TWM571782U - Alignment wafer grinding structure - Google Patents
Alignment wafer grinding structureInfo
- Publication number
- TWM571782U TWM571782U TWM571782U TW M571782 U TWM571782 U TW M571782U TW M571782 U TWM571782 U TW M571782U
- Authority
- TW
- Taiwan
- Prior art keywords
- ring
- wafer polishing
- grinding
- polishing structure
- fixing ring
- Prior art date
Links
- 238000005498 polishing Methods 0.000 claims abstract description 24
- 210000001503 Joints Anatomy 0.000 claims abstract description 3
- 239000007769 metal material Substances 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 2
- 239000000126 substance Substances 0.000 claims description 2
- 230000000694 effects Effects 0.000 abstract description 4
- 239000002184 metal Substances 0.000 description 5
- 229910052755 nonmetal Inorganic materials 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 238000007599 discharging Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006011 modification reaction Methods 0.000 description 1
- 230000000750 progressive Effects 0.000 description 1
- 230000002393 scratching Effects 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
Abstract
一種對位晶圓研磨結構,其包含有一固定環以及一研磨環。該固定環一面上係設有多數固定孔,另一面上係環設有至少二結合部;該研磨環係與固定環結合,且與固定環為不同材質,而該研磨環之一面上係設有多數排水槽,另一面上係環設有與各結合部對接之至少二組接部。藉此,可使固定環與研磨環利用結合部及組接部進行相互結合,而達到穩固組裝、緊密結合以及增加結構強度之功效。A align wafer polishing structure comprising a retaining ring and a grinding ring. The fixing ring has a plurality of fixing holes on one side, and at least two joint portions on the other side of the fixing ring; the grinding ring is combined with the fixing ring and is different from the fixing ring, and the grinding ring is arranged on one side There are a plurality of drainage grooves, and the other side of the ring is provided with at least two sets of joints that abut each joint. Thereby, the fixing ring and the grinding ring can be combined with each other by the joint portion and the joint portion, thereby achieving the effects of stable assembly, tight bonding and increased structural strength.
Description
本創作是有關於一種對位晶圓研磨結構,尤指一種可作為晶圓研磨之使用者。This creation is about a para-wafer grinding structure, especially one that can be used as a wafer grinding user.
一般半導體晶圓於進行研磨時,係利用固定模板將半導體晶圓加以定位,之後再將晶圓抵接於一具有研磨布之承盤上,進而由驅動機構帶動模板產生旋轉而進行研磨,且為使晶圓能有效定位以提高晶片之產生品質,通常需使固定模板之旋轉軸心必須與晶圓中心相互對應,且在旋轉過程中,該晶圓之中心必保持準確之定位,但是以前述習用之方式進行晶圓研磨時,並無法使晶圓中心穩固定位。 故,便有相關業者研發出一種定位環結構,而該定位環係由金屬與非金屬兩種不同材質之環狀體所結合而成,當運用時係可讓金屬環狀體與所需之驅動機構定位結合,而非金屬環狀體之內徑則可配合待研磨晶圓外徑,如此,便可於晶圓研磨時使該晶圓之中心必保持準確之定位,藉以改善上述習用之缺失。 然,由於該定位環之金屬環狀體與非金屬環狀體兩者係由黏著或螺接之方式進行結合而成,因此,常會於使用一段時間之後,因長期之加壓、旋轉以及工作液體之影響,而使金屬環狀體與非金屬環狀體之間產生間隙或鬆動,導致結構強度及穩定度變差,更甚者則會造成金屬環狀體與非金屬環狀體有脫離之情形;故,一般習用之晶圓研磨定位環較無法符合實際使用之所需。Generally, when the semiconductor wafer is polished, the semiconductor wafer is positioned by using a fixed template, and then the wafer is abutted on a retainer having a polishing cloth, and then the driving mechanism drives the template to rotate and grind, and In order to enable the wafer to be effectively positioned to improve the quality of the wafer, it is usually necessary to make the rotation axis of the fixed template correspond to the center of the wafer, and the center of the wafer must be accurately positioned during the rotation, but When the wafer polishing is performed in the above-mentioned manner, the center of the wafer cannot be stably fixed. Therefore, some related companies have developed a positioning ring structure, which is made up of a combination of two different materials, metal and non-metal. When used, the metal ring can be used. The positioning of the driving mechanism is combined, and the inner diameter of the non-metallic annular body can match the outer diameter of the wafer to be polished, so that the center of the wafer can be accurately positioned during wafer grinding, thereby improving the above-mentioned conventional use. Missing. However, since the metal ring body and the non-metal ring body of the positioning ring are combined by adhesion or screwing, it is often used for a long period of time, due to long-term pressurization, rotation, and work. The influence of the liquid causes a gap or looseness between the metal ring body and the non-metal ring body, resulting in deterioration of structural strength and stability, and even more, the metal ring body is separated from the non-metal ring body. In this case, the conventional wafer grinding positioning ring is less suitable for practical use.
本創作之主要目的係在於,可使固定環與研磨環利用結合部及組接部進行相互結合,而達到穩固組裝、緊密結合以及增加結構強度之功效。 為達上述之目的,本創作係一種對位晶圓研磨結構包含有:一固定環以及一研磨環。該固定環一面上係設有多數固定孔,另一面上係環設有至少二結合部;該研磨環係與固定環結合,且與固定環為不同材質,而該研磨環之一面上係設有多數排水槽,另一面上係環設有與各結合部對接之至少二組接部。 於上述之對位晶圓研磨結構中,該固定環係為具有較佳剛性之金屬材質。 於上述之對位晶圓研磨結構中,各結合部係分別為凹槽、凸肋或其組合。 於上述之對位晶圓研磨結構中,各結合部之間係設有一凸出部,該凸出部之頂面係具有一粗糙面,而該研磨環之另一面係抵靠於該粗糙面。 於上述之對位晶圓研磨結構中,該研磨環係為高耐磨與耐化學品腐蝕之非金屬材料。 於上述之對位晶圓研磨結構中,各組接部係分別為凸肋、凹槽或其組合。 於上述之對位晶圓研磨結構中,各組接部之間係設有一與凸出部對接之凹陷部,而該凹陷部之底面上係進一步設有與凸出部所設粗糙面抵靠之另一粗糙面。 於上述之對位晶圓研磨結構中,各排水槽係傾斜設置,而各排水槽 之傾斜角度係介於35 。~45 。之間,且以40 。為最佳。 The main purpose of the present invention is to enable the fixing ring and the grinding ring to be combined with each other by using the joint portion and the joint portion, thereby achieving the effects of stable assembly, tight bonding, and increased structural strength. For the above purposes, the present invention relates to a align wafer polishing structure comprising: a fixing ring and a grinding ring. The fixing ring has a plurality of fixing holes on one side, and at least two joint portions on the other side of the fixing ring; the grinding ring is combined with the fixing ring and is different from the fixing ring, and the grinding ring is arranged on one side There are a plurality of drainage grooves, and the other side of the ring is provided with at least two sets of joints that abut each joint. In the above-mentioned alignment wafer polishing structure, the fixing ring is made of a metal material having better rigidity. In the above-mentioned alignment wafer polishing structure, each bonding portion is a groove, a rib, or a combination thereof. In the above-mentioned alignment wafer polishing structure, a protruding portion is disposed between each of the bonding portions, the top surface of the protruding portion has a rough surface, and the other surface of the polishing ring is abutted against the rough surface. . In the above-mentioned alignment wafer polishing structure, the grinding ring is a non-metallic material with high wear resistance and chemical resistance. In the above-mentioned alignment wafer polishing structure, each of the joint portions is a rib, a groove or a combination thereof. In the above-mentioned alignment wafer polishing structure, a recess portion abutting the protruding portion is disposed between each of the connecting portions, and the bottom surface of the concave portion is further provided with a rough surface provided with the protruding portion. Another rough surface. In the above-mentioned alignment wafer polishing structure, each drainage channel is inclined, and the inclination angle of each drainage groove is 35 . ~45 . Between and 40 . For the best.
請參閱『第1、2、3及第4圖』所示,係分別為本創作之外觀示意圖、本創作之分解示意圖、本創之剖面狀態示意圖及本創作第3圖a部分之局部放大示意圖 。如圖所示:本創作係一種對位晶圓研磨結構,其至少包含一固定環1以及一研磨環2所構成。 該固定環1之一面上係設有多數固定孔11,且該固定環1之另一面上係環設有至少二結合部12。 該研磨環2係與固定環1結合,且與固定環1為不同材質,而該研磨環2之一面上係設有多數排水槽21,並該研磨環2之另一面上係環設有與各結合部12對接之至少二組接部22。 當該固定環1與該研磨環2結合時,係可將該固定環1之結合部12與該研磨環2之組接部22相互對接,使該固定環1與該研磨環2達到穩固組裝、緊密結合以及增加結構強度之功效。 當本創作於運用時,係可讓該固定環1以其一面上之各固定孔11配合固定元件與所需之驅動機構定位結合(圖未示),而該研磨環2之內徑則可配合待研磨晶圓外徑,以使該研磨環2套設於晶圓之外緣進行定位(圖未示),而藉由驅動機構之轉動而同時帶動該固定環1與該研磨環2進行研磨,並使研磨時之工作液體及廢粒由該研磨環2一面上之各排水槽21導出。 於本創作之一實施例中,該固定環1係為具有較佳剛性之金屬材質。藉此,可使該固定環1具有較佳之支撐力,以防止該研磨環2變形。 於本創作之一實施例中,該研磨環2係為高耐磨與耐化學品腐蝕之非金屬材料。藉此,可避免於研磨時刮傷晶圓,並可延長該研磨環2之使用壽命。 於本創作之一實施例中,各結合部12係分別為凹槽、凸肋或其組合;而各組接部22係分別為凸肋、凹槽或其組合。藉此,使各結合部12與各組接部22可符合實際組裝之需求。本創作中各結合部12係分別為凹槽,而各組接部22係分別為凸肋,而當該固定環1與該研磨環2結合時,係以為凸肋之各組接部22對接於為凹槽之各結合部12中,使該固定環1與該研磨環2達到穩固組裝、緊密結合以及增加結構強度之功效。 於本創作之一實施例中,各結合部12之間係設有一凸出部13,該凸出部13之頂面係具有一粗糙面14;而各組接部22之間係設有一與凸出部13對接之凹陷部23,而該凹陷部23之底面上係進一步設有另一粗糙面24。當該固定環1之結合部12與該研磨環2之組接部22相互對接時,便同時使該凸出部13嵌接於該凹陷部23中,且使該凸出部13頂面之粗糙面14與該凹陷部23底面之另一粗糙面24相互抵靠,而更穩固進行咬合,使該固定環1與該研磨環2達到穩固組裝、緊密結合以及增加結構強度之功效。 於本創作之一實施例中,各排水槽21係傾斜設置,而各排水槽2 1之傾斜角度係介於35 。~45 。之間,且以40 。為最佳。藉此,可於晶圓研磨時,利用傾斜設置之各排水槽21達到易於導出工作液體及廢粒之功效。 綜上所述,本創作對位晶圓研磨結構可有效改善習用之種種缺點,可使固定環與研磨環利用結合部及組接部進行相互結合,而達到穩固組裝、緊密結合以及增加結構強度之功效;進而使本創作之産生能更進步、更實用、更符合消費者使用之所須,確已符合創作專利申請之要件,爰依法提出專利申請。 惟以上所述者,僅為本創作之較佳實施例而已,當不能以此限定本創作實施之範圍;故,凡依本創作申請專利範圍及新型說明書內容所作之簡單的等效變化與修飾,皆應仍屬本創作專利涵蓋之範圍內。 Please refer to the "Figures 1, 2, 3 and 4" for the appearance of the creation, the exploded view of the creation, the schematic diagram of the profile of the creation, and a partial enlarged view of the part of the third part of the creation. . As shown in the figure: This creation is a aligning wafer polishing structure comprising at least one fixing ring 1 and a grinding ring 2. A plurality of fixing holes 11 are formed on one surface of the fixing ring 1 , and at least two joint portions 12 are provided on the other side of the fixing ring 1 . The grinding ring 2 is combined with the fixing ring 1 and is different from the fixing ring 1 , and a plurality of drainage grooves 21 are formed on one surface of the grinding ring 2, and the other side of the grinding ring 2 is provided with a ring Each of the joint portions 12 abuts at least two of the joint portions 22. When the fixing ring 1 is combined with the grinding ring 2, the joint portion 12 of the fixing ring 1 and the joint portion 22 of the grinding ring 2 can be abutted to each other, so that the fixing ring 1 and the grinding ring 2 can be stably assembled. , tightly combined and increased structural strength. When the present invention is used, the fixing ring 1 can be combined with the fixing mechanism of the fixing member 11 on one side thereof with the required driving mechanism (not shown), and the inner diameter of the grinding ring 2 can be The outer diameter of the wafer to be polished is matched so that the grinding ring 2 is sleeved on the outer edge of the wafer for positioning (not shown), and the fixing ring 1 and the grinding ring 2 are simultaneously driven by the rotation of the driving mechanism. The polishing and the working liquid and the waste particles during the grinding are led out from the respective drain grooves 21 on one side of the grinding ring 2. In one embodiment of the present invention, the fixing ring 1 is made of a metal material having a relatively high rigidity. Thereby, the fixing ring 1 can have a better supporting force to prevent the grinding ring 2 from being deformed. In one embodiment of the present invention, the grinding ring 2 is a non-metallic material that is highly wear resistant and chemically resistant. Thereby, it is possible to avoid scratching the wafer during grinding and to extend the service life of the grinding ring 2. In one embodiment of the present invention, each of the joint portions 12 is a groove, a rib, or a combination thereof, and each of the joint portions 22 is a rib, a groove, or a combination thereof. Thereby, each joint portion 12 and each joint portion 22 can meet the requirements of actual assembly. In the present invention, each of the joint portions 12 is a groove, and each of the joint portions 22 is a rib, respectively, and when the fixing ring 1 is combined with the grinding ring 2, the joint portions 22 of the rib are docked. In each of the joint portions 12 of the groove, the fixing ring 1 and the grinding ring 2 are brought into a stable assembly, a tight bond, and an increase in structural strength. In an embodiment of the present invention, a protruding portion 13 is disposed between each of the joint portions 12, and a top surface of the protruding portion 13 has a rough surface 14; and each of the connecting portions 22 is provided with a The protrusion 13 abuts the recess 23, and the bottom surface of the recess 23 is further provided with another rough surface 24. When the joint portion 12 of the fixing ring 1 and the joint portion 22 of the grinding ring 2 abut each other, the protruding portion 13 is simultaneously engaged in the recess portion 23, and the top surface of the protruding portion 13 is made. The rough surface 14 and the other rough surface 24 of the bottom surface of the recess portion 23 abut against each other to make the biting more stable, so that the fixing ring 1 and the grinding ring 2 can achieve stable assembly, tight bonding and increase structural strength. In one embodiment of the present invention, each of the drain grooves 21 is inclined, and the angle of inclination of each of the drain grooves 21 is 35 . ~45 . Between and 40 . For the best. Thereby, it is possible to achieve the effect of easily discharging the working liquid and the waste particles by using the respective drain grooves 21 provided obliquely at the time of wafer polishing. In summary, the created wafer polishing structure can effectively improve various disadvantages of the conventional use, and the fixing ring and the grinding ring can be combined with each other by the joint portion and the joint portion to achieve stable assembly, tight bonding and increase structural strength. The effect; in order to make the creation of this creation more progressive, more practical, more in line with the needs of consumers, has indeed met the requirements of the creation of patent applications, and filed a patent application according to law. However, the above descriptions are only preferred embodiments of the present invention, and the scope of the present invention cannot be limited by this; therefore, the simple equivalent changes and modifications made by the scope of the patent application and the contents of the new manual are All should remain within the scope of this creation patent.
1‧‧‧固定環1‧‧‧Fixed ring
11‧‧‧固定孔 11‧‧‧Fixed holes
12‧‧‧結合部 12‧‧‧Combination Department
13‧‧‧凸出部 13‧‧‧Protruding
14‧‧‧粗糙面 14‧‧‧Rough surface
2‧‧‧研磨環 2‧‧‧ grinding ring
21‧‧‧排水槽 21‧‧‧Drainage trough
22‧‧‧組接部 22‧‧‧Team
23‧‧‧凹陷部 23‧‧‧Depression
24‧‧‧粗糙面 24‧‧‧Rough surface
第1圖,係本創作之外觀示意圖。 第2圖,係本創作之分解示意圖。 第3圖,係本創作之剖面狀態示意圖。 第4圖,係本創作第3圖a部分之局部放大示意圖。Figure 1 is a schematic diagram of the appearance of this creation. Figure 2 is an exploded view of the creation. Figure 3 is a schematic diagram of the profile state of the creation. Fig. 4 is a partially enlarged schematic view showing a portion of the third drawing of Fig. 3 of the present invention.
Claims (8)
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111496670A (en) * | 2020-04-20 | 2020-08-07 | 宁波赢伟泰科新材料有限公司 | Grooved chemical mechanical polishing retaining ring and manufacturing method thereof |
TWI791305B (en) * | 2021-10-18 | 2023-02-01 | 尚源股份有限公司 | Wafer Grinding Embedded Structure |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111496670A (en) * | 2020-04-20 | 2020-08-07 | 宁波赢伟泰科新材料有限公司 | Grooved chemical mechanical polishing retaining ring and manufacturing method thereof |
TWI791305B (en) * | 2021-10-18 | 2023-02-01 | 尚源股份有限公司 | Wafer Grinding Embedded Structure |
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