US20140272688A1 - Grayscale lithography of photo definable glass - Google Patents
Grayscale lithography of photo definable glass Download PDFInfo
- Publication number
- US20140272688A1 US20140272688A1 US13/837,299 US201313837299A US2014272688A1 US 20140272688 A1 US20140272688 A1 US 20140272688A1 US 201313837299 A US201313837299 A US 201313837299A US 2014272688 A1 US2014272688 A1 US 2014272688A1
- Authority
- US
- United States
- Prior art keywords
- photosensitive glass
- glass substrate
- photomask
- substrate
- dimensional
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0042—Photosensitive materials with inorganic or organometallic light-sensitive compounds not otherwise provided for, e.g. inorganic resists
- G03F7/0043—Chalcogenides; Silicon, germanium, arsenic or derivatives thereof; Metals, oxides or alloys thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E50/00—Technologies for the production of fuel of non-fossil origin
- Y02E50/10—Biofuels, e.g. bio-diesel
Definitions
- the present invention relates to three-dimensional microstructures and methods of manufacturing three-dimensional microstructures.
- binary photomasks are typically comprised of a substantially transparent substrate (e.g., quartz) and an opaque layer (e.g., chrome) in which the pattern to be transferred is etched.
- an antireflective layer e.g., chrome oxide
- the photoresist in the substrate on the integrated circuit being processed is then developed and either the exposed or unexposed portions are removed. Thereafter, the material on the substrate is etched in the areas where the photoresist is removed.
- An example of the technology involved in manufacturing a traditional binary photomask (e.g., chrome-on-quartz) and its use to manufacture integrated circuits is disclosed in, for example, U.S. Pat. No. 6,406,818.
- Photosensitive glass also called photodefinable glass
- Photosensitive glass allows for the formation of microstructures in the glass without the use of photoresist.
- photosensitive glass when exposed to UV light, then baked at a certain temperature and duration, transforms into a ceramic material (crystalline-phase lithium metasilicate).
- the ceramic material is much more active for reaction with a hydrofluoric acid (HF) etchant than the amorphous glass.
- HF hydrofluoric acid
- a problem associated with the conventional method of forming a three-dimensional structure in photosensitive glass substrates is that the exposed portions are transformed into opaque ceramic material through the thickness of the substrate. Depending on the desired feature depth, the etching step will only remove a certain percentage of the entire exposed portion, resulting in opaque portions remaining in the substrate. Particularly in the case of microfluidic applications, these opaque portions are undesirable.
- Another problem associated with the conventional method is that the remaining ceramic portions will result in increased autofluorescence, which interferes with detection of fluorescent signals.
- FIG. 1 is a process diagram illustrating a method of manufacturing a three-dimensional microstructure according to an exemplary embodiment of the present invention.
- FIGS. 2A , 2 B, 2 C, and 2 D are respective first, second, third, and fourth sequential cross sectional views of a process of creating a three-dimensional microstructure according to an exemplary embodiment of the present invention.
- Various exemplary embodiments of the present invention are directed to a method of forming three-dimensional structures in a photosensitive glass substrate.
- grayscale lithography techniques are used to partially expose portions of the photosensitive glass substrate to UV light so as to control the amount of substrate that is converted to ceramic material as a result of the exposure.
- the use of grayscale lithography allows for the formation of through-glass vias (TGVs) where ceramic through-conversion is full (100%), as well as the formation of other areas where the ceramic conversion is less than 100% (e.g., 0%, 10%, 20%, 50%, etc.).
- TGVs through-glass vias
- microfluidic and other types of three-dimensional microstructures can be formed with, for example, TGVs, channels and sub-features within the channels, with a single exposure.
- any suitable grayscale lithography technique may be used to form three-dimensional structures in a photosensitive glass substrate.
- a continuous tone pattern on a photomask e.g., chrome-on-glass
- a binary half tone (“BHT”) photomask One type of continuous tone, variable transmission photomask is commonly known as a binary half tone (“BHT”) photomask.
- BHT photomasks use two levels of gray tones (e.g., 0% transmissive and 100% transmissive).
- variable transmission photomask Another type of continuous tone, variable transmission photomask is known as a gray scale photomask, which uses varying levels of transmission of light through the photomask (e.g., 0%, 50%, 100%, etc.).
- levels of transmission of light through the photomask e.g., 0%, 50%, 100%, etc.
- a three-dimensional structure can be formed in the photosensitive glass substrate through the use of a continuous tone pattern.
- BHT photomasks are typically designed to have sub-resolution features that partially transmit exposure source light intensity based on feature modulation in width and pitch.
- a BHT photomask layout may be designed for microscopic surfaces by dividing the patterned area of the photomask into pixels and sub-pixels (commonly referred to as “sub-pixelation”) which define areas on the mask through which light is to be transmitted.
- the sub-pixels defining the BHT photomask pattern are designed to be smaller than the resolution of the exposure tool being used so that a gray scale image can be created on the photosensitive glass substrate.
- An example of a BHT photomask that may be used in the present invention is disclosed in U.S. Pat. No. 6,828,068, the contents of which are incorporated herein by reference in their entirety.
- FIG. 1 shows a flowchart describing a method for manufacturing a three-dimensional microstructure according to exemplary embodiments.
- FIG. 2A-2D show a series of diagrams illustrating a process of creating a three-dimensional microstructure according to exemplary embodiments. Any type of three-dimensional microstructure may be formed using the processes described herein, including, for example, microarrays, microfluidic devices, titer plates, microelectromechanical systems (MEMS) and three-dimensional glass structures.
- MEMS microelectromechanical systems
- a suitable substrate 10 is provided.
- various exemplary embodiments of the present invention relate to three-dimensional microstructures manufactured from the substrate 10 .
- the substrate 10 may have one or more layers that are substantially transparent.
- the substrate 10 may be made of photosensitive glass, such as, for example, APEXTM Glass, produced by Life BioScience Inc. of Albuquerque, N. Mex., USA, and FoturanTM or ZerodurTM, both produced by Schott Glass Corp. of Mainz, Germany.
- wafers of photosensitive glass having a diameter within the range of 100 mm to 150 mm and a thickness of approximately 0.5 mm to over 4 mm, may be used.
- microscope slide sized wafers such as, for example wafers ranging in size from approximately 25 ⁇ 76 ⁇ 1 mm to 25 ⁇ 76 ⁇ 0.5 mm may be used.
- the obtained substrate 10 is photo-patterned according to any suitable grayscale lithography process.
- a grayscale or BHT photomask 20 may be placed over the substrate 10 and exposed to a high-energy source, such as, for example, ultraviolet (UV) light.
- a high-energy source such as, for example, ultraviolet (UV) light.
- UV ultraviolet
- a 310 nm wavelength energy source may be appropriate.
- any other suitable wavelength may be used. Formation of channels on APEX glass and/or related materials are described in more detail in U.S. patent application Ser. Nos. 12/058,608 and 12/058,588, the disclosures of which are incorporated herein by reference in their entireties
- the exposed substrate 10 may be exposed to heat, such as by baking. While the heat application may be done through a furnace or oven, in various exemplary embodiments other heat sources may be used to apply heat to the substrate.
- the baking process may be done once, or multiple times at different temperatures for different lengths of time. In embodiments where APEXTM glass is the provided substrate, the baking process may be made up of two steps. The first step may include baking the substrate in an oven at a first temperature, such as, for example 500° C. for a period of time, such as, for example, 75 minutes. The next step may be baking the substrate at a higher temperature, such as 575° C. for another period of time, such as, for example, 75 minutes.
- the heat 12 may transform UV exposed regions of the substrate 10 into altered portions 14 .
- the heating may transform exposed regions of the APEXTM glass or any other similar material into a substantially opaque ceramic material.
- the portions of the substrate 10 that are transformed into ceramic material are controlled by modulating the exposure light.
- grayscale lithography techniques may be used or the time and/or dose of exposure light may be controlled using direct write tools.
- altered portions 14 of various depths and/or widths can be formed in the substrate 10 in a single process flow (i.e., without requiring subsequent exposure steps to obtain microstructures of varying feature depth).
- altered portions 14 of the substrate 10 may have varying depths through the substrate 10 , such as, for example, depths ranging from 0% to 100% through the entire thickness of the substrate 10 , depending on the modulated exposure.
- the altered portions 14 may extend 10%, 20%, 25%, 50%, 75%, or any other percentage through the entire thickness of the substrate 10 . Any portions of the substrate 10 below the altered portions 14 are unaltered by the exposure and thus remain substantially transparent.
- the baked substrate 10 may be subjected to an etching process.
- FIG. 2C shows a UV photo-patterned and baked substrate 10 having altered portions 14 subjected to a wet etch 16 .
- any suitable etching process may be used, such as, for example, a dry etch.
- Suitable wet etchants include, for example, hydrofluoric acid (HF).
- HF hydrofluoric acid
- the shallower altered portions 14 the larger amount of glass remaining underneath results in a reduced etch rate as compared to the etch rate for deeper altered portions 14 , which have a less amount of glass underneath.
- the differences in etch rates between the shallow and deep altered portions 14 allows for all of the altered portion 14 to be removed in a single etch step.
- channels 18 may be formed in the substrate 10 .
- the dimensions of the channels 18 may depend on the parameters of photo-pattern, UV exposure, baking and etching processes.
- the channels 18 may be formed with various dimensions, with the height of each channel 18 ranging from approximately 100 nm to 1 mm. In other words, the channel height may be only very shallow with respective to the substrate 10 , or the channel 18 may form through the substrate 10 to form a TGV.
- the width of each channel 16 may range from approximately 1 um to 500 um.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Micromachines (AREA)
- Materials For Photolithography (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Surface Treatment Of Glass (AREA)
Abstract
A method for forming a three-dimensional microstructure includes providing a photosensitive glass substrate; exposing the photosensitive glass substrate to energy through a continuous tone, variable transmission photomask so as to form opaque portions in the photosensitive glass substrate, each of the opaque portions having one of a variety of depths extending through the entire thickness of the photosensitive glass substrate; and removing the opaque portions so as to form three-dimensional features in the photosensitive glass substrate.
Description
- The present invention relates to three-dimensional microstructures and methods of manufacturing three-dimensional microstructures.
- Conventional optical lithography techniques used for fabricating integrated circuits have been adapted to manufacture three-dimensional microstructures, such as microarrays, microfluidic devices, titer plates, microelectromechanical systems (MEMS) and three-dimensional glass structures. In conventional optical lithography, a fully resolved pattern is etched into a binary photomask and transferred to a wafer by exposing the wafer through an exposure tool (e.g., stepper). More particularly, binary photomasks are typically comprised of a substantially transparent substrate (e.g., quartz) and an opaque layer (e.g., chrome) in which the pattern to be transferred is etched. It is also known that other layers may be included on the photomask, including, for example, an antireflective layer (e.g., chrome oxide). The photoresist in the substrate on the integrated circuit being processed is then developed and either the exposed or unexposed portions are removed. Thereafter, the material on the substrate is etched in the areas where the photoresist is removed. An example of the technology involved in manufacturing a traditional binary photomask (e.g., chrome-on-quartz) and its use to manufacture integrated circuits is disclosed in, for example, U.S. Pat. No. 6,406,818.
- It is known to use a photosensitive glass substrate to form a three-dimensional microstructure. Photosensitive glass, also called photodefinable glass, allows for the formation of microstructures in the glass without the use of photoresist. In particular, photosensitive glass, when exposed to UV light, then baked at a certain temperature and duration, transforms into a ceramic material (crystalline-phase lithium metasilicate). The ceramic material is much more active for reaction with a hydrofluoric acid (HF) etchant than the amorphous glass. Thus, according to conventional methods, different microstructures can be created in a top-down approach by exposing portions of the photosensitive glass to UV light through a binary photomask.
- A problem associated with the conventional method of forming a three-dimensional structure in photosensitive glass substrates is that the exposed portions are transformed into opaque ceramic material through the thickness of the substrate. Depending on the desired feature depth, the etching step will only remove a certain percentage of the entire exposed portion, resulting in opaque portions remaining in the substrate. Particularly in the case of microfluidic applications, these opaque portions are undesirable. Another problem associated with the conventional method is that the remaining ceramic portions will result in increased autofluorescence, which interferes with detection of fluorescent signals.
- The features and advantages of the present invention will be more fully understood with reference to the following, detailed description of an illustrative embodiment of the present invention when taken in conjunction with the accompanying figures, wherein:
-
FIG. 1 is a process diagram illustrating a method of manufacturing a three-dimensional microstructure according to an exemplary embodiment of the present invention; and -
FIGS. 2A , 2B, 2C, and 2D are respective first, second, third, and fourth sequential cross sectional views of a process of creating a three-dimensional microstructure according to an exemplary embodiment of the present invention. - Various exemplary embodiments of the present invention are directed to a method of forming three-dimensional structures in a photosensitive glass substrate. In particular, according to exemplary embodiments, grayscale lithography techniques are used to partially expose portions of the photosensitive glass substrate to UV light so as to control the amount of substrate that is converted to ceramic material as a result of the exposure. The use of grayscale lithography allows for the formation of through-glass vias (TGVs) where ceramic through-conversion is full (100%), as well as the formation of other areas where the ceramic conversion is less than 100% (e.g., 0%, 10%, 20%, 50%, etc.). Thus, microfluidic and other types of three-dimensional microstructures can be formed with, for example, TGVs, channels and sub-features within the channels, with a single exposure.
- According to exemplary embodiments of the present invention, any suitable grayscale lithography technique may be used to form three-dimensional structures in a photosensitive glass substrate. In this regard, it is known to use a continuous tone pattern on a photomask (e.g., chrome-on-glass) instead of a binary, fully resolved mask pattern to yield a continuous tone intensity through the photomask during image formation. One type of continuous tone, variable transmission photomask is commonly known as a binary half tone (“BHT”) photomask. BHT photomasks use two levels of gray tones (e.g., 0% transmissive and 100% transmissive). Another type of continuous tone, variable transmission photomask is known as a gray scale photomask, which uses varying levels of transmission of light through the photomask (e.g., 0%, 50%, 100%, etc.). By using these types of variable transmission photomasks, a three-dimensional structure can be formed in the photosensitive glass substrate through the use of a continuous tone pattern.
- BHT photomasks are typically designed to have sub-resolution features that partially transmit exposure source light intensity based on feature modulation in width and pitch. In this regard, a BHT photomask layout may be designed for microscopic surfaces by dividing the patterned area of the photomask into pixels and sub-pixels (commonly referred to as “sub-pixelation”) which define areas on the mask through which light is to be transmitted. The sub-pixels defining the BHT photomask pattern are designed to be smaller than the resolution of the exposure tool being used so that a gray scale image can be created on the photosensitive glass substrate. An example of a BHT photomask that may be used in the present invention is disclosed in U.S. Pat. No. 6,828,068, the contents of which are incorporated herein by reference in their entirety.
-
FIG. 1 shows a flowchart describing a method for manufacturing a three-dimensional microstructure according to exemplary embodiments.FIG. 2A-2D show a series of diagrams illustrating a process of creating a three-dimensional microstructure according to exemplary embodiments. Any type of three-dimensional microstructure may be formed using the processes described herein, including, for example, microarrays, microfluidic devices, titer plates, microelectromechanical systems (MEMS) and three-dimensional glass structures. - Referring to
FIGS. 1 and 2A , instep 102, asuitable substrate 10 is provided. In this regard, various exemplary embodiments of the present invention relate to three-dimensional microstructures manufactured from thesubstrate 10. Thus, thesubstrate 10 may have one or more layers that are substantially transparent. Thesubstrate 10 may be made of photosensitive glass, such as, for example, APEX™ Glass, produced by Life BioScience Inc. of Albuquerque, N. Mex., USA, and Foturan™ or Zerodur™, both produced by Schott Glass Corp. of Mainz, Germany. In exemplary embodiments, wafers of photosensitive glass having a diameter within the range of 100 mm to 150 mm and a thickness of approximately 0.5 mm to over 4 mm, may be used. However, other sized wafers of photosensitive glass may also be used depending on application or need. For example, in exemplary embodiments, microscope slide sized wafers, such as, for example wafers ranging in size from approximately 25×76×1 mm to 25×76×0.5 mm may be used. - In step 104, the obtained
substrate 10 is photo-patterned according to any suitable grayscale lithography process. For example, referring toFIG. 2A , a grayscale orBHT photomask 20 may be placed over thesubstrate 10 and exposed to a high-energy source, such as, for example, ultraviolet (UV) light. In exemplary embodiments involving the use of APEX™ Glass, for example, a 310 nm wavelength energy source may be appropriate. However, it should be appreciated that any other suitable wavelength may be used. Formation of channels on APEX glass and/or related materials are described in more detail in U.S. patent application Ser. Nos. 12/058,608 and 12/058,588, the disclosures of which are incorporated herein by reference in their entireties - Referring to
FIG. 1 , in step 106, according to exemplary embodiments, the exposedsubstrate 10 may be exposed to heat, such as by baking. While the heat application may be done through a furnace or oven, in various exemplary embodiments other heat sources may be used to apply heat to the substrate. The baking process may be done once, or multiple times at different temperatures for different lengths of time. In embodiments where APEX™ glass is the provided substrate, the baking process may be made up of two steps. The first step may include baking the substrate in an oven at a first temperature, such as, for example 500° C. for a period of time, such as, for example, 75 minutes. The next step may be baking the substrate at a higher temperature, such as 575° C. for another period of time, such as, for example, 75 minutes. - Referring to
FIG. 2B , in exemplary embodiments, theheat 12 may transform UV exposed regions of thesubstrate 10 into alteredportions 14. For example, the heating may transform exposed regions of the APEX™ glass or any other similar material into a substantially opaque ceramic material. However, the portions of thesubstrate 10 that are transformed into ceramic material are controlled by modulating the exposure light. For example, as previously described, grayscale lithography techniques may be used or the time and/or dose of exposure light may be controlled using direct write tools. Thus, alteredportions 14 of various depths and/or widths can be formed in thesubstrate 10 in a single process flow (i.e., without requiring subsequent exposure steps to obtain microstructures of varying feature depth). In exemplary embodiments, alteredportions 14 of thesubstrate 10 may have varying depths through thesubstrate 10, such as, for example, depths ranging from 0% to 100% through the entire thickness of thesubstrate 10, depending on the modulated exposure. For example, the alteredportions 14 may extend 10%, 20%, 25%, 50%, 75%, or any other percentage through the entire thickness of thesubstrate 10. Any portions of thesubstrate 10 below the alteredportions 14 are unaltered by the exposure and thus remain substantially transparent. - In step 108, the
baked substrate 10 may be subjected to an etching process.FIG. 2C , for example, shows a UV photo-patterned andbaked substrate 10 having alteredportions 14 subjected to awet etch 16. However, it should be appreciated that any suitable etching process may be used, such as, for example, a dry etch. Suitable wet etchants include, for example, hydrofluoric acid (HF). In regards to the shalloweraltered portions 14, the larger amount of glass remaining underneath results in a reduced etch rate as compared to the etch rate for deeperaltered portions 14, which have a less amount of glass underneath. The differences in etch rates between the shallow and deepaltered portions 14 allows for all of the alteredportion 14 to be removed in a single etch step. - Referring to
FIG. 2D , as a result of etching,channels 18 may be formed in thesubstrate 10. The dimensions of thechannels 18 may depend on the parameters of photo-pattern, UV exposure, baking and etching processes. For example, thechannels 18 may be formed with various dimensions, with the height of eachchannel 18 ranging from approximately 100 nm to 1 mm. In other words, the channel height may be only very shallow with respective to thesubstrate 10, or thechannel 18 may form through thesubstrate 10 to form a TGV. The width of eachchannel 16 may range from approximately 1 um to 500 um. - Now that embodiments of the present invention have been shown and described in detail, various modifications and improvements thereon will become readily apparent to those skilled in the art. Accordingly, the spirit and scope of the present invention is to be construed broadly and not limited by the foregoing specification.
Claims (15)
1. A method for forming a three-dimensional microstructure, comprising:
providing a photosensitive glass substrate;
exposing the photosensitive glass substrate to energy through a continuous tone, variable transmission photomask so as to form opaque portions in the photosensitive glass substrate, each of the opaque portions having one of a variety of depths extending through the entire thickness of the photosensitive glass substrate; and
removing the opaque portions so as to form three-dimensional features in the photosensitive glass substrate.
2. The method of claim 1 , wherein the photosensitive glass substrate comprises photosensitive glass selected from the group consisting of: Foturan™ and APEX™ glass.
3. The method of claim 1 , wherein the continuous tone, variable transmission photomask is a binary halftone photomask.
4. The method of claim 1 , wherein the continuous tone, variable transmission photomask is a grayscale photomask.
5. The method of claim 1 , wherein the energy is in the form of UV light.
6. The method of claim 1 , wherein the variety of depths are within the range of 0% to 100%.
7. The method of claim 1 , wherein the variety of depths comprise 0%, 20%, 25%, 50%, 70%, 75% and 100%.
8. The method of claim 1 , further comprising the step of baking the photosensitive glass substrate.
9. The method of claim 1 , wherein the step of baking comprises heating the photosensitive glass substrate to a temperature within the range of 450° C. to 550° C.
10. The method of claim 1 , wherein the step of removing comprises etching the photosensitive glass substrate.
11. The method of claim 10 , wherein the etching is performed using a wet etchant.
12. The method of claim 10 , wherein the etching is performed using a dry etchant.
13. The method of claim 1 , wherein the three-dimensional features comprise a type selected from the group consisting of: channels, through-hole vias, and channel sub-features.
14. The method of claim 1 , wherein the three-dimensional microstructure comprises one or more microstructures selected from the group consisting of: microarrays, microfluidic devices and titer plates.
15. A three-dimensional microstructure formed according to the method of claim 1 .
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/837,299 US20140272688A1 (en) | 2013-03-15 | 2013-03-15 | Grayscale lithography of photo definable glass |
PCT/US2014/029047 WO2014144576A2 (en) | 2013-03-15 | 2014-03-14 | Grayscale lithography of photo definable glass |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/837,299 US20140272688A1 (en) | 2013-03-15 | 2013-03-15 | Grayscale lithography of photo definable glass |
Publications (1)
Publication Number | Publication Date |
---|---|
US20140272688A1 true US20140272688A1 (en) | 2014-09-18 |
Family
ID=51528513
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US13/837,299 Abandoned US20140272688A1 (en) | 2013-03-15 | 2013-03-15 | Grayscale lithography of photo definable glass |
Country Status (2)
Country | Link |
---|---|
US (1) | US20140272688A1 (en) |
WO (1) | WO2014144576A2 (en) |
Cited By (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20170094794A1 (en) * | 2015-09-30 | 2017-03-30 | 3D Glass Solutions, Inc | Photo-definable glass with integrated electronics and ground plane |
US10665377B2 (en) | 2014-05-05 | 2020-05-26 | 3D Glass Solutions, Inc. | 2D and 3D inductors antenna and transformers fabricating photoactive substrates |
US10854946B2 (en) | 2017-12-15 | 2020-12-01 | 3D Glass Solutions, Inc. | Coupled transmission line resonate RF filter |
US10903545B2 (en) | 2018-05-29 | 2021-01-26 | 3D Glass Solutions, Inc. | Method of making a mechanically stabilized radio frequency transmission line device |
US11076489B2 (en) | 2018-04-10 | 2021-07-27 | 3D Glass Solutions, Inc. | RF integrated power condition capacitor |
US11101532B2 (en) | 2017-04-28 | 2021-08-24 | 3D Glass Solutions, Inc. | RF circulator |
US11139582B2 (en) | 2018-09-17 | 2021-10-05 | 3D Glass Solutions, Inc. | High efficiency compact slotted antenna with a ground plane |
US11161773B2 (en) * | 2016-04-08 | 2021-11-02 | 3D Glass Solutions, Inc. | Methods of fabricating photosensitive substrates suitable for optical coupler |
KR20210142753A (en) * | 2019-04-18 | 2021-11-25 | 3디 글래스 솔루션즈 인코포레이티드 | High-efficiency die dicing and release |
US11264167B2 (en) | 2016-02-25 | 2022-03-01 | 3D Glass Solutions, Inc. | 3D capacitor and capacitor array fabricating photoactive substrates |
US11270843B2 (en) | 2018-12-28 | 2022-03-08 | 3D Glass Solutions, Inc. | Annular capacitor RF, microwave and MM wave systems |
US11342896B2 (en) | 2017-07-07 | 2022-05-24 | 3D Glass Solutions, Inc. | 2D and 3D RF lumped element devices for RF system in a package photoactive glass substrates |
WO2022128529A1 (en) * | 2020-12-15 | 2022-06-23 | Ams International Ag | Optical system packaging |
US11594457B2 (en) | 2018-12-28 | 2023-02-28 | 3D Glass Solutions, Inc. | Heterogenous integration for RF, microwave and MM wave systems in photoactive glass substrates |
US11662659B2 (en) | 2020-10-27 | 2023-05-30 | Samsung Electronics Co., Ltd. | Photomask, exposure apparatus, and method of fabricating three-dimensional semiconductor memory device using the same |
US11677373B2 (en) | 2018-01-04 | 2023-06-13 | 3D Glass Solutions, Inc. | Impedence matching conductive structure for high efficiency RF circuits |
US11908617B2 (en) | 2020-04-17 | 2024-02-20 | 3D Glass Solutions, Inc. | Broadband induction |
US11962057B2 (en) | 2019-04-05 | 2024-04-16 | 3D Glass Solutions, Inc. | Glass based empty substrate integrated waveguide devices |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030138706A1 (en) * | 1986-02-13 | 2003-07-24 | Progler Christopher J. | Binary half tone photomasks and microscopic three-dimensional devices and method of fabricating the same |
US20080248250A1 (en) * | 2007-03-28 | 2008-10-09 | Life Bioscience, Inc. | Compositions and methods to fabricate a photoactive substrate suitable for shaped glass structures |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0788230B2 (en) * | 1991-10-02 | 1995-09-27 | 株式会社精工舎 | Photosensitive glass processing method and photomask used therefor |
JP2003015275A (en) * | 2001-07-03 | 2003-01-15 | Keio Gijuku | Method for forming gray scale mask and three- dimensional fine working method by using the same |
-
2013
- 2013-03-15 US US13/837,299 patent/US20140272688A1/en not_active Abandoned
-
2014
- 2014-03-14 WO PCT/US2014/029047 patent/WO2014144576A2/en active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030138706A1 (en) * | 1986-02-13 | 2003-07-24 | Progler Christopher J. | Binary half tone photomasks and microscopic three-dimensional devices and method of fabricating the same |
US20080248250A1 (en) * | 2007-03-28 | 2008-10-09 | Life Bioscience, Inc. | Compositions and methods to fabricate a photoactive substrate suitable for shaped glass structures |
Cited By (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10665377B2 (en) | 2014-05-05 | 2020-05-26 | 3D Glass Solutions, Inc. | 2D and 3D inductors antenna and transformers fabricating photoactive substrates |
US11929199B2 (en) | 2014-05-05 | 2024-03-12 | 3D Glass Solutions, Inc. | 2D and 3D inductors fabricating photoactive substrates |
US10070533B2 (en) * | 2015-09-30 | 2018-09-04 | 3D Glass Solutions, Inc. | Photo-definable glass with integrated electronics and ground plane |
US20170094794A1 (en) * | 2015-09-30 | 2017-03-30 | 3D Glass Solutions, Inc | Photo-definable glass with integrated electronics and ground plane |
US11264167B2 (en) | 2016-02-25 | 2022-03-01 | 3D Glass Solutions, Inc. | 3D capacitor and capacitor array fabricating photoactive substrates |
US11161773B2 (en) * | 2016-04-08 | 2021-11-02 | 3D Glass Solutions, Inc. | Methods of fabricating photosensitive substrates suitable for optical coupler |
US11101532B2 (en) | 2017-04-28 | 2021-08-24 | 3D Glass Solutions, Inc. | RF circulator |
US11342896B2 (en) | 2017-07-07 | 2022-05-24 | 3D Glass Solutions, Inc. | 2D and 3D RF lumped element devices for RF system in a package photoactive glass substrates |
US10854946B2 (en) | 2017-12-15 | 2020-12-01 | 3D Glass Solutions, Inc. | Coupled transmission line resonate RF filter |
US11367939B2 (en) | 2017-12-15 | 2022-06-21 | 3D Glass Solutions, Inc. | Coupled transmission line resonate RF filter |
US11894594B2 (en) | 2017-12-15 | 2024-02-06 | 3D Glass Solutions, Inc. | Coupled transmission line resonate RF filter |
US11677373B2 (en) | 2018-01-04 | 2023-06-13 | 3D Glass Solutions, Inc. | Impedence matching conductive structure for high efficiency RF circuits |
US11076489B2 (en) | 2018-04-10 | 2021-07-27 | 3D Glass Solutions, Inc. | RF integrated power condition capacitor |
US10903545B2 (en) | 2018-05-29 | 2021-01-26 | 3D Glass Solutions, Inc. | Method of making a mechanically stabilized radio frequency transmission line device |
US11139582B2 (en) | 2018-09-17 | 2021-10-05 | 3D Glass Solutions, Inc. | High efficiency compact slotted antenna with a ground plane |
US11594457B2 (en) | 2018-12-28 | 2023-02-28 | 3D Glass Solutions, Inc. | Heterogenous integration for RF, microwave and MM wave systems in photoactive glass substrates |
US11270843B2 (en) | 2018-12-28 | 2022-03-08 | 3D Glass Solutions, Inc. | Annular capacitor RF, microwave and MM wave systems |
US11962057B2 (en) | 2019-04-05 | 2024-04-16 | 3D Glass Solutions, Inc. | Glass based empty substrate integrated waveguide devices |
US11373908B2 (en) * | 2019-04-18 | 2022-06-28 | 3D Glass Solutions, Inc. | High efficiency die dicing and release |
KR20220165795A (en) * | 2019-04-18 | 2022-12-15 | 3디 글래스 솔루션즈 인코포레이티드 | High efficiency die dicing and release |
KR102473256B1 (en) | 2019-04-18 | 2022-12-05 | 3디 글래스 솔루션즈 인코포레이티드 | High efficiency die dicing and release |
KR102601781B1 (en) | 2019-04-18 | 2023-11-14 | 3디 글래스 솔루션즈 인코포레이티드 | High efficiency die dicing and release |
EP3948954A4 (en) * | 2019-04-18 | 2022-06-01 | 3D Glass Solutions, Inc. | High efficiency die dicing and release |
KR20210142753A (en) * | 2019-04-18 | 2021-11-25 | 3디 글래스 솔루션즈 인코포레이티드 | High-efficiency die dicing and release |
US11908617B2 (en) | 2020-04-17 | 2024-02-20 | 3D Glass Solutions, Inc. | Broadband induction |
US11662659B2 (en) | 2020-10-27 | 2023-05-30 | Samsung Electronics Co., Ltd. | Photomask, exposure apparatus, and method of fabricating three-dimensional semiconductor memory device using the same |
WO2022128529A1 (en) * | 2020-12-15 | 2022-06-23 | Ams International Ag | Optical system packaging |
Also Published As
Publication number | Publication date |
---|---|
WO2014144576A2 (en) | 2014-09-18 |
WO2014144576A3 (en) | 2015-04-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US20140272688A1 (en) | Grayscale lithography of photo definable glass | |
KR101927549B1 (en) | Method for transferring pattern, and method for manufacturing flat panel display | |
KR101045450B1 (en) | Four-gradation photomask and using method thereof | |
US20100086877A1 (en) | Pattern forming method and pattern form | |
JP2007249198A (en) | Manufacturing method for four-gradation photomask, and photomask blank | |
CN107799402A (en) | The forming method of secondary figure | |
JP5264237B2 (en) | Nanostructure and method for producing nanostructure | |
CN105467745A (en) | Optical mask and manufacturing method for display device | |
KR0127662B1 (en) | Method for fabricating phase shift mask of semiconductor device | |
JP2015177009A (en) | Pattern formation method | |
KR100796509B1 (en) | Method of manufacturing semiconductor device | |
TWI773659B (en) | Pattern forming method | |
JP2009229893A (en) | Method of manufacturing multi-gradation photomask, and pattern transfer method | |
TWI534947B (en) | Double patterning method of forming semiconductor active areas and isolation regions | |
JP6794308B2 (en) | Method for manufacturing molds for manufacturing microlens arrays | |
CN108074806A (en) | Method for forming convex structure on surface of substrate | |
JP2009231670A (en) | Stencil mask or apertures and their production method | |
JP5966808B2 (en) | Manufacturing method of semiconductor device | |
JP2009170863A (en) | Method of forming pattern of semiconductor device | |
JP2004021256A (en) | Method for manufacturing alternate phase inversion mask | |
KR100272517B1 (en) | Mask structuring method of semiconductor device | |
KR100818389B1 (en) | Method for fabricating a narrow pattern in a semiconductor | |
TW200527119A (en) | Multi-step phase shift mask and methods for fabrication thereof | |
US20050026049A1 (en) | Method for forming an opening on an alternating phase shift mask | |
KR20120037254A (en) | Method for manufacturing semiconductor device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: PHOTRONICS, INC., CONNECTICUT Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:DILLON, BRIAN W.;REEL/FRAME:032833/0966 Effective date: 20140414 |
|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |