coating agent is coated on a substrate by a known method such as roll coating, gravure coating, knife coating, dip coating, spray coating, and the like, and is coated by drying and removing the solvent, diluent, etc. Can do.
- the application amount of the anchor coating agent is preferably about 0.1 to 5 g / m 2 (dry state).
- a commercially available base material with an easy-adhesion layer may be used.
- the anchor coat layer can be formed by a vapor phase method such as physical vapor deposition or chemical vapor deposition.
- a vapor phase method such as physical vapor deposition or chemical vapor deposition.
- an inorganic film mainly composed of silicon oxide can be formed for the purpose of improving adhesion and the like.
- the thickness of the anchor coat layer is not particularly limited, but is preferably about 0.5 to 10.0 ⁇ m.
- the gas barrier film of the present invention may have a bleed-out preventing layer on the base material surface opposite to the surface on which the gas barrier layer is provided.
- the bleed-out prevention layer is provided for the purpose of suppressing a phenomenon that, when the film is heated, unreacted oligomers and the like move from the film to the surface and contaminate the contact surface.
- the bleed-out prevention layer may basically have the same configuration as the smooth layer as long as it has this function.
- the unsaturated organic compound having a polymerizable unsaturated group that can be contained as a hard coat agent in the bleed-out prevention layer is a polyunsaturated organic compound having two or more polymerizable unsaturated groups in the molecule.
- a monovalent unsaturated organic compound having one polymerizable unsaturated group in the molecule can be exemplified.
- the polyunsaturated organic compound for example, ethylene glycol di (meth) acrylate, diethylene glycol di (meth) acrylate, glycerol di (meth) acrylate, glycerol tri (meth) acrylate, 1,4-butanediol di- (Meth) acrylate, 1,6-hexanediol di (meth) acrylate, neopentyl glycol di (meth) acrylate, trimethylolpropane tri (meth) acrylate, dicyclopentanyl di (meth) acrylate, pentaerythritol tri (meth) ) Acrylate, pentaerythritol tetra (meth) acrylate, dipentaerythritol hexa (meth) acrylate, dipentaerythritol monohydroxypenta (meth) acrylate, ditrimethylolpro Ntetora (
- Examples of monounsaturated organic compounds include methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, butyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, isodecyl (meth) acrylate, and lauryl.
- Matting agents may be added as other additives.
- inorganic particles having an average particle diameter of about 0.1 to 5 ⁇ m are preferable.
- inorganic particles one or more of silica, alumina, talc, clay, calcium carbonate, magnesium carbonate, barium sulfate, aluminum hydroxide, titanium dioxide, zirconium oxide and the like can be used in combination. .
- the matting agent composed of inorganic particles is 2 parts by mass or more, preferably 4 parts by mass or more, more preferably 6 parts by mass or more and 20 parts by mass or less, preferably 18 parts per 100 parts by mass of the solid content of the hard coat agent. It is desirable that they are mixed in a proportion of not more than part by mass, more preferably not more than 16 parts by mass.
- the bleed-out prevention layer may contain a thermoplastic resin, a thermosetting resin, an ionizing radiation curable resin, a photopolymerization initiator, and the like as other components of the hard coat agent and the mat agent.
- thermoplastic resins examples include cellulose derivatives such as acetylcellulose, nitrocellulose, acetylbutylcellulose, ethylcellulose, methylcellulose, vinyl acetate and copolymers thereof, vinyl chloride and copolymers thereof, vinylidene chloride and copolymers thereof.
- Vinyl resins such as polyvinyl formal, acetal resins such as polyvinyl formal and polyvinyl butyral, acrylic resins and copolymers thereof, acrylic resins such as methacrylic resins and copolymers thereof, polystyrene resins, polyamide resins, linear polyester resins, polycarbonates Examples thereof include resins.
- thermosetting resin examples include thermosetting urethane resin composed of (meth) acrylic polyol and isocyanate prepolymer, phenol resin, urea melamine resin, epoxy resin, unsaturated polyester resin, silicon resin and the like.
- an ionizing radiation curable resin an ionizing radiation (ultraviolet ray or electron beam) is irradiated to an ionizing radiation curable coating material in which one or more of a photopolymerizable prepolymer or a photopolymerizable monomer is mixed. Those that cure can be used.
- a photopolymerizable prepolymer a (meth) acrylic prepolymer having two or more (meth) acryloyl groups in one molecule and forming a three-dimensional network structure by crosslinking and curing is particularly preferably used.
- the (meth) acrylic prepolymer urethane (meth) acrylate, polyester (meth) acrylate, epoxy (meth) acrylate, melamine (meth) acrylate, and the like can be used. Further, as the photopolymerizable monomer, the polyunsaturated organic compounds described above can be used.
- photopolymerization initiators include acetophenone, benzophenone, Michler ketone, benzoin, benzylmethyl ketal, benzoin benzoate, hydroxycyclohexyl phenyl ketone, 2-methyl-1- (4- (methylthio) phenyl) -2- (4-morpholinyl). ) -1-propane, ⁇ -acyloxime ester, thioxanthone and the like.
- the bleed-out prevention layer as described above is formulated as a coating solution with a hard coating agent, a matting agent, and other components as necessary, and appropriately prepared as a dilution solvent to support the coating solution. It can form by apply
- ultraviolet rays having a wavelength range of 100 to 400 nm, preferably 200 to 400 nm, emitted from an ultrahigh pressure mercury lamp, a high pressure mercury lamp, a low pressure mercury lamp, a carbon arc, a metal halide lamp, or the like are irradiated or scanned.
- the irradiation can be performed by irradiating an electron beam having a wavelength region of 100 nm or less emitted from a type or curtain type electron beam accelerator.
- the thickness of the bleed-out preventing layer ranges from 1.0 to 10 ⁇ m from the viewpoint of improving the heat resistance of the film, facilitating the balance adjustment of the optical properties of the film, and adjusting the curl of the gas barrier film. More preferably, it is preferably in the range of 2 ⁇ m to 7 ⁇ m.
- the gas barrier film of the present invention can be continuously produced and wound into a roll form (so-called roll-to-roll production). In that case, it is preferable to stick and wind up a protective sheet on the surface in which the gas barrier layer was formed.
- a protective sheet is applied in a place with a high degree of cleanliness. It is very effective to prevent the adhesion of dust. In addition, it is effective for preventing scratches on the gas barrier layer surface that enters during winding.
- the protective sheet is not particularly limited, and general “protective sheet” and “release sheet” having a configuration in which a weakly adhesive layer is provided on a resin substrate having a thickness of about 100 ⁇ m can be used.
- the water vapor transmission rate of the gas barrier film of the present invention is preferably as low as possible, but is preferably 0.001 to 0.00001 g / m 2 ⁇ 24 h, for example, 0.0001 to 0.00001 g / m 2 ⁇ 24 h. More preferably.
- the method for measuring the water vapor transmission rate is not particularly limited, but in the present invention, the water vapor transmission rate measurement method was measured by the following Ca method.
- Vapor Deposition Equipment Vacuum Deposition Equipment JEE-400 manufactured by JEOL Ltd.
- Constant temperature and humidity oven Yamato Humidic Chamber IG47M Metal that reacts with water and corrodes: Calcium (granular)
- Water vapor impermeable metal Aluminum ( ⁇ 3-5mm, granular) Production of Cell for Evaluating Water Vapor Barrier Properties Metal calcium was deposited on the gas barrier layer surface of the gas barrier film sample using a vacuum deposition apparatus (vacuum deposition apparatus JEE-400 manufactured by JEOL Ltd.).
- vacuum deposition apparatus vacuum deposition apparatus JEE-400 manufactured by JEOL Ltd.
- vapor deposition performed masking except the part (12 mm x 12 mm 9 places) to vapor-deposit of a gas-barrier film sample.
- the mask was removed in a vacuum state, and aluminum was deposited from another metal deposition source on the entire surface of one side of the sheet.
- the vacuum state is released, and the aluminum sealing side is quickly passed through a UV-curable resin (manufactured by Nagase ChemteX Corporation) to 0.2 mm thick quartz glass in a dry nitrogen gas atmosphere.
- an evaluation cell was produced by irradiating with ultraviolet rays. Further, as shown in the examples described later, in order to confirm the change in gas barrier properties before and after bending, the same water vapor is applied to the gas barrier film subjected to the bending treatment and the gas barrier film not subjected to the bending treatment. A cell for evaluating barrier properties was produced.
- the obtained sample with both sides sealed was stored at 85 ° C. and 95% RH under high temperature and high humidity, and permeated into the cell from the corrosion amount of metallic calcium based on the method described in JP-A-2005-283561. The amount of water was calculated.
- a sample obtained by depositing metallic calcium using a quartz glass plate having a thickness of 0.2 mm instead of the gas barrier film sample as a comparative sample was stored under the same high temperature and high humidity of 85 ° C. and 95% RH, and it was confirmed that no corrosion of metallic calcium occurred even after 100 hours.
- the gas barrier film of the present invention can be preferably used for a device whose performance is deteriorated by chemical components (oxygen, water, nitrogen oxide, sulfur oxide, ozone, etc.) in the air. That is, this invention provides the electronic device which has an electronic device main body and the gas barrier film of this invention, or the gas barrier film obtained by the manufacturing method which concerns on this invention.
- Examples of the devices include electronic devices such as organic EL elements, liquid crystal display elements (LCD), thin film transistors, touch panels, electronic paper, solar cells (PV), and the like. From the viewpoint that the effect of the present invention can be obtained more efficiently, it is preferably used for an organic EL device or a solar cell, and particularly preferably used for an organic EL device.
- organic EL elements liquid crystal display elements (LCD), thin film transistors, touch panels, electronic paper, solar cells (PV), and the like.
- LCD liquid crystal display elements
- PV solar cells
- the gas barrier film of the present invention can also be used for device film sealing. That is, it is a method of providing the gas barrier film of the present invention on the surface of the device itself as a support.
- the device may be covered with a protective layer before providing the gas barrier film.
- the gas barrier film of the present invention can also be used as a device substrate or a film for sealing by a solid sealing method.
- the solid sealing method is a method in which after a protective layer is formed on a device, an adhesive layer and a gas barrier film are stacked and cured.
- the adhesive is not particularly limited, and examples thereof include a thermosetting epoxy resin and a photocurable (meth) acrylate resin.
- Organic EL device Examples of organic EL elements using a gas barrier film are described in detail in JP-A-2007-30387.
- the reflective liquid crystal display device has a configuration including a lower substrate, a reflective electrode, a lower alignment film, a liquid crystal layer, an upper alignment film, a transparent electrode, an upper substrate, a ⁇ / 4 plate, and a polarizing film in order from the bottom.
- the gas barrier film in the present invention can be used as the transparent electrode substrate and the upper substrate. In the case of color display, it is preferable to further provide a color filter layer between the reflective electrode and the lower alignment film, or between the upper alignment film and the transparent electrode.
- the transmissive liquid crystal display device includes, in order from the bottom, a backlight, a polarizing plate, a ⁇ / 4 plate, a lower transparent electrode, a lower alignment film, a liquid crystal layer, an upper alignment film, an upper transparent electrode, an upper substrate, a ⁇ / 4 plate, and a polarization It has a structure consisting of a film. In the case of color display, it is preferable to further provide a color filter layer between the lower transparent electrode and the lower alignment film, or between the upper alignment film and the transparent electrode.
- the type of the liquid crystal cell is not particularly limited, but more preferably a TN type (Twisted Nematic), an STN type (Super Twisted Nematic), a HAN type (Hybrid Aligned Nematic), a VA type (Vertical Alignment E), EC type. Controlled birefringence), OCB type (Optically Compensated Bend), IPS type (In-Plane Switching), and CPA type (Continuous Pinheal Alignment) are preferable.
- TN type Transmission Nematic
- STN type Super Twisted Nematic
- HAN type Hybrid Aligned Nematic
- VA type Very Alignment E
- EC type Controlled birefringence
- OCB type Optically Compensated Bend
- IPS type In-Plane Switching
- CPA type Continuous Pinheal Alignment
- the gas barrier film of the present invention can also be used as a sealing film for solar cell elements.
- the gas barrier film of the present invention is preferably sealed so that the gas barrier layer is closer to the solar cell element.
- the solar cell element in which the gas barrier film of the present invention is preferably used is not particularly limited. For example, it is a single crystal silicon solar cell element, a polycrystalline silicon solar cell element, a single junction type, or a tandem structure type.
- Amorphous silicon-based solar cell elements III-V group compound semiconductor solar cell elements such as gallium arsenide (GaAs) and indium phosphorus (InP), II-VI group compound semiconductor solar cell elements such as cadmium tellurium (CdTe), I-III- such as copper / indium / selenium (so-called CIS), copper / indium / gallium / selenium (so-called CIGS), copper / indium / gallium / selenium / sulfur (so-called CIGS), etc.
- Group VI compound semiconductor solar cell element dye-sensitized solar cell element, organic solar cell element, etc. And the like.
- the solar cell element is a copper / indium / selenium system (so-called CIS system), a copper / indium / gallium / selenium system (so-called CIGS system), copper / indium / gallium / selenium / sulfur.
- CIS system copper / indium / selenium system
- CIGS system copper / indium / gallium / selenium system
- sulfur copper / indium / gallium / selenium / sulfur.
- a group I-III-VI compound semiconductor solar cell element such as a system (so-called CIGSS system) is preferable.
- the gas barrier film of the present invention can also be used as an optical member.
- the optical member include a circularly polarizing plate.
- a circularly polarizing plate can be produced by laminating a ⁇ / 4 plate and a polarizing plate using the gas barrier film in the present invention as a substrate. In this case, the lamination is performed so that the angle formed by the slow axis of the ⁇ / 4 plate and the absorption axis of the polarizing plate is 45 °.
- a polarizing plate one that is stretched in a direction of 45 ° with respect to the longitudinal direction (MD) is preferably used.
- MD longitudinal direction
- those described in JP-A-2002-865554 can be suitably used. .
- Base material A Transparent resin base material with a hard coat layer (intermediate layer) (polyethylene terephthalate (PET) film with a clear hard coat layer (CHC) manufactured by Kimoto Co., Ltd.), and the hard coat layer is a UV curable resin mainly composed of an acrylic resin Configuration, PET thickness 125 ⁇ m, CHC thickness 6 ⁇ m)
- the substrates B and C those obtained by changing only the transparent resin substrate of the substrate A to the following were used.
- Substrate B Melinex (registered trademark) (manufactured by Teijin DuPont Films, model number 542, thickness 50 ⁇ m)
- Substrate C Teijin (registered trademark) Tetron (registered trademark) film (manufactured by Teijin Limited, model number G2P2, thickness 25 ⁇ m).
- ⁇ Simultaneous multilayer coating> A slide hopper coating apparatus capable of coating four layers simultaneously was used. While keeping the polysilazane-containing coating solution prepared above at 23 ° C., on the substrate A having a size of 210 mm ⁇ 350 mm heated to 23 ° C. as the substrate, the film thickness at the time of drying becomes 30 nm for each layer. A total of 4 layers were simultaneously applied.
- a vacuum ultraviolet ray irradiation treatment was applied from the side of the polysilazane coating film layer, which is the fourth gas barrier layer farthest from the substrate, by the following apparatus and method. 1) was produced.
- Ultraviolet irradiation device Eximer irradiation device MODEL MECL-M-1-200 manufactured by M.D.Com Wavelength 172nm, stage temperature 100 ° C Integrated light quantity 3500 mJ / cm 2 , oxygen concentration 0.1 volume%.
- 11 is an apparatus chamber, which supplies a proper amount of nitrogen and oxygen from a gas supply port (not shown) to the inside and exhausts gas from a gas discharge port (not shown), thereby substantially removing water vapor from the inside of the chamber.
- the oxygen concentration can be maintained at a predetermined concentration.
- Reference numeral 12 denotes an Xe excimer lamp having a double tube structure that irradiates vacuum ultraviolet rays of 172 nm
- reference numeral 13 denotes an excimer lamp holder that also serves as an external electrode.
- Reference numeral 14 denotes a sample stage. The sample stage 14 can be reciprocated horizontally at a predetermined speed in the apparatus chamber 11 by a moving means (not shown).
- the sample stage 14 can be maintained at a predetermined temperature by a heating means (not shown).
- Reference numeral 15 denotes a sample on which a polysilazane coating layer is formed. When the sample stage moves horizontally, the height of the sample stage is adjusted so that the shortest distance between the surface of the sample coating layer and the excimer lamp tube surface is 3 mm.
- Reference numeral 16 denotes a light shielding plate, which prevents the vacuum ultraviolet light from being applied to the coating layer of the sample during the aging of the Xe excimer lamp 12.
- the energy irradiated to the coating film surface in the vacuum ultraviolet irradiation process was measured using a 172 nm sensor head using a UV integrating light meter: C8026 / H8025 UV POWER METER manufactured by Hamamatsu Photonics Co., Ltd.
- the sensor head is installed in the center of the sample stage 14 so that the shortest distance between the Xe excimer lamp tube surface and the measurement surface of the sensor head is 3 mm, and the atmosphere in the apparatus chamber 11 is irradiated with vacuum ultraviolet rays. Nitrogen and oxygen were supplied so that the oxygen concentration was the same as that in the process, and the sample stage 14 was moved at a speed of 0.5 m / min for measurement.
- an aging time of 10 minutes was provided after the Xe excimer lamp was turned on, and then the sample stage was moved to start the measurement.
- the moving speed of the sample stage was adjusted to adjust the irradiation energy to 3500 mJ / cm 2 .
- the vacuum ultraviolet irradiation was performed after aging for 10 minutes as in the case of irradiation energy measurement.
- Comparative Example 2 A gas barrier film (Sample No. 2) was produced in the same manner as in Comparative Example 1 except that after vacuum ultraviolet irradiation, a temperature treatment was further performed at 40 ° C. for 24 hours.
- Comparative Example 3 A gas barrier film (sample No. 3) was produced in the same manner as in Comparative Example 1 except that the substrate A was changed to the substrate B.
- Comparative Example 4 A gas barrier film (Sample No. 4) was produced in the same manner as in Comparative Example 3, except that after the vacuum ultraviolet irradiation, a temperature treatment was further performed at 40 ° C. for 24 hours.
- Example 5 A gas barrier film (sample No. 5) was produced in the same manner as in Comparative Example 1 except that the substrate A was changed to the substrate C.
- Example 6 A gas barrier film (Sample No. 6) was produced in the same manner as in Comparative Example 3 except that after vacuum irradiation, a temperature treatment was further performed at 40 ° C. for 24 hours.
- Comparative Example 7 The polysilazane-containing coating solution prepared in Comparative Example 1 was formed on the substrate A with a spin coater so as to have a thickness of 30 nm, allowed to stand for 2 minutes, and then subjected to additional heat treatment for 1 minute on an 80 ° C. hot plate. And a polysilazane coating layer was formed. Thereafter, the apparatus and method of Comparative Example 1 were used to perform vacuum ultraviolet irradiation to form a first gas barrier layer.
- a gas barrier film (Sample No. 8) was produced in the same manner as in Comparative Example 7, except that a temperature treatment was further performed at 40 ° C. for 24 hours.
- Comparative Example 9 A gas barrier film (sample No. 9) was produced in the same manner as in Comparative Example 7 except that the substrate A was changed to the substrate B.
- a gas barrier film (Sample No. 10) was produced in the same manner as in Comparative Example 9, except that a temperature treatment was further performed at 40 ° C. for 24 hours.
- a gas barrier film (Sample No. 12) was produced in the same manner as in Comparative Example 11 except that a temperature treatment was further performed at 40 ° C. for 24 hours.
- Example 1 An aluminum-containing coating solution was prepared by the following method.
- Comparative Example 1 except that the simultaneous multilayer coating was performed so as to form a coating film layer (coating layer furthest away from the substrate) serving as the fourth gas barrier layer from the aluminum-containing coating solution obtained above. Similarly, a gas barrier film (sample No. 13) was produced. The content of aluminum in the fourth gas barrier layer was 40% by mass.
- Example 2 A gas barrier film (Sample No. 14) was produced in the same manner as in Example 1 except that after vacuum ultraviolet irradiation, a temperature treatment was further performed at 40 ° C. for 24 hours.
- Example 3 A gas barrier film (sample No. 15) was produced in the same manner as in Example 1 except that the substrate A was changed to the substrate B.
- Example 4 A gas barrier film (Sample No. 16) was produced in the same manner as in Example 3 except that after vacuum irradiation, a temperature treatment was further performed at 40 ° C. for 24 hours.
- Example 5 A gas barrier film (sample No. 17) was produced in the same manner as in Example 1 except that the substrate A was changed to the substrate C.
- Example 6 A gas barrier film (sample No. 18) was produced in the same manner as in Example 5 except that after the vacuum ultraviolet irradiation, a temperature treatment was further performed at 40 ° C. for 24 hours.
- Example 7 Using the aluminum-containing coating solution prepared in Example 1, simultaneous multilayer coating was performed so as to form an aluminum-containing polysilazane coating layer serving as the second gas barrier layer and an aluminum-containing polysilazane coating layer serving as the fourth gas barrier layer.
- a gas barrier film (Sample No. 19) was produced in the same manner as in Comparative Example 1 except that this was done.
- the aluminum content in the second gas barrier layer and the fourth gas barrier layer was 40% by mass.
- Example 8 A gas barrier film (Sample No. 20) was produced in the same manner as in Example 7 except that after vacuum ultraviolet irradiation, a temperature treatment was further performed at 40 ° C. for 24 hours.
- Example 9 A gas barrier film (sample No. 21) was produced in the same manner as in Example 7 except that the substrate A was changed to the substrate B.
- Example 10 A gas barrier film (Sample No. 22) was produced in the same manner as in Example 9 except that after vacuum ultraviolet irradiation, a temperature treatment was further performed at 40 ° C. for 24 hours.
- Example 11 A gas barrier film (sample No. 23) was produced in the same manner as in Example 7 except that the substrate A was changed to the substrate C.
- Example 12 A gas barrier film (Sample No. 24) was produced in the same manner as in Example 11 except that after vacuum ultraviolet irradiation, temperature treatment was further performed at 40 ° C. for 24 hours.
- Example 13 Instead of ALCH in the aluminum-containing coating solution prepared in Example 1, 0.306 g of gallium (III) isopropoxide (manufactured by Wako Pure Chemical Industries, Ltd.) was added to prepare a gallium-containing coating solution. Except for using this gallium-containing coating solution, simultaneous multi-layer coating was performed so as to form a gallium-containing polysilazane coating layer serving as a second gas barrier layer and a gallium-containing polysilazane coating layer serving as a fourth gas barrier layer. In the same manner as in Example 9, a gas barrier film (Sample No. 25) was produced.
- Example 14 Instead of ALCH in the aluminum-containing coating solution prepared in Example 1, 0.306 g of indium (III) isopropoxide (manufactured by Wako Pure Chemical Industries, Ltd.) was added to prepare an indium-containing coating solution. Except for using this indium-containing coating solution, simultaneous multi-layer coating was performed so as to form an indium-containing polysilazane coating layer serving as a second gas barrier layer and an indium-containing polysilazane coating layer serving as a fourth gas barrier layer. In the same manner as in Example 9, a gas barrier film (Sample No. 26) was produced.
- indium (III) isopropoxide manufactured by Wako Pure Chemical Industries, Ltd.
- Example 15 Instead of ALCH in the aluminum-containing coating solution prepared in Example 1, 0.306 g of magnesium ethoxide (manufactured by Wako Pure Chemical Industries, Ltd.) was added to prepare a magnesium-containing coating solution. Using this magnesium-containing coating solution, except that simultaneous multilayer coating was performed so as to form a magnesium-containing polysilazane coating layer serving as a second gas barrier layer and a magnesium-containing polysilazane coating layer serving as a fourth gas barrier layer In the same manner as in Example 9, a gas barrier film (Sample No. 27) was produced.
- Example 16 Instead of ALCH in the aluminum-containing coating solution prepared in Example 1, 0.306 g of calcium isopropoxide (manufactured by Wako Pure Chemical Industries, Ltd.) was added to prepare a calcium-containing coating solution. Using this calcium-containing coating solution, except that simultaneous multi-layer coating was performed so as to form a calcium-containing polysilazane coating layer serving as a second gas barrier layer and a calcium-containing polysilazane coating layer serving as a fourth gas barrier layer. In the same manner as in Example 9, a gas barrier film (Sample No. 28) was produced.
- Example 17 Instead of ALCH in the aluminum-containing coating solution prepared in Example 1, 0.306 g of triisopropyl borate (manufactured by Wako Pure Chemical Industries, Ltd.) was added to prepare a boron-containing coating solution. Using this boron-containing coating solution, except that simultaneous multi-layer coating was performed so as to form a boron-containing polysilazane coating layer serving as a second gas barrier layer and a boron-containing polysilazane coating layer serving as a fourth gas barrier layer In the same manner as in Example 9, a gas barrier film (Sample No. 29) was produced.
- a first gas barrier layer (deposition gas barrier layer) was formed by an atmospheric pressure plasma method using a roll-to-roll atmospheric pressure plasma film forming apparatus as shown in FIG. Specifically, a first gas barrier layer (thickness 30 nm) made of silicon oxycarbide (SiOC) was formed on the base material B having a size of 210 mm ⁇ 350 mm under the thin film formation conditions shown in Table 1 below. When the elastic modulus E1 of the first gas barrier layer was measured by the nanointention method, it was 30 GPa uniformly in the film thickness direction.
- Second to third gas barrier layers (polysilazane coating layer)
- a film was formed on the first gas barrier layer with a spin coater to a thickness of 30 nm, allowed to stand for 2 minutes, and then 1 minute on an 80 ° C. hot plate. Additional heat treatment was performed to form a second polysilazane coating layer. Thereafter, vacuum ultraviolet irradiation was performed by the above apparatus and method (however, the integrated light amount was 2000 mJ / cm 2 ) to form a second gas barrier layer.
- a third gas barrier layer was further formed on the second gas barrier layer by the same method as the formation of the second gas barrier layer. In this way, a gas barrier film (Sample No. 31) was produced.
- a coating layer serving as the second gas barrier layer and a coating layer serving as the third gas barrier layer are formed by simultaneous multilayer coating and drying, and vacuum ultraviolet irradiation is applied from the side of the coating layer serving as the third gas barrier layer.
- a gas barrier film (Sample No. 32) was produced in the same manner as in Comparative Example 14 except that the integrated light quantity was 2000 mJ / cm 2 .
- Example 18 Using the aluminum-containing coating solution prepared in Example 1, similar to Comparative Example 15, except that simultaneous multi-layer coating was performed so as to form an aluminum-containing polysilazane coating film serving as a third gas barrier layer. A gas barrier film (Sample No. 33) was produced.
- Example 19 Using the aluminum-containing coating solution prepared in Example 1, using the same multilayer coating so as to form an aluminum-containing polysilazane coating layer serving as the second gas barrier layer, as in Comparative Example 15, A gas barrier film (Sample No. 34) was produced.
- Evaluation of the water vapor barrier property was performed by depositing metal calcium having a thickness of 80 nm on a gas barrier film, and evaluating the time when the formed calcium was 50% area as 50% area time (see below). ). The 50% area time before and after exposure for 100 hours was evaluated, and the 50% area time after exposure / 50% area time before exposure was calculated as the retention rate (%) and shown in Table 3. As an index of retention rate, 70% or more was considered acceptable, and less than 70% was judged as nonconforming.
- Vapor deposition device JEOL Ltd., vacuum vapor deposition device JEE-400 Constant temperature and humidity oven: Yamato Humidic Chamber IG47M (raw materials) Metal that reacts with water and corrodes: Calcium (granular) Water vapor impermeable metal: Aluminum ( ⁇ 3-5mm, granular) (Preparation of water vapor barrier property evaluation sample)
- a vacuum vapor deposition apparatus manufactured by JEOL Ltd., vacuum vapor deposition apparatus JEE-400
- metallic calcium was vapor-deposited in a size of 12 mm ⁇ 12 mm through a mask on the outermost gas barrier layer surface of the produced gas barrier film. At this time, the deposited film thickness was set to 80 nm.
- the mask was removed in a vacuum state, and aluminum was vapor-deposited on the entire surface of one side of the sheet and temporarily sealed.
- the vacuum state is released, and it is immediately transferred to a dry nitrogen gas atmosphere, and a quartz glass with a thickness of 0.2 mm is bonded to the aluminum vapor-deposited surface via an ultraviolet curing resin for sealing (manufactured by Nagase ChemteX Corporation).
- the water vapor barrier property evaluation sample was produced by irradiating ultraviolet rays to cure and adhere the resin to perform main sealing.
- the obtained sample was stored under high temperature and high humidity of 85 ° C. and 95% RH, and the state in which metallic calcium was corroded with respect to the storage time was observed.
- the observation was obtained by linearly interpolating the time at which the area where metal calcium was corroded with respect to the metal calcium vapor deposition area of 12 mm ⁇ 12 mm to 50% from the observation results.
- This test consists of a sample before being exposed to high temperature and high humidity of 85 ° C. and 95% RH for 100 hours, and a sample after exposure to high temperature and high humidity of 85 ° C. and 95% RH for 100 hours (after DH 100 hr). I went in both.
- Deterioration resistance (water vapor permeability after bending test / water vapor permeability before bending test) ⁇ 100 (%) 5: Deterioration resistance is 95% or more 4: Deterioration resistance is 85% or more and less than 95% 3: Deterioration resistance is 50% or more and less than 85% 2: Deterioration resistance is 10% or more and 50% Less than 1: Deterioration resistance is less than 10%.
- This test consists of a sample before being exposed to high temperature and high humidity of 85 ° C. and 95% RH for 100 hours, and a sample after exposure to high temperature and high humidity of 85 ° C. and 95% RH for 100 hours (after DH 100 hr). I went in both.
- ITO indium tin oxide
- first electrode layer On the outermost gas barrier layer of each gas barrier film, ITO (indium tin oxide) having a thickness of 150 nm was formed by sputtering and patterned by photolithography to form a first electrode layer. The pattern was such that the light emission area was 50 mm square.
- the following hole transport layer forming coating solution was applied by an extrusion coater and then dried to form a hole transport layer. .
- the coating liquid for forming the hole transport layer was applied so that the thickness after drying was 50 nm.
- the gas barrier film was subjected to cleaning surface modification using a low-pressure mercury lamp with a wavelength of 184.9 nm at an irradiation intensity of 15 mW / cm 2 and a distance of 10 mm.
- a static eliminator using weak X-rays was used for the charge removal treatment.
- ⁇ Application conditions> The coating process was performed in an atmosphere of 25 ° C. and a relative humidity of 50% RH.
- ⁇ Drying and heat treatment conditions After applying the hole transport layer forming coating solution, the solvent is removed at a height of 100 mm toward the film formation surface, a discharge air velocity of 1 m / s, a wide air velocity distribution of 5%, and a temperature of 100 ° C., followed by heat treatment.
- the back surface heat transfer type heat treatment was performed at a temperature of 150 ° C. using an apparatus to form a hole transport layer.
- the following coating solution for forming a white light-emitting layer was applied by an extrusion coater and then dried to form a light-emitting layer.
- the white light emitting layer forming coating solution was applied so that the thickness after drying was 40 nm.
- ⁇ White luminescent layer forming coating solution > 1.0 g of the following HA of the host material, 100 mg of the following DA of the dopant material, 0.2 mg of the following DB of the dopant material, 0.2 mg of the following DC of the dopant material, was dissolved in 100 g of toluene to prepare a coating solution for forming a white light emitting layer.
- the coating process was performed in an atmosphere having a nitrogen gas concentration of 99% by volume or more, a coating temperature of 25 ° C., and a coating speed of 1 m / min.
- the coating process was performed in an atmosphere having a nitrogen gas concentration of 99% by volume or more, the coating temperature of the coating liquid for forming an electron transport layer was 25 ° C., and the coating speed was 1 m / min.
- an electron injection layer was formed on the formed electron transport layer.
- the substrate was put into a decompression chamber and decompressed to 5 ⁇ 10 ⁇ 4 Pa.
- cesium fluoride prepared in a tantalum vapor deposition boat was heated in a vacuum chamber to form an electron injection layer having a thickness of 3 nm.
- Second electrode Except for the portion that becomes the extraction electrode on the first electrode, aluminum is used as the second electrode forming material on the formed electron injection layer under a vacuum of 5 ⁇ 10 ⁇ 4 Pa so as to have the extraction electrode. Then, a mask pattern was formed by vapor deposition so that the light emission area was 50 mm square, and a second electrode having a thickness of 100 nm was laminated.
- the gas barrier film formed up to the second electrode was moved again to a nitrogen atmosphere and cut into a prescribed size using an ultraviolet laser.
- Crimping conditions Crimping was performed at a temperature of 170 ° C. (ACF temperature 140 ° C. measured separately using a thermocouple), a pressure of 2 MPa, and 10 seconds.
- the organic EL element to which the electrode lead (flexible printed circuit board) was connected was bonded to a sealing member using a commercially available roll laminating apparatus to produce an organic EL element.
- PET polyethylene terephthalate
- PET polyethylene terephthalate
- dry lamination adhesive two-component reaction type urethane adhesive
- thermosetting adhesive was uniformly applied to the aluminum surface with a thickness of 20 ⁇ m along the adhesive surface (glossy surface) of the aluminum foil.
- thermosetting adhesive The following epoxy adhesive was used as the thermosetting adhesive.
- the sealing substrate is closely attached and arranged so as to cover the joint portion of the take-out electrode and the electrode lead, and pressure bonding conditions using the pressure roll: pressure roll temperature 120 ° C., pressure 0.5 MPa, apparatus speed 0. Adherent sealing was performed at 3 m / min.
- Element deterioration tolerance rate (area of black spots generated in elements not subjected to accelerated deterioration processing / area of black spots generated in elements subjected to accelerated deterioration processing) ⁇ 100 (%)
- the gas barrier film of the present invention produced according to the examples has a high gas barrier property even when using a thin base material as compared with the conventional film, and even after being stored under high temperature and high humidity conditions. Excellent interlaminar adhesion and bending resistance and less cracking. Moreover, it has the effect of reducing generation
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Abstract
Description
本発明のガスバリア性フィルムは、基材と、複数のガスバリア層と、を有する。本発明のガスバリア性フィルムは、他の部材をさらに含むものであってもよい。本発明のガスバリア性フィルムは、例えば、基材といずれかのガスバリア層との間に、いずれかのガスバリア層の上に、またはガスバリア層が形成されていない基材の他方の面に、他の部材を有していてもよい。ここで、他の部材としては、特に制限されず、従来のガスバリア性フィルムに使用される部材が同様にしてあるいは適宜修飾して使用できる。具体的には、蒸着法により形成されるガスバリア層、平滑層、アンカーコート層、ブリードアウト防止層、中間層、保護層、デシカント層(吸湿層)や帯電防止層の機能化層などが挙げられる。上記他の部材は、単独でもまたは2種以上組み合わせて使用してもよい。また、上記他の部材は、単層として存在してもまたは2層以上の積層構造を有していてもよい。
本発明のガスバリア性フィルムの基材としては、ガスバリア層を保持することができるものであれば特に限定されるものではない。
本発明のガスバリア性フィルムは、基材上にガスバリア層を複数(2層以上)有する。当該複数のガスバリア層は、基材上に、ポリシラザン化合物を含有する塗布液を同時重層塗布し乾燥して複数の塗膜層を得た後、前記基材から最も離れた前記塗膜層の側から真空紫外線を照射し改質処理を行うことにより得られる。そして、前記ガスバリア層の少なくとも1層は、添加元素を含有する。
ポリシラザンとは、ケイ素-窒素結合を有するポリマーであり、Si-N、Si-H、N-H等の結合を有するSiO2、Si3N4、および両方の中間固溶体SiOxNy等のセラミック前駆体無機ポリマーである。
添加元素を含むガスバリア層を形成する場合は、添加化合物を添加した塗布液を塗布、乾燥した塗膜層を形成した後、改質処理すればよい。添加化合物の例としては、添加元素を含む金属アルコキシド化合物が挙げられる。
アノーソクレース、アルミナ、アルミノケイ酸塩、アルミン酸、アルミン酸ナトリウム、アレキサンドライト、アンモニウム白榴石、イットリウム・アルミニウム・ガーネット、黄長石、尾去沢石、オンファス輝石、輝石、絹雲母、ギブス石、サニディン、サファイア、酸化アルミニウム、水酸化酸化アルミニウム、臭化アルミニウム、十二ホウ化アルミニウム、硝酸アルミニウム、白雲母、水酸化アルミニウム、水素化アルミニウムリチウム、杉石、スピネル、ダイアスポア、ヒ化アルミニウム、ピーコック(顔料)、微斜長石、ヒスイ輝石、氷晶石、普通角閃石、フッ化アルミニウム、沸石、ブラジル石、ベスブ石、Βアルミナ固体電解質、ペツォッタイト、方ソーダ石、有機アルミニウム化合物、リシア輝石、リチア雲母、硫酸アルミニウム、緑柱石、緑泥石、緑簾石、リン化アルミニウム、リン酸アルミニウム等。
亜鉛緑礬、亜硫酸マグネシウム、安息香酸マグネシウム、カーナライト、過塩素酸マグネシウム、過酸化マグネシウム、滑石、頑火輝石、カンラン石、酢酸マグネシウム、酸化マグネシウム、蛇紋石、臭化マグネシウム、硝酸マグネシウム、水酸化マグネシウム、スピネル、普通角閃石、普通輝石、フッ化マグネシウム、硫化マグネシウム、硫酸マグネシウム、菱苦土鉱等。
アラレ石、亜硫酸カルシウム、安息香酸カルシウム、エジプシャンブルー、塩化カルシウム、塩化水酸化カルシウム、塩素酸カルシウム、灰クロム柘榴石、灰重石、灰鉄輝石、灰簾石、過酸化カルシウム、過リン酸石灰、カルシウムシアナミド、次亜塩素酸カルシウム、シアン化カルシウム、臭化カルシウム、重過リン酸石灰、シュウ酸カルシウム、臭素酸カルシウム、硝酸カルシウム、水酸化カルシウム、普通角閃石、普通輝石、フッ化カルシウム、フッ素燐灰石、ヨウ化カルシウム、ヨウ素酸カルシウム、ヨハンセン輝石、硫化カルシウム、硫酸カルシウム、緑閃石、緑簾石、緑簾石、燐灰ウラン石、燐灰石、リン酸カルシウム等。
酸化ガリウム(III)、水酸化ガリウム(III)、窒化ガリウム、ヒ化ガリウム、ヨウ化ガリウム(III)、リン酸ガリウム等。
酸化ホウ素、三臭化ホウ素、三フッ化ホウ素、三ヨウ化ホウ素、シアノ水素化ホウ素ナトリウム、ジボラン、ホウ酸、ホウ酸トリメチル、ホウ砂、ボラジン、ボラン、ボロン酸等。
有機ゲルマニウム化合物、無機ゲルマニウム化合物、酸化ゲルマニウム等。
酸化インジウム、塩化インジウム等。
塗膜層形成用の塗布液(以下、塗膜層形成用塗布液とも称する)を調製するための溶剤としては、ポリシラザンおよび/または添加化合物を溶解または分散できるものであれば特に制限されないが、ポリシラザンと容易に反応してしまう水および反応性基(例えば、ヒドロキシル基、あるいはアミン基等)を含まず、ポリシラザンに対して不活性の有機溶剤が好ましく、非プロトン性の有機溶剤がより好ましい。具体的には、溶剤としては、非プロトン性溶剤;例えば、ペンタン、ヘキサン、シクロヘキサン、トルエン、キシレン、ソルベッソ、ターベン等の、脂肪族炭化水素、脂環式炭化水素、芳香族炭化水素等の炭化水素溶媒;塩化メチレン、トリクロロエタン等のハロゲン炭化水素溶媒;酢酸エチル、酢酸ブチル等のエステル類;アセトン、メチルエチルケトン等のケトン類;ジブチルエーテル、ジオキサン、テトラヒドロフラン等の脂肪族エーテル、脂環式エーテル等のエーテル類:例えば、テトラヒドロフラン、ジブチルエーテル、モノアルキレングリコールジアルキルエーテルおよびポリアルキレングリコールジアルキルエーテル(ジグライム類)などを挙げることができる。上記溶剤は、単独で使用されてもまたは2種以上の混合物の形態で使用されてもよい。
本発明において、塗膜層形成用塗布液を塗布する方法は、同時重層塗布法であり、従来公知の適切な同時重層塗布方法が採用される。具体例としては、スライド型カーテン塗布法、米国特許第2,761,419号明細書、米国特許第2,761,791号明細書などに記載のスライドホッパー塗布法、エクストルージョンコート法などが挙げられる。
本発明における塗膜層の改質処理とは、上記で得られた塗膜層に含まれるポリシラザンの一部または全部が、酸化ケイ素、窒化ケイ素、酸窒化ケイ素等へ転化する反応を指し、具体的には本発明のガスバリア性フィルムが全体としてガスバリア性を発現するに貢献できるレベルの無機薄膜を形成する反応を指す。
e+Xe→e+Xe*
Xe*+Xe+Xe→Xe2 *+Xe
となり、励起されたエキシマ分子であるXe2 *が基底状態に遷移するときに172nmのエキシマ光(真空紫外光)を発光する。
パーヒドロポリシラザン中のSi-H結合やN-H結合は真空紫外線照射による励起等で比較的容易に切断され、不活性雰囲気下ではSi-Nとして再結合すると考えられる(Siの未結合手が形成される場合もある)。すなわち、酸化することなくSiNy組成として硬化する。この場合はポリマー主鎖の切断は生じない。Si-H結合やN-H結合の切断は触媒の存在や、加熱によって促進される。切断されたHはH2として膜外に放出される。
パーヒドロポリシラザン中のSi-N結合は水により加水分解され、ポリマー主鎖が切断されてSi-OHを形成する。二つのSi-OHが脱水縮合してSi-O-Si結合を形成して硬化する。これは大気中でも生じる反応であるが、不活性雰囲気下での真空紫外線照射中では、照射の熱によって基材からアウトガスとして生じる水蒸気が主な水分源となると考えられる。水分が過剰となると脱水縮合しきれないSi-OHが残存し、SiO2.1~SiO2.3の組成で示されるガスバリア性の低い硬化膜となる。
真空紫外線照射中、雰囲気下に適当量の酸素が存在すると、酸化力の非常に強い一重項酸素が形成される。パーヒドロポリシラザン中のHやNはOと置き換わってSi-O-Si結合を形成して硬化する。ポリマー主鎖の切断により結合の組み換えを生じる場合もあると考えられる。
真空紫外線のエネルギーはパーヒドロポリシラザン中のSi-Nの結合エネルギーよりも高いため、Si-N結合は切断され、周囲に酸素、オゾン、水等の酸素源が存在すると酸化されてSi-O-Si結合やSi-O-N結合が生じると考えられる。ポリマー主鎖の切断により結合の組み換えを生じる場合もあると考えられる。
本発明のガスバリア性フィルムは、蒸着法により形成されるガスバリア層(以下、単に蒸着ガスバリア層とも称する)をさらに有していてもよい。
反応性蒸着法は、真空容器内に反応性ガスを導入し、蒸発源から蒸発した原子・分子を反応させて堆積させる方法であり、反応を促進させるためにプラズマ等の励起源を導入することもできる。代表的な原料として、蒸着源としては、珪素、窒化珪素、酸化珪素、酸窒化珪素など、反応性ガスとしては、窒素、水素、アンモニア、酸素などが用いられる。
スパッタ法は、電界加速した高エネルギーイオンをターゲットに入射させターゲットの構成原子をたたきだすスパッタリング現象を利用し、スパッタされたターゲットの構成原子を基材に堆積させる方法である。反応性スパッタ法は、真空容器内に反応性ガスを導入し、スパッタされたターゲットの構成原子と反応させて基材に堆積させる方法である。代表的な原料として、ターゲット材には、珪素、窒化珪素、酸化珪素、酸窒化珪素など、反応性ガスとしては、窒素、水素、アンモニア、酸素などが用いられる。
化学気相堆積法は、真空容器内に膜の構成元素を含む材料ガスを導入し、特定の励起源により材料ガスを励起することで、化学反応により励起種を形成し、基材に堆積させる方法である。代表的な原料として、モノシラン、ヘキサメチルジシラザン、アンモニア、窒素、水素、酸素などが用いられる。
Cat-CVD法は、タングステン等ならなるワイヤを内部に配した真空容器に材料ガスを流入させ、電源により通電加熱されたワイヤで材料ガス接触分解反応させ、生成された反応種を基材に堆積させる方法である。
PECVD法は、プラズマ源を搭載した真空容器に材料ガスを流入させ、電源からプラズマ源に電力供給する事で真空容器内に放電プラズマを発生させ、プラズマで材料ガスを分解反応させ、生成された反応種を基材に堆積させる方法である。プラズマ源の方式としては、平行平板電極を用いた容量結合プラズマ、誘導結合プラズマ、表面波を利用したマイクロ波励起プラズマ等が使われる。
印加電源記号 メーカー 周波数 製品名
A1 神鋼電機 3kHz SPG3-4500
A2 神鋼電機 5kHz SPG5-4500
A3 春日電機 15kHz AGI-023
A4 神鋼電機 50kHz SPG50-4500
A5 ハイデン研究所 100kHz* PHF-6k
A6 パール工業 200kHz CF-2000-200k
A7 パール工業 400kHz CF-2000-400k
等の市販のものを挙げることができ、何れも使用することができる。
印加電源記号 メーカー 周波数 製品名
B1 パール工業 800kHz CF-2000-800k
B2 パール工業 2MHz CF-2000-2M
B3 パール工業 13.56MHz CF-5000-13M
B4 パール工業 27MHz CF-2000-27M
B5 パール工業 150MHz CF-2000-150M
等の市販のものを挙げることができ、何れも使用することができる。
蒸着ガスバリア層においては、成膜された膜にエキシマ処理(改質処理)を施してもよい。エキシマ処理(真空紫外線処理)は、公知の方法を用いることができるが、前述した「<塗膜層の改質処理>」の項で述べたような真空紫外線処理が好ましく、さらには100~180nmの波長の光のエネルギーによる真空紫外線処理が好ましい。
改質処理して形成されたガスバリア層は、その前段階である塗布液を塗布した後または改質処理した後、特には改質処理した後、後処理を施すことが好ましい。ここで述べる後処理とは、温度10℃以上800℃未満の温度処理(熱処理)、あるいは相対湿度0%RH以上100%RH以下、または水浴に浸漬した湿度処理も含み、処理時間は、5秒から48日の範囲より選択される範囲と定義する。温度と湿度との両方の処理を施してもよく、どちらか一方だけでもよい。ガスバリア性向上、密着性向上等の観点から、好ましくは温度処理である。
本発明のガスバリア性フィルムは、各ガスバリア層の間に中間層を有していてもよい。該中間層を形成する方法としては、ポリシロキサン改質層を形成する方法を適用することができる。この方法は、ポリシロキサンを含有した塗布液を湿式塗布法によりガスバリア層上に塗布して乾燥した後、得られた塗膜に真空紫外線を照射することによってポリシロキサン改質層とした中間層を形成する方法である。なお、本発明では、基材から最も離れたポリシラザンを含む塗膜層の側から真空紫外線照射を行うが、この真空紫外線照射によりポリシロキサン改質層も形成することができるため、中間層となる塗膜を形成した直後に真空紫外線照射を行わなくてもよい。
本発明に係るガスバリア性フィルムは、塗布によって形成されたガスバリア層、または蒸着法によって形成されたガスバリア層の上部に、有機化合物を含む保護層を設けてもよい。保護層に用いられる有機化合物としては、有機モノマー、オリゴマー、ポリマー等の有機樹脂、有機基を有するシロキサンやシルセスキオキサンのモノマー、オリゴマー、ポリマー等を用いた有機無機複合樹脂を好ましく用いることができる。これらの有機樹脂もしくは有機無機複合樹脂は重合性基や架橋性基を有することが好ましく、これらの有機樹脂もしくは有機無機複合樹脂を含有し、必要に応じて重合開始剤や架橋剤等を含有する有機樹脂組成物塗布液から塗布形成した層に、光照射処理や熱処理を加えて硬化させることが好ましい。ここで「架橋性基」とは、光照射処理や熱処理で起こる化学反応によりバインダーポリマーを架橋することができる基のことである。このような機能を有する基であれば特にその化学構造は限定されないが、例えば、付加重合し得る官能基としてエチレン性不飽和基、エポキシ基/オキセタニル基等の環状エーテル基が挙げられる。また光照射によりラジカルになり得る官能基であってもよく、そのような架橋性基としては、例えば、チオール基、ハロゲン原子、オニウム塩構造等が挙げられる。中でも、エチレン性不飽和基が好ましく、特開2007-17948号公報の段落「0130」~「0139」に記載された官能基が含まれる。
本発明のガスバリア性フィルムは、デシカント性層(吸湿層)を有してもよい。デシカント性層として用いられる材料としては、例えば、酸化カルシウムや有機金属酸化物などが挙げられる。酸化カルシウムとしては、バインダー樹脂などに分散されたものが好ましく、市販品としては、例えば、サエスゲッター社のAqvaDryシリーズなどを好ましく用いることができる。また、有機金属酸化物としては、双葉電子工業株式会社製のOleDry(登録商標)シリーズなどを用いることができる。
本発明のガスバリア性フィルムは、基材のガスバリア層を有する面、好ましくは基材と第1層目のガスバリア層との間に平滑層(下地層、プライマー層、ハードコート層)を有していてもよい。平滑層は突起等が存在する基材の粗面を平坦化するために、あるいは、基材に存在する突起により、ガスバリア層に生じた凹凸やピンホールを埋めて平坦化するために設けられる。このような平滑層は、いずれの材料で形成されてもよいが、炭素含有ポリマーを含むことが好ましく、炭素含有ポリマーから構成されることがより好ましい。すなわち、本発明のガスバリア性フィルムは、基材と第1層目のガスバリア層との間に、炭素含有ポリマーを含む平滑層をさらに有することが好ましい。
基材の表面には、接着性(密着性)の向上を目的として、アンカーコート層を易接着層として形成してもよい。このアンカーコート層に用いられるアンカーコート剤としては、ポリエステル樹脂、イソシアネート樹脂、ウレタン樹脂、アクリル樹脂、エチレン・ビニルアルコール樹脂、ビニル変性樹脂、エポキシ樹脂、変性スチレン樹脂、変性シリコン樹脂、およびアルキルチタネート等を、1種または2種以上併せて使用することができる。上記アンカーコート剤は、市販品を使用してもよい。具体的には、シロキサン系UV硬化性ポリマー溶液(信越化学工業株式会社製、「X-12-2400」の3%イソプロピルアルコール溶液)を用いることができる。
本発明のガスバリア性フィルムは、ガスバリア層を設ける面とは反対側の基材面にブリードアウト防止層を有してもよい。
本発明のガスバリア性フィルムは、連続生産しロール形態に巻き取ることができる(いわゆるロール・トゥ・ロール生産)。その際、ガスバリア層を形成した面に保護シートを貼合して巻き取ることが好ましい。特に、本発明のガスバリア性フィルムを有機薄膜デバイスの封止材として用いる場合、表面に付着したゴミ(例えば、パーティクル)が原因で欠陥となる場合が多く、クリーン度の高い場所で保護シートを貼合してゴミの付着を防止することは非常に有効である。併せて、巻き取り時に入るガスバリア層表面への傷の防止に有効である。
本発明のガスバリア性フィルムの水蒸気透過率は、低いほど好ましいが、例えば、0.001~0.00001g/m2・24hであることが好ましく、0.0001~0.00001g/m2・24hであることがより好ましい。
蒸着装置:日本電子株式会社製 真空蒸着装置JEE-400
恒温恒湿度オーブン:Yamato Humidic ChamberIG47M
水分と反応して腐食する金属:カルシウム(粒状)
水蒸気不透過性の金属:アルミニウム(φ3~5mm、粒状)
水蒸気バリア性評価用セルの作製
ガスバリア性フィルム試料のガスバリア層面に、真空蒸着装置(日本電子株式会社製 真空蒸着装置JEE-400)を用い、金属カルシウムを蒸着させた。なお、蒸着は、ガスバリア性フィルム試料の蒸着させたい部分(12mm×12mmを9箇所)以外をマスクして行った。その後、真空状態のままマスクを取り去り、シート片側全面にアルミニウムをもう一つの金属蒸着源から蒸着させた。アルミニウム封止後、真空状態を解除し、速やかに乾燥窒素ガス雰囲気下で、厚さ0.2mmの石英ガラスに封止用紫外線硬化樹脂(ナガセケムテックス株式会社製)を介してアルミニウム封止側と対面させ、紫外線を照射することで、評価用セルを作製した。また、後述の実施例に示すように、屈曲前後のガスバリア性の変化を確認するために、屈曲の処理を行ったガスバリア性フィルムと、屈曲の処理を行わなかったガスバリア性フィルムについて、同様の水蒸気バリア性評価用セルを作製した。
本発明のガスバリア性フィルムは、空気中の化学成分(酸素、水、窒素酸化物、硫黄酸化物、オゾン等)によって性能が劣化するデバイスに好ましく用いることができる。すなわち、本発明は、電子デバイス本体と、本発明のガスバリア性フィルムまたは本発明に係る製造方法により得られるガスバリア性フィルムと、を有する電子デバイスを提供する。
ガスバリア性フィルムを用いた有機EL素子の例は、特開2007-30387号公報に詳しく記載されている。
反射型液晶表示装置は、下から順に、下基板、反射電極、下配向膜、液晶層、上配向膜、透明電極、上基板、λ/4板、そして偏光膜からなる構成を有する。本発明におけるガスバリア性フィルムは、前記透明電極基板および上基板として使用することができる。カラー表示の場合には、さらにカラーフィルター層を反射電極と下配向膜との間、または上配向膜と透明電極との間に設けることが好ましい。透過型液晶表示装置は、下から順に、バックライト、偏光板、λ/4板、下透明電極、下配向膜、液晶層、上配向膜、上透明電極、上基板、λ/4板および偏光膜からなる構成を有する。カラー表示の場合には、さらにカラーフィルター層を下透明電極と下配向膜との間、または上配向膜と透明電極との間に設けることが好ましい。液晶セルの種類は特に限定されないが、より好ましくはTN型(Twisted Nematic)、STN型(Super Twisted Nematic)またはHAN型(Hybrid Aligned Nematic)、VA型(Vertically Alignment)、ECB型(Electrically
Controlled Birefringence)、OCB型(Optically Compensated Bend)、IPS型(In-Plane Switching)、CPA型(Continuous Pinwheel Alignment)であることが好ましい。
本発明のガスバリア性フィルムは、太陽電池素子の封止フィルムとしても用いることができる。ここで、本発明のガスバリア性フィルムは、ガスバリア層が太陽電池素子に近い側となるように封止することが好ましい。本発明のガスバリア性フィルムが好ましく用いられる太陽電池素子としては、特に制限はないが、例えば、単結晶シリコン系太陽電池素子、多結晶シリコン系太陽電池素子、シングル接合型、またはタンデム構造型等で構成されるアモルファスシリコン系太陽電池素子、ガリウムヒ素(GaAs)やインジウム燐(InP)等のIII-V族化合物半導体太陽電池素子、カドミウムテルル(CdTe)等のII-VI族化合物半導体太陽電池素子、銅/インジウム/セレン系(いわゆる、CIS系)、銅/インジウム/ガリウム/セレン系(いわゆる、CIGS系)、銅/インジウム/ガリウム/セレン/硫黄系(いわゆる、CIGSS系)等のI-III-VI族化合物半導体太陽電池素子、色素増感型太陽電池素子、有機太陽電池素子等が挙げられる。中でも、本発明においては、上記太陽電池素子が、銅/インジウム/セレン系(いわゆる、CIS系)、銅/インジウム/ガリウム/セレン系(いわゆる、CIGS系)、銅/インジウム/ガリウム/セレン/硫黄系(いわゆる、CIGSS系)等のI-III-VI族化合物半導体太陽電池素子であることが好ましい。
その他の適用例としては、特表平10-512104号公報に記載の薄膜トランジスタ、特開平5-127822号公報、特開2002-48913号公報等に記載のタッチパネル、特開2000-98326号公報に記載の電子ペーパー等が挙げられる。
本発明のガスバリア性フィルムは、光学部材としても用いることができる。光学部材の例としては円偏光板等が挙げられる。
本発明におけるガスバリア性フィルムを基板としλ/4板と偏光板とを積層し、円偏光板を作製することができる。この場合、λ/4板の遅相軸と偏光板の吸収軸とのなす角が45°になるように積層する。このような偏光板は、長手方向(MD)に対し45°の方向に延伸されているものを用いることが好ましく、例えば、特開2002-865554号公報に記載のものを好適に用いることができる。
基材B、Cは、上記基材Aの透明樹脂基材のみを下記に変更したものを使用した。
基材C:テイジン(登録商標)テトロン(登録商標)フィルム(帝人株式会社製、型番G2P2、厚さ25μm)。
〔第1~第4のガスバリア層(ポリシラザン塗膜層)の形成〕
<ポリシラザン含有塗布液の調製>
無触媒のパーヒドロポリシラザン(PHPS)を20質量%含むジブチルエーテル溶液(AZエレクトロニックマテリアルズ株式会社製、NN120-20)と、1質量%のアミン触媒(N,N,N’,N’-テトラメチル-1,6-ジアミノヘキサン)および19質量%のパーヒドロポリシラザンを含むジブチルエーテル溶液(AZエレクトロニックマテリアルズ株式会社製、NAX120-20)とを、4:1の割合で混合し、さらにジブチルエーテル溶媒で、塗布液の固形分が5質量%になるように希釈調製した。
4層同時重層塗布可能なスライドホッパー塗布装置を用いた。上記で調製したポリシラザン含有塗布液を23℃に保温しながら、基材として23℃に加温した210mm×350mmの大きさの基材A上に、乾燥時の膜厚が各層30nmになるように計4層の同時重層塗布を行った。
エム・ディ・コム製エキシマ照射装置MODEL:MECL-M-1-200
波長172nm、ステージ温度100℃
積算光量3500mJ/cm2、酸素濃度0.1体積%。
真空紫外線照射は、図2に断面模式図で示した装置を用いて行った。
真空紫外線照射の後、さらに40℃で24時間、温度処理を施したこと以外は、比較例1と同様にして、ガスバリア性フィルム(サンプルNo.2)を作製した。
基材Aを基材Bに変更したこと以外は、比較例1と同様にして、ガスバリア性フィルム(サンプルNo.3)を作製した。
真空紫外線照射の後、さらに40℃で24時間、温度処理を施したこと以外は、比較例3と同様にして、ガスバリア性フィルム(サンプルNo.4)を作製した。
基材Aを基材Cに変更したこと以外は、比較例1と同様にして、ガスバリア性フィルム(サンプルNo.5)を作製した。
真空紫外線照射の後、さらに40℃で24時間、温度処理を施したこと以外は、比較例3と同様にして、ガスバリア性フィルム(サンプルNo.6)を作製した。
比較例1で調製したポリシラザン含有塗布液を、スピンコーターにて基材A上に、厚さが30nmになるよう成膜し、2分間放置した後、80℃のホットプレートで1分間追加加熱処理を行い、ポリシラザン塗膜層を形成した。その後、比較例1の装置および方法により、真空紫外線照射を施し、第1のガスバリア層を形成した。
第4のガスバリア層を形成した後、さらに40℃で24時間、温度処理を施したこと以外は、比較例7と同様にして、ガスバリア性フィルム(サンプルNo.8)を作製した。
基材Aを基材Bに変更したこと以外は、比較例7と同様にして、ガスバリア性フィルム(サンプルNo.9)を作製した。
第4のガスバリア層を形成した後、さらに40℃で24時間、温度処理を施したこと以外は、比較例9と同様にして、ガスバリア性フィルム(サンプルNo.10)を作製した。
基材Aを基材Cに変更したこと以外は、比較例7と同様にして、ガスバリア性フィルム(サンプルNo.11)を作製した。
第4のガスバリア層を形成した後、さらに40℃で24時間、温度処理を施したこと以外は、比較例11と同様にして、ガスバリア性フィルム(サンプルNo.12)を作製した。
下記の方法でアルミニウム含有塗布液を調製した。
無触媒のパーヒドロポリシラザンを20質量%含むジブチルエーテル溶液(AZエレクトロニックマテリアルズ株式会社製、NN120-20)と、1質量%のアミン触媒(N,N,N’,N’-テトラメチル-1,6-ジアミノヘキサン)および19質量%のパーヒドロポリシラザンを含むジブチルエーテル溶液(AZエレクトロニックマテリアルズ株式会社製、NAX120-20)とを、4:1の割合で混合したもの 2.318g、ALCH(川研ファインケミカル株式会社製、アルミニウムエチルアセトアセテート・ジイソプロピレート)0.306g、およびジブチルエーテル 12.776gを混合したものを塗布液とした。
真空紫外線照射の後、さらに40℃で24時間、温度処理を施したこと以外は、実施例1と同様にして、ガスバリア性フィルム(サンプルNo.14)を作製した。
基材Aを基材Bに変更したこと以外は、実施例1と同様にして、ガスバリア性フィルム(サンプルNo.15)を作製した。
真空紫外線照射の後、さらに40℃で24時間、温度処理を施したこと以外は、実施例3と同様にして、ガスバリア性フィルム(サンプルNo.16)を作製した。
基材Aを基材Cに変更したこと以外は、実施例1と同様にして、ガスバリア性フィルム(サンプルNo.17)を作製した。
真空紫外線照射の後、さらに40℃で24時間、温度処理を施したこと以外は、実施例5と同様にして、ガスバリア性フィルム(サンプルNo.18)を作製した。
実施例1で調製したアルミニウム含有塗布液を用いて、第2のガスバリア層となるアルミニウム含有ポリシラザン塗膜層および第4のガスバリア層となるアルミニウム含有ポリシラザン塗膜層を形成するように同時重層塗布を行ったこと以外は、比較例1と同様にして、ガスバリア性フィルム(サンプルNo.19)を作製した。第2のガスバリア層および第4のガスバリア層中のアルミニウムの含有量は、40質量%であった。
真空紫外線照射の後、さらに40℃で24時間、温度処理を施したこと以外は、実施例7と同様にして、ガスバリア性フィルム(サンプルNo.20)を作製した。
基材Aを基材Bに変更したこと以外は、実施例7と同様にして、ガスバリア性フィルム(サンプルNo.21)を作製した。
真空紫外線照射の後、さらに40℃で24時間、温度処理を施したこと以外は、実施例9と同様にして、ガスバリア性フィルム(サンプルNo.22)を作製した。
基材Aを基材Cに変更したこと以外は、実施例7と同様にして、ガスバリア性フィルム(サンプルNo.23)を作製した。
真空紫外線照射の後、さらに40℃で24時間、温度処理を施したこと以外は、実施例11と同様にして、ガスバリア性フィルム(サンプルNo.24)を作製した。
上記実施例1で調製したアルミニウム含有塗布液中のALCHの代わりに、ガリルム(III)イソプロポキシド(和光純薬工業株式会社製)0.306gを添加し、ガリウム含有塗布液を調製した。このガリウム含有塗布液を用いて、第2のガスバリア層となるガリウム含有ポリシラザン塗膜層および第4のガスバリア層となるガリウム含有ポリシラザン塗膜層を形成するように同時重層塗布を行ったこと以外は、実施例9と同様にして、ガスバリア性フィルム(サンプルNo.25)を作製した。
上記実施例1で調製したアルミニウム含有塗布液中のALCHの代わりに、インジウム(III)イソプロポキシド(和光純薬工業株式会社製)0.306gを添加し、インジウム含有塗布液を調製した。このインジウム含有塗布液を用いて、第2のガスバリア層となるインジウム含有ポリシラザン塗膜層および第4のガスバリア層となるインジウム含有ポリシラザン塗膜層を形成するように同時重層塗布を行ったこと以外は、実施例9と同様にして、ガスバリア性フィルム(サンプルNo.26)を作製した。
上記実施例1で調製したアルミニウム含有塗布液中のALCHの代わりに、マグネシウムエトキシド(和光純薬工業株式会社製)0.306gを添加し、マグネシウム含有塗布液を調製した。このマグネシウム含有塗布液を用いて、第2のガスバリア層となるマグネシウム含有ポリシラザン塗膜層および第4のガスバリア層となるマグネシウム含有ポリシラザン塗膜層を形成するように同時重層塗布を行ったこと以外は、実施例9と同様にして、ガスバリア性フィルム(サンプルNo.27)を作製した。
上記実施例1で調製したアルミニウム含有塗布液中のALCHの代わりに、カルシウムイソプロポキシド(和光純薬工業株式会社製)0.306gを添加し、カルシウム含有塗布液を調製した。このカルシウム含有塗布液を用いて、第2のガスバリア層となるカルシウム含有ポリシラザン塗膜層および第4のガスバリア層となるカルシウム含有ポリシラザン塗膜層を形成するように同時重層塗布を行ったこと以外は、実施例9と同様にして、ガスバリア性フィルム(サンプルNo.28)を作製した。
上記実施例1で調製したアルミニウム含有塗布液中のALCHの代わりに、ホウ酸トリイソプロピル(和光純薬工業株式会社製)0.306gを添加し、ホウ素含有塗布液を調製した。このホウ素含有塗布液を用いて、第2のガスバリア層となるホウ素含有ポリシラザン塗膜層および第4のガスバリア層となるホウ素含有ポリシラザン塗膜層を形成するように同時重層塗布を行ったこと以外は、実施例9と同様にして、ガスバリア性フィルム(サンプルNo.29)を作製した。
上記実施例1で調製したアルミニウム含有塗布液中のALCHの代わりに、トリス(ジブチルスルフィド)ロジウムクロライド[Tris(dibutylsulfide)RhCl3、Gelest,Inc.製]0.306gを添加し、ロジウム含有塗布液を調製した。このロジウム含有塗布液を用いて、第2のガスバリア層となるロジウム含有ポリシラザン塗膜層および第4のガスバリア層となるロジウム含有ポリシラザン塗膜層の形成を行ったこと以外は、実施例9と同様にして、ガスバリア性フィルム(サンプルNo.30)を作製した。
〔第1のガスバリア層の形成(蒸着法)〕
図1に示すようなロールツーロール形態の大気圧プラズマ製膜装置を用いて、大気圧プラズマ法により第1のガスバリア層(蒸着ガスバリア層)を形成した。具体的には、210mm×350mmの大きさの基材B上に、下記表1に示す薄膜形成条件で酸炭化珪素(SiOC)からなる第1のガスバリア層(厚さ30nm)を形成した。第1のガスバリア層の弾性率E1をナノインテンデーション法により測定したところ、膜厚方向で一様に30GPaであった。
比較例1で調製したポリシラザン含有塗布液を用い、スピンコーターにて第1のガスバリア層上に、厚さが30nmになるよう成膜し、2分間放置した後、80℃のホットプレートで1分間追加加熱処理を行い、第2のポリシラザン塗膜層を形成した。その後、上記の装置および方法により、真空紫外線照射を施し(ただし、積算光量は2000mJ/cm2)、第2のガスバリア層を形成した。
第2のガスバリア層となる塗膜層および第3のガスバリア層となる塗膜層を同時重層塗布および乾燥により形成し、第3のガスバリア層となる塗膜層の側から、真空紫外線照射を施した(積算光量は2000mJ/cm2)こと以外は、比較例14と同様の方法で、ガスバリア性フィルム(サンプルNo.32)を作製した。
実施例1で調製したアルミニウム含有塗布液を用いて、第3のガスバリア層となるアルミニウム含有ポリシラザン塗膜層を形成するように同時重層塗布を行ったこと以外は、比較例15と同様にして、ガスバリア性フィルム(サンプルNo.33)を作製した。
実施例1で調製したアルミニウム含有塗布液を用いて、第2のガスバリア層となるアルミニウム含有ポリシラザン塗膜層を形成するように同時重層塗布を行ったこと以外は、比較例15と同様にして、ガスバリア性フィルム(サンプルNo.34)を作製した。
得られた試料をA4サイズに切りだした後の平面性カールについて、20名に取り扱いを評価してもらい、各人が下記の様に5段階ランク評価した。20名の合計点数を100点~20点まで評価し、合計点数が多い方が取り扱いのよいサンプルとなる。
4:カール多少あるが取り扱い問題なし
3:カール少しあり、取り扱い問題懸念あり
2:カールあり、取り扱い問題あり
1:カールあり、後加工等の取り扱いが出来なくN.G.。
上記で作製したガスバリア性フィルムについて、85℃95%RHの高温高湿下に100時間曝す前のサンプル(即)と、85℃95%RHの高温高湿下に100時間曝したサンプル(DH100hr後)とを各々準備した。
蒸着装置:日本電子株式会社製、真空蒸着装置JEE-400
恒温恒湿度オーブン:Yamato Humidic ChamberIG47M
(原材料)
水分と反応して腐食する金属:カルシウム(粒状)
水蒸気不透過性の金属:アルミニウム(φ3~5mm、粒状)
(水蒸気バリア性評価試料の作製)
真空蒸着装置(日本電子株式会社製、真空蒸着装置 JEE-400)を用い、作製したガスバリア性フィルムの最外層のガスバリア層表面に、マスクを通して12mm×12mmのサイズで金属カルシウムを蒸着させた。この際、蒸着膜厚は80nmとなるようにした。
JIS K 5400:1990に準じて、100マスのクロスカット試験を実施した。100マス中、剥離がないマス目の数の多い方が、密着力が良いことになる。
各ガスバリア性フィルムを、半径が2mmの曲率になるように、180°の角度で150回の屈曲を繰り返した。その後、上記と同様の方法で水蒸気透過率(水蒸気バリア性)を測定し、屈曲前後での水蒸気透過率の変化より、下式に従って耐劣化度を算出し、下記の基準に従って折り曲げ耐性を評価した。
5:耐劣化度が95%以上である
4:耐劣化度が85%以上95%未満である
3:耐劣化度が50%以上85%未満である
2:耐劣化度が10%以上50%未満である
1:耐劣化度が10%未満である。
上記で作製したガスバリア性フィルムの100mm×100mmサイズについて、85℃、95%RHの高温高湿下で100時間保存した。保存後、パナソニック株式会社製のスタジオスポットライト・NQSシリーズ NQS-50を用いて膜面クラックを目視にて本数の評価を行い、下記のようにランク付けした。クラックの本数が少ないほど良好な試料である。
4:1~4本
3:5~9本
2:10~19本
1:20本以上。
上記で作製したガスバリア性フィルムを用いて、有機薄膜電子デバイスである有機EL素子を作製した。
(第1電極層の形成)
各ガスバリア性フィルムの最外層のガスバリア層上に、厚さ150nmのITO(インジウムチンオキシド)をスパッタ法により成膜し、フォトリソグラフィー法によりパターニングを行い、第1電極層を形成した。なお、パターンは発光面積が50mm平方になるようなパターンとした。
第1電極層が形成されたガスバリア性フィルムの第1電極層の上に、以下に示す正孔輸送層形成用塗布液を押し出し塗布機で塗布した後、乾燥し、正孔輸送層を形成した。正孔輸送層形成用塗布液は、乾燥後の厚みが50nmになるように塗布した。
塗布工程は大気中、25℃、相対湿度50%RHの環境で行った。
ポリエチレンジオキシチオフェン・ポリスチレンスルホネート(PEDOT/PSS、Bayer社製 Baytron P AI 4083)を純水で65%、メタノール5%で希釈した溶液を正孔輸送層形成用塗布液として準備した。
正孔輸送層形成用塗布液を塗布した後、成膜面に向け高さ100mm、吐出風速1m/s、幅手の風速分布5%、温度100℃で溶媒を除去した後、引き続き、加熱処理装置を用い温度150℃で裏面伝熱方式の熱処理を行い、正孔輸送層を形成した。
引き続き、正孔輸送層まで形成したガスバリア性フィルムの正孔輸送層上に、以下に示す白色発光層形成用塗布液を押出し塗布機で塗布した後、乾燥し発光層を形成した。白色発光層形成用塗布液は乾燥後の厚みが40nmになるように塗布した。
ホスト材の下記H-Aを1.0gと、ドーパント材の下記D-Aを100mgと、ドーパント材の下記D-Bを0.2mgと、ドーパント材の下記D-Cを0.2mgと、を100gのトルエンに溶解し白色発光層形成用塗布液として準備した。
塗布工程を窒素ガス濃度99体積%以上の雰囲気で、塗布温度を25℃とし、塗布速度1m/minで行った。
白色発光層形成用塗布液を塗布した後、成膜面に向け高さ100mm、吐出風速1m/s、幅手の風速分布5%、温度60℃で溶媒を除去した。次いで、温度130℃で加熱処理を行い、発光層を形成した。
次に、以下に示す電子輸送層形成用塗布液を押出し塗布機で塗布した後、乾燥し電子輸送層を形成した。電子輸送層形成用塗布液は乾燥後の厚みが30nmになるように塗布した。
塗布工程は、窒素ガス濃度99体積%以上の雰囲気で、電子輸送層形成用塗布液の塗布温度を25℃とし、塗布速度1m/minで行った。
電子輸送層は、下記E-Aを2,2,3,3-テトラフルオロ-1-プロパノール中に溶解し0.5質量%溶液とし電子輸送層形成用塗布液とした。
電子輸送層形成用塗布液を塗布した後、成膜面に向け高さ100mm、吐出風速1m/s、幅手の風速分布5%、温度60℃で溶媒を除去した。次いで、加熱処理部で、温度200℃で加熱処理を行い、電子輸送層を形成した。
次に、形成された電子輸送層上に電子注入層を形成した。まず、基板を減圧チャンバに投入し、5×10-4Paまで減圧した。あらかじめ、真空チャンバにタンタル製蒸着ボートに用意しておいたフッ化セシウムを加熱し、厚さ3nmの電子注入層を形成した。
第1電極の上に取り出し電極になる部分を除き、形成された電子注入層の上に5×10-4Paの真空下にて第2電極形成材料としてアルミニウムを使用し、取り出し電極を有するように蒸着法で、発光面積が50mm平方になるようにマスクパターン成膜し、厚さ100nmの第2電極を積層した。
第2電極まで形成したガスバリア性フィルムを、再び窒素雰囲気に移動し、規定の大きさに、紫外線レーザーを用いて裁断した。
作製した有機EL素子に、ソニーケミカル&インフォメーションデバイス株式会社製の異方性導電フィルムDP3232S9を用いて、フレキシブルプリント基板(ベースフィルム:ポリイミド12.5μm、圧延銅箔18μm、カバーレイ:ポリイミド12.5μm、表面処理NiAuメッキ)を接続した。
電極リード(フレキシブルプリント基板)を接続した有機EL素子を、市販のロールラミネート装置を用いて封止部材を接着し、有機EL素子を製作した。
ジシアンジアミド(DICY)
エポキシアダクト系硬化促進剤。
上記作製した有機EL素子について、下記の方法に従って、耐久性の評価を行った。
(加速劣化処理)
上記作製した各有機EL素子を、85℃、95%RHの環境下で100時間の加速劣化処理を施した後、加速劣化処理を施していない有機EL素子と共に、下記の黒点に関する評価を行った。
加速劣化処理を施した有機EL素子および加速劣化処理を施していない有機EL素子に対し、それぞれ1mA/cm2の電流を印加し、24時間連続発光させた後、100倍のマイクロスコープ(株式会社モリテックス製MS-804、レンズMP-ZE25-200)でパネルの一部分を拡大し、撮影を行った。撮影画像を2mm四方に切り抜き、黒点の発生面積比率を求め、下式に従って素子劣化耐性率を算出し、下記の基準に従って耐久性を評価した。評価ランクが、◎であれば、実用上好ましい特性であると判定した。
◎:素子劣化耐性率が、90%以上である
○:素子劣化耐性率が、60%以上90%未満である
△:素子劣化耐性率が、20%以上60%未満である
×:素子劣化耐性率が、20%未満である
この評価を、85℃95%RHの高温高湿下に100時間曝す前のサンプル(即)と、85℃95%RHの高温高湿下に100時間曝した後のサンプル(DH100hr後)との両方で行った。
Claims (6)
- 基材上に、ポリシラザン化合物を含有する塗布液を同時重層塗布し乾燥して複数の塗膜層を得た後、前記基材から最も離れた前記塗膜層の側から真空紫外線を照射し改質処理を行うことにより得られる、複数のガスバリア層を有するガスバリア性フィルムであって、
前記ガスバリア層の少なくとも1層は、長周期型周期表の第2族、第13族、および第14族の元素からなる群より選択される少なくとも1種の元素(ただし、ケイ素および炭素を除く)を含有する、ガスバリア性フィルム。 - 前記長周期型周期表の第2族、第13族、および第14族の元素からなる群より選択される少なくとも1種の元素が、アルミニウム、インジウム、ガリウム、マグネシウム、カルシウム、ゲルマニウム、およびホウ素からなる群より選択される少なくとも1種である、請求項1に記載のガスバリア性フィルム。
- 前記基材の厚さが10~100μmである、請求項1または2に記載のガスバリア性フィルム。
- 前記改質処理の後に、さらに温度処理されて形成される、請求項1~3のいずれか1項に記載のガスバリア性フィルム。
- 基材上に、ポリシラザン化合物を含有する塗布液を同時重層塗布し乾燥して複数の塗膜層を得る工程と、
前記基材から最も離れた前記塗膜層の側から真空紫外線を照射し改質処理を行う工程と、
を含む、複数のガスバリア層を有するガスバリア性フィルムの製造方法であって、
前記塗膜層の少なくとも1層は、長周期型周期表の第2族、第13族、および第14族の元素からなる群より選択される少なくとも1種の元素(ただし、ケイ素および炭素を除く)の化合物を含有する、ガスバリア性フィルムの製造方法。 - 電子デバイス本体と、
請求項1~4のいずれか1項に記載のガスバリア性フィルムまたは請求項5に記載の製造方法により得られるガスバリア性フィルムと、
を有する、電子デバイス。
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JP7091464B2 (ja) | 2018-04-25 | 2022-06-27 | エルジー・ケム・リミテッド | バリアフィルム |
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