[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

WO2002029893A1 - Semiconductor device - Google Patents

Semiconductor device Download PDF

Info

Publication number
WO2002029893A1
WO2002029893A1 PCT/JP2000/006859 JP0006859W WO0229893A1 WO 2002029893 A1 WO2002029893 A1 WO 2002029893A1 JP 0006859 W JP0006859 W JP 0006859W WO 0229893 A1 WO0229893 A1 WO 0229893A1
Authority
WO
WIPO (PCT)
Prior art keywords
power source
operating power
circuit
threshold voltage
logic threshold
Prior art date
Application number
PCT/JP2000/006859
Other languages
French (fr)
Japanese (ja)
Inventor
Kouichi Ashiga
Takaaki Noda
Katsuhiro Masujima
Original Assignee
Hitachi, Ltd
Hitachi Device Engeneering Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi, Ltd, Hitachi Device Engeneering Co., Ltd. filed Critical Hitachi, Ltd
Priority to JP2002533375A priority Critical patent/JPWO2002029893A1/en
Priority to AU2000274531A priority patent/AU2000274531A1/en
Priority to PCT/JP2000/006859 priority patent/WO2002029893A1/en
Publication of WO2002029893A1 publication Critical patent/WO2002029893A1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/085Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
    • H01L27/088Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
    • H01L27/092Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0008Arrangements for reducing power consumption
    • H03K19/0016Arrangements for reducing power consumption by using a control or a clock signal, e.g. in order to apply power supply

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

A semiconductor device (1) has a plurality of circuit blocks (BLK1 BLK8) having different operating power source voltages and a common logic threshold voltage in a semiconductor chip (1A). Each circuit block operates with an operating power source voltage which is equal to the potential difference between a low potential level and a high potential level, outputs a signal the amplitude center of which is the logic threshold voltage and corresponds to its operating power source voltage, and receives a signal the amplitude center of which is the logic threshold voltage different from that of the output signal. Even if the operating power source voltage of each built-in circuit block is determined as desired depending on its operating frequency, or each built-in circuit block is programmably switched depending on the operating mode, each circuit block can interface a signal the amplitude center of which is a logic threshold voltage common to the other circuit blocks and corresponds to the operating power source voltage, and therefore any additional circuit such as a level converting circuit is not necessary.
PCT/JP2000/006859 2000-10-03 2000-10-03 Semiconductor device WO2002029893A1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2002533375A JPWO2002029893A1 (en) 2000-10-03 2000-10-03 Semiconductor device
AU2000274531A AU2000274531A1 (en) 2000-10-03 2000-10-03 Semiconductor device
PCT/JP2000/006859 WO2002029893A1 (en) 2000-10-03 2000-10-03 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2000/006859 WO2002029893A1 (en) 2000-10-03 2000-10-03 Semiconductor device

Publications (1)

Publication Number Publication Date
WO2002029893A1 true WO2002029893A1 (en) 2002-04-11

Family

ID=11736554

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2000/006859 WO2002029893A1 (en) 2000-10-03 2000-10-03 Semiconductor device

Country Status (3)

Country Link
JP (1) JPWO2002029893A1 (en)
AU (1) AU2000274531A1 (en)
WO (1) WO2002029893A1 (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005269516A (en) * 2004-03-22 2005-09-29 Denso Corp Integrated circuit device
JP2007180085A (en) * 2005-12-27 2007-07-12 Seiko Epson Corp Integrated circuit device
JP2007184678A (en) * 2006-01-04 2007-07-19 Fujitsu Ltd Semiconductor integrated circuit device
JP2008004848A (en) * 2006-06-23 2008-01-10 Ricoh Co Ltd Trimming method of semiconductor device
US7498750B2 (en) 2004-06-21 2009-03-03 Koninklijke Philips Electronics N.V. Gas discharge lamp driving circuit and method with resonating sweep voltage
JP2009510617A (en) * 2005-09-28 2009-03-12 インテル コーポレイション Power supply and power management for multi-core processors
US7612604B2 (en) 2002-05-07 2009-11-03 Hitachi, Ltd. Semiconductor integrated circuit device
JP2013527941A (en) * 2009-12-14 2013-07-04 ザ・ボーイング・カンパニー System and method for controlling devices operating within different voltage ranges
WO2012122221A3 (en) * 2011-03-10 2013-07-04 Microchip Technology Incorporated Using low voltage regulator to supply power to a source-biased power domain

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05299624A (en) * 1992-04-23 1993-11-12 Mitsubishi Electric Corp Semiconductor integrated circuit device
US5289425A (en) * 1991-04-18 1994-02-22 Hitachi, Ltd. Semiconductor integrated circuit device
US5583457A (en) * 1992-04-14 1996-12-10 Hitachi, Ltd. Semiconductor integrated circuit device having power reduction mechanism
EP0843247A2 (en) * 1996-11-19 1998-05-20 Nec Corporation Regulator built-in semiconductor integrated circuit
JPH10209380A (en) * 1997-01-23 1998-08-07 Kawasaki Steel Corp Semiconductor integrated circuit
JPH10228339A (en) * 1997-02-13 1998-08-25 Canon Inc Power supply management device
US5847432A (en) * 1995-01-11 1998-12-08 Mitsubishi Denki Kabushiki Kaisha Semiconductor device and production method therefor
WO1999034445A1 (en) * 1997-12-26 1999-07-08 Hitachi, Ltd. Semiconductor integrated circuit
JPH11250661A (en) * 1998-12-25 1999-09-17 Hitachi Ltd Semiconductor device
US6060905A (en) * 1996-02-07 2000-05-09 International Business Machines Corporation Variable voltage, variable impedance CMOS off-chip driver and receiver interface and circuits
JP2000164805A (en) * 1998-11-25 2000-06-16 Fujitsu Ltd Internal voltage forming circuit

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5289425A (en) * 1991-04-18 1994-02-22 Hitachi, Ltd. Semiconductor integrated circuit device
US5583457A (en) * 1992-04-14 1996-12-10 Hitachi, Ltd. Semiconductor integrated circuit device having power reduction mechanism
JPH05299624A (en) * 1992-04-23 1993-11-12 Mitsubishi Electric Corp Semiconductor integrated circuit device
US5847432A (en) * 1995-01-11 1998-12-08 Mitsubishi Denki Kabushiki Kaisha Semiconductor device and production method therefor
US6060905A (en) * 1996-02-07 2000-05-09 International Business Machines Corporation Variable voltage, variable impedance CMOS off-chip driver and receiver interface and circuits
EP0843247A2 (en) * 1996-11-19 1998-05-20 Nec Corporation Regulator built-in semiconductor integrated circuit
JPH10209380A (en) * 1997-01-23 1998-08-07 Kawasaki Steel Corp Semiconductor integrated circuit
JPH10228339A (en) * 1997-02-13 1998-08-25 Canon Inc Power supply management device
WO1999034445A1 (en) * 1997-12-26 1999-07-08 Hitachi, Ltd. Semiconductor integrated circuit
JP2000164805A (en) * 1998-11-25 2000-06-16 Fujitsu Ltd Internal voltage forming circuit
JPH11250661A (en) * 1998-12-25 1999-09-17 Hitachi Ltd Semiconductor device

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7612604B2 (en) 2002-05-07 2009-11-03 Hitachi, Ltd. Semiconductor integrated circuit device
JP2005269516A (en) * 2004-03-22 2005-09-29 Denso Corp Integrated circuit device
JP4576862B2 (en) * 2004-03-22 2010-11-10 株式会社デンソー Integrated circuit device
US7498750B2 (en) 2004-06-21 2009-03-03 Koninklijke Philips Electronics N.V. Gas discharge lamp driving circuit and method with resonating sweep voltage
JP2009510617A (en) * 2005-09-28 2009-03-12 インテル コーポレイション Power supply and power management for multi-core processors
JP2007180085A (en) * 2005-12-27 2007-07-12 Seiko Epson Corp Integrated circuit device
JP2007184678A (en) * 2006-01-04 2007-07-19 Fujitsu Ltd Semiconductor integrated circuit device
JP2008004848A (en) * 2006-06-23 2008-01-10 Ricoh Co Ltd Trimming method of semiconductor device
JP2013527941A (en) * 2009-12-14 2013-07-04 ザ・ボーイング・カンパニー System and method for controlling devices operating within different voltage ranges
WO2012122221A3 (en) * 2011-03-10 2013-07-04 Microchip Technology Incorporated Using low voltage regulator to supply power to a source-biased power domain
US8970190B2 (en) 2011-03-10 2015-03-03 Microchip Technology Incorporated Using low voltage regulator to supply power to a source-biased power domain

Also Published As

Publication number Publication date
JPWO2002029893A1 (en) 2004-02-19
AU2000274531A1 (en) 2002-04-15

Similar Documents

Publication Publication Date Title
US5959472A (en) Driver circuit device
WO2003030360A3 (en) High voltage cmos output driver in low voltage process
EP1318601A3 (en) Voltage mode differential driver and method
MY118314A (en) Semiconductor integrated circuit
US5886556A (en) Low power schmitt trigger
AU2002359642A1 (en) Input buffer and method for voltage level detection
WO2002093745A3 (en) Reconfigurable logic device
US7019559B2 (en) Level shift circuit
WO2002029893A1 (en) Semiconductor device
TW344131B (en) A 1.5V bootstrapped all-N-logic true-single-phase CMOS dynamic logic circuit suitable for low supply voltage and high speed pipelined
KR100453084B1 (en) Semiconductor integrated circuit device
WO2002095531A3 (en) Circuit having a controllable slew rate
TW333698B (en) The method for output circuit to select switch transistor & semiconductor memory
WO2004032323A3 (en) Circuit arrangement for bridging high voltages using a switching signal
EP0661809A1 (en) A buffer stage for use with a current controlled oscillator
TW357452B (en) Semiconductor device having an input buffer circuit with low power consumption
CA2089429A1 (en) Low power noise rejecting ttl to cmos input buffer
EP1437815A1 (en) Power supply voltage selection circuit
TW200610268A (en) Level shifter and method thereof
KR19980050807A (en) Semiconductor circuit for generating high output voltage
ATE253784T1 (en) OUTPUT DRIVER CIRCUIT
US8937503B2 (en) Switch control circuit, semiconductor device, and radio communication device
KR950016000A (en) Semiconductor device with CMOS and bipolar circuits
TW200513036A (en) Delay stage insensitive to operating voltage and delay circuit including the same
WO2002029972A3 (en) Buffers with reduced voltage input/output signals

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A1

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CR CU CZ DE DK DM DZ EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT TZ UA UG US UZ VN YU ZA ZW

AL Designated countries for regional patents

Kind code of ref document: A1

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG

DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
121 Ep: the epo has been informed by wipo that ep was designated in this application
WWE Wipo information: entry into national phase

Ref document number: 2002533375

Country of ref document: JP

REG Reference to national code

Ref country code: DE

Ref legal event code: 8642

122 Ep: pct application non-entry in european phase