TWI721484B - Intelligent test question assigning system and electronic device - Google Patents

Abstract

An intelligent test question assigning system and electronic device are provided. The intelligent test question assigning system includes: a server; and an electronic device coupled to the server. The electronic device login to the server and performs a first test through a teaching platform of the server. A test range of the first test includes multiple sub-ranges and multiple first test questions of the first test are distributed in the sub-ranges. The teaching platform calculates a score of each of the sub-ranges by a scoring algorithm according to answering results of portion of the first test questions of each of the sub-ranges. The teaching platform obtains the sub-ranges with the scores lower than a threshold and generates a second test according to multiple second test questions of the sub-ranges with the scores lower than the threshold.

Description

Smart question matching system and electronic device

The present invention relates to a smart question matching system and electronic device, and more particularly to a smart question matching system and electronic device that can more accurately determine the level of students and provide suitable test questions.

In the existing teaching system, the judgment of the student's level is often based on the number of questions that the student answers correctly in a test question, and the difficulty of each question is not taken into consideration. Therefore, there will be a certain gap in judging the degree of students. Existing examination papers also select questions from the question bank and add them to the examination papers, without considering the students' learning status to give suitable examination questions. Therefore, how to record students' learning conditions more accurately and allocate appropriate examination papers to assist students in learning is a goal that those skilled in the art should strive for.

The invention provides a smart question allocation system and an electronic device, which can more accurately judge the degree of a student and provide suitable test questions.

The present invention provides a smart question allocation system, including: a server; and an electronic device coupled to the server. The electronic device logs in to the server and performs the first test through the teaching platform of the server. The test range of the first test includes multiple sub-ranges, and the multiple first test questions of the first test are distributed in the sub-ranges. The teaching platform uses a scoring algorithm to calculate the scores of each sub-range according to the answer results of some of the first test questions in each sub-range. The teaching platform obtains a sub-range with a score below the threshold, and generates a second test based on multiple second test questions in the sub-range with a score below the threshold.

In an embodiment of the present invention, in the scoring algorithm, the first test question is divided into multiple difficulties, and the difficulty includes the first difficulty, the second difficulty, and the third difficulty. The score has a first upper limit when the answer results of multiple first-difficulty test questions are correct. The score has a second upper limit when the answer results of multiple first difficulty and multiple second difficulty test questions are correct. The score has a third upper limit when the answer results of multiple first difficulty, multiple second difficulty, and multiple third difficulty test questions are correct. The third upper limit value is greater than the second upper limit value and the second upper limit value is greater than the first upper limit value.

In an embodiment of the present invention, for the first sub-range in the sub-range whose score is lower than the threshold value, the teaching platform generates at least one third test question corresponding to the difficulty of the score of the first sub-range, and according to at least one third test question. The results of the test questions are used to update the scores in the first sub-range.

In an embodiment of the present invention, the above-mentioned teaching platform updates the scores of the sub-ranges according to the answer results of the second test questions of the second test.

In an embodiment of the present invention, the aforementioned sub-range includes the second sub-range. When the total opening time of the course description corresponding to the second sub-range is less than the time threshold and the electronic device accesses a plurality of fourth test questions corresponding to the second sub-range, the server sends a prompt message to the electronic device.

The present invention provides an electronic device including a processor and a memory coupled to the processor. The electronic device logs in to the server and performs the first test through the teaching platform of the server. The test range of the first test includes multiple sub-ranges, and the multiple first test questions of the first test are distributed in the sub-ranges. The teaching platform uses a scoring algorithm to calculate the scores of each sub-range according to the answer results of some of the first test questions in each sub-range. The teaching platform obtains a sub-range with a score below the threshold, and generates a second test based on multiple second test questions in the sub-range with a score below the threshold.

Based on the above, the smart question allocation system and electronic device of the present invention can provide students for testing, and according to the answer results of the test questions in each sub-range of the test range of the test, the score of each sub-range is calculated by the scoring algorithm to represent the student The level of understanding of each sub-scope. In the next test, the smart question matching system of the present invention can give priority to the test questions in the sub-range with low scores. The above scoring algorithm includes dividing the test questions into multiple difficulty levels. When the answer of the lower difficulty test questions is correct, the score will have an upper limit, and the upper limit of the score can be increased only when the higher difficulty test questions are answered correctly. In addition, the smart question allocation system of the present invention can also update the scores of multiple sub-ranges belonging to the student according to the test results or the answering results of the students' self-practice test questions, so as to completely record the students' understanding of each sub-range.

In order to make the above-mentioned features and advantages of the present invention more comprehensible, the following specific embodiments are described in detail in conjunction with the accompanying drawings.

FIG. 1 is a block diagram of a smart question matching system according to an embodiment of the present invention.

Please refer to FIG. 1, a smart question matching system 100 according to an embodiment of the present invention includes an electronic device 110 and a server 120. The electronic device 110 can be coupled to the server 120 via a communication chip (not shown in the figure) via a wired or wireless network. The electronic device 110 is, for example, a personal computer, a notebook computer, a tablet computer, a smart phone or other similar devices. The electronic device 110 may include a processor 111 and a memory 112. The processor 111 is, for example, a central processing unit (Central Processing Unit, CPU), a microprocessor control unit (Microprocessor Control Unit, MCU) or other similar devices. The memory 112 is, for example, a dynamic random access memory (DRAM), a hard disk drive (HDD), a solid state drive (SSD) or other similar devices.

In one embodiment, the electronic device 110 can obtain interactive teaching content from the server 120 through a webpage or an application (APP). Specifically, the user can log in to the server 120 by sending the account and password to the server 120 through the electronic device 110. After the user logs in to the server 120, the server 120 can transmit the teaching screen of the teaching platform to the electronic device 110, and the electronic device 110 can display the teaching screen on a display (not shown in the figure). The user can watch the course description on the teaching platform and perform test exercises for various sub-ranges of the course (for example, list binary linear expressions, simplification of binary linear expressions, merging similar items, etc.). The teaching platform can provide test questions of different difficulty and judge the user's score in each sub-range according to the user's answering situation according to the scoring algorithm.

In one embodiment, in the scoring algorithm, the first test question is divided into multiple difficulties, and the difficulty includes the first difficulty, the second difficulty, and the third difficulty. The score has a first upper limit when the answer results of multiple first-difficulty test questions are correct. The score has a second upper limit when the answer results of multiple first difficulty and multiple second difficulty test questions are correct. The score has a third upper limit when the answer results of multiple first difficulty, multiple second difficulty, and multiple third difficulty test questions are correct. The third upper limit value is greater than the second upper limit value and the second upper limit value is greater than the first upper limit value. 2A to 2D are schematic diagrams of a scoring algorithm according to an embodiment of the invention.

2A, in this embodiment, for each sub-range, the test questions can be divided into "basic" (for example, the first difficulty), "advanced" (for example, the second difficulty) and "difficulty" (for example, the third difficulty). Difficulty) Three kinds of difficulty. When answering one question correctly in each difficulty, the system can judge that the student is "possible to learn" and when answering two questions correctly, the system can judge that the student is "sure to learn". Similarly, the system can judge the student "may not" when answering one question incorrectly in each level of difficulty, and the system can judge the student "definitely not" when answering two questions incorrectly. In the example in Figure 2A, because the students "answer basic questions correctly", "advance questions wrongly answered", "difficult questions incorrectly answered", and "difficult questions incorrectly answered" in order, the system determines the student's score in this sub-range of 210 It is "17%".

Please refer to Figure 2B, because the students “answer the basic questions correctly”, “answer the basic questions correctly”, “advance questions wrongly answered”, “difficult questions answered incorrectly”, and “difficult questions answered incorrectly” in order, so the system determines that the students are here. The score 220 of the range is "33%" (for example, the first upper limit value).

Please refer to Figure 2C. Because the students "answer the basic questions correctly", "answer the basic questions correctly", "answer the advanced questions correctly", "answer the advanced questions correctly", and "answer the difficult questions incorrectly" in order, the system determines that the students are in this sub-range The score 230 of is "66%" (for example, the second upper limit).

Please refer to Figure 2D, because the students “answer the basic questions correctly”, “answer the basic questions correctly”, “answer the advanced questions correctly”, “answer the advanced questions correctly”, “answer the difficult questions correctly”, and “answer the difficult questions correctly” in order, so the system judges The student's score 240 in this sub-range is "100%" (for example, the third upper limit).

It can be seen from FIG. 2A to FIG. 2D that the scoring algorithm of an embodiment of the present invention can more accurately determine the degree of a student. In the traditional grading method, if the student answers the four basic questions correctly, the score is "100%". However, in the grading algorithm of an embodiment of the present invention, because the student did not answer the advanced and difficult questions, The score is "33%", which is the first upper limit. It is worth noting that although three levels of difficulty and two levels of judgment are described in this embodiment (for example, "may learn" and "definite learn"), the present invention is not limited to this. In another embodiment, the scoring algorithm may also include more levels of difficulty and more degree of judgment.

FIG. 3 is a schematic diagram of a smart question matching system according to an embodiment of the present invention.

1 to 3, the electronic device 110 logs in to the server 120 and performs the first test through the teaching platform 300 of the server 120. The test range of the first test includes multiple sub-ranges, and the multiple first test questions of the first test are distributed in the sub-ranges. The teaching platform 300 calculates the score of each sub-range with a scoring algorithm according to the answer results of the first test questions in each sub-range. The teaching platform 300 obtains a sub-range with a score lower than a threshold value, and generates a second test based on a plurality of second test questions in the sub-range with a score lower than the threshold value. The teaching platform 300 may update the scores of the sub-ranges according to the answer results of the second test questions of the second test.

In the example of FIG. 3, the teaching platform 300 shows part of the sub-ranges of the first test, that is, the sub-range 311 (that is, the "row binary linear") and the sub-range 312 (that is, the "binary linear Simplify”), and the scores 321 (ie, 50%) and scores 322 (ie, 28%) corresponding to the sub-range 311 and the sub-range 312, respectively. The score 321 and the score 322 are calculated by the teaching platform 300 based on the answer results of the various difficulty test questions in each sub-range 311 and sub-range 312 using a scoring algorithm. The teaching platform 300 can re-select multiple second test questions for the test range of the first test to generate a second test, wherein test questions corresponding to sub-ranges with scores below a threshold (for example, 50%) can be selected first.

In one embodiment, for the first sub-range in the sub-range with a score lower than the threshold value, the teaching platform 300 generates at least one third test question corresponding to the difficulty of the score in the first sub-range, and according to the score of the at least one third test question Update the score of the first sub-range by answering the result. For example, since the student's score 321 in the sub-range 311 is 50% (that is, between 33% and 66%), the teaching platform 300 can generate intermediate questions for students to practice and display marks 331 corresponding to the intermediate questions; The student's score 322 in the sub-range 312 is 28% (that is, between 0% and 33%). The teaching platform 300 can generate simple questions for students to practice and display marks 332 corresponding to the simple questions. After the students have completed the above intermediate and/or simple questions, the teaching platform 300 can update the score 321 and/or the score 322 according to the answering result and the scoring algorithm.

In one embodiment, when the total opening time of the course description 340 is less than the time threshold (for example, 10 minutes) and the electronic device 110 accesses the test questions corresponding to the sub-range 312, the server 120 may send a prompt message to the electronic device 110. In other words, when the student has not spent enough time to read the course description 340 before doing the problem, the server 120 may send a prompt message to the electronic device 110 to guide the student to read the course description 340 first. However, the teaching platform 300 does not force students to read the course description 340 before taking the test.

In one embodiment, the teaching platform 300 may record a predetermined completion time for each test question of the test. When the time for a student to answer a question is too short, for example, less than one-tenth of the scheduled completion time, the teaching platform 300 can determine that the student is guessing randomly. Therefore, even if the student guessed the question correctly, the scoring algorithm of the teaching platform 300 will be regarded as a wrong answer.

To sum up, the smart question allocation system and electronic device of the present invention can provide students to take a test, and according to the answer results of the test questions in each sub-range of the test range of the test, use the scoring algorithm to calculate the score of each sub-range. Represents students’ understanding of each sub-area. In the next test, the smart question matching system of the present invention can give priority to the test questions in the sub-range with low scores. The above scoring algorithm includes dividing the test questions into multiple difficulty levels. When the answer of the lower difficulty test questions is correct, the score will have an upper limit, and the upper limit of the score can be increased only when the higher difficulty test questions are answered correctly. In addition, the smart question allocation system of the present invention can also update the scores of multiple sub-ranges belonging to the student according to the test results or the answering results of the students' self-practice test questions, so as to completely record the students' understanding of each sub-range.

Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the relevant technical field can make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention shall be determined by the scope of the attached patent application.

100: Smart Question Matching System 110: Electronic device 111: Processor 112: Memory 120: Server 210, 220, 230, 240: points 300: Teaching Platform 311, 312: Sub-range 321, 322: Score 331, 332: mark 340: Course description

FIG. 1 is a block diagram of a smart question matching system according to an embodiment of the present invention. 2A to 2D are schematic diagrams of a scoring algorithm according to an embodiment of the invention. FIG. 3 is a schematic diagram of a smart question matching system according to an embodiment of the present invention.

300: Teaching Platform 311, 312: Sub-range 321, 322: Score 331, 332: mark 340: Course description

Claims (10)

A smart question matching system, including: A server; and An electronic device coupled to the server, wherein The electronic device logs in to the server and performs a first test through a teaching platform of the server. A test range of the first test includes a plurality of sub-ranges and a plurality of first test questions of the first test are distributed in the sub-ranges. range; The teaching platform uses a scoring algorithm to calculate a score for each of the sub-ranges according to the answer results of the first test questions in each of the sub-ranges; and The teaching platform obtains the sub-ranges where the score is lower than a threshold value, and generates a second test based on a plurality of second test questions in the sub-ranges where the score is lower than the threshold value. For example, in the smart question assignment system described in item 1 of the scope of patent application, in the scoring algorithm, the first test questions are divided into multiple difficulties, and the difficulties include a first difficulty, a second difficulty, and a third difficulty. Difficulty. The score has a first upper limit when the answer results of a plurality of test questions of the first difficulty are correct, and the score has a first upper limit when the answer results of a plurality of test questions of the first difficulty and a plurality of the second difficulty are correct The score has a second upper limit, and when the answering results of a plurality of the first difficulty, a plurality of the second difficulty and a plurality of the third difficulty are correct, the score has a third upper limit, wherein the The third upper limit value is greater than the second upper limit value and the second upper limit value is greater than the first upper limit value. For example, the smart question assignment system described in item 1 of the scope of patent application, wherein for a first sub-range of the sub-ranges whose score is lower than the threshold value, the teaching platform generates the score corresponding to the first sub-range The score of the first sub-range is updated according to the answer result of the at least one third test question of at least one third test question of difficulty. For example, in the smart question allocation system described in item 1 of the scope of patent application, the teaching platform updates the scores of the sub-ranges according to the answer results of the second test questions of the second test. For example, the intelligent question assignment system described in item 1 of the scope of patent application, wherein the sub-ranges include a second sub-range, when a total opening time corresponding to a course description of the second sub-range is less than a time threshold and the When the electronic device accesses a plurality of fourth test questions corresponding to the second sub-range, the server sends a prompt message to the electronic device. An electronic device, including: A processor; and A memory, coupled to the processor, where The electronic device logs in to the server and performs a first test through a teaching platform of the server. A test range of the first test includes a plurality of sub-ranges and a plurality of first test questions of the first test are distributed in the sub-ranges. range; The teaching platform uses a scoring algorithm to calculate a score for each of the sub-ranges according to the answer results of the first test questions in each of the sub-ranges; and The teaching platform obtains the sub-ranges where the score is lower than a threshold value, and generates a second test based on a plurality of second test questions in the sub-ranges where the score is lower than the threshold value. For the electronic device described in item 6 of the scope of patent application, in the scoring algorithm, the first test questions are divided into multiple difficulties, and the difficulties include a first difficulty, a second difficulty, and a third difficulty, The score has a first upper limit when the answer results of multiple test questions of the first difficulty are correct, and when the answer results of multiple test questions of the first difficulty and a plurality of the second difficulty are correct, the score has A second upper limit. When the answer results of a plurality of the first difficulty, a plurality of the second difficulty and a plurality of the third difficulty are correct, the score has a third upper limit, wherein the third The upper limit value is greater than the second upper limit value and the second upper limit value is greater than the first upper limit value. For the electronic device described in item 6 of the scope of patent application, for a first sub-range of the sub-ranges in which the score is lower than the threshold value, the teaching platform generates the difficulty of the score corresponding to the first sub-range At least one third test question, and update the score of the first sub-range according to the answer result of the at least one third test question. According to the electronic device described in item 6 of the scope of patent application, the teaching platform updates the scores of the sub-ranges according to the answer results of the second test questions of the second test. For the electronic device described in item 6 of the scope of patent application, wherein the sub-ranges include a second sub-range, when a total opening time corresponding to a course description of the second sub-range is less than a time threshold and the electronic device When accessing a plurality of fourth test questions corresponding to the second sub-range, the server sends a prompt message to the electronic device.

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