[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

TWM453145U - Automatic optical inspection machine structure - Google Patents

Automatic optical inspection machine structure Download PDF

Info

Publication number
TWM453145U
TWM453145U TW101217311U TW101217311U TWM453145U TW M453145 U TWM453145 U TW M453145U TW 101217311 U TW101217311 U TW 101217311U TW 101217311 U TW101217311 U TW 101217311U TW M453145 U TWM453145 U TW M453145U
Authority
TW
Taiwan
Prior art keywords
frame
module
automatic optical
axis robot
optical detector
Prior art date
Application number
TW101217311U
Other languages
Chinese (zh)
Inventor
Shun-Peng Zhang
Original Assignee
Hai Hong Prec Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hai Hong Prec Co Ltd filed Critical Hai Hong Prec Co Ltd
Priority to TW101217311U priority Critical patent/TWM453145U/en
Publication of TWM453145U publication Critical patent/TWM453145U/en

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

自動光學檢測機結構Automatic optical inspection machine structure

本創作隸屬一種光學檢測之技術領域,具體而言係一種具六軸自由度的自動光學檢測機結構,藉以能增進檢測作業的便利性與多樣性。This creation belongs to a technical field of optical inspection, specifically an automatic optical detector structure with six-axis degrees of freedom, which can improve the convenience and diversity of inspection operations.

按,隨著半導體、面板等技術的持續發展,各類板材的平整度、孔位、電路佈設的準確性要求越來越高,以現今的電路板而言,例如其在製造完成之後,要進行電路板的各種平整度、孔位、孔徑及線路等檢測,如此,可以減少誤用不良電路板的機率,以維持產品的良率【yield】,以防止後續在裝設電容、電感、電阻或物件等電子元件時發生對位不準的現象,而造成電路板及相關電子元件的損壞;由於積體電路日漸微細化,而於製程中所產生的極微小的缺陷就成為影響整體品質的關鍵;而用以檢測製程中所產生缺陷的檢測作業,已成為製程中的不可或缺的標準步驟。通常,每一製程階段皆需仰賴檢測系統來掌控產品的品質,故檢測系統的應用在半導體工業是相當廣泛。According to the continuous development of technologies such as semiconductors and panels, the flatness, hole position and circuit layout accuracy of various types of boards are becoming higher and higher. In today's circuit boards, for example, after manufacturing is completed, Perform various board flatness, hole position, aperture and line detection. In this way, the probability of misuse of the bad board can be reduced to maintain the yield of the product [yield] to prevent subsequent installation of capacitors, inductors, resistors or When the electronic components such as objects are inaccurate, the circuit board and related electronic components are damaged. Due to the increasingly finer integrated circuits, the extremely small defects generated in the process become the key factors affecting the overall quality. The inspection operation used to detect defects generated in the process has become an indispensable standard step in the process. Usually, each process stage relies on the inspection system to control the quality of the product, so the application of the detection system is quite extensive in the semiconductor industry.

然而,傳統檢測機台的設計在於僅具有水平的X軸軌道與Y軸軌道,再利用線性移動的吸取單元則在上述X軸軌道與Y軸軌道上移動,將物件移動至測試機台所指定的區域;例如:該吸取單元先由進料區吸取待測試物件至測試區,待物件測試完畢後,再將測試完成之物件由測試區上移動至出料區。但隨著物件測試速度的提 升,傳統測試機台的輸出瓶頸則出現在吸取單元的移動/吸取作業上,由於吸取單元必須執行物件的吸取、物件的搬移、物件的分類等等作業,故吸取單元移動所消耗的時間會遠大於物件之測試所需的時間,導致物件測試作業的閒置與停頓。再者,其通常僅能進行物件的單面檢測,而無法進行周邊、吸取面的檢測,因此如周緣側邊或吸取面有檢測需求時,需另外以其他檢測設備、治具或重新進、出料等,極為費時,且需重新對位、校準,也影響檢測的準確性。因此如何縮短這些電路板進行檢測的時間,以提高檢測的效率,是許多廠商所想要探討的課題。However, the conventional inspection machine is designed to have only horizontal X-axis and Y-axis tracks, and then the linearly moving suction unit moves on the X-axis track and the Y-axis track to move the object to the test machine. The area; for example, the suction unit first sucks the object to be tested from the feeding area to the test area, and after the object is tested, moves the tested object from the test area to the discharge area. But with the speed of object testing l, the output bottleneck of the traditional test machine appears on the moving/suction operation of the suction unit. Since the suction unit must perform the suction of the object, the movement of the object, the classification of the object, etc., the time taken for the suction unit to move will It is much longer than the time required for the testing of the object, resulting in idle and paused object testing operations. Furthermore, it is usually only capable of detecting one side of the object, and it is not possible to detect the peripheral and suction surfaces. Therefore, if the peripheral side or the suction surface has a detection requirement, another detection device, a jig or a re-entry is required. Discharge, etc., is extremely time consuming, and needs to be realigned and calibrated, which also affects the accuracy of the test. Therefore, how to shorten the time for detecting these boards to improve the detection efficiency is a problem that many manufacturers want to explore.

有鑑於此,本創作人乃針對前述現有檢測設備所面臨之問題深入探討,並藉由本創作人多年從事相關產業的開發經驗,積極尋求解決之道,經不斷努力之研究與發展,終於成功的創作出一種自動光學檢測機結構,藉以克服現有者需不重新進出料及對位所造成的困擾與不便。In view of this, the creator is in-depth discussion on the problems faced by the aforementioned existing testing equipment, and actively seeks solutions through the experience of the creators in the development of related industries for many years, and has been successfully researched and developed through continuous efforts. Created an automatic optical inspection machine structure to overcome the troubles and inconveniences caused by the existing need to re-feed and discharge.

因此,本創作之主要目的係在提供一種自動光學檢測機結構,藉以能讓物件呈各種自由度檢測,可有效提升檢測的效率與便利性。Therefore, the main purpose of this creation is to provide an automatic optical detector structure, so that the object can be detected in various degrees of freedom, which can effectively improve the efficiency and convenience of detection.

為此,本創作主要係透過下列的技術手段,來具體實現上述的各項目的與效能,其包含有:一機架;一六軸機械手臂,該六軸機械手臂係設於機架上, 且該六軸機械手臂具有六軸向之移動或旋轉的功能,再者六軸機械手臂前端設有一供抓取物件之抓取器;至少一光學檢測模組,該等光學檢測模組係設於機架上,且光學檢測模組位於六軸機械手臂的移動或旋轉範圍內;一控制單元,該控制單元係設於機架上,且控制單元可供進行檢測物件、六軸機械手臂動作之設定及檢測影像顯示;一進料模組,該進料模組設於機架上,進料模組可供載送物件進出機架內部;一出料模組,該出料模組設於機架上,出料模組可供載送物件離開機架內部。To this end, this creation mainly through the following technical means to achieve the above purposes and effectiveness, including: a rack; a six-axis robot arm, the six-axis robot arm is mounted on the rack, The six-axis robot arm has a six-axis movement or rotation function, and the front end of the six-axis robot arm is provided with a gripper for grasping objects; at least one optical detection module, and the optical detection module is provided On the frame, and the optical detection module is located within the movement or rotation range of the six-axis robot arm; a control unit, the control unit is disposed on the frame, and the control unit is configured to detect the object and the six-axis robot arm Setting and detecting image display; a feeding module, the feeding module is arranged on the frame, the feeding module is capable of carrying the object into and out of the rack; a discharging module, the discharging module is set On the rack, the discharge module can carry the articles away from the inside of the rack.

藉此,透過前述技術手段的具體實現,使本創作之自動光學檢測機結構可利用六軸機械手臂進行物件的移動與旋轉,使其能在同一次的抓取動作中,完成各項位置、不同表面及出料分類,且可進行不同表面的檢測,而無需使用其他檢測設備或治具,更不需重新對位、校準,故不會導致物件測試作業的閒置與停頓,大幅提升其檢測的效率,並能增進其準確性與有效性,從而能增加其附加價值,進一步可提高其經濟效益。Thereby, through the specific implementation of the foregoing technical means, the automatic optical detector structure of the present invention can use the six-axis robot arm to move and rotate the object, so that it can complete various positions in the same grasping action. Different surface and discharge classification, and can detect different surfaces without using other testing equipment or fixtures, no need to realign and calibrate, so it will not cause idle and pause of object testing, greatly improve its detection. Efficiency, and can improve its accuracy and effectiveness, which can increase its added value and further improve its economic efficiency.

為使 貴審查委員能進一步了解本創作的構成、特徵及其他目的,以下乃舉本創作之若干較佳實施例,並配合圖式詳細說明如后,同時讓熟悉該項技術領域者能夠具體實施。In order to enable the review board to further understand the composition, characteristics and other purposes of the creation, the following are some of the preferred embodiments of the creation, and the detailed description of the creation is as follows, and the person familiar with the technical field can be implemented. .

本創作係一種自動光學檢測機結構,隨附圖例示本創作之具體實施例及其構件中,所有關於前與後、左與右、頂部與底部、上部與下部、以及水平與垂直的參考,僅用於方便進行描述,並非限制本創作,亦非將其構件限制於任何位置或空間方向。圖式與說明書中所指定的尺寸,當可在不離開本創作之申請專利範圍內,根據本創作之具體實施例的設計與需求而進行變化。The present invention is an automatic optical detector structure, with reference to the specific embodiments of the present invention and its components, all of which relate to front and rear, left and right, top and bottom, upper and lower, and horizontal and vertical references, It is for convenience of description only and does not limit the creation of the invention, nor does it limit its components to any position or space. The drawings and the dimensions specified in the specification may be varied according to the design and needs of the specific embodiments of the present invention, without departing from the scope of the invention.

本創作之自動光學檢測機結構的簡要構成,如第一、二圖所顯示者,其具有一機架(10),該機架(10)具有一鄰近地面之底座(11)、一位於中段之工作平台(12)及一設於頂端之上框(13),又機架(10)於對應底座(11)與工作平台(12)間的外側周緣環設有一機殼(15),另機架(10)於對應工作平台(12)與上框(13)間的周緣各側面分設有至少一門板(16),供啟閉以檢修機架(10)內部組件;進一步參看第三、四及五圖所示,而機架(10)上設有一穿出工作平台(12)頂面的六軸機械手臂(20),該六軸機械手臂(20)具有智慧型運動控制(Smart Motion Control)技術,供進行不同軸向【X、Y、Z、Xθ、Yθ、Zθ】之移動及旋轉,再者六軸機械手臂(20)前端設有一抓取器(25),其中抓取器(25)可選自真空吸取或夾顎夾取等設計;又機架(10)於工作平台(12)鄰近前側面設有一立臂組(30),且機架(10)於上框(13)上設有至少 一懸臂組(35),該立臂組(30)與懸臂組(35)係由鋁擠桿所組成,再者前述立臂組(30)上設有一平整度檢測模組(40),該平整度檢測模組(40)係利用雷射非接觸式檢測,以供確認物件的平整度,可提高後續檢測的準確性與有效性,另該等懸臂組(35)上分設有至少一光學檢測模組(50、55),本創作以兩組光學檢測模組(50、55)為主要實施例,其係供利用CCD或CMOS等感光元件進行影像擷取及比對檢測;再者,機架(10)於工作平台(12)前方設有一具顯示器之控制單元(60),該控制單元(60)可供進行檢測物件、六軸機械手臂(20)動作之設定及檢測影像顯示,且工作平台(12)兩側分設有一進料模組(70)及一出料模組(80),其中進料模組(70)上具有一可線性移動之載盤(75),而出料模組(80)則係以一輸送帶(85)來傳輸物件,另工作平台(12)於異於進、出料模組(70、80)一側表面設有至少一壞料出料單元(90),供收集不同類型的不良品,如平整度不佳、孔位不對、孔徑不對等,以便於後續加工處理;藉此,組構成一易於檢測操作、且檢測多樣化的自動光學檢測機結構者。The brief structure of the automatic optical detector structure of the present invention, as shown in the first and second figures, has a frame (10) having a base (11) adjacent to the ground and a middle section The working platform (12) and a frame (13) disposed on the top end, and the frame (10) is provided with a casing (15) on the outer peripheral ring between the corresponding base (11) and the working platform (12), and The frame (10) is provided with at least one door panel (16) on each side of the periphery between the corresponding working platform (12) and the upper frame (13) for opening and closing to repair the internal components of the frame (10); As shown in Figures 4 and 5, the frame (10) is provided with a six-axis robot arm (20) that passes through the top surface of the working platform (12). The six-axis robot arm (20) has intelligent motion control (Smart). Motion Control technology for moving and rotating different axes [X, Y, Z, Xθ, Yθ, Zθ], and a gripper (25) at the front end of the six-axis robot arm (20) The device (25) may be selected from the group consisting of vacuum suction or clamping, and the frame (10) is provided with a vertical arm group (30) adjacent to the front side of the working platform (12), and the frame (10) is in the upper frame. (13) at least a cantilever group (35), the vertical arm group (30) and the cantilever group (35) are composed of an aluminum extrusion rod, and the vertical arm group (30) is provided with a flatness detecting module (40). The flatness detection module (40) utilizes laser non-contact detection for confirming the flatness of the object, which can improve the accuracy and effectiveness of the subsequent detection, and the cantilever group (35) is provided with at least one Optical detection module (50, 55), this creation uses two sets of optical detection modules (50, 55) as the main example, which is used for image capture and comparison detection by CCD or CMOS sensor; The frame (10) is provided with a display control unit (60) in front of the working platform (12). The control unit (60) is capable of setting the detection object, the six-axis robot arm (20), and detecting the image display. And a feeding module (70) and a discharging module (80) are arranged on both sides of the working platform (12), wherein the feeding module (70) has a linearly movable carrier (75). The discharging module (80) transmits the object by a conveyor belt (85), and the working platform (12) is provided with at least one bad material on the surface of one side of the inlet and outlet modules (70, 80). Discharge order (90), for collecting different types of defective products, such as poor flatness, incorrect hole position, and incorrect aperture, so as to facilitate subsequent processing; thereby, the group constitutes an automatic optical inspection that is easy to detect and has diverse detections. Machine structure.

而本創作自動光學檢測機結構之實際運用,則係如第二、三、四及五圖所顯示者,操作上,係由控制單元(60)依物件形狀、欲檢測部位、路徑及比對影像預先進行設定,接著將被檢測物件置於進料模組(70)的載盤(75),進料模組(70)可利用載盤(75)移動至平整度檢測模組(40)對應處,供平整度檢測模組(40) 利用雷射技術進行物件的平整度檢測,如為平整度不良品則由六軸機械手臂(20)透過抓取器(25)抓取後置於對應的壞料出料單元(90),如係良品則由六軸機械手臂(20)的抓取器(25)抓取後移動或旋轉至對應的光學檢測模組(50、55)下,進行各種孔位、孔徑或線路等檢測,如係不良品則由六軸機械手臂(20)於對應的壞料出料單元(90),如係良品則由六軸機械手臂(20)移至出料模組(80)的輸送帶(85)上,供逐一出料。The actual application of the automatic optical detector structure of the present invention is as shown in the second, third, fourth and fifth figures. In operation, the control unit (60) depends on the shape of the object, the part to be detected, the path and the comparison. The image is pre-set, and then the object to be detected is placed on the carrier (75) of the feeding module (70), and the feeding module (70) can be moved to the flatness detecting module (40) by using the carrier (75). Correspondence, flatness detection module (40) The laser technology is used to detect the flatness of the object. If the flatness is defective, the six-axis robot arm (20) is grasped by the gripper (25) and placed in the corresponding bad material discharge unit (90), such as The good product is grabbed by the grabber (25) of the six-axis robot arm (20) and moved or rotated to the corresponding optical detection module (50, 55) for various hole positions, apertures or lines, such as The defective product is moved by the six-axis robot arm (20) to the corresponding bad material discharge unit (90), and if it is good, the six-axis robot arm (20) is moved to the conveyor belt of the discharge module (80) (85). ), for one by one.

透過上述構成及動作說明可知,本創作之自動光學檢測機結構可利用六軸機械手臂(20)進行物件的移動與旋轉,使其能在同一次的抓取動作中,完成各項位置、不同表面及出料分類,相較於現有者大幅減少移動所消耗的時間,也不會導致物件測試作業的閒置與停頓,且更可進行不同表面的檢測,如周邊、甚至抓取面,而無需使用其他檢測設備或治具,更不需重新對位、校準,大幅提升其檢測的效率,並能增進其準確性與有效性,故能提高產品的附加價值,並可增加其經濟效益。According to the above configuration and operation description, the automatic optical detector structure of the present invention can use the six-axis robot arm (20) to move and rotate the object, so that it can complete various positions and different positions in the same grasping action. Surface and discharge classification, compared to the existing ones to significantly reduce the time spent moving, does not lead to idle and pause of object testing operations, and can also detect different surfaces, such as the perimeter, or even the grab surface, without The use of other testing equipment or fixtures eliminates the need for realignment and calibration, greatly improves the efficiency of their testing, and enhances their accuracy and effectiveness, thereby increasing the added value of the product and increasing its economic efficiency.

藉此,可以理解到本創作為一創意極佳之新型創作,除了有效解決習式者所面臨的問題,更大幅增進功效,且在相同的技術領域中未見相同或近似的產品創作或公開使用,同時具有功效的增進,故本創作已符合新型專利有關「新穎性」與「進步性」的要件,乃依法提出申請新型專利。In this way, it can be understood that this creation is a creative new creation. In addition to effectively solving the problems faced by the practitioners, the effect is greatly enhanced, and the same or similar product creation or disclosure is not seen in the same technical field. The use, at the same time, has an improvement in efficacy. Therefore, this creation has met the requirements of "newness" and "progressiveness" of the new patent, and is applying for a new type of patent according to law.

(10)‧‧‧架體(10)‧‧‧ ‧ Body

(11)‧‧‧底板(11) ‧‧‧floor

(12)‧‧‧工作平台(12) ‧ ‧ work platform

(13)‧‧‧上框(13) ‧‧‧上框

(15)‧‧‧機殼(15)‧‧‧Shell

(16)‧‧‧門板(16)‧‧‧ Door panels

(20)‧‧‧六軸機械手臂(20)‧‧‧ Six-axis robot

(25)‧‧‧抓取器(25)‧‧‧ Grabber

(30)‧‧‧立臂組(30) ‧ ‧ vertical arm group

(35)‧‧‧懸臂組(35)‧‧‧Cantilever group

(40)‧‧‧平整度檢測模組(40) ‧ ‧ flatness detection module

(50)‧‧‧光學檢測模組(50)‧‧‧Optical Inspection Module

(55)‧‧‧光學檢測模組(55)‧‧‧Optical Inspection Module

(60)‧‧‧控制單元(60) ‧‧‧Control unit

(70)‧‧‧進料模組(70)‧‧‧ Feed module

(75)‧‧‧載盤(75) ‧‧‧ Carrier

(80)‧‧‧出料模組(80)‧‧‧Drawing module

(85)‧‧‧輸送帶(85)‧‧‧Conveyor belt

(90)‧‧‧壞料回收模組(90)‧‧‧Battery recovery module

第一圖:本創作之自動光學檢測機結構的外觀示意圖。The first picture: the appearance of the structure of the automatic optical inspection machine of the present creation.

第二圖:本創作之自動光學檢測機結構的架構示意圖。The second picture: Schematic diagram of the structure of the automatic optical detector structure of this creation.

第三圖:本創作之自動光學檢測機結構的局部架構放大示意圖。The third figure: an enlarged schematic diagram of the partial structure of the automatic optical detector structure of the present creation.

第四圖:本創作之自動光學檢測機結構的前視架構示意圖。Figure 4: Schematic diagram of the front view architecture of the automatic optical detector structure of this creation.

第五圖:本創作之自動光學檢測機結構的俯視架構示意圖。Figure 5: Schematic diagram of the top view of the structure of the automatic optical detector.

(10)‧‧‧架體(10)‧‧‧ ‧ Body

(11)‧‧‧底板(11) ‧‧‧floor

(12)‧‧‧工作平台(12) ‧ ‧ work platform

(13)‧‧‧上框(13) ‧‧‧上框

(20)‧‧‧六軸機械手臂(20)‧‧‧ Six-axis robot

(25)‧‧‧抓取器(25)‧‧‧ Grabber

(30)‧‧‧立臂組(30) ‧ ‧ vertical arm group

(35)‧‧‧懸臂組(35)‧‧‧Cantilever group

(40)‧‧‧平整度檢測模組(40) ‧ ‧ flatness detection module

(50)‧‧‧光學檢測模組(50)‧‧‧Optical Inspection Module

(55)‧‧‧光學檢測模組(55)‧‧‧Optical Inspection Module

(60)‧‧‧控制單元(60) ‧‧‧Control unit

(70)‧‧‧進料模組(70)‧‧‧ Feed module

(75)‧‧‧載盤(75) ‧‧‧ Carrier

(80)‧‧‧出料模組(80)‧‧‧Drawing module

(85)‧‧‧輸送帶(85)‧‧‧Conveyor belt

Claims (9)

一種自動光學檢測機結構,其包含有:一機架;一六軸機械手臂,該六軸機械手臂係設於機架上,且該六軸機械手臂具有六軸向之移動或旋轉的功能,再者六軸機械手臂前端設有一供抓取物件之抓取器;至少一光學檢測模組,該等光學檢測模組係設於機架上,且光學檢測模組位於六軸機械手臂的移動或旋轉範圍內;一控制單元,該控制單元係設於機架上,且控制單元可供進行檢測物件、六軸機械手臂動作之設定及檢測影像顯示;一進料模組,該進料模組設於機架上,進料模組可供載送物件進出機架內部;一出料模組,該出料模組設於機架上,出料模組可供載送物件離開機架內部;藉此,組構成一易於檢測操作、且檢測多樣化的自動光學檢測機結構者。An automatic optical detector structure comprises: a frame; a six-axis robot arm, the six-axis robot arm is mounted on the frame, and the six-axis robot arm has a six-axis movement or rotation function. Furthermore, a front end of the six-axis robot arm is provided with a gripper for grasping objects; at least one optical detecting module is disposed on the frame, and the optical detecting module is located on the movement of the six-axis robot arm Or a rotation range; a control unit, the control unit is disposed on the frame, and the control unit is configured to perform detection of the object, the six-axis robot arm, and the detection image display; a feeding module, the feeding module The group is arranged on the frame, the feeding module is adapted to carry the object into and out of the rack; and the discharging module is arranged on the frame, and the discharging module is configured to carry the object away from the rack Internally; thereby, the group constitutes an automatic optical detector structure that is easy to detect and detect. 如申請專利範圍第1項所述之自動光學檢測機結構,其中該機架具有一鄰近地面之底座、一位於中段之工作平台及一設於頂端之上框,又機架於對應底座與工作平台間的外側周緣環設有一機殼,另機架於對應工作平台與上框間的周緣各側面分設有至少 一門板,供啟閉以檢修機架內部組件。 The automatic optical detector structure according to claim 1, wherein the frame has a base adjacent to the ground, a working platform located at the middle portion, and a frame disposed at the top end, and the frame is corresponding to the base and working. The outer peripheral ring of the platform is provided with a casing, and the other frame is provided with at least the peripheral sides of the corresponding working platform and the upper frame. A door panel for opening and closing to access the internal components of the rack. 如申請專利範圍第1項所述之自動光學檢測機結構,其中該六軸機械手臂之抓取器係選自真空吸取機構。 The automatic optical detector structure of claim 1, wherein the gripper of the six-axis robot is selected from a vacuum suction mechanism. 如申請專利範圍第1項所述之自動光學檢測機結構,其中該機架內設有一平整度檢測模組,供檢測物件的平整度。 The automatic optical detector structure according to claim 1, wherein the rack is provided with a flatness detecting module for detecting the flatness of the object. 如申請專利範圍第4項所述之自動光學檢測機結構,其中該平整度檢測模組係利用雷射非接觸式檢測,以供確認物件的平整度。 The automatic optical inspection machine structure according to claim 4, wherein the flatness detection module uses laser non-contact detection for confirming the flatness of the object. 如申請專利範圍第1項所述之自動光學檢測機結構,其中該等光學檢測模組係供利用CCD或CMOS之感光元件進行影像擷取及比對檢測。 The automatic optical detector structure according to claim 1, wherein the optical detecting module is configured to perform image capturing and comparison detection by using a CCD or CMOS photosensitive element. 如申請專利範圍第1項所述之自動光學檢測機結構,其中該進料模組上具有一可線性移動之載盤。 The automatic optical detector structure of claim 1, wherein the feeding module has a linearly movable carrier. 如申請專利範圍第1項所述之自動光學檢測機結構,其中該出料模組上具有一輸送帶。 The automatic optical detector structure of claim 1, wherein the discharge module has a conveyor belt. 如申請專利範圍第1項所述之自動光學檢測機結構,其中該機架內設有有至少一壞料出料單元,供不同類型的不良品分類收集。 The automatic optical inspection machine structure according to claim 1, wherein the frame is provided with at least one bad material discharge unit for different types of defective products to be collected and collected.
TW101217311U 2012-09-07 2012-09-07 Automatic optical inspection machine structure TWM453145U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW101217311U TWM453145U (en) 2012-09-07 2012-09-07 Automatic optical inspection machine structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW101217311U TWM453145U (en) 2012-09-07 2012-09-07 Automatic optical inspection machine structure

Publications (1)

Publication Number Publication Date
TWM453145U true TWM453145U (en) 2013-05-11

Family

ID=49079563

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101217311U TWM453145U (en) 2012-09-07 2012-09-07 Automatic optical inspection machine structure

Country Status (1)

Country Link
TW (1) TWM453145U (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106705843A (en) * 2016-12-30 2017-05-24 芜湖哈特机器人产业技术研究院有限公司 Bolt sorting system and sorting method thereof
CN108459030A (en) * 2018-02-08 2018-08-28 东华大学 One kind being applied to non-planar plastic smooth surface flaw on-line measuring device and method
CN109709091A (en) * 2017-10-25 2019-05-03 浙江大学常州工业技术研究院 Equipment for testing product lacquer painting
CN112124682A (en) * 2020-09-03 2020-12-25 苏州搏技光电技术有限公司 Accelerometer test equipment

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106705843A (en) * 2016-12-30 2017-05-24 芜湖哈特机器人产业技术研究院有限公司 Bolt sorting system and sorting method thereof
CN109709091A (en) * 2017-10-25 2019-05-03 浙江大学常州工业技术研究院 Equipment for testing product lacquer painting
CN108459030A (en) * 2018-02-08 2018-08-28 东华大学 One kind being applied to non-planar plastic smooth surface flaw on-line measuring device and method
CN112124682A (en) * 2020-09-03 2020-12-25 苏州搏技光电技术有限公司 Accelerometer test equipment

Similar Documents

Publication Publication Date Title
CN104826817B (en) A kind of Product checking machine detected by CCD
CN106546173B (en) Device for detecting components and detection method thereof
CN202770779U (en) Detection device capable of applying multi-shaft mechanical arm
CN105689278B (en) IC appearance test devices
TWM453145U (en) Automatic optical inspection machine structure
JP7102271B2 (en) Semiconductor manufacturing equipment and manufacturing method of semiconductor equipment
JP2018069413A (en) Robot system
CN113984786A (en) Double-station full-automatic ITO (indium tin oxide) scratch detection equipment for liquid crystal display panel
US10638650B2 (en) Apparatus and method of loading components
JP5635835B2 (en) Wafer supply device and chip bonding device
CN205263258U (en) Circuit board detection device
TWI621192B (en) A chip appearance inspection device and method
JPWO2018158888A1 (en) Backup pin recognition method and component mounting apparatus
KR101248141B1 (en) Inspector for mobile phone parts
TWI467197B (en) An electronic component operating unit for an image capturing device, and a working device for its application
CN110694924A (en) Mobile phone and appearance detection machine for color box of mobile phone
CN208572295U (en) A kind of detection device of camera module motor solder joint
CN111748768B (en) Mask plate cleaning equipment and mask plate cleaning method
CN110672600A (en) Online optical filter detection device and method
CN115351009A (en) Circuit board detection device with dust removal mechanical arm and dust removal method
TWM519738U (en) Inspecting apparatus of circuit board
TWM446330U (en) Air pressure synchronous type image scanning device
JP2018017607A (en) Electronic component conveyance apparatus and electronic component inspection apparatus
TWI649247B (en) Electronic component operating device and its operation classification device
JP3537682B2 (en) Mounter component recognition processing device and component recognition processing method

Legal Events

Date Code Title Description
MM4K Annulment or lapse of a utility model due to non-payment of fees