US20040190566A1 - Method of characterising a tuneable laser - Google Patents
Method of characterising a tuneable laser Download PDFInfo
- Publication number
- US20040190566A1 US20040190566A1 US10/795,798 US79579804A US2004190566A1 US 20040190566 A1 US20040190566 A1 US 20040190566A1 US 79579804 A US79579804 A US 79579804A US 2004190566 A1 US2004190566 A1 US 2004190566A1
- Authority
- US
- United States
- Prior art keywords
- laser
- recited
- light
- frequency
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000000034 method Methods 0.000 title claims abstract description 17
- 230000003287 optical effect Effects 0.000 claims description 8
- 230000001105 regulatory effect Effects 0.000 claims description 7
- 239000004065 semiconductor Substances 0.000 claims description 4
- 230000001276 controlling effect Effects 0.000 claims description 3
- 230000001419 dependent effect Effects 0.000 claims 3
- 239000004020 conductor Substances 0.000 description 12
- 230000000694 effects Effects 0.000 description 4
- 230000006870 function Effects 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 230000001629 suppression Effects 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000013507 mapping Methods 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
- H01S5/0687—Stabilising the frequency of the laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/0014—Measuring characteristics or properties thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/062—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
- H01S5/0625—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes in multi-section lasers
- H01S5/06255—Controlling the frequency of the radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/062—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
- H01S5/0625—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes in multi-section lasers
- H01S5/06255—Controlling the frequency of the radiation
- H01S5/06256—Controlling the frequency of the radiation with DBR-structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
- H01S5/06832—Stabilising during amplitude modulation
Definitions
- the present invention relates to a method of enabling a tuneable laser to be characterized quickly.
- the method can be applied for evaluating and selecting lasers with respect to emitted wavelength and to find good operation points systematically.
- Tuneable semiconductor lasers have a number of different sections through which current is injected, typically three or four such sections.
- the wavelength, power and mode purity of the lasers can be controlled by adjusting the current injected into the various sections.
- Mode purity implies that the laser is at an operation point, i.e., at a distance from a combination of the drive currents where so-called mode jumps take place, and where lasering is stable and side mode suppression is high.
- the laser In the case of telecommunications applications, it is necessary that the laser is able to retain its wavelength to a very high degree of accuracy and over very long periods of time, after having set the drive currents and the temperature.
- a typical accuracy in this respect is 0.1 nanometer and a typical time period is 20 years.
- Mapping of the behavior of a laser is normally effected by connecting the laser to different measuring instruments and then varying the drive currents systematically.
- Such instruments are normally power meters, optical spectrum analyzers for measuring wavelength and sidemode suppression, and line width measuring devices. This laser measuring process enables all of these parameters to be fully mapped as a function of all different drive currents.
- the wavelength of the emitted light is determined mainly by the current or voltage across the tuning sections.
- the power emitted is controlled by current to the gain section of the laser or by the voltage across said section.
- the present invention solves this problem and provides a method of quickly sorting away control combinations that do not result in correct wavelengths.
- the present invention also relates to a method of evaluating a tuneable laser and determining suitable laser operation points for a laser that includes two or more tuneable sections, in which injected current can be varied and of which at least one is a reflector section and one is a phase section.
- the method includes leading part of the light emitted by the laser to an arrangement that includes a Fabry-Perot filter and a first and a second detector, said detectors being adapted to measure the 0 power of the light and to deliver a corresponding detector signal.
- the detectors are arranged relative to the Fabry-Perot filter such that the data signals will contain information relating at least to the wavelength of the detected light.
- the currents are swept through the tuning sections so as to pass through different current combinations, and the ratio between the two detector signals during said sweeps is measured.
- the reflector current in the inner sweep variable is swept in one direction and then in the opposite direction back to its start value.
- the control combination for the tuning currents is stored when the ratio between the detector signals lies within a predetermined range that indicates that the light emitted lies within one of a number of wavelengths given by the Fabry-Perot filter, and when the ratio lies within said predetermined range for a given reflector current in both sweep directions of said current.
- FIG. 1 is a perspective, partially cut-away view of a DBR laser
- FIG. 2 is a sectional view of a tuneable Grating Coupled Sampled Reflector (GCSR) laser
- FIG. 3 is a sectional view of a Sampled Grating DBR laser.
- FIG. 4 is a schematic block diagram illustrating an arrangement which is used in accordance with the invention.
- FIG. 1 Shown in FIG. 1 is a DBR laser which includes three sections, namely a Bragg reflector 1 , a phase section 2 and a gain section 3 . Each section is controlled by injecting current into respective sections through respective electric conductors 4 , 5 , 6 .
- FIG. 2 is a sectional view of a tuneable Grating Coupled Sampled Reflector (GCSR) laser.
- GCSR Grating Coupled Sampled Reflector
- Such a laser includes four sections, i.e., a Bragg reflector 7 , a phase section 8 , a coupler 9 and a gain section 10 . Each of the sections is controlled by injecting current into the respective sections.
- FIG. 3 is a sectional view of a Sampled Grating DBR laser that also includes four sections 11 , 12 , 13 , 14 , of which sections 11 and 14 are Bragg reflectors, section 13 is the phase section, and section 12 is the gain section.
- the present invention relates to a method of evaluating tuneable lasers and determining suitable laser operation points.
- the laser may thus contain two or more tuneable sections in which injected current can be varied in a known manner.
- the laser is of the kind which includes at least one reflector section and one phase section.
- FIG. 4 is a block diagram which illustrates an arrangement used in accordance with the present invention.
- the reference numeral 15 identifies a GCSR laser
- the reference numeral 16 identifies current generators for injecting current into the reflector section, the phase section and the coupler section respectively of said laser, through respective conductors 17 , 18 and 19 .
- the power of the laser is controlled to its gain section by means of a power regulating circuit 20 , via a conductor 21 .
- the laser emits light from the front mirror to a light conductor 23 , for instance a light-conducting fiber, via a lens pack 22 .
- This light conductor leads the light to a light splitter or divider 26 which switches part of the light to another light conductor 24 .
- the remainder of the light is led further in the light conductor 25 .
- the light splitter 26 switches, e.g., 10%, of the light from the conductor 23 to the conductor 24 .
- the light conductor 24 leads the light to a second light splitter or divider 27 , which functions to divide the light equally between two light conductors 28 , 29 .
- a lens 30 and a lens 31 are disposed at respective ends of the light conductors.
- a Fabry-Perot filter 32 is provided in the beam path downstream of the lens 30 .
- the filter 32 is well known and will not therefore be described in more detail in this document.
- Fabry-Perot filters can be designed to exhibit a certain light transmission solely for certain wavelengths, normally wavelengths that are multiples of a given wavelength.
- the Fabry-Perot filter exhibits a deviating lower or higher transmission at other wavelengths.
- a first detector 33 is provided downstream of the lens 31 , and a second detector 34 is provided downstream of the Fabry-Perot filter.
- the detectors 33 , 34 function to measure the power of the light and to deliver a corresponding detector signal to an A/D converter 37 , via a respective amplifier 35 , 36 .
- the A/D converter 37 , the power regulating circuit 20 and the current generators 16 are all connected to a microprocessor 39 via a data bus 38 .
- the microprocessor is adapted to control the current generators and the power regulating circuit in a desired and a well known manner, in response to the signals from the A/D converter 37 and the power regulating circuit 20 .
- part of the forwardly emitted light is thus conducted to the first detector 33 and also to the second detector 34 , via the Fabry-Perot filter 32 .
- the currents are swept through the tuning sections 18 , 19 , 21 such as to pass through different current combinations.
- the ratio between the two detector signals I 1 and I 2 is measured during said sweeps.
- the reflector current is the inner sweep variable. It is meant by this that the reflector current is swept for different combinations of other tuning currents while holding said other currents constant.
- the reflector current is swept first in one direction and then in the opposite direction, back to its start value. For instance, the reflector current is swept from a zero value and up to its maximum value and then down to zero again.
- current control in the present document is meant that the current through the sections is controlled by current generators or, alternatively, by controlling the voltage across the sections.
- the first detector 33 , the second detector 34 and the Fabry-Perot filter 32 are placed in the proximity of the front mirror of the laser.
- the components may equally as well be placed in the proximity of the rear mirror of the laser, in which case light emitted from the rear mirror of said laser is used to determine the wavelength.
- the Fabry-Perot filter and the first and the second detector may be arranged relative to one another in a manner different from that shown in FIG. 4, so as to detect at least wavelengths.
- the first and the second detector may be arranged to measure light transmitted through the Fabry-Perot filter and/or light reflected towards the Fabry-Perot filter, such as to detect wavelengths.
- the hysteresis effect exhibited by lasers causes the power output of the laser in respect of certain reflector currents, with otherwise constant conditions, to be different due to the reflector current having taken its existing value by virtue of the reflector current having increased to said value or having decreased from a higher value.
- the wavelength is also influenced by the hysteresis effect.
- Such operation points as those which lie in the regions of hysteresis with respect to the reflector current, or with respect to other tuning currents for those sections that exhibit hysteresis, are non-preferred operation points for a laser in operation.
- Communication lasers are adapted to operate at certain given wavelengths that are included in a so-called channel plane, where each channel corresponds to a well defined wavelength.
- the Fabry-Perot filter 32 is adapted to have a certain given transmission for each wavelength included in the channel plane.
- the control combination for the tuning currents is stored, in accordance with the invention.
- one or more other tuneable currents to sections that exhibit a hysteresis effect, excluding the reflector current, are swept so as to determine whether or not hysteresis occurs at a contemplated operation point.
- the signal 12 is delivered from the first detector 33 to the power regulating circuit 20 .
- the regulating circuit is adapted to control the laser so that said laser will emit light at a constant power. This enables the ratio I 1 /I 2 to be followed very easily in determining possible operation points.
- a monitor diode 40 is placed on the side of the laser opposite to that side on which the first and the second detectors are placed, said monitor diode being caused to measure the light emitted by the laser.
- the detected light measurement signal is led through an amplifier 41 to an A/D converter 42 , whose output signal is delivered to the microprocessor 39 .
- one or more of the tuneable currents is chosen so as to minimize the ratio between the power of the rearwardly emitted light and the power of the forwardly emitted light, thereby enabling an optimum operation point for a channel to be selected from said possible operation points.
- the monitor diode 40 is placed adjacent the rear mirror of the laser in the FIG. 4 embodiment.
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Semiconductor Lasers (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Lasers (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
A method of evaluating a tuneable laser and determining suitable laser operation points. Part of the light emitted by the laser is led to a Fabry-Perot filter and to a pair of light detectors to measure the power of the laser and deliver a corresponding output signal representative of the wavelength of the detected light. Injected currents are swept through the laser tuning sections to pass through different current combinations, and the ratio between the detector signals is measured during the sweep of the reflector current in both directions. The control combination for the tuning currents is stored when the ratio between the detector output signals lies within a predetermined range, signifying that the emitted light lies within one of a number of wavelengths given by the Fabry-Perot filter, and the ratio lies within the predetermined range for a given reflector current in both sweep directions of the reflector current.
Description
- 1. Field of the Invention
- The present invention relates to a method of enabling a tuneable laser to be characterized quickly.
- The method can be applied for evaluating and selecting lasers with respect to emitted wavelength and to find good operation points systematically.
- 2. Description of the Related Art
- Tuneable semiconductor lasers have a number of different sections through which current is injected, typically three or four such sections. The wavelength, power and mode purity of the lasers can be controlled by adjusting the current injected into the various sections. Mode purity implies that the laser is at an operation point, i.e., at a distance from a combination of the drive currents where so-called mode jumps take place, and where lasering is stable and side mode suppression is high.
- In the case of telecommunications applications, it is necessary that the laser is able to retain its wavelength to a very high degree of accuracy and over very long periods of time, after having set the drive currents and the temperature. A typical accuracy in this respect is 0.1 nanometer and a typical time period is 20 years.
- In order to be able to control the laser, it is necessary to map the behavior of the laser as a function of the various drive currents. This is necessary prior to using the laser after its manufacture.
- Mapping of the behavior of a laser is normally effected by connecting the laser to different measuring instruments and then varying the drive currents systematically. Such instruments are normally power meters, optical spectrum analyzers for measuring wavelength and sidemode suppression, and line width measuring devices. This laser measuring process enables all of these parameters to be fully mapped as a function of all different drive currents.
- One problem is that lasers exhibit hysteresis. As a result of the hysteresis, the laser will deliver different output signals in the form of power and wavelength in respect of a given drive current set-up, i.e., with respect to a given operation point, depending on the path through which the laser has passed with respect to the change in said drive currents, in order to arrive at the working point in question. Thus, this means that a given drive current set-up will not unequivocally give the expected wavelength or power.
- In the case of a tuneable laser, the wavelength of the emitted light is determined mainly by the current or voltage across the tuning sections. The power emitted is controlled by current to the gain section of the laser or by the voltage across said section.
- When characterizing a laser, all of the possible control combinations afforded by the tuning sections, or a subset of said sections, are investigated. During the characterizing process, the emitted light is studied with respect to wavelength and sidemode suppression and controlling the gain section with regard to power adjustment.
- The enormous number of possible control combinations, typically tens of billions, of which fewer than a hundred will be selected, makes total mapping of the laser impossible in view of the large amount of data generated.
- The present invention solves this problem and provides a method of quickly sorting away control combinations that do not result in correct wavelengths.
- The present invention also relates to a method of evaluating a tuneable laser and determining suitable laser operation points for a laser that includes two or more tuneable sections, in which injected current can be varied and of which at least one is a reflector section and one is a phase section. The method includes leading part of the light emitted by the laser to an arrangement that includes a Fabry-Perot filter and a first and a second detector, said detectors being adapted to measure the0power of the light and to deliver a corresponding detector signal. The detectors are arranged relative to the Fabry-Perot filter such that the data signals will contain information relating at least to the wavelength of the detected light. The currents are swept through the tuning sections so as to pass through different current combinations, and the ratio between the two detector signals during said sweeps is measured. The reflector current in the inner sweep variable is swept in one direction and then in the opposite direction back to its start value. The control combination for the tuning currents is stored when the ratio between the detector signals lies within a predetermined range that indicates that the light emitted lies within one of a number of wavelengths given by the Fabry-Perot filter, and when the ratio lies within said predetermined range for a given reflector current in both sweep directions of said current.
- The invention will now be described in more detail with reference to exemplifying embodiments thereof and also with reference to the accompanying drawings, in which
- FIG. 1 is a perspective, partially cut-away view of a DBR laser;
- FIG. 2 is a sectional view of a tuneable Grating Coupled Sampled Reflector (GCSR) laser;
- FIG. 3 is a sectional view of a Sampled Grating DBR laser; and
- FIG. 4 is a schematic block diagram illustrating an arrangement which is used in accordance with the invention.
- Shown in FIG. 1 is a DBR laser which includes three sections, namely a Bragg
reflector 1, aphase section 2 and again section 3. Each section is controlled by injecting current into respective sections through respectiveelectric conductors - FIG. 2 is a sectional view of a tuneable Grating Coupled Sampled Reflector (GCSR) laser. Such a laser includes four sections, i.e., a Bragg
reflector 7, aphase section 8, acoupler 9 and again section 10. Each of the sections is controlled by injecting current into the respective sections. - FIG. 3 is a sectional view of a Sampled Grating DBR laser that also includes four
sections sections section 13 is the phase section, andsection 12 is the gain section. - These three laser types are common, although other types of lasers exist.
- Although the invention is described below essentially with reference to a GCSR laser according to FIG. 2, it will be understood that the invention is not restricted to any particular type of tuneable semiconductor laser, but can be applied correspondingly with tuneable lasers other than those illustrated by way of example in the drawings.
- The present invention relates to a method of evaluating tuneable lasers and determining suitable laser operation points. The laser may thus contain two or more tuneable sections in which injected current can be varied in a known manner. The laser is of the kind which includes at least one reflector section and one phase section.
- FIG. 4 is a block diagram which illustrates an arrangement used in accordance with the present invention. The
reference numeral 15 identifies a GCSR laser, while thereference numeral 16 identifies current generators for injecting current into the reflector section, the phase section and the coupler section respectively of said laser, throughrespective conductors circuit 20, via aconductor 21. - The laser emits light from the front mirror to a
light conductor 23, for instance a light-conducting fiber, via alens pack 22. This light conductor leads the light to a light splitter or divider 26 which switches part of the light to anotherlight conductor 24. The remainder of the light is led further in thelight conductor 25. The light splitter 26 switches, e.g., 10%, of the light from theconductor 23 to theconductor 24. - The
light conductor 24 leads the light to a second light splitter or divider 27, which functions to divide the light equally between twolight conductors lens 30 and alens 31 are disposed at respective ends of the light conductors. A Fabry-Perot filter 32 is provided in the beam path downstream of thelens 30. Thefilter 32 is well known and will not therefore be described in more detail in this document. Fabry-Perot filters can be designed to exhibit a certain light transmission solely for certain wavelengths, normally wavelengths that are multiples of a given wavelength. The Fabry-Perot filter exhibits a deviating lower or higher transmission at other wavelengths. - A
first detector 33 is provided downstream of thelens 31, and asecond detector 34 is provided downstream of the Fabry-Perot filter. Thedetectors D converter 37, via arespective amplifier - The A/
D converter 37, thepower regulating circuit 20 and thecurrent generators 16 are all connected to amicroprocessor 39 via adata bus 38. The microprocessor is adapted to control the current generators and the power regulating circuit in a desired and a well known manner, in response to the signals from the A/D converter 37 and thepower regulating circuit 20. - According to the invention, part of the forwardly emitted light is thus conducted to the
first detector 33 and also to thesecond detector 34, via the Fabry-Perot filter 32. - According to the invention, the currents are swept through the tuning
sections - When sweeping the currents through the tuning sections, the reflector current is the inner sweep variable. It is meant by this that the reflector current is swept for different combinations of other tuning currents while holding said other currents constant. The reflector current is swept first in one direction and then in the opposite direction, back to its start value. For instance, the reflector current is swept from a zero value and up to its maximum value and then down to zero again.
- By current control in the present document is meant that the current through the sections is controlled by current generators or, alternatively, by controlling the voltage across the sections.
- In the case of the FIG. 4 embodiment, the
first detector 33, thesecond detector 34 and the Fabry-Perot filter 32 are placed in the proximity of the front mirror of the laser. Alternatively, the components may equally as well be placed in the proximity of the rear mirror of the laser, in which case light emitted from the rear mirror of said laser is used to determine the wavelength. - The Fabry-Perot filter and the first and the second detector may be arranged relative to one another in a manner different from that shown in FIG. 4, so as to detect at least wavelengths. The first and the second detector may be arranged to measure light transmitted through the Fabry-Perot filter and/or light reflected towards the Fabry-Perot filter, such as to detect wavelengths.
- The hysteresis effect exhibited by lasers causes the power output of the laser in respect of certain reflector currents, with otherwise constant conditions, to be different due to the reflector current having taken its existing value by virtue of the reflector current having increased to said value or having decreased from a higher value. The wavelength is also influenced by the hysteresis effect. Such operation points as those which lie in the regions of hysteresis with respect to the reflector current, or with respect to other tuning currents for those sections that exhibit hysteresis, are non-preferred operation points for a laser in operation.
- Communication lasers are adapted to operate at certain given wavelengths that are included in a so-called channel plane, where each channel corresponds to a well defined wavelength. According to the invention, the Fabry-
Perot filter 32 is adapted to have a certain given transmission for each wavelength included in the channel plane. - When the ratio between the detector signals I1/I2 from the
detectors - This range is given by the permitted channel width in the channel plane.
- These control combinations thus fulfill the criteria that will give desired wavelengths and not result in any hysteresis effect.
- In certain cases it is preferred that one or more other tuneable currents to sections that exhibit a hysteresis effect, excluding the reflector current, are swept so as to determine whether or not hysteresis occurs at a contemplated operation point.
- According to one preferred embodiment, the
signal 12 is delivered from thefirst detector 33 to thepower regulating circuit 20. The regulating circuit is adapted to control the laser so that said laser will emit light at a constant power. This enables the ratio I1/I2 to be followed very easily in determining possible operation points. - According to another preferred embodiment of the invention, a
monitor diode 40 is placed on the side of the laser opposite to that side on which the first and the second detectors are placed, said monitor diode being caused to measure the light emitted by the laser. The detected light measurement signal is led through anamplifier 41 to an A/D converter 42, whose output signal is delivered to themicroprocessor 39. In this embodiment, one or more of the tuneable currents is chosen so as to minimize the ratio between the power of the rearwardly emitted light and the power of the forwardly emitted light, thereby enabling an optimum operation point for a channel to be selected from said possible operation points. - The
monitor diode 40 is placed adjacent the rear mirror of the laser in the FIG. 4 embodiment. - It is highly preferred with a number of the possible operation points taken out to measure the wavelength emitted by the laser until an operation point has been obtained with each desired wavelength, wherewith the control combination for each operation point is stored. Thus, one control combination for each channel in the channel plane will be stored in the memory of the microprocessor.
- It will be evident from the foregoing that the use of a Fabry-Perot filter enables all those control combinations that do not fulfil the criterion that the ratio between the currents I1/I2 shall lie within a certain given range to be sorted out. Moreover, it is sufficient for communications purposes to identify one control combination for each wavelength in the channel plane that lies in a region in which the laser exhibits no hysteresis.
- The present invention thus solves the problem mentioned in the introduction.
- Although different embodiments have been described, and therewith in respect of a GCSR laser, it will be obvious that the structural design of the described arrangement can be varied while achieving the same result. The invention can also be applied to lasers of a type other than GCSR lasers.
- It will therefore be understood that the present invention is not restricted to the aforedescribed and illustrated exemplifying embodiments thereof and that variations can be made within the scope of the following claims.
Claims (17)
1-6. (canceled)
7. A tunable laser system, comprising:
a semiconductor laser having at least three laser sections, the at least three laser sections being individually addressable with respective control currents, the at least three laser sections comprising a gain section and at least two tuning sections, the at least two tuning sections comprising at least a phase section and a first reflector section; and
a laser control unit coupled to apply respective control currents to the at least three laser sections, the current control unit storing information describing different combinations of the respective control currents, the different combinations of the respective control currents being associated with different operation points of the laser.
8. The laser system as recited in claim 7 , wherein the at least two tuning sections further comprise a second reflector section.
9. The laser system as recited in claim 7 , wherein the at least two tuning sections further comprise a coupler section.
10. The laser system as recited in claim 7 , wherein the laser control unit comprises a current generator unit that supplies the control currents applied to the at least two tuning sections.
11. The laser system as recited in claim 7 , further comprising a power detector optically coupled to receive an optical output from the laser, and wherein the laser control unit further comprises a power regulating unit adapted to direct a current to the gain section so as to emit light at constant power.
12. The laser system as recited in claim 7 , further comprising a frequency-sensitive detector unit coupled to the control unit, the frequency sensitive detector unit optically coupled to receive light output from the laser and coupled to provide a frequency signal to the laser control unit, frequency signal being indicative of the frequency of the light output from the laser.
13. The laser system as recited in claim 12 , wherein the frequency sensitive detector unit comprises an optical filter having a frequency-dependent filter characteristic and a light detector disposed to detect an optical signal modulated by the frequency-dependent filter characteristic of the optical filter.
14. The laser system as recited in claim 13 , wherein the optical filter is a Fabry-Perot filter.
15. The laser system as recited in claim 7 , wherein the laser control unit further comprises a microprocessor that controls selection of the different combinations of the respective control currents applied to the laser.
16. A method of operating a semiconductor laser having at least two tuning sections receiving individually addressable control currents, the method comprising:
storing combinations of control currents, each combination of control current being associated with a predetermined laser operating wavelength; and
applying a particular combination of control currents to the laser, the particular combination of control currents applied to the laser being associated with a desired laser operating wavelength.
17. The method as recited in claim 16 , further comprising detecting an optical signal from the laser indicative of power output from the laser and controlling the power output from the laser to be stable based on the detected optical signal.
18. The method as recited in claim 16 , wherein applying the particular control currents to the laser comprises applying a control current to at least a first reflector section and a phase section of the laser.
19. The method as recited in claim 18 , wherein applying the particular control currents to the laser further comprises applying a control current to at least a second reflector section of the laser.
20. The method as recited in claim 18 , wherein applying the particular control currents to the laser further comprises applying a control current to a coupler section of the laser.
21. The method as recited in claim 16 , further comprising passing light from the laser to a frequency-sensitive detector and producing a frequency signal.
22. The laser system as recited in claim 12 , wherein passing the light from the laser to a frequency-sensitive detector comprises passing the light to a filter having a frequency dependent filter characteristic and detecting light modulated by the filter.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/795,798 US20040190566A1 (en) | 1999-02-17 | 2004-03-08 | Method of characterising a tuneable laser |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9900536-5 | 1999-02-17 | ||
SE9900536A SE518827C2 (en) | 1999-02-17 | 1999-02-17 | Method for characterizing a tunable laser |
US09/913,845 US6826206B1 (en) | 1999-02-17 | 2000-02-15 | Method of characterizing a tuneable laser |
US10/795,798 US20040190566A1 (en) | 1999-02-17 | 2004-03-08 | Method of characterising a tuneable laser |
Related Parent Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US09/913,845 Continuation US6826206B1 (en) | 1999-02-17 | 2000-02-15 | Method of characterizing a tuneable laser |
PCT/SE2000/000292 Continuation WO2000054380A1 (en) | 1999-02-17 | 2000-02-15 | A method of characterising a tuneable laser |
Publications (1)
Publication Number | Publication Date |
---|---|
US20040190566A1 true US20040190566A1 (en) | 2004-09-30 |
Family
ID=20414501
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US09/913,845 Expired - Lifetime US6826206B1 (en) | 1999-02-17 | 2000-02-15 | Method of characterizing a tuneable laser |
US10/795,798 Abandoned US20040190566A1 (en) | 1999-02-17 | 2004-03-08 | Method of characterising a tuneable laser |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US09/913,845 Expired - Lifetime US6826206B1 (en) | 1999-02-17 | 2000-02-15 | Method of characterizing a tuneable laser |
Country Status (8)
Country | Link |
---|---|
US (2) | US6826206B1 (en) |
EP (1) | EP1166407A1 (en) |
JP (1) | JP2002542608A (en) |
CN (1) | CN1162946C (en) |
AU (1) | AU3202700A (en) |
CA (1) | CA2360960A1 (en) |
SE (1) | SE518827C2 (en) |
WO (1) | WO2000054380A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2016060933A1 (en) * | 2014-10-15 | 2016-04-21 | Lumentum Operations Llc | Laser system and method of tuning the output power of the laser system |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE518827C2 (en) * | 1999-02-17 | 2002-11-26 | Altitun Ab | Method for characterizing a tunable laser |
US6728279B1 (en) * | 1999-05-17 | 2004-04-27 | Interuniversitair Microelektronica Centrum | Widely wavelength tunable integrated semiconductor device and method for widely tuning semiconductor devices |
SE514187C2 (en) | 1999-07-06 | 2001-01-22 | Altitun Ab | Method and apparatus for equipping a tunable laser |
SE518381C2 (en) | 2000-04-05 | 2002-10-01 | Altitun Ab | Method for frequency and mode stabilization of a tunable laser |
US6937638B2 (en) * | 2000-06-09 | 2005-08-30 | Agility Communications, Inc. | Manufacturable sampled grating mirrors |
GB2380058A (en) * | 2001-09-21 | 2003-03-26 | Marconi Caswell Ltd | Telecommunication laser transmitter systems and methods of operating such systems |
GB2381123B (en) * | 2001-10-17 | 2005-02-23 | Marconi Optical Components Ltd | Tuneable laser |
US20050030990A1 (en) * | 2001-10-30 | 2005-02-10 | O'gorman Neal | Stability factors for tuneable multi-section semiconductor lasers |
IES20020187A2 (en) | 2002-03-11 | 2003-09-17 | Intune Technologies Ltd | Method for optimising the calibration process of a tuneable laser |
GB2394118B (en) * | 2002-10-09 | 2006-02-15 | Tsunami Photonics Ltd | Charcterisation and non-invasive correction of operation control currents of a tuneable laser |
US8308375B2 (en) * | 2006-12-18 | 2012-11-13 | Verizon Patent And Licensing Inc. | Optical signal measurement devices |
US7955002B2 (en) * | 2006-12-18 | 2011-06-07 | Verizon Patent And Licensing Inc. | Optical signal measurement device |
EP2735064A2 (en) * | 2011-07-22 | 2014-05-28 | Insight Photonic Solutions, Inc. | System and method of dynamic and adaptive creation of a wavelength-continuous and prescribed wavelength versus time sweep from a laser |
US9455549B2 (en) | 2011-09-14 | 2016-09-27 | Insight Photonic Solutions, Inc. | System and method for creating and utilizing multivariate paths for ongoing simultaneous multi-dimensional control to attain single mode sweep operation in an electromagnetic radiation source |
US20130070795A1 (en) * | 2011-09-16 | 2013-03-21 | Sumitomo Electric Industries, Ltd. | Method to switch emission wavelength of tunable laser diode |
CN105826811B (en) * | 2016-05-06 | 2020-10-23 | 华中科技大学 | Characterization method and device of tunable laser |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6826206B1 (en) * | 1999-02-17 | 2004-11-30 | Adc Telecommunications, Inc. | Method of characterizing a tuneable laser |
Family Cites Families (50)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4608697A (en) * | 1983-04-11 | 1986-08-26 | At&T Bell Laboratories | Spectral control arrangement for coupled cavity laser |
DE3421851C2 (en) | 1984-06-13 | 1997-12-18 | Sfim Ind Deutschland Gmbh | Method for regulating the wavelength and power of the output radiation of a semiconductor radiation source |
US4680810A (en) | 1985-06-28 | 1987-07-14 | American Telephone And Telegraph Company, At&T Bell Labs | Means for controlling a semiconductor device and communication system comprising the means |
US4792956A (en) * | 1986-05-13 | 1988-12-20 | Litton Systems, Inc. | Laser diode intensity and wavelength control |
US4749277A (en) | 1987-01-20 | 1988-06-07 | Gte Laboratories Incorporated | Methods of and apparatus for measuring the frequency response of optical detectors |
JPH0831653B2 (en) | 1987-07-21 | 1996-03-27 | 国際電信電話株式会社 | Semiconductor laser |
US4896325A (en) * | 1988-08-23 | 1990-01-23 | The Regents Of The University Of California | Multi-section tunable laser with differing multi-element mirrors |
FR2639773B1 (en) * | 1988-11-25 | 1994-05-13 | Alcatel Nv | TUNABLE SEMICONDUCTOR LASER |
US5019769A (en) | 1990-09-14 | 1991-05-28 | Finisar Corporation | Semiconductor laser diode controller and laser diode biasing control method |
JP3067880B2 (en) | 1991-01-12 | 2000-07-24 | キヤノン株式会社 | Photodetector having diffraction grating |
JP2546080B2 (en) | 1991-05-10 | 1996-10-23 | 富士通株式会社 | Semiconductor laser control device |
US5691989A (en) | 1991-07-26 | 1997-11-25 | Accuwave Corporation | Wavelength stabilized laser sources using feedback from volume holograms |
DE69205924T2 (en) | 1991-08-30 | 1996-05-30 | Philips Electronics Nv | Continuously tunable laser oscillator. |
DE69200654T2 (en) | 1991-08-30 | 1995-05-24 | Philips Nv | Tunable laser oscillator. |
US5220578A (en) | 1991-11-01 | 1993-06-15 | At&T Bell Laboratories | Long term mode stabilization for distributed bragg reflector laser |
FR2694423B1 (en) | 1992-07-30 | 1994-12-23 | France Telecom | Device for controlling the output power of laser diodes. |
DE69414740T2 (en) | 1993-03-09 | 1999-04-15 | Tdk Corp., Tokio/Tokyo | Magnetic recording medium |
FR2716303B1 (en) | 1994-02-11 | 1996-04-05 | Franck Delorme | Wavelength tunable distributed Bragg reflector laser with selectively activated virtual diffraction gratings. |
WO1995034927A1 (en) | 1994-06-16 | 1995-12-21 | Komatsu Ltd. | Laser gas controller and charging-discharging device for discharge-excited laser |
CA2153909C (en) | 1994-07-15 | 1999-11-16 | Mitsuhiro Kitamura | Wavelength-tunable semiconductor laser and fabrication process thereof |
JP3846918B2 (en) * | 1994-08-02 | 2006-11-15 | 富士通株式会社 | Optical transmission system, optical multiplex transmission system and related technologies |
US5473625A (en) | 1994-09-26 | 1995-12-05 | At&T Corp. | Tunable distributed Bragg reflector laser for wavelength dithering |
FR2728399B1 (en) | 1994-12-20 | 1997-03-14 | Bouadma Nouredine | LASER COMPONENT WITH BRAGG REFLECTOR IN ORGANIC MATERIAL AND METHOD FOR THE PRODUCTION THEREOF |
US5488503A (en) | 1995-02-09 | 1996-01-30 | Hughes Aircraft Company | Low-power, stabilized, photonic modulator system |
US5602860A (en) | 1995-04-19 | 1997-02-11 | Optelecom, Inc. | Laser thermal control using thermoelectric cooler |
KR0146076B1 (en) | 1995-06-28 | 1998-08-01 | 문정환 | A voltage regulator device for substrate of semiconductor device |
US5835650A (en) * | 1995-11-16 | 1998-11-10 | Matsushita Electric Industrial Co., Ltd. | Optical apparatus and method for producing the same |
JP3583846B2 (en) | 1995-12-26 | 2004-11-04 | 富士通株式会社 | Method and apparatus for driving optical modulator and optical communication system |
US5812572A (en) | 1996-07-01 | 1998-09-22 | Pacific Fiberoptics, Inc. | Intelligent fiberoptic transmitters and methods of operating and manufacturing the same |
SE507376C2 (en) | 1996-09-04 | 1998-05-18 | Ericsson Telefon Ab L M | Wavelength tunable laser device |
US5832014A (en) * | 1997-02-11 | 1998-11-03 | Lucent Technologies Inc. | Wavelength stabilization in tunable semiconductor lasers |
NO307357B1 (en) | 1997-02-14 | 2000-03-20 | Optoplan As | Device for painting optical wavelengths |
JPH11135871A (en) | 1997-10-28 | 1999-05-21 | Nec Corp | Method for activating laser diode and circuit thereof |
US6629638B1 (en) | 1997-12-11 | 2003-10-07 | Ceyx Technologies | Electro-optic system controller and method of operation |
SE519081C3 (en) | 1998-01-21 | 2003-02-19 | Altitun Ab | Method and apparatus for optimizing the laser operating point and device |
US6163555A (en) | 1998-06-12 | 2000-12-19 | Nortel Networks Limited | Regulation of emission frequencies of a set of lasers |
DE19831715A1 (en) | 1998-07-15 | 2000-01-20 | Alcatel Sa | Operating point setting of a diode of a diode network by voltage injection |
US6192058B1 (en) | 1998-09-18 | 2001-02-20 | Sarnoff Corporation | Multiwavelength actively mode-locked external cavity semiconductor laser |
SE519155C2 (en) | 1999-02-17 | 2003-01-21 | Altitun Ab | Method for evaluation of tunable lasers |
SE514188C2 (en) | 1999-02-17 | 2001-01-22 | Altitun Ab | Method for characterizing a tunable laser and determining the current wavelength |
SE515435C2 (en) | 1999-02-17 | 2001-08-06 | Altitun Ab | Method of wavelength locking and mode control of a tunable laser |
US6333263B1 (en) | 1999-04-02 | 2001-12-25 | Advanced Micro Devices, Inc. | Method of reducing stress corrosion induced voiding of patterned metal layers |
US6181717B1 (en) | 1999-06-04 | 2001-01-30 | Bandwidth 9 | Tunable semiconductor laser system |
US6064681A (en) | 1999-06-11 | 2000-05-16 | Lucent Technologies Inc. | Wavelength stabilized, tunable optical transmitter with high SMSR |
SE514187C2 (en) | 1999-07-06 | 2001-01-22 | Altitun Ab | Method and apparatus for equipping a tunable laser |
EP1208367A4 (en) | 1999-08-06 | 2007-03-07 | Cambridge Res & Instrmnt Inc | Spectral imaging system |
US6359915B1 (en) | 1999-09-23 | 2002-03-19 | Agere Systems | Wavelength-stabilized Bragg laser |
SE518158C2 (en) | 2000-04-05 | 2002-09-03 | Altitun Ab | Method for frequency and mode stabilization of a tunable laser with at least three sections |
SE518381C2 (en) | 2000-04-05 | 2002-10-01 | Altitun Ab | Method for frequency and mode stabilization of a tunable laser |
JP2002075855A (en) | 2000-06-14 | 2002-03-15 | Canon Inc | Dead weight compensating device, stage device using the same, exposure system, and method of manufacturing device using the system |
-
1999
- 1999-02-17 SE SE9900536A patent/SE518827C2/en not_active IP Right Cessation
-
2000
- 2000-02-15 AU AU32027/00A patent/AU3202700A/en not_active Abandoned
- 2000-02-15 CN CNB00803883XA patent/CN1162946C/en not_active Expired - Fee Related
- 2000-02-15 US US09/913,845 patent/US6826206B1/en not_active Expired - Lifetime
- 2000-02-15 EP EP00909848A patent/EP1166407A1/en not_active Withdrawn
- 2000-02-15 CA CA002360960A patent/CA2360960A1/en not_active Abandoned
- 2000-02-15 WO PCT/SE2000/000292 patent/WO2000054380A1/en not_active Application Discontinuation
- 2000-02-15 JP JP2000604502A patent/JP2002542608A/en active Pending
-
2004
- 2004-03-08 US US10/795,798 patent/US20040190566A1/en not_active Abandoned
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6826206B1 (en) * | 1999-02-17 | 2004-11-30 | Adc Telecommunications, Inc. | Method of characterizing a tuneable laser |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2016060933A1 (en) * | 2014-10-15 | 2016-04-21 | Lumentum Operations Llc | Laser system and method of tuning the output power of the laser system |
US10305252B2 (en) | 2014-10-15 | 2019-05-28 | Lumentum Operations Llc | Laser system and method of tuning the output power of the laser system |
Also Published As
Publication number | Publication date |
---|---|
WO2000054380A1 (en) | 2000-09-14 |
SE9900536D0 (en) | 1999-02-17 |
CN1162946C (en) | 2004-08-18 |
SE518827C2 (en) | 2002-11-26 |
US6826206B1 (en) | 2004-11-30 |
EP1166407A1 (en) | 2002-01-02 |
AU3202700A (en) | 2000-09-28 |
JP2002542608A (en) | 2002-12-10 |
CN1340230A (en) | 2002-03-13 |
CA2360960A1 (en) | 2000-09-14 |
SE9900536L (en) | 2000-08-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US20040190566A1 (en) | Method of characterising a tuneable laser | |
US6504856B1 (en) | Method and apparatus for optimizing operation points of a tunable laser | |
US5015099A (en) | Differential absorption laser radar gas detection apparatus having tunable wavelength single mode semiconductor laser source | |
EP1624543B1 (en) | Optical module and method for monitoring and controlling wavelength | |
EP1166409B1 (en) | A method of characterising a tuneable laser and determining its actual wavelength | |
US20060239306A1 (en) | Characterization and non-invasive correction of operational control currents of a tuneable laser | |
US7649917B2 (en) | Method and system for continuous sweeping of a tunable laser | |
US6658028B1 (en) | Method of wavelength locking and mode monitoring a tuneable laser | |
US6658033B1 (en) | Method of evaluating tuneable lasers | |
JP4141715B2 (en) | Wavelength control device, wavelength control method, and wavelength tunable semiconductor laser device for wavelength tunable semiconductor laser | |
US7356055B2 (en) | Method and device for regulating the average wavelength of a laser, especially a semiconductor laser | |
US7359648B2 (en) | Wavelength tuning optimization of semiconductor lasers | |
JP2003283043A (en) | Oscillation mode monitoring device and semiconductor laser device | |
EP0483821A2 (en) | A method for controlling a tunable filter and an apparatus therefor | |
JPH0835910A (en) | Dynamic-characteristic measuring apparatus for turnable element | |
IE20030281U1 (en) | Method and apparatus for continuous sweeping of a tunable laser | |
IES83706Y1 (en) | Method and apparatus for continuous sweeping of a tunable laser |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |
|
AS | Assignment |
Owner name: COMMSCOPE TECHNOLOGIES LLC, NORTH CAROLINA Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:COMMSCOPE EMEA LIMITED;REEL/FRAME:037012/0001 Effective date: 20150828 |