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WO2005019810A3 - Thz investigative systems, focussing members for thz investigative systems, and a scanning probe - Google Patents

Thz investigative systems, focussing members for thz investigative systems, and a scanning probe Download PDF

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Publication number
WO2005019810A3
WO2005019810A3 PCT/GB2004/003632 GB2004003632W WO2005019810A3 WO 2005019810 A3 WO2005019810 A3 WO 2005019810A3 GB 2004003632 W GB2004003632 W GB 2004003632W WO 2005019810 A3 WO2005019810 A3 WO 2005019810A3
Authority
WO
WIPO (PCT)
Prior art keywords
thz
focussing
section
radiation
systems
Prior art date
Application number
PCT/GB2004/003632
Other languages
French (fr)
Other versions
WO2005019810A2 (en
Inventor
Bryan Edward Cole
Michael John Withers
Original Assignee
Teraview Ltd
Bryan Edward Cole
Michael John Withers
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teraview Ltd, Bryan Edward Cole, Michael John Withers filed Critical Teraview Ltd
Publication of WO2005019810A2 publication Critical patent/WO2005019810A2/en
Publication of WO2005019810A3 publication Critical patent/WO2005019810A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/02—Refracting or diffracting devices, e.g. lens, prism
    • H01Q15/08—Refracting or diffracting devices, e.g. lens, prism formed of solid dielectric material
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/02—Simple or compound lenses with non-spherical faces
    • G02B3/04—Simple or compound lenses with non-spherical faces with continuous faces that are rotationally symmetrical but deviate from a true sphere, e.g. so called "aspheric" lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/42—Coupling light guides with opto-electronic elements
    • G02B6/4201—Packages, e.g. shape, construction, internal or external details
    • G02B6/4204—Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms
    • G02B6/4206—Optical features

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Toxicology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

A Thz investigating system is described, said system comprising a focussing member (53) and being configured to transmit THz radiation through said focussing member, said focussing member having. an ellipsoidal focussing surface (55) through which said THz radiation emitted by a THz emitter (71) is transmitted. Alternative focussing members suitable for use in Thz investigating systems have an aspherical convex focussing surface following a specific equation. Furthermore a scanning probe is described, said probe comprising a source of radiation, a focussing member having a first section and a second section, said second section being slidable with respect to said first section and having a sample surface, the system being configured such that radiation emitted from said radiation source enters said first section and exits the focussing member through the sample surface, said system further comprising translating means arranged to translate said first section and said radiation source with respect to the second member, thus scanning the radiation across said sample surface.
PCT/GB2004/003632 2003-08-22 2004-08-20 Thz investigative systems, focussing members for thz investigative systems, and a scanning probe WO2005019810A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0319842A GB2405263B (en) 2003-08-22 2003-08-22 Sample investigation system with sliding focussing elements
GB0319842.1 2003-08-22

Publications (2)

Publication Number Publication Date
WO2005019810A2 WO2005019810A2 (en) 2005-03-03
WO2005019810A3 true WO2005019810A3 (en) 2005-05-06

Family

ID=28460191

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/GB2004/003632 WO2005019810A2 (en) 2003-08-22 2004-08-20 Thz investigative systems, focussing members for thz investigative systems, and a scanning probe

Country Status (2)

Country Link
GB (1) GB2405263B (en)
WO (1) WO2005019810A2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11112305B2 (en) 2012-01-23 2021-09-07 The Regents Of The University Of California Photoconductive detector device with plasmonic electrodes
US11249017B2 (en) 2017-04-20 2022-02-15 The Regents Of The University Of California Systems and methods for high frequency nanoscopy

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7449695B2 (en) 2004-05-26 2008-11-11 Picometrix Terahertz imaging system for examining articles
CA2656177C (en) 2005-06-30 2015-04-21 Streetlight Intelligence, Inc. Adaptive energy performance monitoring and control system
ATE556568T1 (en) 2005-06-30 2012-05-15 Led Roadway Lighting Ltd METHOD AND SYSTEM FOR LUMINANCE CHARACTERIZATION
FR2904434B1 (en) * 2006-07-28 2011-04-15 Univ Savoie OPTICAL DEVICE FOR IMAGING OR CHARACTERIZING A MATERIAL SAMPLE IN MICROSCOPY OR SPECTROSCOPY IN REFLECTION IN THE TERAHERTZ SPECTRAL DOMAIN
US7888646B2 (en) 2007-06-04 2011-02-15 Morpho Detection, Inc. System and method for detecting contraband
US7745792B2 (en) 2007-08-15 2010-06-29 Morpho Detection, Inc. Terahertz detectors for use in terahertz inspection or imaging systems
GB2452267B (en) * 2007-08-28 2010-06-16 Teraview Ltd Scanning Terahertz probe
US8290710B2 (en) 2007-09-07 2012-10-16 Led Roadway Lighting Ltd. Streetlight monitoring and control
DE102013217038A1 (en) * 2013-08-27 2015-03-05 Inoex Gmbh Measuring device for reflection measurements on test objects and method for measuring radiation reflected on test objects
JP2015087163A (en) * 2013-10-29 2015-05-07 パイオニア株式会社 Terahertz wave measuring device
DE102016119728A1 (en) * 2016-10-17 2018-04-19 Inoex Gmbh Lnnovationen Und Ausrüstungen Für Die Extrusionstechnik Terahertz meter
US11906424B2 (en) 2019-10-01 2024-02-20 The Regents Of The University Of California Method for identifying chemical and structural variations through terahertz time-domain spectroscopy
EP4052458A4 (en) 2019-10-31 2023-11-29 The Regents of the University of California Methods and systems for detecting water status in plants using terahertz radiation
CN111308464B (en) * 2020-02-29 2024-04-09 哈尔滨吉赫科技有限责任公司 Ultra-wideband terahertz passive anti-stealth radar
CN111964596B (en) * 2020-08-19 2021-10-19 长春理工大学 Caliper type thickness measuring device and method based on terahertz pulse
CN112378881B (en) * 2020-10-21 2022-09-16 山东省科学院自动化研究所 Terahertz spectrum-based drug identification method
DE102020133704B4 (en) 2020-12-16 2022-07-07 CiTEX Holding GmbH THz measuring device and THz measuring method for measuring a corrugated pipe

Citations (5)

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EP0727671A2 (en) * 1995-02-15 1996-08-21 AT&T Corp. Method and apparatus for terahertz imaging
EP0828143A2 (en) * 1996-09-09 1998-03-11 Lucent Technologies Inc. Optical system employing terahertz radiation
US5991098A (en) * 1995-12-12 1999-11-23 Pareto; Eugeni Jordana Lens structure without spherical aberration and stereoscopic camera including such lens structure
US6388799B1 (en) * 1998-11-03 2002-05-14 Toshiba Research Europe Limited Optical device and imaging system
GB2371618A (en) * 2001-01-30 2002-07-31 Teraprobe Ltd A probe comprising a dielectric body for examining a sample using radiation

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JPH0461636A (en) * 1990-06-27 1992-02-27 Omron Corp Optical head
DE4225512C1 (en) * 1992-08-01 1994-02-17 Bosch Gmbh Robert Opto-electronic radiation detector, e.g. for IR communications system - uses semi-ellipsoidal lens coupled to optical sensor via intermediate cylindrical disc
US5706017A (en) * 1993-04-21 1998-01-06 California Institute Of Technology Hybrid antenna including a dielectric lens and planar feed
US5581408A (en) * 1994-05-13 1996-12-03 United Technologies Corporation Method and apparatus for deflecting an optical beam
EP1571824B1 (en) * 1996-10-30 2012-10-24 FUJIFILM Corporation Method and apparatus for inner face scanning with multi beams
AUPO790397A0 (en) * 1997-07-16 1997-08-07 Lions Eye Institute Of Western Australia Incorporated, The Laser scanning apparatus and method
JP2000228023A (en) * 1999-02-05 2000-08-15 Samsung Yokohama Kenkyusho:Kk Optical pickup device
EP1155294A1 (en) * 1999-02-23 2001-11-21 Teraprobe Limited Method and apparatus for terahertz imaging
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Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0727671A2 (en) * 1995-02-15 1996-08-21 AT&T Corp. Method and apparatus for terahertz imaging
US5991098A (en) * 1995-12-12 1999-11-23 Pareto; Eugeni Jordana Lens structure without spherical aberration and stereoscopic camera including such lens structure
EP0828143A2 (en) * 1996-09-09 1998-03-11 Lucent Technologies Inc. Optical system employing terahertz radiation
US6388799B1 (en) * 1998-11-03 2002-05-14 Toshiba Research Europe Limited Optical device and imaging system
GB2371618A (en) * 2001-01-30 2002-07-31 Teraprobe Ltd A probe comprising a dielectric body for examining a sample using radiation

Non-Patent Citations (2)

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Title
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SIEBERT K J ET AL: "All-optoelectronic continuous wave THz imaging for biomedical applications", PHYS. MED. BIOL., vol. 47, 2002, pages 3743 - 3748, XP002306731 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11112305B2 (en) 2012-01-23 2021-09-07 The Regents Of The University Of California Photoconductive detector device with plasmonic electrodes
US11231318B2 (en) 2012-01-23 2022-01-25 The Regents Of The University Of California Photoconductive detector device with plasmonic electrodes
US11249017B2 (en) 2017-04-20 2022-02-15 The Regents Of The University Of California Systems and methods for high frequency nanoscopy

Also Published As

Publication number Publication date
GB2405263A (en) 2005-02-23
GB2405263B (en) 2006-07-12
WO2005019810A2 (en) 2005-03-03
GB0319842D0 (en) 2003-09-24

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