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USD806586S1 - Image measuring device - Google Patents

Image measuring device Download PDF

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Publication number
USD806586S1
USD806586S1 US29/576,286 US201629576286F USD806586S US D806586 S1 USD806586 S1 US D806586S1 US 201629576286 F US201629576286 F US 201629576286F US D806586 S USD806586 S US D806586S
Authority
US
United States
Prior art keywords
measuring device
image measuring
view
elevational view
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/576,286
Inventor
Sadayuki Matsumiya
Yu Sugai
Shigeru Ohtani
Kenji Iwamoto
Ryohei KANNO
Atsushi Hattori
Takaharu Imura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JPD2016-4949F external-priority patent/JP1563237S/ja
Priority claimed from JPD2016-4977F external-priority patent/JP1563316S/ja
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Assigned to MITUTOYO CORPORATION reassignment MITUTOYO CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: HATTORI, ATSUSHI, IMURA, TAKAHARU, IWAMOTO, KENJI, KANNO, RYOHEI, MATSUMIYA, SADAYUKI, OHTANI, SHIGERU, SUGAI, YU
Application granted granted Critical
Publication of USD806586S1 publication Critical patent/USD806586S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a front, right-side, top perspective view of a first embodiment of the image measuring device;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a right-side elevational view thereof;
FIG. 5 is a left-side elevational view thereof;
FIG. 6 is a rear elevational view thereof; and
FIG. 7 is a bottom plan view thereof.
FIG. 8 is a front, right-side, top perspective view of a second embodiment of the image measuring device;
FIG. 9 is a front elevational view thereof;
FIG. 10 is a top plan view thereof;
FIG. 11 is a right-side elevational view thereof;
FIG. 12 is a left-side elevational view thereof;
FIG. 13 is a rear elevational view thereof; and,
FIG. 14 is a bottom plan view thereof.
The broken lines depict unclaimed portions of the image measuring device, and thus form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for an image measuring device, as shown and described.
US29/576,286 2016-03-04 2016-09-01 Image measuring device Active USD806586S1 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2016-004949 2016-03-04
JPD2016-4949F JP1563237S (en) 2016-03-04 2016-03-04
JP2016-004977 2016-03-04
JPD2016-4977F JP1563316S (en) 2016-03-04 2016-03-04

Publications (1)

Publication Number Publication Date
USD806586S1 true USD806586S1 (en) 2018-01-02

Family

ID=60804918

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/576,286 Active USD806586S1 (en) 2016-03-04 2016-09-01 Image measuring device

Country Status (1)

Country Link
US (1) USD806586S1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD981879S1 (en) 2021-03-05 2023-03-28 Mitutoyo Corporation Image measuring device
USD986075S1 (en) 2021-03-05 2023-05-16 Mitutoyo Corporation Image measuring device
USD1001657S1 (en) 2021-03-05 2023-10-17 Mitutoyo Corporation Image measuring device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD783424S1 (en) * 2016-03-04 2017-04-11 Mitutoyo Corporation Image measuring device
US9740190B2 (en) * 2014-10-09 2017-08-22 Mitutoyo Corporation Method for programming a three-dimensional workpiece scan path for a metrology system

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9740190B2 (en) * 2014-10-09 2017-08-22 Mitutoyo Corporation Method for programming a three-dimensional workpiece scan path for a metrology system
USD783424S1 (en) * 2016-03-04 2017-04-11 Mitutoyo Corporation Image measuring device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD981879S1 (en) 2021-03-05 2023-03-28 Mitutoyo Corporation Image measuring device
USD986075S1 (en) 2021-03-05 2023-05-16 Mitutoyo Corporation Image measuring device
USD1001657S1 (en) 2021-03-05 2023-10-17 Mitutoyo Corporation Image measuring device

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