WO2006032836A1 - Thick-film hybrid production process - Google Patents
Thick-film hybrid production process Download PDFInfo
- Publication number
- WO2006032836A1 WO2006032836A1 PCT/GB2005/003290 GB2005003290W WO2006032836A1 WO 2006032836 A1 WO2006032836 A1 WO 2006032836A1 GB 2005003290 W GB2005003290 W GB 2005003290W WO 2006032836 A1 WO2006032836 A1 WO 2006032836A1
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- WO
- WIPO (PCT)
- Prior art keywords
- thick
- process according
- film
- pads
- overglaze
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title description 4
- 238000000034 method Methods 0.000 claims abstract description 37
- 239000000758 substrate Substances 0.000 claims abstract description 36
- 239000004020 conductor Substances 0.000 claims abstract description 20
- 239000000919 ceramic Substances 0.000 claims abstract description 13
- 238000007639 printing Methods 0.000 claims abstract description 6
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 24
- 229910052709 silver Inorganic materials 0.000 claims description 19
- 239000004332 silver Substances 0.000 claims description 19
- 229910052759 nickel Inorganic materials 0.000 claims description 12
- 239000010931 gold Substances 0.000 claims description 11
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 10
- 229910052737 gold Inorganic materials 0.000 claims description 10
- 229910000679 solder Inorganic materials 0.000 claims description 10
- 239000004411 aluminium Substances 0.000 claims description 6
- 229910052782 aluminium Inorganic materials 0.000 claims description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 6
- 238000003466 welding Methods 0.000 claims description 6
- 239000003292 glue Substances 0.000 claims description 3
- 238000009966 trimming Methods 0.000 claims description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 17
- 239000000976 ink Substances 0.000 description 9
- 238000005516 engineering process Methods 0.000 description 7
- 239000011521 glass Substances 0.000 description 7
- 239000000463 material Substances 0.000 description 7
- 230000005012 migration Effects 0.000 description 6
- 238000013508 migration Methods 0.000 description 6
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 5
- 238000007650 screen-printing Methods 0.000 description 4
- 238000005476 soldering Methods 0.000 description 4
- 229910052593 corundum Inorganic materials 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000001465 metallisation Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 229910001845 yogo sapphire Inorganic materials 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 2
- 101100434911 Mus musculus Angpt1 gene Proteins 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- MSNOMDLPLDYDME-UHFFFAOYSA-N gold nickel Chemical compound [Ni].[Au] MSNOMDLPLDYDME-UHFFFAOYSA-N 0.000 description 2
- -1 lead) in the glass Chemical class 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- IHWJXGQYRBHUIF-UHFFFAOYSA-N [Ag].[Pt] Chemical compound [Ag].[Pt] IHWJXGQYRBHUIF-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 238000004026 adhesive bonding Methods 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000007872 degassing Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 210000001787 dendrite Anatomy 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000002386 leaching Methods 0.000 description 1
- 230000005923 long-lasting effect Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000005272 metallurgy Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- SWELZOZIOHGSPA-UHFFFAOYSA-N palladium silver Chemical compound [Pd].[Ag] SWELZOZIOHGSPA-UHFFFAOYSA-N 0.000 description 1
- 230000002787 reinforcement Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
- C04B41/81—Coating or impregnation
- C04B41/89—Coating or impregnation for obtaining at least two superposed coatings having different compositions
- C04B41/90—Coating or impregnation for obtaining at least two superposed coatings having different compositions at least one coating being a metal
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/4867—Applying pastes or inks, e.g. screen printing
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/009—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone characterised by the material treated
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/52—Multiple coating or impregnating multiple coating or impregnating with the same composition or with compositions only differing in the concentration of the constituents, is classified as single coating or impregnation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/245—Reinforcing conductive patterns made by printing techniques or by other techniques for applying conductive pastes, inks or powders; Reinforcing other conductive patterns by such techniques
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/245—Reinforcing conductive patterns made by printing techniques or by other techniques for applying conductive pastes, inks or powders; Reinforcing other conductive patterns by such techniques
- H05K3/246—Reinforcing conductive paste, ink or powder patterns by other methods, e.g. by plating
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2111/00—Mortars, concrete or artificial stone or mixtures to prepare them, characterised by specific function, property or use
- C04B2111/00474—Uses not provided for elsewhere in C04B2111/00
- C04B2111/00844—Uses not provided for elsewhere in C04B2111/00 for electronic applications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/45124—Aluminium (Al) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19107—Disposition of discrete passive components off-chip wires
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
- H05K1/092—Dispersed materials, e.g. conductive pastes or inks
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/16—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor
- H05K1/167—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor incorporating printed resistors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0137—Materials
- H05K2201/017—Glass ceramic coating, e.g. formed on inorganic substrate
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/0347—Overplating, e.g. for reinforcing conductors or bumps; Plating over filled vias
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/243—Reinforcing the conductive pattern characterised by selective plating, e.g. for finish plating of pads
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
Definitions
- the present invention relates to a process for producing a thick-film hybrid.
- the inventive process enables thick-film hybrids which operate satisfactorily at high temperatures, for example ambient temperatures above 150 0 C.
- the state of the art integration technology proposed for temperatures above 150 0 C is Thick-film Hybrid Technology on ceramic substrates, for example Al 2 O 3 , using silver- based ink systems and insulating overglazes for covering the silver and enabling pad layer reinforcement.
- the most common technology to produce metal films on a ceramic substrate is screen printing.
- the pattern to be printed is produced by photolithographic means in the film layer on top of a steel wire mesh with appropriate mesh size.
- Typical layer thicknesses are in the order of 8 to 18 ⁇ m. If larger thicknesses are required for lower conductor resistance, multiple printing and burning of layers on top of each other is possible.
- the most important ceramic substrates used in thick film technology are alumina (Al 2 O 3 ) and aluminium nitride (AlN).
- Standard thick-film materials are the silver palladium (AgPd) air fireable inks.
- the palladium content is needed to reduce the tendency of migration and leaching of pure silver, but it is costly and increases the resistivity of the films.
- copper based systems have been introduced which have to be burned in nitrogen to avoid oxidation. This is no problem for gold-based inks which are, of course, a high-end system both with respect to cost and performance (low ohmic, non-oxidizing, no corrosion). Due to cost, only small gold film thicknesses are produced resulting in a moderate sheet resistance of the track.
- a good (low-priced) alternative is the family of pure silver and silver platinum inks which combine the advantages of low ohmic tracks with firing in air and low material cost.
- a further problem is to find a suited process that allows the simultaneous use of the different technologies mentioned above at high operation temperatures.
- the inventive process and material selection for applying thick-film technology on ceramic substrates produces reliable electrical conductor tracks and thick-film resistors for high temperature applications with ambient temperatures above 15O 0 C. Based on these substrates, electrical hybrids can be built with surface mountable components and long lasting reliable interconnections to the substrate.
- a process for producing a thick-film hybrid comprising the steps of: providing a ceramic substrate; printing at least one thick-film conducting layer onto the substrate to form a conductive pattern on the substrate, the pattern comprising at least one conductive pad located for subsequent connection to an electrical component; covering at least a portion of the thick- film conductor with an insulating overglaze, leaving the or each pad uncovered by the overglaze; metallising the pad(s); and electrically connecting an electrical component to the or each metallised pad.
- the thick-film conductor comprises silver.
- a resistor film is printed onto the substrate, to form at least one resistor.
- the step of covering the thick-film conductor with an overglaze preferably includes covering the resistor film with the overglaze.
- the at least one overglazed resistor may then be trimmed to adjust its electrical characteristics. This trimming may be carried out using a laser. The trimmed resistor may then be re-covered by overglaze.
- the step of metallising the pads comprises applying a layer of nickel to the pads.
- a layer of gold may be applied to the layer of nickel.
- the step of electrically connecting electrical components to the metallised pads may comprise affixing components to the pads using solder and / or electrically conductive glue.
- the step of electrically connecting electrical components to the metallised pads may comprise affixing wire bonds to the pads, for example aluminium wire bonds. These may be affixed ultrasonically.
- the step of electrically connecting electrical components to the metallised pads may comprise affixing metallic strips to the pads by welding.
- the metallic strips may comprise nickel.
- a thick-film hybrid produced by the inventive process.
- a thick-film hybrid comprising a ceramic substrate, at least one thick-film conducting layer forming a conductive pattern arranged on the substrate, the pattern comprising at least one conductive pad, wherein at least a portion of the thick-film conductor is covered with an insulating overglaze leaving the or each pad uncovered by said overglaze, said at least one pad is metallised, and an electrical component is electrically connected to the or each metallised pad.
- Figure 1 shows a ceramic substrate with overglazed conductive tracks
- Figure 2 shows a section of a hybrid with a surface mounted component
- Figure 3 shows a section of a hybrid with various connections.
- a thick-film hybrid is produced using the following steps, illustrated in Figs 1 to 3:
- a ceramic substrate for example Al 2 O 3
- the conductor pattern to be printed is produced with a standard process as described above, using silver-based thick-film inks.
- the substrates are passed through a belt dryer at around 15O 0 C for about lOmin and subsequently through a multizone belt furnace with maximum temperature of about 850 0 C and with air or N 2 -atmosphere.
- the substrates should be present for about lOmin in order to completely burn out all organic constituents and to melt the glass frit of the ink, which then tends to flow into the interface between the substrate and the thick film layer thus acting as glue.
- Typical layer thicknesses are in the order of about 8 to 18 ⁇ m. If larger thicknesses are required, multiple printing and burning of layers on t ⁇ p of each other is possible. Fine line patterns down to track widths of about 75 ⁇ m are feasible. Complex wiring can therefore be accomplished. To maintain low levels of silver migration the distance d, see Fig.l, between two tracks 2 should be about 1 mm / 100V or a minimum of about 0.5 mm.
- the resistor ink family used has to be compatible with the AgPd or AgPt termination metallurgies as specified by the suppliers.
- the production of resistors with different resistivity ranges is accomplished by printing and drying for about 10-15 min at around 150 0 C the different pastes successively, which are then simultaneously co-fired at about 850 0 C in air for about 10 min at peak temperature.
- the overglaze 3 is a multifunctional layer. Apart from protecting most of the silver layer printed on the alumina substrate (from migration) it simultaneously serves as a mask for the subsequent metallisation of the I/O-pads and as a solderstop during the reflow soldering process of the final assembly. In both processes it prevents the additional material, for example nickel/gold plated onto the silver and, respectively, solder wetting the nickel/gold surface, from contacting the regions of the hybrid where it is not supposed to be deposited.
- the printed resistors may be laser-trimmed to adjust the electrical characteristics with an accuracy of ⁇ 1%.
- the resistor material and the overglaze are cut (e.g. L-cut) with a resulting open cut that is very susceptible to any contamination by the ambient or subsequent processes.
- This step is necessary to close the open cuts to protect the resistors against an intrusion of gas or bath solutions during the following steps or long-term operation. Only the resistor pattern is screen printed again and the same overglaze may be used as before.
- a nickel-gold interface 4 is introduced between the contact areas and the silver-based conductor tracks 2 below.
- a suitable electroless metallization process is described for example in UK Patent Application No. 0417917.2.
- a layer of nickel is applied to the pads, followed by a thin layer of gold.
- solder 6 such as semiconductor 7 may be affixed by applying solder 6 to the substrate contacts, by using screen printing as mentioned above.
- the solder is ideally a high temperature solder with a high lead content (Pb95Sn5) and a solidus temperature above 30O 0 C. In this case, only bare chips and components with non-organic housings can be used.
- the components are placed into the wet solder and then soldered in a batch oven with an oxygen-reducing atmosphere.
- the peak temperature is about 350 0 C for around 2 minutes.
- soft solders like lead are used which can act as an elastic mechanical connection, to minimize the mechanical stress on the components during the cool-down process, due to thermal mismatch between the substrate and the components and the shrinkage of the solid solder itself.
- Gluing with an electrical conductive material is an alternative or additional process, which does not need the high process temperature compared to soldering. Therefore additional devices can be used which would not withstand the solder process.
- the composition may be for example a metal filled epoxy that concurrently provides the mechanical fixation and electrical connection of the component. The epoxy is applied to the corresponding contacts after any soldering has been done. The component is then placed on the substrate and then cured at elevated temperatures (below 200 0 C).
- An ultrasonic bonding process with aluminium wire 8 is used to make electrical contacts between bare semiconductor chips and the nickel gold pads.
- An advantage of the aluminium wire is the monometallic connection to the chip contacts and the proven and known long-time reliability with the nickel connection on top of the silver tracks.
- the interconnections between different substrates as shown in Fig. 3, to connectors or to flying leads are made by thin (low current) or thick (high current) nickel strips 9, which are micro-welded on the nickel-Au pads.
- the welding process may be achieved by ohmic heating on the tip of the weld tool, with the welding voltage and time selected as necessary.
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- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Structural Engineering (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0706875A GB2432978A (en) | 2004-09-22 | 2005-08-24 | Thick-film hybrid production process |
NO20071954A NO20071954L (en) | 2004-09-22 | 2007-04-17 | Process of producing thick film hybrid |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0420992A GB2418538A (en) | 2004-09-22 | 2004-09-22 | Thick-film printed circuit |
GB0420992.0 | 2004-09-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2006032836A1 true WO2006032836A1 (en) | 2006-03-30 |
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ID=33306966
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Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/GB2005/003290 WO2006032836A1 (en) | 2004-09-22 | 2005-08-24 | Thick-film hybrid production process |
Country Status (3)
Country | Link |
---|---|
GB (2) | GB2418538A (en) |
NO (1) | NO20071954L (en) |
WO (1) | WO2006032836A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7032042B2 (en) * | 2015-12-22 | 2022-03-08 | ヘレウス ドイチェラント ゲーエムベーハー ウント カンパニー カーゲー | Direct-bonded copper substrate improved with thick film paste |
EP3301082B1 (en) * | 2016-09-30 | 2024-09-18 | Infineon Technologies AG | Method for producing a metal-ceramic substrate |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03244183A (en) * | 1990-02-22 | 1991-10-30 | Matsushita Electric Ind Co Ltd | Thick film integrated circuit device |
JPH04296088A (en) * | 1991-03-25 | 1992-10-20 | Nec Corp | Thick film hybrid integrated circuit device |
US5937321A (en) * | 1996-11-09 | 1999-08-10 | Robert Bosch Gmbh | Method for manufacturing ceramic multilayer circuit |
US20050019534A1 (en) * | 2003-07-23 | 2005-01-27 | Walter Roethlingshoefer | Method for producing a hybrid product composed of several wiring planes, as well as a sensor or evaluation circuit and a control device with hybrid product produced by the inventive method |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4870240A (en) * | 1987-01-30 | 1989-09-26 | Siemens Aktiengesellschaft | Apparatus for contacting wires with resistance welding |
JPS63253659A (en) * | 1987-04-10 | 1988-10-20 | Hitachi Ltd | Thick-film hybrid integrated circuit device |
JPH02112201A (en) * | 1988-10-21 | 1990-04-24 | Hitachi Ltd | Thick film hybrid integrated circuit |
JPH0846357A (en) * | 1994-07-29 | 1996-02-16 | Hitachi Ltd | Production of thin film ceramic hybrid board |
JPH08162746A (en) * | 1994-11-30 | 1996-06-21 | Taiyo Yuden Co Ltd | Circuit board |
JP2000207938A (en) * | 1999-01-13 | 2000-07-28 | Murata Mfg Co Ltd | Insulative glass paste and thick-film circuit parts |
JP2000216187A (en) * | 1999-01-20 | 2000-08-04 | Fuji Electric Co Ltd | Module with built-in electronic parts |
JP4019543B2 (en) * | 1999-03-23 | 2007-12-12 | 株式会社デンソー | Circuit board manufacturing method |
DE60021828D1 (en) * | 1999-10-28 | 2005-09-15 | Murata Manufacturing Co | Thick film resistor and ceramic substrate |
-
2004
- 2004-09-22 GB GB0420992A patent/GB2418538A/en not_active Withdrawn
-
2005
- 2005-08-24 WO PCT/GB2005/003290 patent/WO2006032836A1/en active Application Filing
- 2005-08-24 GB GB0706875A patent/GB2432978A/en not_active Withdrawn
-
2007
- 2007-04-17 NO NO20071954A patent/NO20071954L/en not_active Application Discontinuation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03244183A (en) * | 1990-02-22 | 1991-10-30 | Matsushita Electric Ind Co Ltd | Thick film integrated circuit device |
JPH04296088A (en) * | 1991-03-25 | 1992-10-20 | Nec Corp | Thick film hybrid integrated circuit device |
US5937321A (en) * | 1996-11-09 | 1999-08-10 | Robert Bosch Gmbh | Method for manufacturing ceramic multilayer circuit |
US20050019534A1 (en) * | 2003-07-23 | 2005-01-27 | Walter Roethlingshoefer | Method for producing a hybrid product composed of several wiring planes, as well as a sensor or evaluation circuit and a control device with hybrid product produced by the inventive method |
Non-Patent Citations (2)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 016, no. 031 (E - 1159) 27 January 1992 (1992-01-27) * |
PATENT ABSTRACTS OF JAPAN vol. 017, no. 115 (E - 1330) 10 March 1993 (1993-03-10) * |
Also Published As
Publication number | Publication date |
---|---|
GB2432978A (en) | 2007-06-06 |
NO20071954L (en) | 2007-06-22 |
GB0420992D0 (en) | 2004-10-20 |
GB0706875D0 (en) | 2007-05-16 |
GB2418538A (en) | 2006-03-29 |
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