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WO2008010120A3 - Employing beam scanning for optical detection - Google Patents

Employing beam scanning for optical detection Download PDF

Info

Publication number
WO2008010120A3
WO2008010120A3 PCT/IB2007/052499 IB2007052499W WO2008010120A3 WO 2008010120 A3 WO2008010120 A3 WO 2008010120A3 IB 2007052499 W IB2007052499 W IB 2007052499W WO 2008010120 A3 WO2008010120 A3 WO 2008010120A3
Authority
WO
WIPO (PCT)
Prior art keywords
substrate
scanning
focusing element
irradiation beam
excitation irradiation
Prior art date
Application number
PCT/IB2007/052499
Other languages
French (fr)
Other versions
WO2008010120A2 (en
Inventor
Dijk Erik M H P Van
Marius I Boamfa
Marcello L M Balistreri
Reinhold Wimberger-Friedl
Original Assignee
Koninkl Philips Electronics Nv
Dijk Erik M H P Van
Marius I Boamfa
Marcello L M Balistreri
Reinhold Wimberger-Friedl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv, Dijk Erik M H P Van, Marius I Boamfa, Marcello L M Balistreri, Reinhold Wimberger-Friedl filed Critical Koninkl Philips Electronics Nv
Publication of WO2008010120A2 publication Critical patent/WO2008010120A2/en
Publication of WO2008010120A3 publication Critical patent/WO2008010120A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6452—Individual samples arranged in a regular 2D-array, e.g. multiwell plates

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

A detection system is described allowing scanning of an excitation irradiation beam over a substrate (8) for detecting luminescence sites. The scanning thereby is performed by using an optical deflector (5) for varying an angle of incidence of the excitation irradiation beam on a single focusing element (7) on an irradiation path between the deflector (5) and the substrate (8). By varying the angle of incidence on the single focusing element (7), the focus point of the excitation irradiation beam is shifted in the focal plane of the focusing element (7), where the substrate (8) is positioned. The latter allows fast scanning of the excitation irradiation beam. In a preferred embodiment, an additional scanning motion in a substantially different direction is furthermore superimposed, resulting in the possibility for scanning an appropriate area of the substrate (8). The additional scanning motion may be obtained using a split optics system, whereby substantially only the single focusing element (7) and the optical deflector (5) are moved with respect to the substrate (8), whereas other optical components typically are fixed with respect to the substrate (8) during the scanning.
PCT/IB2007/052499 2006-07-17 2007-06-27 Employing beam scanning for optical detection WO2008010120A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP06117295 2006-07-17
EP06117295.3 2006-07-17

Publications (2)

Publication Number Publication Date
WO2008010120A2 WO2008010120A2 (en) 2008-01-24
WO2008010120A3 true WO2008010120A3 (en) 2008-05-02

Family

ID=38957158

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2007/052499 WO2008010120A2 (en) 2006-07-17 2007-06-27 Employing beam scanning for optical detection

Country Status (1)

Country Link
WO (1) WO2008010120A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10539497B2 (en) 2014-06-05 2020-01-21 Essen Instruments, Inc. Automated alignment of optics within a flow cytometer
EP3152545A2 (en) 2014-06-05 2017-04-12 IntelliCyt Corporation Flow cytometer with optical system assembly
US11137337B2 (en) 2019-01-21 2021-10-05 Essen Instruments, Inc. Flow cytometry with data analysis for optimized dilution of fluid samples for flow cytometry investigation
US11709116B2 (en) 2020-02-04 2023-07-25 Sartorius Bioanalytical Instruments, Inc. Liquid flourescent dye concentrate for flow cytometry evaluation of virus-size particles and related products and methods

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5981956A (en) * 1996-05-16 1999-11-09 Affymetrix, Inc. Systems and methods for detection of labeled materials
US20020027202A1 (en) * 2000-09-07 2002-03-07 Johann Engelhardt Method and apparatus for the detection of fluorescent light in confocal scanning microscopy
US20030198272A1 (en) * 2002-04-19 2003-10-23 Fuji Photo Film Co., Ltd. Image read-out method and apparatus
US20060033918A1 (en) * 2004-08-13 2006-02-16 Nikon Corporation Scanning microscope and laser microscope
WO2006038149A1 (en) * 2004-10-01 2006-04-13 Koninklijke Philips Electronics N. V. Method and apparatus for the detection of labeling elements in a sample
US20060109461A1 (en) * 2003-05-30 2006-05-25 Olympus Corporation Spectroscopy analysis apparatus

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5981956A (en) * 1996-05-16 1999-11-09 Affymetrix, Inc. Systems and methods for detection of labeled materials
US20020027202A1 (en) * 2000-09-07 2002-03-07 Johann Engelhardt Method and apparatus for the detection of fluorescent light in confocal scanning microscopy
US20030198272A1 (en) * 2002-04-19 2003-10-23 Fuji Photo Film Co., Ltd. Image read-out method and apparatus
US20060109461A1 (en) * 2003-05-30 2006-05-25 Olympus Corporation Spectroscopy analysis apparatus
US20060033918A1 (en) * 2004-08-13 2006-02-16 Nikon Corporation Scanning microscope and laser microscope
WO2006038149A1 (en) * 2004-10-01 2006-04-13 Koninklijke Philips Electronics N. V. Method and apparatus for the detection of labeling elements in a sample

Also Published As

Publication number Publication date
WO2008010120A2 (en) 2008-01-24

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