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US20070187703A1 - Light emitting systems - Google Patents

Light emitting systems Download PDF

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Publication number
US20070187703A1
US20070187703A1 US11/654,368 US65436807A US2007187703A1 US 20070187703 A1 US20070187703 A1 US 20070187703A1 US 65436807 A US65436807 A US 65436807A US 2007187703 A1 US2007187703 A1 US 2007187703A1
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US
United States
Prior art keywords
light
layer
led
emitting device
generating region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US11/654,368
Inventor
Alexei Erchak
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Luminus Devices Inc
Original Assignee
Luminus Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/724,005 external-priority patent/US7083993B2/en
Priority claimed from US10/723,987 external-priority patent/US7211831B2/en
Priority claimed from US10/724,033 external-priority patent/US7262550B2/en
Priority claimed from US10/724,029 external-priority patent/US7098589B2/en
Priority claimed from US10/724,006 external-priority patent/US7084434B2/en
Priority claimed from US10/724,015 external-priority patent/US7521854B2/en
Priority claimed from US10/724,004 external-priority patent/US6831302B2/en
Application filed by Luminus Devices Inc filed Critical Luminus Devices Inc
Priority to US11/654,368 priority Critical patent/US20070187703A1/en
Assigned to LUMINUS DEVICES, INC. reassignment LUMINUS DEVICES, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ERCHAK, ALEXEI A.
Publication of US20070187703A1 publication Critical patent/US20070187703A1/en
Abandoned legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/20Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
    • H01L33/22Roughened surfaces, e.g. at the interface between epitaxial layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/20Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/10Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a light reflecting structure, e.g. semiconductor Bragg reflector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0083Periodic patterns for optical field-shaping in or on the semiconductor body or semiconductor body package, e.g. photonic bandgap structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0093Wafer bonding; Removal of the growth substrate

Definitions

  • the invention relates to systems, and related components, systems and methods.
  • a light emitting diode often can provide light in a more efficient manner than an incandescent light source and/or a fluorescent light source.
  • the relatively high power efficiency associated with LEDs has created an interest in using LEDs to displace conventional light sources in a variety of lighting applications. For example, in some instances LEDs are being used as traffic lights and to illuminate cell phone keypads and displays.
  • an LED is formed of multiple layers, with at least some of the layers being formed of different materials.
  • the materials and thicknesses selected for the layers determine the wavelength(s) of light emitted by the LED.
  • the chemical composition of the layers can be selected to try to isolate injected electrical charge carriers into regions (commonly referred to as quantum wells) for relatively efficient conversion to optical power.
  • the layers on one side of the junction where a quantum well is grown are doped with donor atoms that result in high electron concentration (such layers are commonly referred to as n-type layers), and the layers on the opposite side are doped with acceptor atoms that result in a relatively high hole concentration (such layers are commonly referred to as p-type layers).
  • a common approach to preparing an LED is as follows.
  • the layers of material are prepared in the form of a wafer.
  • the layers are formed using an epitaxial deposition technique, such as metal-organic chemical vapor deposition (MOCVD), with the initially deposited layer being formed on a growth substrate.
  • MOCVD metal-organic chemical vapor deposition
  • the layers are then exposed to various etching and metallization techniques to form contacts for electrical current injection, and the wafer is subsequently sectioned into individual LED chips.
  • the LED chips are packaged.
  • electrical energy is usually injected into an LED and then converted into electromagnetic radiation (light), some of which is extracted from the LED.
  • the invention relates to light-emitting systems, and related components, systems and methods.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials.
  • the multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region.
  • the surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer.
  • the surface of the first layer has a dielectric function that varies spatially according to a pattern, and the pattern has an ideal lattice constant and a detuning parameter with a value greater than zero.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials.
  • the multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region.
  • the surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer, and the surface has a dielectric function that varies spatially according to a nonperiodic pattern.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials.
  • the multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region.
  • the surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer, and the surface has a dielectric function that varies spatially according to a complex periodic pattern.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials.
  • the multi-layer stack of materials includes a layer of n-doped material, a layer of p-doped material, and a light-generating region.
  • the light-emitting device also includes a layer of reflective material that is capable of reflecting at least about 50% of light generated by the light-generating region that impinges on the layer of reflective material.
  • the surface of the layer of n-doped material is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the layer of n-doped material.
  • the surface of the layer of n-doped material has a dielectric function that varies spatially according to a pattern, and the distance between the layer of p-doped material and the layer of reflective material is less than the distance between the layer of n-doped material and the layer of reflective material.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the layer of n-doped material, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials including a light-generating region and a first layer supported by the light-generating region.
  • the surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer, and the surface of the first layer has a dielectric function that varies spatially according to a pattern.
  • the light-emitting device also includes a layer of reflective material that is capable of reflecting at least about 50% of light generated by the light-generating region that impinges on the layer of reflective material.
  • the light-generating region is between the layer of reflective material and the first layer, and the pattern does not extend beyond the first layer.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the layer of n-doped material, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials.
  • the multi-layer stack of materials includes a light-generating region, and a first layer supported by the light-generating region.
  • the surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer.
  • the light-emitting device also includes a material in contact with the surface of the first layer, where the material has an index of refraction less than about 1.5.
  • the light emitting device is packaged.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the layer of n-doped material, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials.
  • the multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region.
  • the surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer.
  • the surface of the first layer has a dielectric function that varies spatially according to a pattern.
  • the light-emitting device also includes a phosphor material supported by the surface of the first layer.
  • the sidewalls of the light-emitting device are substantially devoid of the phosphor material.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the layer of n-doped material, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials.
  • the multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region.
  • the surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer, and the surface of the first layer has a dielectric function that varies spatially according to a pattern.
  • the light-emitting device also includes a phosphor material configured so that light generated by the light-generating region that emerges via the surface of the first layer interacts with the phosphor material so that light that emerges from the phosphor layer is substantially white light.
  • the ratio of the height of the light-emitting device to an area of the light-emitting device is sufficiently small enough for the white light to extend in all directions.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials.
  • the multi-layer stack of materials includes a light-generating region, and a first layer supported by the light-generating region.
  • the surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer.
  • the light-emitting device also includes a first sheet formed of a material that is substantially transparent to light that emerges from the light-emitting device, and a second sheet that includes a phosphor material. The second sheet is adjacent the first sheet.
  • the light-emitting device is packaged, and the first and second sheets form a portion of the package for the light-emitting device.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials including a light-generating region and a first layer supported by the light-generating region.
  • the surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer.
  • the surface of the first layer has a dielectric function that varies spatially according to a pattern, and the pattern is configured so that light generated by the light-generating region that emerges from the light-emitting device via the surface of the first layer is more collimated than a lambertian distribution of light.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials.
  • the multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region so that, during use of the light-emitting device, light generated by the light-generating region can emerge from the light-emitting device via a surface of the first layer.
  • the surface of the first layer has a dielectric function that varies spatially according to a pattern, and at least about 45% (e.g., at least about 50%, at least about 60%, at least about 70%) of the total amount of light generated by the light-generating region that emerges from the light-emitting device emerges via the surface of the light-emitting device.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials.
  • the multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region so that, during use of the light-emitting device, light generated by the light-generating region can emerge from the light-emitting device via a surface of the first layer.
  • the light-emitting device has an edge which is at least about one millimeter (e.g., at least about 1.5 millimeters, at least about two millimeters, at least about 2.5 millimeters) long, and the light-emitting device is designed so that the extraction efficiency of the light-emitting device is substantially independent of the length of the edge of the light-emitting device.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials.
  • the multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region so that, during use of the light-emitting device, light generated by the light-generating region can emerge from the light-emitting device via a surface of the first layer.
  • the light-emitting device has an edge which is at least about one millimeter (e.g., at least about 1.5 millimeters, at least about two millimeters, at least about 2.5 millimeters) long, and the light-emitting device is designed so that the quantum efficiency of the light-emitting device is substantially independent of the length of the edge of the light-emitting device.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • the invention features a light-emitting system that includes a light-emitting device.
  • the light-emitting device includes a multi-layer stack of materials.
  • the multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region so that, during use of the light-emitting device, light generated by the light-generating region can emerge from the light-emitting device via a surface of the first layer.
  • the light-emitting device has an edge which is at least about one millimeter (e.g., at least about 1.5 millimeters, at least about two millimeters, at least about 2.5 millimeters) long, and the light-emitting device is designed so that the wall plug efficiency of the light-emitting device is substantially independent of the length of the edge of the light-emitting device.
  • the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • Embodiments can feature one or more of the following aspects.
  • the light-emitting system is selected from projectors, portable electronic devices, computer monitors, large area signage systems, vehicle lighting systems, general lighting systems, high brightness lighting systems, camera flashes, medical devices, telecommunications systems, security sensing systems, integrated optoelectronic systems, military field communication systems, biosensing systems, photodynamic therapy systems, night-vision goggles, solar powered transit lighting systems, emergency lighting systems, airport runway lighting systems, airline lighting systems, surgical goggles, wearable light sources and combinations thereof.
  • the light-emitting system is a projector, such as, for example, a rear projection projector (e.g., is a rear projection projector for a television) or a front projection projector.
  • a projector such as, for example, a rear projection projector (e.g., is a rear projection projector for a television) or a front projection projector.
  • the light-emitting system is a vehicle lighting system.
  • the light-emitting system is a general lighting system.
  • the light-emitting system includes a plurality of light-emitting devices, where each of the plurality of light emitting devices includes a multi-layer stack of materials including a light-generating region and a first layer supported by the light-generating region.
  • a surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer.
  • the surface of the first layer has a dielectric function that varies spatially according to a pattern.
  • the pattern has an ideal lattice constant and a detuning parameter with a value greater than zero, and the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • the light-emitting system includes a plurality of light-emitting devices that are configured as an array.
  • the light-emitting system can include a plurality of arrays of light-emitting devices.
  • the light-emitting device has a housing with a surface, the light-emitting device is disposed in the housing, and the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • the light when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light passes through at least one optical component before emerging from the light-emitting system.
  • the light-emitting system includes a plurality of light-emitting devices, at least some of the light-emitting devices having different peak emission wavelengths.
  • the light-emitting system includes a plurality of light-emitting devices, each of the light-emitting devices having substantially the same peak emission wavelength.
  • the multi-layer stack of materials can be formed of a multi-layer stack of semiconductor materials.
  • the first layer can be a layer of n-doped semiconductor material, and the multi-layer stack can further include a layer of p-doped semiconductor material.
  • the light-generating region can be between the layer of n-doped semiconductor material and the layer of p-doped semiconductor material.
  • the light-emitting device can further include a support that supports the multi-layer stack of materials.
  • the light-emitting device can further include a layer of reflective material that is capable of reflecting at least about 50% of light generated by the light-generating region that impinges on the layer of reflective material.
  • the layer of reflective material can be between the support and the multi-layer stack of materials.
  • the distance between the layer of p-doped semiconductor material and the layer of reflective material can be less than a distance between the layer of n-doped semiconductor material and the layer of reflective material.
  • the light-emitting device can further include a p-ohmic contact layer between the layer of p-doped material and the layer of reflective material.
  • the light-emitting device can further include a current-spreading layer between the first layer and the light-generating region.
  • the multi-layer stack of materials can be formed of semiconductor materials, such as, for example, III-V semiconductor materials, organic semiconductor materials and/or silicon.
  • the pattern does not extend into the light-generating region.
  • the pattern does not extend beyond the first layer.
  • the pattern extends beyond the first layer.
  • the light-emitting device can further include electrical contacts configured to inject current into the light-emitting device.
  • the electrical contacts can be configured to vertically inject electrical current into the light-emitting device.
  • the pattern can be partially formed of a component selected from, for example, holes in the surface of the first layer, pillars in the first layer, continuous veins in the first layer, discontinuous veins in the first layer and combinations thereof.
  • the pattern can be selected from triangular patterns, square patterns, and grating patterns.
  • the pattern can be selected from aperiodic patterns, quasicrystalline patterns, Robinson patterns, and Amman patterns. In some embodiments, the pattern is a Penrose pattern.
  • the pattern is selected from honeycomb patterns and Archimidean patterns.
  • a pattern e.g., a honeycomb pattern
  • the pattern can be partially formed of holes in the surface of the first layer.
  • the detuning parameter can be, for example, at least about 1% of the ideal lattice constant and/or at most about 25% of the ideal lattice constant.
  • the pattern can correspond to a substantially randomly detuned ideal pattern.
  • the pattern can be configured so that light emitted by the surface of the first layer has a spectrum of radiation modes, and the spectrum of radiation modes is substantially the same as a characteristic emission spectrum of the light-generating region.
  • the light-emitting device can be, for example, a light-emitting diode, a laser, or an optical amplifier.
  • Examples of light-emitting devices include organic light-emitting devices (OLEDs), flat surface-emitting LEDs, and high brightness light-emitting devices (HBLEDs).
  • the surface of the first layer has features with a size of less than about ⁇ /5, where ⁇ is a wavelength of light that can be emitted by the first layer.
  • the light-emitting device is packaged (e.g., in the form of a packaged die).
  • a packaged light-emitting device can be free of an encapsulant material.
  • the material in contact with the surface of the first layer is a gas (e.g., air).
  • the gas can have a pressure of less than about 100 Torr.
  • the material in contact with the surface of the first layer has an index of refraction of at least about one.
  • a packaged LED includes a cover.
  • the cover can include a phosphor material.
  • the cover can be configured so that light generated by the light-generating region that emerges via the surface of the first layer can interact with the phosphor material, and so that light that emerges via the surface of the first layer and interacts with the phosphor material emerges from the cover as substantially white light.
  • the light-emitting device further includes a first sheet comprising a material that is substantially transparent to light that emerges from the light-emitting device, and a second sheet that includes a phosphor material.
  • the second sheet can be adjacent the first sheet, and a material having an index of refraction of less than about 1.5 can be between the first sheet and the surface of the first layer.
  • the first and second sheets can be configured so that light generated by the light-generating region that emerges via the surface of the first layer can interact with the phosphor material, and so that light that emerges via the surface of the first layer and interacts with the phosphor material emerges from the second sheet as substantially white light.
  • the phosphor material can be disposed on the surface of the first layer.
  • the light-generating region when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, at least about 40% of the light emerging via the surface of the first layer emerges within at most about 30° of an angle normal to the surface of the first layer.
  • the filling factor of the light-emitting device is at least about 10% and/or at most about 75%.
  • Embodiments can feature one or more of the following advantages.
  • a light-emitting system can include an LED and/or a relatively large LED chip that can exhibit relatively high light extraction.
  • a light-emitting system can include an LED and/or a relatively large LED chip that can exhibit relatively high surface brightness, relatively high average surface brightness, relatively low need for heat dissipation or relatively high rate of heat dissipation, relatively low etendue and/or relatively high power efficiency.
  • a light-emitting system can include an LED and/or a relatively large LED chip that can be designed so that relatively little light emitted by the LED/LED chip is absorbed by packaging.
  • a light-emitting system can include a packaged LED (e.g., a relatively large packaged LED) that can be prepared without using an encapsulant material.
  • a packaged LED e.g., a relatively large packaged LED
  • This can result in a packaged LED that avoids certain problems associated with the use of certain encapsulant materials, such as reduced performance and/or inconsistent performance as a function of time, thereby providing a packaged LED that can exhibit relatively good and/or reliable performance over a relatively long period of time.
  • a light-emitting system can include an LED (e.g., a packaged LED, which can be a relatively large packaged LED) that can have a relatively uniform coating of a phosphor material.
  • an LED e.g., a packaged LED, which can be a relatively large packaged LED
  • a light-emitting system can include an LED (e.g., a packaged LED, which can be a relatively large packaged LED) that can be designed to provide a desired light output within a particular angular range (e.g., within a particular angular range relative to the LED surface normal).
  • an LED e.g., a packaged LED, which can be a relatively large packaged LED
  • a desired light output within a particular angular range (e.g., within a particular angular range relative to the LED surface normal).
  • a light-emitting system can include an LED and/or a relatively large LED chip that can be prepared by a process that is relatively inexpensive.
  • a light-emitting system can include an LED and/or a relatively large LED chip that can be prepared by a process that can be conducted on a commercial scale without incurring costs that render the process economically unfeasible.
  • FIG. 1 is a schematic representation of a light emitting system.
  • FIG. 2 is a side view of an LED with a patterned surface.
  • FIG. 3 is a top view the patterned surface of the LED of FIG. 2 .
  • FIG. 4 is a graph of an extraction efficiency of an LED with a patterned surface as function of a detuning parameter.
  • FIG. 5 is a schematic representation of the Fourier transformation of a patterned surface of an LED.
  • FIG. 6 is a graph of an extraction efficiency of an LED with a patterned surface as function of nearest neighbor distance.
  • FIG. 7 is a graph of an extraction efficiency of an LED with a patterned surface as function of a filling factor.
  • FIG. 8 is a top view a patterned surface of an LED.
  • FIG. 9 is a graph of an extraction efficiency of LEDs with different surface patterns.
  • FIG. 10 is a graph of an extraction efficiency of LEDs with different surface patterns.
  • FIG. 11 is a graph of an extraction efficiency of LEDs with different surface patterns.
  • FIG. 12 is a graph of an extraction efficiency of LEDs with different surface patterns.
  • FIG. 13 is a schematic representation of the Fourier transformation two LEDs having different patterned surfaces compared with the radiation emission spectrum of the LEDs.
  • FIG. 14 is a graph of an extraction efficiency of LEDs having different surface patterns as a function of angle.
  • FIG. 15 is a side view of an LED with a patterned surface and a phosphor layer on the patterned surface.
  • FIG. 16 is a side view of a epitaxial layer precursor to an LED with a patterned surface.
  • FIG. 17 is a side view of a epitaxial layer precursor to an LED with a patterned surface.
  • FIG. 18 is a side view of a epitaxial layer precursor to an LED with a patterned surface.
  • FIG. 19 is a side view of a epitaxial layer precursor to an LED with a patterned surface.
  • FIG. 20 is a side view of a epitaxial layer precursor to an LED with a patterned surface.
  • FIG. 1 is a schematic representation of a light-emitting system 50 that has an array 60 of LEDs 100 incorporated therein.
  • Array 60 is configured so that, during use, light that emerges from LEDs 100 (see discussion below) emerges from system 50 via surface 55 .
  • light-emitting systems include projectors (e.g., rear projection projectors, front projection projectors), portable electronic devices (e.g., cell phones, personal digital assistants, laptop computers), computer monitors, large area signage (e.g., highway signage), vehicle interior lighting (e.g., dashboard lighting), vehicle exterior lighting (e.g., vehicle headlights, including color changeable headlights), general lighting (e.g., office overhead lighting), high brightness lighting (e.g., streetlights), camera flashes, medical devices (e.g., endoscopes), telecommunications (e.g. plastic fibers for short range data transfer), security sensing (e.g.
  • projectors e.g., rear projection projectors, front projection projectors
  • portable electronic devices e.g., cell phones, personal digital assistants, laptop computers
  • computer monitors large area signage (e.g., highway signage), vehicle interior lighting (e.g., dashboard lighting), vehicle exterior lighting (e.g., vehicle headlights, including
  • biometrics biometrics
  • integrated optoelectronics e.g., intrachip and interchip optical interconnects and optical clocking
  • military field communications e.g., point to point communications
  • biosensing e.g. photo-detection of organic or inorganic substances
  • photodynamic therapy e.g. skin treatment
  • night-vision goggles solar powered transit lighting, emergency lighting, airport runway lighting, airline lighting, surgical goggles, wearable light sources (e.g. life-vests).
  • An example of a rear projection projector is a rear projector television.
  • An example of a front projection projector is a projector for displaying on a surface, such as a screen or a wall.
  • a laptop computer can include a front projection projector.
  • surface 55 is formed of a material that transmits at least about 20% (e.g., at least about 30%, at least about 40%, at least about 50%, at least about 60%, at least about 70%, at least about 80%, at least about 90%, at least about 95%) of the light that emerges from LEDs 100 and impinges on surface 55 .
  • materials from which surface 55 can be formed include glass, silica, quartz, plastic and polymers.
  • the light that emerges e.g., total light intensity, light intensity as a function of wavelength, and/or peak emission wavelength
  • An example is time-sequencing of substantially monochromatic sources (e.g. LEDs) in display applications (e.g., to achieve vibrant full-color displays).
  • Another example is in telecommunications where it can be advantageous for an optical system to have a particular wavelength of light travel from the source to the light guide, and from the light guide to the detector.
  • a further example is vehicle lighting where color indicates signaling.
  • An additional example is in medical applications (e.g., photosensitive drug activation or biosensing applications, where wavelength or color response can be advantageous).
  • the light that emerges e.g., total light intensity, light intensity as a function of wavelength, and/or peak emission wavelength
  • An example is in general lighting (e.g., where multiple wavelengths can improve the color rendering index (CRI)).
  • CRI is a measurement of the amount of color shift that objects undergo when lighted by the light-emitting system as compared with the color of those same objects when seen under a reference lighting system (e.g., daylight) of comparable correlated temperature.
  • Another example is in camera flashes (e.g., where substantially high CRI, such as substantially close to the CRI of noontime sunlight, is desirable for a realistic rendering of the object or subject being photographed).
  • a further example is in medical devices (e.g., where substantially consistent CRI is advantageous for tissue, organ, fluid, etc. differentiation and/or identification).
  • An additional example is in backlighting displays (e.g., where certain CRI white light is often more pleasing or natural to the human eye).
  • LEDs 100 can be configured differently.
  • system 50 includes a single LED 100 .
  • the array is curved to help angularly direct the light from various sources onto the same point (e.g., an optic such as a lens).
  • the array of devices is hexagonally distributed to allow for close-packing and high effective surface brightness.
  • the devices are distributed around a mirror (e.g., a dichroic mirror) that combines or reflects light from the LEDs in the array.
  • system 50 includes a single LED 100 .
  • light from LEDs 100 is focused onto a microdisplay (e.g., onto a light valve such as a digital light processor (DLP) or a liquid crystal display (LCD)).
  • a microdisplay e.g., onto a light valve such as a digital light processor (DLP) or a liquid crystal display (LCD)
  • DLP digital light processor
  • LCD liquid crystal display
  • light is directed through various optics, mirrors or polarizers (e.g., for an LCD).
  • light is projected through primary or secondary optics, such as, for example, a lens or a set of lenses.
  • FIG. 2 shows a side view of an LED 100 in the form of a packaged die.
  • LED 100 includes a multi-layer stack 122 disposed on a submount 120 .
  • Multi-layer stack 122 includes a 320 nm thick silicon doped (n-doped) GaN layer 134 having a pattern of openings 150 in its upper surface 110 .
  • Multi-layer stack 122 also includes a bonding layer 124 , a 100 nm thick silver layer 126 , a 40 nm thick magnesium doped (p-doped) GaN layer 128 , a 120 nm thick light-generating region 130 formed of multiple InGaN/GaN quantum wells, and a AlGaN layer 132 .
  • An n-side contact pad 136 is disposed on layer 134
  • a p-side contact pad 138 is disposed on layer 126 .
  • An encapsulant material (epoxy having an index of refraction of 1.5) 144 is present between layer 134 and a cover slip 140 and supports 142 . Layer 144 does not extend into openings 150 .
  • Light is generated by LED 100 as follows.
  • P-side contact pad 138 is held at a positive potential relative to n-side contact pad 136 , which causes electrical current to be injected into LED 100 .
  • As the electrical current passes through light-generating region 130 electrons from n-doped layer 134 combine in region 130 with holes from p-doped layer 128 , which causes region 130 to generate light.
  • Light-generating region 130 contains a multitude of point dipole radiation sources that emit light (e.g., isotropically) within the region 130 with a spectrum of wavelengths characteristic of the material from which light-generating region 130 is formed.
  • the spectrum of wavelengths of light generated by region 130 can have a peak wavelength of about 445 nanometers (nm) and a full width at half maximum (FWHM) of about 30 nm.
  • the charge carriers in p-doped layer 126 have relatively low mobility compared to the charge carriers in the n-doped semiconductor layer 134 .
  • placing silver layer 126 (which is conductive) along the surface of p-doped layer 128 can enhance the uniformity of charge injection from contact pad 138 into p-doped layer 128 and light-generating region 130 . This can also reduce the electrical resistance of device 100 and/or increase the injection efficiency of device 100 .
  • Because of the relatively high charge carrier mobility of the n-doped layer 134 electrons can spread relatively quickly from n-side contact pad 136 throughout layers 132 and 134 , so that the current density within the light-generating region 130 is substantially uniform across the region 130 .
  • silver layer 126 has relatively high thermal conductivity, allowing layer 126 to act as a heat sink for LED 100 (to transfer heat vertically from the multi-layer stack 122 to submount 120 ).
  • At least some of the light that is generated by region 130 is directed toward silver layer 126 .
  • This light can be reflected by layer 126 and emerge from LED 100 via surface 110 , or can be reflected by layer 126 and then absorbed within the semiconductor material in LED 100 to produce an electron-hole pair that can combine in region 130 , causing region 130 to generate light.
  • at least some of the light that is generated by region 130 is directed toward pad 136 .
  • the underside, of pad 136 is formed of a material (e.g., a Ti/Al/Ni/Au alloy) that can reflect at least some of the light generated by light-generating region 130 .
  • the light that is directed to pad 136 can be reflected by pad 136 and subsequently emerge from LED 100 via surface 110 (e.g., by being reflected from silver layer 126 ), or the light that is directed to pad 136 can be reflected by pad 136 and then absorbed within the semiconductor material in LED 100 to produce an electron-hole pair that can combine in region 130 , causing region 130 to generate light (e.g., with or without being reflected by silver layer 126 ).
  • surface 110 of LED 100 is not flat but consists of a modified triangular pattern of openings 150 .
  • various values can be selected for the depth of openings 150 , the diameter of openings 150 and the spacing between nearest neighbors in openings 150 can vary.
  • openings 150 have a depth 146 equal to about 280 nm, a non-zero diameter of about 160 nm, a spacing between nearest neighbors or about 220 nm, and an index of refraction equal to 1.0.
  • the triangular pattern is detuned so that the nearest neighbors in pattern 150 have a center-to-center distance with a value between (a ⁇ a) and (a+ ⁇ a), where “a” is the lattice constant for an ideal triangular pattern and “ ⁇ a” is a detuning parameter with dimensions of length and where the detuning can occur in random directions.
  • detuning parameter, ⁇ a is generally at least about one percent (e.g., at least about two percent, at least about three percent, at least about four percent, at least about five percent) of ideal lattice constant, a, and/or at most about 25% (e.g., at most about 20%, at most about 15%, at most about 10%) of ideal lattice constant, a.
  • the nearest neighbor spacings vary substantially randomly between (a ⁇ a) and (a+ ⁇ a), such that pattern 150 is substantially randomly detuned.
  • the extraction efficiency data shown in FIG. 4 are calculated by using a three-dimensional finite-difference time-domain (FDTD) method to approximate solutions to Maxwell's equations for the light within and outside of LED 100 .
  • FDTD finite-difference time-domain
  • input parameters in a FDTD calculation include the center frequency and bandwidth of the light emitted by the point dipole radiation sources in light-generating region 130 , the dimensions and dielectric properties of the layers within multilayer stack 122 , and the diameters, depths, and nearest neighbor distances (NND) between openings in pattern 150 .
  • extraction efficiency data for LED 100 are calculated using an FDTD method as follows.
  • + ⁇ right arrow over (P) ⁇ m captures the frequency-dependent response of the quantum well light-generating region 130 , the p-contact layer 126 and other layers within LED 100 .
  • the individual ⁇ right arrow over (P) ⁇ m terms are empirically derived values of different contributions to the overall polarizability of a material (e.g., the polarization response for bound electron oscillations, the polarization response for free electron oscillations).
  • the only layers that are considered are encapsulant 144 , silver layer 126 and layers between encapsulant 144 and silver layer 126 . This approximation is based on the assumption that encapsulant 144 and layer 126 are thick enough so that surrounding layers do not influence the optical performance of LED 100 .
  • the relevant structures within LED 100 that are assumed to have a frequency dependent dielectric constant are silver layer 126 and light-generating region 130 .
  • the other relevant layers within LED 100 are assumed to not have frequency dependent dielectric constants. It is to be noted that in embodiments in which LED 100 includes additional metal layers between encapsulant 144 and silver layer 126 , each of the additional metal layers will have a corresponding frequency dependent dielectric constant.
  • silver layer 126 (and any other metal layer in LED 100 ) has a frequency dependent term for both bound electrons and free electrons, whereas light-generating region 130 has a frequency dependent term for bound electrons but does not have a frequency dependent term for free electrons.
  • other terms can be included when modeling the frequency dependence of the dielectric constant. Such terms may include, for example, electron-phonon interactions, atomic polarizations, ionic polarizations and/or molecular polarizations.
  • the emission of light from the quantum well region of light-generating region 130 is modeled by incorporating a number of randomly-placed, constant-current dipole sources within the light-generating region 130 , each emitting short Gaussian pulses of spectral width equal to that of the actual quantum well, each with random initial phase and start-time.
  • a large supercell in the lateral direction is used, along with periodic boundary conditions. This can assist in simulating relatively large (e.g., greater than 0.01 mm on edge) device sizes.
  • the full evolution equations are solved in time, long after all dipole sources have emitted their energy, until no energy remains in the system.
  • the total energy emitted, the energy flux extracted through top surface 110 , and the energy absorbed by the quantum wells and the n-doped layer is monitored. Through Fourier transforms both in time and space, frequency and angle resolved data of the extracted flux are obtained, and therefore an angle- and frequency-resolved extraction efficiency can be calculated.
  • absolute angle-resolved extraction in lumens/per solid angle/per chip area for given electrical input is obtained.
  • the detuned pattern 150 can enhance the efficiency with which light generated in region 130 emerges from LED 100 via surface 110 because openings 150 create a dielectric function that varies spatially in layer 134 according to pattern 150 . It is believed that this alters the density of radiation modes (i.e., light modes that emerge from surface 110 ) and guided modes (i.e., light modes that are confined within multi-layer stack 122 ) within LED 100 , and that this alteration to the density of radiation modes and guided modes within LED 100 results in some light that would otherwise be emitted into guided modes in the absence of pattern 150 being scattered (e.g., Bragg scattered) into modes that can leak into radiation modes. In certain embodiments, it is believed that pattern 150 (e.g., the pattern discussed above, or one of the patterns discussed below) can eliminate all of the guided modes within LED 100 .
  • pattern 150 e.g., the pattern discussed above, or one of the patterns discussed below
  • the effect of detuning of the lattice can be understood by considering Bragg scattering off of a crystal having point scattering sites.
  • the Bragg condition can be relaxed by detuning the spacing of between lattice sites by a detuning parameter ⁇ a. It is believed that detuning the lattice increases the scattering effectiveness and angular acceptance of the pattern over the spectral bandwidth and spatial emission profile of the source.
  • modified triangular pattern 150 having a non-zero detuning parameter ⁇ a has been described that can enhance light extraction from LED 100
  • other patterns can also be used to enhance light extraction from LED 100 .
  • physical insight may first be used to approximate a basic pattern that can enhance light extraction before conducting such numerical calculations.
  • the extraction efficiency of LED 100 can be further understood (e.g., in the weak scattering regime) by considering the Fourier transform of the dielectric function that varies spatially according to pattern 150 .
  • the maximum G to be considered is fixed by the frequency ( ⁇ ) emitted by the light-generating region and the dielectric constant of the light-generating region. As shown in FIG. 5 , this defines a ring in reciprocal space which is often called the light line.
  • the light line will be an annulus due to the finite bandwidth of the light-generating region but for sake of clarity we illustrate the light line of a monochromatic source.
  • light propagating within the encapsulant is bounded by a light line (the inner circle in FIG. 5 ).
  • the extraction efficiency is improved by increasing F k for all directions k that lie within the encapsulant light-line which amounts to increasing the number of G points within the encapsulant light line and increasing the scattering strength ⁇ G for G points which lie within the material light line. This physical insight can be used when selecting patterns that can improve extraction efficiency.
  • FIG. 6 shows the effect of increasing lattice constant for an ideal triangular pattern.
  • the data shown in FIG. 6 are calculated using the parameters given for LED 100 shown in FIG. 2 , except that the emitted light has a peak wavelength of 450 nm, and the depth of the holes, the diameter of the holes, and the thickness of the n-doped layer 134 scale with the nearest neighbor distance, a, as 1.27a, 0.72a, and 1.27a+40 nm, respectively.
  • Increasing the lattice constant increases the density of G points within the light-line of the encapsulant.
  • a clear trend in extraction efficiency with NND is observed. It is believed that the maximum extraction efficiency occurs for NND approximately equal to the wavelength of light in vacuum. The reason a maximum is achieved, is that as the NND becomes much larger than the wavelength of light, the scattering effect is reduced because the material becomes more uniform.
  • FIG. 7 shows the effect of increasing hole size or filling factor.
  • the filling factor for a triangular pattern is given by (2 ⁇ / ⁇ 3)*(r/a) 2 , where r is the radius of a hole.
  • the data shown in FIG. 7 are calculated using the parameters given for the LED 100 shown in FIG. 2 , except that the diameter of the openings is changed according the filling factor value given on the x-axis of the graph.
  • the extraction efficiency increases with filling factor as the scattering strengths ( ⁇ G ) increase. A maximum is observed for this particular system at a filling factor of ⁇ 48%.
  • LED 100 has a filling factor of at least about 10% (e.g., at least about 15%, at least about 20%) and/or at most about 90% (e.g., at most about 80%, at most about 70%, at most about 60%).
  • a modified (detuned) triangular pattern may also be achieved by modifying the holes in an ideal triangular pattern while keeping the centers at the positions for an ideal triangular pattern.
  • FIG. 8 shows an embodiment of such a pattern.
  • the enhancement in light extraction, the methodology for conducting the corresponding numerical calculation, and the physical explanation of the enhanced light extraction for a light-emitting device having the pattern shown in FIG. 8 is generally the same as described above.
  • a modified (detuned) pattern can have openings that are displaced from the ideal locations and openings at the ideal locations but with varying diameters.
  • enhanced light extraction from a light-emitting device can be achieved by using different types of patterns, including, for example, complex periodic patterns and nonperiodic patterns.
  • a complex periodic pattern is a pattern that has more than one feature in each unit cell that repeats in a periodic fashion.
  • Examples of complex periodic patterns include honeycomb patterns, honeycomb base patterns, (2 ⁇ 2) base patterns, ring patterns, and Archimidean patterns.
  • a complex periodic pattern can have certain openings with one diameter and other openings with a smaller diameter.
  • a nonperiodic pattern is a pattern that has no translational symmetry over a unit cell that has a length that is at least 50 times the peak wavelength of light generated by region 130 .
  • Examples of nonperiodic patterns include aperiodic patterns, quasicrystalline patterns, Robinson patterns, and Amman patterns.
  • FIG. 9 shows numerical calculations for LED 100 for two different complex periodic patterns in which certain openings in the patterns have a particular diameter, and other openings in the patterns have smaller diameters.
  • the numerical calculations represented in FIG. 9 show the behavior of the extraction efficiency (larger holes with a diameter of 80 nm) as the diameter of the smaller holes (dR) is varied from zero nm to 95 nm.
  • the data shown in FIG. 7 are calculated using the parameters given for the LED 100 shown in FIG. 2 except that the diameter of the openings is changed according the filling factor value given on the x-axis of the graph.
  • multiple hole sizes allow scattering from multiple periodicities within the pattern, therefore increasing the angular acceptance- and spectral effectiveness of the pattern.
  • the enhancement in light extraction, the methodology for conducting the corresponding numerical calculation, and the physical explanation of the enhanced light extraction for a light-emitting device having the pattern shown in FIG. 9 is generally the same as described above.
  • FIG. 20 shows numerical calculations for LED 100 having different ring patterns (complex periodic patterns).
  • the number of holes in the first ring surrounding the central hole is different (six, eight or 10) for the different ring patterns.
  • the data shown in FIG. 10 are calculated using the parameters given for the LED 100 shown in FIG. 2 , except that the emitted light has a peak wavelength of 450 nm.
  • the numerical calculations represented in FIG. 10 show the extraction efficiency of LED 100 as the number of ring patterns per unit cell that is repeated across a unit cell is varied from two to four.
  • the enhancement in light extraction, the methodology for conducting the corresponding numerical calculation, and the physical explanation of the enhanced light extraction for a light-emitting device having the pattern shown in FIG. 10 is generally the same as described above.
  • FIG. 11 shows numerical calculations for LED 100 having an Archimidean pattern.
  • the Archimidean tiling A 119 consists of 19 equally-spaced holes with a NND of a.
  • the holes are arranged in the form of an inner hexagon of seven holes, and outer hexagon of 12 holes, and a central hole within the inner hexagon.
  • the enhancement in light extraction, the methodology for conducting the corresponding numerical calculation, and the physical explanation of the enhanced light extraction for a light-emitting device having the pattern shown in FIG. 11 is generally the same as described above. As shown in FIG. 11 the extraction efficiency for A 7 and A 19 is about 77%.
  • the data shown in FIG. 11 are calculated using the parameters given for the LED 100 shown in FIG. 2 , except that the emitted light has a peak wavelength of 450 and except that the NND is defined as the distance between openings within an individual cell.
  • FIG. 12 shows numerical calculation data for LED 100 having a quasicrystalline pattern.
  • Quasicrystalline patterns are described, for example, in M. Senechal, Quasicrystals and Geometry (Cambridge University Press, Cambridge, England 1996), which is hereby incorporated by reference.
  • the numerical calculations show the behavior of the extraction efficiency as the class of 8-fold based quasi-periodic structure is varied. It is believed that quasicrystalline patterns exhibit high extraction efficiency due to high degree of in-plane rotational symmetries allowed by such structures.
  • the enhancement in light extraction, the methodology for conducting the corresponding numerical calculation, and the physical explanation of the enhanced light extraction for a light-emitting device having the pattern shown in FIG. 12 is generally the same as described above. Results from FDTD calculations shown in FIG.
  • the data shown in FIG. 12 indicate that the extraction efficiency of quasicrystalline structures reaches about 82%.
  • the data shown in FIG. 12 are calculated using the parameters given for the LED 100 shown in FIG. 2 , except that the emitted light has a peak wavelength of 450 and except that the NND is defined as the distance between openings within an individual cell.
  • At least about 45% e.g., at least about 50%, at least about 55%, at least about 60%, at least about 70%, at least about 80%, at least about 90%, at least about 95%) of the total amount of light generated by light-generating region 130 that emerges from LED 100 emerges via surface 110 .
  • the cross-sectional area of LED 100 can be relatively large, while still exhibiting efficient light extraction from LED 100 .
  • one or more edges of LED 100 can be at least about one millimeter (e.g., at least about 1.5 millimeters, at least about two millimeters, at least about 2.5 millimeters, at least about three millimeters), and at least about 45% (e.g., at least about 50%, at least about 55%, at least about 60%, at least about 70%, at least about 80%, at least about 90%, at least about 95%) of the total amount of light generated by light-generating region 130 that emerges from LED 100 emerges via surface 110 .
  • This can allow for an LED to have a relatively large cross-section (e.g., at least about one millimeter by at least about one millimeter) while exhibiting good power conversion efficiency.
  • the extraction efficiency of an LED having the design of LED 100 is substantially independent of the length of the edge of the LED.
  • the difference between the extraction efficiency of an LED having the design of LED 100 and one or more edges having a length of about 0.25 millimeter and the extraction efficiency of LED having the design of LED 100 and one or more edges having a length of one millimeter can vary by less than about 10% (e.g., less than about 8%, less than about 5%, less than about 3%).
  • the extraction efficiency of an LED is the ratio of the light emitted by the LED to the amount of light generated by the device (which can be measured in terms of energy or photons). This can allow for an LED to have a relatively large cross-section (e.g., at least about one millimeter by at least about one millimeter) while exhibiting good power conversion efficiency.
  • the quantum efficiency of an LED having the design of LED 100 is substantially independent of the length of the edge of the LED.
  • the difference between the quantum efficiency of an LED having the design of LED 100 and one or more edges having a length of about 0.25 millimeter and the quantum efficiency of LED having the design of LED 100 and one or more edges having a length of one millimeter can vary by less than about 10% (e.g., less than about 8%, less than about 5%, less than about 3%).
  • the quantum efficiency of an LED is the ratio of the number of photons generated by the LED to the number of electron-hole recombinations that occur in the LED. This can allow for an LED to have a relatively large cross-section (e.g., at least about one millimeter by at least about one millimeter) while exhibiting good performance.
  • the wall plug efficiency of an LED having the design of LED 100 is substantially independent of the length of the edge of the LED.
  • the difference between the wall plug efficiency of an LED having the design of LED 100 and one or more edges having a length of about 0.25 millimeter and the wall plug efficiency of LED having the design of LED 100 and one or more edges having a length of one millimeter can vary by less than about 10% (e.g., less than about 8%, less than about 5%, less than about 3%).
  • the wall plug efficiency of an LED is the product of the injection efficiency of the LED (the ratio of the numbers of carriers injected into the device to the number of carriers that recombine in the light-generating region of the device), the radiative efficiency of the LED (the ratio of electron-hole recombinations that result in a radiative event to the total number of electron-hole recombinations), and the extraction efficiency of the LED (the ratio of photons that are extracted from the LED to the total number of photons created).
  • This can allow for an LED to have a relatively large cross-section (e.g., at least about one millimeter by at least about one millimeter) while exhibiting good performance.
  • a given solid angle e.g., into a solid angle around the direction normal to surface 10
  • FIG. 13 shows the Fourier transform construction for two ideal triangular lattices of different lattice constant.
  • ⁇ G scattering strengths of G points
  • FIG. 14 which shows extraction efficiency into a solid angle (given by the collection half-angle in the diagram).
  • the data shown in FIG. 14 are calculated using the parameters given for the LED 100 shown in FIG. 2 , except that the emitted light has a peak wavelength of 530 nm and a bandwidth of 34 nm, the index of refraction of the encapsulant was 1.0, the thickness of the p-doped layer was 160 nm, the light generating layer was 30 nm thick, the NND (a) for the three curves is shown on FIG. 14 , and the depth, hole diameter, and n-doped layer thickness scaled with a, as 1.27a, 0.72a, and 1.27a+40 nm, respectively.
  • the approach is especially applicable for reducing the source etendue which is believed to often be proportional to n 2 , where n is the index of refraction of the surrounding material (e.g., the encapsulant). It is therefore believed that reducing the index of refraction of the encapsulating layer for LED 100 can lead to more collimated emission, a lower source etendue, and therefore to a higher surface brightness (here defined as the total lumens extracted into the etendue of the source). In some embodiments then, using an encapsulant of air will reduce the source etendue while increasing extraction efficiency into a given collection angle centered around the normal direction.
  • the distribution of light is more collimated than a lambertian distribution.
  • at least about 40% e.g., at least about 50%, at least about 70%, at least about 90%
  • the light emerging via the surface of the dielectric layer emerges within at most about 30° (e.g., at most about 25°, at most about 20°, at most about 15°) of an angle normal to surface 110 .
  • a wafer has at least about five LEDs (e.g., at least about 25 LEDs, at least about 50 LEDs) per square centimeter.
  • an LED 300 having a layer containing a phosphor material 180 can be disposed on surface 110 .
  • the phosphor material can interact with light at the wavelength(s) generated by region 130 to provide light at desired wavelength(s).
  • the phosphor material in layer 180 can be formed of, for example, a (Y,Gd)(Al,Ga)G:Ce 3+ or “YAG” (yttrium, aluminum, garnet) phosphor.
  • the phosphor material in layer 180 can be activated and emit light (e.g., isotropically) with a broad spectrum centered around yellow wavelengths.
  • a viewer of the total light spectrum emerging from packaged LED 100 sees the yellow phosphor broad emission spectrum and the blue InGaN narrow emission spectrum and typically mixes the two spectra to perceive white.
  • layer 180 can be substantially uniformly disposed on surface 110 .
  • the distance between the top 151 of pattern 150 and the top 181 of layer 180 can vary by less than about 20% (e.g., less than about 10%, less than about 5%, less than about 2%) across surface 110 .
  • the thickness of layer 180 is small compared to the cross-sectional dimensions of surface 130 of LED 100 , which are typically about one millimeter (mm) by one mm. Because layer 180 is substantially uniformly deposited on surface 10 , the phosphor material in layer 180 can be substantially uniformly pumped by light emerging via surface 110 .
  • the phosphor layer 180 is relatively thin compared to the dimensions of the surface 110 of the LED 100 , such that light emitted by the light-generating region 130 is converted into lower wavelength light within the phosphor layer 180 approximately uniformly over the entire surface 10 of LED 100 .
  • the relatively thin, uniform phosphor layer 180 produces a uniform spectrum of white light emitted from the LED 100 as a function of position on surface 110 .
  • LED 100 can be fabricated as desired. Typically, fabrication of LED 100 involves various deposition, laser processing, lithography, and etching steps.
  • a LED wafer 500 containing an LED layer stack of material deposited on a sapphire substrate is readily available and can be purchased from a commercial vendor.
  • a buffer layer 504 On the sapphire substrate 502 are disposed, consecutively, a buffer layer 504 , an n-doped Si:GaN layer 506 , an AlGaN/GaN heterojunction or superlattice that provides a current spreading layer 508 , an InGaN/GaN multi-quantum well light-generating region 510 , and a p-doped Mg:GaN layer 512 .
  • the commercially available LED wafer is about 2-3 inches in diameter and multiple LED dice can be cut from the wafer to form individual devices after the wafer has been processed. Before dicing the wafer, a number of wafer scale processing steps are used to position the p-doped layer 128 on the same side of the light-generating region 130 as the mirror layer 126 .
  • a relatively thin nickel layer 520 is deposited (e.g., using electron-beam evaporation) on p-doped layer 512 to form a p-type ohmic contact to p-doped layer 512 .
  • a silver layer 522 is deposited (e.g., using electron-beam evaporation) on nickel layer 520 .
  • a relatively thick nickel layer 524 is deposited on silver layer 522 (e.g., using electron-beam evaporation). Layer 524 can act as diffusion barrier to reduce the diffusion of contaminants into silver layer 522 .
  • a gold layer 526 is deposited on nickel layer 524 (e.g., using resistance evaporation). Wafer 500 is then annealed at a temperature between 400 and 600 degrees Celsius for between 30 and 300 seconds in a nitrogen, oxygen, air, or forming gas to achieve an ohmic contact.
  • a submount wafer 600 is prepared by depositing on a p-doped silicon wafer 602 , consecutively (e.g., using electron-beam evaporation) an aluminum contact layer 604 .
  • a gold layer 608 is deposited (e.g., using thermal evaporation) onto layer 604
  • a AuSn bonding layer 610 is deposited (e.g., using thermal evaporation) onto layer 608 .
  • Submount wafer 600 is annealed at a temperature between 350 and 500 degrees Celsius for between 30 and 300 seconds in a nitrogen, oxygen, air, or forming gas to achieve an ohmic contact.
  • Wafer 500 and 600 are bonded together by bringing the layer 526 into contact with layer 610 of the submount wafer 600 (e.g., using a thermal-mechanical press) using pressures from 0 to 0.5 MPa and temperatures ranging from 200-400 degrees Celsius. Layer 510 and layer 610 form a eutectic bond. The combined wafer sandwich is cooled and the bonded sandwich is removed from the press.
  • substrate 502 is removed from the combined structure by a laser liftoff process.
  • Laser liftoff processes are disclosed, for example, in U.S. Pat. Nos. 6,420,242 and 6,071,795, which are hereby incorporated by reference.
  • a 248 nm laser beam is shined through substrate 502 to locally heat n-doped Si:GaN layer 506 near its interface with sapphire substrate 502 , decomposing a sublayer of n-doped layer 506 .
  • the wafer sandwich is then heated to above the melting point of gallium, at which point sapphire substrate 502 is removed from the sandwich by applying a lateral force to it (e.g., using a cotton swab).
  • the exposed GaN surface is then cleaned (e.g., using a hydrochloric acid bath) to remove liquid gallium from the surface.
  • sapphire substrate 502 is removed from the GaN epitaxial layer stack
  • strain that was present in the stack e.g., due to the lattice mismatch between substrate 502 and the stack
  • the coefficient of thermal expansion is considered when choosing the submount to avoid cracking in the laser liftoff process.
  • cracking can be reduced during laser-liftoff by substantially overlapping fields in the step and repeat process.
  • the exposed surface of n-doped Si:GaN layer 506 is etched back (e.g., using a reactive ion etching process) to achieve a desired thickness for the layer to be used in the final device ( FIG. 20 ).
  • the surface of the etched GaN layer 506 has a roughened surface texture 700 due to the etching.
  • Roughened surface 700 can be planarized and thinned (e.g., using a chemical-mechanical process) to achieve a final thickness for layer 506 and surface smoothness of less than about 5 nm root mean square (rms).
  • roughened surface 700 can be maintained in order to aid in increasing the extraction efficiency of the device by introducing a locally non-planar interface to the device 100 .
  • the roughened surface increases the probability, with respect to a microscopically smooth surface, that a light ray that strikes surface 700 multiple times will eventually strike the surface at an angle that less than the critical angle given by Snell's law and will be extracted through the surface 700 .
  • a planarization layer 702 of a material e.g., a polymer
  • a resist layer 704 is disposed (e.g., spin-coated) onto planarization layer 702 .
  • the pattern that forms the photonic lattice in the LED is then created in n-doped layer 506 by a nanoimprint lithography and etching process.
  • a mold that defines a portion of the desired pattern is pressed into the resist layer 704 and stepped across the entire surface of the wafer in a portion-by-portion manner to print the features of the pattern 150 and leaving regions for depositing n-contacts later on in the process flow.
  • the surface of n-doped layer 506 is substantially flat during this portion of the process.
  • X-ray lithography or deep ultraviolet lithography, for example, can also be used to create the pattern in resist layer 704 .
  • a predeposited etch mask can be laid down on the surface of layer 506 .
  • Patterned layer 704 is used as a mask to transfer the pattern into the planarization layer 702 (e.g., using a reactive-ion etching process). Planarization layer is subsequently used as a mask to transfer the pattern into the n-doped layer 506 . Following etching of GaN layer 506 , the planarization layer is removed (e.g., using an oxygen-based reactive ion etch).
  • a layer of phosphor material can optionally be disposed (e.g., spin-coated) onto the patterned surface of n-doped layer 506 .
  • the phosphor can conformally coat the patterned surface (coat with substantially no voids present along the bottoms and sidewalls of the openings in the patterned surface).
  • a layer of encapsulant material can be disposed on the surface of patterned n-doped layer 506 (e.g. by CVD, sputtering, suspension by liquid binder that is subsequently evaporated).
  • the encapsulant can contain one or more phosphor materials.
  • the phosphor can be compressed to achieve thickness uniformity less that 20%, less than 15%, less than 10%, less than 5%, or less than 2% of the average thickness of the phosphor.
  • the phosphor-containing encapsulant can conformally coat the patterned surface.
  • individual LED dice can be cut from the wafer. Once wafer processing and wafer testing is complete, individual LED dice are separated and prepared for packaging and testing. A sidewall passivation step and/or a pre-separation deep mesa etching step may be used to reduce potential damage to the electrical and/or optical properties of the patterned LED incurred during wafer cutting.
  • the individual LEDs can be any size up to the size of the wafer itself, but individual LEDs are typically square or rectangular, with sides having a length between about 0.5 mm to 5 mm.
  • standard photolithography is used to define the location of contact pads on the wafer for energizing the device, and ohmic contacts are evaporated (e.g. using electron beam evaporation) onto the desired locations.
  • the package should generally be capable of facilitating light collection while also providing mechanical and environmental protection of the die.
  • a transparent cover can be packaged on the LED die to protect the patterned surface of the 506 when an encapsulant is not used.
  • the cover slip is attached to supports 142 using a glassy frit that is melted in a furnace.
  • the opposite ends of the supports are connected using a cap weld or an epoxy for example.
  • Supports are typically Ni-plated to facilitate welding to an Au plated surface of the package. It believed that the absence of an encapsulant layer allows higher tolerable power loads per unit area in the patterned surface LED 100 . Degradation of the encapsulant can be a common failure mechanism for standard LEDs and is avoided not using an encapsulant layer.
  • the LEDs are cut from a large area flat wafer, their light output per area does not decrease with area. Also, because the cross section of an individual LEDs cut from a wafer is only slightly larger than the light-emitting surface area of the LED, many individual, and separately addressable LEDs can be packed closely together in an array. If one LED does not function (e.g., due to a large defect), then it does not significant diminish the performance of the array because the individual devices are closely packed.
  • the light-emitting device can have any desired thickness, and the individual layers within the light-emitting device can have any desired thickness.
  • the thicknesses of the layers within multi-layer stack 122 are chosen so as to increase the spatial overlap of the optical modes with light-generating region 130 , to increase the output from light generated in region 130 .
  • Exemplary thicknesses for certain layers in a light-emitting device include the following.
  • layer 134 can have a thickness of at least about 100 nm (e.g., at least about 200 nm, at least about 300 nm, at least about 400 nm, at least about 500 nm) and/or at most about 10 microns (e.g., at most about five microns, at most about three microns, at most about one micron).
  • layer 128 has a thickness of at least about 10 nm (e.g., at least about 25 nm, at least about 40 nm) and/or at most about one micron (e.g., at most about 500 nm, at most about 100 nm).
  • layer 126 has a thickness of at least about 10 nm (e.g., at least about 50 nm, at least about 100 nm) and/or at most about one micron (e.g., at most about 500 nm, at most about 250 nm).
  • light-generating region 130 has a thickness of at least about 10 nm (e.g., at least about 25 nm, at least about 50 nm, at least about 100 nm) and/or at most about 500 nm (e.g., at most about 250 nm, at most about 150 nm).
  • light-emitting diode As an example, while a light-emitting diode has been described, other light-emitting devices having the above-described features (e.g., patterns, processes) can be used. Such light-emitting devices include lasers and optical amplifiers.
  • a current spreading layer can be integral with (e.g., a portion of) layer 134 .
  • the current spreading layer can be a relatively highly n-doped portion of layer 134 or a heterojunction between (e.g. AlGaN/GaN) to form a 2D electron gas.
  • any semiconductor materials e.g., III-V semiconductor materials, organic semiconductor materials, silicon
  • any semiconductor materials can be used that can be used in a light-emitting device.
  • Examples of other light-generating materials include InGaAsP, AlInGaN, AlGaAs, InGaAIP.
  • Organic light-emitting materials include small molecules such as aluminum tris-8-hydroxyquinoline (Alq 3 ) and conjugated polymers such as poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-vinylenephenylene] or MEH-PPV.
  • the LEDs can also be small area LEDs (e.g., LEDs smaller than the standard about 300 microns on edge).
  • a dielectric function that varies spatially according to a pattern has been described in which the pattern is formed of holes, the pattern can also be formed in other ways.
  • a pattern can be formed continuous veins and/or discontinuous veins in the appropriate layer.
  • the pattern in varying dielectric function can be achieved without using holes or veins.
  • materials having different dielectric functions can be patterned in the appropriate layer. Combinations of such patterns can also be used.
  • layer 126 has been described as being formed of silver, other materials can also be used.
  • layer 126 is formed of a material that can reflect at least about 50% of light generated by the light-generating region that impinges on the layer of reflective material, the layer of reflective material being between the support and the multi-layer stack of materials. Examples of such materials include distributed Bragg reflector stacks and various metals and alloys, such as aluminum and aluminum-containing alloys.
  • support 120 can be formed of a variety of materials. Examples of materials from which support 120 can be formed include copper, copper-tungsten, aluminum nitride, silicon carbide, beryllium-oxide, diamonds, TEC and aluminum.
  • a light-emitting device can include a separate layer (e.g., disposed between layer 126 and submount 120 ) that serves as a heat sink.
  • layer 126 may or may not be formed of a material that can serve as a heat sink.
  • the varying pattern in dielectric function has been described as extending into n-doped layer 134 only (which can substantially reduce the likelihood of surface recombination carrier losses) in addition to making use of the entire light-generating region, in some embodiments, the varying pattern in dielectric function can extend beyond n-doped layer (e.g., into current spreading layer 132 , light-generating region 130 , and/or p-doped layer 128 ).
  • air can be disposed between surface 110 can cover slip 140
  • materials other than, or in an addition to, air can be disposed between surface 110 and cover slip 140 .
  • such materials have an index of refraction of at least about one and less than about 1.5 (e.g., less than about 1.4, less than about 1.3, less than about 1.2, less than about 1.1).
  • examples of such materials include nitrogen, air, or some higher thermal conductivity gas.
  • surface 110 may or may not be patterned.
  • surface 110 may be non-patterned but may be roughened (i.e., having randomly distributed features of various sizes and shapes less than ⁇ /5).
  • a light-emitting device can include a layer of a phosphor material coated on surface 110 , cover layer 140 and supports 142 .
  • a light-emitting device can include a cover layer 140 that has a phosphor material disposed therein.
  • surface 110 may or may not be patterned.
  • the light emitted by the light-generating region 130 is UV (or violet, or blue) and the phosphor layer 180 includes a mixture of a red phosphor material (e.g., L 2 O 2 S:Eu 3+ ), a green phosphor material (e.g, ZnS:Cu,Al,Mn), and blue phosphor material (e.g, (Sr,Ca,Ba,Mg) 10 (PO 4 ) 6 Cl:Eu 2+ ).
  • a red phosphor material e.g., L 2 O 2 S:Eu 3+
  • a green phosphor material e.g, ZnS:Cu,Al,Mn
  • blue phosphor material e.g, (Sr,Ca,Ba,Mg) 10 (PO 4 ) 6 Cl:Eu 2+

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
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  • Led Devices (AREA)

Abstract

Light-emitting systems, and related components, systems and methods are disclosed.

Description

    CROSS-REFERENCE TO RELATED APPLICATIONS
  • This application claims priority under 35 U.S.C. §119 to the following U.S. Provisional Patent Applications: 60/462,889, filed Apr. 15, 2003; 60/474,199, filed May 29, 2003; 60/475,682, filed Jun. 4, 2003; 60/503,653, filed Sep. 17, 2003; 60/503,654 filed Sep. 17, 2003; 60/503,661, filed Sep. 17, 2003; 60/503,671, filed Sep. 17, 2003; 60/503,672, filed Sep. 17, 2003; 60/513,807, filed Oct. 23, 2003; and 60/514,764, filed Oct. 27, 2003. This application also claims priority under 35 U.S.C. §120 to, and is a continuation of U.S. patent application Ser. No. 10/735,498, entitled “Light Emitting Systems,” and filed Dec. 12, 2003, which is a continuation-in-part of, the following U.S. patent applications Ser. Nos: 10/723,987, entitled “Light Emitting Devices,” and filed Nov. 26, 2003; 10/724,004 (now U.S. Pat. No. 6,831,302), entitled “Light Emitting Devices,” and filed Nov. 26, 2003; 10/724,033, entitled “Light Emitting Devices,” and filed Nov. 26, 2003; 10/724,006 (now U.S. Pat. No. 7,084,434), entitled “Light Emitting Devices,” and filed Nov. 26, 2003; 10/724,029 (now U.S. Pat. No. 7,098,589), entitled “Light Emitting Devices,” and filed Nov. 26, 2003; Ser. No. 10/724,015, entitled “Light Emitting Devices,” and filed Nov. 26, 2003; Ser. No. 10/724,005 (now U.S. Pat. No. 7,083,993), entitled “Light Emitting Devices,” and filed Nov. 26, 2003. Each of these patent applications is incorporated herein by reference.
  • TECHNICAL FIELD
  • The invention relates to systems, and related components, systems and methods.
  • BACKGROUND
  • A light emitting diode (LED) often can provide light in a more efficient manner than an incandescent light source and/or a fluorescent light source. The relatively high power efficiency associated with LEDs has created an interest in using LEDs to displace conventional light sources in a variety of lighting applications. For example, in some instances LEDs are being used as traffic lights and to illuminate cell phone keypads and displays.
  • Typically, an LED is formed of multiple layers, with at least some of the layers being formed of different materials. In general, the materials and thicknesses selected for the layers determine the wavelength(s) of light emitted by the LED. In addition, the chemical composition of the layers can be selected to try to isolate injected electrical charge carriers into regions (commonly referred to as quantum wells) for relatively efficient conversion to optical power. Generally, the layers on one side of the junction where a quantum well is grown are doped with donor atoms that result in high electron concentration (such layers are commonly referred to as n-type layers), and the layers on the opposite side are doped with acceptor atoms that result in a relatively high hole concentration (such layers are commonly referred to as p-type layers).
  • A common approach to preparing an LED is as follows. The layers of material are prepared in the form of a wafer. Typically, the layers are formed using an epitaxial deposition technique, such as metal-organic chemical vapor deposition (MOCVD), with the initially deposited layer being formed on a growth substrate. The layers are then exposed to various etching and metallization techniques to form contacts for electrical current injection, and the wafer is subsequently sectioned into individual LED chips. Usually, the LED chips are packaged.
  • During use, electrical energy is usually injected into an LED and then converted into electromagnetic radiation (light), some of which is extracted from the LED.
  • SUMMARY
  • The invention relates to light-emitting systems, and related components, systems and methods.
  • In one embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials. The multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region. The surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer. The surface of the first layer has a dielectric function that varies spatially according to a pattern, and the pattern has an ideal lattice constant and a detuning parameter with a value greater than zero. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • In another embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials. The multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region. The surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer, and the surface has a dielectric function that varies spatially according to a nonperiodic pattern. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • In a further embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials. The multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region. The surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer, and the surface has a dielectric function that varies spatially according to a complex periodic pattern. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • In one embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials. The multi-layer stack of materials includes a layer of n-doped material, a layer of p-doped material, and a light-generating region. The light-emitting device also includes a layer of reflective material that is capable of reflecting at least about 50% of light generated by the light-generating region that impinges on the layer of reflective material. The surface of the layer of n-doped material is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the layer of n-doped material. The surface of the layer of n-doped material has a dielectric function that varies spatially according to a pattern, and the distance between the layer of p-doped material and the layer of reflective material is less than the distance between the layer of n-doped material and the layer of reflective material. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the layer of n-doped material, the light can emerge from the light-emitting system.
  • In another embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials including a light-generating region and a first layer supported by the light-generating region. The surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer, and the surface of the first layer has a dielectric function that varies spatially according to a pattern. The light-emitting device also includes a layer of reflective material that is capable of reflecting at least about 50% of light generated by the light-generating region that impinges on the layer of reflective material. The light-generating region is between the layer of reflective material and the first layer, and the pattern does not extend beyond the first layer. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the layer of n-doped material, the light can emerge from the light-emitting system.
  • In a further embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials. The multi-layer stack of materials includes a light-generating region, and a first layer supported by the light-generating region. The surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer. The light-emitting device also includes a material in contact with the surface of the first layer, where the material has an index of refraction less than about 1.5. The light emitting device is packaged. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the layer of n-doped material, the light can emerge from the light-emitting system.
  • In one embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials. The multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region. The surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer. The surface of the first layer has a dielectric function that varies spatially according to a pattern. The light-emitting device also includes a phosphor material supported by the surface of the first layer. The sidewalls of the light-emitting device are substantially devoid of the phosphor material. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the layer of n-doped material, the light can emerge from the light-emitting system.
  • In a further embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials. The multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region. The surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer, and the surface of the first layer has a dielectric function that varies spatially according to a pattern. The light-emitting device also includes a phosphor material configured so that light generated by the light-generating region that emerges via the surface of the first layer interacts with the phosphor material so that light that emerges from the phosphor layer is substantially white light. The ratio of the height of the light-emitting device to an area of the light-emitting device is sufficiently small enough for the white light to extend in all directions. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • In one embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials. The multi-layer stack of materials includes a light-generating region, and a first layer supported by the light-generating region. The surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer. The light-emitting device also includes a first sheet formed of a material that is substantially transparent to light that emerges from the light-emitting device, and a second sheet that includes a phosphor material. The second sheet is adjacent the first sheet. The light-emitting device is packaged, and the first and second sheets form a portion of the package for the light-emitting device. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • In another embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials including a light-generating region and a first layer supported by the light-generating region. The surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer. The surface of the first layer has a dielectric function that varies spatially according to a pattern, and the pattern is configured so that light generated by the light-generating region that emerges from the light-emitting device via the surface of the first layer is more collimated than a lambertian distribution of light. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • In one embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials. The multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region so that, during use of the light-emitting device, light generated by the light-generating region can emerge from the light-emitting device via a surface of the first layer. The surface of the first layer has a dielectric function that varies spatially according to a pattern, and at least about 45% (e.g., at least about 50%, at least about 60%, at least about 70%) of the total amount of light generated by the light-generating region that emerges from the light-emitting device emerges via the surface of the light-emitting device. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • In another embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials. The multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region so that, during use of the light-emitting device, light generated by the light-generating region can emerge from the light-emitting device via a surface of the first layer. The light-emitting device has an edge which is at least about one millimeter (e.g., at least about 1.5 millimeters, at least about two millimeters, at least about 2.5 millimeters) long, and the light-emitting device is designed so that the extraction efficiency of the light-emitting device is substantially independent of the length of the edge of the light-emitting device. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • In a further embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials. The multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region so that, during use of the light-emitting device, light generated by the light-generating region can emerge from the light-emitting device via a surface of the first layer. The light-emitting device has an edge which is at least about one millimeter (e.g., at least about 1.5 millimeters, at least about two millimeters, at least about 2.5 millimeters) long, and the light-emitting device is designed so that the quantum efficiency of the light-emitting device is substantially independent of the length of the edge of the light-emitting device. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • In one embodiment, the invention features a light-emitting system that includes a light-emitting device. The light-emitting device includes a multi-layer stack of materials. The multi-layer stack of materials includes a light-generating region and a first layer supported by the light-generating region so that, during use of the light-emitting device, light generated by the light-generating region can emerge from the light-emitting device via a surface of the first layer. The light-emitting device has an edge which is at least about one millimeter (e.g., at least about 1.5 millimeters, at least about two millimeters, at least about 2.5 millimeters) long, and the light-emitting device is designed so that the wall plug efficiency of the light-emitting device is substantially independent of the length of the edge of the light-emitting device. The light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • Embodiments can feature one or more of the following aspects.
  • In some embodiments, the light-emitting system is selected from projectors, portable electronic devices, computer monitors, large area signage systems, vehicle lighting systems, general lighting systems, high brightness lighting systems, camera flashes, medical devices, telecommunications systems, security sensing systems, integrated optoelectronic systems, military field communication systems, biosensing systems, photodynamic therapy systems, night-vision goggles, solar powered transit lighting systems, emergency lighting systems, airport runway lighting systems, airline lighting systems, surgical goggles, wearable light sources and combinations thereof.
  • In certain embodiments, the light-emitting system is a projector, such as, for example, a rear projection projector (e.g., is a rear projection projector for a television) or a front projection projector.
  • In some embodiments, the light-emitting system is a vehicle lighting system.
  • In certain embodiments, the light-emitting system is a general lighting system.
  • In some embodiments, the light-emitting system includes a plurality of light-emitting devices, where each of the plurality of light emitting devices includes a multi-layer stack of materials including a light-generating region and a first layer supported by the light-generating region. For each of the plurality of light-emitting devices, a surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer. The surface of the first layer has a dielectric function that varies spatially according to a pattern. The pattern has an ideal lattice constant and a detuning parameter with a value greater than zero, and the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • In certain embodiments, the light-emitting system includes a plurality of light-emitting devices that are configured as an array. The light-emitting system can include a plurality of arrays of light-emitting devices.
  • In some embodiments, the light-emitting device has a housing with a surface, the light-emitting device is disposed in the housing, and the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
  • In certain embodiments, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light passes through at least one optical component before emerging from the light-emitting system.
  • In some embodiments, the light-emitting system includes a plurality of light-emitting devices, at least some of the light-emitting devices having different peak emission wavelengths.
  • In certain embodiments, the light-emitting system includes a plurality of light-emitting devices, each of the light-emitting devices having substantially the same peak emission wavelength.
  • The multi-layer stack of materials can be formed of a multi-layer stack of semiconductor materials. The first layer can be a layer of n-doped semiconductor material, and the multi-layer stack can further include a layer of p-doped semiconductor material. The light-generating region can be between the layer of n-doped semiconductor material and the layer of p-doped semiconductor material.
  • The light-emitting device can further include a support that supports the multi-layer stack of materials.
  • The light-emitting device can further include a layer of reflective material that is capable of reflecting at least about 50% of light generated by the light-generating region that impinges on the layer of reflective material. The layer of reflective material can be between the support and the multi-layer stack of materials. The distance between the layer of p-doped semiconductor material and the layer of reflective material can be less than a distance between the layer of n-doped semiconductor material and the layer of reflective material. The light-emitting device can further include a p-ohmic contact layer between the layer of p-doped material and the layer of reflective material.
  • The light-emitting device can further include a current-spreading layer between the first layer and the light-generating region.
  • The multi-layer stack of materials can be formed of semiconductor materials, such as, for example, III-V semiconductor materials, organic semiconductor materials and/or silicon.
  • In some embodiments, the pattern does not extend into the light-generating region.
  • In certain embodiments, the pattern does not extend beyond the first layer.
  • In some embodiments, the pattern extends beyond the first layer.
  • The light-emitting device can further include electrical contacts configured to inject current into the light-emitting device. The electrical contacts can be configured to vertically inject electrical current into the light-emitting device.
  • The pattern can be partially formed of a component selected from, for example, holes in the surface of the first layer, pillars in the first layer, continuous veins in the first layer, discontinuous veins in the first layer and combinations thereof.
  • In some embodiments, the pattern can be selected from triangular patterns, square patterns, and grating patterns.
  • In certain embodiments, the pattern can be selected from aperiodic patterns, quasicrystalline patterns, Robinson patterns, and Amman patterns. In some embodiments, the pattern is a Penrose pattern.
  • In some embodiments, the pattern is selected from honeycomb patterns and Archimidean patterns. In certain embodiments, a pattern (e.g., a honeycomb pattern) can have holes with different diameters.
  • The pattern can be partially formed of holes in the surface of the first layer.
  • The detuning parameter can be, for example, at least about 1% of the ideal lattice constant and/or at most about 25% of the ideal lattice constant. In some embodiments, the pattern can correspond to a substantially randomly detuned ideal pattern.
  • The pattern can be configured so that light emitted by the surface of the first layer has a spectrum of radiation modes, and the spectrum of radiation modes is substantially the same as a characteristic emission spectrum of the light-generating region.
  • The light-emitting device can be, for example, a light-emitting diode, a laser, or an optical amplifier. Examples of light-emitting devices include organic light-emitting devices (OLEDs), flat surface-emitting LEDs, and high brightness light-emitting devices (HBLEDs).
  • In some embodiments, the surface of the first layer has features with a size of less than about λ/5, where λ is a wavelength of light that can be emitted by the first layer.
  • In certain embodiments, the light-emitting device is packaged (e.g., in the form of a packaged die). In some embodiments, a packaged light-emitting device can be free of an encapsulant material.
  • In some embodiments, the material in contact with the surface of the first layer is a gas (e.g., air). The gas can have a pressure of less than about 100 Torr.
  • In certain embodiments, the material in contact with the surface of the first layer has an index of refraction of at least about one.
  • In some embodiments, a packaged LED includes a cover. The cover can include a phosphor material. The cover can be configured so that light generated by the light-generating region that emerges via the surface of the first layer can interact with the phosphor material, and so that light that emerges via the surface of the first layer and interacts with the phosphor material emerges from the cover as substantially white light.
  • In certain embodiments, the light-emitting device further includes a first sheet comprising a material that is substantially transparent to light that emerges from the light-emitting device, and a second sheet that includes a phosphor material. The second sheet can be adjacent the first sheet, and a material having an index of refraction of less than about 1.5 can be between the first sheet and the surface of the first layer. The first and second sheets can be configured so that light generated by the light-generating region that emerges via the surface of the first layer can interact with the phosphor material, and so that light that emerges via the surface of the first layer and interacts with the phosphor material emerges from the second sheet as substantially white light.
  • The phosphor material can be disposed on the surface of the first layer.
  • In some embodiments, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, at least about 40% of the light emerging via the surface of the first layer emerges within at most about 30° of an angle normal to the surface of the first layer.
  • In certain embodiments, the filling factor of the light-emitting device is at least about 10% and/or at most about 75%.
  • Embodiments can feature one or more of the following advantages.
  • In certain embodiments, a light-emitting system can include an LED and/or a relatively large LED chip that can exhibit relatively high light extraction.
  • In some embodiments, a light-emitting system can include an LED and/or a relatively large LED chip that can exhibit relatively high surface brightness, relatively high average surface brightness, relatively low need for heat dissipation or relatively high rate of heat dissipation, relatively low etendue and/or relatively high power efficiency.
  • In certain embodiments, a light-emitting system can include an LED and/or a relatively large LED chip that can be designed so that relatively little light emitted by the LED/LED chip is absorbed by packaging.
  • In some embodiments, a light-emitting system can include a packaged LED (e.g., a relatively large packaged LED) that can be prepared without using an encapsulant material. This can result in a packaged LED that avoids certain problems associated with the use of certain encapsulant materials, such as reduced performance and/or inconsistent performance as a function of time, thereby providing a packaged LED that can exhibit relatively good and/or reliable performance over a relatively long period of time.
  • In certain embodiments, a light-emitting system can include an LED (e.g., a packaged LED, which can be a relatively large packaged LED) that can have a relatively uniform coating of a phosphor material.
  • In some embodiments, a light-emitting system can include an LED (e.g., a packaged LED, which can be a relatively large packaged LED) that can be designed to provide a desired light output within a particular angular range (e.g., within a particular angular range relative to the LED surface normal).
  • In some embodiments, a light-emitting system can include an LED and/or a relatively large LED chip that can be prepared by a process that is relatively inexpensive.
  • In certain embodiments, a light-emitting system can include an LED and/or a relatively large LED chip that can be prepared by a process that can be conducted on a commercial scale without incurring costs that render the process economically unfeasible.
  • Features and advantages of the invention are in the description, drawings and claims.
  • DESCRIPTION OF DRAWINGS
  • FIG. 1 is a schematic representation of a light emitting system.
  • FIG. 2 is a side view of an LED with a patterned surface.
  • FIG. 3 is a top view the patterned surface of the LED of FIG. 2.
  • FIG. 4 is a graph of an extraction efficiency of an LED with a patterned surface as function of a detuning parameter.
  • FIG. 5 is a schematic representation of the Fourier transformation of a patterned surface of an LED.
  • FIG. 6 is a graph of an extraction efficiency of an LED with a patterned surface as function of nearest neighbor distance.
  • FIG. 7 is a graph of an extraction efficiency of an LED with a patterned surface as function of a filling factor.
  • FIG. 8 is a top view a patterned surface of an LED.
  • FIG. 9 is a graph of an extraction efficiency of LEDs with different surface patterns.
  • FIG. 10 is a graph of an extraction efficiency of LEDs with different surface patterns.
  • FIG. 11 is a graph of an extraction efficiency of LEDs with different surface patterns.
  • FIG. 12 is a graph of an extraction efficiency of LEDs with different surface patterns.
  • FIG. 13 is a schematic representation of the Fourier transformation two LEDs having different patterned surfaces compared with the radiation emission spectrum of the LEDs.
  • FIG. 14 is a graph of an extraction efficiency of LEDs having different surface patterns as a function of angle.
  • FIG. 15 is a side view of an LED with a patterned surface and a phosphor layer on the patterned surface.
  • FIG. 16 is a side view of a epitaxial layer precursor to an LED with a patterned surface.
  • FIG. 17 is a side view of a epitaxial layer precursor to an LED with a patterned surface.
  • FIG. 18 is a side view of a epitaxial layer precursor to an LED with a patterned surface.
  • FIG. 19 is a side view of a epitaxial layer precursor to an LED with a patterned surface.
  • FIG. 20 is a side view of a epitaxial layer precursor to an LED with a patterned surface.
  • Like reference symbols in the various drawings indicate like elements.
  • DETAILED DESCRIPTION
  • FIG. 1 is a schematic representation of a light-emitting system 50 that has an array 60 of LEDs 100 incorporated therein. Array 60 is configured so that, during use, light that emerges from LEDs 100 (see discussion below) emerges from system 50 via surface 55.
  • Examples of light-emitting systems include projectors (e.g., rear projection projectors, front projection projectors), portable electronic devices (e.g., cell phones, personal digital assistants, laptop computers), computer monitors, large area signage (e.g., highway signage), vehicle interior lighting (e.g., dashboard lighting), vehicle exterior lighting (e.g., vehicle headlights, including color changeable headlights), general lighting (e.g., office overhead lighting), high brightness lighting (e.g., streetlights), camera flashes, medical devices (e.g., endoscopes), telecommunications (e.g. plastic fibers for short range data transfer), security sensing (e.g. biometrics), integrated optoelectronics (e.g., intrachip and interchip optical interconnects and optical clocking), military field communications (e.g., point to point communications), biosensing (e.g. photo-detection of organic or inorganic substances), photodynamic therapy (e.g. skin treatment), night-vision goggles, solar powered transit lighting, emergency lighting, airport runway lighting, airline lighting, surgical goggles, wearable light sources (e.g. life-vests). An example of a rear projection projector is a rear projector television. An example of a front projection projector is a projector for displaying on a surface, such as a screen or a wall. In some embodiments, a laptop computer can include a front projection projector.
  • Typically, surface 55 is formed of a material that transmits at least about 20% (e.g., at least about 30%, at least about 40%, at least about 50%, at least about 60%, at least about 70%, at least about 80%, at least about 90%, at least about 95%) of the light that emerges from LEDs 100 and impinges on surface 55. Examples of materials from which surface 55 can be formed include glass, silica, quartz, plastic and polymers.
  • In some embodiments, it may be desirable for the light that emerges (e.g., total light intensity, light intensity as a function of wavelength, and/or peak emission wavelength) from each LED 100 to be substantially the same. An example is time-sequencing of substantially monochromatic sources (e.g. LEDs) in display applications (e.g., to achieve vibrant full-color displays). Another example is in telecommunications where it can be advantageous for an optical system to have a particular wavelength of light travel from the source to the light guide, and from the light guide to the detector. A further example is vehicle lighting where color indicates signaling. An additional example is in medical applications (e.g., photosensitive drug activation or biosensing applications, where wavelength or color response can be advantageous).
  • In certain embodiments, it may be desirable for the light that emerges (e.g., total light intensity, light intensity as a function of wavelength, and/or peak emission wavelength) from at least some of LEDs 100 to be different from the light that emerges (e.g., total light intensity, light intensity as a function of wavelength, and/or peak emission wavelength) from different LEDs 100. An example is in general lighting (e.g., where multiple wavelengths can improve the color rendering index (CRI)). CRI is a measurement of the amount of color shift that objects undergo when lighted by the light-emitting system as compared with the color of those same objects when seen under a reference lighting system (e.g., daylight) of comparable correlated temperature. Another example is in camera flashes (e.g., where substantially high CRI, such as substantially close to the CRI of noontime sunlight, is desirable for a realistic rendering of the object or subject being photographed). A further example is in medical devices (e.g., where substantially consistent CRI is advantageous for tissue, organ, fluid, etc. differentiation and/or identification). An additional example is in backlighting displays (e.g., where certain CRI white light is often more pleasing or natural to the human eye).
  • Although depicted in FIG. 1 as being in the form of an array, LEDs 100 can be configured differently. As an example, in some embodiments, system 50 includes a single LED 100. As another example, in certain embodiments, the array is curved to help angularly direct the light from various sources onto the same point (e.g., an optic such as a lens). As a further example, in some embodiments, the array of devices is hexagonally distributed to allow for close-packing and high effective surface brightness. As an additional example, in certain embodiments, the devices are distributed around a mirror (e.g., a dichroic mirror) that combines or reflects light from the LEDs in the array.
  • In FIG. 1 the light that emerges from LEDs 100 is shown as traveling directly from LEDs 100 to surface 55. However, in some embodiments, the light that emerges from LEDs 100 can travel an indirect path from LEDs 100 to surface 55. As an example, in some embodiments, system 50 includes a single LED 100. As another example, in certain embodiments, light from LEDs 100 is focused onto a microdisplay (e.g., onto a light valve such as a digital light processor (DLP) or a liquid crystal display (LCD)). As a further example, in some embodiments, light is directed through various optics, mirrors or polarizers (e.g., for an LCD). As an additional example, in certain embodiments, light is projected through primary or secondary optics, such as, for example, a lens or a set of lenses.
  • FIG. 2 shows a side view of an LED 100 in the form of a packaged die. LED 100 includes a multi-layer stack 122 disposed on a submount 120. Multi-layer stack 122 includes a 320 nm thick silicon doped (n-doped) GaN layer 134 having a pattern of openings 150 in its upper surface 110. Multi-layer stack 122 also includes a bonding layer 124, a 100 nm thick silver layer 126, a 40 nm thick magnesium doped (p-doped) GaN layer 128, a 120 nm thick light-generating region 130 formed of multiple InGaN/GaN quantum wells, and a AlGaN layer 132. An n-side contact pad 136 is disposed on layer 134, and a p-side contact pad 138 is disposed on layer 126. An encapsulant material (epoxy having an index of refraction of 1.5) 144 is present between layer 134 and a cover slip 140 and supports 142. Layer 144 does not extend into openings 150.
  • Light is generated by LED 100 as follows. P-side contact pad 138 is held at a positive potential relative to n-side contact pad 136, which causes electrical current to be injected into LED 100. As the electrical current passes through light-generating region 130, electrons from n-doped layer 134 combine in region 130 with holes from p-doped layer 128, which causes region 130 to generate light. Light-generating region 130 contains a multitude of point dipole radiation sources that emit light (e.g., isotropically) within the region 130 with a spectrum of wavelengths characteristic of the material from which light-generating region 130 is formed. For InGaN/GaN quantum wells, the spectrum of wavelengths of light generated by region 130 can have a peak wavelength of about 445 nanometers (nm) and a full width at half maximum (FWHM) of about 30 nm.
  • It is to be noted that the charge carriers in p-doped layer 126 have relatively low mobility compared to the charge carriers in the n-doped semiconductor layer 134. As a result, placing silver layer 126 (which is conductive) along the surface of p-doped layer 128 can enhance the uniformity of charge injection from contact pad 138 into p-doped layer 128 and light-generating region 130. This can also reduce the electrical resistance of device 100 and/or increase the injection efficiency of device 100. Because of the relatively high charge carrier mobility of the n-doped layer 134, electrons can spread relatively quickly from n-side contact pad 136 throughout layers 132 and 134, so that the current density within the light-generating region 130 is substantially uniform across the region 130. It is also to be noted that silver layer 126 has relatively high thermal conductivity, allowing layer 126 to act as a heat sink for LED 100 (to transfer heat vertically from the multi-layer stack 122 to submount 120).
  • At least some of the light that is generated by region 130 is directed toward silver layer 126. This light can be reflected by layer 126 and emerge from LED 100 via surface 110, or can be reflected by layer 126 and then absorbed within the semiconductor material in LED 100 to produce an electron-hole pair that can combine in region 130, causing region 130 to generate light. Similarly, at least some of the light that is generated by region 130 is directed toward pad 136. The underside, of pad 136 is formed of a material (e.g., a Ti/Al/Ni/Au alloy) that can reflect at least some of the light generated by light-generating region 130. Accordingly, the light that is directed to pad 136 can be reflected by pad 136 and subsequently emerge from LED 100 via surface 110 (e.g., by being reflected from silver layer 126), or the light that is directed to pad 136 can be reflected by pad 136 and then absorbed within the semiconductor material in LED 100 to produce an electron-hole pair that can combine in region 130, causing region 130 to generate light (e.g., with or without being reflected by silver layer 126).
  • As shown in FIGS. 2 and 3, surface 110 of LED 100 is not flat but consists of a modified triangular pattern of openings 150. In general, various values can be selected for the depth of openings 150, the diameter of openings 150 and the spacing between nearest neighbors in openings 150 can vary. Unless otherwise noted, for purposes of the figures below showing the results of numerical calculations, openings 150 have a depth 146 equal to about 280 nm, a non-zero diameter of about 160 nm, a spacing between nearest neighbors or about 220 nm, and an index of refraction equal to 1.0. The triangular pattern is detuned so that the nearest neighbors in pattern 150 have a center-to-center distance with a value between (a−Δa) and (a+Δa), where “a” is the lattice constant for an ideal triangular pattern and “Δa” is a detuning parameter with dimensions of length and where the detuning can occur in random directions. To enhance light extraction from LED 100 (see discussion below), detuning parameter, Δa, is generally at least about one percent (e.g., at least about two percent, at least about three percent, at least about four percent, at least about five percent) of ideal lattice constant, a, and/or at most about 25% (e.g., at most about 20%, at most about 15%, at most about 10%) of ideal lattice constant, a. In some embodiments, the nearest neighbor spacings vary substantially randomly between (a−Δa) and (a+Δa), such that pattern 150 is substantially randomly detuned.
  • For the modified triangular pattern of openings 150, it has been found that a non-zero detuning parameter enhances the extraction efficiency of an LED 100. For LED 100 described above, as the detuning parameter Δa increases from zero to about 0.15a, numerical modeling (described below) of the electromagnetic fields in the LED 100 has shown that the extraction efficiency of the device increases from about 0.60 to about 0.70, as shown in FIG. 4.
  • The extraction efficiency data shown in FIG. 4 are calculated by using a three-dimensional finite-difference time-domain (FDTD) method to approximate solutions to Maxwell's equations for the light within and outside of LED 100. See, for example, K. S. Kunz and R. J. Luebbers, The Finite-Difference Time-Domain Methods (CRC, Boca Raton, Fla., 1993); A. Taflove, Computational Electrodynamics: The Finite-Difference Time-Domain Method (Artech House, London, 1995), both of which are hereby incorporated by reference. To represent the optical behavior of LED 100 with a particular pattern 150, input parameters in a FDTD calculation include the center frequency and bandwidth of the light emitted by the point dipole radiation sources in light-generating region 130, the dimensions and dielectric properties of the layers within multilayer stack 122, and the diameters, depths, and nearest neighbor distances (NND) between openings in pattern 150.
  • In certain embodiments, extraction efficiency data for LED 100 are calculated using an FDTD method as follows. The FDTD method is used to solve the full-vector time-dependent Maxwell's equations: × E = - μ H t , × H = ɛ E t + P t ,
    where the polarizability {right arrow over (P)}={right arrow over (P)}1+{right arrow over (P)}2+ . . . +{right arrow over (P)}m captures the frequency-dependent response of the quantum well light-generating region 130, the p-contact layer 126 and other layers within LED 100. The individual {right arrow over (P)}m terms are empirically derived values of different contributions to the overall polarizability of a material (e.g., the polarization response for bound electron oscillations, the polarization response for free electron oscillations). In particular, 2 P m t 2 + γ m P m t + ω m 2 P m = ɛ ( ω ) E ,
    where the polarization corresponds to a dielectric constant ɛ ( ω ) = ɛ + m s m ω m 2 - ω 2 - ⅈγ m ω .
  • For purposes of the numerical calculations, the only layers that are considered are encapsulant 144, silver layer 126 and layers between encapsulant 144 and silver layer 126. This approximation is based on the assumption that encapsulant 144 and layer 126 are thick enough so that surrounding layers do not influence the optical performance of LED 100. The relevant structures within LED 100 that are assumed to have a frequency dependent dielectric constant are silver layer 126 and light-generating region 130. The other relevant layers within LED 100 are assumed to not have frequency dependent dielectric constants. It is to be noted that in embodiments in which LED 100 includes additional metal layers between encapsulant 144 and silver layer 126, each of the additional metal layers will have a corresponding frequency dependent dielectric constant. It is also to be noted that silver layer 126 (and any other metal layer in LED 100) has a frequency dependent term for both bound electrons and free electrons, whereas light-generating region 130 has a frequency dependent term for bound electrons but does not have a frequency dependent term for free electrons. In certain embodiments, other terms can be included when modeling the frequency dependence of the dielectric constant. Such terms may include, for example, electron-phonon interactions, atomic polarizations, ionic polarizations and/or molecular polarizations.
  • The emission of light from the quantum well region of light-generating region 130 is modeled by incorporating a number of randomly-placed, constant-current dipole sources within the light-generating region 130, each emitting short Gaussian pulses of spectral width equal to that of the actual quantum well, each with random initial phase and start-time.
  • To cope with the pattern of openings 150 in surface 110 of the LED 100, a large supercell in the lateral direction is used, along with periodic boundary conditions. This can assist in simulating relatively large (e.g., greater than 0.01 mm on edge) device sizes. The full evolution equations are solved in time, long after all dipole sources have emitted their energy, until no energy remains in the system. During the simulation, the total energy emitted, the energy flux extracted through top surface 110, and the energy absorbed by the quantum wells and the n-doped layer is monitored. Through Fourier transforms both in time and space, frequency and angle resolved data of the extracted flux are obtained, and therefore an angle- and frequency-resolved extraction efficiency can be calculated. By matching the total energy emitted with the experimentally known luminescence of light-generating region 130, absolute angle-resolved extraction in lumens/per solid angle/per chip area for given electrical input is obtained.
  • Without wishing to be bound by theory, it is believed that the detuned pattern 150 can enhance the efficiency with which light generated in region 130 emerges from LED 100 via surface 110 because openings 150 create a dielectric function that varies spatially in layer 134 according to pattern 150. It is believed that this alters the density of radiation modes (i.e., light modes that emerge from surface 110) and guided modes (i.e., light modes that are confined within multi-layer stack 122) within LED 100, and that this alteration to the density of radiation modes and guided modes within LED 100 results in some light that would otherwise be emitted into guided modes in the absence of pattern 150 being scattered (e.g., Bragg scattered) into modes that can leak into radiation modes. In certain embodiments, it is believed that pattern 150 (e.g., the pattern discussed above, or one of the patterns discussed below) can eliminate all of the guided modes within LED 100.
  • It is believed that the effect of detuning of the lattice can be understood by considering Bragg scattering off of a crystal having point scattering sites. For a perfect lattice arranged in lattice planes separated by a distance d, monochromatic light of wavelength λ is scattered through an angle θ according to the Bragg condition, nλ=2 dsinθ, where n is an integer that gives the order of the scattering. However, it is believed that for a light source having a spectral bandwidth Δλ/λ, and emitting into a solid angle ΔΘ, the Bragg condition can be relaxed by detuning the spacing of between lattice sites by a detuning parameter Δa. It is believed that detuning the lattice increases the scattering effectiveness and angular acceptance of the pattern over the spectral bandwidth and spatial emission profile of the source.
  • While a modified triangular pattern 150 having a non-zero detuning parameter Δa has been described that can enhance light extraction from LED 100, other patterns can also be used to enhance light extraction from LED 100. When determining whether a given pattern enhances light extraction from LED 100 and/or what pattern of openings may be used to enhance light extraction from LED 100, physical insight may first be used to approximate a basic pattern that can enhance light extraction before conducting such numerical calculations.
  • The extraction efficiency of LED 100 can be further understood (e.g., in the weak scattering regime) by considering the Fourier transform of the dielectric function that varies spatially according to pattern 150. FIG. 5 depicts the Fourier transform for an ideal triangular lattice. Extraction of light into a particular direction with in-plane wavevector k is related to the source emission Sk′ into all those modes with in-plane wavevector k′ (i.e. parallel to pattern 150) that are compatible to k by the addition or subtraction of a reciprocal lattice vector G, i.e k=k′±G. The extraction efficiency is proportional to the magnitude of the corresponding Fourier component (Fk) of the dielectric function εG given by F k = c k G ɛ G S k - G , ɛ G = ɛ ( r ) - i G r r
  • Since light propagating in the material generally satisfies the equation k2 (in-plane)+k2(normal)=ε(ω/c)2, the maximum G to be considered is fixed by the frequency (ω) emitted by the light-generating region and the dielectric constant of the light-generating region. As shown in FIG. 5, this defines a ring in reciprocal space which is often called the light line. The light line will be an annulus due to the finite bandwidth of the light-generating region but for sake of clarity we illustrate the light line of a monochromatic source. Similarly, light propagating within the encapsulant is bounded by a light line (the inner circle in FIG. 5). Therefore, the extraction efficiency is improved by increasing Fk for all directions k that lie within the encapsulant light-line which amounts to increasing the number of G points within the encapsulant light line and increasing the scattering strength εG for G points which lie within the material light line. This physical insight can be used when selecting patterns that can improve extraction efficiency.
  • As an example, FIG. 6 shows the effect of increasing lattice constant for an ideal triangular pattern. The data shown in FIG. 6 are calculated using the parameters given for LED 100 shown in FIG. 2, except that the emitted light has a peak wavelength of 450 nm, and the depth of the holes, the diameter of the holes, and the thickness of the n-doped layer 134 scale with the nearest neighbor distance, a, as 1.27a, 0.72a, and 1.27a+40 nm, respectively. Increasing the lattice constant, increases the density of G points within the light-line of the encapsulant. A clear trend in extraction efficiency with NND is observed. It is believed that the maximum extraction efficiency occurs for NND approximately equal to the wavelength of light in vacuum. The reason a maximum is achieved, is that as the NND becomes much larger than the wavelength of light, the scattering effect is reduced because the material becomes more uniform.
  • As another example, FIG. 7 shows the effect of increasing hole size or filling factor. The filling factor for a triangular pattern is given by (2π/√3)*(r/a)2, where r is the radius of a hole. The data shown in FIG. 7 are calculated using the parameters given for the LED 100 shown in FIG. 2, except that the diameter of the openings is changed according the filling factor value given on the x-axis of the graph. The extraction efficiency increases with filling factor as the scattering strengths (εG) increase. A maximum is observed for this particular system at a filling factor of ˜48%. In certain embodiments, LED 100 has a filling factor of at least about 10% (e.g., at least about 15%, at least about 20%) and/or at most about 90% (e.g., at most about 80%, at most about 70%, at most about 60%).
  • While a modified triangular pattern has been described in which a detuning parameter relates to positioning of openings in the pattern from the positions in an ideal triangular lattice, a modified (detuned) triangular pattern may also be achieved by modifying the holes in an ideal triangular pattern while keeping the centers at the positions for an ideal triangular pattern. FIG. 8 shows an embodiment of such a pattern. The enhancement in light extraction, the methodology for conducting the corresponding numerical calculation, and the physical explanation of the enhanced light extraction for a light-emitting device having the pattern shown in FIG. 8 is generally the same as described above. In some embodiments, a modified (detuned) pattern can have openings that are displaced from the ideal locations and openings at the ideal locations but with varying diameters.
  • In other embodiments, enhanced light extraction from a light-emitting device can be achieved by using different types of patterns, including, for example, complex periodic patterns and nonperiodic patterns. As referred to herein, a complex periodic pattern is a pattern that has more than one feature in each unit cell that repeats in a periodic fashion. Examples of complex periodic patterns include honeycomb patterns, honeycomb base patterns, (2×2) base patterns, ring patterns, and Archimidean patterns. As discussed below, in some embodiments, a complex periodic pattern can have certain openings with one diameter and other openings with a smaller diameter. As referred to herein, a nonperiodic pattern is a pattern that has no translational symmetry over a unit cell that has a length that is at least 50 times the peak wavelength of light generated by region 130. Examples of nonperiodic patterns include aperiodic patterns, quasicrystalline patterns, Robinson patterns, and Amman patterns.
  • FIG. 9 shows numerical calculations for LED 100 for two different complex periodic patterns in which certain openings in the patterns have a particular diameter, and other openings in the patterns have smaller diameters. The numerical calculations represented in FIG. 9 show the behavior of the extraction efficiency (larger holes with a diameter of 80 nm) as the diameter of the smaller holes (dR) is varied from zero nm to 95 nm. The data shown in FIG. 7 are calculated using the parameters given for the LED 100 shown in FIG. 2 except that the diameter of the openings is changed according the filling factor value given on the x-axis of the graph. Without wishing to be bound by theory, multiple hole sizes allow scattering from multiple periodicities within the pattern, therefore increasing the angular acceptance- and spectral effectiveness of the pattern. The enhancement in light extraction, the methodology for conducting the corresponding numerical calculation, and the physical explanation of the enhanced light extraction for a light-emitting device having the pattern shown in FIG. 9 is generally the same as described above.
  • FIG. 20 shows numerical calculations for LED 100 having different ring patterns (complex periodic patterns). The number of holes in the first ring surrounding the central hole is different (six, eight or 10) for the different ring patterns. The data shown in FIG. 10 are calculated using the parameters given for the LED 100 shown in FIG. 2, except that the emitted light has a peak wavelength of 450 nm. The numerical calculations represented in FIG. 10 show the extraction efficiency of LED 100 as the number of ring patterns per unit cell that is repeated across a unit cell is varied from two to four. The enhancement in light extraction, the methodology for conducting the corresponding numerical calculation, and the physical explanation of the enhanced light extraction for a light-emitting device having the pattern shown in FIG. 10 is generally the same as described above.
  • FIG. 11 shows numerical calculations for LED 100 having an Archimidean pattern. The Archimedean pattern A7 consists of hexagonal unit cells 230 of 7 equally-spaced holes with a nearest neighbor distance of a. Within a unit cell 230, six holes are arranged in the shape of a regular hexagon and the seventh hole is located at the center of the hexagon. The hexagonal unit cells 230 then fit together along their edges with a center-to-center spacing between the unit cells of a′=a*(1+√{square root over (3)}) to pattern the entire surface of the LED. This is known as an A7 tiling, because 7 holes make up the unit cell. Similarly, the Archimidean tiling A119 consists of 19 equally-spaced holes with a NND of a. The holes are arranged in the form of an inner hexagon of seven holes, and outer hexagon of 12 holes, and a central hole within the inner hexagon. The hexagonal unit cells 230 then fit together along their edges with a center-to-center spacing between the unit cells of a′=a*(3+√{right arrow over (3)}) to pattern the entire surface of the LED. The enhancement in light extraction, the methodology for conducting the corresponding numerical calculation, and the physical explanation of the enhanced light extraction for a light-emitting device having the pattern shown in FIG. 11 is generally the same as described above. As shown in FIG. 11 the extraction efficiency for A7 and A19 is about 77%. The data shown in FIG. 11 are calculated using the parameters given for the LED 100 shown in FIG. 2, except that the emitted light has a peak wavelength of 450 and except that the NND is defined as the distance between openings within an individual cell.
  • FIG. 12 shows numerical calculation data for LED 100 having a quasicrystalline pattern. Quasicrystalline patterns are described, for example, in M. Senechal, Quasicrystals and Geometry (Cambridge University Press, Cambridge, England 1996), which is hereby incorporated by reference. The numerical calculations show the behavior of the extraction efficiency as the class of 8-fold based quasi-periodic structure is varied. It is believed that quasicrystalline patterns exhibit high extraction efficiency due to high degree of in-plane rotational symmetries allowed by such structures. The enhancement in light extraction, the methodology for conducting the corresponding numerical calculation, and the physical explanation of the enhanced light extraction for a light-emitting device having the pattern shown in FIG. 12 is generally the same as described above. Results from FDTD calculations shown in FIG. 12 indicate that the extraction efficiency of quasicrystalline structures reaches about 82%. The data shown in FIG. 12 are calculated using the parameters given for the LED 100 shown in FIG. 2, except that the emitted light has a peak wavelength of 450 and except that the NND is defined as the distance between openings within an individual cell.
  • While certain examples of patterns have been described herein, it is believed that other patterns can also enhance the light extraction from LED 100 if the patterns satisfy the basic principles discussed above. For example, it is believed that adding detuning to quasicrystalline or complex periodic structures can increase extraction efficiency.
  • In some embodiments, at least about 45% (e.g., at least about 50%, at least about 55%, at least about 60%, at least about 70%, at least about 80%, at least about 90%, at least about 95%) of the total amount of light generated by light-generating region 130 that emerges from LED 100 emerges via surface 110.
  • In certain embodiments, the cross-sectional area of LED 100 can be relatively large, while still exhibiting efficient light extraction from LED 100. For example, one or more edges of LED 100 can be at least about one millimeter (e.g., at least about 1.5 millimeters, at least about two millimeters, at least about 2.5 millimeters, at least about three millimeters), and at least about 45% (e.g., at least about 50%, at least about 55%, at least about 60%, at least about 70%, at least about 80%, at least about 90%, at least about 95%) of the total amount of light generated by light-generating region 130 that emerges from LED 100 emerges via surface 110. This can allow for an LED to have a relatively large cross-section (e.g., at least about one millimeter by at least about one millimeter) while exhibiting good power conversion efficiency.
  • In some embodiments, the extraction efficiency of an LED having the design of LED 100 is substantially independent of the length of the edge of the LED. For example, the difference between the extraction efficiency of an LED having the design of LED 100 and one or more edges having a length of about 0.25 millimeter and the extraction efficiency of LED having the design of LED 100 and one or more edges having a length of one millimeter can vary by less than about 10% (e.g., less than about 8%, less than about 5%, less than about 3%). As referred to herein, the extraction efficiency of an LED is the ratio of the light emitted by the LED to the amount of light generated by the device (which can be measured in terms of energy or photons). This can allow for an LED to have a relatively large cross-section (e.g., at least about one millimeter by at least about one millimeter) while exhibiting good power conversion efficiency.
  • In certain embodiments, the quantum efficiency of an LED having the design of LED 100 is substantially independent of the length of the edge of the LED. For example, the difference between the quantum efficiency of an LED having the design of LED 100 and one or more edges having a length of about 0.25 millimeter and the quantum efficiency of LED having the design of LED 100 and one or more edges having a length of one millimeter can vary by less than about 10% (e.g., less than about 8%, less than about 5%, less than about 3%). As referred to herein, the quantum efficiency of an LED is the ratio of the number of photons generated by the LED to the number of electron-hole recombinations that occur in the LED. This can allow for an LED to have a relatively large cross-section (e.g., at least about one millimeter by at least about one millimeter) while exhibiting good performance.
  • In some embodiments, the wall plug efficiency of an LED having the design of LED 100 is substantially independent of the length of the edge of the LED. For example, the difference between the wall plug efficiency of an LED having the design of LED 100 and one or more edges having a length of about 0.25 millimeter and the wall plug efficiency of LED having the design of LED 100 and one or more edges having a length of one millimeter can vary by less than about 10% (e.g., less than about 8%, less than about 5%, less than about 3%). As referred to herein, the wall plug efficiency of an LED is the product of the injection efficiency of the LED (the ratio of the numbers of carriers injected into the device to the number of carriers that recombine in the light-generating region of the device), the radiative efficiency of the LED (the ratio of electron-hole recombinations that result in a radiative event to the total number of electron-hole recombinations), and the extraction efficiency of the LED (the ratio of photons that are extracted from the LED to the total number of photons created). This can allow for an LED to have a relatively large cross-section (e.g., at least about one millimeter by at least about one millimeter) while exhibiting good performance.
  • In some embodiments, it may be desirable to manipulate the angular distribution of light that emerges from LED 100 via surface 110. To increase extraction efficiency into a given solid angle (e.g., into a solid angle around the direction normal to surface 10) we examine the Fourier transform of the dielectric function that varies spatially according to pattern 150 (as described earlier). FIG. 13 shows the Fourier transform construction for two ideal triangular lattices of different lattice constant. To increase the extraction efficiency, we seek to increase the number of G points within the encapsulant light line and scattering strengths of G points (εG) within the material light line. This would imply increasing the NND so as to achieve the effect depicted in FIG. 6. However, here we are concerned with increasing the extraction efficiency into a solid angle centered around the normal direction. Therefore, we would also like to limit the introduction of higher order G points by reducing the radius of the encapsulant light line, such that the magnitude of G>(ω(ne))/c. We can see that by decreasing the index of refraction of the encapsulant (the bare minimum of which is removing the encapsulant all together) we allow larger NND and therefore increase the number of G points within the material light line that are available to contribute to extraction in the normal direction (Fk=0) while simultaneously avoiding diffraction into higher order (oblique angles) in the encapsulant. The above described trends are depicted in FIG. 14 which shows extraction efficiency into a solid angle (given by the collection half-angle in the diagram). The data shown in FIG. 14 are calculated using the parameters given for the LED 100 shown in FIG. 2, except that the emitted light has a peak wavelength of 530 nm and a bandwidth of 34 nm, the index of refraction of the encapsulant was 1.0, the thickness of the p-doped layer was 160 nm, the light generating layer was 30 nm thick, the NND (a) for the three curves is shown on FIG. 14, and the depth, hole diameter, and n-doped layer thickness scaled with a, as 1.27a, 0.72a, and 1.27a+40 nm, respectively. As the lattice constant is increased, the extraction efficiency at narrow angles increases as well as the overall extraction efficiency into all angles. However, for even larger lattice constant, diffraction into higher order modes in the encapsulant limits the extraction efficiency at narrow angles even though the overall extraction efficiency increases into all angles. For a lattice constant of 460 nm, we calculate greater than 25% extraction efficiency into a collection half-angle of 30°. That is, about half of the extracted light is collected within only about 13.4% of the upper hemisphere of solid angle demonstrating the collimation effect of the pattern. It is believed that any pattern that increases the number of G points within the material light line while limiting the number of G points within the encapsulant light line to only the G points at k=0 can improve the extraction efficiency into a solid angle centered around the normal direction.
  • The approach is especially applicable for reducing the source etendue which is believed to often be proportional to n2, where n is the index of refraction of the surrounding material (e.g., the encapsulant). It is therefore believed that reducing the index of refraction of the encapsulating layer for LED 100 can lead to more collimated emission, a lower source etendue, and therefore to a higher surface brightness (here defined as the total lumens extracted into the etendue of the source). In some embodiments then, using an encapsulant of air will reduce the source etendue while increasing extraction efficiency into a given collection angle centered around the normal direction.
  • In certain embodiments, when light generated by region 130 emerges from LED 100 via surface 110, the distribution of light is more collimated than a lambertian distribution. For example, in some embodiments, when light generated by region 130 emerges from LED 100 via surface 110, at least about 40% (e.g., at least about 50%, at least about 70%, at least about 90%) of the light emerging via the surface of the dielectric layer emerges within at most about 30° (e.g., at most about 25°, at most about 20°, at most about 15°) of an angle normal to surface 110.
  • The ability to extract a relatively high percentage of light from a desired angle alone or coupled with a relatively high light extraction can allow for a relatively high density of LEDs to be prepared on a given wafer. For example, in some embodiments, a wafer has at least about five LEDs (e.g., at least about 25 LEDs, at least about 50 LEDs) per square centimeter.
  • In some embodiments, it may be desirable to modify the wavelength(s) of light that emerge(s) from a packaged LED 100 relative to the wavelength(s) of light generated by light-generating region 130. For example, as shown in FIG. 15, an LED 300 having a layer containing a phosphor material 180 can be disposed on surface 110. The phosphor material can interact with light at the wavelength(s) generated by region 130 to provide light at desired wavelength(s). In some embodiments, it may be desirable for the light that emerges from packaged LED 100 to be substantially white light. In such embodiments, the phosphor material in layer 180 can be formed of, for example, a (Y,Gd)(Al,Ga)G:Ce3+ or “YAG” (yttrium, aluminum, garnet) phosphor. When pumped by blue light emitted from the light-generating region 130, the phosphor material in layer 180 can be activated and emit light (e.g., isotropically) with a broad spectrum centered around yellow wavelengths. A viewer of the total light spectrum emerging from packaged LED 100 sees the yellow phosphor broad emission spectrum and the blue InGaN narrow emission spectrum and typically mixes the two spectra to perceive white.
  • In certain embodiments, layer 180 can be substantially uniformly disposed on surface 110. For example, the distance between the top 151 of pattern 150 and the top 181 of layer 180 can vary by less than about 20% (e.g., less than about 10%, less than about 5%, less than about 2%) across surface 110.
  • In general, the thickness of layer 180 is small compared to the cross-sectional dimensions of surface 130 of LED 100, which are typically about one millimeter (mm) by one mm. Because layer 180 is substantially uniformly deposited on surface 10, the phosphor material in layer 180 can be substantially uniformly pumped by light emerging via surface 110. The phosphor layer 180 is relatively thin compared to the dimensions of the surface 110 of the LED 100, such that light emitted by the light-generating region 130 is converted into lower wavelength light within the phosphor layer 180 approximately uniformly over the entire surface 10 of LED 100. Thus, the relatively thin, uniform phosphor layer 180 produces a uniform spectrum of white light emitted from the LED 100 as a function of position on surface 110.
  • In general, LED 100 can be fabricated as desired. Typically, fabrication of LED 100 involves various deposition, laser processing, lithography, and etching steps.
  • Referring to FIG. 16, a LED wafer 500 containing an LED layer stack of material deposited on a sapphire substrate is readily available and can be purchased from a commercial vendor. On the sapphire substrate 502 are disposed, consecutively, a buffer layer 504, an n-doped Si:GaN layer 506, an AlGaN/GaN heterojunction or superlattice that provides a current spreading layer 508, an InGaN/GaN multi-quantum well light-generating region 510, and a p-doped Mg:GaN layer 512. The commercially available LED wafer is about 2-3 inches in diameter and multiple LED dice can be cut from the wafer to form individual devices after the wafer has been processed. Before dicing the wafer, a number of wafer scale processing steps are used to position the p-doped layer 128 on the same side of the light-generating region 130 as the mirror layer 126.
  • Referring to FIG. 17, a relatively thin nickel layer 520 is deposited (e.g., using electron-beam evaporation) on p-doped layer 512 to form a p-type ohmic contact to p-doped layer 512. A silver layer 522 is deposited (e.g., using electron-beam evaporation) on nickel layer 520. A relatively thick nickel layer 524 is deposited on silver layer 522 (e.g., using electron-beam evaporation). Layer 524 can act as diffusion barrier to reduce the diffusion of contaminants into silver layer 522. A gold layer 526 is deposited on nickel layer 524 (e.g., using resistance evaporation). Wafer 500 is then annealed at a temperature between 400 and 600 degrees Celsius for between 30 and 300 seconds in a nitrogen, oxygen, air, or forming gas to achieve an ohmic contact.
  • Referring to FIG. 18, a submount wafer 600 is prepared by depositing on a p-doped silicon wafer 602, consecutively (e.g., using electron-beam evaporation) an aluminum contact layer 604. A gold layer 608 is deposited (e.g., using thermal evaporation) onto layer 604, and a AuSn bonding layer 610 is deposited (e.g., using thermal evaporation) onto layer 608. Submount wafer 600 is annealed at a temperature between 350 and 500 degrees Celsius for between 30 and 300 seconds in a nitrogen, oxygen, air, or forming gas to achieve an ohmic contact.
  • Wafer 500 and 600 are bonded together by bringing the layer 526 into contact with layer 610 of the submount wafer 600 (e.g., using a thermal-mechanical press) using pressures from 0 to 0.5 MPa and temperatures ranging from 200-400 degrees Celsius. Layer 510 and layer 610 form a eutectic bond. The combined wafer sandwich is cooled and the bonded sandwich is removed from the press.
  • After bonding, substrate 502 is removed from the combined structure by a laser liftoff process. Laser liftoff processes are disclosed, for example, in U.S. Pat. Nos. 6,420,242 and 6,071,795, which are hereby incorporated by reference. In some embodiments, a 248 nm laser beam is shined through substrate 502 to locally heat n-doped Si:GaN layer 506 near its interface with sapphire substrate 502, decomposing a sublayer of n-doped layer 506. The wafer sandwich is then heated to above the melting point of gallium, at which point sapphire substrate 502 is removed from the sandwich by applying a lateral force to it (e.g., using a cotton swab). The exposed GaN surface is then cleaned (e.g., using a hydrochloric acid bath) to remove liquid gallium from the surface. Often, when sapphire substrate 502 is removed from the GaN epitaxial layer stack, strain that was present in the stack (e.g., due to the lattice mismatch between substrate 502 and the stack) is removed from the stack. This can allow the stack to relax from a warped or bowed shape it may have had when bonded to substrate 502, and to assume a relatively flat shape on the exposed surface of n-doped layer 506. The coefficient of thermal expansion is considered when choosing the submount to avoid cracking in the laser liftoff process. In addition, cracking can be reduced during laser-liftoff by substantially overlapping fields in the step and repeat process.
  • Referring to FIG. 19, the exposed surface of n-doped Si:GaN layer 506 is etched back (e.g., using a reactive ion etching process) to achieve a desired thickness for the layer to be used in the final device (FIG. 20). After etching, the surface of the etched GaN layer 506 has a roughened surface texture 700 due to the etching. Roughened surface 700 can be planarized and thinned (e.g., using a chemical-mechanical process) to achieve a final thickness for layer 506 and surface smoothness of less than about 5 nm root mean square (rms). Alternatively, roughened surface 700 can be maintained in order to aid in increasing the extraction efficiency of the device by introducing a locally non-planar interface to the device 100. The roughened surface increases the probability, with respect to a microscopically smooth surface, that a light ray that strikes surface 700 multiple times will eventually strike the surface at an angle that less than the critical angle given by Snell's law and will be extracted through the surface 700.
  • After etching, to prepare a dielectric function pattern in the n-doped layer 506, first a planarization layer 702 of a material (e.g., a polymer) is disposed (e.g., using spin-coating) onto n-doped GaN layer 506 and a resist layer 704 is disposed (e.g., spin-coated) onto planarization layer 702. The pattern that forms the photonic lattice in the LED is then created in n-doped layer 506 by a nanoimprint lithography and etching process. First, a mold that defines a portion of the desired pattern is pressed into the resist layer 704 and stepped across the entire surface of the wafer in a portion-by-portion manner to print the features of the pattern 150 and leaving regions for depositing n-contacts later on in the process flow. Preferably, the surface of n-doped layer 506 is substantially flat during this portion of the process. X-ray lithography or deep ultraviolet lithography, for example, can also be used to create the pattern in resist layer 704. As an alternative to depositing a resist on the wafer and creating a pattern in the resist on the wafer, a predeposited etch mask can be laid down on the surface of layer 506.
  • Patterned layer 704 is used as a mask to transfer the pattern into the planarization layer 702 (e.g., using a reactive-ion etching process). Planarization layer is subsequently used as a mask to transfer the pattern into the n-doped layer 506. Following etching of GaN layer 506, the planarization layer is removed (e.g., using an oxygen-based reactive ion etch).
  • After the pattern has been transferred to n-doped layer 506, a layer of phosphor material can optionally be disposed (e.g., spin-coated) onto the patterned surface of n-doped layer 506. In some embodiments, the phosphor can conformally coat the patterned surface (coat with substantially no voids present along the bottoms and sidewalls of the openings in the patterned surface). Alternatively, a layer of encapsulant material can be disposed on the surface of patterned n-doped layer 506 (e.g. by CVD, sputtering, suspension by liquid binder that is subsequently evaporated). In some embodiments, the encapsulant can contain one or more phosphor materials. In some embodiments, the phosphor can be compressed to achieve thickness uniformity less that 20%, less than 15%, less than 10%, less than 5%, or less than 2% of the average thickness of the phosphor. In some embodiments, the phosphor-containing encapsulant can conformally coat the patterned surface.
  • After the dielectric function pattern has been created in the n-doped layer 506, individual LED dice can be cut from the wafer. Once wafer processing and wafer testing is complete, individual LED dice are separated and prepared for packaging and testing. A sidewall passivation step and/or a pre-separation deep mesa etching step may be used to reduce potential damage to the electrical and/or optical properties of the patterned LED incurred during wafer cutting. The individual LEDs can be any size up to the size of the wafer itself, but individual LEDs are typically square or rectangular, with sides having a length between about 0.5 mm to 5 mm. To create the dice, standard photolithography is used to define the location of contact pads on the wafer for energizing the device, and ohmic contacts are evaporated (e.g. using electron beam evaporation) onto the desired locations.
  • If an LED die is packaged, the package should generally be capable of facilitating light collection while also providing mechanical and environmental protection of the die. For example, a transparent cover can be packaged on the LED die to protect the patterned surface of the 506 when an encapsulant is not used. The cover slip is attached to supports 142 using a glassy frit that is melted in a furnace. The opposite ends of the supports are connected using a cap weld or an epoxy for example. Supports are typically Ni-plated to facilitate welding to an Au plated surface of the package. It believed that the absence of an encapsulant layer allows higher tolerable power loads per unit area in the patterned surface LED 100. Degradation of the encapsulant can be a common failure mechanism for standard LEDs and is avoided not using an encapsulant layer.
  • Because the LEDs are cut from a large area flat wafer, their light output per area does not decrease with area. Also, because the cross section of an individual LEDs cut from a wafer is only slightly larger than the light-emitting surface area of the LED, many individual, and separately addressable LEDs can be packed closely together in an array. If one LED does not function (e.g., due to a large defect), then it does not significant diminish the performance of the array because the individual devices are closely packed.
  • While certain embodiments have been described, other embodiments are possible.
  • As an example, while certain thickness for a light-emitting device and associated layers are discussed above, other thicknesses are also possible. In general, the light-emitting device can have any desired thickness, and the individual layers within the light-emitting device can have any desired thickness. Typically, the thicknesses of the layers within multi-layer stack 122 are chosen so as to increase the spatial overlap of the optical modes with light-generating region 130, to increase the output from light generated in region 130. Exemplary thicknesses for certain layers in a light-emitting device include the following. In some embodiments, layer 134 can have a thickness of at least about 100 nm (e.g., at least about 200 nm, at least about 300 nm, at least about 400 nm, at least about 500 nm) and/or at most about 10 microns (e.g., at most about five microns, at most about three microns, at most about one micron). In certain embodiments, layer 128 has a thickness of at least about 10 nm (e.g., at least about 25 nm, at least about 40 nm) and/or at most about one micron (e.g., at most about 500 nm, at most about 100 nm). In some embodiments, layer 126 has a thickness of at least about 10 nm (e.g., at least about 50 nm, at least about 100 nm) and/or at most about one micron (e.g., at most about 500 nm, at most about 250 nm). In certain embodiments, light-generating region 130 has a thickness of at least about 10 nm (e.g., at least about 25 nm, at least about 50 nm, at least about 100 nm) and/or at most about 500 nm (e.g., at most about 250 nm, at most about 150 nm).
  • As an example, while a light-emitting diode has been described, other light-emitting devices having the above-described features (e.g., patterns, processes) can be used. Such light-emitting devices include lasers and optical amplifiers.
  • As another example, while current spreading layer 132 has been described as a separate layer from n-doped layer 134, in some embodiments, a current spreading layer can be integral with (e.g., a portion of) layer 134. In such embodiments, the current spreading layer can be a relatively highly n-doped portion of layer 134 or a heterojunction between (e.g. AlGaN/GaN) to form a 2D electron gas.
  • As a further example, while certain semiconductor materials have been described, other semiconductor materials can also be used. In general, any semiconductor materials (e.g., III-V semiconductor materials, organic semiconductor materials, silicon) can be used that can be used in a light-emitting device. Examples of other light-generating materials include InGaAsP, AlInGaN, AlGaAs, InGaAIP. Organic light-emitting materials include small molecules such as aluminum tris-8-hydroxyquinoline (Alq3) and conjugated polymers such as poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-vinylenephenylene] or MEH-PPV.
  • As an additional example, while large area LEDs have been described, the LEDs can also be small area LEDs (e.g., LEDs smaller than the standard about 300 microns on edge).
  • As another example, while a dielectric function that varies spatially according to a pattern has been described in which the pattern is formed of holes, the pattern can also be formed in other ways. For example, a pattern can be formed continuous veins and/or discontinuous veins in the appropriate layer. Further, the pattern in varying dielectric function can be achieved without using holes or veins. For example, materials having different dielectric functions can be patterned in the appropriate layer. Combinations of such patterns can also be used.
  • As a further example, while layer 126 has been described as being formed of silver, other materials can also be used. In some embodiments, layer 126 is formed of a material that can reflect at least about 50% of light generated by the light-generating region that impinges on the layer of reflective material, the layer of reflective material being between the support and the multi-layer stack of materials. Examples of such materials include distributed Bragg reflector stacks and various metals and alloys, such as aluminum and aluminum-containing alloys.
  • As another example, support 120 can be formed of a variety of materials. Examples of materials from which support 120 can be formed include copper, copper-tungsten, aluminum nitride, silicon carbide, beryllium-oxide, diamonds, TEC and aluminum.
  • As an additional example, while layer 126 has been described as being formed of a heat sink material, in some embodiments, a light-emitting device can include a separate layer (e.g., disposed between layer 126 and submount 120) that serves as a heat sink. In such embodiments, layer 126 may or may not be formed of a material that can serve as a heat sink.
  • As a further example, while the varying pattern in dielectric function has been described as extending into n-doped layer 134 only (which can substantially reduce the likelihood of surface recombination carrier losses) in addition to making use of the entire light-generating region, in some embodiments, the varying pattern in dielectric function can extend beyond n-doped layer (e.g., into current spreading layer 132, light-generating region 130, and/or p-doped layer 128).
  • As another example, while embodiments have been described in which air can be disposed between surface 110 can cover slip 140, in some embodiments materials other than, or in an addition to, air can be disposed between surface 110 and cover slip 140. Generally, such materials have an index of refraction of at least about one and less than about 1.5 (e.g., less than about 1.4, less than about 1.3, less than about 1.2, less than about 1.1). Examples of such materials include nitrogen, air, or some higher thermal conductivity gas. In such embodiments, surface 110 may or may not be patterned. For example, surface 110 may be non-patterned but may be roughened (i.e., having randomly distributed features of various sizes and shapes less than λ/5).
  • In some embodiments, a light-emitting device can include a layer of a phosphor material coated on surface 110, cover layer 140 and supports 142.
  • In certain embodiments, a light-emitting device can include a cover layer 140 that has a phosphor material disposed therein. In such embodiments, surface 110 may or may not be patterned.
  • In an alternative implementation, the light emitted by the light-generating region 130 is UV (or violet, or blue) and the phosphor layer 180 includes a mixture of a red phosphor material (e.g., L2O2S:Eu3+), a green phosphor material (e.g, ZnS:Cu,Al,Mn), and blue phosphor material (e.g, (Sr,Ca,Ba,Mg)10(PO4)6Cl:Eu2+).
  • Other embodiments are in the claims.

Claims (1)

1. A light-emitting system including a light-emitting device that comprises:
a multi-layer stack of materials including a light-generating region and a first layer supported by the light-generating region,
wherein:
a surface of the first layer is configured so that light generated by the light-generating region can emerge from the light-emitting device via the surface of the first layer;
the surface of the first layer has a dielectric function that varies spatially according to a pattern;
the pattern has an ideal lattice constant and a detuning parameter with a value greater than zero; and
the light-emitting device is configured so that, when light generated by the light-generating region emerges from the light-emitting device via the surface of the first layer, the light can emerge from the light-emitting system.
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US10/724,005 US7083993B2 (en) 2003-04-15 2003-11-26 Methods of making multi-layer light emitting devices
US10/723,987 US7211831B2 (en) 2003-04-15 2003-11-26 Light emitting device with patterned surfaces
US10/724,033 US7262550B2 (en) 2003-04-15 2003-11-26 Light emitting diode utilizing a physical pattern
US10/724,029 US7098589B2 (en) 2003-04-15 2003-11-26 Light emitting devices with high light collimation
US10/724,006 US7084434B2 (en) 2003-04-15 2003-11-26 Uniform color phosphor-coated light-emitting diode
US10/724,015 US7521854B2 (en) 2003-04-15 2003-11-26 Patterned light emitting devices and extraction efficiencies related to the same
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US10/724,015 Continuation-In-Part US7521854B2 (en) 2003-04-15 2003-11-26 Patterned light emitting devices and extraction efficiencies related to the same
US10/724,033 Continuation-In-Part US7262550B2 (en) 2003-04-15 2003-11-26 Light emitting diode utilizing a physical pattern
US10/724,029 Continuation-In-Part US7098589B2 (en) 2003-04-15 2003-11-26 Light emitting devices with high light collimation
US10/724,005 Continuation-In-Part US7083993B2 (en) 2003-04-15 2003-11-26 Methods of making multi-layer light emitting devices
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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8648932B2 (en) 2009-08-13 2014-02-11 Olive Medical Corporation System, apparatus and methods for providing a single use imaging device for sterile environments
US8952312B2 (en) 2011-05-12 2015-02-10 Olive Medical Corporation Image sensor for endoscopic use
US8972714B2 (en) 2010-03-25 2015-03-03 Olive Medical Corporation System and method for providing a single use imaging device for medical applications
US9462234B2 (en) 2012-07-26 2016-10-04 DePuy Synthes Products, Inc. Camera system with minimal area monolithic CMOS image sensor
US10517469B2 (en) 2013-03-15 2019-12-31 DePuy Synthes Products, Inc. Image sensor synchronization without input clock and data transmission clock
US10750933B2 (en) 2013-03-15 2020-08-25 DePuy Synthes Products, Inc. Minimize image sensor I/O and conductor counts in endoscope applications

Families Citing this family (57)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7521854B2 (en) * 2003-04-15 2009-04-21 Luminus Devices, Inc. Patterned light emitting devices and extraction efficiencies related to the same
US7105861B2 (en) * 2003-04-15 2006-09-12 Luminus Devices, Inc. Electronic device contact structures
US7074631B2 (en) * 2003-04-15 2006-07-11 Luminus Devices, Inc. Light emitting device methods
US7667238B2 (en) * 2003-04-15 2010-02-23 Luminus Devices, Inc. Light emitting devices for liquid crystal displays
US7262550B2 (en) * 2003-04-15 2007-08-28 Luminus Devices, Inc. Light emitting diode utilizing a physical pattern
US20040259279A1 (en) * 2003-04-15 2004-12-23 Erchak Alexei A. Light emitting device methods
US7083993B2 (en) * 2003-04-15 2006-08-01 Luminus Devices, Inc. Methods of making multi-layer light emitting devices
US7098589B2 (en) * 2003-04-15 2006-08-29 Luminus Devices, Inc. Light emitting devices with high light collimation
US7211831B2 (en) * 2003-04-15 2007-05-01 Luminus Devices, Inc. Light emitting device with patterned surfaces
US7274043B2 (en) * 2003-04-15 2007-09-25 Luminus Devices, Inc. Light emitting diode systems
US6831302B2 (en) * 2003-04-15 2004-12-14 Luminus Devices, Inc. Light emitting devices with improved extraction efficiency
US7084434B2 (en) * 2003-04-15 2006-08-01 Luminus Devices, Inc. Uniform color phosphor-coated light-emitting diode
EP1658642B1 (en) * 2003-08-28 2014-02-26 Panasonic Corporation Semiconductor light emitting device, light emitting module, lighting apparatus, display element and manufacturing method of semiconductor light emitting device
US7344903B2 (en) * 2003-09-17 2008-03-18 Luminus Devices, Inc. Light emitting device processes
US7012279B2 (en) * 2003-10-21 2006-03-14 Lumileds Lighting U.S., Llc Photonic crystal light emitting device
US7450311B2 (en) * 2003-12-12 2008-11-11 Luminus Devices, Inc. Optical display systems and methods
US7397067B2 (en) * 2003-12-31 2008-07-08 Intel Corporation Microdisplay packaging system
US20050205883A1 (en) * 2004-03-19 2005-09-22 Wierer Jonathan J Jr Photonic crystal light emitting device
TWI319914B (en) * 2004-04-02 2010-01-21 Led and backlight system adapting the led
US7345298B2 (en) * 2005-02-28 2008-03-18 The Regents Of The University Of California Horizontal emitting, vertical emitting, beam shaped, distributed feedback (DFB) lasers by growth over a patterned substrate
US20070267646A1 (en) * 2004-06-03 2007-11-22 Philips Lumileds Lighting Company, Llc Light Emitting Device Including a Photonic Crystal and a Luminescent Ceramic
US20090023239A1 (en) * 2004-07-22 2009-01-22 Luminus Devices, Inc. Light emitting device processes
US7442964B2 (en) * 2004-08-04 2008-10-28 Philips Lumileds Lighting Company, Llc Photonic crystal light emitting device with multiple lattices
US20060038188A1 (en) 2004-08-20 2006-02-23 Erchak Alexei A Light emitting diode systems
US20060043400A1 (en) * 2004-08-31 2006-03-02 Erchak Alexei A Polarized light emitting device
US7352006B2 (en) * 2004-09-28 2008-04-01 Goldeneye, Inc. Light emitting diodes exhibiting both high reflectivity and high light extraction
WO2006042050A2 (en) * 2004-10-08 2006-04-20 B/E Aerospace, Inc. Dimmable reading light with emergency lighting capability
US7692207B2 (en) * 2005-01-21 2010-04-06 Luminus Devices, Inc. Packaging designs for LEDs
US7170100B2 (en) 2005-01-21 2007-01-30 Luminus Devices, Inc. Packaging designs for LEDs
US20070045640A1 (en) 2005-08-23 2007-03-01 Erchak Alexei A Light emitting devices for liquid crystal displays
US20060204865A1 (en) * 2005-03-08 2006-09-14 Luminus Devices, Inc. Patterned light-emitting devices
US8163575B2 (en) 2005-06-17 2012-04-24 Philips Lumileds Lighting Company Llc Grown photonic crystals in semiconductor light emitting devices
US20080099777A1 (en) * 2005-10-19 2008-05-01 Luminus Devices, Inc. Light-emitting devices and related systems
US20080025037A1 (en) * 2006-07-28 2008-01-31 Visteon Global Technologies, Inc. LED headlamp
US8362603B2 (en) * 2006-09-14 2013-01-29 Luminus Devices, Inc. Flexible circuit light-emitting structures
US8110838B2 (en) * 2006-12-08 2012-02-07 Luminus Devices, Inc. Spatial localization of light-generating portions in LEDs
US8110425B2 (en) 2007-03-20 2012-02-07 Luminus Devices, Inc. Laser liftoff structure and related methods
WO2009075753A2 (en) * 2007-12-06 2009-06-18 Paul Panaccione Chip-scale packaged light-emitting devices
US20100038670A1 (en) * 2008-08-18 2010-02-18 Luminus Devices, Inc. Illumination assembly including chip-scale packaged light-emitting device
WO2010036364A1 (en) * 2008-09-24 2010-04-01 Luminus Devices, Inc. Light-emitting device including independently electrically addressable sections
WO2010044888A1 (en) * 2008-10-17 2010-04-22 Luminus Devices, Inc. Remote lighting assemblies and methods
CN102596641A (en) * 2009-10-01 2012-07-18 发光装置公司 Arrays of light emitting devices
US20110121726A1 (en) * 2009-11-23 2011-05-26 Luminus Devices, Inc. Solid-state lamp
US10290788B2 (en) * 2009-11-24 2019-05-14 Luminus Devices, Inc. Systems and methods for managing heat from an LED
KR101039880B1 (en) 2010-04-28 2011-06-09 엘지이노텍 주식회사 Light emitting device, method for fabricating the same and light emitting device package
US8872217B2 (en) 2011-04-15 2014-10-28 Luminus Devices, Inc. Electronic device contact structures
TWI664752B (en) 2011-06-28 2019-07-01 魯米納斯設備公司 Light-emitting diode architectures for enhanced performance
WO2013022129A1 (en) * 2011-08-09 2013-02-14 삼성전자주식회사 Nitride semiconductor light-emitting element
JP5854383B2 (en) * 2012-01-31 2016-02-09 国立大学法人京都大学 2D photonic crystal
US9496458B2 (en) * 2012-06-08 2016-11-15 Cree, Inc. Semiconductor light emitting diodes with crack-tolerant barrier structures and methods of fabricating the same
JP6493773B2 (en) * 2015-08-31 2019-04-03 パナソニックIpマネジメント株式会社 Light emitting device
CN108968976B (en) 2017-05-31 2022-09-13 心脏起搏器股份公司 Implantable medical device with chemical sensor
WO2019023093A1 (en) 2017-07-26 2019-01-31 Cardiac Pacemakers, Inc. Systems and methods for disambiguation of posture
CN109381195B (en) 2017-08-10 2023-01-10 心脏起搏器股份公司 Systems and methods including electrolyte sensor fusion
CN109419515B (en) 2017-08-23 2023-03-24 心脏起搏器股份公司 Implantable chemical sensor with staged activation
CN109864746B (en) 2017-12-01 2023-09-29 心脏起搏器股份公司 Multimode analyte sensor for medical devices
CN109864747B (en) 2017-12-05 2023-08-25 心脏起搏器股份公司 Multimode analyte sensor optoelectronic interface

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5779924A (en) * 1996-03-22 1998-07-14 Hewlett-Packard Company Ordered interface texturing for a light emitting device

Family Cites Families (96)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3293513A (en) * 1962-08-08 1966-12-20 Texas Instruments Inc Semiconductor radiant diode
US3922706A (en) * 1965-07-31 1975-11-25 Telefunken Patent Transistor having emitter with high circumference-surface area ratio
US4864370A (en) * 1987-11-16 1989-09-05 Motorola, Inc. Electrical contact for an LED
US5126231A (en) * 1990-02-26 1992-06-30 Applied Materials, Inc. Process for multi-layer photoresist etching with minimal feature undercut and unchanging photoresist load during etch
JPH0442582A (en) * 1990-06-08 1992-02-13 Eastman Kodak Japan Kk Light emitting diode array
US5073041A (en) * 1990-11-13 1991-12-17 Bell Communications Research, Inc. Integrated assembly comprising vertical cavity surface-emitting laser array with Fresnel microlenses
JPH04264781A (en) * 1991-02-20 1992-09-21 Eastman Kodak Japan Kk Light-emitting diode array
US5359345A (en) * 1992-08-05 1994-10-25 Cree Research, Inc. Shuttered and cycled light emitting diode display and method of producing the same
US5724062A (en) * 1992-08-05 1998-03-03 Cree Research, Inc. High resolution, high brightness light emitting diode display and method and producing the same
US5363009A (en) * 1992-08-10 1994-11-08 Mark Monto Incandescent light with parallel grooves encompassing a bulbous portion
WO1994005948A1 (en) * 1992-09-09 1994-03-17 Massachusetts Institute Of Technology Replicated-in-place internal viscous shear damper for machine structures and components
DE69405427T2 (en) * 1993-03-04 1998-04-02 At & T Corp Device with focusing surface-emitting semiconductor laser
TW253999B (en) * 1993-06-30 1995-08-11 Hitachi Cable
US5600483A (en) * 1994-05-10 1997-02-04 Massachusetts Institute Of Technology Three-dimensional periodic dielectric structures having photonic bandgaps
US5631190A (en) * 1994-10-07 1997-05-20 Cree Research, Inc. Method for producing high efficiency light-emitting diodes and resulting diode structures
US5633527A (en) * 1995-02-06 1997-05-27 Sandia Corporation Unitary lens semiconductor device
US5814839A (en) * 1995-02-16 1998-09-29 Sharp Kabushiki Kaisha Semiconductor light-emitting device having a current adjusting layer and a uneven shape light emitting region, and method for producing same
DE19629920B4 (en) * 1995-08-10 2006-02-02 LumiLeds Lighting, U.S., LLC, San Jose Light-emitting diode with a non-absorbing distributed Bragg reflector
EP1341009B1 (en) * 1996-09-24 2006-04-19 Seiko Epson Corporation Illumination device and display device using it
DE19640594B4 (en) * 1996-10-01 2016-08-04 Osram Gmbh module
US5834331A (en) * 1996-10-17 1998-11-10 Northwestern University Method for making III-Nitride laser and detection device
US5955749A (en) * 1996-12-02 1999-09-21 Massachusetts Institute Of Technology Light emitting device utilizing a periodic dielectric structure
FR2758890B1 (en) * 1997-01-29 1999-02-26 Thomson Multimedia Sa OPTICAL POLARIZATION DEVICE
US6388264B1 (en) * 1997-03-28 2002-05-14 Benedict G Pace Optocoupler package being hermetically sealed
GB9710062D0 (en) * 1997-05-16 1997-07-09 British Tech Group Optical devices and methods of fabrication thereof
US6784463B2 (en) * 1997-06-03 2004-08-31 Lumileds Lighting U.S., Llc III-Phospide and III-Arsenide flip chip light-emitting devices
US6690268B2 (en) * 2000-03-02 2004-02-10 Donnelly Corporation Video mirror systems incorporating an accessory module
US6071795A (en) * 1998-01-23 2000-06-06 The Regents Of The University Of California Separation of thin films from transparent substrates by selective optical processing
US6265820B1 (en) * 1998-01-29 2001-07-24 Emagin Corporation Heat removal system for use in organic light emitting diode displays having high brightness
US6091085A (en) * 1998-02-19 2000-07-18 Agilent Technologies, Inc. GaN LEDs with improved output coupling efficiency
JPH11251629A (en) * 1998-02-27 1999-09-17 Daido Steel Co Ltd Manufacture of semiconductor light-emitting device
JP5019664B2 (en) * 1998-07-28 2012-09-05 アイメック Devices that emit light with high efficiency and methods for manufacturing such devices
US6504180B1 (en) * 1998-07-28 2003-01-07 Imec Vzw And Vrije Universiteit Method of manufacturing surface textured high-efficiency radiating devices and devices obtained therefrom
US6291085B1 (en) * 1998-08-03 2001-09-18 The Curators Of The University Of Missouri Zinc oxide films containing P-type dopant and process for preparing same
US6335548B1 (en) * 1999-03-15 2002-01-01 Gentex Corporation Semiconductor radiation emitter package
US6169294B1 (en) * 1998-09-08 2001-01-02 Epistar Co. Inverted light emitting diode
JP3525061B2 (en) * 1998-09-25 2004-05-10 株式会社東芝 Method for manufacturing semiconductor light emitting device
US6307218B1 (en) * 1998-11-20 2001-10-23 Lumileds Lighting, U.S., Llc Electrode structures for light emitting devices
US6222207B1 (en) * 1999-05-24 2001-04-24 Lumileds Lighting, U.S. Llc Diffusion barrier for increased mirror reflectivity in reflective solderable contacts on high power LED chip
TW437104B (en) * 1999-05-25 2001-05-28 Wang Tien Yang Semiconductor light-emitting device and method for manufacturing the same
US6122103A (en) * 1999-06-22 2000-09-19 Moxtech Broadband wire grid polarizer for the visible spectrum
US6288840B1 (en) * 1999-06-22 2001-09-11 Moxtek Imbedded wire grid polarizer for the visible spectrum
US6803603B1 (en) * 1999-06-23 2004-10-12 Kabushiki Kaisha Toshiba Semiconductor light-emitting element
US6534798B1 (en) * 1999-09-08 2003-03-18 California Institute Of Technology Surface plasmon enhanced light emitting diode and method of operation for the same
US6287882B1 (en) * 1999-10-04 2001-09-11 Visual Photonics Epitaxy Co., Ltd. Light emitting diode with a metal-coated reflective permanent substrate and the method for manufacturing the same
US6614056B1 (en) * 1999-12-01 2003-09-02 Cree Lighting Company Scalable led with improved current spreading structures
US6657236B1 (en) * 1999-12-03 2003-12-02 Cree Lighting Company Enhanced light extraction in LEDs through the use of internal and external optical elements
US6410942B1 (en) * 1999-12-03 2002-06-25 Cree Lighting Company Enhanced light extraction through the use of micro-LED arrays
US6573537B1 (en) * 1999-12-22 2003-06-03 Lumileds Lighting, U.S., Llc Highly reflective ohmic contacts to III-nitride flip-chip LEDs
US6277665B1 (en) 2000-01-10 2001-08-21 United Epitaxy Company, Ltd. Fabrication process of semiconductor light-emitting device with enhanced external quantum efficiency
JP4643794B2 (en) * 2000-04-21 2011-03-02 富士通株式会社 Semiconductor light emitting device
US6853663B2 (en) * 2000-06-02 2005-02-08 Agilent Technologies, Inc. Efficiency GaN-based light emitting devices
JP4024994B2 (en) * 2000-06-30 2007-12-19 株式会社東芝 Semiconductor light emitting device
US20020085390A1 (en) * 2000-07-14 2002-07-04 Hironobu Kiyomoto Optical device and apparatus employing the same
TW456058B (en) 2000-08-10 2001-09-21 United Epitaxy Co Ltd Light emitting diode and the manufacturing method thereof
US6998281B2 (en) * 2000-10-12 2006-02-14 General Electric Company Solid state lighting device with reduced form factor including LED with directional emission and package with microoptics
TW579608B (en) * 2000-11-24 2004-03-11 High Link Technology Corp Method and structure of forming electrode for light emitting device
JP5110744B2 (en) * 2000-12-21 2012-12-26 フィリップス ルミレッズ ライティング カンパニー リミテッド ライアビリティ カンパニー Light emitting device and manufacturing method thereof
US6703780B2 (en) * 2001-01-16 2004-03-09 General Electric Company Organic electroluminescent device with a ceramic output coupler and method of making the same
US6794684B2 (en) * 2001-02-01 2004-09-21 Cree, Inc. Reflective ohmic contacts for silicon carbide including a layer consisting essentially of nickel, methods of fabricating same, and light emitting devices including the same
US6791119B2 (en) * 2001-02-01 2004-09-14 Cree, Inc. Light emitting diodes including modifications for light extraction
AU2002303112A1 (en) 2001-03-06 2002-09-19 Michael G. Brown Led lead for improved light extraction
US6522063B2 (en) * 2001-03-28 2003-02-18 Epitech Corporation Light emitting diode
FR2824228B1 (en) * 2001-04-26 2003-08-01 Centre Nat Rech Scient ELECTROLUMINESCENT DEVICE WITH LIGHT EXTRACTOR
US6574383B1 (en) * 2001-04-30 2003-06-03 Massachusetts Institute Of Technology Input light coupler using a pattern of dielectric contrast distributed in at least two dimensions
US6709929B2 (en) * 2001-06-25 2004-03-23 North Carolina State University Methods of forming nano-scale electronic and optoelectronic devices using non-photolithographically defined nano-channel templates
US6740906B2 (en) * 2001-07-23 2004-05-25 Cree, Inc. Light emitting diodes including modifications for submount bonding
DE10147887C2 (en) * 2001-09-28 2003-10-23 Osram Opto Semiconductors Gmbh Radiation-emitting semiconductor component with a contact, which comprises a plurality of spaced-apart contact points
DE10158754A1 (en) * 2001-11-30 2003-06-18 Osram Opto Semiconductors Gmbh Light emitting semiconductor component, uses conductive adhesive material for joining semiconductor body electrically and thermally to carrier
US6744071B2 (en) * 2002-01-28 2004-06-01 Nichia Corporation Nitride semiconductor element with a supporting substrate
US7279718B2 (en) * 2002-01-28 2007-10-09 Philips Lumileds Lighting Company, Llc LED including photonic crystal structure
US6869820B2 (en) * 2002-01-30 2005-03-22 United Epitaxy Co., Ltd. High efficiency light emitting diode and method of making the same
US6849558B2 (en) * 2002-05-22 2005-02-01 The Board Of Trustees Of The Leland Stanford Junior University Replication and transfer of microstructures and nanostructures
US20030222263A1 (en) * 2002-06-04 2003-12-04 Kopin Corporation High-efficiency light-emitting diodes
US6649437B1 (en) * 2002-08-20 2003-11-18 United Epitaxy Company, Ltd. Method of manufacturing high-power light emitting diodes
TW541732B (en) * 2002-08-28 2003-07-11 Arima Optoelectronics Corp Manufacturing method of LED having transparent substrate
US6762069B2 (en) * 2002-11-19 2004-07-13 United Epitaxy Company, Ltd. Method for manufacturing light-emitting element on non-transparent substrate
US7750059B2 (en) * 2002-12-04 2010-07-06 Hewlett-Packard Development Company, L.P. Polymer solution for nanoimprint lithography to reduce imprint temperature and pressure
US7141828B2 (en) * 2003-03-19 2006-11-28 Gelcore, Llc Flip-chip light emitting diode with a thermally stable multiple layer reflective p-type contact
US7262550B2 (en) * 2003-04-15 2007-08-28 Luminus Devices, Inc. Light emitting diode utilizing a physical pattern
US7083993B2 (en) * 2003-04-15 2006-08-01 Luminus Devices, Inc. Methods of making multi-layer light emitting devices
US7211831B2 (en) * 2003-04-15 2007-05-01 Luminus Devices, Inc. Light emitting device with patterned surfaces
US7521854B2 (en) * 2003-04-15 2009-04-21 Luminus Devices, Inc. Patterned light emitting devices and extraction efficiencies related to the same
US7274043B2 (en) * 2003-04-15 2007-09-25 Luminus Devices, Inc. Light emitting diode systems
US20040259279A1 (en) * 2003-04-15 2004-12-23 Erchak Alexei A. Light emitting device methods
US6831302B2 (en) * 2003-04-15 2004-12-14 Luminus Devices, Inc. Light emitting devices with improved extraction efficiency
US7098589B2 (en) * 2003-04-15 2006-08-29 Luminus Devices, Inc. Light emitting devices with high light collimation
US7084434B2 (en) * 2003-04-15 2006-08-01 Luminus Devices, Inc. Uniform color phosphor-coated light-emitting diode
US7074631B2 (en) * 2003-04-15 2006-07-11 Luminus Devices, Inc. Light emitting device methods
US7105861B2 (en) * 2003-04-15 2006-09-12 Luminus Devices, Inc. Electronic device contact structures
TWI240434B (en) 2003-06-24 2005-09-21 Osram Opto Semiconductors Gmbh Method to produce semiconductor-chips
US6847057B1 (en) 2003-08-01 2005-01-25 Lumileds Lighting U.S., Llc Semiconductor light emitting devices
US7341880B2 (en) * 2003-09-17 2008-03-11 Luminus Devices, Inc. Light emitting device processes
US7344903B2 (en) * 2003-09-17 2008-03-18 Luminus Devices, Inc. Light emitting device processes
US7012279B2 (en) 2003-10-21 2006-03-14 Lumileds Lighting U.S., Llc Photonic crystal light emitting device
US7450311B2 (en) * 2003-12-12 2008-11-11 Luminus Devices, Inc. Optical display systems and methods

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5779924A (en) * 1996-03-22 1998-07-14 Hewlett-Packard Company Ordered interface texturing for a light emitting device

Cited By (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8648932B2 (en) 2009-08-13 2014-02-11 Olive Medical Corporation System, apparatus and methods for providing a single use imaging device for sterile environments
US11601622B2 (en) 2010-03-25 2023-03-07 DePuy Synthes Products, Inc. System and method for providing a single use imaging device for medical applications
US12047714B2 (en) 2010-03-25 2024-07-23 DePuy Synthes Products, Inc. Systems, methods and devices for providing illumination in an endoscopic imaging environment
US8972714B2 (en) 2010-03-25 2015-03-03 Olive Medical Corporation System and method for providing a single use imaging device for medical applications
US10874292B2 (en) 2010-03-25 2020-12-29 DePuy Synthes Products, Inc. System and method for providing a single use imaging device for medical applications
US10413165B2 (en) 2010-03-25 2019-09-17 DePuy Synthes Products, Inc. System and method for providing a single use imaging device for medical applications
US9622650B2 (en) 2011-05-12 2017-04-18 DePuy Synthes Products, Inc. System and method for sub-column parallel digitizers for hybrid stacked image sensor using vertical interconnects
US10709319B2 (en) 2011-05-12 2020-07-14 DePuy Synthes Products, Inc. System and method for sub-column parallel digitizers for hybrid stacked image sensor using vertical interconnects
US9763566B2 (en) 2011-05-12 2017-09-19 DePuy Synthes Products, Inc. Pixel array area optimization using stacking scheme for hybrid image sensor with minimal vertical interconnects
US9907459B2 (en) 2011-05-12 2018-03-06 DePuy Synthes Products, Inc. Image sensor with tolerance optimizing interconnects
US9980633B2 (en) 2011-05-12 2018-05-29 DePuy Synthes Products, Inc. Image sensor for endoscopic use
US11432715B2 (en) 2011-05-12 2022-09-06 DePuy Synthes Products, Inc. System and method for sub-column parallel digitizers for hybrid stacked image sensor using vertical interconnects
US9343489B2 (en) 2011-05-12 2016-05-17 DePuy Synthes Products, Inc. Image sensor for endoscopic use
US12100716B2 (en) 2011-05-12 2024-09-24 DePuy Synthes Products, Inc. Image sensor with tolerance optimizing interconnects
US10517471B2 (en) 2011-05-12 2019-12-31 DePuy Synthes Products, Inc. Pixel array area optimization using stacking scheme for hybrid image sensor with minimal vertical interconnects
US10537234B2 (en) 2011-05-12 2020-01-21 DePuy Synthes Products, Inc. Image sensor with tolerance optimizing interconnects
US11682682B2 (en) 2011-05-12 2023-06-20 DePuy Synthes Products, Inc. Pixel array area optimization using stacking scheme for hybrid image sensor with minimal vertical interconnects
US11179029B2 (en) 2011-05-12 2021-11-23 DePuy Synthes Products, Inc. Image sensor with tolerance optimizing interconnects
US9153609B2 (en) 2011-05-12 2015-10-06 Olive Medical Corporation Image sensor with tolerance optimizing interconnects
US10863894B2 (en) 2011-05-12 2020-12-15 DePuy Synthes Products, Inc. System and method for sub-column parallel digitizers for hybrid stacked image sensor using vertical interconnects
US9123602B2 (en) 2011-05-12 2015-09-01 Olive Medical Corporation Pixel array area optimization using stacking scheme for hybrid image sensor with minimal vertical interconnects
US8952312B2 (en) 2011-05-12 2015-02-10 Olive Medical Corporation Image sensor for endoscopic use
US11848337B2 (en) 2011-05-12 2023-12-19 DePuy Synthes Products, Inc. Image sensor
US11026565B2 (en) 2011-05-12 2021-06-08 DePuy Synthes Products, Inc. Image sensor for endoscopic use
US11109750B2 (en) 2011-05-12 2021-09-07 DePuy Synthes Products, Inc. Pixel array area optimization using stacking scheme for hybrid image sensor with minimal vertical interconnects
US11089192B2 (en) 2012-07-26 2021-08-10 DePuy Synthes Products, Inc. Camera system with minimal area monolithic CMOS image sensor
US9462234B2 (en) 2012-07-26 2016-10-04 DePuy Synthes Products, Inc. Camera system with minimal area monolithic CMOS image sensor
US11766175B2 (en) 2012-07-26 2023-09-26 DePuy Synthes Products, Inc. Camera system with minimal area monolithic CMOS image sensor
US10701254B2 (en) 2012-07-26 2020-06-30 DePuy Synthes Products, Inc. Camera system with minimal area monolithic CMOS image sensor
US10075626B2 (en) 2012-07-26 2018-09-11 DePuy Synthes Products, Inc. Camera system with minimal area monolithic CMOS image sensor
US10750933B2 (en) 2013-03-15 2020-08-25 DePuy Synthes Products, Inc. Minimize image sensor I/O and conductor counts in endoscope applications
US11344189B2 (en) 2013-03-15 2022-05-31 DePuy Synthes Products, Inc. Image sensor synchronization without input clock and data transmission clock
US11253139B2 (en) 2013-03-15 2022-02-22 DePuy Synthes Products, Inc. Minimize image sensor I/O and conductor counts in endoscope applications
US10980406B2 (en) 2013-03-15 2021-04-20 DePuy Synthes Products, Inc. Image sensor synchronization without input clock and data transmission clock
US11903564B2 (en) 2013-03-15 2024-02-20 DePuy Synthes Products, Inc. Image sensor synchronization without input clock and data transmission clock
US10881272B2 (en) 2013-03-15 2021-01-05 DePuy Synthes Products, Inc. Minimize image sensor I/O and conductor counts in endoscope applications
US10517469B2 (en) 2013-03-15 2019-12-31 DePuy Synthes Products, Inc. Image sensor synchronization without input clock and data transmission clock

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