TWM259165U - Improved structure of electronic component testing machine - Google Patents

Description

M259165 IV. Creation Instructions (i) [The original creations of the new type can provide chip designs, so that they can benefit the whole. [Previous technology] The conventional crystal quality test method is as shown in the first figure. A test platform is set on the cantilever 20. The quality is measured on the test platform and a wafer chuck. The test board is connected to the test board with a circuit board. ), By which the sliding device 50 and a series of tests described above can be seen to connect to a good setting environment, and can not be seen in the field of sliding device technology] Related to the structural improvement of an electronic component testing machine, but refers to a The structure of the electronic component testing machine for quality inspection is improved and the testing environment is more streamlined and practical, and the operation is convenient. After the package is completed, it must be shown as a chip that eliminates flaws. It includes a base 10 and a test set-up. The device 30 and the test platform 40 are provided with a slide mounting assembly capable of sucking wafers 40, and the bottom 70 is 70, that is, the test table 40 inherently works at least when the wafers are fine-tuned for trial use. The conventional film inspection machine is equipped with a test electric line and a suction cup 7 0 suction 6 0 to form a crystal circuit board to take a wafer and transfer it temporarily to a type of wafer inspection machine through a wafer inspection machine. The upper end is set at the test position and is set to 50 and sent to the test circuit board. There is a cantilever 20 behind the main board and the test touch is conducted. The device has a solid through hole 4 0 below the device 30 and borrows a fine-tuning device 60 test platform. When the test is performed under 40, the test is selected and selected (for example, the computer owner can use the state below the platform 40. The chip tester performed by the tester does not provide a good motherboard, and through complicated wiring and other equipment and The test circuit board provides a good and convenient operating test environment; and Xi 50 can only move back and forth, so for wafers and test

M259165 IV. Creation Instructions (2) There is no reasonably used technical means for the purpose of contact and conduction of circuit boards. [New content] The main purpose of this creation is to provide an electronic component tester with improved structure. The structure of the tester and at least one tester board is designed to improve the structure, so that the overall test environment is more streamlined and practical. It has the effect of making the operation of the detector more convenient. According to the above purpose, the content of this creative implementation is composed of a testing machine and a testing machine board, wherein: the testing machine is composed of at least a base, a conveying device, a picking device, a clamping device and a testing device. The main reason is that the clamping device is formed into a plate shape, and at least one through slot is provided at the selected portion of the plate, and the assembly structure with the finely adjustable position of the plate is erected on any side of the base; The tester board is composed of a circuit board that is directly inserted into the back of a motherboard through an electrical connector; thereby, the plate-shaped clamping device can be used to provide the motherboard mounting and fixing, so that the circuit The board extends directly through the through slot to the bottom of the detection device to further provide an electronic component testing machine for chip connection and testing. [Embodiment] The following describes the structural features and other functions and purposes of this creation in detail according to the embodiments of the drawings: With reference to the drawings, this creation is a "structure improvement of electronic component testing machine" as a gift. The chip-to-chip quality testing electrical and component testing machine mainly includes at least one testing machine 100 and a testing machine board 200, and the testing machine 100 includes a base 1 and a conveying device. 2

M259165 Fourth, the creation instructions (3), a capture device 3, a clamping device 4 and a detection device 5 (as shown in the second figure), where: the base 1 'is provided with a lower conveying device 2, capture Device 3, the holding base of the melon I 4 and the detection device 5 groups, as shown in the figure, can be a rectangular base, or other shape base, etc .; 輮 send Gua Dan 2, including the moving mechanism and A lifting mechanism is used in cooperation; the moving mechanism is provided with a vertical moving sleeve & 21 at a selected position on the base 1. The vertical moving sleeve group 21 can be a vertical fixed handle 211 and a sliding seat 2 1 2 is applied to select the sliding seat 2 1 2 to have a horizontal moving set 2 2 on it, so that one of the horizontal moving sets 2 2 slides 2 2 1 and the sliding seat 2 1 2 is fixed to each other ' A slide seat 2 2 2 is provided on the sliding handle 2 2 1 which can move linearly forward and backward; and the lifting mechanism is provided on the front side of the vertical moving set 2 1 with a rocker lifting mechanism 2 3, and Combined with a turning mechanism 2 4, the rocker lifting mechanism 2 3 is provided with a swingable connecting rod 2 3 1 and the middle is pivotally arranged at the bottom On the seat 1, the sliding seat 2 1 2 of the connecting rod 2 3 1-end can be lifted up, and the other end of the connecting rod 2 3 1 extends at the torsion mechanism 2 4; and the twisting The mechanism 2 4 is provided with a rotating shaft 2 4 1 at a selected position of the base 1 in a rotatable manner. A cam 2 4 2 is set at the end of the rotating shaft 2 4 1-which can press one end of the connecting rod 2 31 so that the connecting rod 231 can A swing is generated, and a hand wheel 2 4 3 and a swing arm 2 4 4 are provided at the other end of the rotation shaft 241, wherein an upper end of the swing arm 2 4 4 is provided with a positioning plate 2 4 5 and an L-shaped baffle 2 4 6 ′ The positioning plate 2 4 5 and the baffle plate 2 4 6 can be located right in front of the sliding seat 2 2 2 of the horizontal moving set 2 2 after being turned over; the picking device 3 includes a circular suction cup 31 (also Can be other shapes) and a fine adjustment mechanism 32, the suction cup 31 is used to capture and fix

M259165 IV. Creation instructions (4) Fixed film components; and the fine-tuning mechanism 3 2 is located below the suction cup 31 and is used to adjust the suction cup 31 1 micro-rotation and forward and backward movement mechanism, including a stretcher 3 2 at the front end 1, and a positioning lever 3 2 2 is provided at the end of the blocking lever 3 2 1, and one side is provided with two fine adjustment bolts and its internal mechanism, but the internal mechanism of the fine adjustment mechanism 3 2 is a conventional technology, so The detailed structure is not repeated, but the positioning rod 3 2 2 can be used to contact the positioning plate 2 4 5 and the baffle 2 4 6 described above to have a blocking effect; thereby, the fine adjustment mechanism 3 2 of the capturing device 3 can be used. Fixedly combined with the sliding seat 2 2 2 of the above-mentioned horizontal moving set 22, the suction cup 31 can be moved forward, backward, and up and down arbitrarily through the conveying device 2; the clamping device 4 is provided The test machine plate 2000 is provided with a fixed structural device, which is formed by a plate 41 in an upright position on at least one side of the left or right side of the base 1, and at least _ penetrating slots are provided at the selected place of the plate 41. 4U and fixed test machine board 2 0 0 components, and an adjustment mechanism 42 ( To apply the screw adjustment mechanism formed by the screw), the plate 41 can be adjusted to its height position arbitrarily. Included—inspection instrument 5 2 and a cantilever mechanism 5 1 structure: the tester Yi 52 series can be You will know the group, or CCD image acquisition equipment, etc .; _ 锊 is the enemy, and the members are not hungry 拄 5 1 1 is fixed on the conveying device 2 Deye 丨 ', c 1 1 is set at an appropriate height on the front side. There are 2 rear soil debts ^ bases ^, at the upper end of the stand is provided with a front, back: acupoints: in addition to the splint ⑴, standing ί rail group 5 1 3 (as shown in the figure can be the direction of the two birds corpse can be Water adjustment / linear slide rail and slide seat), composed of \ 'said block and dovetail block, = 2 5U (as shown in the figure, a smooth rail stage 513 can be equipped with 〆 rotation; ® shaft sleeve Connection-ring seat))

M259165 IV. Creation instructions (5) ^ --- Group 5 1 4—A vertical slide group seat is provided on the side, and a dovetail seat is provided on the side, and then combined ~ 二 / 不 == The ring slide group 5 1 5 before Combining one of the above, (,,, =)), so that the detection U 52 can be arbitrarily moved to adjust the position of the ^^ registration base 1, the conveying device 2, the taxi w 4 and the detection device 5 and its structure and assembly ^ and two Straight 3, the detection device created by the clamping device is 100, 卩 ^^;% only Y column, can constitute the test action of this sub-component. It does n’t matter) to carry the motor board 2 such as chip 8, as shown in the fourth picture, it includes-various types of mainframes of the main computer, or other = = there is at least one thunderous sound on the back. The test circuit ;;: two provide-test circuit board 7 direct circuit # ^ electronic contacts that the electronic components such as wafers contact, and any electronic components such as ::: ΐ: T corresponding chip The circuit, Μ ,; side § there are multiple prostitute contacts that can be plugged and connected with the electrical connector 61. This can cause the test circuit board 7 to start up and be inserted from the old house :: Provide wafer isoelectricity: = = ί 直 6 is fixed on the board Γ㈣ test machine board 2. The main board of the ° is difficult to empty-4 1 set 4 /, outside the plate 41, so that the test circuit board 7 penetrates and extends below the testing instrument 52 (as shown in the ninth figure) (Above), if so, you can move the horizontal movement kit 22 of the mouthpiece J2 through the carousel 2 to the bottom of the test board 7 (please refer to the fifth

M259165, creation description (6) shown), and then rotate the fan ▲ the link 23 1-end to synchronize the rotation mechanism 24, so that its cam 242 presses down the sliding seat 2 1 of the sleeve 2 1 2 | Details 2 3 1 The other end lifts the vertical movement to further make the wafer 8 and the test gong (/, as shown in the sixth to eighth figures). The mechanism 3 2 positions the wafer 8 and _: the branch 7 is positioned, 俾By adjusting this micro, you can adjust the detection device $ electricity = board 7 contact to form electrical continuity, borrowed) to perform wafer ^ product = inspection, instrument 52 position (refer to the ninth picture, the above-mentioned moving shell tearing 5 can be reversed) The chip will be tested after the test is completed. 'You can exit the chip 8 and replace it with another one. The electronic test machine 100 is an implementation with at least one new test machine structure improvement. 〇Installation, which can make the test = f clamping device 4 can provide the test machine board (ring%, and because the test machine x ^ 2 0 〇 has a more stable installation and test, circuit board 7 composition, eliminating Practice 1 The main board 6 is directly inserted into a pre-test and post-test installation and a more mixed cable connection structure, so the structural environment can be improved. Simplified; another—, fast, convenient, and improved testing, it has the function of horizontal wheel feed crystal + creation of the transport Pei 2 knot | function, if so, not only the operation makes: and the operation circuit board to lift the wafer vertically 7 contact combination, I achieved the detection effect two fast her | Only need to specify, this creation is mainly special 9, the effect cup. Has a better installation structure, the rest of the Shangjieshe = providing test machine board 200 is only for this creation The description of the best embodiment is =, deduction and composition relations, etc., and other structures implemented on behalf of the implementation, so the use of 'ya does not limit the creation can replace or replace the implementer, such as the tenth figure: in: " Make it easy to change! 、 1 base-the side is also set

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M259165 IV. Creation instructions (7) A clamping device identical to the above 4 can be provided with a test machine board 2 0 0 for installation and use (that is, both sides of the base 1 are provided with a clamping device 4 and can be moved and adjusted at any time. 5 Testing), or for example: replacing the type of sliding handle, replacing the testing instrument 5 2 with other instruments, or implementing the cantilever mechanism 51 as a fixed and non-adjustable structure, etc., shall be included in the patent scope of this case. To sum up, the design of this studio for the "improvement of the structure of electronic component testing machines" is indeed practical and creative. The use of its means is also novel and undoubted, and the efficacy and design purpose are indeed in line with it. Bright. To this end, a new type of patent application was filed in accordance with the law, but the Bureau is kindly requested to review it carefully and grant the patent as a prayer.

M259165

Brief description of the drawings on page 12 [Simplified illustration of the drawings] The first picture is a three-dimensional schematic diagram of a conventional wafer inspection machine. The second picture is a three-dimensional schematic diagram of a creative electronic component tester. The second picture is a creative installation test machine board. Three-dimensional diagram. The fourth diagram is the three-dimensional diagram of the creative test machine board. The fifth diagram is the schematic diagram of the horizontal movement of the creative conveying device. The sixth diagram is the schematic diagram of the vertical movement of the creative conveying device. The seventh diagram is the creative twisting mechanism. Schematic diagram of the operation. The eighth diagram is another diagram of the operation of the creative torsion mechanism. The ninth diagram is a diagram of the operation of the creative detection device. The tenth diagram is another embodiment of the creative clamping device. Explanation] Tester 100; Tester board 2 0 0; Base 1; Conveyor 2; Vertical moving set 21; Fixed holder 211; Slide base 212; Horizontal moving set 22; Slide holder 221; Slide base 2 2 2; Rocker lifting mechanism 23; Link 231; Torsion mechanism 24; Rotary shaft 241; Cam 2 4 2; Handwheel 2 4 3; Rotary arm 2 44; positioning plate 2 4 5; baffle 2 4 6; picking device 3; suction cup 31; fine-tuning mechanism 32; M259165 simple description of the lever 3 21; positioning lever 3 2 2; clamping device 4; plate 41 Penetration slot 411; Adjustment mechanism 42; Detection device 5; Cantilever mechanism 51; Column 511; Plywood 512; Water leveling group 513; Rotating group 514; Vertical slide group 515; Testing instrument 52; Main board 6; Electrical connector 61; test circuit board 7; chip 8; < »

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Claims (1)

M259165 V. Application for Patent Scope 1. A structural improvement of an electronic component testing machine, comprising a testing machine and a testing machine board. The testing machine is provided with another base. A conveying device is provided on the base, and the conveying device is provided on the base. An electronic device is provided with a pick-up device, and a detection device is arranged at the rear end of the conveying device. The tester board is composed of a main board and a test circuit board, and is characterized in that the base is at least one of left and right. At least one clamping device is arranged on the side, and the clamping device is a plate which is combined with the base in an adjustable height position and is provided with at least one through slot at a selected position of the plate; thereby providing a test machine board The main board can be installed on the outside of the plate of the clamping device, and the test circuit board can pass through the through slot and extend below the detection device for the electronic component tester. 2. The structural improvement of the electronic component testing machine as described in item 1 of the scope of patent application, wherein the combination of the plate with adjustable height position includes an adjustment mechanism provided between the plate and the base. The plate can be arbitrarily adjusted in position; and the adjustment mechanism can be a spiral adjustment mechanism composed of an application screw. 3. The structural improvement of the electronic component tester as described in item 1 of the scope of the patent application, wherein the tester board includes at least one electrical connector on the back of the main board, and at least one edge of the test circuit board is provided with Contacts in contact with electrical connectors. 4. The structural improvement of the electronic component testing machine according to item 1 of the application for profit-seeking scope, wherein the conveying device includes a moving mechanism and a jacking mechanism and is applied in cooperation; the moving mechanism is provided on the base with a Down Page 14 M259165 V. Patent application Straight moving set. The vertical moving set can be applied by a vertical fixed holder and a sliding seat. Therefore, a horizontal moving set is set on the selected sliding seat. One slider of the horizontal moving set is fixed to the sliding seat, and a sliding seat that can be moved forward and backward is provided on the sliding seat, and the sliding seat is provided for the picking device; and the lifting mechanism is A rocker lifting mechanism is provided on the front side of the vertical moving and moving set, and is matched with a torsion mechanism, wherein the rocker lifting mechanism has a swingable link pivotally arranged on the base, so that the One end of the connecting rod can lift the sliding seat of the vertical moving set to rise, and the other end of the connecting rod extends at the torsion mechanism; and the torsion mechanism has a rotating shaft that is rotatably provided at the selected position of the base, and one The cam can press down one end of the link, so that the link can swing, and a hand wheel and a swing arm are provided at the other end of the rotating shaft, wherein the upper end of the swing arm is provided with a positioning plate and a baffle plate, so that the positioning plate and Baffle can be positioned correctly after turning The horizontal movement of the carriage in front of the kit. 5. The structural improvement of the electronic component testing machine as described in item 1 of the scope of the patent application, wherein the extraction device is composed of a suction cup and a fine adjustment mechanism, and the fine adjustment mechanism is arranged below the suction cup, so that the fine adjustment mechanism is installed. The suction device can be arbitrarily moved on the conveying device through the conveying device. Page 15