WO1994002965A1 - Ceramic deflection device - Google Patents
Ceramic deflection device Download PDFInfo
- Publication number
- WO1994002965A1 WO1994002965A1 PCT/GB1993/001456 GB9301456W WO9402965A1 WO 1994002965 A1 WO1994002965 A1 WO 1994002965A1 GB 9301456 W GB9301456 W GB 9301456W WO 9402965 A1 WO9402965 A1 WO 9402965A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- electrostrictive
- ceramic material
- ceramic
- layer
- deflection
- Prior art date
Links
- 239000000919 ceramic Substances 0.000 title claims abstract description 22
- 239000010410 layer Substances 0.000 claims abstract description 35
- 229910010293 ceramic material Inorganic materials 0.000 claims abstract description 27
- 238000006073 displacement reaction Methods 0.000 claims abstract description 17
- 239000002356 single layer Substances 0.000 claims abstract description 3
- 238000000034 method Methods 0.000 claims description 21
- 239000002184 metal Substances 0.000 claims description 7
- 229910052751 metal Inorganic materials 0.000 claims description 7
- 239000000758 substrate Substances 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 claims description 4
- 238000000151 deposition Methods 0.000 claims description 2
- 230000008713 feedback mechanism Effects 0.000 claims description 2
- 238000010304 firing Methods 0.000 claims description 2
- 238000010345 tape casting Methods 0.000 claims description 2
- 230000005684 electric field Effects 0.000 description 8
- 230000000694 effects Effects 0.000 description 5
- 238000005452 bending Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- FYOZFGWYYZDOQH-UHFFFAOYSA-N [Mg].[Nb] Chemical compound [Mg].[Nb] FYOZFGWYYZDOQH-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000003985 ceramic capacitor Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 230000028161 membrane depolarization Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/20—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators
- H10N30/204—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators using bending displacement, e.g. unimorph, bimorph or multimorph cantilever or membrane benders
- H10N30/2041—Beam type
- H10N30/2042—Cantilevers, i.e. having one fixed end
Definitions
- the present invention relates to a ceramic deflection device and, in particular, to a method of producing and operating a monolithic ceramic deflection device and displacement sensor which does not employ a piezoelectric sensor.
- Ceramic bending devices utilizing the converse piezoelectric effect are well known in the art. This is the phenomenon by which an applied electric field generates a proportional shape change in such materials. Devices often take the form of so-called bimorphs and multimorphs. The operating principle is identical in both cases. Alternating layers of piezoelectric ceramic are poled, usually in antiparallel directions. The application of an electric field induces a transverse compressive strain in those layers having polar directions parallel to the field, due to the piezoelectric coefficient d_. of the piezoelectric ceramic material. Conversely, transverse tensile strain is induced in layers poled antiparallel to the applied field.
- the free end of the device is deflected by an amount determined by the magnitude of the applied field, d and various geometrical factors.
- the displacement is reversed on reversal of the field direction. It is- usual to apply the same electric field across all of the layers of the device.
- EP-A-0137148 describes such a piezoelectric bimorph constructed from piezoelectric ceramic layers which are poled.
- This device has the advantage of a monolithic sensor enabling feedback control.
- the piezoelectric sensor portion of the device operates without the application of an externally applied electric bias field.
- the device is made to bend by the application of an electric field to the remainder. This places a stress on the sensor portion, causing current to flow which can be related to the displacement of the element.
- GB-A-2006541 discloses a piezoelectric bimorph which has a pair of oppositely polarized piezoelectric elements bonded to a common substrate.
- a drive circuit applies a deflection voltage to each element in the same sense as the polarization of the element and thus avoids depolarization of the elements.
- the device does not include a displacement sensor.
- EP-A-0262637 discloses a piezoelectric bimorph device in which the piezoelectric ceramic layers are poled in the same direction and the application of an electric field across each layer causes bending.
- the device does not include a displacement sensor.
- two ceramic layers are bonded, in such a way as to enable electrical contact, to the major surfaces of a metal shim and electrodes applied to their opposite surfaces.
- the application of an electric field between the metal shim and the upper external electrode causes upwards deflection.
- M or Q 12 which places the upper ceramic layer under compressive strain.
- the deflection obtained varies, amongst others, as a function of the square of the applied field and, therefore, reversal of the electic field direction induces identical upwards deflection.
- the electric field is applied between the metal shim and the lower electrode, downwards deflection is produced, regardless of the field direction.
- the present invention provides a monolithic ceramic device comprising an integral electrostrictive deflection element and a displacement sensor which device comprises two layers of an electrostrictive ceramic material with a central electrode sandwiched therebetween, the outer surfaces of each layer of the ceramic material having attached thereto at least one conducting electrode and means for applying a bias field across a single layer of the electrostrictive ceramic material.
- the central electrode of the deflection element of the present invention is generally connected to the earth .
- the electrostrictive deflection device and sensor of the present invention together form a monolithic element, i.e. the sensor is an integral part of the device rather than, for example, a bonded strain gauge or capactive displacement sensor.
- the present invention also includes within its scope a method for the fabrication of a monolithic element as defined above, which method comprises forming a sandwich of a central electrode between two layers of an electrostrictive ceramic material, the outer surface of each of the layers of the ceramic material having a conducting electrode formed thereon.
- the monolithic ceramic device may be formed by bonding individual ceramic plates onto a metal substrate which forms the central electrode, for example by means of an adhesive, or by depositing the electrostrictive ceramic material onto the metal substrate.
- the electrodes may be attached to the outer surface of each layer of the electrostrictive ceramic material by electrodeposition or other methods known in the art.
- the monolithic device may be formed by the method of tape casting the ceramic material, electroding, forming a laminate and firing the structure, in a manner similar to that used in the production of multilayer ceramic capacitors.
- the present invention also includes within its scope a method of operating an electrostrictive deflection element and displacement sensor as hereinbefore defined, which method comprises applying a potential to the conducting electrode on one layer of the electrostrictive ceramic material and applying a d.c. bias voltage to the conducting electrode on the other layer of the electrostrictive ceramic material, and measuring the charge.
- the charge, Q which is generated by the sensor portion of the structure may be measured by conventional techniques.
- the deflection of the electrostrictive deflection element may thus be controlled by a feedback mechanism.
- Figure 1 is a schematic illustration of the device of the present invention
- Figure 2 is a schematic illustration of the device of the invention caused to deflect upwardly
- Figure 3 is a schematic illustration of the device of the invention caused to deflect downwardly; and Figure 4 is a graph of the sensor output voltage against the applied voltage for the device as described in the Example.
- Electrodes 5 and 6 are formed on the outer surfaces of layers 1 and 2.
- the device is clamped in position by means of clamps 7 and 8.
- the connections to the electrodes 5 and 6 are shown at 9 and 10, respectively.
- Vb A d.c. bias voltage, Vb, is simultaneously applied to the lower electrode 6 and causes the lower section of the device to act as a sensor, generating a charge flow which is proportional to the change in displacement.
- the d.c. bias field causes a deflection which opposes that generated by the deflecting portion. Consequently, the d.c. bias voltage may be maintained at a relatively small value, typically about 20 V, to obtain large displacements. It follows, however, that the effective stiffness of the device, which is the resistance to deflection, can be controlled by variation of the d.c. bias, a larger d.c. bias providing a greater resistance to deflection. This type of device may be used in active vibration control.
- a device of the type as described with reference to Figure 1 of the accompanying drawings was prepared from an electrostrictive material based on lead magnesium niobium titanate, Pb(Mg.Nb ? )0 -PbTi0_.
- the fired device consisted of layers of the ceramic material approximately 200 ⁇ m thick, separated by a central palladium electrode. Electrical contacts were made to the surfaces of the ceramic layers as shown in Figure 1.
- a d.c. bias voltage of 15 V was applied to the ceramic layer chosen to operate as a sensor and a triangle wave drive voltage was applied to the ceramic layer chosen to operate as an actuator. Displacement of the actuator placed a stress on the sensor, causing the generation of a proportional output signal.
- the sensor output signal (in mV) is plotted in Figure 4 as a function of the voltage applied to the actuator.
- the response is electrostrictive in nature, as expected for the motion of the actuator.
- the offset in the response is a natural consequence of the application of the d.c. bias to the sensor portion and can be removed by the application of an equal d.c. bias offset to the actuator portion.
Landscapes
- General Electrical Machinery Utilizing Piezoelectricity, Electrostriction Or Magnetostriction (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP93916053A EP0650642A1 (en) | 1992-07-17 | 1993-07-13 | Ceramic deflection device |
GB9500800A GB2284298B (en) | 1992-07-17 | 1993-07-13 | Ceramic deflection device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9215254.5 | 1992-07-17 | ||
GB929215254A GB9215254D0 (en) | 1992-07-17 | 1992-07-17 | Ceramic deflection device |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1994002965A1 true WO1994002965A1 (en) | 1994-02-03 |
Family
ID=10718897
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/GB1993/001456 WO1994002965A1 (en) | 1992-07-17 | 1993-07-13 | Ceramic deflection device |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0650642A1 (en) |
GB (2) | GB9215254D0 (en) |
WO (1) | WO1994002965A1 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20040040791A (en) * | 2002-11-08 | 2004-05-13 | 정성필 | The anchor method which uses the ground improvement shoe |
WO2006125694A1 (en) * | 2005-05-25 | 2006-11-30 | Siemens Aktiengesellschaft | Piezoelectric bending transducer comprising a sensor element for detecting a deflection of the bending transducer |
US7336022B2 (en) * | 2001-06-27 | 2008-02-26 | Siemens Aktiengesellschaft | Piezoelectrical bending converter |
DE102011080114A1 (en) | 2011-07-29 | 2013-01-31 | Siemens Aktiengesellschaft | Detecting a deformation parameter of a piezoelectric bending transducer |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2365251B (en) * | 1997-09-05 | 2002-04-03 | 1 Ltd | Moving magnet transducer |
GB2329514B (en) * | 1997-09-05 | 2002-02-13 | 1 Ipr Ltd | Aerogels, piezoelectric devices and uses therefor |
GB2362976B (en) | 2000-05-31 | 2005-04-27 | Seiko Epson Corp | Memory device |
GB2362989B (en) | 2000-05-31 | 2004-03-24 | Seiko Epson Corp | Piezoelectric devices |
US6540618B1 (en) | 2000-09-26 | 2003-04-01 | The Torrington Company | Steering column slider assembly |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0137148A2 (en) * | 1983-09-13 | 1985-04-17 | International Business Machines Corporation | Electrostatic probe |
US4594526A (en) * | 1982-11-19 | 1986-06-10 | Nec Corporation | Bimorph electromechanical transducer and control circuit device therefor |
-
1992
- 1992-07-17 GB GB929215254A patent/GB9215254D0/en active Pending
-
1993
- 1993-07-13 GB GB9500800A patent/GB2284298B/en not_active Expired - Fee Related
- 1993-07-13 WO PCT/GB1993/001456 patent/WO1994002965A1/en not_active Application Discontinuation
- 1993-07-13 EP EP93916053A patent/EP0650642A1/en not_active Withdrawn
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4594526A (en) * | 1982-11-19 | 1986-06-10 | Nec Corporation | Bimorph electromechanical transducer and control circuit device therefor |
EP0137148A2 (en) * | 1983-09-13 | 1985-04-17 | International Business Machines Corporation | Electrostatic probe |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7336022B2 (en) * | 2001-06-27 | 2008-02-26 | Siemens Aktiengesellschaft | Piezoelectrical bending converter |
KR20040040791A (en) * | 2002-11-08 | 2004-05-13 | 정성필 | The anchor method which uses the ground improvement shoe |
WO2006125694A1 (en) * | 2005-05-25 | 2006-11-30 | Siemens Aktiengesellschaft | Piezoelectric bending transducer comprising a sensor element for detecting a deflection of the bending transducer |
DE102011080114A1 (en) | 2011-07-29 | 2013-01-31 | Siemens Aktiengesellschaft | Detecting a deformation parameter of a piezoelectric bending transducer |
WO2013017389A1 (en) | 2011-07-29 | 2013-02-07 | Siemens Aktiengesellschaft | Detecting a deformation parameter of a piezoelectric bending transducer |
Also Published As
Publication number | Publication date |
---|---|
GB9215254D0 (en) | 1992-09-02 |
EP0650642A1 (en) | 1995-05-03 |
GB2284298A (en) | 1995-05-31 |
GB2284298B (en) | 1996-05-15 |
GB9500800D0 (en) | 1995-03-08 |
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