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WO2012074287A3 - Adc for removing column fixed pattern noise and cmos image sensor including same - Google Patents

Adc for removing column fixed pattern noise and cmos image sensor including same Download PDF

Info

Publication number
WO2012074287A3
WO2012074287A3 PCT/KR2011/009198 KR2011009198W WO2012074287A3 WO 2012074287 A3 WO2012074287 A3 WO 2012074287A3 KR 2011009198 W KR2011009198 W KR 2011009198W WO 2012074287 A3 WO2012074287 A3 WO 2012074287A3
Authority
WO
WIPO (PCT)
Prior art keywords
bit
memory
sync
adc
output value
Prior art date
Application number
PCT/KR2011/009198
Other languages
French (fr)
Korean (ko)
Other versions
WO2012074287A2 (en
Inventor
송민규
문준호
김대윤
Original Assignee
동국대학교 산학협력단
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 동국대학교 산학협력단 filed Critical 동국대학교 산학협력단
Publication of WO2012074287A2 publication Critical patent/WO2012074287A2/en
Publication of WO2012074287A3 publication Critical patent/WO2012074287A3/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • H03M1/56—Input signal compared with linear ramp

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

The present invention relates to an ADC for removing fixed pattern noise, in which the ADC comprises: a comparison unit which compares an input voltage (VIN) with a ramp input increasing with a constant slope according to time, and outputs the comparison result to a sync-shift block unit; the sync-shift block unit which shifts a sync signal, on the basis of information for C-FPN removal received from a memory for C-FPN removal and the comparison result of the comparison unit; an n-bit counter which outputs an n-bit digital counter output value to an n-bit memory or a memory for C-FPN removal; the n-bit memory which stores the digital counter output value of the n-bit counter using the shifted sync signal; and the memory for C-FPN removal which provides the sync-shift block unit with the digital counter output value of the n-bit counter corresponding to a reference voltage, wherein the sync signal is a signal used to determine the digital counter output value of the n-bit counter. A difference of conversion characteristics between column ADCs is solved, so that the C-FPN characteristic in a CIS can be removed to implement an improved image.
PCT/KR2011/009198 2010-12-03 2011-11-30 Adc for removing column fixed pattern noise and cmos image sensor including same WO2012074287A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020100122859A KR101211082B1 (en) 2010-12-03 2010-12-03 ADC for removing column fixed pattern noise and CMOS image sensor including the same
KR10-2010-0122859 2010-12-03

Publications (2)

Publication Number Publication Date
WO2012074287A2 WO2012074287A2 (en) 2012-06-07
WO2012074287A3 true WO2012074287A3 (en) 2012-10-11

Family

ID=46172397

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2011/009198 WO2012074287A2 (en) 2010-12-03 2011-11-30 Adc for removing column fixed pattern noise and cmos image sensor including same

Country Status (2)

Country Link
KR (1) KR101211082B1 (en)
WO (1) WO2012074287A2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102195409B1 (en) 2014-05-29 2020-12-30 삼성전자주식회사 Device and method for lamp signal calibration and image sensor using the same
KR102261595B1 (en) 2014-09-19 2021-06-04 삼성전자주식회사 An image sensor, and an image processing system including the same
KR102292137B1 (en) 2015-01-09 2021-08-20 삼성전자주식회사 Image sensor, and image processing system including the same
KR20160123708A (en) 2015-04-17 2016-10-26 에스케이하이닉스 주식회사 Image sensing device
CN111372016B (en) * 2020-04-14 2022-07-01 上海微阱电子科技有限公司 Image sensor for reducing column fixed pattern noise

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20060052524A (en) * 2004-11-08 2006-05-19 소니 가부시끼 가이샤 Analog-to-digital conversion method, analog-to-digital converter, semiconductor device for detecting distribution of physical quantity, and electronic apparatus
KR20080022887A (en) * 2006-09-08 2008-03-12 삼성전자주식회사 CDS and ADC apparatus and method using multiple sampling
JP2009089066A (en) * 2007-09-28 2009-04-23 Sony Corp A / D conversion circuit, solid-state imaging device, and camera system
KR20090058011A (en) * 2006-10-06 2009-06-08 소니 가부시끼 가이샤 Solid-state imaging device, driving method and imaging device of solid-state imaging device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5375030B2 (en) 2008-10-31 2013-12-25 富士通セミコンダクター株式会社 Image sensor

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20060052524A (en) * 2004-11-08 2006-05-19 소니 가부시끼 가이샤 Analog-to-digital conversion method, analog-to-digital converter, semiconductor device for detecting distribution of physical quantity, and electronic apparatus
KR20080022887A (en) * 2006-09-08 2008-03-12 삼성전자주식회사 CDS and ADC apparatus and method using multiple sampling
KR20090058011A (en) * 2006-10-06 2009-06-08 소니 가부시끼 가이샤 Solid-state imaging device, driving method and imaging device of solid-state imaging device
JP2009089066A (en) * 2007-09-28 2009-04-23 Sony Corp A / D conversion circuit, solid-state imaging device, and camera system

Also Published As

Publication number Publication date
KR101211082B1 (en) 2012-12-12
WO2012074287A2 (en) 2012-06-07
KR20120061523A (en) 2012-06-13

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