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WO2012013214A3 - Method for marking a solar cell, and solar cell - Google Patents

Method for marking a solar cell, and solar cell Download PDF

Info

Publication number
WO2012013214A3
WO2012013214A3 PCT/EP2010/060790 EP2010060790W WO2012013214A3 WO 2012013214 A3 WO2012013214 A3 WO 2012013214A3 EP 2010060790 W EP2010060790 W EP 2010060790W WO 2012013214 A3 WO2012013214 A3 WO 2012013214A3
Authority
WO
WIPO (PCT)
Prior art keywords
solar cell
marking
cell substrate
substrate
etchant
Prior art date
Application number
PCT/EP2010/060790
Other languages
French (fr)
Other versions
WO2012013214A2 (en
Inventor
Markus Hlusiak
Carsten Swiatkowski
Maximilian Scherff
Jörg Müller
Andreas Kux
Original Assignee
Q-Cells Se
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Q-Cells Se filed Critical Q-Cells Se
Priority to PCT/EP2010/060790 priority Critical patent/WO2012013214A2/en
Priority to CN2010800682123A priority patent/CN103109374A/en
Publication of WO2012013214A2 publication Critical patent/WO2012013214A2/en
Publication of WO2012013214A3 publication Critical patent/WO2012013214A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0236—Special surface textures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544—Marks applied to semiconductor devices or parts
    • H01L2223/54406—Marks applied to semiconductor devices or parts comprising alphanumeric information
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544—Marks applied to semiconductor devices or parts
    • H01L2223/54413—Marks applied to semiconductor devices or parts comprising digital information, e.g. bar codes, data matrix
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544—Marks applied to semiconductor devices or parts
    • H01L2223/54433—Marks applied to semiconductor devices or parts containing identification or tracking information
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544—Marks applied to semiconductor devices or parts
    • H01L2223/54493—Peripheral marks on wafers, e.g. orientation flats, notches, lot number
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Manufacturing & Machinery (AREA)
  • Photovoltaic Devices (AREA)

Abstract

The invention relates to a method for marking a solar cell, comprising the following steps: Providing a solar cell substrate (1 ); Selecting an identification pattern for identifying the solar cell substrate (1 ) during process steps of a manufacturing process for the solar cell and / or for tracing back the solar cell substrate (1 ) after assembly of the solar cell in a solar cell module; Forming an etch resist layer (3) on a surface (2) of the solar cell substrate (1 ); Etching the surface (2) of the solar cell substrate (1 ) with an etchant, whereby the etch resist layer (3) is formed in such a way that a pattern region (4) of the surface (2) in the shape of the identification pattern is protected from the etchant. Furthermore, the invention relates to a solar cell.
PCT/EP2010/060790 2010-07-26 2010-07-26 Method for marking a solar cell, and solar cell WO2012013214A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/EP2010/060790 WO2012013214A2 (en) 2010-07-26 2010-07-26 Method for marking a solar cell, and solar cell
CN2010800682123A CN103109374A (en) 2010-07-26 2010-07-26 Method for marking a solar cell, and solar cell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2010/060790 WO2012013214A2 (en) 2010-07-26 2010-07-26 Method for marking a solar cell, and solar cell

Publications (2)

Publication Number Publication Date
WO2012013214A2 WO2012013214A2 (en) 2012-02-02
WO2012013214A3 true WO2012013214A3 (en) 2012-05-31

Family

ID=44624853

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2010/060790 WO2012013214A2 (en) 2010-07-26 2010-07-26 Method for marking a solar cell, and solar cell

Country Status (2)

Country Link
CN (1) CN103109374A (en)
WO (1) WO2012013214A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130160832A1 (en) * 2011-12-22 2013-06-27 Andreas Krause Marking of a substrate of a solar cell
JP6098815B2 (en) * 2013-06-19 2017-03-22 パナソニックＩｐマネジメント株式会社 Solar cell having marking and method for manufacturing the same
DE102019006090A1 (en) * 2019-08-29 2021-03-04 Azur Space Solar Power Gmbh Marking process
CN114334911B (en) * 2022-03-03 2022-08-05 晶科能源(海宁)有限公司 Photovoltaic cell, forming method thereof and photovoltaic module

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6342426B1 (en) * 2001-02-08 2002-01-29 Mosel Vitelic Inc. Method for protecting stepper alignment marks
JP2004047776A (en) * 2002-07-12 2004-02-12 Honda Motor Co Ltd Photovoltaic cell and method for manufacturing the same
US20070163634A1 (en) * 2005-07-14 2007-07-19 Kyocera Corporation Solar cell, manufacturing method and manufacturing management system thereof, and solar cell module
US20090050198A1 (en) * 2006-02-28 2009-02-26 Joerg Mueller Solar-Cell Marking Method and Solar Cell

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6342426B1 (en) * 2001-02-08 2002-01-29 Mosel Vitelic Inc. Method for protecting stepper alignment marks
JP2004047776A (en) * 2002-07-12 2004-02-12 Honda Motor Co Ltd Photovoltaic cell and method for manufacturing the same
US20070163634A1 (en) * 2005-07-14 2007-07-19 Kyocera Corporation Solar cell, manufacturing method and manufacturing management system thereof, and solar cell module
US20090050198A1 (en) * 2006-02-28 2009-02-26 Joerg Mueller Solar-Cell Marking Method and Solar Cell

Also Published As

Publication number Publication date
WO2012013214A2 (en) 2012-02-02
CN103109374A (en) 2013-05-15

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