TWI704361B - An automated circuit board test system and a method thereof - Google Patents

Abstract

An automated circuit board test system and a method thereof which are applied in the environment of a device under test (DUT). The automated circuit board test system provides test signals to the object under test of the electronic product for measurement of relevant parameters. During the process that the automated circuit board test system of the present invention is used to perform an automated circuit board test method, first, the test processing module transfer a control signal to a switch module of test board. The switch module of test board switches a plurality of relays to switch the signal path, and converts the control signal into a sequence control signal. Then, the sequence control signal is transmitted to the test board for testing. In the process of returning, the switch module of test board switches the signal path again, and the result data is transmitted back to the test processing module. Thereby, the system can test multiple electronic products at one time by switching the signal path of the switch module of test board.

Description

Automatic circuit board testing system and method

The invention relates to an automated test system, in particular to an automated circuit board test system and method for signal switching.

Automatic Test Equipment (ATE) uses automated mechanisms to test semiconductor products, electronic circuit devices, and printed circuit boards. Among them, the measurement unit is an important component commonly seen in automated test systems. The function of the measurement unit is mainly to provide test signals to the device under test (DUT) for the measurement of related parameters. Common patterns such as Pseudo-Randon Binary Sequence (PRBS) are used to test the bit error rate of the DUT feedback.

When the automated test system currently on the market performs the PRBS test of the device under test, the tester only needs to input the required data and the required test parameters according to the test requirements, and operate the user interface (GUI) to change the test program, and because Different test procedures need to replace and unplug the circuit on the DUT, the whole test reaches multiple steps.

Taiwan Public/Announcement No. I479957 "The concept of extracting signals exchanged between a device under test and automated test equipment" is a type of printing used to extract signals exchanged between a device under test and an automated test equipment Circuit board. The printed circuit board includes a plurality of first terminals, a plurality of second terminals, a plurality of transmission lines and an extraction circuit. The plurality of first terminals are assembled to contact terminals of a slot of the device under test. The plurality of second terminals are assembled to contact the terminals of a test fixing member of the automated test equipment, and the terminals are adapted to contact the terminals of the slot of the device under test. The multiple transmission lines are assembled to connect the multiple first terminals and the multiple second terminals. The extraction circuit is an electrical appliance coupled to one of the plurality of transmission lines, and is configured to extract signals exchanged between the device under test and the automated test equipment through the one transmission line to provide an extraction Signal, wherein the extraction circuit includes a resistor or a resistor network, and the presence of the printed circuit board adds to the signal exchanged between the device under test and the automated test through the transmission line A loss is less than 6 decibels.

Taiwan Public/Announcement No. I561839 "Integrated Circuit Test Interface and Automatic Test Equipment" discloses an integrated circuit test interface that can upgrade an automatic test device to test a component under test. The integrated circuit test interface contains at least A pin is used to receive or transmit at least one test signal to a test machine of the automatic test equipment; a plurality of digitizers are coupled to the at least one pin to generate a digital signal; a processor is coupled The plurality of digitizers are used to process the digital signal; and a connector is used to connect the processor and a computer device to transmit one of the output signals of the processor to the computer device; wherein, The integrated circuit test interface is arranged between the test machine and a probe test machine of the automatic test equipment.

At present, one of the problems in the conventional automated test system is that on the test system, only one DUT can be tested at a time, for example, one DUT A and one DUT B. The test system Connect the DUT A to perform the test action. After the test, the DUT A must be removed, and then the DUT B must be connected to perform the test action. The automated circuit board testing system of the present invention solves the aforementioned problems, can connect multiple DUTs at one time, and test multiple DUTs by switching the signal path.

However, as the DUT is becoming more and more diversified and its operation is becoming more and more sophisticated, more powerful automatic test systems and methods are needed to meet the increasingly complex test requirements and provide more flexible and efficient Automated test system, which simplifies the test process and shortens the test time, is one of the problems that R&D personnel should solve.

The main purpose of the present invention is to provide an automated circuit board testing system and method, which can connect the switch module and the control module of the board to be tested to the test board, and control the board to be tested through the control module The board switch module quickly switches the relay to switch the signal path, so that the test system can connect and test multiple DUTs at a time, and further enable the test system to reduce human resources, shorten the test time, fully automated, recordable, and The analysis is performed in the test processing module, and the analysis result is displayed on the user interface.

In order to achieve the foregoing and other objectives, one object of the present invention is to provide an automated circuit board testing system, which includes: at least one switch module to be tested, the switch module to be tested is connected to a test board, the test board Including: a first signal interface, a second signal interface, a third signal interface and a repeater, the second signal interface and the third signal interface are connected to each other by a signal line, and the first signal interface is connected to the Repeater, the switch module of the board to be tested is respectively connected to the second signal interface and the third signal interface, the switch module of the board to be tested includes a plurality of relays; a control module, which is connected with a control interface The bus bar is connected to the switch module of the board to be tested, the control module controls the switch module of the board to be tested; and a test processing module that receives the encrypted result data tested by the test board, and the test processing module uses At least two serial port buses are respectively connected to the control module and the first signal interface.

Wherein, the test processing module transmits a control signal to the control module, the control module converts the control signal into a serial control signal, and the control module transmits the serial control signal to the switch group of the board to be tested, and Control the relay switching signal path of the switch module of the board to be tested, the test board returns result data to the switch module of the board to be tested, and the switch module of the board to be tested transmits the result data to the control module via a sequence of return signals Group, the control module converts the serial return signal into a return signal, and transmits the encrypted result data to the test processing module through the return signal.

Preferably, the switch module of the board to be tested includes: at least two boards to be tested, at least one relay module and a software protector, and the test board is connected to the second signal interface and the third signal interface, respectively, The waiting test boards are individually connected to the relay module, the relay module is connected to the control module by the control interface bus, and the software protector is connected to the relay module by a software interface bus. The software The protector encrypts the data returned by the relay module. The number of serial port buses is three. The serial port buses are respectively connected to the first signal interface, the control module and the software protector, and are connected to the Test processing module.

Preferably, the relay module uses the sequence control signal to control an output pin of an expansion chip of the relay module, so that the switches of the relays achieve signal path switching.

Preferably, the encrypted result data includes: test date and time, work order information, test site, test process, test item, and test result, and the encrypted result data is stored in the test processing module.

Preferably, the test result includes a plurality of test result details.

Preferably, wherein the oscillation frequency of the control module is 24 MHz.

Preferably, wherein the control module includes a control power chip, the control power chip provides a 3.3V DC voltage to the microcontroller of the control module, the relay module includes a relay power chip, the relay power chip It provides 3.3V DC voltage to the expansion chip.

Preferably, the expansion chip has an integrated circuit interface interface and a plurality of pins.

Preferably, the total test time of the test system is between 0 and 200 seconds.

In order to achieve the foregoing and other objectives, another object of the present invention is to provide a test method for an automated circuit board test system, which includes the following steps: a setting step, the test processing module sets the repeater through the first signal interface Enter the test mode; a step of sending a test signal, the test processing module sends the control signal to the control module; a step of converting a signal, the control module receives the control signal, and transmits the control signal to the The microcontroller of the control module converts the control signal into the sequence control signal; a data comparison step is to send the sequence control signal to a memory, and perform data comparison in the memory, and then the The sequence control signal is returned to the control chip, and the control chip transmits the sequence control signal to the relay module; a signal path switching step, the relay module receives the sequence control signal and controls the relay switching paths , Then the relay module transmits the sequence control signal to the test board; a test step, the test board receives the sequence control signal, and performs a test action in the test board; a step of receiving result data, the relay module After receiving the result data, send the result data to the software protector via the serial return signal; in a packet step, the software protector receives the result data, performs a packet action on the result data and forms the encrypted result data, Then convert the serial return signal into the return signal, and then send the encrypted result data to the test processing module via the return signal; and a storage step in which the test processing module receives the encrypted result data, and The encryption result data is stored in the test processing module.

The automated circuit board testing system and method provided by the present invention mainly use the automated circuit board testing system and the automated circuit board testing method to switch the relays in the switch module of the board to be tested and achieve faster switching The signal path can test multiple boards to be tested at the same time, effectively simplifying the test process and shortening the test time.

Please refer to FIG. 1. FIG. 1 is a schematic diagram of an automated circuit board testing system according to a preferred embodiment of the present invention. According to an embodiment of the present invention, the automated circuit board testing system 100 includes: at least one switch module 10 of the board to be tested, a control module 20 and a test processing module 30.

As shown in FIGS. 1 and 3, the switch module 10 (DUT Switch Circuit) to be tested is connected to a test board 40 (Test board), and the test board 40 includes: a first Signal interface 42c (MDIO0), a second signal interface 42a (MDIO1), a third signal interface 42b (MDIO2) and a repeater 41 (Retimer), the second signal interface 42a (MDIO1) and the third signal The interface 42b (MDIO2) is connected to each other by a signal line 43 (Cable), the first signal interface 42c (MDIO0) is connected to the repeater 41, and the board switch module 10 to be tested is respectively connected to the second signal interface 42a (MDIO1 ) And the third signal interface 42b (MDIO2), as shown in FIG. 4, the switch module 10 of the board to be tested includes a plurality of relays 111a, 111b (Relay). In this embodiment, the signal line 43 is a one-to-one test line, and is connected to the second signal interface 42a (MDIO1) and the third signal interface 42b (MDIO2). In another embodiment, there are signal interfaces MDIO1 to MDIO5, the signal line 43 can use one-to-four test lines, and the number of signal interfaces corresponds to the use of different styles of the signal line 43.

The control module 20 (Control board) is connected to the switch module 10 of the board under test through a control interface bus 21 (I2C), and the control module 20 controls the switch module 10 of the board under test. In this embodiment, the oscillation frequency of the control module 20 is 24 MHz, but the present invention is not limited to this, and it is changed according to the circuit designed by the designer.

The test processing module 30 (GUI-PC) receives the encrypted result data 32 tested by the test board 40. The test processing module 30 uses two serial port buses 31b, 31c (not shown) (USB2, 3) The control module 20 and the first signal interface 42c (MDIO0) are respectively connected (not shown).

It should be further explained that the test processing module 30 transmits a control signal (USB signal) to the control module 20, and the control module 20 converts the control signal (USB signal) into a serial control signal (I2C signal), The control module 20 then transmits the sequence control signal (I2C signal) to the switch group 10 of the board to be tested, and controls the relays 111a, 111b of the switch module 10 to switch the signal path, and the test board 40 returns The result data is transmitted to the switch module 10 of the board to be tested, and the switch 10 module of the board to be tested transmits the result data to the control module 20 via a serial return signal (I2C return signal), and the control module 20 converts The serial return signal (I2C return signal) is a return signal (USB return signal), and the encrypted result data 32 is transmitted to the test processing module 30 via the return signal (USB return signal).

Please refer to FIG. 2, which is a flowchart of an automated circuit board testing method according to a preferred embodiment of the present invention. The following steps can be performed:

First, in a setting step S1, the test processing module 30 is connected to the first signal interface 42c (MDIO0) through the serial port bus 31c (USB3), and the repeater 41 (Retimer) is set to enter the test mode (not shown in the figure) Show);

Then, a step S2 of sending a test signal, in which the test processing module 30 sends the control signal (USB signal) to the control module 20;

Then, a signal path switching step S3, the switch module under test 10 receives the sequence control signal (I2C signal) and controls the relays 111a, 111b to switch paths, and then the switch module under test 10 transmits the sequence control Signal (I2C signal) to the test board 40;

Then, in a test step S4, the test board 40 receives the serial control signal (I2C signal), and performs a test action on the test board 40;

Next, in a step S5 of receiving result data, the switch module under test 10 receives the result data, performs a packet operation on the result data to form the encrypted result data 32, and then returns a signal through the sequence (I2C return signal) Send the result data to the control module 20;

Finally, in a storage step S6, the test processing module 30 receives the encrypted result data 32 and stores the encrypted result data 32 in the test processing module 30.

In order to further understand the structural features of the present invention, the technical means used and the expected effects, the use of the present invention is described, and it is believed that a deeper and specific understanding of the present invention can be obtained from this.

Please refer to FIG. 1 and FIG. 3. FIG. 3 is a schematic diagram of an automated circuit board testing system according to a preferred embodiment of the present invention. The board switch module 10 of the present invention includes: at least two boards to be tested 13a, 13b (DUT), at least one relay module 11 (Relay board), and a software protector 12 (Dongle). 13b is respectively connected to the second signal interface 42a (MDIO1) and the third signal interface 42b (MDIO2), the waiting test boards 13a, 13b are respectively connected to the relay module 11, and the relay module 11 is connected to the control interface The bus 21 (I2C) is connected to the control module 20, the software protector 12 is connected to the relay module 11 through a software interface bus 121 (I2C), and the software protector 12 encrypts the relay module 11 to send back data of.

It should be further explained that the number of serial port buses is three, and the serial port buses 31a, 31b, 31c (USB1~3) are respectively connected to the first signal interface 42c (MDIO0), the control module 20 and The software protector 12 is connected to the test processing module 30. The number of the test boards 13a, 13b (DUT) can be set to a plurality according to the user's needs, that is, the present invention can test multiple test boards 13a, 13b.

Please refer to FIG. 4, which is a schematic diagram of the connection between the control module and the relay module according to a preferred embodiment of the present invention. The relay module 11 uses the serial control signal (I2C signal) to control the output pins of an expansion chip 114 (Expander IC) of the relay module 11, so that the switches of the relays 111a and 111b achieve signal path switching. The expansion chip 114 has an IC interface (I2C interface) and a plurality of pins (GPIO).

As shown in FIG. 4, the control module 20 includes a control power chip 24. The control power chip 24 is used to provide a 3.3V DC voltage to the microcontroller 22 of the control module 20. The relay module 11 includes a The relay power chip 112 is used to provide a 3.3V DC voltage to the expansion chip 114.

As shown in FIG. 4, the control module 20 provides a 5V DC voltage to the control power chip 24 through the serial port bus 31b, and the control power chip 24 converts a 3.3V DC voltage to the micro control of the control module 20 The relay module 11 further includes a power supply unit 113. The power supply unit 113 provides a 5V DC voltage to the relay power chip 112, and the relay power chip 112 converts a 3.3V DC voltage to the expansion chip 114.

Please continue to refer to FIG. 5 and FIG. 6. FIG. 5 is a schematic diagram of the encrypted result data of a preferred embodiment of the present invention, and FIG. 6 is a schematic diagram of the test result details of a preferred embodiment of the present invention. The encrypted result data 32 includes: test date and time 321, work order information 322, test station type 323, test process 324, test item 325, and test result 326, which are stored in the test processing module 30 respectively, where the The test result 326 includes a plurality of test result details 3261.

As shown in Figure 5, Connect Test0 to Connect Test2 in the test project, the test content is the connection status of each module and component, and further examine the environmental settings of the test system. The test process is to display the process of each test item, and the test results are displayed in a list.

Please refer to FIG. 7 in conjunction with FIG. 3 and FIG. 4. FIG. 7 is a flowchart of an automated circuit board testing method according to a preferred embodiment of the present invention. The present invention uses the above-mentioned automated circuit board testing system 100 as the core basis of operation, and performs the following actual test steps:

First, in the setting step S1, as shown in FIG. 3, the test processing module 30 connects to the first signal interface 42c (MDIO0) through the serial port bus 31c (USB3), and sets the repeater 41 (Retimer) Enter the test mode.

Next, the sending test signal step S2, as shown in FIG. 3, is that the test processing module 30 sends the control signal (USB signal) to the control module 20. In this embodiment, the test processing module 30 issues commands to the control module 20 through the serial port bus 31b (USB2);

Then, a signal conversion step S21, as shown in FIG. 3, the control module 20 receives the control signal (USB signal), and transmits the control signal (USB signal) to the microcontroller 22 of the control module 20 ( MCU) and convert the control signal (USB signal) into the serial control signal (I2C signal).

In this embodiment, the microcontroller 22 may be a Field Programmable Gate Array (FPGA) or a Central Processing Unit (CPU).

At this time, a data comparison step S22, as shown in FIG. 4, transmits the sequence control signal to a memory 23 (EEPROM), and performs data comparison in the memory 23, and then the sequence control signal (I2C signal) is sent back to the microcontroller 22, and the microcontroller 22 sends the sequence control signal (I2C signal) to the relay module 11.

It should be further explained in the data comparison step S22 that the memory 23 can be Programmable Read-Only Memory (PROM) or Erasable Programmable Read-Only Memory (Erasable Programmable Read-Only Memory). Only Memory (EPROM), Flash Memory (Flash Memory) and other non-volatile memory (Non-Volatile Memory), or it can be dynamic random access memory (Dynamic Rand Access Memory, DRAM), static random access Volatile Memory such as Static Rand Access Memory (SRAM).

Then, the signal path switching step S3, as shown in FIGS. 3 and 4, the relay module 11 receives the sequence control signal (I2C signal) and controls the relays 111a, 111b to switch paths, and then the relay module 11 transmits the sequence control signal (I2C signal) to the test board 40. In this embodiment, the relay module 11 switches the relays 111a and 111b so that the software protector 12 is connected to the second signal interface 42a (MDIO1 ).

Then, in the test step S4, the test board 40 receives the sequence control signal (I2C signal) and executes the test action in the test board 40. In this embodiment, as shown in FIG. 3, the test processing module 30 through the serial port bus 31a (USB1) through the software protector 12 to test the board under test 13a (DUT) of the second signal interface 42a (MDIO1).

Then, the receiving result data step S5, the relay module 11 receives the result data, and then transmits the result data to the software protector 12 via the serial return signal (I2C return signal). In this embodiment, As shown in FIG. 3, the relay module 11 switches the relays 111a and 111b to connect the software protector 12 to the second signal interface 42a (MDIO1).

Then, a packet step S51, as shown in FIG. 3, the software protector 12 receives the result data, performs a packet action on the result data to form the encrypted result data 32, and then sends the sequence back to the signal (I2C return Signal) is converted into the return signal (USB return signal), and then the encrypted result data 32 is transmitted to the test processing module 30 via the return signal (USB return signal).

Finally, in the storing step S6, the test processing module 30 receives the encrypted result data 32 and stores the encrypted result data 32 in the test processing module 30.

Continuing the above, the steps are the execution steps of the second signal interface 42a (MDIO1) setting, sending instructions, switching signals, testing and returning data as an example. If the second signal interface 42a (MDIO1) and the When the third signal interface 42b (MDIO2) is tested at the same time, the above steps are repeated. The difference is that the relay module 11 switches the signal path so that the software protector 12 is connected to the second signal interface 42a (MDIO1) or The third signal interface 42b (MDIO2) issues a test command or returns the encrypted result data 32.

In another embodiment, five of the signal interfaces (MDIO1 to MDIO5) are included and five boards to be tested are connected. The signal path switching step S3 needs to be repeated five times, and the receiving result data step S5 also needs to be repeated five times. Secondly, according to the number of the signal interface corresponding to the style of the signal line 43, the signal path switching step S3 and the receiving result data step S5 also change the number of executions according to the number of the signal interface.

Hereby, the characteristics of the present invention and the expected effects that can be achieved are stated as follows:

The automated circuit board testing system and method of the present invention mainly use the automated circuit board testing system and the automated circuit board testing method to further know that the switch module 10 of the board to be tested can quickly switch the Wait for the relays 111a, 111b to reach the switching signal path, and connect the waiting test boards 13a, 13b, so that during the entire test process, there is no need to manually replace the signal line 43 or replace the waiting test boards 13a, 13b, and the whole process is automated , And reduce test time.

Therefore, the present invention has the following implementation effects and technical effects:

First, the present invention enables the test system 100 to reach the switching signal path by switching the relays 111a, 111b on the switch module 10 of the board to be tested, without the need to manually change the signal line 43 or replace the test board. 13a, 13b, and reduce human resources.

Second, the present invention stores the encrypted result data 32 through the test processing module 30, so that the test system 100 does not need to manually record the entire result data, preventing recorders from recording errors, and reducing the error rate of test results.

Third, the present invention parses the encrypted result data 32 through the test processing module 30, and displays the parsed encrypted result data 32 on the user interface for testers to view the test results, and does not require personnel with an engineer background Judging, the test system 100 can display data in real time, reducing test time and labor cost.

Fourth, the automated circuit board test system and method of the embodiment of the present invention can shorten the entire test time, and the total test time can be shortened to 150 seconds, which further simplifies the operation process and is very practical.

Specific examples are used to illustrate the implementation of the present invention, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied by other different specific examples, and various details in the specification of the present invention can also be modified and changed based on different viewpoints and applications without departing from the spirit of the present invention.

It should be noted that the structure, ratio, size, number of components, etc. shown in the accompanying drawings in this specification are only used to match the content disclosed in the specification for the understanding and reading of those familiar with this technology, and are not intended to limit the scope of the present invention. The limited conditions of implementation do not have any technical significance. Any structural modification, proportional relationship change, or size adjustment should fall within the present invention without affecting the effects and objectives that can be achieved by the present invention. The technical content disclosed must be within the scope.

100: Automated circuit board test system 10: Switch module of the board to be tested 11: Relay module 111a, 111b: Relay 112: Relay power chip 113: power supply 114: Expansion chip 12: Software protector 121: software interface bus 13a, 13b: boards to be tested 20: Control module 21: Control interface bus 22: Microcontroller 23: Memory 24: control power chip 30: Test processing module 31a, 31b, 31c: serial port bus 32: Encrypted result data 321: Test date and time 322: Ticket Information 323: test station 324: Test Process 325: test item 326: test result 3261: Test result details 40: test board 41: Repeater 42a: The second signal interface 42b: third signal interface 42c: The first signal interface 43: signal line S1: Setting steps S2: Steps to send signal S21: Conversion signal steps S22: Data comparison steps S3: Signal path switching steps S4: Test steps S5: Steps for receiving result data S51: Packet Step S6: Storage steps

FIG. 1 is a schematic diagram of an automated circuit board testing system according to a preferred embodiment of the present invention. Fig. 2 is a flowchart of an automated circuit board testing method according to a preferred embodiment of the present invention. FIG. 3 is a schematic diagram of an automated circuit board testing system according to a preferred embodiment of the present invention. 4 is a schematic diagram of the connection between the control module and the relay module according to a preferred embodiment of the present invention. FIG. 5 is a schematic diagram of encrypted result data according to a preferred embodiment of the present invention. FIG. 6 is a schematic diagram of the test results of a preferred embodiment of the present invention. FIG. 7 is a flowchart of an automated circuit board testing method according to a preferred embodiment of the present invention.

100: Automated circuit board test system

10: Switch module of the board to be tested

20: Control module

21: Control interface bus

30: Test processing module

31b: Serial port bus

Claims (9)

An automated circuit board testing system, comprising: at least one switch module to be tested, the switch module to be tested is connected to a test board, the test board includes: a first signal interface, a second signal interface, a The third signal interface and a repeater, the second signal interface and the third signal interface are connected to each other by a signal line, the first signal interface is connected to the repeater, and the switch module of the board to be tested is connected to the first The second signal interface and the third signal interface, the switch module of the board to be tested includes a plurality of relays; a control module, which is connected to the switch module of the board to be tested by a control interface bus, the control module Control the switch module of the board to be tested; and a test processing module, which receives the encrypted result data tested by the test board, and the test processing module connects the control module and the control module with at least two serial port buses respectively The first signal interface; wherein the switch module of the board to be tested includes: at least two boards to be tested, at least one relay module, and a software protector, and the test board is connected to the second signal interface and the third signal interface, respectively , The waiting test board is individually connected to the relay module, the relay module is connected to the control module by the control interface bus, the software protector is connected to the relay module by a software interface bus, the The software protector encrypts the data returned by the relay module. The number of serial port buses is three. The serial port buses are respectively connected to the first signal interface, the control module and the software protector, and are connected to The test processing module; Wherein, the test processing module transmits a control signal to the control module, the control module converts the control signal into a serial control signal, and the control module transmits the serial control signal to the switch group of the board to be tested, and Control the relay switching signal path of the switch module of the board to be tested, the test board returns result data to the switch module of the board to be tested, and the switch module of the board to be tested transmits the result data to the control module via a sequence of return signals Group, the control module converts the serial return signal into a return signal, and transmits the encrypted result data to the test processing module through the return signal. For example, the automated circuit board test system described in the first item of the scope of patent application, wherein the relay module uses the sequence control signal to control the output pin of an expansion chip of the relay module, so that the switching of the relays reaches the signal Path switching. For example, the automated circuit board test system described in item 1 of the scope of patent application, wherein the encrypted result data includes: test date and time, work order information, test station, test process, test items, and test results. The encrypted result data is Stored in the test processing module. The automated circuit board testing system described in item 3 of the scope of patent application, wherein the test result includes a plurality of test result details. The automated circuit board test system described in item 1 of the scope of patent application, wherein the oscillation frequency of the control module is 24 MHz. The automated circuit board testing system described in item 2 of the scope of patent application, wherein the control module includes a control power chip, and the control power chip provides 3.3V The DC voltage is applied to the microcontroller of the control module, the relay module includes a relay power chip, and the relay power chip provides a 3.3V DC voltage to the expansion chip. According to the automatic circuit board testing system described in item 2 of the scope of patent application, the expansion chip has an interface for an integrated circuit to interface with a bus and a plurality of pins. The automated circuit board test system described in item 1 of the scope of patent application, wherein the total test time of the test system is between 0 and 200 seconds. A test method for an automated circuit board test system includes the following steps: a setting step, the test processing module sets the repeater to enter the test mode through the first signal interface; a sending test signal step, which is processed by the test The module sends the control signal to the control module; in a signal conversion step, the control module receives the control signal, transmits the control signal to the microcontroller of the control module, and converts the control signal to the serial control Signal; a data comparison step, the sequence control signal is sent to a memory, and the data comparison is performed in the memory, and then the sequence control signal is returned to the control chip, and the control chip sends the The sequence control signal is sent to the relay module; a signal path switching step, the relay module receives the sequence control signal and controls the relay switching paths, and then the relay module transmits the sequence control signal to the test board; In a test step, the test board receives the sequence control signal and executes a test action on the test board; In a step of receiving result data, the relay module receives the result data, and then transmits the result data to the software protector via the serial return signal; in a packet step, the software protector receives the result data, and the result data Perform a packet action to form the encrypted result data, then convert the sequence of return signals into the return signal, and then send the encrypted result data to the test processing module via the return signal; and a storage step, the test processing The module receives the encryption result data and stores the encryption result data in the test processing module.

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