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USD991813S1 - Spectrum analyzer - Google Patents

Spectrum analyzer Download PDF

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Publication number
USD991813S1
USD991813S1 US29/857,716 US202229857716F USD991813S US D991813 S1 USD991813 S1 US D991813S1 US 202229857716 F US202229857716 F US 202229857716F US D991813 S USD991813 S US D991813S
Authority
US
United States
Prior art keywords
spectrum analyzer
design
view
spectrum
broken line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/857,716
Inventor
Daisuke Sato
Gentarou ISHIHARA
Ayako KOUNO
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Yokogawa Test and Measurement Corp
Original Assignee
Yokogawa Electric Corp
Yokogawa Test and Measurement Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp, Yokogawa Test and Measurement Corp filed Critical Yokogawa Electric Corp
Priority to US29/857,716 priority Critical patent/USD991813S1/en
Application granted granted Critical
Publication of USD991813S1 publication Critical patent/USD991813S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

The file of this patent contains at least one drawing/photograph executed in color. Copies of this patent with color drawing(s)/photograph(s) will be provided by the Office upon request and payment of the necessary fee.
FIG. 1 is a front view of a spectrum analyzer showing our new design;
FIG. 2 is a right side view thereof, the left side view being a mirror image; and,
FIG. 3 is a top view thereof.
The broken line gridded portion forms part of the claimed design.
The broken lines outside the gridded area depict portions of the spectrum analyzer which form no part of the claimed design.
The broken line text forms no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a spectrum analyzer, as shown and described.
US29/857,716 2021-04-26 2022-10-25 Spectrum analyzer Active USD991813S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/857,716 USD991813S1 (en) 2021-04-26 2022-10-25 Spectrum analyzer

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US35/355,128 USD987459S1 (en) 2021-04-26 2021-04-26 Spectrum analyzer
US29/857,716 USD991813S1 (en) 2021-04-26 2022-10-25 Spectrum analyzer

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US35/355,128 Division USD987459S1 (en) 2021-04-26 2021-04-26 Spectrum analyzer

Publications (1)

Publication Number Publication Date
USD991813S1 true USD991813S1 (en) 2023-07-11

Family

ID=86426444

Family Applications (3)

Application Number Title Priority Date Filing Date
US35/355,128 Active USD987459S1 (en) 2021-04-26 2021-04-26 Spectrum analyzer
US29/857,732 Active USD991814S1 (en) 2021-04-26 2022-10-25 Spectrum analyzer
US29/857,716 Active USD991813S1 (en) 2021-04-26 2022-10-25 Spectrum analyzer

Family Applications Before (2)

Application Number Title Priority Date Filing Date
US35/355,128 Active USD987459S1 (en) 2021-04-26 2021-04-26 Spectrum analyzer
US29/857,732 Active USD991814S1 (en) 2021-04-26 2022-10-25 Spectrum analyzer

Country Status (1)

Country Link
US (3) USD987459S1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD993277S1 (en) * 2020-12-10 2023-07-25 Yokogawa Electric Corporation Display screen or portion thereof with graphical user interface
TWD232694S (en) 2023-11-07 2024-08-01 炳碩生醫股份有限公司 Parts of Spectroscopic Analysis Inspection Machine
TWD232693S (en) 2023-11-07 2024-08-01 炳碩生醫股份有限公司 Parts of Spectroscopic Analysis Inspection Machine

Citations (69)

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USD251366S (en) 1977-03-14 1979-03-20 Wiltron Company Electronic test instrument
US4244024A (en) 1978-08-10 1981-01-06 Hewlett-Packard Company Spectrum analyzer having enterable offsets and automatic display zoom
US4253152A (en) 1978-08-10 1981-02-24 Hewlett-Packard Company Spectrum analyzer with parameter updating from a display marker
US4257104A (en) 1978-08-10 1981-03-17 Hewlett-Packard Company Apparatus for spectrum analysis of an electrical signal
US4264958A (en) 1978-08-10 1981-04-28 Hewlett-Packard Company Video processor for a spectrum analyzer
US4350953A (en) 1978-03-20 1982-09-21 Hewlett-Packard Company Time interval measurement apparatus
USD282351S (en) 1983-10-11 1986-01-28 Norland Corporation Digital oscilloscope
US4578640A (en) 1982-09-14 1986-03-25 Analogic Corporation Oscilloscope control
US4695833A (en) 1983-03-28 1987-09-22 Hitachi Construction Machinery Co. Man-machine interface type portable ultrasonic composite measuring apparatus
US4800378A (en) * 1985-08-23 1989-01-24 Snap-On Tools Corporation Digital engine analyzer
US4821030A (en) * 1986-12-19 1989-04-11 Tektronix, Inc. Touchscreen feedback system
US4924175A (en) * 1988-02-29 1990-05-08 Clinton James R Apparatus for displaying analog signatures of an electronic component
US4972138A (en) 1987-05-11 1990-11-20 Hewlett Packard Co. Oscilloscope-like user-interface for a logic analyzer
US5025411A (en) * 1986-12-08 1991-06-18 Tektronix, Inc. Method which provides debounced inputs from a touch screen panel by waiting until each x and y coordinates stop altering
US5177560A (en) 1991-11-06 1993-01-05 Hewlett-Packard Company Optical spectrum analyzer having adjustable sensitivity
USD335093S (en) 1991-09-23 1993-04-27 Snap-On Tools Corporation Digital oscilloscope
US5321420A (en) 1991-04-26 1994-06-14 Motorola, Inc. Operator interface for an electronic measurement system
US5396444A (en) 1984-01-09 1995-03-07 Hewlett-Packard Company Terminator keys having reciprocal exponents in a data processing system
US5434954A (en) * 1990-03-30 1995-07-18 Anritsu Corporation Waveform display apparatus for easily realizing high-definition waveform observation
USD367821S (en) 1993-11-06 1996-03-12 Helmut Fischer Coating thickness gauge
USD377319S (en) 1995-06-14 1997-01-14 Advantest Corporation Network analyzer
US5631667A (en) * 1993-12-08 1997-05-20 Cadwell Industries, Inc. Frequency and amplitude measurement tool for electronic displays
USD420607S (en) * 1999-04-09 2000-02-15 Tektronix, Inc. Front panel for a measurement instrument
US6112593A (en) * 1997-11-14 2000-09-05 Hitachi Construction Machinery Co., Ltd. Portable non-destructive inspection device and support casing therefor
US6140812A (en) * 1998-06-18 2000-10-31 Tektronix, Inc. Electronic instrument with multiple position spring detented handle
US6195617B1 (en) 1998-03-09 2001-02-27 Lecroy, S.A. Digital storage oscilloscope with simultaneous primary measurement and derived parameter display on common time axis and method therefor
USD460371S1 (en) 2001-12-20 2002-07-16 Tektronix, Inc. Measurement instrument
USD460703S1 (en) 2001-12-20 2002-07-23 Tektronix, Inc. Measurement instrument
US6437552B1 (en) 2000-07-31 2002-08-20 Lecroy Corporation Automatic probe identification system
US20030062906A1 (en) * 2001-09-28 2003-04-03 Anderson Mark A. Instrument with housing having recess for connectors
US20030219086A1 (en) 2002-05-21 2003-11-27 Lecheminant Greg D. Jitter identification using a wide bandwidth oscilloscope
US6731104B1 (en) * 2002-12-05 2004-05-04 Tektronix, Inc. Measurement probe system with EOS/ESD protection
US20040095381A1 (en) 2002-11-14 2004-05-20 Mcdowell David H. Graphical user interface for a remote spectrum analyzer
US6774890B2 (en) 2001-01-09 2004-08-10 Tektronix, Inc. Touch controlled zoom and pan of graphic displays
US20040164984A1 (en) 2003-02-25 2004-08-26 Pickerd John J. Method of constraints control for oscilloscope vertical subsection and display parameters
US20040167727A1 (en) 2003-02-25 2004-08-26 Pickerd John J. Method of constraints control for oscilloscope timebase subsection and display parameters
USD499658S1 (en) 2004-04-30 2004-12-14 Tektronix, Inc. Waveform generator
USD501414S1 (en) 2003-10-09 2005-02-01 Lecroy Corporation Measurement instrument
US6856127B1 (en) * 2003-07-25 2005-02-15 Tektronix, Inc. Oscilloscope-based automatic finder for locating high power dissipation areas in switch-mode power supply (SMPS) switching devices
USD504079S1 (en) 2004-04-30 2005-04-19 Tektronix, Inc. Oscilloscope instrument
USD504078S1 (en) 2003-10-09 2005-04-19 Lecroy Corporation Measurement instrument
USD504080S1 (en) 2004-04-30 2005-04-19 Tektronix, Inc. Oscilloscope instrument
USD504341S1 (en) 2003-10-09 2005-04-26 Lecroy Corporation Measurement instrument
US6982550B2 (en) * 2004-04-28 2006-01-03 Agilent Technologies, Inc. Unbreakable micro-browser
USD514004S1 (en) 2004-04-30 2006-01-31 Tektronix, Inc. Waveform generator
US20070027675A1 (en) 2005-07-26 2007-02-01 Lecroy Corporation Spectrum analyzer control in an oscilloscope
USD556066S1 (en) 2006-01-10 2007-11-27 Lecroy Corporation Housing for oscilloscope
US20080231256A1 (en) * 2006-12-19 2008-09-25 Lecroy Corporation Removable Front Panel Control for Oscilloscope
US20080278143A1 (en) * 2006-12-19 2008-11-13 Lecroy Corporation Remote Display and Control for Test and Measurement Apparatus
US7459898B1 (en) 2005-11-28 2008-12-02 Ryan Woodings System and apparatus for detecting and analyzing a frequency spectrum
US7911466B2 (en) * 2006-09-26 2011-03-22 Fujitsu Limited Method and apparatus for editing timing diagram, and computer product
US8195413B2 (en) * 2006-05-22 2012-06-05 Rohde & Schwarz Gmbh & Co. Kg Measuring device for a preview display of several time-variable electrical signals
USD663636S1 (en) 2011-04-22 2012-07-17 Tektronix, Inc. Front panel for a measurement instrument
US20130006570A1 (en) 2011-06-30 2013-01-03 Kaplan Sidney J Unbound oscilloscope probe systems-using rf and or optical test point links - provides operational access and mobility
US8521457B2 (en) * 2008-10-20 2013-08-27 Olympus Ndt User designated measurement display system and method for NDT/NDI with high rate input data
US8576231B2 (en) * 2005-11-28 2013-11-05 Ryan Woodings Spectrum analyzer interface
US9234927B2 (en) * 2009-04-24 2016-01-12 Rohde & Schwarz Gmbh & Co. Kg Measuring instrument and measuring method featuring dynamic channel allocation
US9367166B1 (en) * 2007-12-21 2016-06-14 Cypress Semiconductor Corporation System and method of visualizing capacitance sensing system operation
US9459290B2 (en) * 2013-04-30 2016-10-04 Keysight Technologies, Inc. Oscilloscope system and method for simultaneously displaying zoomed-in and zoomed-out waveforms
US9546927B2 (en) * 2014-09-08 2017-01-17 Yokogawa Electric Corporation Optical pulse tester
US9646395B2 (en) * 2014-02-27 2017-05-09 Change Healthcare Llc Method and apparatus for comparing portions of a waveform
USD787961S1 (en) * 2015-05-26 2017-05-30 Graphtec Corporation Measurement data collector
USD820129S1 (en) * 2014-11-21 2018-06-12 Tektronix, Inc. Front panel for a measurement instrument
USD845797S1 (en) * 2016-12-01 2019-04-16 Elma Electronic Ag Versatile casing for electronic equipment
US20190162764A1 (en) 2014-04-02 2019-05-30 Research Electronics International, Llc Expanded Detail Graphical Display for Spectrum Analyzers
USD909899S1 (en) * 2019-01-25 2021-02-09 Tektronix, Inc. Housing for a test and measurement instrument
US20210325437A1 (en) 2020-04-19 2021-10-21 Research Electronics International, Llc Cached Peak Graphical Display for Spectrum Analyzers
USD955246S1 (en) * 2018-05-31 2022-06-21 Micromass Uk Limited Mass spectrometer
US11415602B2 (en) * 2018-12-03 2022-08-16 Rohde & Schwarz Gmbh & Co. Kg Method for operating an oscilloscope as well as oscilloscope

Patent Citations (70)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD251366S (en) 1977-03-14 1979-03-20 Wiltron Company Electronic test instrument
US4350953A (en) 1978-03-20 1982-09-21 Hewlett-Packard Company Time interval measurement apparatus
US4244024A (en) 1978-08-10 1981-01-06 Hewlett-Packard Company Spectrum analyzer having enterable offsets and automatic display zoom
US4253152A (en) 1978-08-10 1981-02-24 Hewlett-Packard Company Spectrum analyzer with parameter updating from a display marker
US4257104A (en) 1978-08-10 1981-03-17 Hewlett-Packard Company Apparatus for spectrum analysis of an electrical signal
US4264958A (en) 1978-08-10 1981-04-28 Hewlett-Packard Company Video processor for a spectrum analyzer
US4578640A (en) 1982-09-14 1986-03-25 Analogic Corporation Oscilloscope control
US4695833A (en) 1983-03-28 1987-09-22 Hitachi Construction Machinery Co. Man-machine interface type portable ultrasonic composite measuring apparatus
USD282351S (en) 1983-10-11 1986-01-28 Norland Corporation Digital oscilloscope
US5396444A (en) 1984-01-09 1995-03-07 Hewlett-Packard Company Terminator keys having reciprocal exponents in a data processing system
US4800378A (en) * 1985-08-23 1989-01-24 Snap-On Tools Corporation Digital engine analyzer
US5025411A (en) * 1986-12-08 1991-06-18 Tektronix, Inc. Method which provides debounced inputs from a touch screen panel by waiting until each x and y coordinates stop altering
US4821030A (en) * 1986-12-19 1989-04-11 Tektronix, Inc. Touchscreen feedback system
US4972138A (en) 1987-05-11 1990-11-20 Hewlett Packard Co. Oscilloscope-like user-interface for a logic analyzer
US4924175A (en) * 1988-02-29 1990-05-08 Clinton James R Apparatus for displaying analog signatures of an electronic component
US5434954A (en) * 1990-03-30 1995-07-18 Anritsu Corporation Waveform display apparatus for easily realizing high-definition waveform observation
US5321420A (en) 1991-04-26 1994-06-14 Motorola, Inc. Operator interface for an electronic measurement system
USD335093S (en) 1991-09-23 1993-04-27 Snap-On Tools Corporation Digital oscilloscope
US5177560A (en) 1991-11-06 1993-01-05 Hewlett-Packard Company Optical spectrum analyzer having adjustable sensitivity
USD367821S (en) 1993-11-06 1996-03-12 Helmut Fischer Coating thickness gauge
US5631667A (en) * 1993-12-08 1997-05-20 Cadwell Industries, Inc. Frequency and amplitude measurement tool for electronic displays
USD377319S (en) 1995-06-14 1997-01-14 Advantest Corporation Network analyzer
US6112593A (en) * 1997-11-14 2000-09-05 Hitachi Construction Machinery Co., Ltd. Portable non-destructive inspection device and support casing therefor
US6195617B1 (en) 1998-03-09 2001-02-27 Lecroy, S.A. Digital storage oscilloscope with simultaneous primary measurement and derived parameter display on common time axis and method therefor
US6140812A (en) * 1998-06-18 2000-10-31 Tektronix, Inc. Electronic instrument with multiple position spring detented handle
USD420607S (en) * 1999-04-09 2000-02-15 Tektronix, Inc. Front panel for a measurement instrument
US6437552B1 (en) 2000-07-31 2002-08-20 Lecroy Corporation Automatic probe identification system
US6774890B2 (en) 2001-01-09 2004-08-10 Tektronix, Inc. Touch controlled zoom and pan of graphic displays
US20030062906A1 (en) * 2001-09-28 2003-04-03 Anderson Mark A. Instrument with housing having recess for connectors
USD460371S1 (en) 2001-12-20 2002-07-16 Tektronix, Inc. Measurement instrument
USD460703S1 (en) 2001-12-20 2002-07-23 Tektronix, Inc. Measurement instrument
US20030219086A1 (en) 2002-05-21 2003-11-27 Lecheminant Greg D. Jitter identification using a wide bandwidth oscilloscope
US20040095381A1 (en) 2002-11-14 2004-05-20 Mcdowell David H. Graphical user interface for a remote spectrum analyzer
US6731104B1 (en) * 2002-12-05 2004-05-04 Tektronix, Inc. Measurement probe system with EOS/ESD protection
US20040164984A1 (en) 2003-02-25 2004-08-26 Pickerd John J. Method of constraints control for oscilloscope vertical subsection and display parameters
US20040167727A1 (en) 2003-02-25 2004-08-26 Pickerd John J. Method of constraints control for oscilloscope timebase subsection and display parameters
US6856127B1 (en) * 2003-07-25 2005-02-15 Tektronix, Inc. Oscilloscope-based automatic finder for locating high power dissipation areas in switch-mode power supply (SMPS) switching devices
USD504341S1 (en) 2003-10-09 2005-04-26 Lecroy Corporation Measurement instrument
USD501414S1 (en) 2003-10-09 2005-02-01 Lecroy Corporation Measurement instrument
USD504078S1 (en) 2003-10-09 2005-04-19 Lecroy Corporation Measurement instrument
US6982550B2 (en) * 2004-04-28 2006-01-03 Agilent Technologies, Inc. Unbreakable micro-browser
USD504080S1 (en) 2004-04-30 2005-04-19 Tektronix, Inc. Oscilloscope instrument
USD504079S1 (en) 2004-04-30 2005-04-19 Tektronix, Inc. Oscilloscope instrument
USD514004S1 (en) 2004-04-30 2006-01-31 Tektronix, Inc. Waveform generator
USD499658S1 (en) 2004-04-30 2004-12-14 Tektronix, Inc. Waveform generator
US20070027675A1 (en) 2005-07-26 2007-02-01 Lecroy Corporation Spectrum analyzer control in an oscilloscope
US7459898B1 (en) 2005-11-28 2008-12-02 Ryan Woodings System and apparatus for detecting and analyzing a frequency spectrum
US8576231B2 (en) * 2005-11-28 2013-11-05 Ryan Woodings Spectrum analyzer interface
USD556066S1 (en) 2006-01-10 2007-11-27 Lecroy Corporation Housing for oscilloscope
US8195413B2 (en) * 2006-05-22 2012-06-05 Rohde & Schwarz Gmbh & Co. Kg Measuring device for a preview display of several time-variable electrical signals
US7911466B2 (en) * 2006-09-26 2011-03-22 Fujitsu Limited Method and apparatus for editing timing diagram, and computer product
US20080278143A1 (en) * 2006-12-19 2008-11-13 Lecroy Corporation Remote Display and Control for Test and Measurement Apparatus
US20080231256A1 (en) * 2006-12-19 2008-09-25 Lecroy Corporation Removable Front Panel Control for Oscilloscope
US9367166B1 (en) * 2007-12-21 2016-06-14 Cypress Semiconductor Corporation System and method of visualizing capacitance sensing system operation
US8521457B2 (en) * 2008-10-20 2013-08-27 Olympus Ndt User designated measurement display system and method for NDT/NDI with high rate input data
US9234927B2 (en) * 2009-04-24 2016-01-12 Rohde & Schwarz Gmbh & Co. Kg Measuring instrument and measuring method featuring dynamic channel allocation
USD663636S1 (en) 2011-04-22 2012-07-17 Tektronix, Inc. Front panel for a measurement instrument
US20130006570A1 (en) 2011-06-30 2013-01-03 Kaplan Sidney J Unbound oscilloscope probe systems-using rf and or optical test point links - provides operational access and mobility
US9459290B2 (en) * 2013-04-30 2016-10-04 Keysight Technologies, Inc. Oscilloscope system and method for simultaneously displaying zoomed-in and zoomed-out waveforms
US9646395B2 (en) * 2014-02-27 2017-05-09 Change Healthcare Llc Method and apparatus for comparing portions of a waveform
US20190162764A1 (en) 2014-04-02 2019-05-30 Research Electronics International, Llc Expanded Detail Graphical Display for Spectrum Analyzers
US9546927B2 (en) * 2014-09-08 2017-01-17 Yokogawa Electric Corporation Optical pulse tester
USD820129S1 (en) * 2014-11-21 2018-06-12 Tektronix, Inc. Front panel for a measurement instrument
USD820127S1 (en) 2014-11-21 2018-06-12 Tektronix, Inc. Housing for a test and measurement instrument
USD787961S1 (en) * 2015-05-26 2017-05-30 Graphtec Corporation Measurement data collector
USD845797S1 (en) * 2016-12-01 2019-04-16 Elma Electronic Ag Versatile casing for electronic equipment
USD955246S1 (en) * 2018-05-31 2022-06-21 Micromass Uk Limited Mass spectrometer
US11415602B2 (en) * 2018-12-03 2022-08-16 Rohde & Schwarz Gmbh & Co. Kg Method for operating an oscilloscope as well as oscilloscope
USD909899S1 (en) * 2019-01-25 2021-02-09 Tektronix, Inc. Housing for a test and measurement instrument
US20210325437A1 (en) 2020-04-19 2021-10-21 Research Electronics International, Llc Cached Peak Graphical Display for Spectrum Analyzers

Also Published As

Publication number Publication date
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